Pvel Pan File 111013

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PV Modules are rated under standard test conditions (STC), yet rarely operate under those conditions in the eld. PAN les describe module performance under a wide range of environmental conditions, and serve as the basis for PVSyst performance forcasting models - the standard forecasting software in the industry. PAN les are only as accurate as the measurement data used to generate them. PVEL PAN les are based on precise measurements over a wide range of operating conditions. PAN File Generation PVEL measures PV module performance at irradiances and temperatures per IEC 61853-1. Table 2 of IEC 61853-1, reproduced below, outlines the performance measurement metrics used in PVEL’s PAN le development. reduce uncertainty with better data. During performance measurements, temperature uniformity in a given sample is within 2 ˚C across the three measurement locations dened in Figure 1 of IEC 61853-1. In addition to these measurements, a sophisticated combination of methods outlined in IEC 60891 and IEC 60853 help maintain data integrity and bolster result condence. LIGHT-INDUCED DEGRADATION All modules used in PAN le development are light-soaked to achieve full light-induced degradation (LID) prior to performance measurements. In the LID protocol, the modules are initially ash tested at STC. The modules are then exposed to outdoor sunlight until they are stabilized. Irradiance (W m -2 ) Module Temperature 15 ˚C 25 ˚C 50 ˚C 75 ˚C 1100 NA 1000 800 600 400 NA 200 NA NA 100 NA NA Table 2 of IEC 61853-1, I SC , P MAX  , V OC  , and V MAX  versus irradiance and temperatu re PV Evolution Lab’s (PVEL) PAN les reduce energy model uncertainty, lower risk of plant underperformance caused by misrepresentations in the e nergy model, and improve performance testing margins. PVEL can provide a direct upload of the les into the PVSyst database— the strongest PAN le offering in the industry.

description

PAN

Transcript of Pvel Pan File 111013

  • PV Modules are rated under standard test conditions (STC), yet rarely operate under those conditions in the field. PAN files describe module performance under a wide range of environmental conditions, and serve as the basis for PVSyst performance forcasting models - the standard forecasting software in the industry. PAN files are only as accurate as the measurement data used to generate them.

    PVEL PAN files are based on precise measurements over a wide range of operating conditions.

    PAN File Generation

    PVEL measures PV module performance at irradiances and temperatures per IEC 61853-1. Table 2 of IEC 61853-1, reproduced below, outlines the performance measurement metrics used in PVELs PAN file development.

    reduce uncertainty with better data.

    During performance measurements, temperature uniformity in a given sample is within 2 C across the three measurement locations defined in Figure 1 of IEC 61853-1. In addition to these measurements, a sophisticated combination of methods outlined in IEC 60891 and IEC 60853 help maintain data integrity and bolster result confidence.

    LIGHT-INDUCED DEGRADATION All modules used in PAN file development are light-soaked to achieve full light-induced degradation (LID) prior to performance measurements. In the LID protocol, the modules are initially flash tested at STC. The modules are then exposed to outdoor sunlight until they are stabilized.

    Irradiance (Wm-2) Module Temperature15 C 25 C 50 C 75 C

    1100 NA

    1000

    800

    600

    400 NA200 NA NA100 NA NA

    Table 2 of IEC 61853-1, ISC , PMAX , VOC , and VMAX versus irradiance and temperature

    PV Evolution Labs (PVEL) PAN files reduce energy model uncertainty, lower risk of plant underperformance caused by misrepresentations in the energy model, and improve performance testing margins.

    PVEL can provide a direct upload of the files into the PVSyst databasethe strongest PAN file offering in the industry.

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