Silicon epitaxy - Referenceglobe · Types of Epitaxy (a) Liquid phase epitaxy - III-V epitaxial...
Transcript of Silicon epitaxy - Referenceglobe · Types of Epitaxy (a) Liquid phase epitaxy - III-V epitaxial...
SILICON EPITAXYSILICON EPITAXY
MAIMOONA YASMINMAIMOONA YASMIN
PHYSICS DEPARTMENTPHYSICS DEPARTMENT
UNIVERSITY OF LUCKNOWUNIVERSITY OF LUCKNOW
LUCKNOWLUCKNOW--226 007226 007
SILICON EPITAXYSILICON EPITAXY1. Definitions.
2. Why Silicon dominates?
3. Why silicon epitaxy?
4. Lattice matching in epitaxial growth.
5. Gases used in Silicon epitaxy.
6. Types of Epitaxy.
7. Silicon on insulator.
8. Applications
- Si on Sapphire device
- Buried Layer Device
- UV Silicon Detector
9. Summary
DefinitionsDefinitions
Epitaxy: “arranged upon”Homoepitaxy: Same substrate and film
e.g. Silicon on Silicon
Heteroepitaxy: Different substrate and film.
e.g. Silicon on Sapphire.
Why Silicon dominates?Why Silicon dominates? Abundant, cheap
Silicon dioxide is very stable, strong dielectric and it is easy to grow on thermal process.
Wider band gap, wide operation temperature
Unit cell of single crystal silicon
Si
2900oCBoiling PointFrom Latin Word “silices”
Origin of name
1414oCMelting point1824Discovery Year
28%ReflectivitySwedenDiscovered at
1000,000 µΩcmElectrical resistivityJons Jacob BerzeliusDiscoverer
2200 m/sVelocity of sound28.0855Atomic Weight
12.06 cm3Molar Volume14Atomic Number
2.33 gm/cm3Density of solidSiSymbol
2.352 AoBond length in single Crystal Si
SiliconName
Si
Si
Si
Si
Why Why Si EpitaxySi Epitaxy??
To enhance the performance of discrete bipolar
transistor.
To improve the performance of dynamic random access
memory devices (RAMs).
Advantages of epitaxial wafers over bulk wafers
Offers means of controlling the doping profile
Epitaxial layers are generally oxygen and carbon free
Lattice matching in Epitaxial Growth
Lattice structure and lattice constant must match for two
materials eg. GaAs and AlAs both have zincblende structure
1.43eV
0.36eV
In .53Ga.47 As
5.65 6.06
Gases used in Silicon Gases used in Silicon EpitaxyEpitaxy
a) Silane (SiH4) Pyrolysis : SiH4 (H2) Si + 2H2
b) Dichlorosilane (DCS) SiH2Cl2
c) Tricholorosilane (TCS) SiHCl3
d) Silicon tetrachloride SiCl4
e) Disilane Si2H6
f) Dopant gases –Diborane (B2H6)
– Phosphine (PH3)
– Arsine (AsH3)
Types of Types of EpitaxyEpitaxy(a) Liquid phase epitaxy
- III-V epitaxial layer GaAs
- Refreeze of laser melted silicon
(b) Molecular beam epitaxy
- Crystalline layer grows in vacuum
- 500o C
(c) Vapor phase epitaxy
- It is performed by chemical vapor deposition (CVD)
- Provides excellent control of thickness, doping and
crystallinity
- High temperature (800o C – 1100oC)
Liquid phase Liquid phase epitaxyepitaxy Growing crystals from a liquid solution below their
melting point .
Melting point of GaAs is 1238oC whereas a mixture
of GaAs with Ga metal has considerably lower
melting point
Single crystal GaAs layer can be grown from
Ga+GaAs melt.
The solution becomes richer in Ga and thus lower
melting point.
Low temperature eliminates many problems of
impurity introduction.
LIQUID PHASE EPITAXYLIQUID PHASE EPITAXYGrowth of Growth of AlGaAs AlGaAs and and GaAs GaAs layer on layer on GaAs GaAs substratesubstrate
Wafer held on carbon slider
Moves into a pocket containing melt
Slider moves the substrate to the next chamber.
Molecular beam epitaxy (MBE)
Substrate is held in high vacuum in the range 10-10 torr
Components along with dopants, are heated in separate
cylindrical cells.
Collimated beams of these escape into the vacuum and are
directed into the surface of a substrate
Sample held at relatively low temperature (600oC for GaAs)
Conventional temperature range is 400o C to 800oC
Growth rates are in the range of 0.01 to 0.3 µm/min
EquipmentEquipment
EquipmentEquipment
An ultra high vacuum chamber holding heated substrate.
Furnaces holding electronic grade silicon and dopants.
Beams of these dopants & EGS directed into the heated wafer.
For attaining vacuum level in the 10–10 torr range, material should have a low vapor pressure and low sticking coefficient.
Silicon volatized by electron beam heating rather than by heating in furnace.
Buffers & shutters shape and control flux.
Resistance heating generates temperature over the range of 400oC to 1100oC.
