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Standard

AIAA S-112A-201X (Revision of S-112-2005)

Qualification and Quality Requirements for Electrical Components on

Space Solar Panels

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AIAA S-112A-201X (Revision of AIAA S-112-2005)

Standard

Qualification and Quality Requirements for Electrical Components on

Space Solar Panels

Sponsored by

American Institute of Aeronautics and Astronautics

Approved

TBD

Abstract

This standard establishes the quality requirements and provides methods for establishing the qualification of electrical components integrated onto spacecraft solar panels.


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Published by American Institute of Aeronautics and Astronautics 1801 Alexander Bell Drive, Reston, VA 20191

Copyright © 201X American Institute of Aeronautics and Astronautics All rights reserved No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without prior written permission of the publisher. Printed in the United States of America


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Table of Contents Foreword ........................................................................................................................................................................ v Introduction .................................................................................................................................................................. vii 1 Scope............................................................................................................................................................... 1 1.1 Qualification by Similarity ................................................................................................................................. 1 1.2 Characterization by Similarity .......................................................................................................................... 1 1.3 Reporting Requirements for Qualification and Characterization by Similarity .................................................. 1 2 Tailoring ........................................................................................................................................................... 1 3 Applicable Documents ..................................................................................................................................... 1 4 Vocabulary ....................................................................................................................................................... 2 5 Summary of Qualification and Characterization Tests ..................................................................................... 4 6 Test Requirements .......................................................................................................................................... 4 6.1 Sample Selection ............................................................................................................................................. 5 6.2 Visual Inspection .............................................................................................................................................. 7 6.3 Test Temperature Definitions and Requirements for Temperature Measurement ........................................... 7 6.4 Functional Tests .............................................................................................................................................. 8 6.5 Inspection and Function Test Ensemble ........................................................................................................ 10 7 Qualification Tests ......................................................................................................................................... 11 7.1 Life-Cycle Coupon Test With Humidity Exposure .......................................................................................... 11 7.2 Panel-Level Volatile Condensable Materials (VCM) / Acoustic Test .............................................................. 15 7.3 ESD Test ....................................................................................................................................................... 17 8 Characterization Tests ................................................................................................................................... 17 8.1 UV Effects ...................................................................................................................................................... 17 8.2 Angle of Incidence ......................................................................................................................................... 19 8.3 Normal Emittance .......................................................................................................................................... 19 8.4 Solar Absorptance ......................................................................................................................................... 20 8.5 Bypass Diode ................................................................................................................................................. 21 8.6 Atomic Oxygen (AO) Test .............................................................................................................................. 21 8.7 Component Characterization ......................................................................................................................... 22 9 Quality Requirements .................................................................................................................................... 22 9.1 Performance .................................................................................................................................................. 22 9.2 Panel Reliability ............................................................................................................................................. 23 9.3 Certification of Conformance ......................................................................................................................... 23 9.4 Lot Identification and Traceability .................................................................................................................. 23


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9.5 Test Equipment Maintenance and Calibration System .................................................................................. 24 9.6 Incoming, In-process, and Outgoing Inventory Control .................................................................................. 24 9.7 Process Control ............................................................................................................................................. 24 9.8 Environmental Controls.................................................................................................................................. 24 9.9 Conformance of Production Solar Panels to Qualified Product ...................................................................... 24 9.10 Electrostatic Discharge Sensitivity Program .................................................................................................. 25 9.11 Reworked Solar Panels ................................................................................................................................. 25 9.12 Design Construction and Process Change Control Procedures .................................................................... 25 10 Critical Materials and Designs ....................................................................................................................... 25 10.1 Scope............................................................................................................................................................. 25 10.2 Requirements ................................................................................................................................................ 25 11 Reporting Requirements ................................................................................................................................ 26 11.1 Reports to be Produced ................................................................................................................................. 26 11.2 Qualification Report ....................................................................................................................................... 26 11.3 Characterization Report ................................................................................................................................. 27 11.4 Quality Report ................................................................................................................................................ 27

List of Tables

Table 1 – Summary of qualification and characterization tests ...................................................................................... 4


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Foreword AIAA Standard S-112-2005 “Qualification and Quality Requirements for Space Solar Panels” was originally developed to provide a “gold standard” for space solar panel qualification, with provisions included to supplement industry ISO 9001 standards for quality. That document has been successfully used within the industry; however, some of the requirements were ambiguous and users of the document often needed to tailor the requirements to fit the need of the spacecraft under development.

In this revised version of the Standard, much effort and care has been taken to clarify those requirements and to resolve controversial issues and errors that were present in the original version. The result is a new standard that the Solar Cells and Solar Panels Committee on Standards has developed and reached consensus that defines the best practices for space solar panel qualification.

At the time of the 2012 revision, the members of the AIAA Solar Cells and Solar Panels CoS were:

Henry Brandhorst (Chair) Carbon-Free Energy, LLC

Robert W. Francis (Group Chair) Aerospace Corporation

Edward Gaddy (Co-Chair) Johns Hopkins University Applied Physics Laboratory

Jerry Kukulka (Co-Chair) Consultant

Amalia Aviles The Boeing Company

Scott Billets Lockheed Martin Space Systems Company

Vivien Bercier Orbital Sciences Corporation

Robert Bornino National Technical Systems

Marc Breen Boeing Defense Space and Security

Michael Butler Johns Hopkins University Applied Physics Laboratory

James Hall Qioptiq Space Technology

Bao Hoang Space Systems/Loral

Glenn Jones Qioptiq Space Technology

Bongim Jun Boeing-Spectrolab

John Lyons Goddard Space Flight Center

John Martin Qioptiq Space Technology

Scott Messenger Naval Research Laboratory

Tom Newbauer Space and Mille Systems Center

Tod Redick Space Systems/Loral

Brad Reed Space and Missile Systems Center

Julie Rodiek Auburn University

Dennis Russell Boeing Radiation Effects Laboratory

Paul Sharps Emcore Corporation

Jared Smith Space and Missile Systems Center

C. M. Chantal Toporow Northrop Grumman Space Technology

Brian Wells Auburn University


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Jerry Z Wu Spectrolab

Henry Yoo Air Force Research Laboratory

The above consensus body approved this document for publication in Month, Year. The AIAA Standards Executive Council (VP-Standards, XXX, Chairperson) accepted this document for publication in Month, Year.

The AIAA Standards Procedures dictates that all approved Standards, Recommended Practices, and Guides are advisory only. Their use by anyone engaged in industry or trade is entirely voluntary. There is no agreement to adhere to any AIAA standards publication and no commitment to conform to or be guided by standards reports. In formulating, revising, and approving standards publications, the committees on standards will not consider patents that may apply to the subject matter. Prospective users of the publications are responsible for protecting themselves against liability for infringement of patents or copyright or both.


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Introduction This Standard establishes the quality requirements and provides the methods for establishing the qualification of electrical components integrated onto spacecraft solar panels. Section 7 describes specific tests necessary to ensure the quality and reliability of solar panels intended for space application. Section 8 describes specific solar panel characterization tests necessary to characterize the performance of solar panels intended for space application. Section 9 describes the quality requirements for panels to be qualified to this standard. Section 11 describes the reporting format for the qualification tests in Section 7, the characterization tests in Section 8, and the quality requirements in Section 9.


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1 Scope This document establishes qualification and quality requirements of the electrical components integrated onto spacecraft solar panels that carry single crystal silicon solar cells or gallium arsenide solar cells having any number of junctions including those with metamorphic and inverted metamorphic structure. In this standard the term panel defines the assembly of electrical components to be tested. The Standard also defines requirements for manufacturers’ quality systems and for qualification and characterization of the electrical components on solar panels.

This Standard fully addresses the qualification of all panel components and the panel substrate only as they affect electrical performance. Requirements for acceptance testing are not defined in this document. In accordance with the conditions stated in this Section, this Standard accepts qualification and characterization by similarity.

1.1 Qualification by Similarity If qualification by similarity is to be considered, then use “Guidance for Qualification by Similarity” of MIL-HDBK-340A Vol. II Military Handbook: Test Requirements for Launch, Upper-Stage, and Space Vehicles use Section 4.4.3.1, and the following.

If a panel to be qualified uses the same part types, materials, and processes as a panel previously qualified to this Standard and is exposed to environments that are encompassed by the previous qualification to this Standard, this Standard’s required tests and characterizations may be waived. If the same part types or materials are not available, equivalent part types or materials may be used if their pedigree to the same part type can be established and is satisfactory for the intended usage.

If some parts, materials, and processes have changed from similarity qualification, as defined by the paragraph above, the qualification may still suffice for the unchanged parts, materials, and processes. The similarity qualification will apply only to those parts and materials that are not changed and that do not make physical contact with a changed part or material; the qualifier must show by analysis that the remaining parts and materials are not affected to any degree by the presence of a changed part or material. The qualifier must execute the tests required by this Standard on all the parts that are changed, or that are in physical contact with a changed part or that may be affected by a changed part.

1.2 Characterization by Similarity Characterization is only required for parts and materials that were not characterized by similarity or that are changed or that were produced with processes that changed since the similarity characterization.

1.3 Reporting Requirements for Qualification and Characterization by Similarity Report in accordance with Section 11.2f and 11.3e.

2 Tailoring Tailoring of this document is allowed to meet specified requirements.

Wherever tailoring is proposed to a requirement herein, the rationale shall be stated and agreed upon.

