THRESHOLD - ESD A · Dear ESDA Volunteers & Friends of ESDA, The 39th EOS/ESD Symposium will be...

Volume 33, No. 5 Sept/Oct 2017

THRESHOLDTM

Inside this Issue:Symposium 2017, page 1From the President, page 2EOS/ESD Symposium Keynote, page 3Standards Meetings, page 4 EOS/ESD Symposium Schedule, pages 6-7 IEW Call for Presentations, pages 7-82018 EOS/ESD Manufacturing Symposium in Asia Call fo Presentations, pages 9-1040th Annual Symposium Call for Papers, pages 11-14China Forum Worksho, page 18Select Papers from Past Symposiums, pages 24-54 Q & A, page 55 Calendar, page 56Photo Corner, page 57

The Board of Directors Welcomes You to the EOS/ESD Symposium!

Now in its 39th year, the 2017 EOS/ESD Symposium presents the latest re-search on EOS and ESD in the rapidly changing world of electronics. This in-ternational gathering, which is jointly sponsored by the IEEE, the EMC Society, the Electron Devices Society and the Reliability Society, offers a unique op-portunity for engineers in industry and academia to learn best practices and the newest advances in technology for ESD control protection and design. It addresses EOS/ESD at the device, board and system level with attention to both design and manufacturing issues. This year’s event, which will be held September 10-15 at the beautiful Westin La Paloma Resort in Tucson, Ariz. offers an expanded technical program that includes new and updated tutorials, an added parallel track on EOS/ESD in Manufacturing and a total of 16 new sessions. The industry exhibits display a wide variety of ESD solutions from established products to leading-edge innovations. Representatives from many different companies welcome you in the exhibit hall to demonstrate their products and services, starting with the welcome reception on Monday evening and continuing until the exhibits close on Wednesday afternoon. The exhibits offer a unique opportunity to find what you have been looking for or a chance to talk to the professionals with hands-on experience in static control meth-ods, evaluation techniques, ESD testing hardware, and many other ESD solutions.

2

THRESHOLDTM

September/October 2017

TREK, INC.190 Walnut Street, Lockport, NY USA 14094

Tel: +1-716-438-7555 Fax: +1-716-201-1804 www.trekinc.com • [email protected]

Designer and manufacturer of instrumentation and sensors for measuring surface voltage, ionizer performance, and surface resistivity

ACL STATICIDE840 W. 49th Place, Chicago, IL 60609

Tel: 847-981-9212 Fax: [email protected] • www.aclstaticide.com

Manufacturer of anti-static topicals, dissipative coatings for plastic and floors, ESD workstation products including meters. ISO 9001:2008 certified QS

ESD Association President;Gianluca Boselli

Dear ESDA Volunteers & Friends of ESDA,The 39th EOS/ESD Symposium will be held on September 10-15, at the Westin La Paloma Resort, Tucson, AZ. The EOS/ESD Symposium is an extraordinarily concentrated event, which can appeal the ESD newbies as well the world-class ESD experts, thanks to the breadth of its program and the diversification of its topics.The technical portion of the Symposium will start on Tuesday, September 12 and will conclude on Thursday, September 14. The strong technical program will include about 50 platform presentations selected by a highly competent Technical Program Committee, world-renowned invited speakers on topics tangentially related to EOS/ESD, 2 Year-In reviews to provide a concise summary of the state-of-the-art of the presented topics, and several Workshops set in a highly interactive environment to close every day on very high note.New for this year is the introduction of a new Manufacturing track with a strong emphasis on the discussion group and hands-on sessions. This is an example of how the EOS/ESD Symposium keeps adding contents and formats every event, making it very appealing for attendees to participate year after year.A spectacular industry Exhibits complements the technical program. State-of-the-art equipment and services are displayed in a hall adjacent to where platform presentations will be held, allowing the attendees to enjoy both. The Welcome Reception (official opening of the Symposium) will take place on Monday, September 11 in the Exhibits Hall.The EOS/ESD Symposium is also an extraordinary learning opportunity, featuring three full days of multi-tracks EOS/ESD tutorials, ranging from Basic to Advanced. Certification exams can actually be taken on Friday, September 15.Last but not least, Symposium is also the opportunity for the many Working Groups dealing with a large variety of topics to meet face-to-face and advance the standards in their area. I am looking forward to meeting you all in Tucson.

Gianluca

From the President

The 39th EOS/ESD Symposium is here to bring something new your way..

3

THRESHOLDTM


EOS/ESD SYMPOSIUM KEYNOTETUESDAY, SEPTEMBER 12, 20179:00 a.m. - 9:45 a.m.

Mars Science Laboratory spacecraft launched in November of 2011 reaching Mars only 9 months later to achieve a spectacular Entry, Descent and Landing (EDL) on August 5th 2012. Since then, the Curiosity rover has driven over 16 kilometers, sampled a few sand dunes and over a dozen rocks by drilling into them. This talk will present an overview of the mission, its objectives, and dis-coveries as well as a few of its challenges along the way.

Alicia Allbaugh was born and raised in Newark, Ohio and was valedictorian at Licking Valley High School (yes that is its real name) in 1984. She attended the Ohio State Uni-versity first at a branch campus in her home town and then on main campus in Columbus with 58,000 classmates. Af-ter earning a BS degree in Engineering Physics in 1988, she accepted a position in Annapolis, Maryland analyz-ing electromagnetic interference in communications for military aircraft and even between the space shuttle and ground control during landing. Simultaneously, she took graduate courses in physics at the Johns Hopkins Uni-versity. An act of congress precipitated her layoff from that position in 1991 at which point she landed a position at NASA’s Jet Propulsion Laboratory (JPL) in Pasadena, California. She supported the Galileo mission for 8 years as it cruised towards and then orbited Jupiter including the first ever asteroid encounter with a spacecraft, first spacecraft software upgrade in flight (which is now com-

The Mission and some ChallengesDr. Alicia R. AllbaughMSL IPE Team Chief, NASA’s Jet Propulsion Laboratory (JPL)

monplace), the first observation of an impact of a comet impact into a planet (by Shoemaker-Levy 9) and sending the first probe into another planet’s atmosphere. She left JPL in 1999 to return to graduate work and earned a Ph. D in physics from the Kansas State University in 2003. She became a visiting assistant professor at the Roches-ter Institute of Technology and taught many engineers in training during her two years there. She was drawn back to California by a proposal of marriage from an fellow en-gineer on Galileo. She accepted and returned to JPL in 2006 in support of the Mars Science Laboratory project. She has been supporting the Curiosity rover in some ca-pacity ever since. Currently, she is the Team Chief of the Integrated Planning and Execution Team which is respon-sible for the coordination of all the activities commanded on the rover every martian day and sometimes supports that commanding as a Mission Lead ensuring the health and safety of the vehicle.

EOS/ESD Symposium

4

THRESHOLDTM


STATICO541 Taylor Way, #1, San Carlos, CA 94070 USA

Tel: 650-592-4733 Toll Free: 1-800-261-4149 Fax: 650-508-0761 • [email protected] • www.statico.com

Global supplier of static control & cleanroom products

TRANSFORMING TECHNOLOGIES, LLC3719 King Road, Toledo, OH 43617

Tel: 419-841-9552 • Fax: 419-841-3241 Email: [email protected]

www.transforming-technologies.comTransforming Technologies provides unique and outstanding products to

detect, protect, eliminate, and monitor electrostatic charges.

Standards

September EOS/ESD Association Meeting SeriesTHE WESTIN LA PALOMA RESORT AND SPA3800 E. Sunrise DriveTucson, AZ 85718

Tuesday, September 5TAS 8:00-5:00

Wednesday, September 6TAS 8:00-5:00WG-23, EOS Best Practices 8:00-10:00S20.20/625B Harmonization Task Team 10:00-12:00Education 1:00-5:00WG-19, High Reliability 1:00-5:00WG-5.0, Device Testing 3:00-5:00

Thursday, September 7TAS 8:00-5:00WG-53, Compliance Verification 8:00-12:00JWG, Device Testing (CDM) 8:00-12:00WG-13, Handtools 10:00-12:00WG-4 - Worksurfaces 1:00-5:00JWG, Device Testing (HBM) 1:00-5:00WG-15, Gloves 1:00-3:00WG Chair Meeting 5:30-7:00

Friday, September 8TAS 8:00-5:00WG-3, Ionization 8:00-10:00WG-5.4, Device Testing (TLU) 8:00-10:00WG-5.5, Device Testing (TLP) 10:00-12:00WG-7, Flooring 10:00-12:00WG-1, Wrist Straps 10:00-12:00WG-11, Packaging 1:00-5:00WG-5.6, Device Testing (HMM) 1:00-3:00WG-25, Charged Board Event 3:00-5:00

Saturday, September 9TAS 8:00-5:00WG-21, Flat Panel Display 8:00-10:00WG-14, System Level ESD 8:00-10:00WG-17, Process Assessment 9:00-12:00WG-26, System ESD Modeling 10:00-12:00MAR/STDCOM 1:00-4:00Social Reception with Entertainment 5:30-7:00

Sunday, September 10WG-27, EOS Automotive 1:00-4:00Board of Directors 5:00-7:00

Monday, September 11WG-18, Electronic Design Automation (EDA) 9:00-11:00WG-22, ESD Parameters 11:00-12:00JESD78 Ad-hoc Committee Meeting 2:00-4:00ESD Compact Modeling Committee Meeting 4:30-6:00

To Reserve Your Room: Book by: August 16, 2017Room Rate: $139.00+Tax (Resort Fee Waived) *Guests must identify themselves with the group name 2017 EOS/ESD Symposium and Exhibits- to receive the above-mentioned, discounted room rate.Call In: +1 800-937-8461 refer to 2017 EOS/ESD Symposium and Exhibits Reservations Link: www.starwoodmeeting.com/Book/2017EOSESD

5

THRESHOLDTM


EOS/ESD Symposium

SUNDAY, SEPTEMBER 10, 2017Registration 7:30 a.m. - 5:00 p.m.S20.20 Seminar 8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) (PrM) (Day 1)Tutorials 8:00 a.m. - 12:00 p.m. DD110: ESD Basics to Advanced Protection Design (DD) 8:30 a.m. - 4:30 p.m. FC100: ESD Basics for the Program Manager (PrM) 8:30 a.m. - 12:00 p.m. DD200: Charged Device Model Phenomena, Design, and Modeling (DD) 8:30 a.m. - 12:00 p.m. DD/FC130: System Level ESD/EMI: Testing to IEC & Other Standards (PrM), (DD) 8:30 a.m. - 12:00 p.m. DD/FC155: ESD Control Workstations: Set-up, Practical Considerations, and Measurements 8:30 a.m. - 10:00 a.m. DD/FC161: Perfect ESD Storm 10:30 a.m. - 12:00 p.m. DD/FC330: Control of Charged Board Event (CBE) NEW 1:00 p.m. - 4:30 p.m. DD201: ESD Protection and I/O Design 1:00 p.m. - 4:30 p.m. DD204: ESD Design in HV Technologies 1:00 p.m. - 4:30 p.m. FC164: Costly Controversial ESD Myths 1:00 p.m. - 4:30 p.m. FC370: Basics of EMI and EOS in Manufacturing Environment and Their Mitigation NEW

