TSV integration into silicon photonics interposer for next ...
Transcript of TSV integration into silicon photonics interposer for next ...
© MASSTART
MASSTART Consortium
Data Center Interconnects - Towards Mass Manufacturing, 6th October 2020
TSV integration into silicon photonics interposer for next generation transceiver PICs
Bogdan SIRBUFraunhofer IZM, Germany
www.masstart.eu
virtual conference session:Data Center Interconnects – Towards Mass Manufacturing
online / October 6th 2020 / 4 – 7pm
© Fraunhofer
TSV integration into silicon photonics interposer for next generation transceiver PICs
Bogdan Sirbu , Kai Zoschke
Fraunhofer Institute for Reliability and Microintegration (IZM), Berlin
Photonics days Berlin Brandenburg 2020
© Fraunhofer IZM
Bogdan Sirbu, WLSI
2 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Data Age - Global datasphere by 2025
25%Amount of created real-time data in datasphere
1 zettabyte : 1021 bytes
163ZBAmount of datathat will be createdannually
20%Amount of life-critical data in datasphere
4800/dayAmount of one persons interaction with IoT devices
90%Amount of data in datasphere require security
5.2ZBAmount of data that subject to data analysis
1.4ZBAmount of analysed data touched by AI / cognitive systems
Source: IDC, Seagate
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Bogdan Sirbu, WLSI
3 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Source: Total consumer power consumption forecast, Dr. Anders S. G. Andrae (Huawei), Nordic Digital Business Summit, October 2017
The Downside
© Fraunhofer IZM
Bogdan Sirbu, WLSI
4 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Motivation – Data center traffic growthForecast 2014:
Within data center 73.1%
Data center to user 18.2%
Data center to data center 8.7%
Source: Cisco Global Cloud Index 2014Forecast 2018:
Within data center 73.4%
Data center to user 14.3%
Data center to data center 12.4%
Source: Cisco Global Cloud Index 2016-2021 (2018)
CAGR: 25%
CAGR: 24.7%
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Bogdan Sirbu, WLSI
5 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Silicon Photonics Chip Forecast for DCI
Source: Yole
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Bogdan Sirbu, WLSI
6 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Photonics Packaging Key Challenges
High precision placement for fiber alignment for SM
Delicate parts handling
Different die attach technologies for assembly
Testing
Standardization
Reliability
Small and odd shape devices
High cost
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Bogdan Sirbu, WLSI
7 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Ethernet speed – Historical Data and Forecast
100G proliferating
400G ramp up after 2021
Next stop, 800G and 1.6T
Road >400G includes COBO and co-packaging
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Bogdan Sirbu, WLSI
8 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
MASSTART surpasses the cost metric threshold by using enhanced and scalable techniques
Glass interface based laser/PIC and fiber/PIC coupling approaches, leveraging glass waveguide technology to obtain spot size and pitch converters in order to dramatically increase optical I/O density, while facilitating automated assembly processes,
3D packaging (TSV) enabling backside connection of the high speed PIC to a Si carrier,
A new generation of flip chip bonders with enhanced placement in a complete assembly line compatible with Industry 4.0 which will guarantee an x6 improvement in throughput
Wafer-level evaluation of assembled circuits with novel tools that will reduce the characterization time by a factor of 10, down to 1 minute per device.
4-channel PSM4 module in QSFP-DD format with 400G aggregate bit rate,
8-channel WDM module in a QSFP-DD format with 800G aggregate bit rate,
16-channel WDM on-board module delivering 1.6Tb/s aggregate line rate,
A tunable single-wavelength coherent transceiver with 600Gb/s capacity following the DP-64QAM modulation format on 64Gbaud/s line rate.
