Rifle-m
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Transcript of Rifle-m
RIFLE-M
device analysis platform
• Speeds up new product introduction• Reduces engineering effort in test development• Improves cost of ownership
Technologieso NAND, NORo PCM, NROMo RRAM, FeRAM, MRAMo Embeddedo SLC / MLC / 3D
Areaso Technology developmento Design validationo Characterizationo Reliability analysiso Failure analysis
Interfaceso Parallel, multiplexedo Serialo JTAGo Custom
Deviceso Single cell, test arrayo Stand-alone memoryo SOC, uCo Smart card
Applications
Fast Time-to-Resulto Single environment for
development, execution and analysis
o True interactive testing
Analog Performanceo 200 MHz arbitrary
waveform generatorso 1 MHz PMU for fast cell
current measuremento Full synchronization
Easy Installationo Small-footprint desktopo No need of labo Thermostream / EMMIo Package and wafer
tests
Software-Based Testingo Increased visibility through
algorithmic device management
o Programmable communication protocol
Highlights
Integrated Software Environment
Execution
Analysis
Development
• Microsoft Visual Studio• Productivity significantly
higher than ATE• Protocol description:
• C++• Dedicated FPGA IP
• Device algorithms:• C++• Strong library
support• Test flows:
• C++
• NTEE Operating system• Local and remote control• Engineering and operator
modes• On-the-fly consultation of
the test results (plots, numeric)
• On-line• Sent to BARNIE via
TCP-IP• Automated and
manual processing• Off-line
• XML or STDF• Conform to NplusT
test data model• Loaded in
BarnieDAC or in third-party tool
List of FunctionsThe following list of functions is device and implementation dependent
Memory Test
Program
Erase
Verify
Read
Cycling
Vt Analyis
Bitmap
Distribution
Edge lookup
Icell Analysis
Bitmap
Distribution
IV
Stress
Read stress
Wordline and bitline
disturb
Miscellaneous
Continuity check
Icc
Iref
Device ID
Vbandgap
NplusT
would like to thank youfor your time and
consideration
for further information: [email protected]