MONDAY, SEPTEMBER 11, 2017Registration 7:30 a.m. - 5:00 p.m.S20.20 Seminar 8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) (PrM) (Day 2)Tutorials 8:30 a.m. - 4:30 p.m. FC101: How To’s of In-Plant ESD Auditing and Evaluation Measurements (PrM) 8:30 a.m. - 12:00 p.m. DD231: ESD System Level: Physics, Testing, Debugging of Soft and Hard Failures NEW/REVISED 8:30 a.m. - 12:00 p.m. DD103: An Overview of Integrated Circuit ESD: The ESD Threat, Testing, Design Concepts, and Debugging 8:30 a.m. - 12:00 p.m. FC360: Electrical Overstress (EOS) in Manufacturing and Test 8:30 a.m. - 12:00 p.m. FC200: Packaging Principles for the Program Manager (PrM) 8:30 a.m. - 10:00 a.m. DD213: ESD, EOS, and Latch-up Failure Analysis for Designers 10:30 a.m. - 12:00 p.m. DD300: Circuit-Level Modeling and Simulation of On-Chip Protection (DD) 1:00 p.m. - 4:30 p.m. DD340: Integrated ESD Device and Board Level Design NEW 1:00 p.m. - 4:30 p.m. DD319: Physical Process, Device, and Circuit Simulation (TCAD) Methodologies in Application to Industrial ESD Research and Design 1:00 p.m. - 4:30 p.m. FC215: Device Technology and Failure Analysis Overview (PrM) 1:00 p.m. - 4:30 p.m. DD/FC380: Electrostatic Calculations for the Program Manager and the ESD Engineer (PrM) 1:00 p.m. - 2:30 p.m. DD203: Designing ESD Protection for RF and mmWave CMOS Circuits 3:00 p.m. - 4:30 p.m. DD317: ESD Challenges in Advanced FinFET and Gate-All-Around Nanowire CMOS Technologies NEWReception 5:00 p.m. - 6:00 p.m. Professional and Technical Women’s Reception Welcome Reception 6:00 p.m. - 9:00 p.m. Exhibits Open

TUESDAY, SEPTEMBER 12, 2017Registration 7:30 a.m. - 5:00 p.m.Awards Breakfast 7:30 a.m. - 9:45 a.m. Annual Meeting and Awards BreakfastKeynote 9:00 a.m. - 9:45 a.m. The Mission and some Challenges Dr. Alicia R. AllbaughExhibits Open 9:30 a.m. - 5:30 p.m.Technical Sessions 10:10 a.m.-10:20 a.m. Exhibitor Showcase in Session 1A and 1B 10:20 a.m.-12:00 p.m. 1A: Advanced CMOS I 10:20 a.m.-12:00 p.m. 1B: Manufacturing I 1:10 p.m. - 2:40 p.m. Hands On Session I 1:10 p.m. - 2:40 p.m. Measurement in ESD Control Standards 1:10 p.m. - 1:20 p.m. Exhibitor Showcase in Sessions 2A and 2B 1:20 p.m. - 2:35 p.m. 2A: RF / High Voltage I 1:20 p.m. - 2:35 p.m. 2B: ESD Failure Case Studies I 3:20 p.m. - 3:30 p.m. Exhibitor Showcase in Sessions 3A and 3B 3:30 p.m. - 5:10 p.m. 3A: System Level ESD I 3:30 p.m. - 5:10 p.m. 3B: EOS/ESD EDA Tools 3:30 p.m. - 3:40 p.m. Exhibitor Showcase in Invited Speaker Session 3:40 p.m. - 5:00 p.m. Invited Speaker Session 3:40 p.m. - 4:25 p.m. I: Beyond S20.20: Explosives 4:25 p.m. - 5:00 p.m. II: IoT Challenges for ManufacturingStudy Session 5:00 p.m. - 6:00 p.m. Calculations and ESD Scenarios Review for ESD Program Manager Exam Preparation (STUDY SESSION) Workshops A 5:30 p.m. - 7:00 p.m. A.1 EDA for Latch-up: Which are the Most Suitable Approaches? A.2 ESD and EMI Codesign – a Topic Both for IC and PCB Designers “World- Café Style” Format A.3 Machine Model and the Impact on Manufacturing A.4 A Best Practice Procedure for EOS Analysis in the Automotive Industry - How Can We Improve Our Knowledge Sharing?

NEW!

NEW!

EOS/ESD Association Symposium THE WESTIN LA PALOMA RESORT AND SPA 3800 E. Sunrise Drive Tucson, AZ 85718

6

THRESHOLDTM


EOS/ESD Symposium

Register Today! www.cvent.com/d/x5q0sx

WEDNESDAY, SEPTEMBER 13, 2017Registration 7:30 a.m. - 5:00 p.m.Exhibits Open 8:30 a.m. - 1:30 p.m.Technical Sessions 8:00 a.m. - 8:40 a.m. Year in Review: The Birth and the Life of an EOS/ESD Association, Inc. Standard 9:10 a.m. - 9:20 a.m. Exhibitor Showcase in Session 4B 9:20 a.m. - 11:10 a.m. 4B: Manufacturing II 9:30 a.m. - 9:40 a.m. Exhibitor Showcase in Session 4A 9:40 a.m. - 11:20 a.m. 4A: On-Chip Physics 1:05 p.m. - 3:05 p.m. Hands On Session II 1:05 p.m. - 1:35 p.m. II.A How to Detect ESD Events by EMI (ESD Event Detectors, Antenna, and Scope)? 1:35 p.m. - 2:05 p.m. II.B Detecting and Solving EMI Problems in Manufacturing 2:05 p.m. - 2:35 p.m. II.C Measuring Grounds in a Facility 2:35 p.m. - 3:05 p.m. II.D ESD Field Measurement Pitfalls and ESD Voltage Suppression Demonstration (ANSI/ESD S20.20 and IEC61340-5-1 Differences) 1:35 p.m. - 2:50 p.m. 5A: Testing I 1:35 p.m. - 2:50 p.m. 5B: RF / High Voltage II 3:20 p.m. - 5:00 p.m. 6A: System Level ESD II 3:20 p.m. - 4:35 p.m. 6B: Advanced CMOS II 3:25 p.m. - 5:10 p.m. Short Tutorial Session I: 3:25 p.m. - 4:00 p.m. I.A Cable Discharge Events in Assembly and Testing 4:00 p.m. - 4:35 p.m. I.B Packages, Tape & Reel, Trays, and Others: How to Assess ESD Compliance? 4:35 p.m. - 5:10 p.m. I.C New Methods of Air Ionizer Performance TestingWorkshops B 5:30 p.m. - 7:00 p.m. B.1 Friendly ESD Integration of 3rd Party IP in SoCs? B.2 One Year after The Industry Council White Paper 4 Release B.3 Beyond ANSI/ESD S20.20: High Reliability ESD Control Processes and Lower ESD Sensitivities B.4 HBM and CDM Standards – Recent Advances and Application to Devices 7:00 p.m. - 9:00 p.m. General Chair’s Reception Open to all Symposium Attendees! THURSDAY, SEPTEMBER 14, 2017Registration 7:30 a.m. - 5:00 p.m.Technical Sessions 8:00 a.m. - 8:40 a.m. Year in Review: Transmission Line Pulse Testing for ESD 8:50 a.m. - 10:20 a.m. Discussion Group Session DG.A CDM Manufacturing Controls for Class 0 (0B & 0A) DG.B Electrical Overstress in Manufacturing – Mitigation Strategies and Standards DG.C ESD Control Program Management for Contract Manufacturing 8:50 a.m. - 10:05 a.m. 7A: ESD Failure Case Studies II 10:25 a.m. - 11:40 a.m. 8A: Testing II 10:40 a.m. - 12:25 p.m. Short Tutorial Session II 10:40 a.m. - 11:15 a.m. II.A ANSI/ESD STM11.31: Describe the Test Method and the Differences Between Good and Bad Bags 11:15 a.m. - 11:50 a.m. II.B Charged Board Event and the Correlation to Charged Device Model 11:50 a.m. - 12:25 p.m. II.C “Meet the Standard” with History, Background, and Contents 11:40 a.m. - 11:45 a.m. On-Chip ESD Design Technical Session Closing 12:25 p.m. - 12:30 p.m. EOS/ESD in Manufacturing Technical Session ClosingTutorials 8:00 a.m. - 4:30 p.m. FC390: Basics of ESD Process Assessment 8:30 a.m. - 12:00 p.m. DD260: Design for EOS Reliability NEW 8:30 a.m. - 12:00 p.m. FC210: ESD Standards Overview for the Program Manager (PrM) 8:30 a.m. - 12:00 p.m. FC120: Air Ionization Issues and Answers for the Program Manager (PrM) 1:00 p.m. - 4:30 p.m. DD220: Transmission Line Pulse (TLP) Basics and Applications (DD) 1:00 p.m. - 4:30 p.m. FC262: Electrical Fields and Particles - Practical Considerations for the Factory NEW 1:00 p.m. - 4:30 p.m. FC110: Cleanroom Considerations for the Program Manager (PrM) 1:00 p.m. - 2:30 p.m. DD381: Electronic Design Automation (EDA) Solutions for ESD 3:00 p.m. - 4:30 p.m. DD382: Electronic Design Automation (EDA) Solutions for Latch-up

FRIDAY, SEPTEMBER 15, 2017 8:00a.m.-5:00p.m. DeviceDesignCertificationExam 8:00a.m.-5:00p.m. ProgramManagerCertificationExam

NEW!

NEW!

NEW!

NEW!

EOS/ESD Association Symposium THE WESTIN LA PALOMA RESORT AND SPA 3800 E. Sunrise Drive Tucson, AZ 85718

7

THRESHOLDTM


May 14-18, 2018 at Priory Corsendonk, Oud Turnhout, Belgiumhttps://www.esda.org/index.php/events/iew/

2018 International Electrostatic Discharge WorkshopLocated among century-old forests, the historic Priory Corsendonk provides a picturesque setting with a relaxed and invigorating atmosphere to engage in discussions about the latest issues confronting the ESD and EOS communities. The workshop will include invited seminar speakers, discussion groups, invited talk speakers, technical presentation

IEW12th Annual International Electrostatic Discharge Workshop

Call For Presentations

sessions, and special interest groups. The IEW is the perfect opportunity to submit late-breaking and exciting new research to stimulate discussion and interaction around new ideas, encouraging new research topics. To maintain the unique IEW experience and provide ample opportunity for discussion, there will be an increased focus on discussion groups and invited speakers in 2018. The IEW

workshop presentation format for technical sessions will begin with each author presenting a brief summary to highlight key findings, followed by an interactive poster-based discussion session among authors and attendees. The IEW is closely aligned with the EOS/ESD Symposium for collaborative conference activities.

WearablesWith wearables a new class of mobile devices, such as smart watches, health tracking bracelets, and virtual reality glasses, has emerged recently and will expand strongly in coming years. These battery-operated devices can be characterized by having a high content of advanced electronics in a very small form factor. The combination of sensitive low-power electronics, tiny module sizes and frequent exposure to ESD events in the daily use environment bears challenges for the ESD protection of such devices. Submit your abstract covering the ESD challenges of wearables and discuss your and your peer’s experiences during the IEW workshop.

