SGIA 2017 EIT 2017 EIT... · IL UVA 250-415 EIT nm UVA 320-390 nm Speaking the Same Language...
Transcript of SGIA 2017 EIT 2017 EIT... · IL UVA 250-415 EIT nm UVA 320-390 nm Speaking the Same Language...
Solving UV Curing Mysteries with Measurement
Jim Raymont
Whodunit? Whodat?
UV Can Be Mysterious Unless You Understand It• Cannot see it with the visible eye • Wavelength is a nanometer (nm)-a billionth of a meter • Reduce UV mysteries and process variables to
increase profit
• Ask questions as we go • Will share this presentation as PDF • Here to help during the SGIA show (Booth 2800)
Solving UV Mysteries
Anything that you can measure, you have a better chance of controlling. Things that you do not measure become the cause of mysterious problems
Larry Goldberg-Beta Industries
Producing a large amount of product before detecting a problem.
UV Curing-Crime Scene
Round Up The Usual Suspects
Suspect 1A: The Formulator
Suspect 1B: The Equipment Supplier
� Abrasion Resistance
� Scratch Resistance
� Chemical Resistance
� Hardness
� Weatherability
� Non-Yellowing
� Flexibility
Please Describe the ……..
� Tensile Strength
� Gloss
� Coating Viscosity
� Film Thickness
� Ability to Over Coat
� TBD
� TBD
What properties are formulation driven?
What properties are process/UV source driven?
The UV Process
What if the cake mix only gave you the time?
• 350° X 30 = 10,500
Equal Degree Minute Options
• 700°F for 15 minutes?
• 175°F for 60 minutes?
Cake: Bake at 350°F for 30 minutes
The UV Process-Analogy
Oven Temperature ( °F) is similar to Irradiance (Watts/cm 2)
Bake Time (Minutes or seconds) is similar to Energy Density (Joules/cm 2)
Not Specified: Oven Type
Changing the Cake Process Window
Speaking the Same TerminologyIrradiance (Intensity)• Expressed in watts or milliWatts per square centimeter (W/cm2 or
mW/cm2)
• Total radiant power of (all) wavelengths passing from all incidentdirections onto an infinitesimally small area (cm2)
• Depth of cure, penetration through pigments and opaque colors, adhesion to the substrate
Energy Density (Dose)• Expressed in Joules (J/cm2) or milliJoules (mJ/cm2) per square
centimeter
• Incorporates time as part of the measurement
• One watt for One second = One Joule
• Area under the irradiance curve
• Often the only UV exposure guide number supplied
Speaking the Same Terminology
Time
Peak Irradiance
Communication
• Process Development
• Transition to Production
• Production
• Within a company
• With Supply Chain
IL UVA
250-415 nmEIT
UVA 320-390 nm
Speaking the Same Language
Broadband Instrument Responses • Instrument Bandwidths are not defined and vary from manufacturer to
manufacturer and how they are specified• EIT UVA 320-390 nm, Full Width Half Max (FWHM), CWL 365 nm• IL UVA 250-415 nm CWL 365 nm
Broadband UV Spectrum• UVA: 320-390nm “Black light”, UV Inks, adhesion• UVB: 280-320nm “Toughness” , skin response• UVC: 200-280nm, germicidal (254 nm), surface cure, tack, chemical or
scratch resistance• UVV: 395-445nm, opaque/white, thick coats, adhesion, depth of cure
UV LEDs Discussed Later
“I am loose and tight
in all the
wrong places”
Process Window
• The range in which a process will work with the desired results
– Adhesion, hardness, flexibility, gloss, texture, stain or scratch resistance, chemical rub, cross hatch, abrasion rub, color ID, registration
– Often a compromise
• Invest before production & confirm when things are working!
– Starting guidelines from formulator?
– Define your lower limits and document the readings
– Increase line speed/decrease applied power until you undercure, note readings and cushion by 20%
– Upper limits?
• Monitor your readings by job, hour, shift or day as required to maintain quality
• Establish your process window during the design/development phase and start monitoring from day one in production
Process Window
Variables:
• Line speed
• Lamp distance
• Lamp output
• Bulb Type
• Source Type
• Coating
Process Window
• Starting Point: Formulator Guidelines
• Testing can define a process window
• Lab testing is less expensive than production testing or
no process window
Stop!Undercure Limit
Caution 20% Undercure Buffer Range
Normal Operating Window
Over cure or over temperature ?
