Quality Assurance and Certification
Transcript of Quality Assurance and Certification
QUALITY SYSTEM OVERVIEW–LYNNWOOD AND KAOHSIUNG• Our Lynnwood and Kaohsiung facilities are on the Defense Logistics Agency’s (DLA) Qualified Manufacturers List (QML) of hybrid microcircuits with products compliant up to Class H (Lynnwood and Kaohsiung) and Class K (Lynnwood) of MIL-PRF-38534. Our manufacturing facilities are audited by a US government organization with customer participation. Classes H and K, MIL-PRF-38534 Certificate, Hybrid Microcircuits, FSC 5962, VQ(VQH-21-035667) for Lynnwood.
• The quality management system of Crane Electronics, Inc., Lynnwood and Crane Electronics Corporation, Kaohsiung have been certified to ISO 9001:2015 and AS9100D on certificates 1655 and 1657 by the International Standards Authority, Inc. (www.isaregistrar.com)
• Standard Microcircuit Drawings (SMD) of our DC-DC converters are available to Class H and K of MIL-PRF-38534. DLA Drawing EMI filters are available to Class H and K of MIL-PRF-38534. The government documents may be viewed at https://landandmaritimeapps.dla.mil/programs/smcr/.
• Components and materials used in product assembly are purchased against published revision controlled source control drawings (SCD). Characteristics and allowed suppliers are controlled by specific SCDs. A system is in place to review components and materials prior to stocking. Instruments such as the X-ray fluorescence (XRF) are used to ensure that supplier certifications accurately describe the material. Our high reliability QML products comply with MIL-PRF-38534 specifications, which do not allow the use of pure tin. Our other products may have pure tin. Refer to our “Lead and Other RoHS Materials” letter for more information.
• Documented revision controlled procedures and work instructions are in use for all operations that affect quality.
• Radiation hardness assurance (RHA) levels available referenced to MIL-PRF-38534. Our Lynnwood facility has a DLA approved RHA plan for Interpoint power products. Our SMD products with RHA “P,” “L”, “R” and “H” levels meet DLA RHA requirements.
• Travelers are used to sequence and control operations at in-process, final and special inspection situations.
• Quality documents are specifically identified and retained as specified in our document control procedure. The standard retention period for critical documents is 15 years.
• Quality manual QA-040 (www.interpoint.com/012) is the controlling document for the quality system.
• Personnel performing quality functions are given the responsibility, authority and organizational freedom to identify and evaluate quality concerns as well as to initiate corrective action.
• Contracts are reviewed to identify and make timely provisions for special or unusual circumstances.
• As a minimum, self audits of the quality system are completed annually.
The application note is an overview of the Crane quality system for Interpoint® products. It includes a list of certifications and qualifications, an explanation of our model numbering system and tables of the screening levels offered.
Lynnwood CLass H and K CertifiCate KaoHsiung CLass H dLa Letter
MIL-PRF-38534
IS HEREBY AWARDED TO
THIS CERTIFICATION IS VALID UNTIL TERMINATED BY WRITTEN NOTIFICATION FROM DLA LAND AND MARITIME. REFERENCE DLA LAND AND MARITIME LETTER VQ(VQH-21-035667) FOR DETAILS PERTAINING TO THIS CERTIFICATION.
Crane Electronics, Inc. 16700 13th Avenue West
Lynnwood, Washington 98037
EUGENE WILLIAMS JR. Director Engineering & Technical Support Directorate (V) DLA, Land & Maritime
HYBRID MICROCIRCUIT CERTIFICATION FOR
CLASSES H and K
WILLIAMS.EUGENE.1180650748
Digitally signed by WILLIAMS.EUGENE.1180650748Date: 2020.11.17 15:21:30 -05'00'
DDEEFFEENNSSEE LLOOGGIISSTTIICCSS AAGGEENNCCYY LAND AND MARITIME
POST OFFICE BOX 3990 COLUMBUS, OH 43218-3990
Mr. Dale Fakkema September 4, 2018Crane Electronics, Inc.P.O. Box 97005Redmond, WA 98073-9705
Dear Mr. Fakkema:
Re: Class H Manufacturer Certification, Hybrid Microcircuits, MIL-PRF-38534, FSC 5962,VQ(VQH-18-032974) , CN 064074
Your hybrid facility at No.198, Xinsheng Rd., Qianzhen Dist., Kaohsiung City 80672, Taiwan (R.O.C.) was sample audited the week of March 21-23, 2018 for compliance with the requirements of MIL-PRF-38534.
An acceptable level of confidence has been established that the compliance with these requirements exists. Therefore, Crane Electronics Corporation is considered a certified Classes H manufacturer (certificate enclosed) effective August 30, 2018 retaining a Certification effective date of September 10, 1997.
This certification is for the following:
a. Product Assurance Program Plan: QA-083 Rev. AL.
b. Conversion of Customer Requirements: ENG-002 Rev. AT.
c. Controlled documentation baseline for processing MIL-PRF-38534 devices: QA-039 Rev. AP.
This certification is valid until terminated by written notification from the qualifying activity. The normal period of certification is two years from the date of the audit and, if warranted, may be withdrawn by DLA Land and Maritime-VQ at any time. Your facility may be re-audited on a drop-in basis at any time.
All screening, qualification, conformance, and periodic inspection must be performed at a facility, which has a DLA Land and Maritime-VQ letter of Laboratory Suitability for the applicable test method and condition.
If you have any questions, please contact Mr. Barker at (614) 692-0596.
Sincerely,
ALAN WILLChiefSourcing and Qualifications Division
WILL.ALAN.J.1230187076
Digitally signed by WILL.ALAN.J.1230187076 Date: 2018.09.06 13:11:21 -04'00'
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
APP-009 Rev AN - 2021.03.29Crane Aerospace & ElectronicsPower Solutions – Interpoint® Products16706 13th Avenue West, Lynnwood, WA 98037+1 425-882-3100 • [email protected]/interpoint
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AppLICATION NOTE fOR INTERpOINT® pRODUCTS
QUALITY ASSURANCE CERTIfICATIONS AND STANDARDS LYNNWOOD AND KAOHSIUNG• ANSI/ESD S20.20—Electrostatic Discharge Control Program. We use a multi-level ESD damage prevention approach including operator training, continuously monitoring wrist grounding-straps, static dissipative smocks for personnel, static dissipative work surfaces and floors, air ionizers at work stations and faraday cages for parts movement.
• ANSI/IPC-A-600—Acceptability of Printed Boards
• ANSI/IPC-A-610—Acceptability of Electronic Assemblies. The Lynnwood facility has IPC-610 certified operators.
• ANSI-Z540—Calibration Laboratories and Measuring and Test Equipment—General Requirements
• ASQC-Z1.4—Procedures, Sampling and Tables for Inspection by Attributes
• ISO 9001/AS9100 Quality Systems—Model for quality assurance in design, development, production, installation, and servicing. Lynnwood and Kaohsiung facilities are registered with International Standards Authority (ISA) accredited by ANAB.
• ISO 14644—Cleanrooms and Controlled Environments. Particle count monitoring, laminar flow benches and contamination preventing smocks for personnel all contribute to maintaining the required levels of cleanliness.
• MIL-STD-883—Test Method Standard for Microcircuits
• MIL-PRF-38534—Hybrid Microcircuits, General Specifications for
• Quality Certification—Employees who work with products are individually certified in the required skills. Training and certification are documented and records are maintained. Inspectors are tested for color vision and visual acuity.