3 Applicable Documents The following applicable documents contain provisions which, through reference in this text, constitute provisions of this standard. For all documents, subsequent amendments to, or revisions of, any of these publications do not apply. In the event of a conflict between this Standard, the documents cited below and other documents, this Standard takes precedence.


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AIAA S-111-2005 Qualification and Quality Requirements for Space-Qualified Solar Cells

ANSI/NCSL Z540.1-1994 Calibration Laboratories and Measuring and Test Equipment—General Requirements

Aerospace Report TR-2004 (8583)-1 Revision B, Test Requirements for Launch, Upper-Stage, and Space Vehicles

ASTM E595-93(2003)e2 Standard Test Method for Total Mass Loss and Collected Volatile Condensable Materials from Outgassing in a Vacuum Environment

ASTM E903-96 Standard Test Method for Solar Absorptance, Reflectance, and Transmittance of Materials Using Integrating Spheres

ASTM E927-10 Standard Specification for Solar Simulation for Photovoltaic Testing

EIA 557 (1995) Statistical Process Control Systems

EIA 625 Requirements for Handling Electrostatic Discharge Sensitive Devices

ISO-11221 Space systems – Space solar panels – Spacecraft charging induced electrostatic discharge test methods

JEDEC JESD 625 (1999) Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices

MIL-HDBK-340A Vol. II Military Handbook: Test Requirements for Launch, Upper Stage, and Space Vehicles, Section 4.4.3.1 Guidance for Qualification by Similarity

MIL-STD-750 CHG NOT 5 (2002) Test Method Standard for Semiconductor Devices (Test Methods 5010 and 1020)

4 Vocabulary For the purposes of this document, the following terms and definitions apply.

Control limit the maximum allowable variation of a process characteristic around a target value

NOTE 1 Variation beyond a control limit may be evidence that special causes are affecting the process.

NOTE 2 Control limits are calculated from process data and are usually represented as a line (or lines) on a control chart.

Coverglass an optically clear component affixed to the active side of a solar cell, typically used to provide radiation shielding and increase emissivity

NOTE A coverglass may have coatings to enhance solar cell performance.

Coverglass-interconnect-solar cell assembly (CIC) an assembly consisting of a solar cell, interconnect, and coverglass


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Failure in time (FIT) the expected number of component failures per 109 hours

NOTE The FIT rate is a method of specifying component reliability

Electrostatic discharge (ESD) an electrostatic discharge

Electrostatic discharge sensitivity (ESDS) the sensitivity of a component to electrostatic discharge

Failure modes and effects analysis (FMEA) an analytical technique used as a means to assure that potential failure modes and their associated causes/mechanisms have been considered and addressed

Interconnect a conductive component designed to electrically connect one solar cell to another, or a solar cell to an electrical bus

Life-cycle coupon a panel sample, built with processes, materials, and components that are flight-qualified or proposed for flight qualification

Major change a change that may affect form, fit, or function of a space-qualified solar panel component or solar panel through end of life

Maximum power point (Pmp) the maximum electric power that can be generated by a solar cell, CIC, or string

Minor change a change that will not affect form, fit or function of a space-qualified solar panel component or solar panel through end of life

MSC minimum sample count

Open circuit voltage (Voc) the electric potential across the terminals of a solar cell, CIC, or string at zero current

Panel family a set of solar panels so similar in design and construction as to be indistinguishable from each other in terms of nominal power produced per unit area and degradation subsequent to any environmental exposure

NOTE A panel family is distinct in that it has a unique design that consists of a combination of mechanical dimensions, parts, materials, and processes.

Short circuit current (Isc) the current measured between the terminals of a solar cell, CIC or string at zero voltage

Simulated air mass zero that output achieved from a solar simulator calibrated to air mass zero (AM0) with a balloon-flown standard of the same type as the solar cells being tested

Solar cell a semiconductor device that produces electric power when illuminated

Specification limits the requirements for judging acceptability of a particular characteristic as established by this standard


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String a number of series-connected solar cells that produces electrical power

Subcoupon a smaller life-cycle coupon

NOTE Multiple subcoupons may be used in place of a single life-cycle coupon solar cells.

VCM volatile condensable materials

5 Summary of Qualification and Characterization Tests Table 1 provides a summary of qualification and characterization tests specified under this standard.

Table 1 — Summary of qualification and characterization tests

Test Section Page Test Article Minimum Data Requirement

Solar Panel Life-Cycle Coupon Test With Humidity Exposure

7.1 11 Coupon or subcoupons

MSC CIC data sets and MSC blocking diode

data sets

Panel Level VCM/Acoustic Test 7.2 15 Full-Sized Flight Panel 1 panel data set

ESD Test 7.3 17 Coupon or subcoupons

63 CIC data sets

UV Effects Characterization 8.1 17 CIC 12 CIC data sets

Angle of Incidence Characterization 8.2 19 CIC 16 CIC data sets

Normal Emittance Characterization 8.3 19 CIC 12 CIC data sets

Solar Absorptance Characterization 8.4 20 CIC 12 CIC data sets

Bypass Diode Characterization 8.5 21 Bypass Diodes 22 Bypass diode data sets

Atomic Oxygen Test 8.6

21 Coupon or subcoupons

22 CIC data sets (optionally

12 CIC data sets)

Component Characterization 8.7 22 Determined by qualifier

Determined by qualifier

6 Test Requirements The Qualifier shall obtain or generate drawings and specifications for each of the components and assemblies to be tested and, prior to the start of qualification, shall verify by inspection that each item to be tested meets drawing and specification requirements.


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At a minimum the Qualifier shall have drawings and specifications for solar cells, coverglasses, CICs, adhesives, diodes, wire, connectors, interconnects, turn-arounds, substrates, substrate grounds, temperature sensors, and other components to be tested.

The Qualifier shall record and report the build process for each assembly manufactured for the qualification tests and characterizations required by this Standard.

If a test fails qualification solely due to problems with an isolated single component or assembly, then full qualification may still be achieved by a delta qualification on an additional similarly fabricated coupon incorporating only an improved version or design of the component or assembly that had originally failed. The failed component type or assembly type cannot be retested. It is deemed failed. However, if the component failed due to workmanship unrelated to the design or was otherwise damaged, for instance due to handling, the condition should be considered a nontest. In such a case, the defective component should be reworked to print. In the case of a solar cell, the cell can be removed and the circuit jumpered as long as the minimum sample quantity is maintained. The delta qualification shall have the same test configuration, environment, and stressing conditions that failed the original component or assembly. The number of test articles in the delta qualification are to be at least the same number as those in the original test with no failures to pass qualification.

The qualifier shall determine and report the errors and measurement accuracies for each characterization and qualification test that it conducts.

6.1 Sample Selection The coupon/subcoupon(s) required by Section 7, Qualification Tests, and Section 8, Characterization Tests, shall be populated using flight quality part types.

Wherever there is a requirement for this Standard, the minimum sample count for certain tests, denoted by MSC in the Standard, defaults to 231. If a nondefault MSC is to be required, it must be explicitly specified with the requirement for the Standard, and must be greater than or equal to 116.

Reference this Standard with its default MSC by:

AIAA S-112A-201X Qualification and Quality Requirements for Electrical Components on Space Solar Panels.

Reference this Standard with a non-default MSC of, for example, 116 by:

AIAA S-112A-201X Qualification and Quality Requirements for Electrical Components on Space Solar Panels with MSC set to 116. An MSC greater than 116 does not require tailoring.

Higher MSCs enable achieving a given reliability for the qualified array and may reduce the power margin for cell or string failure.

It is assumed that the solar cell samples are taken from a population with a binomial distribution. To demonstrate that the qualification tests have a defect rate of less than 1% at a confidence level of 90%, requires a MSC of 231. To demonstrate that the qualification tests have a defect rate of less than 2% at a confidence level of 90% requires a MSC of 116.

Counts for part types not included below are defined in each section.

Repairs or removals and replacements that are anticipated or that are likely to occur on the flight panel shall be qualified during the course of the testing required herein. At a minimum, 5% of the CICs and blocking diodes shall be removed and/or replaced on coupons prior to testing. For CICs, at least one shall be at a string termination and one shall be in the middle of a string.

6.1.1 Electrical Components

If solar cells are used in a test involving coupon/subcoupon(s), the solar cell counts for each coupon/


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subcoupon(s) test are specified for the test in this standard. The part counts required for many of the remaining part types are implicitly defined by the number of solar cells required for the test. This Standard requires a quantity of interconnects, circuit end terminations, coverglasses, adhesives, diodes, and wires, necessary to support the solar cells in flight like configuration.

Counts for parts not included in the above are defined in each section. If a part type is not mentioned, the qualifier shall set the part count.

It is at the completion of a test that a part count for the test is required. The required number of parts shall result in that number of valid sets of data. The part count for a given test or exposure is sometimes stated as a number of parts plus expected attrition.

For each qualification and characterization test requiring solar cells, the solar cell samples shall be taken from at least three semiconductor formation lots, e.g. Metallorganic Vapor Phase Epitaxy (MOVPE) or diffusion lots, and three metallization lots. The solar cell/CIC sample shall be selected so that the electrical performance and distribution is as similar as practical to that of a population representing the minimum average efficiency and distribution intended for flight. The solar cell/CIC sample shall be manufactured using processes to be qualified under this standard. All solar cells used on solar panels to be qualified under this standard shall be qualified to AIAA S-111-2005 “Quality and Qualification Requirements for Space Solar Cells.”