Process Window
We can’t ask a UV lamp or a power supply to
confess, but we can gather evidence using
other means…
Gathering UV Evidence
“ Did you perform the maintenance? Did You?”
Gathering UV Evidence
Gathering Evidence
Gathering UV Evidence
• Right Tools?
• Right Tests?
• Right Expectations?
• Documentation?
=
Gathering UV Evidence
Gather and preserve evidence to use it
for when conditions change
Date
Line Speed Dwell Time
FPM/RPM
UV System: North Line Lamp: 2
Ind. Actual. PowerWPI
Hour Meter
Irradiance(W/cm 2)
Energy Density (J/cm 2)
10/9 25 22 400 780 0.859 1.45
For each UV lamp system• Hour meter • Indicated vs. actual process speed• Power settings (WPI, Amps)• Irradiance (W/cm 2)• Radiant Energy Density(J/cm 2)• Lamp matched to chemistry• Focus/Reflector condition• TBD
Preserving UV Evidence
Poor chain of custody
Focused
lamp
Time in seconds
UV
W/c
m2
Non-Focused lamp
UV
W/c
m2
Time in seconds
FOCUSED
858 mW/cm2
2096 mJ/cm2
NON-FOCUSED
290 mW/cm2
1707 mJ/cm2
Dimensional Curing
Gloss Control
Distance Change-Same lamp
Profiling Radiometers
• Profile helps determine
focus of system and
tracks changes
• Lamp types
• Break down multi-lamp
systems
Time in seconds
UV
W/c
m2
Gathering UV Evidence
A typical Irradiance Profile
Differences in:• Irradiance values• Lamp Types• Focus of Lamps• Speed collected
Gathering UV Evidence
Gathering UV Evidence
In God we trust, all others bring data Dr. W. Edwards Deming
Gathering UV Evidence
• What Data (Evidence) Is Needed? • Consistent Data Collection Techniques• Fooled by the Equipment?• Do not contaminate the crime scene or
measurement tools
Gathering UV Evidence
Ref ReadingsUnit Readings % Deviation
Unit Power Puck II
Power Puck II
s/n 15678 17654Speed (f/m) 25 feet/min 25 feet/min
UVA mJ/cm2 mW/cm2 mJ/cm2 mW/cm2 mJ/cm2 mW/cm21 109.000 450.000 99.000 445.000 -9.17% -1.11%2 105.000 442.000 103.000 461.000 -1.90% +4.30%3 104.000 460.000 109.000 439.000 +4.81% -4.57%
Average 106.000 450.667 103.667 448.333 -2.09% -0.46%% STEDV 2.496% 2.001% 4.855% 2.537% 7.142% 4.488%
Repeat for other UV bands
A Scandal in Bohemia
Analyzing the UV Evidence
Inspector Jacques Clouseau: It's amazing how he fell perfectly into
the chalk outline on the floor.
Ponton: I think they drew the outline after he was shot.
Inspector Jacques Clouseau: Ah! We must be working with some
kind of mastermind!
My Best Cases
Cases of Absent Minded Staff
Human Error …
Unit was sent through UV system upside down
Temperature Reading
UV Readings
55” (140 cm) bulb
Irradiance mW/cm2 Data collected 3/24/16
Band Left Center Right Highest Delta
UVA 797 983 635 35.4%
UVB 713 888 573 35.5%
UVC 200 257 167 35.0%
UVV 612 757 492 35.0%
Energy Density mJ/cm2
UVA 243 282 234 17.0%
UVB 206 239 195 18.4%
UVC 58 68 55 19.1%
UVV 231 264 222 15.9%
Arc lamp performance-Data
Bulb not installed correctly in UV system
Graphically display UV across width of bulb
Arc Lamp Performance-Graph
Instrument Care
• Radiometers work better when properly maintained
Optics & Sensor Care
• Optics work better when properly maintained
Irradiance W/cm2 Data Collected 3/24/16
Band Before After Difference
UVA 1223 983 -19.6%
UVB 1066 888 -16.7%
UVC 277 257 -7.2%
UVV 889 757 -14.9%
Energy Density J/cm2
Band Before After Difference
UVA 349 282 -19.2%
UVB 284 239 -15.9%
UVC 75 68 -9.33%
UVV 309 264 -14.6%
Before: Data collected with contaminated optics
After: Data collected after cleaning
UV Measurement Challenges
• Two recommended methods:
o Lint/Detergent free wipes or IPA with cotton swab
• Advantages and disadvantages to each method
• First do no harm
• Avoid shirt sleeve, shop towel, etc.