• QML-38534—Qualified Manufacturer’s List of Products Qualified under Performance Specification MIL-PRF-38534 Hybrid Microcircuits, General Requirements for
• Restriction of Hazardous Substances (RoHS), Waste Electrical and Electronic Equipment (WEEE) and Registration, Evaluation, and Authorization of Chemicals (REACh) are addressed in “Lead and Other RoHS Materials”.
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pART NUMBERING Our part numbering indicates the series (family), input voltage, output voltage, number of outputs, package configu-ration and screening level. The screening and RHA levels found in this Quality Assurance document appear at the right end of the part number. Products with standard screening do not have a screening level in the part number: e.g. MTR2812D is the MTR Series™ 28 volt input (nominal), ±12 volt outputs, flanged package and standard screening. Refer to individual datasheets to determine what screening options are available for a particular product. Screening methods are referenced to MIL-STD-883 per MIL-PRF-38534.
MTR 28 12 D F /883 Base Model
Input Voltage
Output Voltage
Screening
Number of Outputs
Case/Lead Option(Standard case has no designator in thisposition. F=flanged model; U, V, W, Y and Zrefer to various options on select products. See individual products for more information.)
(S = single, D = dual, T = triple)
(Main and aux. VOUT for triple models)
(Standard screening has no designatorin this position. See screening levels at right.)
The example shows an MTR, 28 Vin, ±12 Vout, flanged case with /883 (Class H) screening. MTR2812D/883 is a model in the MTR Series™.
SMHF 28 05 S F / K RBase Model
Input Voltage
Output Voltage
Environmental Screening
Number of Outputs(S = single, D = dual)
Radiation HardnessAssurance (RHA)
Case Option(Non-flanged case has no designator in this position)
The example below shows an SMHF, 28 Vin, +5 Vout, flanged case, Class K screening and RHA level R. SMHF2805SF/KR is a model in the SMHF Series™.
Notes1. RHA “H” applies to filters only. Our EMI filters are designed with passive
components providing maximum tolerance for space environment requirements. RHA “H” is defined as radiation tolerant up to 1000 krad(Si) total dose.
2. Non-QML products “O” may not meet all of the requirements of MIL-PRF-38534.
If ordering by model number add a “-Q” to request solder dipped leads (e. g. SMHF2805SF/KR-Q).
Table 1: environmenTal Screening (non Space)
Screening (/) DeScripTion
883 Class H, QML, has an SMD number, marked with “QML”. Class H, QML, products that do not have an SMD number, marked with “CH”. Qualified by similarity.
SX 1, 2 MIL-STD-883 screening, non QML, marked with “SX”.
ES 2 Extended screening, per the product’s datasheet.
Standard 2 Standard screening, per the product’s datasheet.
1. “SX’” screening is only available on specific models. Refer to the Series’ datasheet. 2. Non-compliant products may not meet all of the requirements of
MIL-PRF-38534.
Table 2: Screening anD rHa levelS, Space proDucTS
level DeScripTion of levelS
KR Class K, QML, RHA level R, 100 krad(Si)
KL Class K, QML, RHA level L, 50 krad(Si)
KP Class K, QML, RHA level P, 30 krad(Si)
HR Class H, QML, RHA level R, 100 krad(Si)
HL Class H, QML, RHA level L, 50 krad(Si)
HP Class H, QML, RHA level P, 30 krad(Si)
KH Class K, QML, filters only RHA level H 1
HH Class H, QML, filters only RHA level H 1
BR Class K screening, non-QML2, RHA level R, 100 krad(Si)
BL Class K screening, non-QML2, RHA level L, 50 krad(Si)
BP Class K screening, non-QML2, RHA level P, 30 krad(Si)
AR Class H screening, non-QML2, RHA level R, 100 krad(Si)
AL Class H screening, non-QML2, RHA level L, 50 krad(Si)
AP Class H screening, non-QML2, RHA level P, 30 krad(Si)
OO Space prototype, screening (non-QML2) per the product’s datasheet. “O” in the RHA designator position in Interpoint model numbers indicates DLA RHA “-” defined as no RHA.
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SCREENING TABLES
“Table 3: Environmental Screening Space DC-DC Converters Prototype, Class H and K” ................page 5
“Table 4: Space Radiation Hardness Assurance DC-DC Converters Class H and K, RHA P, L and R” ..........................................................................................................................................................page 6
“Table 5: Environmental Screening Space DC-DC Converters Prototype, A and B” .........................page 7
“Table 6: Space Radiation Hardness Assurance DC-DC Converters A and B non-QML RHA P, L and R” ..........................................................................................................................................................page 8
“Table 7: Environmental Screening Space EMI Filters Prototype, Class H and K, RHA H” ...............page 9
“Table 8: Environmental Screening High Reliability DC-DC Converters and EMI Filters Standard, /ES, /SX and /883 (Class H)” .................................................................... page 10
Appendix A: Element Evaluation Tables 1 ......................................................................................... page 11
“Table A: Microcircuit Dice Evaluation Requirements” (Table C-II) ......................................... page 12
“Table B: Semiconductor Dice Evaluation Requirements” (Table C-II-1) ................................ page 13
“Table C: Wire Bondable and Surface Mount Resistors” (Table C-III) ..................................... page 16
“Table D: Chip Capacitors, Solid Tantalum” (Table C-III-2) ................................................ page 18
“Table E: Coils, Transformers” (Table C-III-4)2 ............................................................................. page 20
1. Referenced MIL-PRF-38534 table is listed in parentheses. 2, Table E applies to purchased magnetics. It does not apply to magnetics made in-house by Crane which are made on a qualified line and do
not require additional Element Evaluation.
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Table is for reference only. See individual Series' datasheets for specific screening.
Table 3: environmenTal Screening Space Dc-Dc converTerS proToType, claSS H anD K
Table is for reference only. See individual Series' datasheets for specific screening.
environmentaL sCreening spaCe dC-dC Converters prototype, CLass H and K
non-QmL 1 QmL 2, 3
test performed prototype (/o) 4 CLass H (/H) CLass K (/K)
Non-destruct wire bond pull, Method 2023 ■ 5 ■
pre-cap Inspection, Method 2017, 2032 ■ ■ ■
Temperature Cycle (10 times)
Method 1010, Cond. C, -65°C to +150°C, ambient ■ ■ ■
Constant Acceleration
Method 2001, 3000 g ■ ■ ■
pIND, Test Method 2020, Cond. A ■ 5 ■
pre burn-in test, Group A, Subgroups 1 and 4 ■ ■ 5 ■
Burn-in Method 1015, +125°C case, typical 6
96 hours ■
160 hours ■
2 x 160 hours (includes mid-BI test) ■
final Electrical Test, MIL-pRf-38534, Group A,
Subgroups 1 and 4: +25°C case ■
Subgroups 1 through 6, -55°C, +25°C, +125°C case ■ ■
Hermeticity Test, Method 1014
Gross Leak, Cond. B2, Kr85 ■
Gross Leak, Cond. C1, fluorocarbon ■ ■
Fine Leak, Cond. B1, Kr85 ■
Fine Leak, Cond. A2, helium ■ ■
Radiography, Method 2012 ■
post Radiography Electrical Test, +25°C case ■ 5
final visual inspection
Method 2009 of MIL-STD-883 ■ ■
Magnification 1X 7 ■
Test methods are referenced to MIL-STD-883 as determined by MIL-PRF-38534.
Notes1. Non-QML prototype products may not meet all of the requirements of
MIL-PRF-38534.2. All processes are QML qualified and performed by certified operators. 3. Class H or K QML products that have no SMD number are marked “CHP, CHL, CHR,
CKP, CKL or CKR” per MIL-PRF-38534, Table III instead of “QML”.4. “O” in the RHA designator position in Interpoint model numbers indicates DLA RHA “-”
defined as no RHA.
