Twin-X - AMCO Instruments · Lab-X320: Instrument with two analysis ‘heads’ fitted with Fe55...
Transcript of Twin-X - AMCO Instruments · Lab-X320: Instrument with two analysis ‘heads’ fitted with Fe55...
Twin-XA unique combination of technologiesdelivering greater flexibility andperformance to benchtop EDXRF
Oxford Instruments Analytical
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© Oxford Instruments Analytical Ltd, 2003. All rights reserved. Part no: OIA/079/A/0203
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1968Portable MineralAnalyser (PMA)introduced,offeringstationary/transportableanalysis
1972Lab-X100: Radioactive isotope(Fe55) based instrument formeasuring Al to Fe in theperiodic table
1976Lab-X320: Instrument with twoanalysis ‘heads’ fitted with Fe55and Cd109 radioistopes foranalysis over a wider elementalrange
1982Introduction of Lab-X2000 withelectronics console, ‘one pushbutton’ operation and a rangeof source/detector combinationsfor optimised performance
1987Introduction of Lab-X1000 withnew design and automatic threeposition turntable
1993Introduction of Lab-X3000incorporating an X-ray tube withunique patented technologyallowing measurements from Alto U in the periodic table
1998Introduction of Lab-X3000S:Optimised “sulphur in oil”analyser with lowest detectionlimits
2000Introduction of Lab-X3500 withPC interface option allowing fullkeyboard operation andtransmission of results into Exceldatabases
2003Introduction ofTwin-X, theculminationof 35 yearsexperience inbenchtop XRF!
Oxford Instruments brings youthe next generation ofbenchtop EDXRF analysis.Twin-X is the result ofcombining two provendetector technologies to giveunprecedented versatility andperformance in one compactinstrument.
Each detector is highly tunedfor a specific group ofelements on the periodictable. The patented ‘Focus 5+’detection system is the proventechnology first introduced inthe Lab-X3000.
‘Focus 5+’ outperforms pindiode detectors on low atomicnumber elements such as Na,Mg, Al, Si, P, S, Cl, K, Ca...
The PIN detector focuses onthe analysis of complex metalmatrices. The PIN detectordelivers high sensitivity andresolution for higher atomicnumber elements such as Cr,Mn, Fe, Co, Ni, Cu, Zn...
Twin-X can be configuredwith one or both of thesedetectors. Any combination of‘Focus 5+’ and PIN detectorgives the unique advantage oftailoring the Twin-X toexactly suit your needs.
The marriage of the twotechnologies offers the bestperformance ever put into abenchtop EDXRFspectrometer.
Food & Healthcare Minerals Petroleum
Metals Polymers
Laboratory Education Environment
Introducing a new con cept in benchtop XRF...
■ Easy to use - can be operated byanyone
■ Rugged robustdesign - for use in harshenvironments
■ High PrecisionAnalysis - sensitivity acrossthe range Na-U
■ Flexible andcompact -integrated PC and software
35 Years of benchtopXRF experience Twin-X
Analysis of liquids, tosolids, to powders -
Twin-X delivers
click onto www.oxford-instruments.com for more information
click onto www.oxford-instruments.com for more information
Rugged and Robust Design
Auto-sampler
Twin Detection Systems
Integrated PC
Remote Diagnostics
■ Membrane keypad - resistant to dust,spills and dirty hands
■ High resistance to dust ingress -cooling fans do not carry dust tosensitive internal components
■ High resistance to Electro-magneticinterference - passes the highestindustrial standards
■ Integrated design - no cabling, mainspower only - He as an option
■ Minimise downtime
■ Reduce maintenance costs
■ Expert on-line advice
■ Password protected
■ Easy to operate; one-touch analysis
■ No expert knowledge required
■ Flat panel colour display
■ 32 bit Windows® operating system
■ Networking capabilities
■ USB/Ethernet serial interface
Unique SamplePositioning System
The TwinDetectionSystems
Powerful SoftwareTwin-X - twice the performance
Easy to Use...
■ Autosampler guaranteesconsistent, repeatable results fromeach position on the sample tray
■ 10 Position tray - for unattendedoperation
■ High precision sample placement -for more precise results
■ Integrated system check samples -for simple system tests
■ Sample spinner (optional) - reduceserrors due to sample preparation,particle size and inhomogeneity
■ Low helium usage (optional) - reducesoperational costs
■ Tested to 1 million cycles, fully loaded -equivalent to 15 years of operation at200 samples a day
■ Method development tool - simple, stepwise methodcreation
Preparesample
Insert
Windows® based 32-bit
Simple, flexible data output for theneeds of today and tomorrow
The Twin-X software is based on an embedded PCplatform and displayed on an integrated ‘flat panel’color monitor. The powerful software includes:
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Focus 5+ PIN Detector
■ Proportional counterdetector - offering highsensitivity
■ Primary beam filtering -offering optimisedexcitation
■ Secondary beam filtering- for improved resolutionbetween elements
■ PIN diode detector -offering high resolutionfor low Z elements
■ Primary beam filtering -offering optimisedexcitation
■ Wide element range - for greater flexibility
■ Each detector is highly tuned for a specific group ofelements - the combination gives the best performance
across the elemental range Na-U
Press ‘Start’key
■ Spectrum Scan tool - direct interface with detectors
■ Regression analysis tool - includes alpha, intensity, ratio,overlap and background corrections
■ Stored result library - flexible and searchable
■ Oxford Instruments manufactured X-ray tube technology- offering high reliability