• Avoid ‘dry’ cleaning instrument
UV Measurement Challenges
You Tube Video Link on EIT website
UV Measurement Challenges
The Case of the
Missing ID
How Old Are You?
Hour Meter
Devitrification / Clouding Mirroring
Blackening / Erosion Contaminated Airflow
Lamp Symptoms - Aging
440mW/cm2 in the middle vs. 317 mW/cm2 at the end
How wide is your line compared to the product?
MiddleEnd
Aged Arc Lamp
Variable: UV Energy Wavelength
Mercury
Gallium Iron
Courtesy Heraeus Fusion UV
Variable: UV Energy Wavelength
Ratio of different bands to identify bulb type
Line 1
Line 2
Blue
UVA
Red UVV
Profiling Radiometers• Trouble shoot two ‘identical’ production lines (Speed, bulb types)
Line Speed Changed Bulb Type Changed
UVA
UVA
UVV
UVV
The Real World: Readings
UVA Energy Density: 537 to 487 mJ/cm 2
UVA Irradiance: 309 to 290 mW/cm 2
NEWOLD
With 600 hours of run time would you change this bu lb?
UV Sources: Spectral Output
Change Now?
OLDNEW
UVV Energy Density: 737 to 1331 mJ/cm2
UVV Irradiance: 397 to 734 mW/cm2
UV Sources: Spectral Output
The Case of the Misguided
Purchasing Staff
Bulbs: Buy on Value vs. Price
Courtesy: Efsen Engineering
Hours
Inte
nsity
Watch purchasing staff getting ‘specials’
Bulbs: Buy on Value vs. Price
The Case of the
Missing Maintenance Team
Neglect of UV curing system
Dirty, damaged and improper reflectors can be
detected by their distinctive “UV fingerprints” on a
profiling radiometer.
Mystery: Bad Reflectors
A CLEAN BULB AND REFLECTOR DELIVERS ALL THE UV SPECTRUM IN THE RANGES OF UVA, UVB, UVC
AND UVV
A DIRTY BULB AND REFLECTOR DELIVERS VERY
LITTLE OF THE UV SPECTRUM IN UVC & UVB ,
AND REDUCED AMOUNTS OF UVA AND UVV
A multi-channel radiometer allows you to compare short
& long wave ratios and identify changes
UVC: UVAUVC: UVV
Abrasion
Resistance
Toughness Adhesion Adhesion
& TiO2
Cure
Process Variables -Reflectors
The Case of the
Overheated Lamp
The bowed lamp (left) overheated due to a damaged
cooling system (right)
Lamp Symptoms – Inadequate Cooling
Sagging-15 % difference in irradiance levels
middle to end
End
Middle
Diagnosing Inadequate Cooling/Airflow
The Case of the
Restless Operator
Mystery: Operator Error
The effect of moving the UV housing away from the cure surface
FOCUSED
858 mW/cm 2
2096 mJ/cm 2
Changing the distance from the UV System to the substrate
NON-FOCUSED
290 mW/cm 2
1707 mJ/cm 2
Non-focused is not
always bad. Useful
for gloss control for
example
Mystery: Operator Error
• Varying the distance from the UV source to the
substrate is a common source of process problems
• Substrate Height?
Lamp Symptoms – Distance to Part
Mystery: Operator Error
The Case of
Unexpected Gremlins
(Mr. Murphy)
Quantitative, routine
maintenance Real-time
status monitoring
Periodic vs. Real-Time UV Measurement
Without an early warning system, the dipstick is useless.
Periodic vs. Real-Time UV Measurement
• Works for applications where a radiometer will not fit or is not practical– Web– Bank of multiple lamps– Lamps high off ground
• Continuous feedback about UV conditions– Certificate of Conformance – Tight Process Windows– High Value Products
• Continuous monitoring of lamp intensity
• Communication– Percentage readings – Coordinate with absolute radiometer
When to Use?