5. Not required by DLA but performed to assure product quality.6. Burn-in temperature designed to bring the case temperature to +125°C minimum.
Burn-in is a powered test. 7. Visual inspection is performed per an internal document. Product may contain
cosmetic irregularities such as dents, dings, scratches, etc. that do not affect form, fit or function.
Table 2: environmenTal Screening Space Dc-Dc converTerS proToType, claSS H anD K
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AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Table is for reference only. See individual Series' datasheets for specific screening.
Table 4: Space raDiaTion HarDneSS aSSurance Dc-Dc converTerS claSS H anD K, rHa p, l anD r
Table is for reference only. See individual Series' datasheets for specific screening.
spaCe radiation Hardness assuranCe dC-dC Converters CLass H and K, rHa 1 p, L and r
QmL 2
CLass H CLass K
QuaLifiCation per miL-std /Hp /HL /Hr /Kp /KL /Kr
RHA p: 30 krad(Si) total dose 3, 4 ■ ■
RHA L: 50 krad(Si) total dose 3, 4 ■ ■
RHA R: 100 krad(Si) total dose 3, 4 ■ ■
SEE, LET 86 MeV cm2/mg 5 ■ ■ ■ ■ ■ ■
Test methods are referenced to MIL-STD-883 as determined by MIL-PRF-38534.
Notes1. DLA has approved the RHA plan for Interpoint power products. Our SMD products with
RHA “P”, “L” or “R” code meet DLA requirements. 2. Class H or K QML products that have no SMD number are marked “CHP, CHL, CHR,
CKP, CKL or CKR” per MIL-PRF-38534, Table III instead of “QML”.3. Radiation sensitive components internal to the devices are procured with radiation
guarantees or undergo radiation lot acceptance testing (RLAT) performed per condition A, method 1019 of MIL-STD-883.
4. Representative devices were initially High Dose Rate (HDR) tested using condition A of method 1019 of MIL-STD 883 to ensure RHA designator levels. Representative devices have also been Low Dose Rate (LDR) tested using condition D of method 1019 of MIL-STD-883 to the RHA designator levels. Representative devices will also be re-tested after design or process changes that can affect RHA response of this device.
5. Single event testing was performed on a converter to 86 MeV-cm2/mg using 15 MeV/nucleon gold ions with no latch-up, burn-out, functional interrupts, or gate ruptures exhibited. Single event upsets (output voltage transients) may be present up to 86 MeV-cm2/mg.
Table 3: Space raDiaTion HarDneSS aSSurance Dc-Dc converTerS claSS H anD K, rHa p, l anD r
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AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Table is for reference only. See individual Series' datasheets for specific screening.
Table 5: environmenTal Screening Space Dc-Dc converTerS proToType, a anD b
environmentaL sCreening spaCe dC-dC Converters prototype, a and B.
non-Qml 1, 2
proToType a b
TeST performeD /oo 3 /a /b
Non-destruct wire bond pull, Method 2023 n 4 n
Pre-cap Inspection, Method 2017, 2032 n n n
Temperature Cycle (10 times)
Method 1010, Cond. C, -65°C to +150°C, ambient n n n
Constant Acceleration
Method 2001, 3000 g n n n
PIND, Test Method 2020, Cond. A n 4 n
Pre burn-in test, Group A, Subgroups 1 and 4 n n 4 n
Burn-in Method 1015, +125°C case, typical 5
96 hours n
160 hours n
2 x 160 hours (includes mid-BI test) n
Final Electrical Test, MIL-PRF-38534, Group A,
Subgroups 1 and 4: +25°C case n
Subgroups 1 through 6, -55°C, +25°C, +125°C case n n
Hermeticity Test, Method 1014
Gross Leak, Cond. B2, Kr85 n
Gross Leak, Cond. C1, fluorocarbon n n
Fine Leak, Cond. B1, Kr85 n
Fine Leak, Cond. A2, helium n n
Radiography, Method 2012 n
Post Radiography Electrical Test, +25°C case n 4
Final visual inspection, Method 2009
Method 2009 of MIL-STD-883 n n
Magnification 1X 6 n
Test methods are referenced to MIL-STD-883 as determined by MIL-PRF-38534.
Notes1. Non-QML prototype products may not meet all of the requirements of
MIL-PRF-38534.2. All processes are QML qualified and performed by certified operators. A and B are
only available on select models.3. “O” in the RHA designator position in Interpoint model numbers indicates DLA RHA “-”
defined as no RHA.
4. Not required by DLA but performed to assure product quality.5. Burn-in temperature designed to bring the case temperature to +125°C minimum.
Burn-in is a powered test. 6. Visual inspection is performed per an internal document. Product may contain
cosmetic irregularities such as dents, dings, scratches, etc. that do not affect form, fit or function.
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AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Table is for reference only. See individual Series' datasheets for specific screening.
spaCe radiation Hardness assuranCe sCreening dC-dC Converters a and B, rHa 1 p, L and r
non-Qml 2
a b
QualificaTion per mil-STD /ap /al /ar /bp /bl /br
RHA P: 30 krad(Si) total dose 3,4 n n
RHA L: 50 krad(Si) total dose 3,4 n n
RHA R: 100 krad(Si) total dose 3,4 n n
SEE, LET 86 MeV cm2/mg 5 n n n n n n
Test methods are referenced to MIL-STD-883 as determined by MIL-PRF-38534.
Table 6: Space raDiaTion HarDneSS aSSurance Dc-Dc converTerS a anD b non-Qml rHa p, l anD r
Notes1. DLA has approved the RHA plan for Interpoint power products. Our SMD products with
RHA “P”, “L” or “R” code meet DLA requirements. 2. Non-QML products may not meet all of the requirements of
MIL-PRF-38534.3. Radiation sensitive components internal to the devices are procured with radiation
guarantees or undergo radiation lot acceptance testing (RLAT) performed per condition A, method 1019 of MIL-STD-883.
4. Representative devices were initially High Dose Rate (HDR) tested using condition A of method 1019 of MIL-STD 883 to ensure RHA designator levels. Representative devices have also been Low Dose Rate (LDR) tested using condition D of method 1019 of MIL-STD-883 to the RHA designator levels. Representative devices will also be re-tested after design or process changes that can affect RHA response of this device.
5. Single event testing was performed on a converter to 86 MeV-cm2/mg using 15 MeV/nucleon gold ions with no latch-up, burn-out, functional interrupts, or gate ruptures exhibited. Single event upsets (output voltage transients) may be present up to 86 MeV-cm2/mg.
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AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Table is for reference only. See individual Series' datasheets for specific screening.
Table 7: environmenTal Screening Space emi filTerS proToType, claSS H anD K, rHa H
Table is for reference only. See individual Series' datasheets for specific screening.
Table 5: environmenTal Screening Space emi filTerS proToType, claSS H anD K, rHa H
Notes1. DLA has approved the RHA plan for Interpoint power products. Our SMD products with
RHA “H” code meet DLA requirements. 2. Non-QML products, prototype (OO), may not meet all of the requirements of MIL-PRF-
38534. 3. All processes are QML qualified and performed by certified operators.4. Class H or K QML products that have no SMD number are marked “CHH, CKH” per
MIL-PRF-38534, Table III instead of “QML”.5. “O” in the RHA designator position in Interpoint model numbers indicates DLA RHA “-”
defined as no RHA6. Our EMI filters are designed exclusively with passive components providing maximum
tolerance for space environment requirements.
