8

Tuesday – 4 JULY

5 Building, CONFERENCE HALL

10:00 – 11:00 PARTICIPANT REGISTRATION

11:00 – 11:10 WELCOME SPEECH by EMC Compo TPC (Etienne Sicard)

11:10 – 11:20 WELCOME SPEECH by ETU (Mikhail Shestopalov)

11:20 – 12:20 KEYNOTE SPEECH by Prof. Alex Yakovlev, by Prof. Milos Krstic

(in cooperation with Xin Fan, Milan Babic, Eckhard Grass, Tobias Bjerregaard)

Reducing Switching Noise Effects by Advanced Clock Management

12:20 – 13:00 Technical section «EMC-aware Design and Guidelines»

Lammert Duipmans, Dusan Milosevic, Arnoud van der Wel, Peter Baltus

Identifying EMC-Critical Devices by Monitoring and Classifying Operating Region Transitions

Alexandre Martorell, Jeremy Raoult, Robin Marijon, Laurent Chusseau

EMI Functional Vulnerability Identification in RF Front-Ends

13:00 – 14:00 LUNCH

14:00 – 15:20 Technical section «EMC of Digital ICs»

Chaimae Ghfiri, Alexandre Boyer, Andre Durier, Sonia Ben Dhia

Methodology of Modeling of the Internal Activity of a FPGA for Conducted Emission Prediction Purpose

Paulo R.C. Villa, Roger C. Goerl, Fabian Vargas, Nilberto Heder Medina, Nemitala Added, Vitor A. P. De Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei A. G. Da Silveira, Eduardo Bezerra, Leticia Poehls

Analysis of ProASIC3 FPGA SEU-Sensitivity to Combined Effects of Conducted-EMI and TID

Mario Auer and Timucin Karaca Digitally Assisted EMI-Reduction Techniques for Class-D Amplifiers with Digital Control

Bernd Deutschmann, Bernhard Auinger, Gunter Winkler

Spread Spectrum Parameter Optimization to Suppress Certain Frequency Spectral Components

15:20 – 15:40 COFFEE BREAK

15:40 – 16:20 Technical section «Materials for Improved EMC of ICs»

Masahiro Yamaguchi, Yasushi Endo, Peng Fan, Jingyan Ma, Satoshi Tanaka, Yasunori Miyazawa, Makoto Nagata

Analysis of Patterned Magnetic Thin-Film Noise Suppressor for RF IC Chip

Bumhee Bae, Sukjin Kim, Youngkun Kwon, Hyunggeun Kim, Sunkyu Kong, Joungho Kim, Harkbyeong Park

Shielding Effectiveness of Noise Coupling on Analog-to-Digital Converter in Magnetic Field Wireless Power Transfer System

16:30 – 17:30 Visit to the A. Popov's Laboratory & Apartment Museum

17:30 – 20:00 Welcome reception

Wednesday – 5 JULY

5 Building, CONFERENCE HALL

10:00 – 11:20 Technical section «EMC of Transceiver ICs»

Matthieu Deloge, Jaume Tornila Oliver, Hans Brekelmans, Peter Vermeeren, Gert Jan Bollen, Arnoud van der Wel, Gerald Kwakernaat, Adrien Schoof

A Time-Continuous Bus-Feedback LIN Transceiver in 0.14 мm High-Voltage SOI CMOS

Kohki Taniguchi, Makoto Nagata,

Akihiro Tsukioka,

Daisuke Fujimoto, Noriyuki Miura,

Takao Egami, Rieko Akimoto,

Kenji Niinomi, Terumitsu Komatsu,

Yoshinori Fukuba,

Atsushi Tomishima

Susceptibility Evaluation of CAN Transceiver Circuits with In-Place Waveform Capturing under RF DPI

Kamel Abouda, Adrien Doridant,

Bertrand Vrignon,

Nicolas Baptistat,

Matthieu Aribaud

Improving Electro-Magnetic Susceptibility Performances

of High Side Switches: Case of High Side of LIN

Physical Layers

M. Burak Baran, Hugo Pues,

Kristof Stijnen, Wim Dehaene

EMI Resisting Low-EME SENT Drivers in 0.18мm

CMOS

11:20 – 11:40 COFFEE BREAK

11:40 – 13:00 Technical section «EMC of Power Devices and Systems»