Automotive Applications ESD/EMCThe electronic content of automobiles is increasing, leading to more complex electronic modules and system design. Integration of ICs and discrete devices is demanding, considering the module level EMC testing and reliability requirements. The IEW invites contributions that address ESD and EMC challenges in automotive systems design, including complying with standards such as bulk current injection (BCI), direct power injection (DPI), IEC-61000-4-2, ISO-10605, and ISO-7637.

Abstract Submission Deadline October 2, 2017

Electrical Overstress (EOS)EOS continues to be one of the single EOS continues to be one of the largest causes of customer returns in the semiconductor industry. Have you recently completed root-cause analysis on a failure with an electrical induced physical damage (EIPD) signature? There is not a defined procedure to determine absolute maximum ratings (AMR) for a product. Do you have a methodology for defining AMR for a product, and verifying it for different timescales? Are you an FA engineer with experience on case studies identifying EOS damage mechanisms and the ensuing physical evidence? Finding sources of EOS can be a challenge. Do you have experience auditing a manufacturing site for sources of EOS? Bring your work to the IEW and share it with your colleagues.

EDA for Latch-up ToolsEDA tools for ESD and latch-up verification have significantly matured in the past few years. The ESD Association’s EDA working group continues working on the subject. While initially the focus was primarily on ESD it now includes latch-up. A technical report is planned for release prior to IEW 2018 to begin discussions. We invite you to submit posters presenting your ideas and experiences for Latch-up tools.

Other topics and areas to consider for abstract submissions include:

Anomalous/Unresolved ESD IssuesRandom and unrepeatable ESD failures, case histories, ESD tester correlation issues, or unique window failures.

System-Level ESD/EOS IssuesOn- and off- chip IEC protection clamps, component/system ESD co-design case studies, cable discharge clamps, transient latch-up, design of system-level clamp circuits, system level ESD test issues and scan techniques, and ESD-induced soft errors.

Failure Analysis TechniquesLocating failure sites, in particular for CDM, imaging techniques, correlating FA identified damage site with ESD stress, distinguishing EOS-like failures from ESD failures, and unusual failure modes.Technology Integration IssuesESD sensitivity with technology transfers, 3D IC ESD design issues, qualification challenges for different fabs, unusual problems of process interaction with ESD, process monitor methods, and technology scaling issues.

cont. on page 2

®

FOCUS TOPICS FOR IEW 2018

8

THRESHOLDTM

2018 International Electrostatic Discharge Workshop c/o EOS/ESD Association, Inc.7900 Turin Road, Bldg. 3Rome, NY 13440Phone: [email protected]

Management CommitteeManagement Committee ChairMirko Scholz, imecTechnical Program ChairMototsugu Okushima, Renesas Elec-tronicsKeynote ChairBart Keppens, SoficsInvited Speaker and Seminar Co-Chairs:Eleonora Gevinti, STMicroelectronicsTheo Smedes, NXP SemiconductorsDiscussion Group and Special Interest Group Co-ChairsJoost Willemen, Infineon TechnologiesHeinrich Wolf, Fraunhofer EMFTAudio/Visual ChairsShih-Hung Chen, imecFabrice Caignet, LAAS/CNRSIndustry Council AdvisorCharvaka Duvvury, ESD Consulting, LLC

ESDA HQ ChairChristina EarlESDA Director of EventsAlan Righter, Analog DevicesESDA Executive DirectorLisa Pimpinella

Technical Program CommitteeTo be announced

Lodging & FacilitiesThe IEW will retreat in a priory founded in 1395, in Corsendonk, Belgium. The Priory of Corsendonk is hidden in the green woods of Oud-Turnhout and is surrounded by centuries-old trees and pastures. On this estate lies a guesthouse which has provided shelter for travelers throughout the centuries. There are spacious standard rooms and small but charming monk rooms, each equipped with private bathroom facilities, telephone, and internet access. The relaxed setting and the absence of distractions encourages extensive interaction among the workshop attendees. Lodging and all meals are included in the registration cost for the workshop. Attendees are allowed to bring guests who will be charged separate fees.

Submission Instructions - Deadline October 2, 2017Please prepare your abstract in the form of a short powerpoint presentation. After the title slide, the second slide of the presentation should describe the objective and significance in a 200 word summary. The presentation should not exceed 5 additional slides; with representative data and figures that will be the foundation for the poster you plan to present at the workshop. A template is available to download from https://www.esda.org/index.php/events/iew/. Please email your presentation abstract (maximum file size 2 MB) in MS PowerPoint® format including title, author affiliation, and e-mail address to [email protected] no later than October 2, 2017.Notification of acceptance will occur by October 23, 2017. Final, full presentations for the workshop in MS PowerPoint® format must be received by April 16, 2018.There will be no published proceedings of the workshop. Registered attendees will receive a copy of all IEW presentations. For any questions please contact the Technical Program Chair, Mototsugu Okishima, ([email protected]).The IEW encourages student submissions by providing a 50% discount in registration fees for a limited number of student presenters. Proof of student status must be submitted along with the abstract for the workshop presentation.Please check our web page at https://www.esda.org/index.php/events/iew/ for regular updates on the workshop. As it becomes available, we will post information on the full technical program including the seminar topics, the keynote speaker, the technical sessions, as well as the discussion group and special interest group topics. In addition to peer-reviewed presentations, attendees will also have the option to present non-peer-reviewed posters at the workshop. Please also go to the web page for information on workshop registration, the Priory of Corsendonk, and the Oud-Turnhout area.

EDA ToolsEDA verification and simulation tools, techniques, design-flows, best practices, experiences with foundry rule decks, commercial tools, and custom tooling.

Novel On-Chip Protection Clamps and Circuit ConfigurationsNew clamp devices and clamp configurations, methods to increase the failure threshold of protected devices, high voltage clamps for automotive and power amplifiers, new chip protection concepts, and low-capacitance clamps for RF and high speed interfaces.ESD Test Characterization, Methods, and IssuesTLP & VF-TLP debug and device characterization methods, correlation of TLP & VF-TLP tests with standard qualification tests, HBM and CDM tester artifacts, unresolved test results and failures, issues relating test qualification levels to real-world exposure, test chip methodology, cable discharge test methods, and test standards issues.

NEWPeople’s Choice Award will be

awarded to a poster chosen by the

attendees.

9

THRESHOLDTM


Setting the Global Standards for Static Control! EOS/ESD Association, Inc. 7900 Turin Rd., Bldg. 3 Rome, NY 13440-2069, USA

PH +1-315-339-6937 • Email: [email protected] • www.esda.org

Conference Center, COEX in Seoul, KOREAMarch 19-20, 2018 Tutorials

March 21-22, 2018 Manufacturing Symposium and Exhibition

March 23, 2018 EOS in Automotive Tutorial March 23, 2018 Professional Program Manager

Certification Exam

The U.S. EOS/ESD Association and the Korea ESD Association (local chapter) are working together to present presentations featuring factory, design, and testing issues along with the 2018 EOS/ESD Manufacturing Symposium for Factory Issues – Korea.

2018 EOS/ESD Manufacturing Symposium in Asia

Korea ESD Association www.esd.or.kr

Corporate Sponsors:

Sponsored by EOS/ESD AssociationCo-sponsored by Korea Chapter of ESD Association

EOS/ESD Association, Inc.www.esda.org

Abstract Submission Deadline November 1st, 2017

Call For Presentations

10

THRESHOLDTM


2

Submission InstructionsYour abstract (two pages including reasonably sized figures) must clearly present the data and the significance of the results. Please email your pre-sentation abstract including title, au-thor affiliation, and email address to [email protected] by the Wednesday, November 1, 2017 deadline. The sub-mission format is a PDF® file (Adobe Acrobat®). Notification of acceptance will occur by December 4, 2017. Final, full presentations for the EOS/ESD Manufacturing Symposium Issues in MS PowerPoint® format must be re-ceived by Feburary 23, 2018. These MS PowerPoint® slides will be includ-ed in the presentation handout that will be distributed during the Sympo-sium. There will be no published pro-ceedings of the Symposium. Techni-cal papers that have been previously published may be considered. For questions please contact the Tech-nical Program Chair: Joshua Yoo at [email protected] visit the ESDA website at www.esda.org/symposia.html or the Korea local chapter at www.esd.or.kr for regular updates on the Sympo-sium. As it becomes available, we will post information on the full technical program including seminars, technical sessions, and exhibits. Visit the web page for information and other details.**Note: Presenters of accepted papers (1 per paper) register at half price.

I. EOS/ESD Factory Level and Materials Technology• Packaging and Handling• Case Studies, Reviews and Analysis• Electrical Overstress problems in the Automotive industry (production and field)• Test Methods and Procedures• Troubleshooting Techniques• Air Ionization and Uses• Facility Design• ESD Shunting Packaging Technology• ESD Control Materials• ESD Detection and Measurement Techniques• Management Issues (cost/benefit analysis etc.)

Technical Program Committee:Joshua Yoo, Core Insight (TPC Chair)

Hangu Kim, Samsung Semiconductor Manho Seung, SK HynixDongsun Kim, LG DisplayByongsu Seol, Samsung ElectronicsYongrae Kim, Continental AutomotiveInderjit Singh, InnospectraJerry Rivera, I-Con TechReinhold Gartner, InfineonJohn Kinnear, IBM

Management Committee Chairs: Reinhold Gaertner, Infineon Technologies John Kinnear, IBM

Local Management Committee:Hangu Kim, Samsung Semiconductor Manho Seung, SK HynixDongsun Kim, LG DisplayByongsu Seol, Samsung ElectronicsYongrae Kim, Continental AutomotiveElly Koo, Core InsightJoshua Yoo, Core Insight

ESDA HQ Executive DirectorLisa Pimpinella

2018 EOS/ESD Manufacturing Symposium in Asia

Abstract Submission Deadline November 1st, 2017



II. EOS/ESD Standards – Components, System, Factory & Materials• Test Methods and Procedures• Standards - Comparisons and Analysis• ESD Control Program Development• Reporting and feedback communication issues during (EOS) failures • Case Studies• Round-Robin Testing, Results and Analysis

III. System Level EOS/ESD/EMC• Test methods• System Level modeling• Case studies, analysis• Standards

11

THRESHOLDTM


40th Annual ELECTRICAL OVERSTRESS/ ELECTROSTATIC DISCHARGE SYMPOSIUM

Sept 23-28, 2018 Peppermill Resort and Casino Reno, NV, USA

CALL FOR PAPERS TRACK 1: EOS/ESD in Manufacturing – Control Materials, Technologies, and Techniques

Parallel TRACK 2: On-Chip ESD Design, including System Level ESD, Testing, and ESD Case Studies

