Report on the KEK Laser system and Test Bench @ Tsukuba
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Report on the KEK Laser systemand Test Bench @ Tsukuba
April-27 2006ILC-CAL meeting
S. Uozumi, T. Maeda
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Laser Test Bench System @ KEK• YAG Laser• = 532 m (green)• Spot size ~ 1m• Pulse width ~ 2 nsec• Useful for Spot measurement,
but not for timing resolution
• 3/13~3/25 : System setup
by 中平、吉村、田口、馬塚、魚住 problem on trigger signal• ~4/20 : Photo diode installed for the
trigger signal, start measurement.• ~5/20 : Used by T2K group (田口くん )
100/400pixels(HPK), 600pixels(Russia)
• 6/1 ~ : We will start the laser
measurement.
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KEK Laser – First Result (by 田口君 )
100μ
m
Laser spot
• Results of the 100 pixel MPPC.• Measure efficiency / gain
inside a pixel, with 10 m pitch.
Gain : (only inside sensitive area)Efficiency (>0.5 p.e. / All)
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~ 30μm
• 20 Russian SiPMs (600 pixels)
are available at KEK.• Test-bench system with thermostatic
chamber / LED is also available
KEK – SiPM samples
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Gain ~ 4 x 105
Device-by-device variation seems not small.
20 SiPM characteristics
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Test-Bench @ Tsukuba
• Just launched in last week• LED / thermostatic chamber
/ CAMAC / VME• Latest 400 / 1600 pixel
MPPC samples from Kobe
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ゲインのバイアス電圧依存性(室温での測定 )
2つの400 pixel MPPC
19106.163
)/(25.0
countpCdGain d
AMP 素電荷
ガイガーモード開始電圧
C = 0.13 ± 0.01 pFV0= -67.6 ± 0.01 V
)( 0VVe
CGain bias
ピクセル容量
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Noise rate• 400 pixel MPPC• Threshold ~ 0.5 p.e.
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Plans at Tsukuba• Evaluate fundamental performances of the latest MPPC samples
– Gain, noise rate, Linearity, P.D.E., cross-talk, dead-time– Its temperature dependence
• Bench test using laser system @ KEK– P.D.E./ Gain uniformity (Pixel-by-pixel / within a pixel)– Cross-talk– Its bias voltage dependence
• Practical test with strip scintillator / WLSF• Then provide feedbacks to HPK, and test newer samples
Short / Mid term … targets to the beam test in 2006/2007
• Long-term stability• Timing resolution• Absolute P.D.E., wave length dependence• Magnetic field test• Evaluate device-by-device characteristics
Long term …
今年度の筑波大 ILC メンバー : 金 , 魚住 , 前田 (M2), 4 年生 1 人
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Backups
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SiPM - ADC 分布
• ノイズレート~ 1MHz時の ADC分布• Single p.e.の S/N~ 2.0
– HPK製のものを同様に測ると S/N~ 4.3
• Pedestalの σ~ 8.9– エレキのノイズ等まだ多い?
Pedestal 1710-043 Vbias=-49.4V
1
1
/( ) 2
pe ped
pe ped
mean meanS N
Signal
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SiPM - 波形
• 信号のタイミングがばらついている
1710-043 Vbias=-49.4V Signa
lNoise
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SiPM - ノイズレート
• Threshold: -17mV• ゲインと同様、逆バイアス電圧にほぼ比例• 0509series~ 800kHz/Vbias 1710series~
370kHz/Vbias
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SiPM - カレント
• ゲイン、ノイズレート同様、逆バイアス電圧にほぼ比例• 0509series~ 0.27μA/Vbias 1710series~ 0.14μA/Vbias
• ゲイン・ノイズレート・カレントにおいて、 0509seriesの方が 1710seriesよりも逆バイアス電圧に sensitive
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HPK製MPPC
• Sample 311-53-1A-002-3• Vbias=-69.0V noise ~ 1MHz• SiPM と同じ回路で測定• S/N ~ 4.3 c.f. ロシア製 ~ 2.0• ゲイン~ 6.4×105 c.f. ロシア製 ~ 4.4×105
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400pix MPPC - LEDに対する信号
150 nSec