Alexandre Boyer,

Manuel Gonzalez Sentis,

Chaimae Ghfiri, Andre Durier

Modeling Methodology of the Conducted Emission

of a DC-DC Converter Board

Alexandre Boyer,

Manuel Gonzalez Sentis,

Chaimae Ghfiri, Andre Durier

Study of the Thermal Aging Effect on the Conducted

Emission of a Synchronous Buck Converter

Volha Subotskaya,

Emanuele Bodano,

Bernd Deutschmann

Adaptive Current Source Driver for High-Frequency

Boost Converter

Raul Blecic, Josip Bacmaga,

Renaud Gillon, Bart Nauwelaers,

Adrijan Baric

EMC-Oriented Design of Output Stage of Synchronous

Buck Converter

13:00 – 14:00 LUNCH

14:00 – 15:00 KEYNOTE SPEECH by Prof. Victor Luchinin

(in cooperation with Alexey Afanasjev, Anatoly Petrov and Vladimir Ilyin)

Family of Micro Key Based on SiC for Extreme Conditions and Duty

15:00 – 15:20 COFFEE BREAK

15:20 – 17:00 Technical section «Semiconductor Device Modelling»

Vitaliy Vitko, Andrey Nikitin,

Alexey Ustinov, Boris Kalinikos

Theory of Optoelectronic Oscillators Based on Serially

Coupled Multiple Micro-Ring Resonators

Irina Ustinova, Andrey Nikitin,

Alexey Ustinov, Boris Kalinikos

and Erkki Lahderanta

Logic Gates Based on Multiferroic Microwave

Interferometers

Anatoly Dudin, Ilya Kogan,

Georgiy Yakovlev,

Maria Mironova, Igor Schukov,

Dmitriy Frolov, Vasiliy Zubkov,

Gennadii Glinskii

Simulation and Characterization of

AlGaAs/InGaAs/GaAs pHEMT Structures with Quantum

Wells for SHF Integrated Circuits

Nikita Permiakov,

Anton Evseenkov, Sergey Tarasov,

Alexander Solomonov,

Vyacheslav Moshnikov,

Ivan Lamkin

Detection Methods of Intense Areas and Identification

of the Reasons of HEMT Transistors Failure

Vladimir Tikhomirov,

Aleksandr Gudkov, Victor Petrov,

Svetlana Agasieva, Andrei Zybin,

Viktor Yankevich, Anton Evseenkov

Simulation of Electric Field Distribution in GaN HEMTs

for the Onset of Structure Degradation

17:00 – 19:00 Visit to ETU CMID Research Center Laboratories

Thursday – 6 JULY

5 Building, CONFERENCE HALL

10:00 – 11:00 Technical section «Near Field Scan Methods for ICs»

Bertrand Vrignon, Kamel Abouda,

Adrien Doridant, Nicolas Baptistat

Time-Domain Measurements Using Near Field Scanning

Method for Fast Transient Current Reconstruction

Nicolas Lacrampe,

Sebastien Serpaud,

Alexandre Boyer, Sereirath Tran

Radiated Suceptibility Investigation of Electronic Board

from Near Field Scan Method

Massiva Zouaoui, Etienne Sicard,

Henri Braquet, Ghislain Rudelou,

Emmanuel Marsy

and Gilles Jacquemod

Impact of NFSI on the Clock Circuit of a Gigabit

Ethernet Switch

11:00 – 11:20 COFFEE BREAK

11:20 – 13:00 Technical section «ESD Modelling and Analysis»

Thomas Ungru,

Wolfgang Wilkening, Renato Negra

Influence of ESD on an Integrated Shift Register

in Operation

Niels Lambrecht, Hugo Pues,

Daniel De Zutter,

Dries Vande Ginste

Circuit Modeling of the ISO 10605 Field Coupled

Electrostatic Discharge Test to Design Robust

Automotive Integrated Circuits

Friedrich Zur Nieden,

Lena Zeitlhofler, Kai Esmark,

Reinhold Gartner

Characterization of a 1-Pin Stress ESD Testing Method

for the Analysis of Nanosecond-Range Charging Effects

Tohlu Matsushima, Mayumi Aoki,

Takashi Hisakado, Osami Wada

Equivalent Circuit Model with Nonlinear Characteristics

of Zener Diode Extracted from SPICE Model for ESD

Simulation

Mario Rotigni, Mauro Merlo,

Martina Cordoni, Paolo Colombo,

Valentino Liberali

Conducted Emissions in a 40 nm CMOS Test Chip: The

Role of ESD Protections

13:00 – 14:00 LUNCH

14:00 – 15:20 Technical section «Measurement and Modelling of IC EMC»