Advantages of MBEAdvantages of MBE Low temperature processing (400oC-800oC)
Precise control of doping
No chemical reactions along with high thermal velocities results in
properties rapidly changing with source
A wider choice of dopants
Mostly used dopants are Sb, Ga, Al
Vapor phase Vapor phase epitaxyepitaxy
Crystallization from vapor phase
Better purity and crystal perfection
Offers great flexibility in the actual fabrication of devices
Epitaxial layers are generally grown on Si substrates by the
controlled deposition of Si atoms onto the surface from a
chemical vapor containing Si
e.g. SiCl4 + 2H2 Si + 4HCl
(for deposition as well as for etching)
Vapor Phase Vapor Phase EpitaxyEpitaxy
Four silicon sources have been used for growing epitaxial
silicon
Silicon tetrachloride (SiCl4)
Dichlorosilane (SiH2Cl2)
Trichlorosilane (SiHCl3)
Silane (SiH4)
Four species in a reaction
SiCl4 (gas) + 2H2 (gas) Si (solid) + 4HCl (gas)
at 1200o C were detected
Concentration of species at different Concentration of species at different
positions along a horizontal reactorpositions along a horizontal reactor
Overall reaction in VPEOverall reaction in VPE
SiCl4 concentration decreases while the other three
constituents (SiHCl3, SiH2Cl2, HCl) increase.
SiCl4 + H2 SiHCl3 + HCl ……….. (1)
SiHCl3 + H2 SiH2Cl2 + HCl……….. (2)
SiH2Cl2 + H2 SiCl2 + H2 …………(3)
SiHCl3 SiCl2 + HCl …………. (4)
SiCl2 + H2 Si + 2HCl ……………(5)
EquipmentEquipment
Weight 2000 Kg
Occupy 2m2 or more of floor space.
Quartz reaction chamber with
susceptors
Graphite susceptors for physical
support
A coating of silicon carbide (50 to
500 µm) applied by CVD process
on susceptors.
Rf heating coil or tungsten halogen
lamps.
Radiant heating
Water cooling
A radiant barrel reactor
Three basic reactor configurationsThree basic reactor configurations
VPE processVPE process
Hydrogen gas purges of air from the reactor .
Reactor is heated to a temperature.
After thermal equilibrium, an HCl etch takes place at
1150oC and 1200oC for 3 minutes nominally.
Temperature is reduced to growth temperature.
Silicon source and dopant flows are turned on.
After growth, temperature is reduced by shutting off
power.
Hydrogen flow replaced by nitrogen flow.
Depending on wafer diameter and reactor type, 10 to 50
wafer per batch can be formed.
Process cycle times are about one hour .
Doping
Intentional addition of impurities or dopants to the crystal
to change its electronic properties (varying conductivity of
semiconductors)
Doping of 1014 to 1017 atom/cm3
Typically hydrides of atoms are used as the source of
dopants eg. PH3, AsH3 or B2H6 for controlled doping
2AsH2AsH33 (gas) (gas) 2As (solid) + 3H2As (solid) + 3H22 (gas)(gas)
2As (solid) 2As2As (solid) 2As++ (solid) + 2e(solid) + 2e--
Doping: Schematic representation of Doping: Schematic representation of
arsine doping and growth processesarsine doping and growth processes
2AsH2AsH33 (gas) (gas) 2As (solid) + 3H2As (solid) + 3H22 (gas)(gas)
2As (solid) 2As2As (solid) 2As++ (solid) + 2e(solid) + 2e––
Doping: Impurity concentrationDoping: Impurity concentration
Interaction between doping process & growth process
Growth rate influences the amount of dopant incorporated in Si
Equilibrium established at low growth rates.
AutodopingAutodoping Outdiffusion from heavily doped substrate
Impurity incorporation from dopant in gas phase
Autodoping limits the minimum layer thickness
Generalized doping profile of an epitaxial layer detailing various
regions of autodoping
Minimizing Minimizing AutodopingAutodoping
Fast growth to minimize outdiffusion.
Low temperature deposition reduces boron
autodoping (not As however).
Seal backside of substrate with highly doped
polyoxide.
Avoid the use of HCl etching.
Reduced pressure epitaxy.
Silicon on insulatorsSilicon on insulators
Fabrication of devices in small islands of silicon on an insulating substrate eg. Silicon on Sapphire (Al2O3)
Substrates have the appropriate thermal expansion match to silicon.
Epitaxial films grown by CVD (eg. Pyrolysis of silane)
Junction capacitance is reduced thus improve the high frequency operation of circuits
Silicon on sapphireSilicon on sapphire
SiHSiH44 Si Si + 2H+ 2H22 (low temperature)(low temperature)
Temperature 1000o C – 1050oC
Growth rate 0.5 µm/min
Film thickness 1 µm or less
Doping range 1014 to 1016 atoms/cm3
High defect density permits only majority
carrier devices
Carrier mobility is reduced.
Buried layerBuried layer• The higher collector series resistance of an integrated
transistor can be easily reduced by a process known as
“buried layer”
Silicon on sapphire devices
Ultraviolet Silicon DetectorUltraviolet Silicon Detector
SUMMARY Silicon is the most preferable material for epitaxial growth.
Three basic methods for growing epitaxial layer on silicon.
(a.) LPE (b). MBE (C). VPE
In all these, lattice structure and lattice constant should match for the two
materials.
The advantages of SOI techniques are compelling for high density and high
speed circuits
MBE is advantageous in ion implanted VLSI circuits
While growth of crystal the growth rate and doping rate should be well
controlled.
Autodoping can be controlled by low temperature epitaxial growth.
Fast growth to minimize outdiffusion.
The trend to thinner layers for bipolar and unipolar ICs will result in
incremental process improvements and continued steady of flatness changes,
defect generation, and autodoping effect.
Contamination free epitaxy will be a worthwhile process improvement.