Status of On-Detector Opto-Linksgan/talk/IBL0612.pdf · "Four new B opto-board PCB (nSQP)...
Transcript of Status of On-Detector Opto-Linksgan/talk/IBL0612.pdf · "Four new B opto-board PCB (nSQP)...
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IBL General Meeting 1
June 15, 2012
K.K. Gan
Status of On-Detector Opto-Links
K.K. Gan, H.P. Kagan, R.D. Kass, J. Moore, D. Pignotti, S. Smith
The Ohio State University
P. Buchholz, A. Wiese, M. Ziolkowski Universität Siegen
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IBL General Meeting 2
Outline
● Results on prototype opto-board
● Analysis of accelerated lifetime test results
● Plan/summary
K.K. Gan
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K.K. Gan IBL General Meeting 3
Status of Opto-Board Prototyping
● 3 opto-board flavors ◆ D opto-board (disk): 7 TTC + 7 data links (2 flavors) ◆ B opto-board (B-layer): 7 TTC + 14 data links ◆ IBL opto-board: 8 TTC + 16 data links
● October IBL GM: ◆ PCBs for B opto-board (nSQP) were fabricated by CERN ■ 6 opto-boards fabricated/irradiated a several design changes to ease the PCB fabrication
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K.K. Gan IBL General Meeting 4
Status of Opto-Board Prototyping ● 4 new B opto-board (nSQP) fabricated ◆ 1st prototype PCB: SLAC ◆ 2nd prototype PCB: Bern, CERN, Wuppertal
VCSEL
PIN
VCSEL
3 cm
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K.K. Gan IBL General Meeting 5
IBL Opto-Board Submission
● IBL design submitted to the CERN PCB shop last week ◆ special thanks to Steven Welch as liaison to the shop ◆ should receive the boards in mid July ◆ should have results by mid August
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K.K. Gan IBL General Meeting 6
Opto-Board Thermal Design
Cross section
1 mm
6 layer PCB
Copper plate
Optical packages mounted directly to copper plate
Cooling from here
0.65 mm
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K.K. Gan IBL General Meeting 7
Opto-Board Quality Assurance ● plan to perform QA test similar to present pixel opto-boards to validate constructed boards ◆ burn in: 72 hours @ 50°C
◆ 10 thermal cycles: -25°C a +50°C
■ 2 hours per cycle
■ 1 hour soak at 50°C
◆ electrical and optical QA
● QA system exercised on fabricated opto-boards
Opto-board QA board
Opto-board
Envirnomental chamber
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IBL General Meeting 8
Accelerated Lifetime Test
K.K. Gan
● Performed an accelerated lifetime test: ■ 20 VCSEL arrays from ULM (10 Gb/s) ■ mounted on OSU opto-packs ■ operated at 85°C and 85% relative humidity over extended time ■ all 240 channels continuously operated at 10 mA DC ■ aggregate VCSEL current/power from each array monitored with a wide area photo-diode ■ LIV (light-current-voltage) measurement every ~500 hours
● Test meant to qualify the use of ULM arrays mounted on the OSU opto-pack ■ believe that the arrays themselves are qualified
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K.K. Gan IBL General Meeting 9
Light-Current-Voltage Measurements
Date Operating Hours 27/9 0 13/10 380 08/11 1,002 29/11 1,510 28/12 2,200
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K.K. Gan IBL General Meeting 10
VCSEL Current/Power ● Aggregate VCSEL current and light output for all arrays recorded continuously
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K.K. Gan IBL General Meeting 11
LIV Measurements ● Performed periodic LIV measurement on each channel ■ measured at 85°C
V11022 Channel 2 V11022 Channel 1
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K.K. Gan IBL General Meeting 12
Results
● Failure study:
◆ visual inspection with microscopy ◆ further measurements ◆ discussion with ULM via Michal Ziolkowski
Hours Failed Channels 1,002 0 1,510 2 2,200 19
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K.K. Gan IBL General Meeting 13
Failure Analysis ● 16 - optical epoxy coverage/scraping ◆ including 4 on a cracked die
● 2 - no obvious/correlated cause ◆ discolored die
● 2 - ultrasonic cleaning of die before placement
● 1 - broken wire bond during test
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K.K. Gan IBL General Meeting 14
Optical Epoxy Coverage Failures ● All channels with incomplete epoxy coverage failed
failed channels
optical epoxy boundary
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K.K. Gan IBL General Meeting 15
Optical Epoxy Scraping Failures ● not possible to have complete epoxy coverage
without epoxy around MT guide pins a epoxy wick up the guide pins due to capillary effect a scrape epoxy from guide pins to allow proper fiber coupling a the accelerated lifetime study reveals that this might cause long term reliability issues: ◆ cracked a die (which survived nearly the whole test) ◆ introduced stress in a few arrays
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K.K. Gan IBL General Meeting 16
Cracked Die
MT guide pin
Scraped optical epoxy
Crack in die (continues to
channel 8)
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K.K. Gan IBL General Meeting 17
Optical Epoxy Solution ● Add an optical epoxy dam ◆ keeps epoxy from climbing the MT guide pins a no optical epoxy scraping ◆ adds reservoir to assist in complete epoxy coverage ◆ doubles as MT ferrule bumper
● Presently constructing 20 Finisar arrays with the optical epoxy dam for next lifetime test ◆ dam tested on 12 arrays ■ 6 good ■ 5 can be used in opto-boards for tests ■ 1 has too much epoxy
Optical epoxy dam
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K.K. Gan IBL General Meeting 18
Opto-Board Accelerated Lifetime Test ● working towards accelerated lifetime test on nSQP B-boards
● IBL board technology nearly identical a test is extremely relevant
● will test 16 nSQP B-boards
● will test 4 IBL boards
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K.K. Gan IBL General Meeting 19
Opto-Board Reliability Qualification Back Front
Opto-board Mounting card for wide area photo-diodes
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K.K. Gan IBL General Meeting 20
Summary
● Four new B opto-board PCB (nSQP) fabricated
● IBL opto-board design submitted for fabrication
● QA test system fabricated and exercised
● Accelerated lifetime test reveals potential mechanical stress due to scrapping of optical epoxy from guide pins a use epoxy dam to contain the epoxy