Sensor Locations
Display/Conditioning Options
Panel Mount• One Sensor• Display plus 0-10V
Output
Din Rail• One Sensor, 0-10V Output
Quartz Rod
Making a Case For
New Lamp Sources
One Bullet Barney……
Hg spectra modified with added materials
0
10
20
30
40
50
60
70
80
90
100
200 250 300 350 400 450 500
wavelength [nm]
rela
tive
spec
tral
rad
ianc
e
Hg Ga Fe
Mercury
Gallium
Iron
Traditional UV Source Spectral Output
EIT Bandwidth Responses
Images courtesy Baldwin, Dymax, Integration Techno logy, Excelitas & Phoseon Technology
UV LEDs
Wide variety of UV LED sources • Multiple suppliers with wide level of expertise,
support, finances• Match source to your application & process• Economics of source selected (ROI)
Adoption Curve
Adoption: Digital-Standard
Suppliers: End Users:
Courtesy
Courtesy
Adoption: Digital-Standard
Adoption: Digital , Custom
Suppliers: End Users:
Courtesy
Courtesy
Adoption: Digital , Custom
Adoption: Screen, simple
Suppliers: End Users:
Courtesy
Adoption: Screen, Industrial
Suppliers: End Users:
Courtesy
EIT Bandwidth Responses
Δ = 60%
Measurement of 395 nm LED
Δ = 95%
Using UVA to measure a 385 nm or 395 nm LED
Evaluate LED Output
• Width of the LED at the 50% Power Point
• Variations between suppliers:• Binning• Longer wavelengths• Sold as +/- 5 nm from center
wavelength (CWL)
395 nm LED array output measured on a spectral radiometer at EIT
L395 LED Output Spectra Showing + 5nm Spread of Cp A long with Required Filter Response to Obtain 2% Measurem ent
Define the right band?
Theoretical Band
Account for variation in
the LED CWL
Optics Design
L395 Instrument Response
Total Measured Optical Response
LED-R™ Series
LEDCure™ Radiometer• L395 Total Optics Response
• Single Band, Cosine Response
• Two Options: Standard & Profiler
• 40 Watt Dynamic Range
• Patented Optics Response
Suggested Operating Range L395
400 mW/cm2 to 40 W/cm2
Start Threshold
16-48mW/cm2
LEDCure L395 Performance
Data collected at EIT February 9, 2017
• A 395nm UV LED source was calibrated to 16W/cm² using the EIT L395.
• The UV LED source was then measured with another NIST traceable radiometer.
• The two radiometers matched to within 4% at different irradiance levels.
Data Courtesy of Phoseon Technology
LEDCure L395 Feedback
• The EIT measurement differed from the calculated value by less than 1%.
• The other NIST traceable radiometer differed from the calculated value by more
than 13%.
LEDCure L395 Feedback
Data Courtesy of Phoseon Technology
0
1
2
3
4
5
6
7
8
9
10
11
Ene
rgy
Den
sity
(J/
cm²)
Energy Density Measurements
EIT L395 Other NIST Meter Calculated
• Measurements at different irradiance settings were made with the
EIT L395 radiometer, and compared to the expected values.
• The L395’s linearity across a 3:1 dynamic range is excellent.
LEDCure L395 Feedback
Data Courtesy of Phoseon Technology
LEDCure L395 Performance
LEDCure vs. National Standard
Working Distance
(mm)
Primary Standard: Integrating
Sphere(W/cm2)
LEDCure L395
(W/cm2)
Difference
5 9.01 9.23 2.4%10 7.74 7.74 0.0 %15 6.66 6.63 - 0.5%20 5.74 5.83 1.6%25 5.04 5.08 0.8%
Data Courtesy Lumen Dynamics/Excelitas
Image courtesy Hamamatsu
UV LEDs
Future• Shorter wavelength
LEDs• Improvement in life
& power in the shorter wavelengths
• Chemistry continues to improve to reach more applications
• Dual 365 & 395 nm Source
� Establish a baseline.
� Establish a process window.
� Make measurements routinely.
� Measure consistently. Same location, speed, device
� Document test procedures
� Use right tools
� Label & mark equipment
� Calibrate all of your tools
� Communicate & Involve Supply Chain
Crime Prevention Tips
Jim RaymontEIT Instrument Markets
Director Sales
Member ASDPT
Want a copy of this presentation?
Send me an Email or give me a card
Open Discussion-Questions
703-478-0700
www.eit.com
SGIA Booth 2800