Ultra-pure Copper Electroplating for Background ... · Electroplating 11 o Electroplating performed...
Transcript of Ultra-pure Copper Electroplating for Background ... · Electroplating 11 o Electroplating performed...
Ultra-pure Copper Electroplating forBackground Suppression in NEWS-GPatrick Knights
University of Birmingham
11/04/2019 1P Knights, DM UK Meeting, King's College London
news-g.org
o NEWS-G@SNO
o Copper radiopurity
o Indirect Pb-210 measurements of copper used for NEWS-G@SNO
o Development of electroplating of detector hemispheres
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Spherical Proportional Counter
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o Grounded metallic shell (⌀ ~30-100 cm)
o Central sphere at high voltage as anode (⌀ ~1-6 mm)
o Electrons drift to anode and amplified near surface
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!"
NEWS-G@SNO
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o NEWS-G dark matter search next generation detector – NEWS-G@SNO
o 140 cm copper sphere to be installed in SNOLab
o 4N Aurubis copper (99.99% pure)– Spun into two hemispheres
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Po218
84
Pb214
82
Rn222
86
Bi214
83
Po214
84
Pb210
82
Bi210
83
Po210
84
Pb206
82
3.8 d
3.1 m
27 m
20 m
160 us
22 y
5 d
138 d
Stable
Background Contributions in Copper
o Copper has no long-lived radio-isotopes
o 63Cu(n,⍺)
60Co by fast neutrons from
cosmic muon spallation
o 238U and
232Th decay chain –
naturally found and deposited by
222Rn
– Commercial copper ~1 μBq/kg
– Electroformed copper (PNNL*)
~100 nBq/kg
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https://www.nndc.bnl.gov/
E. W. Hoppe et al. J. Radioanal. Nucl. Chem. v.277 p.103
*Pacific Northwest National Laboratory, USA
210Pb in Coppero 2 measurements of 210Po in our
copper. Implied:– 210Po ~ 80 mBq/kg– 210Pb ~ 60 mBq/kg
o Geant4 simulation indicates this gives 4.58 dru < 1 keV– Reduced to 1.96 dru if 500 μm
pure copper plated onto surface
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XIA UltraLo-1800
https://www.xia.com/ultralo-theory.htmlSee: XMASS collaboration arXiv:1707.06413
4.58 dru<1 keV1.96 dru<1 keV1.59 dru<1 keV
107 decays of 210Pb and 210Bi in Cu Walls in 2 bar Ne+10% CH4
Best Estimate of 210Po & 210Pb from two measurements of 210Po
Preliminary
Preliminary
o Reactions governed by oxidation and reduction reactions
o Ions reduced at cathode building up material– Current supplied to drive reactions– Mass deposited proportional to
current supplied:
! =#! ∫ %(') )'
*+
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" – m ass
# ! – m olar m ass$(&)– current as function of tim e(– num ber of e lectrons transferred in reduction reaction
) – Faraday C onstant (= + ,- )
Electrolytic Cell and Electroplating
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Electroplating Ultra-Pure Coppero Some ions reduce more readily than
others – reduction potentials
o Copper benefits from ‘electrowinning’ –high reduction potential +0.34 V
o Reduction potential of: – Uranium: -1.80 V– Thorium: -1.90 V– Lead: -0.13 V – All lower than copper → refined
during electroplating
o Using established techniques, similar to Majorana Experiment1
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1arXiv:1308.1633
Preparation Procedure o Cleaned with detergento Sandedo Cleaned againo Surface chemically etched with 3% H202,
1% H2SO4 in deionised (DI) water – Shown to be effective etchant while less
aggressive than some alternativeso Electrolyte of H2SO4, H2O and CuSO4
– Pump and filter to move electrolyte and remove particulates
9P Knights, DMUK 2019 - London 11/04/2019E. W. Hoppe et al. Nucl. Instrum. Methods Phys. Res v.579 p.486
Electropolishing
o Electropolishing serves several purposes– Removes layer from hemisphere
without chemical or mechanical attack– Preferentially removes high spots
from surface– Increases concentration of CuSO4 in
electrolyteo First (second) hemisphere 21.2�0.1 μm
(28.2�0.1 μm) polished
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Cu Movement in Electropolishing
+−
Electroplating
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o Electroplating performed with pulsed current
o 0.27 to 0.3 V amplitude in forward and reverse directions of plating– Established value for ultra-pure copper
electroplatingo Plating continued for ~15 days o In total first (second) hemisphere plated
502.1�0.2 μm (539.5�0.2 μm) o Passivation with Citric Acid
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~0.036 mm/day~1.3 cm/year
Cu Movement in Electroplating
+−
Preliminary
Result
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o Layer of Cu deposited on surface – Awaiting results of analysis of copper and electrolyte to verify purity
