SOC Encounter 2011
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Transcript of SOC Encounter 2011
![Page 1: SOC Encounter 2011](https://reader035.fdocuments.net/reader035/viewer/2022081717/5459fdb2af7959795d8b591d/html5/thumbnails/1.jpg)
Training Course of SOC Encounter
Speaker: C. –S. Hou
REF: • CIC Training Manual – Cell-Based IC Physical Design and Verification with SOC Encounter, July, 2006• CIC Training Manual – Mixed-Signal IC Design Concepts, July, 2007
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Advanced Reliable Systems (ARES) Lab.
Outline
Basic Concept of the Placement & Routing Auto Place and Route Using SOC Encounter Hard Block Abstraction Using Abstract Generator LAB
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Advanced Reliable Systems (ARES) Lab.
Basic Concept of the Placement & Routing
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Advanced Reliable Systems (ARES) Lab.
Cell-Based Design Flow
MATLAB/ C/ C++/ System C/ ADS/ Covergen (MaxSim)
NC-Verilog/ ModelSimDebussy (Verdi)/ VCS
Verilog/ VHDL
Design/ Power Compiler
DFT Compiler/ TetraMAX
NC-Verilog/ ModelSimDebussy (Verdi)/ VCS
SOC Encounter/ Astro
DRC/ LVS (Calibre)
PVS: Calibre xRC/ NanoSim(Time/ Power Mill)
Phys
ical
Com
pile
r/ M
agm
a B
last
Fus
ionConformal/
Formality
Memory Generator
Syntest
Spec.
Tape Out
GDS II
System Level
RTL Level
Logic Synthesis
Design for Test
Gate Level
Layout Level
Post-Layout Verification
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Advanced Reliable Systems (ARES) Lab.
SOC Encounter P&R Flow
SpecifyFloorplan
TimingAnalysis
Pre-CTS Optimization
PowerPlanning
PowerAnalysis
Clock TreeSynthesis
TimingAnalysis
Post-CTSOptimization
PowerRoute
IO, P/G Placement
SI DrivenRoute
Timing/SIAnalysis
Netlist (Verilog)Timing Constraints (sdc)
IO Constraints (ioc)
GDSNetlistSpefDEF
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Advanced Reliable Systems (ARES) Lab.
IO, P/G Placement Determine the
positions of the PADs Functional IO PAD Power/Ground PAD Corner PAD
Just for the connection of PAD power rings
Corner1 I1 VDD O1 Corner2
Corner3 Corner4I4 VSS O4
I2
I3
IOVDD
O2
O3
IOVSS
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Advanced Reliable Systems (ARES) Lab.
Specify Floorplan Determine the aspect
ratio of the Core and the gap between the PAD and Core The Core Utilization
is determined in this step
The final CHIP area is almost determined in this step
Width
Hight
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Advanced Reliable Systems (ARES) Lab.
Floorplan Determine the related
positions of Hard Blocks The performance is
highly affected
Corner1 I1 VDD O1 Corner2
Corner3 Corner4I4 VSS O4
I2
I3
IOVDD
O2
O3
IOVSS
M3
M2
M1
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Advanced Reliable Systems (ARES) Lab.
Amoeba Placement Observe the result of
cells and Hard Blocks placement
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Advanced Reliable Systems (ARES) Lab.
Power Planning Plan the power ring &
power stripe IR-drop
consideration
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Advanced Reliable Systems (ARES) Lab.
Clock Tree Synthesis
CLK CLK
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Advanced Reliable Systems (ARES) Lab.
Power Analysis IR-drop & electron
migration
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Advanced Reliable Systems (ARES) Lab.
Power Route Connect the power pins of standard cells to the global power lines
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Advanced Reliable Systems (ARES) Lab.
Add IO Filler Fill the gap
between PADs Connect the
PAD power rings
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Advanced Reliable Systems (ARES) Lab.
Routing Construct the final
interconnections
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Advanced Reliable Systems (ARES) Lab.
Prepare Data Library
Physical Library (LEF) Information of technology, standard cells, Hard Blocks, and APR
Timing Library (LIB) Timing information of the standard cells and Hard Blocks
Capacitance Table For more accurate RC analysis
Celtic Library For crosstalk analysis
FireIce/Voltage Storm Library For RC extraction and power analysis
User Data Gate-Level Netlist (Verilog) SDC Constraint (*.sdc) IO Constraint (*.ioc)
Not Necessary !
