Testing of CORDIC Chip Sandeep R Aedudodla Ashok Verma Meena Ramani Roby Thomas.
Transcript of Testing of CORDIC Chip Sandeep R Aedudodla Ashok Verma Meena Ramani Roby Thomas.
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Testing of CORDIC Chip
Sandeep R Aedudodla
Ashok Verma
Meena Ramani
Roby Thomas
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CORDIC
CORDIC: A highly efficient computing technique to compute a variety of elementary functions (Ex. Sine, Cosine,Arctan, Sinh, Cosh, Log, Exp etc).
Used extensively in calculators.
Makes use of shifter and adder blocks to compute these functions. Does not need a multiplier.
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Architecture
What to Test? 8-bit Latches 8-bit Adder/Subtractor Units A Variable Length 8-bit Barrel Shifter ROM Table 3-bit Counter
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The Test Plan
IDDQ Test : To detect any non-catastrophic defects.
Functional Test: Test all logic and memory sub-circuits involved and whether the mathematical functions evaluated are accurate enough.
Parametric Test: Test whether Chip meets specifications, such as timing requirements, power consumption etc.
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Modified Design for Test
0.6073 0
ADD/SUB
ADD/SUB
Y-OUTX-OUT
Y-REGX-REG >>k
>>k >>k
MUXMUX
INPUT
ADD/SUB
REG-TEMP >>k
X-REG >>k
MUX
X Y Z
T
M U X
Z
Y
X
T
ROM
3- BIT
CO
UN
TE
RC
LK
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List of Tests
Functional Test : To test the working of various sub-circuits, such as the Latches, Add/Sub Units, Counter, ROM, Shifters.
Functional Test Flow: Test Latches followed by Add/Sub Unit, Counter, ROM,
Shifter. Full Scan Methodology Planned. Estimated No. of extra pins required: 2 or 3 Used PISO for testing the registers. Used verified Registers to test Add/Sub blocks. Used verified registers and Add/Sub blocks to test the
other blocks.
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List of Tests (contd)
Parametric Test : To test the various specification parameters determining Chip – performance.
Measurement of Rise and Fall times: Using the ATE’s Time Measurement System (TMS). May need an advanced TMS capable of accuracy less then a nanosecond.
Measurement of Power Consumption
IDDQ Test : Measures Leakage current at a particular state, by using a current-to-voltage converter on the DIB. State is set by the ATE.
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Components Required on DIB Buffers to overcome the parasitic capacitance of Tester A Current to Voltage converter (for IDDQ) A Local Relay Connection to bypass the Current-Voltage Converter
CORDIC
Buffers
I to VConverter
RelayGND
VDD
INPUTS
OUTPUTS
ContactDUT socket