For each qualification and characterization test requiring blocking and/or bypass diodes, the diodes shall be taken from more than one lot, when available.

6.1.2 Coupon/Subcoupon(s) Substrate

Each test that requires a coupon in Section 7 and Section 8 states which of the following coupon substrates should be used.

6.1.2.1 Flight Like Coupon/Subcoupon(s) Substrates

Where required these substrates shall meet the following requirements:

The coupon/subcoupon(s) substrate shall be as close as practical to the intended flight substrate. The coupon(s) substrate shall include a minimum of one example of the different doubler configurations, inserts, core splices, terminal boards, temperature sensors, harness spot bonds, wiring boots, brackets, snubbers, as well as, any substrate reinforcements, clamps, edge close-outs, thermal control layers and coatings, and any additional bonded and bolted-on components that will exist on the flight panels. All added substrate components and inserts are to have the flight size represented on the test coupons. For diode board testing see Section 7.1.2.

If a ground or ground(s) are present on the flight article, a minimum of two grounds are required. Each ground shall be electrically connected to a wire. The two grounds shall be placed as far as possible from each other.

If the flight panel will have an insulator splice, the coupon/subcoupon(s) shall include an insulator splice.

6.1.2.2 Test Coupon/Subcoupon(s) Substrate

Where required these substrates shall meet the following requirements:

As size allows, the coupon/subcoupon(s) substrate(s) shall be as close as practical to the intended flight substrate except that they need not have grounds, inserts, core splices, insulator joints, or splices or doublers.


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6.2 Visual Inspection 6.2.1 Comprehensive Visual Inspection

Where this Standard requires, the qualifier shall visually inspect all of the parts on a coupon or other substrate including the substrate itself. This is to be done to the qualifier’s standard inspection procedures with this forming the basis of acceptance and rejection criteria. The qualifier shall note and report all discrepancies on all parts. The qualifier shall, in any event, note and report solar cell anomalies, solar cell cracks and chips, solar cell AR coating defects, solar cell metallization defects, coverglass anomalies, coverglass cracks and chips, coverglass coating defects, interconnect cracks, failed or lifted welds, chafing of wire insulation, wire insulation defects, discoloration of any part, surface contamination, de-bonds, de-laminations, connector defects and any other anomaly that might affect electrical output or mechanical integrity. When present the qualifier shall note and report discrepancies on temperature sensors, grounding, and parts associated with electrostatic cleanliness. The qualifier shall inspect an anomaly at up to 30x with polarized light to clarify whether an anomaly might affect reliability or performance.

Fail qualification if more than 3% of a coupon or subcoupon solar cells have cracks propagating from weld(s) or solder sites, or have a fault related to the parts, materials, or processing of the solar cell. Fail qualification or re-perform characterization if any part has a defect which has or might reduce power by more than 3%.

For characterizations, repeat if an anomaly has compromised the characterization.

6.2.2 Visual Inspection of CICs

Where this Standard requires a visual inspection of CICs that are not mounted on a substrate, the qualifier shall note and report solar cell anomalies, solar cell cracks and chips, solar cell anti-relection coating defects, solar cell metallization defects, coverglass anomalies, coverglass cracks and chips, coverglass coating defects, interconnect cracks, failed or lifted welds, discoloration of any part, surface contamination, debonds, delaminations, and any other anomaly that might affect electrical output or mechanical integrity. This is to be done to the qualifier’s standard inspection procedures with this forming the basis of acceptance and rejection criteria. The qualifier shall inspect an anomaly at up to 30x with polarized light to clarify whether an anomaly might affect reliability or performance.

Fail qualification if more than 3% of solar cells have cracks propagating from weld(s) or solder sites, or have a fault related to the parts, materials, or processing of the solar cell. Fail qualification if any part has a defect, which has or will reduce power by more than 3%.

For characterizations, repeat if an anomaly has compromised the characterization.

6.2.3 Visual Inspection of Coverglasses

Where this Standard requires a visual inspection of coverglasses as a standalone part, the qualifier shall note and report coverglass cracks, chips, and coating defects. This is to be done to the qualifier’s standard inspection procedures with this forming the basis of acceptance and rejection criteria. For characterizations, repeat if an anomaly has compromised the characterization. 6.3 Test Temperature Definitions and Requirements for Temperature

Measurement This Standard requires functional tests and environmental exposures at the three temperatures specified here.

Hot test temperature (HTT) shall be at least 10C above the highest predicted flight temperature for the part type.


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However, when HTT is required for a functional electrical test and the HTT is above 80C, the functional test may be conducted at 80C or above.

Cold test temperature (CTT) shall be at least 10C below the lowest predicted flight temperature for the part type. For predicted flight temperatures below 170C, the CTT shall be to the lowest predicted flight temperature as reasonably allowed by the test equipment.

Ambient test temperature (ATT) shall be at 23.5±5C.

The qualifier shall use a minimum of ten (10) temperature sensors to measure the test temperatures on coupons or subcoupons. Five sensors are to be on the solar cell side of the panel and the remaining five are to be on the rear side of the panel, in positions that are opposite, that is, that mirror the solar cell side temperature sensors. Temperature sensors are to be placed near each of the four (4) corners and at the center of the panel. It is preferred and advisable, if space permits, to have redundant, backup temperature sensors co-located with each of the primary ten temperature sensors. If the solar cell qualification panel includes any structural non-uniformities or compositional variations, additional temperature sensors are to be placed in these locations for temperature monitoring and control. All temperature sensors are to satisfy the HTT and CTT conditions specified above. More than 20% defective or inaccurate temperature sensors shall require that an environmental exposure be interrupted for the purpose of repairing or replacing the problematic sensors. The temperature rate of change for all temperature sensors shall be monitored and is required to be less than 100C per minute when measured at a data rate less than or equal to a two (2) second period.

6.4 Functional Tests Section 7, Qualification Tests and Section 8, Characterization Tests of this Standard may require the following functional tests and inspections before and after environmental exposure or component characterization.

Notwithstanding reporting requirements of each section, the qualifier shall report the results of electrical test required by Section 6.4.1 and Section 6.4.2 in graphical and tabular formats.

The failure criteria specified in this section apply only to qualification tests. They do not apply to characterization tests.

6.4.1 Electrical Test of CICs or Solar Cell Strings or Solar Cell Circuits

Where this Standard requires an electrical test of CICs, strings, or circuits, the qualifier shall measure output under simulated AM0 illumination as defined by ASTM E927-10, Standard Specification for Solar Simulation for Photovoltaic Testing, Class A with the exception of spectral match when testing multi-junction solar cells. For this, the simulator spectrum shall be sufficiently accurate to simultaneously obtain the Isc of each of the sub-solar cell junctions of balloon flown standards (or standards of at least that quality) within +/- 1%, except for multijunction solar cells having a germanium junction, in which case the simulator shall obtain the Isc of the germanium junction to within +30% -1%.

Where this Standard requires an electrical test at ATT, the resulting current versus voltage data shall be analytically extrapolated to 28C.

Where this Standard requires an electrical test at HTT, the resulting current versus voltage data shall be analytically extrapolated to the highest predicted flight temperature.

Fail qualification if after any functional test the maximum power (Pmp) of any string degrades more than 2% of the initial measurement at ATT based on the extrapolation to 28C; or more than 3% of the initial measurement at HTT based on the extrapolation to the highest predicted flight temperature.

If the failure criteria are met, the qualification is failed, excepting failures induced by handling, equipment failure, overtest, and so forth. These will result in a declaration of invalid test.


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Failure is not exclusive to the solar cells; it may also be attained through the problematic performance of welds, CICs, interconnects, wires, blocking diodes, connectors, substrates, or any other component on a coupon/subcoupon(s).

6.4.2 Electrical Test of Bypass Diodes

This test is waived if the array being qualified does not have bypass diodes.

The bypass diode test is conducted at ATT with the solar cells associated with the diodes darkened. Forward bias the bypass diodes in a string for a minimum of 10 minutes at 110% of the maximum predicted flight solar cell Isc.

Fail qualification if the diode circuit demonstrates an anomaly that would result in its inability to perform nominally. Fail qualification if a diode shorts or opens.

6.4.3 Electrical Test of Grounds to Substrate

This test is waived if the array being qualified does not have grounds.

Wherever this Standard requires an Electrical Test of grounds; the sample is required to have a minimum of two grounds with a wire electrically attached to each ground.

Measure the resistance between the pair(s) of ground wires at ATT.

If the resistance exceeds a value predetermined by the qualifier, fail the test. This Standard suggests a maximum value of 2 ohms. On a measurement between two ground wires, this suggestion results in 4 ohms.

6.4.4 Functional Test of Temperature Sensors

This test is waived if the flight array does not have temperature sensors.

If a temperature sensor shorts or opens, fail the test required by this section.

Use the temperature sensors being qualified to measure coupon temperature. Correlate this to the temperature measured by ground support temperature sensors at ATT. If the accuracy of the temperature sensors being qualified does not match the temperature from the ground support sensors within a pre-determined value set by the qualifier, fail the test required by this section.

6.4.5 Electrical Test of Conductively Coated Coverglasses

This test is waived if the array being qualified does not have conductively coated coverglasses.