Submission Deadline: March 5, 2018 About the New “EOS/ESD in Manufacturing” Track For the second year, “EOS/ESD in Manufacturing” offers a full track of activities dedicated to EOS/ESD in manufacturing – control materials, technologies and techniques. This manufacturing track focuses on a combination of full technical papers, short papers, poster presentations, invited papers, discussion groups and workshops, hands-on demonstration sessions, and practical demonstrations of equipment by current exhibitors. The Call for Papers describes the offerings and submission requirements. Each abstract submission selects the track, format, and suggested area using the abstract toolkit available on the EOS/ESD Association, Inc. website www.esda.org. Parallel Track Options are:

1. EOS/ESD IN MANUFACTURING - CONTROL MATERIALS, TECHNOLOGIES, AND TECHNIQUES □

2. ON-CHIP ESD DESIGN, INCLUDING SYSTEM LEVEL ESD, TESTING, AND ESD CASE STUDIES □

SUGGESTED SUBMISSION AREA FROM PAGE 3: SUGGESTED SUBMISSION AREA FROM PAGE 4:

STUDENT PAPER □ STUDENT PAPER □

FULL TECHNICAL PAPER □

CONSIDER THIS SUBMISSION FOR POSTER SESSION □ SHORT TECHNICAL PAPER OR WHITE PAPER WITH

PRESENTATION OF CASE STUDIES □

CONSIDER THIS SUBMISSION FOR POSTER SESSION □

POSTER SESSION □

DISCUSSION GROUP □

WORKSHOP □

HANDS-ON DEMONSTRATION □

FULL TECHNICAL PAPER □ DISCUSSION GROUP □

WORKSHOP □

POSTER SESSION □

12

THRESHOLDTM


EOS/ESD Symposium CALL FOR PAPERS TRACK 1: EOS/ESD in Manufacturing – Control Materials, Technologies, and Techniques Parallel TRACK 2: On-Chip ESD Design, including System Level ESD, Testing, and ESD Case Studies Submission Deadline: March 5, 2018

About the EOS/ESD Symposium EOS/ESD Association, Inc. is sponsoring the 40th Annual Symposium on Electrical Overstress (EOS) and Electrostatic Discharge (ESD) effects. The Symposium is dedicated to the understanding of issues related to electrostatic discharge and electrical transients / overstress, and the application of this knowledge to the solution of problems in consumer, industrial, and automotive applications, including electronic components and manufacturing, as well as in systems, subsystems, and equipment. Papers/Contributions The Technical Program Committee solicits symposium contributions, including data and analysis that advance the state-of-the-art knowledge, enhance or review the general knowledge, or discuss new topics related to EOS/ESD. Electronic Submissions Abstract submissions shall be made electronically via an emailed PDF file to [email protected]. One file for each submission is required. Deadlines The abstract submission deadline is Monday, March 5, 2018. Abstracts not meeting guidelines may not be accepted. The final submission deadline for the finished papers is Friday, June 8, 2018. ESDA reserves the right to withdraw any paper or presentation that does not meet the guidelines, including deadlines. Your paper MUST be submitted by the deadline. Final full technical papers will be limited to a maximum of 10 pages - guidelines will be provided after acceptance of the paper.

Paper Acceptance The Technical Program Committee accepts unpublished papers for peer review with the understanding that the author will not publish the work elsewhere prior to presentation at the Symposium. Presentation of your work at the earlier International ESD Workshop (IEW) or the Symposium for Manufacturing Issues will not preclude your Annual Symposium abstract submission. The submission must follow guidelines and be expanded significantly in the abstract submission for the EOS/ESD Symposium. Publication of accepted papers in any form prior to presentation at the Symposium may result in the paper being withdrawn from the Symposium Proceedings. Authors must obtain appropriate company and government clearances prior to submitting their abstracts. Paper Awards and Recognition Awards are presented annually for the Symposium Outstanding Paper (selected by Symposium attendees), the Best Paper (selected by the Technical Program Committee), and the Best Student Paper. The Best Paper is considered for presentation at the RCJ EOS/ESD Symposium in Japan. The Outstanding Paper is considered for presentation at the ESD Forum in Germany. Eligible student contributions for the Best Student Paper Award should be marked as such by the authors at the time of abstract submission. Accepted full technical papers covering selected topics may be considered for review for invited publications in IEEE Transactions on Device and Materials Reliability (TDMR), IEEE Transactions on Electron Devices, the Microelectronics Reliability Journal, the Journal of Electrostatics, or other appropriate publications.

Sponsored by EOS/ESD Association, Inc. in cooperation with IEEE. Technically co-sponsored by the Electron Devices Society.

THRESHOLDTM


Papers / Presentations / Group Sessions in Track 1. EOS/ESD in Manufacturing – Control Materials, Technologies, and Techniques are solicited in the following areas and formats:

A. Full Technical Paper Authors must submit a maximum 50 word abstract and 4-page maximum summary of their work. The summary must clearly state the purpose, results (e.g., data, diagrams, photographs, etc.), and conclusions of the work. Summaries must also include references to prior publications and state how the work enhances existing knowledge. Authors suggest the appropriate technical area related to their submission. Authors are required to use the abstract submission toolkit available on the EOS/ESD Association, Inc. website www.esda.org.

B. Short Technical Paper or White Paper with Presentation of Case Studies Authors must submit a maximum 50 word abstract and 2-page maximum summary of their work. The summary must clearly state the purpose, results (e.g., data, diagrams, photographs, etc.), and conclusions of the work. Summaries must also include references to prior publications and state how the work enhances existing knowledge. Authors suggest the appropriate technical area related to their submission. Authors are required to use the abstract submission toolkit available on the EOS/ESD Association, Inc. website www.esda.org.

C. Poster Session Authors must submit abstracts in the form of a short PowerPoint presentation. After the title slide, the second slide of the presentation should describe the objective and significance in a maximum 200 word summary. The abstract presentation should not exceed 5 additional slides; with representative data and figures that will be the foundation for the longer poster maximum of 24 slides that you plan to present. A formal five minute presentation is given by each author followed by the poster session. Authors are required to use the abstract submission toolkit available on the EOS/ESD Association, Inc. website www.esda.org.

D. Workshops and Discussion Groups Proposals for workshops and discussion groups must be submitted with an abstract describing the proposal. The abstract toolkit is used to indicate participation as a workshop moderator or committee participant. Workshops address fundamentals and generally accepted techniques. Topics consider present and future challenges and solutions to problems. Discussion Groups address EOS/ESD novel ideas. Ideas consider new developments or common myths dispelled. The discussion should encompass some provocative points of view.

E. Hands-on Demonstration Sessions Proposals for hands-on demonstrations of measurement techniques must be submitted with an abstract defining the presentation and measurement. Authors complete a presentation describing the measurement technique followed by a hands-on station for attendees to perform the measurement as described. Application, limitations, and common pitfalls should be discussed. Authors are required to use the abstract submission toolkit available on the EOS/ESD Association, Inc. website www.esda.org. (Note: ESDA does not provide equipment).

Track 1 Suggested Submission Areas:

ESD Packaging and Handling Procedures

EOS/ESD Detection and Measurement Techniques

ESD Facility Design, Mitigation in Test and Manufacturing; Ionization

Manufacturing EOS/ESD Case Studies, Reviews and Analysis

EOS/ESD Process Assessment

ESD Control Materials and Use of Antistatic Materials

ESD Issues in 2.5D & 3D Stacking and TSV

Control Program Topics (Cost/Benefit Analysis, training, etc.)

ESD control in Graphic Arts, Explosives & Pyrotechnics, Oil/Petroleum/Biomedical/Chemical Industry

Standards – Comparison and Analysis

Contact information for questions or further information:

EOS/ESD Association, Inc. Lisa Pimpinella

EOS/ESD Association, Inc. 7900 Turin Road, Building 3

Rome, NY 13440 USA Phone: (+1) 315-339-6937

e-mail: [email protected]

Technical Program Chair Lorenzo Cerati

STMicroelectronics Agrate Brianza, Italy

Phone: (+39) 039-603-7325

e-mail:[email protected]

EOS/ESD in Manufacturing Chairs: Wolfgang Stadler, Intel Deutschland GmbH; Michelle Lam, IBM

THRESHOLDTM


Technical Program Chair Lorenzo Cerati

STMicroelectronics Agrate Brianza, Italy

Phone: (+39) 039-603-7325 e-mail: [email protected]

EOS/ESD Association, Inc. Lisa Pimpinella

EOS/ESD Association, Inc. 7900 Turin Road, Building 3

Rome, NY 13440 USA Phone: (+1) 315-339-6937

e-mail: [email protected]

Papers / Presentations for Track 2. On-Chip ESD Design track, including System Level ESD, ESD Testing, ESD Case Studies are solicited in the following areas:

A. Full Technical Paper Submission Authors must submit a maximum 50 word abstract and 4-page maximum summary of their work. The summary must clearly state the purpose, results (e.g., data, diagrams, photographs, etc.), and conclusions of the work. Summaries must also include references to prior publications and state how the work enhances existing knowledge. Authors suggest the appropriate technical area related to their submission. Authors are required to use the abstract submission toolkit available on the EOS/ESD Association, Inc. website, www.esda.org.

B. Workshops and Discussion Groups Proposals for workshops and discussion groups must be submitted with an abstract describing the proposal. The abstract toolkit is used to indicate participation as a moderator or committee participant. Workshops address fundamentals and generally accepted techniques. Topics consider present and future challenges and solutions to problems. Discussion Groups address EOS/ESD novel ideas. Ideas consider new developments or common myths dispelled. The discussion should encompass some provocative points of view.

C. Poster Session Authors must submit abstracts in the form of a short PowerPoint presentation. After the title slide, the second slide of the presentation should describe the objective and significance in a 200 word maximum summary. The abstract presentation should not exceed 5 additional slides; with representative data and figures that will be the foundation for the longer poster maximum of 24 slides that you plan to present. A formal five minute presentation is given by each author followed by the poster session. Authors are required to use the abstract submission toolkit available on the EOS/ESD Association, Inc. website, www.esda.org.

Track 2 Suggested Submission Areas: I. Advanced CMOS (Analog/Digital) EOS/ESD and Latch-up

ESD Issues in Advanced Technologies (Multi-gate, FinFET, SOI, SiGe, Compound, Graphene, nanowire, etc.)

On-Chip ESD Protection Devices & Techniques in Advanced CMOS Technologies

IC Design and Layout Issues

Circuit Simulation of EOS/ESD Events in Advanced CMOS Technologies

DC/Transient Latch-up Issues and Solutions, Troubleshooting, Simulation

ESD Issues in 2.5D & 3D Stacking and TSV II. ESD Protection in Bipolar, RF, High Voltage and BCD Technologies

ESD Issues in Bipolar, RF, High Voltage and BCD Technologies and power Technologies (SiC, GaN, etc.)

