SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED ...
Transcript of SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED ...
SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED RESEARCH
AND TESTING (SICART )
(Sponsored by Department of Science and Technology, Govt. of India, New Delhi)
Sardar Patel Centre for Science and Technology
Vallabh Vidyanagar- 388120,
Dist: Anand, Gujarat, India
Phone: +91-2692-234966 Fax: +91-2692-238355
E-mail: [email protected] Website: www.sicart.res.in
Inauguration Picture of SICART
Major Objectives of SICART
Vision: To serve the industry and academic institutes persuing scientific research for building a better society by providing total scientific solutions.
Mission:
To bridge the gap between industries and academic research institutes by
spreading awareness of the importance of Material Analysis.
SICART is committed to the pursuit of excellence and its objectives are:
1. To provide instrument facilities to Research Institutions, Universities and Industries
within and outside Gujarat state.
2. To help and provide Consultation/R&D facilities to nearby industries.
3. To establish linkages with various National level and other reputed laboratories so
as to collaborate in research projects.
4. To help industries in developing indigenous instrumentation systems/products for
measurement, calibration and testing and issuing certification on the quality of raw
materials and products.
Authorization
1. Sophisticated Analytical Instruments Facility Supported by
Department of Science & Technology (Govt. of India)
2. Recognized by DSIR as a Research Centre
3. Recognized by Gujarat Pollution Control Board as External
Environmental Auditor, Schedule- I
4. Recognized by NABL
5. Recognized by Sardar Patel University as Research Centre for Ph.D.
study
List of Technical Staff
Sr. No.
Employee Name Designation Qualification
1 Prof. (Dr.) A. R. Jani
Hon. Director
M.Sc. (Physics) Ph.D. (Physics)
2 Dr. S. V. Patel
Sr. Scientific Officer
M.Sc. (Chemistry) Ph.D. (Polymer Chemistry)
3 Dr. M. P Patel
Jr. Scientific Officer
M.Sc. (Materials Science) Ph.D. (Materials Science)
4 Dr. K. K. Tiwari
Jr. Scientific Officer
M.Sc. (Environment Science) Ph.D. (Botany)
5 Dr. M. R. Tiwari
Jr. Scientific Officer
M.Sc. (Inorganic Chemistry) Ph.D. (Industrial Chemistry)
6 Dr. G. R. Chauhan
Jr. Scientific Officer
M.Sc. (Analytical Chemistry) Ph.D. (Chemistry)
7 N. B. Patel
Technician M.Sc. (Industrial Chemistry)
8 V. J. Patel
Technician M.Sc. (Solid State Physics)
9 Rima Sheth Technician M.Sc. (Analytical Chemistry)
10 V. A. Patel Technical Assistant
M.Sc. (Electronics)
11 Dhanvi Patel Technical Assistant
M. Sc. (Bio- Technology)
12 Dipen Patel Trainee Technician
M.Sc. (Analytical Chemistry)
Sophisticated Instrumentation Facility Available in SICART
(1) Field Emission Gun Scanning Electron Microscopy (FEG-
SEM)
Make: FEI Ltd Model: Nova NanoSEM 450
Resolution: 1.0nm at 15kV, 1.4nm at 1kV , 3.5nm at 100V,Accelerating
Voltage: 20V to 30kV, Beam current: upto
200nA Magnification: X25 to X10,00,000Field Emission Gun:Ultra-high
brightness Schottky emitter
(2) Environment Scanning Electron Microscope with EDAX
Philips, Holland, ESEM TMP+EDAX
Emission Current: 0 to 200 µA, Accelerating Voltage: 0.2 to 30 kV, Resolution with
Tungsten filament 3.5 nm at 30 kv, Magnification 10x to 400000x, Automatic scaled
micron marker, Specimen movement: X = 50 mm, Y = 50 mm, Secondary and
Gaseous Secondary with Energy Dispersive X- ray Analysis (EDAX) for qualitative
element analysis
(3) Transmission Electron Microscope (TEM) 200 kV
Technai-20, Phillips, Holland
Electron Source: LaB6 and Tungsten Filament, Accelerating Voltage
Point Resolution: 0.27nm, Magnification: 25x to 7,50,000x,
Single tilt sample holder with CCD Camera (Ultra microtome and Ultra Cutter for
sample Preparation)
(4) Inductively Coupled Plasma Spectrometer (ICP-OES)
Perkin Elmer,USA, Optima 3300 RL
Simultanious detection ,RF frequency:40MHz,RF power:750 to 1500 watts,Pump: 3
channel peristaltic pump 0.2 to 2.5 ml/m,spectrometer:6000pixel SCD Detector ,5000
Emission line resolution,Range:165 to 782nm for UV & VIS,Results:60 elements can
be detected in 1 min.