7. Not required by DLA but performed to assure product quality.8. Burn-in temperature designed to bring the case temperature to +125°C minimum.
Burn-in is a powered test.9. Visual inspection is performed per an internal document. Product may contain
cosmetic irregularities such as dents, dings, scratches, etc. that do not affect form, fit or function.
10. Interpoint EMI filters are designed exclusively with passive components providing maximum tolerance for space environment requirements. RHA level H is guaranteed to 1000 krad(Si).
environmentaL sCreening spaCe emi fiLters prototype, CLass H and K, rHa 1 Hnon-QML 2 QmL 3, 4
prototype 5 CLass H CLass K
test performed /oo 6 /HH 6 /KH 6
pre-cap Inspection, Method 2017, 2032 ■ ■ ■
Temperature Cycle (10 times)
Method 1010, Cond. C, -65°C to +150°C, ambient ■ ■ ■
Constant Acceleration, Method 2001, 3000 g ■ ■ ■
pIND, Test Method 2020, Cond. A ■ 7 ■
pre burn-in test, Group A, Subgroups 1 and 4 ■ ■ ■
Burn-in Method 1015, +125°C case, typical 8
96 hours ■
160 hours ■
2 x 160 hours (includes mid-BI test) ■
final Electrical Test, MIL-pRf-38534, Group A,
Subgroups 1 and 4: +25°C case ■
Subgroups 1 through 6, -55°C, +25°C, +125°C case ■ ■
Hermeticity Test, Method 1014
Gross Leak, Cond. B2, Kr85 ■
Gross Leak, Cond. C1, fluorocarbon ■ ■
Fine Leak, Cond. B1, Kr85 ■
Fine Leak, Cond. A2, helium ■ ■
Radiography, Method 2012 ■
post Radiography Electrical Test, +25°C case ■ 7
final visual inspection
Method 2009 of MIL-STD-883 ■ ■
Magnification 1X 9 ■
Radiation tolerance 1, 10
Passive components, radiation tolerant ■ ■
Test methods are referenced to MIL-STD-883 as determined by MIL-PRF-38534.
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AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Table is for reference only. See individual Series' datasheets for specific screening.
Table 8: environmenTal Screening HigH reliabiliTy Dc-Dc converTerS anD emi filTerS STanDarD, /eS, /SX anD /883 (claSS H)
Table is for reference only. See individual Series' datasheets for specific screening.
environmentaL sCreening HigH reLiaBiLity dC-dC Converters and emi fiLters standard, /es, /sX and /883 (CLass H)
non-QmL 1 CLass H QmL 2, 3
test performed standard /es /sX 4 /883
pre-cap Inspection, Method 2017, 2032 ■ ■ ■ ■
Temperature Cycle (10 times)
Method 1010, Cond. C, -65°C to +150°C, ambient ■ ■
Method 1010, Cond. B, -55°C to +125°C, ambient ■
Constant Acceleration
Method 2001, 3000 g ■ ■
Method 2001, 500 g ■
pIND, Test Method 2020, Cond. A ■ 5 ■ 5
Burn-in Method 1015, +125°C case, typical 6
96 hours ■
160 hours ■ ■
final Electrical Test, MIL-pRf-38534, Group A,
Subgroups 1 through 6, -55°C, +25°C, +125°C case ■ ■
Subgroups 1 and 4, +25°C case ■ ■
Hermeticity Test, Method 1014
Gross Leak, Cond. C1, fluorocarbon ■ ■ ■
Fine Leak, Cond. A2, helium ■ ■ ■
Gross Leak, Dip ■
final visual inspection, Method 2009 ■ ■ ■ ■
Test methods are referenced to MIL-STD-883 as determined by MIL-PRF-38534.
Notes1. Non-QML products may not meet all of the requirements of MIL-PRF-38534.2. All processes are QML qualified and performed by certified operators.3. A QML products which has an SMD number is marked “QML”. A QML product which does not SMD number is marked
per MIL-PRF-38534 table III. 4. “SX” screening is performed per MIL-PRF-38534, MIL-STD-883, Class H for non-QML devices. 5. Not required by DLA but performed to assure product quality.6. Burn-in temperature designed to bring the case temperature to +125°C minimum. Burn-in is a powered test.
for preLiminary miL-std produCts not QuaL’d, no smd numBer [mfX Has it’s own taBLe in its datasHeet)
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AppLICATION NOTE fOR INTERpOINT® pRODUCTS
APPENDIX A - ELEMENT EVALUATION TABLES
THe following TableS are from mil-prf-38534 l aS THey apply To inTerpoinT proDucTS.
MIL-PRF-38534 L, Section C.3.1 NOTE: Elements used in compliant hybrid microcircuits with element evaluation successfully completed prior to the implementation date (3 Jun 2020) of this specification are permitted and shall follow the element evaluation requirements in MIL-PRF-38534 at the time element evaluation was initiated.
The Element Evaluation tables are referenced to MIL-PRF-38534 L tables which are listed in parentheses.
Appendix A: Element Evaluation Tables 1
“Table A: Microcircuit Dice Evaluation Requirements” (Table C-II) ......................................... page 12
“Table B: Semiconductor Dice Evaluation Requirements” (Table C-II-1) .........................................page 13
“Table C: Wire Bondable and Surface Mount Resistors” (Table C-III) ........................................................page 16
“Table D: Chip Capacitors, Solid Tantalum” (Table C-III-2) .................................................................... page 18
“Table E: Coils, Transformers” (Table C-III-4) 2 ............................................................................ page 20
1. Referenced MIL-PRF-38534 table is listed in parentheses. 2, Table E applies to purchased magnetics. It does not apply to magnetics made in-house by Crane which are made on a qualified line
and do not require additional Element Evaluation.
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 11 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLESSu
bgro
up
Clas
s Te
st
Spec
ifica
tion
or S
tand
ard
Met
hod
Cond
ition
Co
mm
ents
Q
uant
ity
(acc
ept
num
ber)
Ref
eren
ce
para
grap
h M
IL-P
RF
-38
534
K
H
1 X
X El
emen
t Ele
ctric
al
Per A
cqui
sitio
n D
ocum
ent
25°C
10
0%
C.3.
3.1
2 X
Elem
ent V
isua
l M
IL-S
TD-8
83
2010
B
10
0%
C.3.
3.2
X El
emen
t Vis
ual
MIL
-STD
-883
20
10
A
3 X
Inte
rnal
Vis
ual
MIL
-STD
-883
20
10
B
10(0
) C.
3.3.
3
C.3.
3.4.
2 X
Inte
rnal
Vis
ual
MIL
-STD
-883
20
10
A
4 X
Initi
al E
lect
rical
Pe
r Acq
uisi
tion
Doc
umen
t 25
°C
Rec
ord
Dat
a 10
(0)
X Te
mpe
ratu
re C
ycle
M
IL-S
TD-8
83
1010
C
20 C
ycle
s C.
3.3.
3 X
Mec
hani
cal S
tres
s 1/
M
IL-S
TD-8
83 -
Cons
tant
Ac
cele
ratio
n 20
01
A Y1
Dire
ctio
n
MIL
-STD
-883
-M
echa
nica
l Sho
ck
2002
B
Y1
Dire
ctio
n
X In
terim
Ele
ctric
al
Per A
cqui
sitio
n D
ocum
ent
25°C
R
ecor
d D
ata
C.3.
3.4.
3
X B
urn
-In 2
/ M
IL-S
TD-8
83
1015
24
0hrs
Min
. at T
c or
Ta
= 12
5o C M
in.