The qualifier shall predetermine an acceptable value of resistance between the coverglasses and the node(s), usually ground, to which the coverglasses are connected. The qualifier shall also predetermine the percentage of coverglasses which may exceed the acceptable post test resistance between the coverglass and the ground node.

At ATT measure the resistance between each coverglass and the coupon/subcoupon(s) ground or other node as appropriate.

If the percentage of coverglasses exceeds the pre-set node resistance criteria, fail the test required by this section.

6.4.6 Electrical Test of Blocking Diodes

This test is waived if blocking diodes are not present on the flight array.

The blocking diode tests are only run on diodes fixed to coupon/subcoupon(s). For most cases, the diodes are divided into two sets. One set is wired in series for forward bias tests. The other set is wired in parallel for reverse bias tests. To obtain better test fidelity, the qualifier has the option to subdivide either


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set into subgroups.

6.4.6.1 Forward Bias Function

At ATT, measure the forward voltage drop of each blocking diode in the series groups while conducting at least 110% of the maximum predicted flight solar cell Isc.

Fail qualification if any of the forward voltages are not within the qualifier’s standard acceptance requirements for the blocking diode. Fail qualification for this section if a diode shorts or opens.

6.4.6.2 Reverse Bias Function

At ATT, measure the blocking diodes’ leakage current by group when reverse biased to at least 200% of the highest predicted flight reverse voltage on the diode.

Fail qualification for this section if the reverse current leakages are not within the qualifier’s standard acceptance requirements for the blocking diode. Fail qualification for this section if a diode shorts or opens.

As the diode is tested in an electrically paralleled group, some fidelity of this test for the individual diodes is lost. To compensate for this in the case of anomalous current, the diodes will be disconnected and tested individually.

6.4.7 Insulation Resistance

Place a minimum of 250 volts or 200% of the highest predicted Voc at worst case cold condition, whichever is higher, between the substrate core (ground) or face-sheet and the positive and negative leads of the solar cell circuits. The connection to ground may be made by the flight like grounds referenced in Section 6.1.2.1. Monitor the insulation resistance continuously for five minutes. Fail qualification on panels larger than or equal to 0.2 m2 if the resistance for each square meter is not greater than 100MΩ using the following example formula:

Panel Area in Square Meters * Measured Resistance in MΩ / (1 * m 2) > 100 MΩ.

For areas less than 0.2 m2, the resistance must exceed 500 MΩ. Measure the insulation resistance at ATT, CTT and HTT.

6.4.8 Parts Not Covered

The qualifier shall determine whether parts not covered by the above shall be subjected to functional tests and shall determine the tests and failure criteria necessary to qualify the parts.

6.5 Inspection and Function Test Ensemble Wherever the Standard invokes this Inspection and Function Test Ensemble it will require that the ensemble be run at a single or several temperatures. With the exception of the Visual Inspection, which is always conducted at ambient temperature, run the following tests at the specified temperature(s).

Perform a visual inspection in accordance with Section 6.2.1, Comprehensive Visual Inspection.

If solar cells are on an item to be tested, perform an electrical test of each CIC, string, or circuit as appropriate, in accordance with Section 6.4.1, Electrical Test of CICs or Solar cell Strings or Solar cell Circuits.

If bypass diodes are on an item to be tested, perform an electrical test of the bypass diodes in accordance with Section 6.4.2, Electrical Test of Bypass Diodes.

If grounds to substrate or other node are on an item to be tested, perform tests in accordance with Section 6.4.3, Electrical Test of Grounds to Substrate.


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If temperature sensors are on an item to be tested, perform tests in accordance with Section 6.4.4, Functional Test of Temperature Sensors.

If conductively coated coverglasses are on an item to be tested, perform tests in accordance with Section 6.4.5, Electrical Test of Conductively Coated Coverglasses.

If blocking diodes are on an item to be tested, perform tests in accordance with Section 6.4.6, Electrical Test of Blocking Diodes.

Perform tests in accordance with Section 6.4.7, Insulation Resistance.

7 Qualification Tests 7.1 Life-Cycle Coupon Test With Humidity Exposure 7.1.1 Purpose

The purpose of this test is to qualify parts, materials, and processes, and verify that the electrically active flight panel will survive a mission-specific environment.

7.1.2 Sample: Life-Cycle Coupon/Subcoupons

The coupon/subcoupon(s) for the life cycle tests with humidity exposure shall be populated with a MSC of solar cells plus expected attrition. If possible, build the coupon(s)/subcoupon(s) with electrical strings configured to produce flight voltages. All subcoupons shall have a minimum of 18 cells, except the subcoupon that is to be illuminated (see next paragraph). The solar cell samples must be wired into individual strings for this. Electrically paralleling of strings is not allowed even if that is the flight configuration. This is to increase the ability to find anomalies should they occur. In any event, the test configuration must be such that an open or shorted solar cell can be readily identified.

Section 7.1.3.4, Combined Effects Exposure, requires that the qualifier illuminate with AM0 during the hot side of the thermal cycling. The illuminated coupon shall be a single item containing the maximum number of solar cells that will fill a uniformly illuminated area of at least 500 square centimeters.

The solar cell samples must be wired into individual strings for this. Electrically paralleling of strings is not allowed even if that is the flight configuration. This is to increase the ability to find anomalies should they occur. In any event, the test configuration must be such that an open or shorted solar cell can be readily identified.

If the flight panels are to be equipped with blocking diodes, a MSC plus attrition shall be tested in flight configuration on coupon/subcoupon(s) that do not include solar cells. The MSC of diodes shall be divided into two equally sized groups. One group for forward bias and the other for reverse bias. To obtain more accurate results, either group may be further sub-divided at the option of the qualifier. The group or groups designated for forward bias testing shall be wired in series; the group or groups for reverse bias testing shall be wired in parallel.

Counts for remaining part types are defined in Section 6.1, Sample Selection; and, the following.

The count required for all electrical part types not previously defined is to be apportioned to the total number of such parts on the flight panels taking into account flight design and reliability. However, a minimum of two such parts is required. This includes each connector type, temperature sensor type, each wire type etc. In the event that test connectors are used on the flight array, two of each type are required unless the test connectors will be removed prior to flight.

This test requires coupon/subcoupon(s) substrates to the requirements of Section 6.1.2.1, Flight Like Coupon/Subcoupon(s) Substrates.


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7.1.3 Procedure

Run this section’s tests in the order written.

7.1.3.1 Humidity Exposure

1. At ATT and HTT, perform the inspection and tests required in Section 6.5, Inspection and Function Test Ensemble.

2. Expose the coupon/subcoupon(s) to 95 ± 4% relative humidity at 45°C for 21 days.

3. The qualifier shall insure that the coupon is sufficiently dry for subsequent steps.

4. At ATT and HTT, perform the inspection and tests required in Section 6.5, Inspection and Function Test Ensemble.

7.1.3.2 Thermal Environment Exposure

If thermal analysis shows that any component operates at temperatures encompassed by the coupon temperatures, the component may be cycled between the coupon CTT and HTT specified below; or it may be cycled between its own CTT and HTT in the same chamber as the coupons by any appropriate means including the use of non-flight thermal blanketing and individual heaters.

7.1.3.3 Thermal Vacuum Bake-out and Thermal Vacuum Cycling

1. Place the coupon/subcoupon(s) in a vacuum chamber.

2. To remove water, gradually heat the coupons to 80°C for 24 hours in a vacuum of 10-5 Torr or less then gradually increase temperature to 100°C for 36 hours in a vacuum of 10-5 Torr or less. Subsequent to initial heating, the vacuum may not meet the 10-5 Torr requirement. In this case, the test times shall start after 10-5 Torr pressure is established.

3. Expose the solar cell and diode coupons to a minimum of eight thermal vacuum cycles between the CTT and HTT for their respective part types.

During the thermal vacuum exposure:

4. This test and several of the tests below require that a current be passed through components during the cooled portion of each thermal cycle. If these currents prevent the coupon/subcoupon(s) from reaching CTT in an acceptable time, the qualifier may substitute lower currents to mitigate the unwanted heating.

Dark forward-bias the solar cell circuits at the highest predicted operational current during the heating portion and through the HTT portion of each and every cycle except the second and seventh. Continue this forward-bias current level until at least 10C below the HTT. Monitor the circuit voltages throughout the cycles to detect any changes, which could indicate intermittent or other faults in the circuit. During the cooling portion of the thermal cycles, monitor the continuity of the solar cell circuits with a forward-bias current of a minimum of 10% of nominal cell Isc at ambient temperature. If a solar cell circuit demonstrates a change that would result in its inability to perform nominally, assess to determine if the non-nominal condition warrants qualification failure. Fail qualification if a solar cell circuit has a solar cell short or open.

5. On the second and seventh thermal vacuum cycles, temporarily suspend the solar cell circuit dark-forward bias and forward bias the bypass diode circuits at the highest predicted operating current during the heating portion and through the HTT portion of each cycle. Continue this forward-bias current level until at least 10C below the HTT. Monitor the circuit voltages throughout the cycles to detect any changes, which could indicate intermittent or other faults in the circuit. During the cooling portion of the thermal cycles, monitor the continuity of the bypass diode circuits with a forward-bias current of a minimum of 10% of nominal cell Isc at ambient temperature. If a bypass diode circuit demonstrates a


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change that would result in its inability to perform nominally, assess to determine if the non nominal condition warrants qualification failure. Fail qualification if the bypass diode circuit opens or suffers a resistance increase that might cause solar cell failure.