o Hemispheres to be welded togethero Final chemical etch to be performed on intact sphereo Detector to be installed in LSM for commissioning this year
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Future NEWS-G Detectors
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o Next generation of detector will require even lower background material
o Two options:– 6N copper sphere – Electroformed intact sphere
o 6N more currently favoured; less pure than electroformed but commercially availableand potentially lower cost– Electroformed copper could be the
generation after – demonstrated growth ~ 1.3 cm/year
– 10 bar, ⌀ 60 cm sphere requires 4 mm walls - ~ 4 months
o Currently planned to be ⌀ 60 cm, installed in NEWS-G@LSM shielding
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Electroformed copper (PNNL) ~<100 nBq/kg 238U & 232Th
Summary
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o Recent indirect measurements of 210Pb in copper show unacceptable contamination – additional measurements with our copper are ongoing
o Electroplated ~0.5 mm pure Cu onto internal surface of NEWS-G@SNO detector to reduce experimental backgrounds– Hemispheres now being welded together
o Commissioning in LSM later this year
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29/11/2018 15P Knights, DMUK 2019 - London
Additional Material
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XIA Counter UltraLo-1800
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From: https://www.xia.com/ultralo-theory.html
XMASS collaboration arXiv:1707.0641311/04/2019
Simulation of Effect of ElectroplatingSimulation of 107 decays of 210Pb and 210Bi within the 10.5 mm of thickness of the copper sphere with an inner radius of 67.5 cm.Data processed assuming 4000 V applied on a 3 mm radius sensor and a CREMAT pre-amplifier with !=46 µs.Gas condition: 2 bars of Ne + 10 % CH4 for a mass of 2.03 kg
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Assuming 40 mBq/kg:Events with rise time lower than 500 µs and energy lower than 1 keV:No plating : 4.58 dru500 µm : 1.96 dru (-58%)1 mm : 1.59 dru (-65%)
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4.58 dru<1 keV1.96 dru<1 keV1.59 dru<1 keV
Electroplating Coppero Some ions reduce more readily than
others – reduction potentialso Voltage between anode and cathode
limits electroplating of some specieso Copper benefits from ‘electrowinning’ –
high reduction potential +0.34 Vo Reduction potential of:
– Uranium: -1.80 V– Thorium: -1.90 V– Lead: -0.44 V – All lower than copper; refined during
electroplating
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Why don’t impurities plate too?o Which reaction proceeds determined by
standard cell potential:
o Related to Gibbs Free Energy:
– If !"! < $ then reaction is spontaneous
– If !"! > $ then need extra energy input
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&"#$$! = &%! − &&!
'" # $ $! - standard cell potentia l
'%! - standard cathode reduction potentia l
'&! – standard anode reduction potentia l
!"! = −) * &"#$$!
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An Example
o Example of solution containing U3+ and Cu2+, with a Cu anode:– U3+ to U
o !!"## = -2.138 V → Requires energy– Cu2+ to Cu
o !!"## = 0 V → In equilibriumo Cu2+ reduction will occur at lower
potentialo Still require a potential difference between
electrodes to overcome energy losses
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!!"##$ = !%$ − !&$
'! " # #$ - standard cell potentia l
'%$ - standard cathode reduction potentia l
'&$ – standard anode reduction potentia l
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Not Quite That Simple…o Assumes standard conditionso Electrode potentials modified outside of
these conditions:
– In theory can have some plating of other species – heavily suppressed
o Other effects dominant in contaminant plating
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! = !! − $%&' ln
∏" +"#$
∏% +%#&
'– E lectrode potentia l
'! – Standard electrode potentia l(– M olar gas constant
)– Tem perature* " – C hem ical activ ity of species +, " – Stoichiom etric coeffic ient of species +
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Why Pulse-Reverse Plating?
o Waveform for plating with relaxation period and/or reverse bias (effectively polishing)
o Benefits compared to DC plating:– High points are preferentially
removed in reverse bias section– Greater uniformity of plate –
relaxation period allows diffusion of ions
– Higher density copper plate
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M . C handrasekar and M . Pushpavanam , “Pulse and pulse reverse p lating - conceptual,
advantages and applications,” E lectrochim ica A cta, vo l. 53, no . 8, pp . 3313 – 3322, 2008.