On-Chip ESD Protection Devices & Techniques in Bipolar, RF, High Voltage and BCD Technologies

IC Design and Layout Issues

Circuit Simulation of EOS/ESD Events in Bipolar, RF, High Voltage and BCD Technologies

DC/Transient Latch-up Issues and Solutions, Troubleshooting, Simulation

ESD Circuit Simulation and Co-Design III. Numerical Modeling and Simulation for On-Chip ESD Protection

ESD Device TCAD Simulation Simulation Tool and Methodology

Numerical Modeling and Physics of EOS/ESD Events TCAD/Circuit Co-simulation

IV. EOS/ESD Failure Analysis, Troubleshooting and Case Studies EOS/ESD Case Studies, Reviews and Analysis EOS/ESD Phenomena in MEMS (Microelectromechanical

Systems) Failure Analysis Techniques and Interpretations

EOS/ESD Component Failure Analysis Testing of MR/TMR Heads and Ultra-Sensitive Devices EOS/ESD Protection for Aircraft, Spacecraft and Avionics

V. Device Testing: Testers, Methods and Correlation Issues

Transmission Line Pulse Testing Systems Novel EOS/ESD Test Methods Novel TLP Measurement Results

HBM, CDM Tester Issues and Solutions Tester Correlation Issues Standards – Round-Robin Testing, Results and Analysis

VI. System Level EOS/ESD/EMC, HMM System Level EOS/ESD/EMC Test Methods System Level EOS/ESD Modeling and Simulation EOS/ESD Simulators, Calibration and Correlation

Transient ESD/EMI Induced Upset Case Studies, Reviews and Analysis Standard Test Boards as an Early Measure of Robustness

VII. Chip/Module/Package EOS/ESD Electronic Design Automation Novel EOS/ESD EDA Tools ESD Checking and Verification Methodology

Application of EDA tools for EOS/ESD Failure Analysis, Design and Verification

Contact information for questions or further information:

15

THRESHOLDTM


Standards Summary July 2017 Virtual Meeting Series

WG1.0 – Wrist Straps.The committee reviewed working group member comments on ESD TR1.0-01. The committee also started the five-year review of ANSI/ESD S1.1 – wrist straps.

WG3.0 – Ionization. The committee discussed x-ray safety enclosure concerns relative to the new standard practice document currently being developed. The committee also reviewed the current document for ESD WIP3.5 - test methods for air assist bar ionizer, soft x-ray (photon) ionizers, alternative room ionization, and non-airflow alpha ionizers. The document is scheduled for review by the technical and advisory support committee before the September meeting series.

WG4.0 – Worksurfaces. The working group reviewed changes to the previously suggested adjudication of technical Standards Committee comments on ESD WIP4.1 – worksurfaces – resistance measurements.

WG5.0 – Device Testing.The committee reviewed and made suggested changes to the current work in progress document on device ESD data sheet standard format. A decision was made to submit the document as a standard practice instead of a technical report.

JWG – (HBM) Device Testing.The joint working group discussed the treatment of exposed pads and the steps required to include the subject in the next revision of ANSI/ESDA/JEDEC JS-001. The committee is still exploring how to classify exposed die attach pads that use non-conductive adhesive. The joint working group also discussed a definition of “pin” and a recommendation on how to stress ICs with 10 pins or less. There was a brief discussion on the status of the user guide for ANSI/ESDA/JEDEC JS-001; a revision is expected soon.

JWG – (CDM) Device Testing.A brief overview of CDM, the history of the CDM joint working group, and current documents in process was given. A presentation on CDM measurement errors was presented by a working group member. An update on the status of a new standard practice, ESD WIP5.3.3, low-impedance contact CDM as an alternative CDM characterization method, was also given.

WG5.4 – (TLU) Device Testing.The committee continued discussions on new topics for the working group to explore after the current standard practice being developed is published.

WG5.5 – (TLP) Device Testing.A presentation was given on three new sections being propose for the user and application guide technical report currently being written. The working group also reviewed the status of a technical report on transient response.

WG5.6 – (HMM) Device Testing.An introduction of the working group’s documents and on-going activities was presented. A short update on single lab testing at a German lab and planned edits to ANSI/ESD SP5.6 during the five-year review cycle was also dis-cussed. A presentation was given on source impedance measurements with a 50-ohm HMM pulser based tester.

16

THRESHOLDTM

September/October 2017WG7.0 – Flooring.This working group is reactivated for the five year review of ANSI/ESD STM7.1. The group reviewed the existing content in the document as well as comments received from an industry user. An open discussion was held for additional comments or questions from industry users and further feedback was requested for consideration during the five year review.

WG11.0 – Packaging. The working group discussed the current status of the five year review for ANSI/ESD S541 and ANSI/ESD STM11.31. A request was made for volunteers to complete testing prior to the September meeting series related to the equip-ment requirements in ANSI/ESD STM11.13 to address industry concerns. A presentation was also given on a new suggested topic for the WG to explore.

WG13.0 – Handtools.The committee reviewed the description of cleaning procedure and solution for cleaning to address the elimination of the influence of contamination on tool handles having any effect on resistance measurements. The document is expected to be submitted for TAS review before the September meeting series. The committee reviewed a technical report on ultrasensitive ESD device non-AC powered tools that includes modifications to reflect the differences in measurement, handling, additional testing procedures and conditions.

WG14.0 – System Level ESD.A presentation was given on “How can ESD compliance to HBM, CDM requirements below 100 volts be proven in a production area?” The presentation showed some of the issues seen in a factory, relating to grounding, CDE, and CBE type events. The presentation was focused on more than CDE and went into other areas resulting in a number of questions. A new standard practice addressing CDE was proposed and a writing team was formed.

WG15.0 – Gloves.The statistics committee presented the round robin testing results. The statistics committee concluded that the test methods in ANSI/ESD SP15.1 are repeatable and reproducible; and the document can be re-designated as a standard test method. The working group started reviewing the current standard practice document and making the necessary revisions to submit the document to TAS for review. The working group also discussed the validity of ESD TR15.0-01-99 - ESD Glove and Finger Cots. Members were asked to review the document and be prepared to discuss recommendations for revision or withdrawal at the September face-to-face meeting.

WG17.0 – Process Assessment.The committee completed discussions and decisions on further assessment flow and measurement techniques based on ESD event detectors in the new standard practice being developed. The committee also continued dis-cussion on integration of ESD WIP10.2 on measurement of CDM related ESD characteristics within automated process equipment. Further discussion is planned for the January 2018 virtual meeting series.

WG18.0 – Electronic Design Automation (EDA).The current status of the latch-up EDA technical report was reviewed and new additions were discussed.

WG19.0 – High Reliability ESD Control Processes.The working group reviewed changes to the current document based on discussions at the April face-to-face meet-ing. Several additional changes were suggested including removing table 2, including verbiage about conductive and dissipative worksurfaces, and clarification on isolated conductors. The document is expected to be submitted for TAS review before the September meeting series.

17

THRESHOLDTM

September/October 2017WG22.0 – ESD Parameters.The committee adjudicated TAS comments on a new technical report for relevant ESD parameters for seamless ESD design and verification flow part 2 – ESD parameters from IP vendors.

WG23.0 – Electrical Overstress (EOS) Best Practices.The working group continued working on a technical report for best practices of EOS mitigation in manufacturing and test including agreement on a new section explaining new definitions of EOS and related terms.

WG25.0 – Charged Board Event.The committee reviewed the proposed slides for a new tutorial being presented at the 2017 EOS/ESD Symposium.

WG26.0 – System ESD Modeling.A presentation was given on a document for “building models for SEED”. The document will be distributed to working group members for review and discussion at the September meeting series. A presentation was given on a snapback model for Spice simulation that includes overshoot and dynamic modeling. Further discussion will be held at the September face-to-face meeting.

WG27.0 – Automotive EOS.The working group reviewed the status of the new standard practice, ESD WIP27.1, related to the information flow regarding EOS issues between automotive OEM, Tier1, and semiconductor manufacturers.

WG53.0 – Compliance Verification.The committee continued updating ESD TR53-01-15 including consolidation of garments into one section, moving the gloves and finger cots section to Annex A, creation of a test procedure for measurement of isolated conductors, and review and discussion on example frequencies for compliance verification. The group also began discussing future revisions of the technical report once the current update is published.

Task Team S20.20 and 625B Harmonization.The committee started suggesting changes to JEDEC JESD625B since the five year revision begins before ANSI/ESD S20.20. Subcommittees were created to address the addition of ESD item product qualification to JEDEC JESD625B and to craft language about safety aspects of conductive surfaces.

18

THRESHOLDTM




EOS/ESD Association, Inc Japan Electronics and Information Technology Industries Association

China ESD Forum Workshop November 6-7, 2017

Canmax, 99 Shuangma Street, Suzhou Industrial Park, Jiangsu, China

Co-Sponsored by:

www.esda.org/events

November 6, 2017 • Real ESD event and failure example in factory/assemble line and ESD control ANSI/ESDA

S20.20 Kevin Duncan, Seagate Technology

November 7, 2017

This special event is planned to be a one-of-a-kind workshop/forum to bring forth the realities of ESD requirements in light of the rapidly advancing semiconductor technologies requiring higher speeds of operations while balanced with much improved worldwide ESD factory control at fabs and assembly areas. It is designed to be a two-day event to bring together key customers and IC quality managers to learn and exchange information about the current issues of ESD requirements, and facilitate all to harmonize towards common goals for product cost savings. The event will cover both adequate background and customer application needs.

The workshop will address:• Efficiency of ESD control methods by Kevin Duncan, Seagate Technology• Practical ESD target levels of today and roadmap by Industry Council chairmen,

Charvaka Duvvury and Harald Gossner• System efficient ESD protection design by Harald Gossner, Intel• Real world and test effects by Hiroyasu Ishizuka, Synaptics; Nobuyuki Wakai, Toshiba

In the panel discussion the lead ESD experts and quality managers will lay out a target roadmap of ESD, useful for suppliers and customers in East Asia.

The event is sponsored by JEITA, Industry Council on ESD Target Levels and EOS/ESD Association, Inc. Those who wish to attend should contact [email protected].