6. If blocking diodes are present, forward bias half of the MSC of diodes set up for this at their highest predicted operating current during the heating portion and through the HTT portion of each and every cycle; continue this forward bias until the temperature is at least 10C below HTT. Monitor the circuit voltages throughout the cycles to detect any changes, which could indicate intermittent or other faults in the circuit. During the cooling portion of the thermal cycles, monitor the continuity of the diode circuits with a forward-bias current of a minimum of 10% of nominal cell Isc at ambient temperature. If the current or voltage shows anomalous behavior stop the test and evaluate the diodes individually in accordance with Section 6.4.6.1, Forward Bias Function. If a diode circuit demonstrates a change that would result in its inability to perform nominally, assess to determine if the non nominal condition warrants qualification failure. Fail qualification if a diode circuit has a short or open.

7. If blocking diodes are present, reverse bias half the MSC of diodes set up for this at 200% of their highest predicted flight reverse voltage during each and every cycle. If the current or voltage shows anomalous behavior stop the test and evaluate the diodes individually in accordance with Section 6.4.6.2, Reverse Bias Function. If the test demonstrates that the diodes do not perform nominally, assess to determine if the non nominal condition warrants qualification failure. Fail qualification if a diode shorts or opens.

8. If substrate grounds are present, usually to the substrate core or face-sheet, continuously measure the resistance between a pair of the grounds during each and every cycle by means of the wires attached to the grounds. Fail qualification if the connection between the two wires opens or shows anomalously high resistance. The qualifier may determine additional failure criteria for this test. The qualifier shall determine the definition of anomalously high resistance before the start of test.

9. If flight-like temperature sensor assemblies are present, continuously monitor them during each and every cycle. The temperature sensor assembly qualification shall fail if the temperature sensors open or short. The qualifier shall determine the failure criteria for temperature sensor assembly agreement with the ground support temperature sensors.

10. On the eighth thermal cycle, reconfigure the solar cell coupon circuitry for an insulation resistance check. Place a minimum of 250 volts or 200% of the highest predicted Voc at worst case cold condition, whichever is higher, between the substrate core (ground) or face-sheet and the positive and negative leads of the solar cell circuits. The connection to ground may be made by the flight like grounds referenced in Section 6.1.2.1. Monitor the insulation resistance continuously for five minutes. Fail qualification on panels larger than or equal to 0.2 m2 if the resistance for each square meter is not greater than 100MΩ using the following example formula:

Panel Area in Square Meters * Measured Resistance in MΩ / (1 * m 2) > 100 MΩ.

For areas less than 0.2 m2, the resistance must exceed 500 M Ω. Measure the insulation resistance at ATT, CTT and HTT.

11. Remove the test articles from the vacuum chamber.

12. At ATT and HTT, perform the inspection and tests required by Section 6.5, Inspection and Function Test Ensemble.

7.1.3.4 Combined Effects Exposure

1. If the number of mission thermal cycles is less than eight, this test may be waived. Thermal vacuum cycles, as defined in Section 7.1.3.3, may be substituted for the ambient pressure cycles required in this section.


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2. For the following tests, temperature transitions shall not exceed 100C/minute.

3. Expose the solar cell and diode coupons to thermal cycling between CTT and HTT for their respective part types for 1.5 times the mission cycles in dry nitrogen or vacuum at the qualifier’s option. If cycling in dry nitrogen, maintain the chamber at slightly higher than ambient pressure. If the diode test temperatures are encompassed by the solar cell CTT and HTT, the diode coupon/subcoupon(s) may be cycled to the same temperature extremes as the solar cell coupon/subcoupon(s) and vice versa.

4. Some missions may have a significant percentage of thermal cycling in which the flight predicted hottest temperature is substantially below the predicted maximum temperature used to determine HTT; and, some missions may have a significant percentage of thermal cycling in which the coldest flight predicted temperatures are substantially above the predicted minimum temperature used to determine CTT. In such cases, and for this subsection only, the qualifier may compute CTT and HTT for such cycles and run the test for 1.5x the number of each of the reduced temperature extreme cycles. In the case that the qualifier elects this option, the cycling to the varied CTTs and HTTs shall, if feasible, occur approximately in the order that occurs in flight. If this is not feasible, the qualifier shall test to the more extreme temperatures and the hotter temperatures toward the end of the test.

For example, a mission may have 1,000 cycles with 250 cycles having a cold predicted temperature of -140C for the solar cells and a hot predicted temperature of 75C for the solar cells. The remaining 750 cycles may have a cold predicted temperature of -100C for the solar cells and a hot predicted temperature of 120C for the solar cells. The solar cell CTT and HTT for 250 cycles is therefore respectively -150C ± 5C and 85C ± 5C. The solar cell CTT and HTT for the 750 cycles is respectively -110C ± 5C and 130C ± 5C. The qualifier can then optionally test the solar cell coupons to 375 cycles between -150C and 85C and 1125 cycles between -110C and 130C.

5. This test and several of the tests below require that a current be passed through components during the cooled portion of each thermal cycle. If these currents prevent the coupon/subcoupon(s) from reaching CTT in an acceptable time, the qualifier may substitute lower currents to mitigate the unwanted heating.

From the start of the heated portion of each and every cycle and for its duration, illuminate the required one or optionally several solar cell coupon/subcoupon(s) with equivalent AM0, loading such that the solar cells in the string(s) operate at their nominal flight predicted voltage. Dwell a minimum of 1 minute at the hot extreme. Dark forward bias the remainder of the subcoupon(s) to follow the current profile obtained from the illuminated coupon. Continue this forward-bias current level until at least 10C below the HTT. During the cooling portion of the thermal cycles, monitor the continuity of the solar cell circuits with a forward-bias current of a minimum of 10% of nominal cell Isc at ambient temperature. Monitor the circuit voltages throughout the cycles to detect any changes, which could indicate intermittent or other faults in the circuit. If a solar cell circuit demonstrates a change that would result in its inability to perform nominally, assess to determine if the non-nominal condition warrants qualification failure. Fail qualification if a solar cell circuit has a solar cell short or open.

6. Perform this test every 25 cycles. Douse the illumination. Temporarily suspend the solar cell circuit dark-forward bias and forward bias the bypass diode circuits on all coupons at the highest predicted operating current during the heating portion and through the HTT portion of the cycle. Continue this forward-bias current level until at least 10C below the HTT. Monitor the circuit voltages throughout the cycles to detect any changes, which could indicate intermittent or other faults in the circuit. During the cooling portion of the thermal cycles, monitor the continuity of the bypass diode circuits with a forward-bias current of a minimum of 10% of nominal cell Isc at ambient temperature. If a bypass diode circuit demonstrates a change that would result in its inability to perform nominally, assess to determine if the non nominal condition warrants qualification failure. Fail qualification if the bypass diode circuit opens or suffers a resistance increase that might cause solar cell failure.

7. If blocking diodes are present, forward bias half of the MSC of diodes set up for this at their highest predicted operating current during the heating portion and through the HTT portion of each and every cycle; continue this forward bias until the temperature is at least 10C below HTT. Monitor the circuit


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voltages throughout the cycles to detect any changes, which could indicate intermittent or other faults in the circuit. During the cooling portion of the thermal cycles, monitor the continuity of the diode circuits with a forward-bias current of a minimum of 10% of nominal cell Isc at ambient temperature. If the current or voltage shows anomalous behavior stop the test and evaluate the diodes individually in accordance with Section 6.4.6.1, Forward Bias Function. If a diode circuit demonstrates a change that would result in its inability to perform nominally, assess to determine if the non nominal condition warrants qualification failure. Fail qualification if a diode circuit has a short or open.

8. If blocking diodes are present, reverse bias half of the MSC of diodes set up for this at 200% of their highest predicted flight reverse voltage during each and every thermal cycle. If the current or voltage shows anomalous behavior stop the test and evaluate the diodes individually in accordance with Section 6.4.6.2, Reverse Bias Function. If the test demonstrates that the diodes do not perform nominally, assess to determine if the non nominal condition warrants qualification failure. Fail qualification if a diode shorts or opens.

9. If substrate grounds are present, usually to the substrate core or face-sheet, continuously measure the resistance between a pair of the grounds during each and every cycle by means of the wires attached to the grounds. Fail qualification if the connection between the two wires opens or shows anomalously high resistance. The qualifier may determine additional failure criteria for this test. The qualifier shall determine the definition of anomalously high resistance before the start of test.

10. If flight-like temperature sensor assemblies are present, continuously monitor them during each and every cycle. The temperature sensor assembly qualification shall fail if the temperature sensors open or short. The qualifier shall determine the failure criteria for temperature sensor assembly agreement with the ground support temperature sensors.

11. Immediately after the first cycle; the one-hundredth cycle, if the number of mission cycles exceeds 100; 0.5 mission cycles; 1.0 mission cycles; and 1.5 mission cycles, remove the coupons from the chamber; and, at ATT and HTT, perform the tests required by Section 6.5, Inspection and Functional Test Ensemble. If desired, additional test breaks may be added.

7.1.4 Reporting Requirements

Report data for each electrical test in graphical and tabular form. Summarize all visual inspections. Include test setup and coupon photographs in the report.

7.2 Panel-Level Volatile Condensable Materials (VCM) / Acoustic Test 7.2.1 Purpose

The purpose of this test is to qualify parts, materials, and processes used in building panels to ensure mechanical and electrical integrity under launch conditions, and to characterize the out-gassing of components subsequent to launch.