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Advanced Reliable Systems (ARES) Lab.
LEF Format – Process Technology
Layers Design Rule Parasitic
POLY
Metal 1
Metal 2
Contact
Via1
Net WidthNet SpacingAreaEnclosureWide Metal SlotAntennaCurrent Density
ResistanceCapacitance
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Advanced Reliable Systems (ARES) Lab.
LEF Format – Process Technology: Layer Define
Layer Metal1TYPE ROUTING;WIDTH 0.28;MAXWIDTH 8;AREA 0.202;SPACING 0.28;SPACING 0.6 RANGE 10.0 10000.0;PITCH 0.66;DIRECTION VERTICAL;THICKNESS 0.26;ANTENNACUMDIFFAREARATIO 5496;RESISTANCE RPERSQ 1.0e-01;CAPACITANCE CPERSQDIST 1.11e-04;EDGECAPACITANCE 9.1e-05;
END Metal1
Wide Metal
Width
Spacing
Wide Metal Spacing
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Advanced Reliable Systems (ARES) Lab.
LEF Format – APR Technology
Unit Site Routing Pitch Default Direction Via Rule
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Advanced Reliable Systems (ARES) Lab.
LEF Format – APR Technology: Site
The placement site gives the placement grid of a family of macros
a row a sitea standard cell
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Advanced Reliable Systems (ARES) Lab.
Row Based PR
VDD
VSS
VDD
VSS
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Advanced Reliable Systems (ARES) Lab.
LEF Format – APR Technology: Routing Pitch, Default Direction
Metal1 Routing Pitch
Metal2 Routing Pitch
Via
HorizontalRouting
VerticalRouting
Metal1Metal3Metal5
Metal2Metal4Metal6
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Advanced Reliable Systems (ARES) Lab.
LEF Format – APR Technology: Via Generation
To connect the wide metal, a via array is generated to reduce the via resistance
Formulas for generating via arrays are defined
Layer Metal1Direction HORIZONTALOVERHANG 0.2
Layer Metal2Direction VERTICALOVERHANG 0.2
Layer Via1RECT -0.14 -0.14 0.14 0.14SPACING 0.56 BY 0.56
Default Via
Generated Via
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Advanced Reliable Systems (ARES) Lab.
LEF Format – APR Technology: Same Net Spacing
SPACINGSAMENET Metal1 Metal1 0.23;SAMENET Metal2 Metal2 0.28 STACK;SAMENET Metal3 Metal3 0.28;SAMENET VIA12 VIA12 0.26;SAMENET VIA23 VIA23 0.26;SAMENET VIA12 VIA23 0.0 STACK;
END SPACING
Metal1 Metal3
VIA12 and VIA23
VIA12 and VIA23 allow stack
Metal1
0.23 Same Net Spacing Rule
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Advanced Reliable Systems (ARES) Lab.
LEF Format – APR Technology: Physical Macros
Define physical data for Standard cells I/O pads Memories Other hard macros
Describe abstract shape Size Class Pins Obstructions
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Advanced Reliable Systems (ARES) Lab.
LEF Format – APR Technology: Physical Macros (Cont’)
MACRO ADD1CLASS CORE;FOREIGN ADD1 0.0 0.0;ORIGEN 0.0 0.0;LEQ ADD;SIZE 19.8 BY 6.4;SYMMETRY x y;SITE coresite;PIN ADIRECTION INPUT;PORTLAYER Metal1;RECT 19.2 8.2 19.5 10.3;….END
END A….END ADD1
VDD
VSS
Y
BA
Barrier
Metal
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Advanced Reliable Systems (ARES) Lab.
LIB Format
Operating condition Slow, fast, typical
Pin type Input/output/inout Function Data/clock Capacitance
Path delay Timing constraint
Setup, hold, mpwh, mpwl, recovery
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Advanced Reliable Systems (ARES) Lab.
Gate-Level Netlist
If designing a chip, IO PADs, power PADs, and Corner PADs should be added before the netlist is imported
Make sure that there is no “assign” statement and no “*cell*” cell name in the netlist
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Advanced Reliable Systems (ARES) Lab.