• ESD design target level for ASIC/System ESD and improvement method for system ESD• Panel discussion, the ESD issue in the line and sufficient test method for application/module

EOS/ESD Association, Inc. and JEITA panel: Terry Welsher, Dangelmayer Associates, LLC; Kevin Duncan, Seagate Technology; Charvaka Duvvury, ESD Consulting LLC; Harald Gossner, Intel; Nobuyuki Wakai, Toshiba, Hiroyasu Ishizuka, Synaptics

19

THRESHOLDTM


Setting the Global Standards for Static Control! EOS/ESD Association, Inc. 7900 Turin Rd., Bldg. 3, Rome, NY 13440-2069, USA


2017 EOS/ESD Association, Inc. Tutorials Nov 8-10, 2017

Canmax, 99 Shuangma Street, Suzhou Industrial Park, Jiangsu, ChinaNov 8, 20178:00 AM - 5:00 PM

FC100: ESD Basics for the Program Manager Certification: PrMInstructors: Ginger Hansel, Terry Welsher, Dangelmayer Associates LLC

This tutorial provides the foundation material for understanding electrostatics and ESD and their role in the manufacturing and handling of ESD sensitive devices. The fundamental properties of charge, electric fields, voltage, capacitance, and current are discussed with a view towards understanding key electrostatic phenomena and electrical processes. These include charge generation and decay, material properties, and induction. An overview of device failure mechanisms is presented, including how these models impact ESD control programs. Finally, the course provides an overview of ESD control procedures during handling and manufacturing and an overview of ANSI/ESD S20.20 program requirements. This full day course is required for those in-plant auditors and program managers who are working toward professional ESD certification. The presentation includes many in-class demonstrations, videos, and animated slides.Some sample topics covered in this course are:

Definitions and relationships among important electrical and mechanical properties Causes of charge generation and decay Field effects and voltages Role of capacitance in ESD (Q=CV) Overview of key measurements including common pitfalls of some measurements Review of ESD failure models Understanding and demonstrating electrostatic induction Utility and limitations of air ionization Basic goals of ESD controls Properties of effective ESD control products and materials Overview of ANSI/ESD S20.20 ESD program development requirements

Nov 9, 2017 8:00 AM - 5:00 PM

FC101: How To’s of In-Plant ESD Auditing and Evaluation Measurements Certification: PrMInstructors: Ginger Hansel, Terry Welsher, Dangelmayer Associates LLC

Compliance verification is one of the most important elements of ESD program management and there are many technical and administrative pitfalls that can be avoided. The attendee will learn not only how to make valid auditing measurements in accordance with ESD TR53 – Compliance Verification of ESD Protective Equipment and Materials, but also how to recognize and avoid common pitfalls. Common instruments will be explained as well as the invalid test results that can result when they are used incorrectly. Advanced auditing techniques will also be covered that enable Class 0 devices to be handled successfully. There are many ways to administer effective Compliance Verification programs. Two successful examples will be presented that were developed independently by different companies. Hidden administrative pitfalls that often result in poor compliance will also be discussed. This tutorial will be highly interactive with live demonstrations, in-plant photographs, and compelling video clips. Students will be encouraged to ask questions and to participate in the discussions

REGISTER ONLINE AT WWW.ESDA.ORG/EVENTS/REGIONAL-TUTORIALS/Tutorials are also offered at international locations and in conjunction with EOS/ESD Association, Inc. events worldwide.

For a complete schedule of events visit www.esda.org/events/calendar/

THRESHOLDTM




2017 EOS/ESD Association, Inc. Tutorials Nov 8-10, 2017

Canmax, 99 Shuangma Street, Suzhou Industrial Park, Jiangsu, China

Nov 10, 20178:00 AM - 5:00 PM Essentials for ESD ProgramsFactory: Technologies • Controls • ProceduresInstructors: Ginger Hansel, Terry Welsher, Dangelmayer Associates LLC

This one-day ESD Essentials seminar is a companion to the Basics and How To’s seminars and provides concentrated versions of the remaining 8 tutorials in the ESDA program manager (PrM) certification program:

• Ionization and Answers for the Program Manager• Packaging Principles for the Program Manager• System Level ESD/EMI: Testing to IEC and other Standards• Cleanroom Considerations for the Program Manager• Device Technology and Failure Analysis Overview• Electrostatic Calculations for the Program Manager and the ESD Engineer • ESD Standards Overview for the Program Manager• ESD Program Development & Assessment (ANSI/ESD S20.20 Seminar)

Key concepts and information from the above courses have been selected for this focused, one-day seminar. Examples of electrostatics and ESD calculations are included where appropriate throughout the seminar. Essential ESD technical areas are reviewed such as air ionization, ESD-safe packaging, cleanroom principles, and electrostatic attraction. Standards relevant to these areas are described. Very simple and basic ESD protection circuit concepts and relevant failure analysis techniques are introduced and reviewed. The final section includes charge generation test methods, additional ESDA standards, system level ESD standards and testing, practical auditing techniques and strategies, and ESD event detection. The tutorial concludes with a review of ESD protected areas (EPAs), ESD program management and the application of ANSI/ESD S20.20.

REGISTER ONLINE AT WWW.ESDA.ORG/EVENTS/REGIONAL-TUTORIALS/Tutorials are also offered at international locations and in conjunction with EOS/ESD Association, Inc. events worldwide.

For a complete schedule of events visit www.esda.org/events/calendar/

21

THRESHOLDTM


129 August 2017 9:35 AM



EOS/ESD Association, Inc. Tutorials Co-Sponsored by System Technology and Trading JSC

November 14-16, 2017 Saigon Prince Hotel

Ho Chi Minh City, Vietnam

Publicity Sponsor

NOVEMBER 14, 2017 ESD Basics8:30 a.m. - 12:00 p.m.Instructor: Terry Welsher, Dangelmayer Associates LLCThis tutorial provides the foundation material for understanding electrostatics and ESD and their role in the manufacturing and handling of ESD sensitive devices. The fundamental properties of charge, electric fields, voltage, capacitance, and current are discussed with a view towards understanding key electrostatic phenomena and electrical processes. An overview of device failure mechanisms is presented, including how these models impact ESD control programs. Finally, the course provides an overview of ESD control procedures during handling and manufacturing. The presentation includes in-class demonstrations, videos, and animated slides.Some sample topics covered in this course are:• Definitions and relationships among important electrical and mechanical properties• Causes of charge generation and decay• Electric fields and voltages• Role of capacitance in ESD (Q=CV)• Review of ESD failure models (CDM and HBM)• Understanding and demonstrating electrostatic induction• Utility and limitations of air ionization• Properties of effective ESD control products and materials

ESD Control Workstations: Set-up, Practical Considerations & Measurements (FC155)1:00 p.m. - 4:30 p.m.Instructor: Ginger Hansel, Dangelmayer Associates LLCThe complexity of properly installing workstations is often underestimated, On the ‘surface’ it appears to be a simple installation of an ESD static dissipative mat or ESD hard laminate. However, there are important issues learned from years of experience that impact cost, durability, ESD performance, maintenance, and compliance verification. A good ESD control workstation is the cornerstone of ESD Program Management (EPM). Workstations used in processing ESD susceptible items are intended to maintain a near zero potential by providing ground paths for basic components of the workstation and a connection point for personnel grounding apparatus. The workstation should provide protection from CDM (Charged Device Model) ESD as well as HBM (Human Body Model). This practical tutorial will teach you how to set-up an effective ESD controlled workstation that accomplishes these goals. It will cover selection and qualification of the required materials and how to install them correctly. Other workstation issues will be discussed including: application of ionization, garment grounding, ESD chairs, handling containers, tools and compliance verification consistent with ESD TR53.

THRESHOLDTM




NOVEMBER 15, 2017 How To’s of In-Plant ESD Auditing and Evaluation Measurements (FC101)8:30 a.m. - 4:30 p.m. Certification: PrMInstructors: Terry Welsher, Ginger Hansel, Dangelmayer Associates LLCThis program reviews the evaluation and periodic verification (audit) measurement procedures for the technical requirements specified in the ANSI/ESD S20.20 ESD program development standard. Detailed explanation of instruments, fixtures, and accessories function and usage are provided. Then, the details of “How to” measure are explained and demonstrated. Measurements include those listed in Table 1: Grounding/Equipotential Bonding Requirements; Table 2: Personnel Grounding Requirements; and Table 3: EPA/ESD Control Items. These recommended measurement procedures confirm the proper operation and use of ESD control products and materials selected as part of a facility’s S20.20 ESD control program.Some sample topics covered in this course are:• ANSI/ESD S20.20 Technical Control Requirements• Program Manager’s Approach to Instrumentation and Applications• Testing Ground Circuits and Assessing Connections• Essential Resistance Measurement Procedures and Concerns• Electrostatic Field and Voltage Measurements• Personnel Grounding Considerations vs. ESD Control Points• Product Installation Baseline Measurements• Evaluation, Acceptance, and Audit Procedures for: Ground Systems, Floors, Worksurfaces, Equipment,

Personnel Grounding, Garments, Materials, Production Aids, Packaging, and Ionization Devices• Electrostatic Analysis Measurements including Worksurface Suppression, Footwear/Flooring, and Ionization Decay

This class qualifies for Program Manager Certification. Details at www.esda.org/certification/.

NOVEMBER 16, 2017 Hands-on ESD Measurements & Instruments-Uses and Pitfalls (FC150)8:30 a.m. - 12:00 p.m.Instructor: Ginger Hansel, Dangelmayer Associates LLCAccurate data is the foundation of effective ESD program management. This hands-on tutorial will explain and demonstrate the proper use of ESD test equipment such as static locators, resistance meters, charge plate monitors, and event detectors. We will examine pitfalls of using these common instruments that can result in an incorrect representation of the ESD risk. For example, static locators can give misleading readings if the effects of voltage suppression are not taken into account. We will also discuss the effective use of ionization since ionizers that are not measured, maintained, and located correctly may contribute ESD hazards to the work area. Each student will participate in class exercises to perform these tests. The hands-on experience is the best way to understand the seriousness of the pitfalls and the benefits to taking the proper precautions. What you learn will help you avoid frequent auditing problems and improve your compliance verification program.

ESD Controls for CDM and Ultra-Sensitive Devices and Circuit Boards (FC361)1:00 p.m. - 4:30 p.m.Instructor: Terry Welsher, Dangelmayer Associates LLCAdvanced ESD Controls and Auditing Measurements for Charged-Device Model (CDM) and ultra-sensitive (Class 0) devices and circuit boards are not well known and there are many technical and strategic pitfalls that must be avoided. This tutorial presents practices which address these issues. The CDM and similar events such as Charge-Board Event (CBE) and Cable Discharge Event (CDE) will be described. Industry definitions (threshold levels) for Class 0 will be described and the history of their use reviewed. Students will learn the additional controls and measurements that are needed for CDM and Class 0 devices; how to avoid common pitfalls; and how to use data successfully. Advanced measurements will be described including event detection and high speed current measurements. Students will learn when each measurement type is useful. Compelling case studies will illustrate these techniques and the success they produce. Examples of SOPs (Special Operating Procedures) developed for specific applications will also be discussed.This tutorial is highly interactive with live demonstrations, in-plant photographs, and video clips. Students are encouraged to ask questions and actively participate in the discussions. References to technical literature on CDM and ultra-sensitive devices will be included.

EOS/ESD Association, Inc. TutorialsHo Chi Minh City, Vietnam, November 14-16, 2017

23

THRESHOLDTM




2017 EOS/ESD Association, Inc. Tutorials December 4-5, 2017

EOS/ESD Association, Inc., 7900 Turin Rd. Bldg. 3, Rome, NY 13440

December 4, 20178:30 a.m. - 4:30 p.m. FC170: ESD Training for Internal Auditors and Supplier Quality Ron Gibson, Advanced Static Control Consulting; John T. Kinnear, IBM Corporation

This class has been designed specifically for those individuals who are responsible for:

Performing internal company ESD assessments based on ANSI/ESD S20.20 Conducting a pre-assessment of their facility prior to an external 3rd party assessment Assessing the ESD control programs of their suppliers

This course will use the checklist used by ESDA certified auditors as the basis for the class. However, this class will delve into the meaning behind each of the audit checklist questions in greater detail than is currently found in either the ESD Association registrar certification training or the ANSI/ESD S20.20 ESD program design seminar. After taking this class the student will be able assess a process and determine whether or not it meets the requirements of ANSI/ESD S20.20-2014.

Note: Familiarity with performing assessments is recommended for anyone planning on taking this course.