© Fraunhofer IZM
Bogdan Sirbu, WLSI
9 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
MASSTART – Consortium as a whole
System providers
Photonic Assembly & Testing
Design House & Technology consultancy
Technology providers
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Bogdan Sirbu, WLSI
10 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
MASSTART Coherent Transceiver Packaging
Glass interface based laser/PIC and fiber/PIC coupling approaches
obtain spot size and pitch converters
increase optical I/O density, automated assembly processes
3D packaging using TSV enabling backside connection of the high speed PIC to a Si carrier
New flip chip bonders with enhanced placement
improvement in throughput
Wafer-level evaluation of assembled circuits with novel tools
reduce characterization time
© Fraunhofer IZM
Bogdan Sirbu, WLSI
11 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
TSV Test-structures GSG
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Bogdan Sirbu, WLSI
12 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
GSGSG TSV Application ScenarioRequired to connect:
Driver/TIA chips assembled on top of the Interposer
DSP chip assembled on the PCB
PCB
Si Interposer
TIA/DRV
DSP
© Fraunhofer IZM
Bogdan Sirbu, WLSI
13 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
TSV Integration Schemes
Back Side Via last
• TSV integration after completewafer processing
• TSV through thick BEOL oxide• Requires keep out zones in FEOL
and BEOL for TSV integration
Via first or middle; Via last;
• TSV integration before FEOL orafter FEOL / before BEOL
• Processes established at IDMs
• Support wafer bonding• Wafer backside thinning• TSV reveal• Backside RDL and bump
formation• Support wafer de-bonding
• TSV integration after completewafer processing
• Requires landing pads in BEOL for prepared TSV connection
• Support wafer bonding• Wafer backside thinning• TSV formation with acess to
landing pads• Metall liner and back side RDL
formation• Support wafer de-bonding (if
required)
© Fraunhofer IZM
Bogdan Sirbu, WLSI
14 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Front and Back Side Processes for TSV, RDL and IO formation
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Bogdan Sirbu, WLSI
15 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Layers and Test Structures for TSV Characterization
Frontside:
#61 – top metal on LETI Wafer(line 20µm, pad Ø30µm)
#10 – TSV(Ø20µm)
#11 – FS-RDL metal(line 20µm, pad Ø40µm)
Backside:
#09 – BS TSV-passopen(via Ø10µm)
#21 – BS-RDL metal(line 20µm, pad Ø30µm)
3 test fields for reserved areas at LETI TRX8 waferRF test
structures
4 point probe structures for via isolation and resistance
daisy chains front to back side and between last metallayer and RDL layers
© Fraunhofer IZM
Bogdan Sirbu, WLSI
16 Photonics Days Berlin Brandenburg, 06.10.2020 www.masstart.eu
Wafer after TSV blind hole etching
• Lithography and Alignment established
• BEOL etching established
• SI-DRIE etching established
• CVD / PVD / Cu-Plating to be done
© MASSTART
MASSTART Consortium
Data Center Interconnects - Towards Mass Manufacturing, 6th October 2020
Acknowledgement
Co-funded by the Horizon 2020Framework Programme of the European Union
MASSTART project is co-funded by the Horizon 2020 Framework Programme of the European Union with Grant Agreement Nr. 825109. https://cordis.europa.eu/project/rcn/219912/factsheet/enMASSTART project is an initiative of the Photonics Public Private Partnership www.photonics21.org#Photonics@Photonics21@PhotonicsEU#H2020
www.masstart.eu
#MASSTART
Disclaimer: The information, documentation and figures available in this deliverable are written by the MASSTART Consortium Partners under co-funding by Horizon 2020 Framework Programme of the European Union (Grant agreement ID: 825109) and do not necessarily reflect the view of the European Commission. The information in this document is provided “as is”, and no guarantee or warranty is given that the information is fit for any particular purpose. The reader uses the information at his/her sole risk and liability.
Copyright © 2020 the MASSTART Consortium. All rights reserved. This document may not be copied, reproduced or modified in whole or in part for any purpose without written permission from the MASSTART Consortium. In addition to such written permission to copy, reproduce or modify this document in whole or part, an acknowledgement of the authors of the document and all applicable portions of the copyright notice must be clearly referenced.