In the case that the solar array consists of panel types containing identical part types but that experience different mechanical stress or are of different size, it is only necessary to qualify the panel type analyzed to have the greatest mechanical stress.

7.2.2 Sample: Panel

A proto-flight panel may be used for this test.

Use a full-size flight panel substrate with flight quality and flight configured insulation. Flight size active solar cell circuits shall be placed in the areas of greatest stress as well as over representative and required doublers, inserts, and insulator butt or lap joints. A minimum of two active circuits are required. Areas not covered by the active circuits shall be covered with CIC mass simulators. For this test, flight representative circuits are required as opposed to strings, which were required in the Combined Effects Test. (Of course if a string forms the entirety of a circuit, its use is satisfactory.)


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Part type counts for other than solar cells are determined by the requirements of Section 6.1, Sample Selection, and the following.

If the flight panels are to be equipped with blocking diodes, representative diodes shall be wired to the circuits and tested in flight configuration. These shall be present in the quantities required by the number of solar cell circuits on the panel and configured as they would be for flight.

The count required for all part types not previously defined is to be apportioned to the total number of such parts on the flight panels taking into account flight design and reliability. However, a minimum of two such parts is required. This includes each connector type, each temperature sensor type, each wire type, and so forth. In the event that test connectors are used on the flight array, two of each type are required unless the test connectors will be removed prior to flight.

The substrate shall be fabricated to flight configuration.

NOTE Using a full-sized panel for the sample allows an appropriate understanding of out-gassing constituents that have crippled sensors on missions past, and vibration/acoustic tests to gauge whether the solar panel will survive the launch environment.

7.2.3 Measure VCM

At ATT, perform the tests required by Section 6.5, Inspection and Function Test Ensemble.

The chamber along with all of the GSE and liquid nitrogen feed lines used for this test shall be baked out in advance at the maximum possible chamber temperature. The chamber temperature shall then be reduced to the temperature that will be used during the determination of the VCM of the test article. At this temperature, the background TQCM rate shall be at least a factor of two below the required TQCM reading for the test article. Failure to achieve this shall require an additional bake-out and possibly a precision clean of the chamber and GSE. The time of the bake-out will be determined by previous experience with the chamber.

The out-gassing rate required shall be tailored to each mission based on the results of molecular transport analysis. The TQCM temperature shall be set to -20C or the lowest temperature of the contamination sensitive surface that has a field of view to the solar array, whichever is lower. The panel shall be tested in a thermal vacuum test chamber or a bake-out box within the chamber. The later is a box with a single vent at which the TQCM may be placed for quantitative assessment of the out-gassing of the test article. If a bake-out box is not used, the TQCM location shall be determined by the contamination expert for the test article.

At ATT, again perform the tests required by Section 6.5, Inspection and Function Test Ensemble.

7.2.4 Acoustic Exposure

The intent of the acoustic test is to determine if any anomalies might be caused by the launch environment. Constrain the panel in a flight like launch configuration in a reverberant acoustic chamber capable of generating a diffuse acoustic field.

Subject the panel to an acoustic environment 6 dB above the maximum predicted environment (MPE) for all pertinent frequencies determined at the solar panel location on the satellite for a minimum of three minutes. Alternatively, a protoqualification may be performed by exposing flight hardware to an acoustic environment of 3 dB above the maximum predicted environment for all pertinent frequencies for a minimum of two minutes.

The above requirement assumes an effective duration of 15 seconds for the liftoff and ascent acoustic excitation. For launch conditions resulting in longer exposures to flight acoustic excitations, the test duration shall be tailored as described in Section 6.3.6.3 of Aerospace Report No. TR-2004(8583).

At ATT, again perform the tests required by Section 6.5, Inspection and Function Test Ensemble.


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Report data for each electrical test in graphical and tabular form. Summarize all visual inspections. Include test setup and panel photographs in the report.

7.3 ESD Test 7.3.1 Purpose

The purpose of this test is to evaluate the solar panel design for resistance to ESD damage, to analyze potential mission-level ESD levels for the solar array, and to establish coupon/subcoupon minimum ESD requirements based on array-level analysis.

Conduct this test in accordance with the following, which takes precedence, and ISO11221 Space systems – Space solar panels – Spacecraft charging induced electrostatic discharge test methods.

7.3.2 Sample: Solar Cell Coupon

The coupon/subcoupon(s) for the ESD tests shall be populated with a minimum of 63 solar cells. Build the coupon/subcoupon(s) in as square a configuration as possible. A subcoupon shall have a minimum of 9 solar cells. Circuits shall be electrically biased to flight voltage requirements. The greatest test voltage differentials between adjacent solar cells shall simulate the greatest flight voltage differentials between adjacent solar cells.

Part type counts for other than solar cells are determined by the requirements of Section 6.1 and the following: If the flight panels are to be equipped with blocking diodes, then representative diodes may be wired to the circuits in flight configuration.

This test requires a coupon substrate to the requirements of Section 6.1.2.1, Flight Like Coupon/Subcoupon(s) Substrates. The count required for all part types not previously defined is to be apportioned to the total number of such parts on the flight panels taking into account flight design and reliability. However, a minimum of two such parts is required. This includes each connector type, temperature sensor type, each wire type, and so forth. In the event that test connectors are used on the flight array, two of each type are required unless the test connectors will be removed prior to flight.

7.3.3 ESD Test

At ATT and HTT, perform the inspection and tests required by Section 6.5, Inspection and Function Test Ensemble.

Expose the coupon/subcoupon(s) to the predicted peak ESD current for the time period established for the array based on an analysis of the on-orbit environment.

At ATT and HTT, perform the inspection and tests required by Section 6.5, Inspection and Function Test Ensemble.


8 Characterization Tests 8.1 UV Effects 8.1.1 Purpose

The purpose of the UV Effects test is to characterize coupon material responses to UV over the range from 115 nm to 400 nm.


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8.1.2 Sample: Coupon/Subcoupon(s)

The CICs used for this characterization must be flight like in all respects except size. However, they must have a minimum size of 4 square centimeters.

This characterization requires a minimum of twelve (12) CICs plus expected attrition mounted to a coupon. The CICs shall be wired to be electrically independent of each other. Part counts for this characterization do not need to meet the requirements of Section 6.1, Sample Selection. Thermocouples for temperature measurement shall be mounted at several locations between the backside of a CIC and the substrate.

To evaluate and account for VCM contamination during the exposure, a minimum of two additional CICs shall be covered with removable UV-grade MgF2 coated fused silica coverglasses. The fused silica coverglasses shall be mechanically held in place (not bonded) and shall be removed at the end of the exposure to separate contamination effects from coverglass darkening and/or coating changes. The fused silica coverglasses shall fully cover the CICs. Pre- and postoptical transmission will indicate the VCM effect.

The chamber shall have an irradiance monitoring calibrated bare solar cell or calibrated CIC. The bare solar cell can be left in the beam at the discretion of the qualifier. The CIC shall be mounted such that it is normally out of beam but will be moved into the simulator beam for short times for periodic in-chamber intensity checks.

The coupon/subcoupon substrate shall meet the requirements of Section 6.1.2.2, Test Coupon/Subcoupon(s) Substrate.

8.1.3 Illumination Sources

For the exposure, use two light sources. One shall be calibrated from 220 to 400 nm, for example xenon. The other shall be calibrated from 115 -180 nm, for example deuterium. The minimum intensity of either exposure source shall be 1X AM0 and the maximum intensity shall be 4X AM0 in the respective wavelength band.

8.1.4 UV Vacuum Exposure

Perform the inspections required by Section 6.2.1, Comprehensive Visual Inspection.

At ATT, electrically test individual CICs in accordance with Section 6.4.1, Electrical Test of CICs or Solar cell Strings or Solar cell Circuits.

Expose the CICs to the two light sources for a minimum of 2,000 equivalent sun-hours. Expose at a minimum vacuum of 10-5 Torr with the coupon maintained at a temperature within 10C of the predicted flight average operating temperature in sunlight. Operate each solar cell within 100 mV of its short circuit current. Continuously monitor temperature and current.

To measure a possible “bleaching” effect after the in-situ measurements, measure the Isc of the solar cells at ATT prior to and while backfilling the chamber with dry air, not GN2. Continue the monitoring until changes reach an asymptote for up to 24 hours. Then perform a final set of measurements according to Section 6.4.1.

Perform the inspections required by Section 6.2.1, Comprehensive Visual Inspection.


Report data for each electrical test in graphical and tabular form. Summarize all visual inspections. Include test setup and CIC photographs in the report.


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8.2 Angle of Incidence This test is not required if the solar array will be pointed within 30 degrees of the sun-line for the mission duration.

8.2.1 Purpose

The purpose of the angle of incidence test is to characterize the response of the flight panel to different angles of incidence of incoming light.


This characterization requires a minimum of a single string of 16 CICs configured with four rows and four columns that is otherwise flight-like. At the qualifier’s option, additional strings may be used. Counts for the remaining parts are defined in Section 6.1, Sample Selection.

The coupon/subcoupon substrate shall meet the requirements of Section 6.1.2.2, Test Coupon/ Subcoupon(s) Substrate.

8.2.3 Vary Angle of Incidence

Perform a cursory inspection to be sure no damage has occurred pre- and posttest.