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(5) X- Ray Diffractometer (XRD)
Philips, Holland, X-pert MPD
Source: Cu target X-Ray tube,X-Ray Power: 2KW,
Detector: Xe-filled Proportional detector,Software:JCPD data base for powder
diffractometry,2 theta Measurement range: 2 to 136, Diffractometer radius: 130 to
230mm
(6) Wavelength Dispersive-X-Ray Fluorescence (WD-XRF)
Description: 4Kw, WD-XRF sequential basic system, X ray tube: Ultra thin Be
window (75µm) Detectors: Scintillation and flow counter detection Software:
Omnian software, TOXAL module, WROXI Mineral and mining Modules.
(7) 400 MHz FT-NMR Spectrometer (FT-NMR)
Model- Bruker, Switzerland, Avance III, Topspin 2.1
Liquid and Solid multi nuclei probe
Low-Temperature Facility (Range up to -800C)
Timing Resolution 12.5 ns, Minimum event time 25 ns, Single Chip RF generation,
Highest Phase resolution (0.0055°), Highest Frequency resolution (0.005 Hz)
Solid nuclei(31P ,29Si ,23Na ,27Al ,51V ,71Ga ,119Sn ,201Pb )
Useful for structure identification of organic, inorganic and polymer compound.
(8) Fourier Transform Infrared Spectrometer (FTIR)
Perkin Elmer,USA:Spectrum-GX
FTIR Spectrometer: Normal range: 4000-400cm-1
Operating Mode:MIR and NIR (Absorbance, Transmittance and Reflectance )
Scanning range: 15600-30cm-1
Scan time: 20scan/second
Resoluiton:0.15cm-1
Single Beam/Ratio:Single,Ditector:MIRTGS
(9) UV-VIS-NIR Spectrometer
Model-Perkin Elmer, USA, Lambda 19
Wavelength Range: 185-3200 nm for Absorbance/Transmission and 200-2500 for
Reflectance
Double Beam, Double Monochromator, Ratio Recording
Lamp: Deuterium (UV), Tungsten-Halogen (VIS/NIR)
Detectors: Photomultiplier tube for UV/Vis
Solid sample attachment: Lead-Sulphide cell (PbS) for NIR
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(10) LC-MS-MS (LCQ Fleet, TSQ Quantum Access)
Thermofisher scientific, USA
LCQ fleet and TSQ Quantum Access: ESI and APCI Source Quantum with HPLC
System
Mass range: LCQ Fleet: 50-2000 Daltons, TSQ-30-3000 Daltons
Pump: dual piston delivery system, built-in vacuum degasser.
Pressure range: 0 to 5800 PSI (0 to 400 bar) at flow rates up to 2 ml/min.
Operating temperature: 10°C to 40°C. Quaternary low pressure system.
(11) High Performance Liquid Chromatograph (HPLC)
Perkin Elmer, USA, Series-200
Quaternary gradient system ,flow rate 0.1 to 10ml/min variable operating back
pressure 5000psi,C-18,C-8 column, Detectors: Photo Diode Array (PDA
),range:190nm to 800nm,UV-VIS:190nm to 800nm,Flurescence Detector;range-
200nm to 900nm,sensitivity range 0.0001 to 2.0 AUS
(12) Gel Permeation Chromatography (GPC)
Perkin Elmer, USA, Series-200:
Determinations of Molecular weight of Polymer samples (Mn & Mw), Polydispersity.
Column: PL gel, Mixed-B, Mixed-D.
Molecular Weight distribution (range: 500-300000gm/mol)
Detector: Refractive Index (RI)
(13) High Performance Thin Layer Chromatograph (HPTLC)
Camag-Switzerland WinCat
Automatic applicator (Linomat-5) of selectable sample volume. GMP, GLP compliant
image plate scanner-3 and documentation (reproster-3) system.Scane range :( 190nm
to 800nm) Deuterium lamp tungsten lampand mercury lamp.
