SPD Mechanics and Cooling Status of the activity in Padova Rosario Turrisi Contents: Calibration of...
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Transcript of SPD Mechanics and Cooling Status of the activity in Padova Rosario Turrisi Contents: Calibration of...
SPD Mechanics and SPD Mechanics and CoolingCooling
Status of the activity in PadovaStatus of the activity in Padova
Rosario TurrisiRosario TurrisiContents: • Calibration of Johansson measuring machine • Cooling components• Half-stave test
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 22
Strong efforts for:Strong efforts for:• Learning and testing the new software PCDMIS 3.2 (DEA, Italy)Learning and testing the new software PCDMIS 3.2 (DEA, Italy)• Software development for semi-automatic measurements;Software development for semi-automatic measurements;• Analysis procedure for CFSS, mandrels, supports Analysis procedure for CFSS, mandrels, supports
(reference frame, checking points…)(reference frame, checking points…)• Non-trivial results interpretation;Non-trivial results interpretation;
First results:First results:New mandrel (l=140 mm) PLANARITY less than 30 New mandrel (l=140 mm) PLANARITY less than 30 mmOld mandrel (l=280 mm) PLANARITY less than 50 Old mandrel (l=280 mm) PLANARITY less than 50 mm
What’s going on/next:What’s going on/next:• Mandrels being produced at EuroMeccanicaMandrels being produced at EuroMeccanica• CFSS: prototype existing, new ones waiting for molds CFSS: prototype existing, new ones waiting for molds
Status of Johansson Status of Johansson machinemachine
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 33
Status of cooling Status of cooling componentscomponents
• Received from Medelec:Received from Medelec:– Phynox tubesPhynox tubes– CuNi capillariesCuNi capillaries
• Processing started: Processing started: – SqueezingSqueezing– Ni+Cu layer on tubes endsNi+Cu layer on tubes ends– Fittings procurement Fittings procurement
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 44
Half-stave test: assemblyHalf-stave test: assembly• Support: carbon fiber + rohacellSupport: carbon fiber + rohacell• Interface card as supportInterface card as support• AOS 54012 thermal grease, 50 to AOS 54012 thermal grease, 50 to
100 100 m thickness (borders to center m thickness (borders to center of the half-stave)of the half-stave)
• Ladder fixed by u.v. gluingLadder fixed by u.v. gluing
• Hydraulic connectivity as of final Hydraulic connectivity as of final project: phynox tube + capillaries project: phynox tube + capillaries (55 cm in - 22 cm out) (55 cm in - 22 cm out)
• p,T pick-up points along the p,T pick-up points along the cooling line + 2 pt1000 on ladderscooling line + 2 pt1000 on ladders
• IR camera for temperature map IR camera for temperature map recordingrecording
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 55
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 66
Cooling prototype schemeCooling prototype scheme
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 77
PointsA 25.00°C B 25.68°C C 28.74°C D 33.11°C E 38.16°C F 38.16°C
P=1.17 W, no coolingP=1.17 W, no cooling
TAVE=32 oC
chip number
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 88
P=1.11W, cooling onP=1.11W, cooling on
TOUT=12 oC
PointsA 15.91°C B 15.31°C C 15.91°C D 20.13°C E 19.56°C
TAVE=17 oC
chip number
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 99
P=8.92 WP=8.92 W
PointsA 21.69°C B 22.11°C C 22.80°C D 34.86°C E 40.20°C
TOUT=12 oC
TAVE=28 oC
chip number
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1010
Wires cut…Wires cut…
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1111
Disconnected chipsDisconnected chips
Bus extender chip 1 chip 2
Many thanks toM. Tessaro (CMS)INFN Padova
When/where damage happened?• No defects noticed at a visual inspection (by magnifing glasses) • Always protected by plastic cover, except:
• during mount• during measurement• for chip disconnection
• main drawbacks: temporary jig used and no automated movement
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1212
Half-stave V vs. AHalf-stave V vs. A
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1313
P=1.35W, cooling onP=1.35W, cooling on
TOUT=18 oC
PointsA 14.25°C B 14.55°C 1st chipC 14.25°CD 14.86°C E 16.35°C F 16.35°C G 15.31°C H 15.31°C I 14.86°C J 14.71°C K 14.71°C 10th chip
TAVE=15 oC
chip number
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1414
P=4.75 W (cooling on!)P=4.75 W (cooling on!)
PointsA 18.98°C B 20.98°C 1st chipC 21.41°C D 22.25°C E 24.18°C F 25.27°C G 22.53°C H 21.83°C I 20.13°C J 18.70°C K 18.41°C 10th chip
TOUT=18 oC
TAVE=21 oC
chip number
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1515
Temperature vs. Power – Temperature vs. Power – before before cutcut
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1616
Temperature vs. Power – Temperature vs. Power – 2 chips 2 chips cutcut
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1717
Transverse T profilesTransverse T profiles3.5 w – last 2 chips disconnected
2
1
before disconnection
February 18, 2004February 18, 2004 Rosario Turrisi - SPD Meeting - CERNRosario Turrisi - SPD Meeting - CERN 1818
Summary and conclusionsSummary and conclusions
• Mechanics and Cooling– Mandrel production started – Cooling components produced, processing started
• Half-stave test– Cooling principle verified with real chips– Origin of wire bonding damage under investigation