X Po
st-B
I Ele
ctric
al
3/
Per A
cqui
sitio
n D
ocum
ent
25°C
, -55
°C, 1
25°C
R
ecor
d D
ata
C.3.
3.4.
3
X St
eady
Sta
te L
ife
2/
MIL
-STD
-883
10
05
1000
hrs
at
Tc o
r Ta
=12
5°C
Min
. or
500h
rs a
t Tc=
150°
C M
in.
X X
Fina
l Ele
ctric
al
3/
Per A
cqui
sitio
n D
ocum
ent
25°C
, -55
°C, 1
25°C
R
ecor
d D
ata
C.3.
3.4.
3
5 X
X W
irebo
nd E
valu
atio
n 4/
M
IL-S
TD-8
83
2011
B
ake
for 1
hou
r m
inim
um
@ +
300º
C (B
imet
allic
bo
nds
only
)
10(0
) or
20(1
) w
ires
C.3.
3.3
C.3.
3.5
6 X
SEM
5/
MIL
-STD
-883
20
18
See
5/
C.3.
3.6
Tab
le a
: mic
ro
cir
cuiT
Dic
e ev
alu
aTio
n r
eQu
irem
enTS
1/Ei
ther
test
met
hod
is a
pplic
able
.2/
Hig
h po
wer
dev
ices
may
be
test
ed a
t Max
Tj w
hen
Ta/T
c w
ould
cau
se T
j to
exce
ed m
ax o
pera
ting
tem
pera
ture
. 3/
Per
form
Del
ta L
imit
Calc
ulat
ion
resu
lts a
gain
st th
e pr
evio
us e
lect
rical
te
st p
erfo
rmed
whe
n re
quire
d by
the
acqu
isiti
on d
ocum
ent.
4/B
ond
wire
s m
ust b
e se
lect
ed to
acc
urat
ely
refle
ct th
e w
ire b
ond
syst
em u
sed
on th
e hy
brid
.5/
The
quan
tity
acce
pt (r
ejec
t) re
quire
men
ts s
peci
fied
here
in fo
r el
emen
t eva
luat
ion
supe
rsed
e th
e sa
mpl
e si
ze a
nd s
elec
tion
requ
irem
ents
of m
etho
d 20
18 o
f MIL
-STD
-883
. If t
he d
ie a
re
from
a k
now
n ho
mog
eneo
us s
ingl
e w
afer
, the
n th
e sa
mpl
e si
ze s
hall
be 4
dev
ices
ran
dom
ly s
elec
ted
from
the
waf
er.
If th
e di
e ar
e fr
om a
non
- hom
ogen
eous
waf
er lo
t (tr
acea
bilit
y is
un
know
n or
no
obje
ctiv
e ev
iden
ce is
ava
ilabl
e fo
r ve
rific
atio
n), t
hen
the
sam
ple
size
sha
ll be
8 d
evic
es r
ando
mly
sel
ecte
d fr
om th
e po
pula
tion.
If t
he d
ie a
re fr
om k
now
n ho
mog
eneo
us
mul
tiple
(tw
o or
mor
e) w
afer
s, th
en th
e sa
mpl
e si
ze s
hall
be 4
dev
ices
ran
dom
ly s
elec
ted
from
eac
h of
two
waf
ers
in th
e lo
t, 8
devi
ces
tota
l. If
any
waf
er fr
om th
e lo
t fai
ls, a
ll re
mai
ning
w
afer
s in
the
lot m
ust b
e te
sted
(4 d
evic
es r
ando
mly
sel
ecte
d fr
om e
ach
waf
er) t
o be
ver
ified
as
acce
ptab
le fo
r us
e.
(Tab
le C
-II o
f MIL
-PR
F-38
534
L)
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 12 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLES
Tab
le b
: Sem
ico
nD
ucT
or D
ice
eval
uaT
ion
reQ
uir
emen
TS
(Tab
le C
-II-1
of M
IL-P
RF-
3853
4 L)
Subgroup
Class
Test
Transistor -Signal
Transistor -Power
Diode -Zener
Diode -Power,Rectifier
MOSFET -Power
SCR *
Spec
ifica
tion
or S
tand
ard
Met
hod
Condition
Com
men
ts
Quantity(Accept number)
Ref
eren
ce
para
grap
h M
IL-P
RF
-38
534
K
H
1 X
X El
emen
t El
ectri
cal
X X
X X
X X
Per A
cqui
sitio
n D
ocum
ent
25°C
10
0%
C.3.
3.1
2 X
X El
emen
t Vi
sual
X
MIL
-STD
-750
20
69
100%
C.
3.3.
2
X X
X 20
70
X X
X X
X 20
72
X X
X X
2073
3
X X
Inte
rnal
Vi
sual
X
MIL
-STD
-750
20
69
10(0
) C.
3.3.
3
C.3.
3.4.
2 X
X X
2070
X
X X
X X
2072
X
X X
X 20
73
4 X
Initi
al
Elec
trica
l 1/
X
X X
X X
X Pe
r Acq
uisi
tion
Doc
umen
t 25
°C
Rec
ord
Dat
a 10
(0)
X Te
mpe
ratu
re
Cycl
e 2/
X
X X
X X
X M
IL-S
TD-8
83
1010
C
20 C
ycle
s C.
3.3.
3
X X
X X
X X
X M
IL-S
TD-7
50
1051
C
20 C
ycle
s X
Surg
e X
MIL
-STD
-750
40
66
B
X X
A
See
foot
note
s at
end
of t
able
.
*Int
erpo
int P
rodu
cts
do n
o ha
ve S
CR c
ompo
nent
s
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 13 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLES
Tab
le b
: Sem
ico
nD
ucT
or D
ice
eval
uaT
ion
reQ
uir
emen
TS (c
on
Tin
ueD
)
(Tab
le C
-II-1
of M
IL-P
RF-
3853
4 L)
Subgroup
Class
Test
Transistor -Signal
Transistor -Power
Diode – Zener
Diode -Power,Rectifier
MOSFET -Power
SCR
Spec
ifica
tion
or S
tand
ard
Met
hod
Condition
Com
men
ts
Quantity(Accept number)
Ref
eren
ce
para
grap
h M
IL-P
RF
-38
534
K
H
4 X
Mec
hani
cal
Stre
ss 2
/ X
X X
X X
X M
IL-S
TD-8
83 -
Cons
tant
Ac
cele
ratio
n
2001
A
Y1 D
irect
ion
5000
g 10
(0)
MIL
-STD
-750
-Co
nsta
nt
Acce
lera
tion
2006
X X
X X
X X
X M
IL-S
TD-8
83 -
Mec
hani
cal S
hock
20
02
B
Y1 D
irect
ion
MIL
-STD
-750
-M
echa
nica
l Sho
ck
2016
Y1
Dire
ctio
n 15
00g
X In
terim
El
ectri
cal
1/
X X
X X
X Pe
r Acq
uisi
tion
Doc
umen
t 25
°C
Rec
ord
Dat
a C.
3.3.
4.3
X H
igh
Tem
pera
ture
R
ever
se B
ias
(HTR
B)
3/
X X
MIL
-STD
-750
10
39
A 80
% M
in. o
f rat
ed
VCB
(b
ipol
ar),
as
appl
icab
le.
C.3.
3.3
X X
MIL
-STD
-750
-B
urn
-in (P
ower
M
OSF
ET)
MIL
-STD
-750
-G
ate
Bia
s (IG
BT)
1042
B
80
% M
in. o
f rat
ed
VGS.