(14) Ion Chromatography (IC)
Dionex Dx – 600 IC System,
Electrochemical and absorbance detector
For sample separation of ions from one another, lanthanides, sugars, amino acids etc
(15) Gas Chromatography with Head Space
Perkin Elmer, USA, Auto System XL
Detector: FID (100 oC - 450oC), TCD (100 oC - 350oC) Detector, NPD and ECD,
Auto sampler
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(16) Gas Chromatograph with mass spectroscopy (GC-MS)
Perkin Elmer, USA, System XL with NIST Library
Analyser: Single Quadrupole with prefilter, Mass range: 20-650 Daltans (amu), Mass
stability:0.1m/z mass accuracy over 48 hours, Ionization modes: electro ionization
positive / negative, chemical ionization.
(17) Particle Size Analyzer (PSA)
Symantec-HELOS-BF, Germany
Laser Diffraction particle size determination system
Particle size range:0.5µm to 875 µm
Accuracy for Dry and Liquid sample
(18) CHN/S/O Elemental Analyser
2400 Series II, Perkin Elmer, USA,
Analyzed Elements: Carbon, Hydrogen, Nitrogen, Sulfur and Oxygen; Operating
Mode: CHN, CHNS and OXYGEN, Accuracy: 0.3 % abs, Analysis Time: 6 to 8
minutes per sample
(19) Thermal Analysis (DSC, TGA, STA)
Perkin Elmer, USA, (DSC-PYRIS-1; TGA-7)
Temperature Range: DSC (0°C to 400°C)
TGA (RT to 1000°C)
Sensibility: 0.1 gm (0.0001 mg)
Atmosphere: Nitrogen or Air
(19) STA
Perkin Elmer, USA.
Model- STA 8000.
Specification - Simultaneous analysis of TG with DTA mode and DSC.
Temperature-30°C to 1000°C
Atmosphere: Nitrogen.
(20) Mercury Porosimeter
ThermoQuest, USA, 440 & 140 with ultra Micropore
Operating Pressure:0.1to 400 Mpa,
Measuring Range for Pore Radius:
Pasal 140:1900 to 58,000 nm
Pasal 440: 31.8 to 7,500 nm
(21) Universal Testing Machine (UTM)
Shimadzu, Japan, AG 100 KNG
Capacity:100KN (10000 kgf),Load measuring accuracy :+0.5% of indicated load
,cross head speed range:0.05 to 1000mm/min,Cross head speed precision: :+0.1
,Effective test width :575nm,Load cell of 100KN,1kgf.
(22) Total Organic Carbon (TOC) Analyzer
Shimadzu, Japan, TOC-VCSN/TNM-1
Measurement range: Total Carbon: 0 to 25000 mg/l; Inorganic Carbon: 0 to 3000
mg/l; Total Nitrogen: 0 to 4000 mg/l; Measurement Time: 10 minute per sample
(23) Micro Hardness Tester (MHT)
Shimadzu, Japan, HMV-2T
Maximum load: 19.61 N, Test load range: 10 to 2000 gf in 9 steps. Load duration: 5
second to 999 seconds in 1 sec increment High test measuring accuracy: 0.01 µ
(24) Laser Flash Thermal Diffusivity
NETZSCH, Burlington-MA USA
Temperature Range: Ambient to300 Deg., Standard sample Size: 12.7 mm Diameter.
Thermal Diffusivity Range: 0.001 to 10cm²/S.
Laser Type: Nd glass
Accuracy: Thermal Diffusivity and Specific Heat: +/- 5%
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(25) Ambient Air Quality Monitoring Mobile Van
(Environnment SA, France)
Measurement of Carbon monoxide, Total hydrocarbons, Oxides of nitrogen, Ozone,
Particulate matter, Sulphur dioxide and meteorological parameters
Environmental Analysis/ Monitoring/ Auditing Facilities
Water and wastewater analysis
Solid waste and soil analysis
Stack pollution monitoring
Environmental Audit and Environmental Consultancy Services
Environmental Research & Development
Contact for more information:
Prof. (Dr.) A. R. Jani, Hon. Director
SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED
RESEARCH AND TESTING (SICART ) (Sponsored by Department of Science and Technology, Govt. of India, New Delhi)
Sardar Patel Centre for Science and Technology
Vallabh Vidyanagar – 388120, Dist: Anand, Gujarat, INDIA
Phone: +91-2692-234966, +91 9925520338 (M); Fax: +91-2692-238355
E-mail: [email protected]
Ex. Professor-Director
UGC-Human Resource Development Center
(UGC-HRDC) Sardar Patel University & Former Professor and Head & [Dean (Faculty of Science)]
P. G. Department of Physics, Sardar Patel University.
Vallabh Vidyanagar 388 120
Gujarat State, INDIA