At ATT, electrically test the strings(s) in accordance with Section 6.4.1, Electrical Test of CICs or Solar Cell Strings or Solar Cell Circuits.

At ATT, electrically test the string(s) in accordance with Section 6.4.1 with the solar cell grids parallel to the axis of rotation at 5, 10, 20, 30, 40, 50, 60, 70, 80, and 85 degrees.

At ATT, electrically test the strings in accordance with Section 6.4.1 with the solar cell grids perpendicular to the axis of rotation at 5, 10, 20, 30, 40, 50, 60, 70, 80, and 85 degrees.

Perform a cursory inspection to be sure no damage has occurred pre- and posttest.

At ATT, electrically test the strings in accordance with Section 6.4.1, Electrical Test of CICs or Solar Cell Strings or Solar Cell Circuits.


Report data for each electrical test in graphical and tabular form. Include test setup photographs in the report.

8.3 Normal Emittance 8.3.1 Purpose

The purpose of the emittance measurement is to characterize the emittance of the CICs and the substrate rear face sheet. This is necessary for the prediction of panel temperature. If required, the qualifier will measure the emittance of additional components.

8.3.2 Coupon Substrate

Where a coupon is required, the substrate shall meet the requirements of Section 6.1.2.2, Test Coupon/Subcoupon(s) Substrate.

8.3.3 Sample: CICs

This characterization requires a minimum of twelve (12) CICs plus expected attrition.


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8.3.4 Measure Coverglass Emittance

Perform a cursory inspection to ensure that the samples are undamaged, do not have cracks, and do not display visible contamination. Perform the inspection required by Section 6.2.3, Visual Inspection of Coverglasses.

Measure the emittance of all of the CICs in accordance with ASTM E408, Standard Test Methods for Total Normal Emittance of Surfaces Using Inspection-Meter Techniques.

Perform the inspection required by Section 6.2.3, Visual Inspection of Coverglass.

8.3.5 Rear Face Sheet With Flight Thermal Coatings or Treatment (if applicable)

Sample at least 12 separate locations from a panel area of at least 1 m2 or the size of the panel, whichever is smaller. The sample locations shall form a matrix pattern approximately equidistant from each other over the entire sample area. If it is not practical to sample the panel itself, the measurements can be made from 12 smaller samples cut from an equivalent face sheet with back surface coatings representative of the flight design.

8.3.6 Measure Rear Face Sheet Emittance

Visually inspect the sample(s) or areas to be tested noting any defects that might cause the emittance measurement to be inaccurate.

Measure the emittance on the face-sheet samples with a procedure equivalent to ASTM E408, Standard Test Methods for Total Normal Emittance of Surfaces Using Inspection-Meter Techniques.

8.3.7 Other Samples

If the qualifier so deems, it shall characterize the emittance of other array components and write procedures for the characterizations.


Report data for each coverglass in graphical and tabular form. Include test setup photographs in the report.

Report data for each rear face sheet measurement in graphical and tabular form. Include test setup photographs in the report.

8.4 Solar Absorptance 8.4.1 Purpose

The purpose of the absorptance measurement is to characterize the absorptance of the CICs and, if required, the substrate rear face sheet. These data are needed for the prediction of panel temperature. If required, the qualifier will measure of the absorptance of additional components.

8.4.2 Coupon Substrate

Where a coupon is required, the substrate shall meet the requirements of Section 6.1.2.2, Test Coupon/Subcoupon(s) Substrate.

8.4.3 Sample: CIC Assemblies

This characterization requires a minimum of twelve (12) CICs plus attrition.

8.4.4 Measure CIC Absorptance

Perform a cursory inspection to ensure that the samples are undamaged, do not have cracks, and do not display visible contamination.


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Measure the absorptance of each sample with a procedure equivalent to ASTM E903, Standard Test Method for Solar Absorptance, Reflectance, and Transmittance of Materials Using Integrating Spheres, starting at 250nm, incremented in steps of 10 nm to 2,500 nm.

8.4.5 Rear Face Sheet With Flight Thermal Coatings or Treatment (if applicable)

Sample at least 12 separate locations from a panel area of at least 1 m2 or the size of the panel, whichever is smaller. The sample locations shall form a matrix pattern approximately equidistant from each other over the entire sample area. If it is not practical to sample the panel itself, the measurements can be made from 12 smaller samples cut from an equivalent face sheet with back surface coatings representative of the flight design.

8.4.6 Measure Absorptance of Face Sheet Sample

Visually inspect the sample(s) or areas to be tested noting any defects that might cause the absorptance measurement to be inaccurate.

Measure the absorptance on the samples with a procedure equivalent to ASTM E903, Standard Test Method for Solar Absorptance, Reflectance, and Transmittance of Materials Using Integrating Spheres, starting at 250nm, incremented in steps of 10 nm to 2500 nm.

8.4.7 Other Samples

If the qualifier so deems, it shall characterize the absorptance of other array components and write procedures for the characterizations


Report data for each CIC in graphical and tabular form. Include test setup photographs in the report.

Report data for each rear face sheet measurement in graphical and tabular form. Include test setup photographs in the report.

8.5 Bypass Diode 8.5.1 Purpose

The purpose of this characterization is to develop a characteristic I-V curve for the bypass diodes.

8.5.2 Sample: Bypass Diode

If the flight panels use bypass diodes, a minimum of twenty-two (22) bypass diodes plus attrition is required. Otherwise this test is waived.

8.5.3 Electrically Characterize Bypass Diodes

Visually inspect the diodes.

At ATT, CTT and HTT, characterize the bypass diode’s I-V characteristics from 150% of the highest predicted reverse voltage to the forward voltage required to obtain 150% of the highest predicted forward current.

Visually inspect the diodes.


Report data for each test in graphical and tabular form. Include test setup photographs in the report.

8.6 Atomic Oxygen (AO) Test The qualifier shall establish by analysis the predicted effect of atomic oxygen on all of the parts of the


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array, including that different parts will be exposed to different fluxes of both ram (direct normal) and thermalized (indirect) AO. If the predicted effect on the parts would cause marginal or worse performance of critical functional characteristics of the parts, or the effect of AO on these parts is unknown, the qualifier shall expose the parts to the requirements of Section 8.6.3, Procedure.

8.6.1 Purpose

The purpose of this test is to evaluate the solar panel design for resistance to atomic oxygen degradation, to perform analysis on potential mission-level atomic oxygen threat levels for solar arrays, and to establish coupon/subcoupon minimum atomic oxygen test requirements based on array-level analysis.


This characterization requires a minimum of twenty-two (22) solar CICs plus attrition mounted to a coupon. Should the required number of solar CICs make the AO exposure test impractical, the number of solar CICs may be reduced to no less than twelve (12). If this sample size is still too large, the qualifier shall conduct the test with multiple exposures.

Part counts for other types shall be as required by Section 6.1, Sample Selection and as follows.

The coupon/subcoupon substrate shall meet the requirements of Section 6.1.2.2, Test Coupon/Subcoupon(s) Substrate.

8.6.3 Procedure

At ATT, perform the tests and inspections required by Section 6.5, Inspection and Function Test Ensemble.

Expose the coupon/subcoupon(s) to atomic oxygen at test requirements established by analysis of the atomic oxygen environment expected for the on-orbit array.

At ATT, perform the tests and inspections required by Section 6.5, Inspection and Function Test Ensemble.



8.7 Component Characterization In addition to the component characterizations required above, individually characterize all remaining components so that their performance may be predicted under the environments to which they are exposed. These environments include charged particles, irradiance including UV, thermal, atomic oxygen, dust and meteorites, humidity prior to launch, and so forth.

The solar cells shall be characterized in accordance with AIAA S-111-2005, Qualification and Quality Requirements for Space Solar Cells.

Report characterization in graphical and tabular form. Summarize all visual inspections. Include test setup and test item photographs in the report.

9 Quality Requirements The solar panel manufacturer shall comply with ISO 9001 or equivalent.

9.1 Performance The solar panel manufacturer shall demonstrate that parts delivered to this standard are equivalent to


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those which pass the tests and inspections in Section 7.

9.2 Panel Reliability The solar panel manufacturer shall establish the reliability of solar panels produced to this standard and baseline the methods used for calculating the specified reliability levels relating to Mean Time to First Failure (MTTFF), Mean Time Between Failures (MTBF), Time for Mean to Fail (TFMTF), and Failure in Time (FIT) rates. The solar panel manufacturer shall maintain an ongoing reliability assessment program to ensure the consistent reliability of their solar panels.

9.2.1 Failure Modes and Effects Analysis (FMEA)

The solar panel manufacturer shall perform a FMEA for panels to be produced under this standard. The FMEA shall identify and address potential failure modes and their causes. The FMEA shall contain a graph of potential failures by their likelihood against the severity of their consequences to performance and from this identify failure modes for corrective measures.

9.2.2 Ongoing Reliability Program

The solar panel manufacturer shall maintain an ongoing reliability program. The program shall provide for feedback to generate continuous improvement. In this regard, the manufacturer shall constantly evaluate production lines and ensure their stability. The ongoing reliability program shall include the following:

a. formal, routine, reliability testing of each manufacturing process;

b. the ability to tie solar panel failure to manufacturing processes;

c. the integration of the solar panel FMEAs to the reliability program;

d. testing of panels after exposure to key environments at a specified frequency;

e. the tracking of failures to manufacturing processes;

f. the recording of solar panel failures, their type, root cause, corrective action, and responsible manufacturing process.