X X
X M
IL-S
TD-7
50 -
Bur
n-in
(Pow
er)
MIL
-STD
-750
-R
ever
se B
ias
(Zen
er, R
ectif
ier)
1038
A
80%
Min
. of r
ated
VR
or V
RWM
whe
n D
C co
nditi
ons
are
spec
ified
. 95
-100
%
of V
RWM
, whe
n ha
lf si
ne c
ondi
tion
is s
peci
fied.
See
foot
note
s at
end
of t
able
.
*Int
erpo
int P
rodu
cts
do n
o ha
ve S
CR c
ompo
nent
s
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 14 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLES
Tab
le b
: Sem
ico
nD
ucT
or D
ice
eval
uaT
ion
reQ
uir
emen
TS (c
on
Tin
ueD
)
(Tab
le C
-II-1
of M
IL-P
RF-
3853
4 L)
Subgroup
Class
Test
Transistor -Signal
Transistor -Power
Diode -Zener
Diode -Power,Rectifier
MOSFET -Power
SCR
Spec
ifica
tion
or S
tand
ard
Met
hod
Condition
Com
men
ts
Quantity(Accept number)
Ref
eren
ce
para
grap
h M
IL-P
RF
-38
534
K
H
4 X
Inte
rim
Elec
trica
l 1/
3/
X X
X X
X X
Per A
cqui
sitio
n D
ocum
ent
25°C
R
ecor
d D
ata
10(0
) C.
3.3.
4.3
X B
urn
-In
X X
MIL
-STD
-750
10
39
B
240h
rs M
in a
t Tj
=M
ax ra
ted,
+
0°C,
-25°
C X
X M
IL-S
TD-7
50
1042
A
240h
rs M
in a
t Tj
=M
ax ra
ted,
+
0°C,
-25°
C X
X X
MIL
-STD
-750
10
38
B
240h
rs M
in a
t Tj
=M
ax ra
ted,
+
0°C,
-25°
C X
X M
IL-S
TD-7
50
1040
B
24
0hrs
Min
at
Tj=
Max
rate
d,
+0°
C, -2
5°C
X Po
st B
I El
ectri
cal
1/ 4
/
X X
X X
X X
Per A
cqui
sitio
n D
ocum
ent
25°C
, -55
°C,
125°
C R
ecor
d D
ata
C.3.
3.4.
3
See
foot
note
s at
end
of t
able
. 1/
Tes
t par
amet
ers
chos
en fr
om a
pplic
able
MIL
-PR
F-19
500
slas
h sh
eet,
appl
icab
le m
anuf
actu
rer’s
dat
a sh
eet,
and/
or a
cqui
stio
n do
cum
ent.
2/ E
ither
test
met
hod
is a
pplic
able
.3/
Whe
n H
igh
Tem
p R
ever
se B
ias
(HTR
B) i
s pe
rfor
med
, lea
kage
cur
rent
sha
ll be
mea
sure
d on
eac
h de
vice
bef
ore
any
othe
r sp
ecifi
ed p
aram
etric
test
is p
erfo
rmed
and
com
plet
ed w
ithin
16
hour
s of
HTR
B c
ompl
etio
n.4/
Whe
n re
quire
d by
the
acqu
isiti
on d
ocum
ent,
perf
orm
del
ta li
mit
calc
ulat
ions
. 5/
Se
lect
bon
d w
ires
that
rep
rese
nt th
e w
ire b
ond
proc
ess
used
in th
e hy
brid
.6/
SEM
is n
ot r
equi
red
for
sem
icon
duct
or d
ice
with
out e
xpan
ded
met
alliz
atio
n (r
efer
ence
met
hod
2077
of M
IL-S
TD-7
50).
7/ T
he q
uant
ity a
ccep
t (re
ject
) req
uire
men
ts s
peci
fied
here
in fo
r el
emen
t eva
luat
ion
supe
rsed
e th
e sa
mpl
e si
ze a
nd s
elec
tion
requ
irem
ents
of m
etho
d 20
18 o
f MIL
-STD
-883
and
met
hod
2077
of M
IL-S
TD-7
50. I
f the
die
are
from
a k
now
n ho
mog
eneo
us s
ingl
e w
afer
, the
n th
e sa
mpl
e si
ze s
hall
be 4
dev
ices
ran
dom
ly s
elec
ted
from
the
waf
er.
If th
e di
e ar
e fr
om a
non
- ho
mog
eneo
us w
afer
lot (
trac
eabi
lity
is u
nkno
wn
or n
o ob
ject
ive
evid
ence
is a
vaila
ble
for
verif
icat
ion)
, the
n th
e sa
mpl
e si
ze s
hall
be 8
dev
ices
ran
dom
ly s
elec
ted
from
the
popu
latio
n. I
f the
di
e ar
e fr
om k
now
n ho
mog
eneo
us m
ultip
le (t
wo
or m
ore)
waf
ers,
then
the
sam
ple
size
sha
ll be
4 d
evic
es r
ando
mly
sel
ecte
d fr
om e
ach
of tw
o w
afer
s in
the
lot,
8 de
vice
s to
tal.
If a
ny w
afer
fr
om th
e lo
t fai
ls, a
ll re
mai
ning
waf
ers
in th
e lo
t mus
t be
test
ed (4
dev
ices
ran
dom
ly s
elec
ted
from
eac
h w
afer
) to
be v
erifi
ed a
s ac
cept
able
for
use.
*Int
erpo
int P
rodu
cts
do n
o ha
ve S
CR c
ompo
nent
s
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 15 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLES
Tab
le c
: wir
e b
on
Dab
le a
nD
Su
rfa
ce m
ou
nT
reS
iSTo
rS
(Tab
le C
-III o
f MIL
-PR
F-38
534
L)
1/ 2
/
Subg
roup
Cl
ass
Test
W
ire
Bon
dabl
e R
esis
tors
Surf
ace
Mou
nt
Res
isto
rs
Stan
dard
or
Spec
ifica
tion
Met
hod
/ Pa
ragr
aph
Cond
ition
Co
mm
ents
Q
uant
ity
(acc
ept n
umbe
r)
Ref
Par
a M
IL-
PRF
-38
534
K
H
Clas
s K
Sa
mpl
es
Clas
s H
Sa
mpl
es
1 X
X El
emen
t El
ectri
cal
X X
MIL
-PR
F-
5534
2 3.
8 25
C 10
0%
100%
C.
3.4.
1
2 X
Visu
al
Insp
ectio
n X
X M
IL-S
TD-
883
2032
H
22
(0)
C.3.
4.2
X X
X M
IL-S
TD-
883
2032
K
10
0%
X X
Dev
ice
Fini
sh
3/
X M
IL-P
RF
-38
534
2 (0
) 2
(0)
3 X
Elem
ent
Elec
trica
l X
X M
IL-P
RF
-55
342
3.8
Mea
sure
&
Rec
ord
DC
Res
ista
nce
@ 2
5C
10(0
) C.
3.4.
4
X Th
erm
al
Shoc
k or
Te
mpe
ratu
re
Cycl
e
X X
MIL
-STD
-20
2 10
7 F
-65C
to
+15
0C, 1
0 Cy
cles
10(0
) C.
3.4.
3
MIL
-STD
-88
3 10
10
C -6
5C to
+
150C
, 10
Cycl
es
X M
echa
nica
l Sh
ock
or
Cons
tant
Ac
cele
ratio
n
X X
MIL
-STD
-88
3 20
02
B
Y1 D
irect
ion
10(0
)
2001
A
Y1 D
irect
ion
See
foot
note
s at
end
of t
able
.