December 5, 20178:30 AM - 12:00 PM FC164: Costly Controversial ESD MythsTed Dangelmayer, Dangelmayer Associates LLC

There are a number of common misunderstandings and controversies about electrostatic discharge (ESD) program management that can have significant impact on the implementation and maintenance of the ESD program. These misunderstandings or “myths” result in unnecessary expenditures and/or result in a compromise of the program integrity. These myths and controversies, such as latency are often cited by skeptics not wanting to adhere to certain standard ESD procedures. As a consequence, it is important to identify and dispel the myths as well as to understand the potential impact of latent failures.

This tutorial highlights 10 common myths and supporting success studies as well as a success study on latency. The myths and success studies presented here were chosen to provide real-world examples of how an ESD program can be strengthened by understanding the fallacy in each of the myths. This understanding will result in more reliable products that are also more cost competitive. Although not a myth, latency it is a significant reliability consideration that is surrounded with controversy. Some experts will argue that latency is virtually non-existent and others will claim that it is the dominant failure mode. Reality lies somewhere in between. The Latency study cites irrefutable evidence of latent failures in alarming proportions that must be factored into ESD programs and product design.

1:00 PM - 4:30 PM FC161: Perfect ESD Storm Ted Dangelmayer, Dangelmayer Associates LLC

Learn how to prepare for the “Perfect ESD Storm” that is brewing in the electronics industry. The trend towards extensive use of ultra-sensitive components (Class 0) and the widespread lack of CDM (Charged Device Model) understanding are brewing the “Perfect ESD Storm.” It is no longer business as usual, and it can take up to two years to prepare. This tutorial is intended for professionals who have a basic understanding of ESD but are not fully aware of CDM control techniques or the industry trend toward extremely sensitive devices and the counter measures that are necessary. Learn the answers to your questions as well as these examples. Are you skeptical about this news of a Class 0 trend? Is it really happening? Is it likely to be a problem in your factory? How big a problem is CDM in manufacturing? What is different about CDM controls? How do I tailor Ansi/ESD S20.20 for CDM and Class 0? Join us for this highly interactive tutorial and learn why this is inevitable and how to prepare for it.

REGISTER ONLINE AT WWW.ESDA.ORG/EVENTS/REGIONAL-TUTORIALS/

Tutorials are also offered at international locations and in conjunction with EOS/ESD Association, Inc. events worldwide. For a complete schedule of events visit www.esda.org/events/calendar/

24

THRESHOLDTM


EOS/ESD Symposium

The common theme for the fourth set of papers in our historical review relates to establishing an ESD control program. From early on in our Symposiums, the costs associated with ESD controls have been related to how much money a properly set-up and managed ESD control program can save. Most consider an ESD control program a necessity today but in the early days there was a need to convince upper management that the time and talent needed to set up the program was worth the investment.

25

THRESHOLDTM


DANGELMAYER ASSOCIATES, L.L.C.14 Butternut Lane, Gloucester, MA 01930

Tel: 978-282-8888 • Fax: 978-282-4884 Email: [email protected] • www.dangelmayer.com

ESD & EOS Consulting Services: No Product Sales!S20.20 Programs, Training, Auditing, CDM, CBE, Class 0, Cleanrooms

IEST - Institute of Environmental Sciences and Technology2340 S. Arlington Heights Road, Suite 100, Arlington Heights IL 60005

Tel: 847-981-0100 • Email: [email protected] • www.iest.comAs secretariat of ISO/TC 209, IEST offers ISO 14644 and ISO 14698

standards, as well as peer-approved standardized procedures, IEST Recommended Practices.

Test Methods for Static Control Products, J.R. Huntsman and D.M. Yenni, Jr. 1982 EOS/ESD Proceedings continued

26

THRESHOLDTM


ESDEMC TECHNOLOGY, LLC4000 Enterprise Dr., Suite 103, Rolla, MO 65401

Tel: 573-202-6411 • Fax: 877-641-9358www.esdemc.com

ESDEMC Technology designs, manufactures, and markets ESD/EMC related products and consulting services.

THERMO FISHER SCIENTIFIC INC.200 Research Drive, Wilmington, MA 01887

Tel: 978-275-0800 • Fax: 978-275-0850 www.thermoscientific.com

Leading manufacturer of semiconductor test equipment for the simula-tion of Electro Static Discharge (ESD), Latch-up, and TLP events.

Test Methods for Static Control Products, J.R. Huntsman and D.M. Yenni, Jr. 1982EOS/ESD Proceedings continued

27

THRESHOLDTM

September/October 2017Test Methods for Static Control Products, J.R. Huntsman and D.M. Yenni, Jr. 1982EOS/ESD Proceedings continued

28

THRESHOLDTM


29

THRESHOLDTM



30

THRESHOLDTM


31

THRESHOLDTM



32

THRESHOLDTM


33

THRESHOLDTM


34

THRESHOLDTM


35

THRESHOLDTM


36

THRESHOLDTM



37

THRESHOLDTM


RMV TECHNOLOGY GROUP, LLCA NASA Industry Partner

350 North Akron Road • Moffett Field • CA • 94035 Tel: 650-964-4792 • www.esdrmv.com

Largest ESD Test Laboratory of all NASA locationsESD/EMC Materials & Product Testing •Training • Auditing •

Anti-Counterfeit Training • Compliance Verification

PROLINE10 Avco Rd., Haverhill, MA 01835Tel: 800-739-9067 Fax: 978-374-4885

www.1proline.com E-mail: [email protected] ESD modular and ergonomic work benches


38

THRESHOLDTM


DESCO INDUSTRIES INC.3651 Walnut Ave., Chino, CA 91710

www.Descoindustries.com • Tel: CA-909-627-8178• MA-781-821-8370 ESD CONTROL PRODUCTS & MORE. Our brands include: CMG,

Charleswater, Desco, EMIT, Menda, Protektive Pak, Smart Clock, Statguard, SCS (formerly 3M Static Control), and Vermason.

NRD - ADVANCED STATIC CONTROL2937 Alt Blvd, Grand Island, NY 14072

Tel: 800-525-8076•716-733-7744•[email protected]•www.nrdinc.comManufacturer of Alpha, Corona, and Passive

Static Control Products


39

THRESHOLDTM


CLEANROOM WORLD / WESTERN STATES SALES INC.6950 South Tucson Way, Unit F, Centennial, CO 80112

Tel: 303-752-0076 • 303-752-0288 [email protected] • www.cleanroomworld.com

Cleanroom World / Western States Sales provides knowledge and solutions for your static controlled and cleanroom environments. Our company has an ISO 9001:2015

QMS. Onsite training center offers courses on ESD and cleanroom topics

RTP COMPANY580 East Front Street, Winona, MN 55987 USA

Tel: +1-507-454-6900 • Fax: +1-507-454-2041 [email protected] • www.rtpcompany.com

Engineers from RTP Company develop customized thermoplastic compounds in over 60 different resin systems for applications requiring color conductive, elastomeric,

flame retardant, high temperature, structural, and wear resistant properties.


ELECTRICAL

OVERSTRESS/

ELECTROSTATIC

DISCHARGE

SYMPOSIUM

PROCEEDINGS

2009Sponsored by

ESD Association in cooperation with IEEE.

Technically co-sponsored by the Electron Devices Society.

Access more than 1,680 Symposium papers, published yearly from 1979 to 2017 in the EOS/ESD Symposium Proceedings. The largest collection of electrostatic research and development papers from around the world.

www.esda.org/training-and-education/proceedings/Proceeding are availble by year, in a complete “Proset” 1979-2017, or purchase an Enterprise-Wide license for company wide reference.

Want to locate a specific paper or author? The Search and Retrieval Index (pdf) can help.This index is a complete listing of Papers, Authors, and Awards presented at the EOS/ESD Symposium from 1979 to 2017.

EOS/ESD Association, Inc. 7900 Turin Rd., Bldg. 3

Rome, NY 13440-2069, USA

ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS

ELECTRICAL OVERSTRESS/

ELECTROSTATIC DISCHARGESYMPOSIUM

PROCEEDINGS2009

Sponsored byESD Association in cooperation with IEEE.

Technically co-sponsored by the Electron Devices Society.

1979 - 2017 ESDA

40

THRESHOLDTM

September/October 2017Triboelectric Testing of Packaging Materials – Practical Considerations: What is Important? What Does it Mean? D. Swenson and R. Gibson, 1992 EOS/ESD Proceedings

41

THRESHOLDTM

September/October 2017Triboelectric Testing of Packaging Materials – Practical Considerations: What is Important? What Does it Mean? D. Swenson and R. Gibson, 1992 EOS/ESD Proceedings continued

42

THRESHOLDTM


43

THRESHOLDTM


44

THRESHOLDTM


45

THRESHOLDTM


46

THRESHOLDTM


47

THRESHOLDTM


48

THRESHOLDTM


49

THRESHOLDTM


LUBRIZOL ADVANCED MATERIALS, INC.9911 Brecksville Rd. Brecksville, OH USA 44141

Tel: +1-888-234-2436 Email: [email protected] www.lubrizol.com/Engineered-Polymers

Lubrizol is a global leader in supplying innovative polymer solutions for applications in the electronics, industrial, and sports and recreation markets.

TECH WEAR, INC.6154 Innovation Way, Carlsbad, CA 92009

Tel: 760-438-7788 Email: [email protected] www.techwear.comIndustry leader in static control garments, including groundable cleanroom

garment systems.

Triboelectric Testing at KSC Under Low Pressure and Temperature – R. Gompf 2002 EOS/ESD Proceedings

50

THRESHOLDTM


JULIE INDUSTRIES/STATICSMART FLOORING2 Dundee Park Drive, Suite 302A, Andover, MA 01810 USA

Ph: 800-225-6052 Fax: 978-276-0821 Email: [email protected] www.staticsmart.com

Manufacturer and global supplier of ESD carpet and vinyl flooring.

GRUND TECHNICAL SOLUTIONS, INC.370 South Abbott Ave, Milpitas, CA 95035 USA

Tel: 408-216-8364, Fax: 408-217-0160 Email: [email protected] www.grundtech.com

Grund Technical Solutions designs & manufactures PurePulse, a modular ESD test platform for HBM, TLP, VFTLP, MM, & HMM

Triboelectric Testing at KSC Under Low Pressure and Temperature – R. Gompf 2002 EOS/ESD Proceedings continued

51

THRESHOLDTM


SelecTech, Inc.33 Wales Ave, Suite F, Avon MA 02322 USA

Ph: 508-583-3200 Fax: 877-738-4537 Email: [email protected] www.selectechinc.com

Manufacturer of StaticStop interlocking flooring

KEY RESIN COMPANY, INC.4050 Clough Woods Drive, Batavia, OH 45103

513-943-4225, Fax 513-943-4255 [email protected] www.keyresin.com

Manufacturer of conductive and ESD resinous flooring and floor sealers.KEY RESIN WEST 1315 E. Gibson, Suite D., Phoenix, AZ 85034

602-523-9353, Fax 602-523-9349


52

THRESHOLDTM


Polyonics28 Industrial Park Dr., Westmoreland, NH, 03467 USA

Ph: +1-603-352-1415 Email: [email protected] • www.polyonics.com

Polyonics maunufactures ANSI/ESD S20.20 compliant low charging labels, tapes, and film

SCS - Formerly 3M Static Control914 Jr Industrial Drive, Sanford, NC 27332 USA

Ph: +1-919-718-0000 www.staticcontrol.comESD control products: bags, floor tiles, foot grounders, ionizers, mats, testers

& monitors, smocks, tape, vacuums, wrist straps, and more.