SDC Constraint
Clock constraints Input delay/ Input drive Output delay/ Output load False path Multi-cycle path
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Advanced Reliable Systems (ARES) Lab.
IO Constraint
Version: 1Pad: CORNER0 NW PCORNERDGZPad: PAD_CLK NPad: PAD_HALT N
Pad: CORNER1 NE PCORNERDGZPad: PAD_X1 WPad: PAD_X2 W
Pad: CORNER2 SW PCORNERDGZPad: PAD_IOVDD1 S PVDD2DGZPad: PAD_IOVSS1 S PVSS2DGZ
Pad: CORNER3 SE PCORNERDGZPad: PAD_VDD1 E PVDD1DGZPad: PAD_VSS1 E PVSS1DGZ
CORNER0 CORNER1
CORNER2 CORNER3
PAD_X2 PAD_VSS1
PAD_X1 PAD_VDD1
PA
D_
CLK
PA
D_
HA
LT
PA
D_
IOV
DD
1
PA
D_
IOV
SS
1
N
W E
S
(*.ioc File)
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Advanced Reliable Systems (ARES) Lab.
How To Decide the NO. of Power/Ground PADs
The following factors are considered: SSO: Simultaneously Switch Outputs SSN: The noise produced by SSO buffers DI: Maximum NO. of copies for one specific kind of IO PAD
switching from high to low simultaneously without making ground voltage level higher than 0.8 volt for one ground PAD
DF: Driving Factor, DF = 1/DI SDF: Sum of Driving Factor
Suggestion in SSO case: Required NO. of ground PADs = SDF Required NO. of power PADs = SDF/1.1
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Advanced Reliable Systems (ARES) Lab.
SDF Example
If a design has 20 PDB02DGZ (2mA) and 10 PDD16DGZ (16mA). Then,
SDF = 20 x 0.02 + 10 x 0.3 = 3.4 In SSO case,
NO. of VSS PAD = 3.4 4 NO. of VDD PAD = 3.4/1.1 = 3.09 4
IO Type 2mA 4mA 8mA 12mA 16mA 24mADF Value 0.02 0.03 0.09 0.18 0.3 0.56
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Advanced Reliable Systems (ARES) Lab.
Tips to Reduce the Power/Ground Bounce
Don’t use stronger output buffers than what is necessary Use slew-rate controlled outputs Place power pad near the middle of the output buffer Place noise sensitive I/O pads away from SSO I/Os Place VDD and VSS pads next to clock input buffer
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Advanced Reliable Systems (ARES) Lab.
Auto Place and Route Using SOC Encounter
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Advanced Reliable Systems (ARES) Lab.
CHIP-Level Netlist If your gate-level netlist is
generated by “CORE-level synthesis”, you should all the “CHIP-level module” in it
Ex:
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Advanced Reliable Systems (ARES) Lab.
CHIP-Level Netlist (Cont’)
Ex:
If your design has a “Hard Block”, you should add an “empty module” for it the module name should be the same as the “cell name” of the Hard
Block
(Module Declaration)
(Module Reference)
Pin Name in SPICE
Connected Wire Name in Verilog
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Advanced Reliable Systems (ARES) Lab.
CHIP-Level Timing ConstraintEx:
CHIP-Level Clock Declaration
Set False Path to Your Test Pins
Set Parameters to the PAD IO
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Advanced Reliable Systems (ARES) Lab.
Getting Started linux %> ssh -l “user name” cae18.ee.ncu.edu.tw unix %> source /APP/cad/cadence/SOC/CIC/soc.csh unix %> encounter(Do not run in the background mode !!)
Connect to Unix
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Advanced Reliable Systems (ARES) Lab.
Import Design <Design> Design/Design Import Verilog Files: your gate-level netlist Tot Cell LEF Files (*.lef): including all the LEF
files of cell libraries & hard blocks LIB Files (*.lib):
Max Timing Libraries Min Timing Libraries Common Model Libraries
IO Assignment File: *.ioc
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Advanced Reliable Systems (ARES) Lab.