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 16 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLES
Tab
le c
: wir
e b
on
Dab
le a
nD
Su
rfa
ce m
ou
nT
reS
iSTo
rS
(co
nTi
nu
eD)
(Tab
le C
-III o
f MIL
-PR
F-38
534
L)
1/ 2
/
Subg
roup
C
lass
Te
st
Wire
Bo
ndab
le
Res
isto
rs
Surfa
ce
Mou
nt
Res
isto
rs
Stan
dard
or
Spec
ifica
tion
Met
hod
/ Pa
ragr
aph
Con
ditio
n C
omm
ents
Q
uant
ity
(acc
ept n
umbe
r) R
ef P
ara
MIL
-PR
F-38
534
K H
C
lass
K
Cla
ss H
Sa
mpl
es
Sam
ples
3
X Po
wer
C
ondi
tioni
ng
X X
MIL
-PR
F-55
342
3.10
4.
8.4
100
hour
s @
70
°C, 1
.5X
Rat
ed
Pow
er
10(0
)
X El
emen
t El
ectri
cal
X X
Acqu
isiti
on
Doc
umen
t or
M
IL-P
RF-
5534
2
3.8
Mea
sure
&
Rec
ord
DC
R
esis
tanc
e @
25C
10(0
) C
.3.4
.4
X El
emen
t El
ectri
cal 4
/ X
X M
IL-P
RF-
5534
2 3.
8 M
easu
re &
R
ecor
d D
C
Res
ista
nce
@ 2
5C
Tole
ranc
e an
d D
elta
R.
10(0
) C
.3.4
.4
4 X
X W
irebo
nd
Eval
uatio
n X
MIL
-PR
F-55
342
3.19
.3
10 (0
) or
20
(1) w
ires
10 (0
) or
20
(1) w
ires
C.3
.4.3
C
.3.4
.6
X M
IL-S
TD-
883
2011
See
foot
note
s at
end
of t
able
. 1/
Sam
ples
sha
ll be
take
n fr
om e
ach
prod
uctio
n lo
t for
eac
h re
sist
ance
val
ue.
2/ P
arts
pro
cure
d as
mil-
prf-3
8534
pro
duct
leve
l T o
r w
ith E
stab
lishe
d R
elia
bilit
y (E
R) f
ailu
re r
ate
R, S
, U, o
r V
are
acce
ptab
le fo
r us
e as
is.
3/ U
sing
a r
ecog
nize
d m
etho
dolo
gy (e
.g. m
etho
d 20
37 o
f MIL
-STD
-883
, JES
D21
3) v
erify
that
fini
shes
con
tain
ing
Tin
(Sn)
hav
e a
min
imum
of 3
% le
ad (P
b) b
y w
eigh
t per
MIL
-PR
F-38
534.
4/ D
elta
R s
hall
not e
xcee
d +/
-0.5
% a
fter
com
plet
ion
of te
st(s
), un
less
oth
erw
ise
spec
ified
in a
cqui
sitio
n do
cum
ent.
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 17 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLESSu
bgro
up
Clas
s Te
st
Stan
dard
or
Spec
ifica
tion
Met
hod
Cond
ition
Co
mm
ents
Q
uant
ity
(acc
ept n
umbe
r)
Ref
eren
ce
Para
grap
h M
IL-P
RF
-38
534
K
H
1 X
X El
emen
t Ele
ctric
al
MIL
-PR
F-3
8534
25
C Pe
r Aqu
isiti
on
Doc
umen
t 10
0%
C.3.
4.1
2 X
X D
evic
e Fi
nish
2/
M
IL-S
TD-8
83
2037
Fo
r ter
min
atio
ns
cont
aini
ng S
n 5
(0)
X Vi
sual
Insp
ectio
n M
IL-S
TD-8
83
2032
10
0%
C.3.
4.2
X 22
(0)
3 X
Ref
low
Con
ditio
ning
M
IL-P
RF
-553
65
Para
. 4.7
.10
100%
X Th
erm
al S
hock
(U
nmou
nted
) M
IL-S
TD-2
02
Test
Met
hod
107
A 3/
-5
5 to
125
C, 5
cy
cles
10
0%
X Su
rge
Curr
ent (
SC)
MIL
-PR
F-5
5365
Pa
ra. 4
.7.1
8 C
100%
X W
eibu
ll FR
L G
radi
ng
MIL
-PR
F-5
5365
Pa
ra. 4
.7.2
0 C
Ret
ain
test
re
sults
Rea
d &
R
ecor
d D
ata
100%
X D
C Le
akag
e M
IL-P
RF
-553
65
Para
. 4.7
.6
100%
X 10
(0)
See
foot
note
s at
end
of t
able
.
Tab
le D
: cH
ip c
apac
iTo
rS,
So
liD
Tan
Talu
m
(Tab
le C
-III-2
of M
IL-P
RF-
3853
4 L)
1/ Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 18 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLES
Tab
le D
: cH
ip c
apac
iTo
rS,
So
liD
Tan
Talu
m (c
on
Tin
ueD
) 1/
(Tab
le C
-III-2
of M
IL-P
RF-
3853
4 L)
Subg
roup
Cl
ass
Test
St
anda
rd o
r Sp
ecifi
catio
n M
etho
d Co
nditi
on
Com
men
ts
Qua
ntity
(a
ccep
t num
ber)
R
efer
ence
Pa
ragr
aph
MIL
-PR
F-
3853
4 K
H
3 X
Capa
cita
nce
MIL
-PR
F-5
5365
an
d
MIL
-STD
-202
Para
. 4.7
.7
305
Ret
ain
test
re
sult
s R
ead
&
Rec
ord
Dat
a
100%
X 10
(0)
X D
issi
patio
n Fa
ctor
M
IL-P
RF
-553
65
Para
. 4.7
.8
100%
X 10
(0)
X ES
R
MIL
-PR
F-5
5365
Pa
ra. 4
.7.1
4 10
0%
X 10
(0)
X +
3 si
gma
cull
requ
ired
for D
F, E
SR, D
C Le
akag
e
MIL
-PR
F-5
5365
M
IL-P
RF
-553
65
1.2.
1.6
Tabl
e III
R
emov
e pa
rts
that
fail
+3
sigm
a cu
ll.
100%
4 X
Rad
iogr
aphi
c In
spec
tion
MIL
-PR
F-5
5365
Pa
ra. 3
.5
100%
5 X
Stab
ility
at l
ow a
nd h
igh
tem
pera
ture
M
IL-P
RF
-553
65
Para
. 3.1
9 22
(0)
6 4/
X
X W
ire B
ond
Eval
uatio
n M
IL-S
TD-8
83
2011
Fo
r wire
bon
ding
ap
plic
atio
ns
10 (0
) wire
s or
20
(1) w
ires
C.3.
4.3
C.3.
4.6
X X
Sold
erab
ility
M
IL-S
TD-2
02
208
For s
olde
ring
appl
icat
ions
5(
0)
X D
estr
uctiv
e Ph
ysic
al
Anal
ysis
M
IL-S
TD-1
580
5 (0
)
7 X
Life
Tes
t M
IL-P
RF
-553
65
Para
. 4.7
.19
Per T
able
VI
2000
Hrs
at 1
25C
24 (1
)
1/ F
or C
lass
H h
ybrid
dev
ices
, ele
men
t eva
luat
ion
in a
ccor
danc
e w
ith th
is ta
ble
is n
ot r
equi
red
for
capa
cito
rs th
at a
re c
ompl
iant
to M
IL-P
RF-
5536
5 an
d ar
e lis
ted
on th
e Q
PL. F
or C
lass
K
hybr
ids,
ele
men
t eva
luat
ion
in a
ccor
danc
e w
ith th
is ta
ble
is n
ot r
equi
red
for
capa
cito
rs p
rocu
red
as Q
PL M
IL-P
RF-
5536
5 pr
oduc
t lev
el T
or
prod
uct l
evel
M w
ith m
inim
um W
eibu
ll FR
L C
com
bine
d w
ith s
urge
cur
rent
opt
ion
C.2/
Usi
ng a
rec
ogni
zed
met
hodo
logy
(e.g
. met
hod
2037
of M
IL-S
TD-8
83, J
ESD
-213
) ve
rify
that
fini
shes
con
tain
ing
Tin
(Sn)
hav
e a
min
imum
of 3
% L
ead
(Pb)
by
wei
ght p
er M
IL-P
RF-
3853
4.