Anna Richelli, Luigi Colalongo,

Lorenzo Toninelli, Ion Rusu,

Jean-Michel Redoute

Measurements of EMI Susceptibility of Precision Voltage

References

Pierre Payet, Jeremy Raoult,

Laurent Chusseau

Disruption of a RF Front-End Subject to a Out-of-Band

Signal

Sebastien Serpaud, Alexandre

Boyer, Chaimae Ghfiri and Andre

Durier

Proposal for Combined Conducted and Radiated

Emission Modeling for Integrated Circuit

Andrea Lavarda,

Bernd Deutschmann, Haerle Dieter

Enhancement of the DPI Method for IC Immunity

Characterization

15:20 – 15:30 COFFEE BREAK

15:30 – 16:30 Poster Session

Alexander Chupakhin,

Volodymyr Pilinsky,

Oleg Petrischev

The method of determination the level of lowfrequency

interference induced by ferromagnetic component

on the PCB

Hyun Ho Park, Keonyoung Seo,

Young-Kun Kwon,

Hark-Byeong Park

Numerical Analysis of Conformal Shields for Chip and

Package Shielding

Binhong Li, Jiantou Gao, Bo Li,

Zhengsheng Han, Jiajun Luo,

Jianfei Wu, Wei Zhu

Impact of DSOI Back-Gate Biasing on Circuit Conducted

Emission

Jianfei Wu, Haiyan Ma, Hongli

Zhang, Binhong Li, H. Wang

and Liming Zheng

DPI Immunity of Bandgap in SI and SOI Technologies

Tvrtko Mandic, Renaud Gillon,

Adrijan Baric

An Experimental Investigation of Four-Port IC-Stripline

Michael Fuchs Design of an EMC Test Board for Analog-to-Digital

Converters

Taras Kustov, Semen Grin,

Sakhaya Burnasheva

Efficiency Improvement Means for Operation of Linear

Photo Detector Controller Based on CCD Line

Shih-Yi Yuan, Jia-Wei Chen,

Ming-Shan Lin, Jian-Li Dong

Application-specific Near Field EMI Estimation on Time-

Sharing Operating System

Valerio M. Salles,

Luiz C. Kretly

Guidelines to Establish Design and Simulation of AC-

Clocked Power Supply in Digital CVSL Circuits:

the Base to Implement Complex Sequential Circuits

Leslie Bai Test Methods For 2.4GHz ISM Data Transmission

Equipment Compliant with EU Regulations

Bogdan Vasiliev,

Viacheslav Zyrin

Analysis of Electromagnetic Compatibility for Two-Level

Frequency Converter with the Electric Motor and Power

Quality at the Inverter Output

Bogdan Vasiliev, Viacheslav Zyrin Power Flow Research and Electromagnetic Compatibility

between Frequency Converter and Electric Motor

17:00 DEPARTURE TO THE SOCIAL EVENT

18:00 – 21:00 CONFERENCE SOCIAL EVENT

Friday – 7 JULY

5 Building, CONFERENCE HALL

11:00 – 12:00 Technical section «Computational Electromagnetics

for IC level EMC»

Vadim Goncharov, Eugene Fiskin,

Rostislav Yashkardin,

Konstantin Sorokin

Method of Calculating of Random Shaped

Electromagnetic Impulse Flowing through Conducting

Structures

Zhifei Xu, Yang Liu, Blaise Ravelo,

Olivier Maurice

Modified Kron's TAN Modeling of 3D Multilayer PCB

Sergey Miropolsky, Stefan Jahn,

Frank Klotz

EM Field Solver Modelling of the Floating EUT Module

Boards in Automotive EMC Test Setups

12:00 CLOSING SPEECH by Etienne Sicard

12:10 CLOSING SPEECH by Mikhail Shestopalov