53

THRESHOLDTM


Innovative Circuits Engineering, Inc.2310 Lundy Avenue, San Jose, CA 95131 USA

Ph: +1-408-955-9505 Fax: +1-408-955-9599 www.icenginc.comProviding reliability testing, ESD testing, and failure analysis services for es-

tablished and startup organizations in the United States and around the globe.

Antistat, Inc.3913 Todd Lane #106 Austin TX USA

Ph: +1-512-377-9010 Email: [email protected] www.antistat.com

Award winning Global supplier of ESD, Production, and Cleanroom consum-ables to the world’s Electronics, Automotive, Pharma, & Biotech sectors.


54

THRESHOLDTM


Core Insight, Inc.186 Galmachi-ro, Seongnam-city, Gyeonggi-do, 13230, Korea

Phone: +82-31-750-9200. Email: [email protected]: www.coreinsight.co.kr

Steady-State DC Ionizer Manufacturer for BenchTop, Overhead, Nozzle, Gun, Air Assist, and Ceiling Ionizers

Molded Fiberglass Tray Co.6175 US Highway 6, Linesville, PA 16424 USA

Ph: +1-814-683-4500 Fx: +1-814-683-4504 www.mfgtray.com

Manufactures fiberglass reinforced plastic Fiberstat ESD products; trays, bins, totes, and mats


55

THRESHOLDTM


HPPI GmbH Stadlerstrasse 6A, D-85540 Haar, Germany

Phone: +49 (0)89 / 878 06 98 – 443; www.hppi.de Development and sales of ESD Testers

HANWA ELECTRONIC IND. CO., LTD. 689-3, Ogaito, Wakayama, Japan 649-6272

TEL:+81-73-477-4435 • FAX:+81-73-477-3445 [email protected] • www.hanwa-ei.co.jp

Full Automatic Wafer Level ESD Tester / HBM, MM, HMM, and SCM ESD Tester, TLP Tester/ CDM Tester/ Electrostatic Imaging System

Q) I have an ESDS material on a wodden table. The operator is grounded via a foot strap to the floor mat which is grounded directed to the facility ground. Does the wooden table need to be grounded?

A) By our ESDA standards, a seated operator needs to be grounded using a wrist strap system. Foot grounders do not provide a consistent ground path since the feet are not always in perfect contact with the floor with sufficent pressure while sitting down. For stand-up operations, there needs to be a shoe grounding strap on each shoe. Even while standing, both feet do not always make perfect contact with the floor. Your wooden bench would be considered an insulator and insulators cannot adequately be connected to ground - an insulator does not readily lose charge by grounding. To provide a better work area, the top surface of the bench/table needs to have a dissipative table mat that can be bonded to ground. This would provide a groundable path for any conductive items placed on it as well as providing a low charge generating surface for most of the items you are working on at that work area. If you want to have further discussion about setting up an ESD Protected Area - EPA, you may want to contact some of the consultants listed in our Buyer’s Guide as many of them have considerable experience.

Q) Does any documentation or data demonstrating the validity of using ionized air flow to discharge two mating interfaces (such as male to female connector connection) exist? I haven’t found any while searching our ESDA specs or items in industry.?

A) Thank you for your question. In order for ionized (+ and -) air to neutralize something, there has to be a clear electric field of either polarity in order to cause attraction of the ions. A connector pair may well have different polarities and when mated, there may not be a clearly defined electric field. Ions will be attracted to the opposite polarity that is present in any electric field. If there is no electric field, there is nothing to attract the ions and they will be absorbed by anything grounded nearby. If you can measure an electric field with a hand-held electric field meter or electrostatic voltmeter, then there is something for the ionizer to neutralize. We cannot say that there are any specific papers dealing with your subject. Our only suggestion is to make measurements of the connectors before and after mating and also after disconnecting to see what sort of electric field level you can measure. Use an ionizer (hopefully well balanced) in the presence of the connectors and monitor the decay of the electric fields on the connectors.. The response given is a service to industry; EOS/ESD Association, Inc. is not responsible for content. The users of this information need to determine the suitability of the response

Q&A

ANSI/ESD S8.1-2017 - SymbolsANSI/ESDA/JEDEC JS-001-2017 – Human Body ModelANSI/ESD SP3.3-2016 – Periodic Verification of Air IonizersANSI/ESD STM5.5.1-2016 – Transmission Line PulseANSI/ESD SP3.4-2016 – Periodic Verification of Air Ionizers using Small Test FixtureANSI/ESD STM97.2-2016 – Footwear/Flooring System – Voltage Measurement in Combination with a PersonESD ADV1.0-2017 – Glossary of TermsANSI/ESD SP5.1.3-2017 - Human Body Model - A Method for Randomly Selecting Pin Pairs

New Standards Published between September 2016 and September 2017

Click here to purchase! https://esda.org/standards/esda-documents/

56

THRESHOLDTM


Calendar of Events

September 5-15, 2017 EOS/ESD Association, Inc. Fall Meeting Series (September 5-9)EOS/ESD Symposium and Tutorials (September 10-15)Westin La PalomaTucson, AZ, USA

October 8-12, 20172017 International Integrated Reliability Workshop (IIRW)Stanford Sierra Conference Center, Fallen Leaf, CA, USA

October 23-25, 201715th German ESD-Forum (Call for Papers)Novotel Munich City, D-81669 Munich, Germany

November 6-7, 2017China ESD Forum WorkshopCanmax, 99 Shuangma Street, Suzhou Industrial Park, Jiangsu, China

Nov 8-10, 2017 China EOS/ESD Association, Inc. TutorialsNov 8, 2017 FC100: ESD Basics for the Program ManagerNov 9, 2017 FC101: How To’s of In-Plant ESD Auditing and Evaluation MeasurementsNov 10, 2017 Essentials for ESD Programs Factory: Technologies • Controls • ProceduresCanmax, 99 Shuangma Street, Suzhou Industrial Park, Jiangsu, China

November 14-16, 2017Vietnam EOS/ESD Association, Inc. TutorialsNovember 14 ESD Basics FC155: ESD Control Workstations: Set-up, Practical Considerations & MeasurementsNovember 15 FC101: How To’s of In-Plant ESD Auditing and Evaluation MeasurementsNovember 16 FC150: Hands-on ESD Measurements & Instruments-Uses and Pitfalls FC361: Ultra-sensitive (Class 0) Devices: ESD Controls and Auditing Measurements Saigon Prince Hotel, Ho Chi Minh City, Vietnam

December 4-5, 2017EOS/ESD Association, Inc. TutorialsDec 4 FC170: ESD Training for Internal Auditors and Supplier Quality Dec 5 FC164: Costly Controversial ESD Myths FC161: Perfect ESD StormEOS/ESD Association, Inc.7900 Turin Rd. Bldg 3 Rome, NY 134402018March 14-16, 2018EOS/ESD Association, Inc. Tutorials March 14-15 ESD System LevelMarch 16 Measurement TechniquesFraunhofer Institution for Modular Solid State Technologies EMFT, Munich, Germany

March 19-23, 2018 EOS/ESD Manufacturing Symposium in KoreaMarch 19 FC100: ESD Basics for the Program ManagerMarch 20 FC101: How To’s of In-Plant ESD Auditing and Evaluation MeasurementsMarch 19-20 FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) (PrM)March 21-22 Technical Sessions / WorkshopsMarch 23 Program Manager ExamCOEX in Seoul, KOREA

April 10-15, 2018 EOS/ESD Association, Inc. Spring Meeting SeriesPeppermill Resort and Casino, Reno NV (Room Rate $95/night)

May 14-18, 2018 2018 International ESD Workshop IEWPriorij CorsendonkBelgiumCall for Presentations Deadline Oct 2, 2017

September 20-28, 2018 EOS/ESD Association Meeting Series EOS/ESD Symposium and ExhibitsPeppermill Resort and Casino, Reno NV (Room Rate $130/night)

CORPORATIVO FANRICH DE MEXICO SAPI DE CV

AVENIDA XOCHIMILCO 211 +52 3315781275 [email protected]

WWW.FANRICH.COM.MXWe are a company dedicated to the production of metalized pouches (as com-

monly are known) and a variety of products that are related ; trays, bins, totes, and mats

www.esda.org/events/calendar/

Looking for ESD Services?Search the Buyers Guide to locate suppliers of ESD control products or services. You can search by product, company,

or geographic location.www.esda.org/buyers-guide/

57

THRESHOLDTM


ThresholdTM is published six times a year by the ESD Association, a not-for-profit corporation. It strives for the advancement of theory and practice of electrical overstress avoidance and of allied arts and sciences and the maintenance of a high professional standing among its members and others.

©Copyright 2017, ESD Association, Rome, NY

ThresholdTM Publication Schedule Issue Deadlines January/February ......................... Nov. 19 March/April ..................................... Feb. 1 May/June ........................................ April 1 July/August .....................................June 1 September/October ........................Aug. 1 November/December ....................Oct. 1

Threshold Institutional ListingsSpace in the Threshold Institutional Listings, which appear at the bottom of newsletter pages, can be purchased for $600.00 for six consecutive issues. Larger contributions are welcome. No agency fee is granted for soliciting such contributions. Inquiries, or contributions made payable to the EOS/ESD Association, Inc. should be sent to:EOS/ESD Association, Inc., 7900 Turin Rd., Bldg. 3, Rome, NY 13440-2069 Tel: (315) 339-6937, e-mail: [email protected].

Newsletter Staff

EditorBrennan PimpinellaEOS/ESD Association, Inc.7900 Turin Road, Bldg. 3, Rome, NY 13440Tel: 1+ 315-339-6937E-mail: [email protected]

Marketing Harald GossnerIntel Mobile Communications

TechnologyCharvaka Duvvury, ESD Consulting

Editorial Advisor Yong Hoon (Joshua) YooCore Insight Inc.

Editorial Advisory Board

PresidentGianluca Boselli Texas Instruments, Inc.

Sr. Vice PresidentGinger Hansel Dangelmayer Associates, L.L.C.

Vice PresidentAlan RighterAnalog Devices, Inc.

Volunteer Development & InitiativesMatthew HoganMentor Graphics

EOS/ESD Association, Inc. StaffLisa Pimpinella, Executive DirectorChristina Earl, Standards Senior Program Manager Brennan Pimpinella, Marketing & Communica-tions Program Manager Nicholas Pimpinella, Administrative AssistantDeborah Urtz, Office Assistant

7900 Turin Road, Bldg. 3, Rome, NY 13440-2069Tel: 1+ (315) 339-6937 • E-mail: [email protected] Web: www.esda.org

Photo Corner

Editorial Deadlines

EOS/ESD Association still knows how to have fun!

THRESHOLD - ESD A · Dear ESDA Volunteers & Friends of ESDA, The 39th EOS/ESD Symposium will be...

Documents

Transcript of THRESHOLD - ESD A · Dear ESDA Volunteers & Friends of ESDA, The 39th EOS/ESD Symposium will be...