Dev
ice
finis
h te
st m
ay b
e co
nduc
ted
by h
ybrid
man
ufac
ture
r up
on r
ecei
pt o
f com
pone
nts.
Dev
ice
finis
h te
st m
ay b
e co
nduc
ted
follo
win
g vi
sual
insp
ectio
n at
the
disc
retio
n of
the
capa
cito
r m
anuf
actu
rer.
3/ M
etho
d 10
7 of
MIL
-STD
-202
Con
ditio
n A
mod
ified
to a
djus
t upp
er te
mpe
ratu
re li
mit
to +
125
4/ S
ubgr
oup
6 te
sts
may
be
cond
ucte
d in
any
ord
er.
4/ S
ubgr
oup
6 te
sts
may
be
cond
ucte
d in
any
ord
er.
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 19 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLES
Tab
le e
: co
ilS,
Tr
anSf
or
mer
S
Subg
roup
Cl
ass
Test
St
anda
rd o
r Sp
ecifi
catio
n M
etho
d Co
nditi
on
Com
men
ts
Qua
ntity
(acc
ept n
umbe
r)
Ref
eren
ce
para
grap
h M
IL-P
RF
-38
534
K
Clos
ed
K
Ope
n 1/
H O
pen
and
Clos
ed
1/
1 X
X X
Elem
ent
Elec
trica
l Ac
quis
ition
D
ocum
ent
25°C
10
0%
C.3.
4.1
2 X
X Vi
sual
In
spec
tion
MIL
-STD
-88
3 an
d M
IL-
STD
-981
2032
M
IL-S
TD-9
81:
5.5.
3, 5
.5.9
, 5.5
.12
100%
C.
3.4.
2
X Vi
sual
In
spec
tion
MIL
-STD
-88
3 20
32
22(0
)
3 X
Tem
pera
ture
Cy
cle
MIL
-STD
-88
3 10
10
C 10
cyc
les
10(0
) C.
3.4.
3
X M
echa
nica
l Sh
ock
or
Cons
tant
Ac
cele
ratio
n 2/
MIL
-STD
-88
3 20
02
B
Y1 d
irect
ion
10(0
)
2001
A
Y1 d
irect
ion
X B
urn
-In
MIL
-STD
-98
1 Se
ctio
n 5.
6.7.
3.4
Clas
s S
T =
Max
Rat
ing,
96
hrs,
Max
Loa
d 10
(0)
X X
X Vi
sual
In
spec
tion
MIL
-STD
-88
3 an
d M
IL-
STD
-981
2032
M
IL-S
TD-9
81:
5.5.
3, 5
.5.9
, 5.5
.12
10(0
) C.
3.4.
3 C.
3.4.
5
X X
X El
emen
t El
ectri
cal
Acqu
isiti
on
Doc
umen
t 10
(0)
C.3.
4.3
C.3.
4.4
See
foot
note
s at
end
of t
able
.
(Tab
le C
-III-4
of M
IL-P
RF-
3853
4 L)
Tabl
e E
appl
ies
to p
urch
ased
mag
netic
s. It
doe
s no
t app
ly to
mag
netic
s m
ade
in-h
ouse
by
Cran
e w
hich
are
mad
e on
a q
ualif
ied
line
and
do n
ot r
equi
re a
dditi
onal
Ele
men
t Eva
luat
ion.
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
AppLICATION NOTE fOR INTERpOINT® pRODUCTS
Page 20 of 21APP-009 Rev AN - 2021.03.29
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APPENDIX A - ELEMENT EVALUATION TABLES
Tab
le e
: co
ilS,
Tr
anSf
or
mer
S (c
on
Tin
ueD
)
(Tab
le C
-III-4
of M
IL-P
RF-
3853
4 L)
Tabl
e E
appl
ies
to p
urch
ased
mag
netic
s. It
doe
s no
t app
ly to
mag
netic
s m
ade
in-h
ouse
by
Cran
e w
hich
are
mad
e on
a q
ualif
ied
line
and
do n
ot r
equi
re a
dditi
onal
Ele
men
t Eva
luat
ion.
Subg
roup
Cl
ass
Test
St
anda
rd o
r Sp
ecifi
catio
n M
etho
d Co
nditi
on
Com
men
ts
Qua
ntity
(acc
ept n
umbe
r)
Ref
eren
ce
para
grap
h M
IL-P
RF
-38
534
K
Clos
ed
K
Ope
n 1/
H O
pen
and
Clos
ed
1/
4 3/
X
X X
Dev
ice
Fini
sh
MIL
-STD
-88
3 or
JES
D
213
2037
N
ot re
quire
d fo
r co
mpo
nent
s th
at
cont
ain
no s
olde
r or
tin (e
.g.,
ferr
ite
mag
netic
s w
ith
copp
er w
ires)
.
5(0)
X X
X W
ire
bond
abili
ty
MIL
-STD
-88
3 20
11
Whe
re A
pplic
able
H
-5(0
) K
-10(
0) o
r 20(
1)
C.3.
4.3
C.3.
4.6
X X
X So
lder
abili
ty
MIL
-STD
-88
3 20
03
Whe
re A
pplic
able
H
-2(0
), K
-5(0
)
X X
X Te
rmin
al
Stre
ngth
M
IL-S
TD-
981
Para
. 5.
6.7.
4 W
here
App
licab
le
H-2
(0),
K-5
(0)
C.3.
4.6
1/M
agne
tic e
lem
ents
bui
lt in
hou
se b
y th
e hy
brid
man
ufac
ture
r m
ay b
e te
sted
per
the
Clas
s K
ope
n co
nstr
uctio
n re
quire
men
ts o
r Cl
ass
H r
equi
rem
ents
, as
appl
icab
le. E
lem
ents
mus
t be
qual
ified
with
the
hybr
id a
nd n
ot m
anuf
actu
red
for
sale
as
a se
para
te q
ualif
ied
com
pone
nt. C
onst
ruct
ion
tech
niqu
es a
nd m
ater
ials
mus
t mee
t or
exce
ed th
at o
f MIL
-STD
-981
(whe
re
appl
icab
le).
2/Ei
ther
test
met
hod
is a
ccep
tabl
e.3/
Gro
up 4
test
s m
ay b
e co
nduc
ted
in a
ny o
rder
.
Crane Aerospace & Electronics Power Solutions
Quality Assurance and Certification
Quality Assurance and Certification APP-009 Rev AN - 2021.03.29 All information is believed to be accurate, but no responsibility is assumed for errors or omissions. Crane Electronics, Inc. reserves the right to make changes that do not affect form, fit or function of Class H or K products or specifications without notice. Interpoint is a registered trademark of Crane Co. The product series names are trademarks of Crane Electronics, Inc. Copyright © 1999 - 2021 Crane Electronics, Inc. All rights reserved. www.craneae.com/interpoint
Page 21 of 21
AppLICATION NOTE fOR INTERpOINT® pRODUCTS