Import Design <Timing> Capacitance Table File Timing Constraint File: *.sdc
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Advanced Reliable Systems (ARES) Lab.
Import Design <Power> <IPO/CTS> Power Nets Ground Nets Footprints for In-Place
Layout Optimization (IPO) and Clock Tree Synthesis (CTS)
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Advanced Reliable Systems (ARES) Lab.
Import Design <Misc.> QX Tech File QX Library Directory
(Floorplan View)
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Advanced Reliable Systems (ARES) Lab.
Global Net Connection Floorplan/Global Net Connections
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Advanced Reliable Systems (ARES) Lab.
Specify Floorplan Floorplan/Specify Floorplan
COREArea
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Advanced Reliable Systems (ARES) Lab.
Specify Scan Chain encounter %> specifyScanChain ScanChainName
- start {ftname | instPinName} - start {ftname | instPinName}
encounter %> scantrace
Ex:
(result)
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Advanced Reliable Systems (ARES) Lab.
Hard Block Placement Move/Resize/Reshape floorplan object
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Advanced Reliable Systems (ARES) Lab.
Edit Block Halo Floorplan/Edit Block Halo Reserve space without standard cell placement
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Advanced Reliable Systems (ARES) Lab.
Standard Cell Placement Place/Place
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Advanced Reliable Systems (ARES) Lab.
Power Planning – Add Rings Floorplan/Custom Power Planning/Add Rings
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Advanced Reliable Systems (ARES) Lab.
Power Planning – Add Block Rings Floorplan/Custom Power Planning/Add Rings
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Advanced Reliable Systems (ARES) Lab.
Example for Power Rings
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Advanced Reliable Systems (ARES) Lab.
PAD Pins Route/SRoute
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Advanced Reliable Systems (ARES) Lab.
Power Planning – Add Stripes Floorplan/Custom Power Planning/Add Stripes
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Advanced Reliable Systems (ARES) Lab.
Power Planning – Add Stripes (Cont’)
Ex:
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Advanced Reliable Systems (ARES) Lab.
Fix Un-Connected Stripes Route/SRoute
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Advanced Reliable Systems (ARES) Lab.
Flow Clock Tree Synthesize
Create Clock Tree Spec
Specify Clock Tree
Synthesis Clock Tree
Display Clock Tree
clock spec
Netlist Synthesis report
Clock netsRouting guide
Modify
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Advanced Reliable Systems (ARES) Lab.
Create/Specify/Synthesis Clock Tree Spec. Clock/Create Clock Tree Spec
Clock/Specify Clock Tree
Clock/Synthesis Clock Tree(Clock Spec.)
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Advanced Reliable Systems (ARES) Lab.
Example for CTS Report
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Advanced Reliable Systems (ARES) Lab.
Display Clock Tree Clock/Display/Display Clock Tree
Ex:
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Advanced Reliable Systems (ARES) Lab.
Power Analysis Power/Edit Pad Location
Power/Edit Net Toggle Probability
Power/Power Analysis/Statistical
Ex:
(Power Analysis Report)
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Advanced Reliable Systems (ARES) Lab.
Example for Rail Analysis of IR-Drop & EM
(IR-Drop) (EM)
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Advanced Reliable Systems (ARES) Lab.
Power Route Route/SRoute
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Advanced Reliable Systems (ARES) Lab.
IO Filler encounter %> source addIoFiller.cmd
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Advanced Reliable Systems (ARES) Lab.
Nano Route Route/NanoRoute
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Advanced Reliable Systems (ARES) Lab.
Example for Nano Route
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Advanced Reliable Systems (ARES) Lab.
Cell Filler Place/Filler/Add Filler
Ex:
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Advanced Reliable Systems (ARES) Lab.
Save Design Design/Save/Netlist *.v Timing/Calculate Delay *.sdf Design/Save/DEF *.def
SELECT “Save Scan”
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Advanced Reliable Systems (ARES) Lab.
Bounding PAD unix %> chmod 755 addbonding.pl unix %> /usr/bin/perl addbonding.pl CHIP.def encounter %> source bondPads.cmd
Ex:
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Advanced Reliable Systems (ARES) Lab.
Save GDSII Design/Save/GDS *.gds
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Advanced Reliable Systems (ARES) Lab.
LAB