9.3 Certification of Conformance When solar panels qualified in this document are delivered, a Certificate of Conformance shall document the following:

a. solar panel manufacturer’s name and address,

b. customer’s or distributor’s name and address,

c. solar panel type and performance specification sheet number,

d. lot identification codes (including assembly plant code),

e. conformance inspection acceptance date,

f. quantity of solar panels in shipment from manufacturer,

g. statement certifying product conformance and traceability, and

h. signature and date of transaction.

9.4 Lot Identification and Traceability All solar panels delivered to this standard shall be traceable to the applicable manufacturing processes, tools, raw materials and fabrication dates through the use of build paper, lot codes, and serialization or


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solar panel manufacturer certification. Solar cells on the panel shall have lot control from wafer processing through screening that provides wafer lot identification; operation (machine), date of operation, operator identification, quantity, and serial numbers of devices processed.

9.5 Test Equipment Maintenance and Calibration System The solar panel manufacturer shall establish and document maintenance and calibration procedures. The manufacturer shall prescribe the frequency of maintenance and calibration for its test equipment and gages. The solar panel manufacturer shall use ANSI/NCSL Z540-1-1994 or equivalent as a guideline.

9.6 Incoming, In-process, and Outgoing Inventory Control The manufacturer shall use procedures to control storage and handling of incoming materials, work in-process, and warehoused and outgoing product in order to (a) achieve such factors as age control of limited-life materials and (b) prevent inadvertent mixing of conforming and nonconforming materials, work in-process, finished product, resubmitted lots, or customer returns.

9.7 Process Control The solar panel manufacturer shall ensure that manufacturing is carried out as specified. The manufacturer shall monitor and control production processes and solar panel characteristics where necessary. Due to the complexity or sensitivity of operations, the manufacturer shall consider working environment, workmanship criteria, equipment set-up, and the need for special operator certification or continuous monitoring of critical parameters.

9.7.1 Statistical Process Control (SPC)

Where SPC is used to control processes within manufacturing, the methodology should use EIA-557 as a guide. If a process exhibits an out-of-control condition, appropriate cause and corrective action shall be undertaken and documented. The solar panel manufacturer shall determine which out-of-control signals to use based upon factors such as process capability, control limit proximity to specification limits, false alarm rates, and so forth. Hardware produced outside the specification limits (not to be confused with control limits), shall be considered nonconforming and shall require appropriate disposition.

9.7.2 Technology Process Flow Chart

The solar panel manufacturer shall generate a production flow chart for the solar panel family. The flow chart shall diagrammatically depict the sequence of processing steps for the solar panel from material and part receipt to final shipment of the panel.

9.8 Environmental Controls The solar panel manufacturer shall specify, control and monitor the relative humidity, temperature, and particle count for each critical process step (e.g., wafer fabrication, assembly). The manufacturer shall document the procedures and techniques for measuring these environmental parameters and limits. The manufacturer’s procedures shall contain corrective actions for out-of-tolerance environmental conditions. The manufacturer shall handle unsealed parts in such a way as to minimize the introduction of foreign material. In addition, the manufacturer shall provide for spittle protection in applicable critical areas (see MIL-STD-750, test method 5010).

9.9 Conformance of Production Solar Panels to Qualified Product 9.9.1 Certification of Space Qualified Facilities

The customer shall verify that the solar panel manufacturer facilities are adequate to produce panels to this standard. The verification and certification shall occur at intervals of no more than once every two years.


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9.9.2 Validation of Solar Panels Qualified for Space

The quality level for solar panels intended for space applications, and any test samples developed to space-qualify those solar panels under this standard, shall meet the quality requirements specified herein. To validate that solar panels claimed to be qualified under this method are identical to the originally qualified solar panels, the customer, or the customer’s representative, reserves the right, with notice, to audit all documentation including, but not limited to, process travelers and test data for compliance with parts, materials, and processes that are qualified under this Standard.

The solar panel manufacturer’s proprietary documentation shall be reviewed at a facility of the manufacturer’s choice.

9.9.3 Audit Schedules and Frequencies

Absent serious problems, the customer may conduct audits no more than once per year to ensure that production panels are equivalent to panels qualified under this Standard.

9.10 Electrostatic Discharge Sensitivity Program The manufacturer of ESDS class 1 and 2 solar panels shall institute an ESDS program commensurate with the classification. The requirements of EIA-625 apply, but may be tailored for establishing an ESDS program. On customer request, justification for the tailoring shall be made available to the customer for approval.

9.11 Reworked Solar Panels Reworked or repaired product shall be re-inspected in accordance with written procedures. Reworked product shall be documented and traceable. Rework is subject to customer review.

9.12 Design Construction and Process Change Control Procedures Subsequent to solar panel qualification, the manufacturer shall document all changes to design, parts, materials, and processes. The manufacturer shall also document the reasons for changes and shall classify each change as major or minor. The manufacturer shall evaluate the impact of changes against the design, parts, materials, processes, and configuration of the panel as it was originally qualified and report the impact. The manufacturer shall document any requalification, including but not limited to, delta qualification and protoqualification.

Upon request, the manufacturer shall provide the above information or “pedigree” to any customer prior to the purchase of panels. Any changes described by the pedigree are to be reported to and approved by the customer prior to manufacturing readiness review.

If changes are required during production of panels for a specific customer, the manufacturer shall report minor changes to the customer and shall obtain customer approval, prior to implementation, for major changes.

10 Critical Materials and Designs 10.1 Scope This section specifies requirements for certain critical materials.

10.2 Requirements a. Silver cladding shall be annealed and contain a minimum of 99.9% pure silver.

b. Pure tin, cadmium, and zinc shall not be present in finished space-qualified solar panels. Pure tin refers to a tin alloy with less than three atomic percent of an alloying metal (e.g.,


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lead). Pure cadmium and zinc is defined as these metals used or applied in a nonmixed metal or unalloyed state.

c. The solar panel shall only use materials with less than 1.0% total mass loss and less than 0.1% collected volatile condensable materials, as determined by the procedures of ASTM E-595 unless approved by the customer.

d. The manufacturer shall determine thermal coefficient of expansion, and glass transition temperature of organic materials used on the panel and qualified to this standard.

e. Solar panels containing beryllium oxide shall be clearly identified with the designation BeO.

11 Reporting Requirements If efficiency is reported in any of the required documents, the irradiance used to compute the efficiency shall also be reported.

11.1 Reports to be Produced Three products shall be delivered from this requirement: a qualification report, a characterization report, and a quality report. The reporting format is described in Sections 11.2, 11.3, and 11.4.

11.2 Qualification Report Qualification report tests are found in Section 7. The qualification report shall be organized in the following manner.

a. Title: The title page shall reflect the name of the solar panel family, and its approximate power.

b. Solar panel family description and features.

c. Test Article Specification: Report the drawings, specifications, and processes to which test articles were fabricated. If proprietary data is in any of the above, the report shall be in a separate document that can be kept at the qualifier’s facility.

d. Summary of qualification tests: Indicate whether the solar panel family passed or failed qualification on the first try. If the family did not pass the qualification initially, specify the changes that enabled it to pass.

e. Qualification test results: Qualification test results shall be reported in the following order:

1. Life-Cycle Coupon Test With Humidity Exposure (Section 7.1)

2. Panel-Level Volatile Condensable Material (VCM) / Acoustic Test (Section 7.2)

3. ESD Test (Section 7.3)

f. Qualification by similarity report: Compare and contrast each part type, material type, component type, and process of the qualified panel to the panel to be qualified. For each qualification test required by this standard, compare the qualifying similarity test results or flight results and the corresponding predicted environment to the panel to be qualified. Report any new or delta qualifications required. Reference and attach the qualification report for which the subject panel is similar.


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11.3 Characterization Report Characterization tests are found in Section 8. The characterization report shall be organized in the following manner:

a. Title: The title shall reflect the name of the solar panel family and its approximate power.

b. Solar panel family description and features

c. Test article specification: Report the drawings, specifications, and processes to which test articles were fabricated. If proprietary data is in any of the above, the report shall be in a separate document that can be kept at the qualifier’s facility.

d. Characterization test results: Characterization test results shall be reported in the following order.

1. UV Effects (Section 8.1)

2. Angle of Incidence (Section 8.2)

3. Normal Emittance (Section 8.3)

4. Solar Absorptance (Section 8.4)

5. Bypass Diode (Section 8.5)

6. Atomic Oxygen (AO) Test (Section 8.6)

7. Component Characterization (Section 8.7).

e. Similarity characterization results: Provide similarity results in accordance with Section 11.3d. The results do not require repeating the original characterization. Referencing the original report is sufficient with the original report attached.

Report any new characterizations required in accordance with Section 11.3d.

11.4 Quality Report Quality requirements are found in Section 9. The quality report shall be organized in the following manner:

a. Title: The title shall reflect the name of the solar panel family, and its nominal power, its approximate minimum average efficiency, and the level of qualification (e.g., LEO, GEO, or the combination of LEO/GEO).

b. Solar cell panel family description and features.

c. Quality requirements: Quality documents shall be arranged in the following order:

1. Panel Reliability (Section 9.2)

2. Failure Modes and Effects Analysis (FMEA) (Section 9.2.1)

3. Certificate of Conformance (Section 9.3)

4. Technology Process Flow Chart (Section 9.7.2).

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