Plan to Attend OPTIFAB - SPIEby the Fraunhofer-Institute Photonic Microsystems (IPMS) at Dresden,...

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CONNECTING MINDS. ADVANCING LIGHT. OPTIFAB Rochester Riverside Convention Center Rochester, New York, USA Exhibition: 17–19 October 2017 Conference and Courses: 16–19 October 2017 www.spie.org/ofb17program HEAR THE LATEST RESEARCH AND SEE THE NEWEST PRODUCTS AT NORTH AMERICA’S PREMIER OPTICAL FABRICATION SHOW Plan to Attend PROGRAM CURRENT AS OF 19 June 2017 Sponsored by: Co-sponsored by:

Transcript of Plan to Attend OPTIFAB - SPIEby the Fraunhofer-Institute Photonic Microsystems (IPMS) at Dresden,...

Page 1: Plan to Attend OPTIFAB - SPIEby the Fraunhofer-Institute Photonic Microsystems (IPMS) at Dresden, where he is working in the field of sensors. Since 2000 he was group manager and responsible

CONNECTING MINDS. ADVANCING LIGHT.

OPTIFABRochester Riverside Convention Center Rochester, New York, USA

Exhibition: 17–19 October 2017

Conference and Courses: 16–19 October 2017

www.spie.org/ofb17program

HEAR THE LATEST RESEARCH AND SEE THE NEWEST PRODUCTS AT NORTH AMERICA’S PREMIER OPTICAL FABRICATION SHOW

Plan to Attend

PROGRAM CURRENT AS OF 19 June 2017

Sponsored by: Co-sponsored by:

Page 2: Plan to Attend OPTIFAB - SPIEby the Fraunhofer-Institute Photonic Microsystems (IPMS) at Dresden, where he is working in the field of sensors. Since 2000 he was group manager and responsible

One Week Many Opportunities

Cutting-Edge Research and CoursesBIOS

The largest biophotonics, biomedical optics, and imaging conference.

LASE The laser source technologies, industrial lasers, and applications conference.

OPTO The optoelectronics and photonic materials and devices conference.

Exhibitions and Sessions for IndustryBIOS EXPO

The world’s largest biomedical optics and biophotonics exhibition.

PHOTONICS WEST EXHIBITION The flagship event for companies in the photonics industry.

INDUSTRY EVENTS Business information and networking sessions that range from

engineering workshops to executive panels.

Training and EducationTake advantage of face-to-face instruction from some

of the biggest names in industry and research.

Networking EventsValuable opportunities every day of the conference:

hot topics and plenary sessions plus an array of special, networking, and technical events to connect you with your collegues.

OPTIFAB 2017Hear the latest research and see the newest products at North America’s premier optical fabrication show

Conferences & Courses: 16–19 October 2017Exhibition: 17–19 October 2017

Rochester Riverside Convention Center Rochester, New York, USA

Join us in RochesterA UNIQUE FORMAT WITH

RESEARCH AND INDUSTRY THAT LETS YOU HEAR RESULTS AND GAIN VALUABLE INSIGHT

INTO THE OPTICAL FABRICATION MARKET 180-COMPANY EXHIBITION

TRAINING AND EDUCATION

REGISTER TODAY

www.spie.org/ofb17program

CONNECTING MINDS. ADVANCING LIGHT.

Rochester Riverside Convention Center · Rochester, New York, USA

Exhibition: 17–19 October 2017 Conferences + Courses: 16–19 October2017

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Register Today: www.spie.org/ofb17program

Rochester Riverside Convention Center · Rochester, New York, USA

Exhibition: 17–19 October 2017 Conferences + Courses: 16–19 October2017

Learn · Connect · Do Business

Everything you need to know about the meeting, the Rochester Riverside Convention Center,

and the city is online • Up-to-date paper listings and session times

• Exhibiting companies and activity on the show floor

• Hotel, travel, and complete registration information

• Information on driving and parking during exhibition days

• Schedule your week: MySchedule Tool and phone apps

Reserve hotel rooms by: 21 SEPTEMBER 2017Registration rates increase after: 29 SEPTEMBER 2017

PROGRAM CURRENT AS OF: 19 June 2017

CO-SPONSORED BY

The American Precision Optics Manufacturers Association represents a broad constituency of precision optics manufacturers, and the supporting industry along with academic associates, whose mutual interest is the advancement and expansion of optics manufacturing and technology.

www.APOMA.org

SPONSORED BY

SPIE is the international society for optics and photonics, an educational not-for-profit organization founded in 1955 to advance light-based science and technology.

www.SPIE.org

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2 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

Plan to attend SPIE Optifab— where the latest information is presented.

DAILY SCHEDULE . . . . . . . . . . . . . . . page 9

PROCEEDINGS . . . . . . . . . . . . . . . . page 28

GENERAL INFORMATION . . pages 24–26

Registration · Author/Presenter Information · Policies · Food and Beverage · Onsite Services · Parking and Car Rental

SPIE POLICIES . . . . . . . . . . . . . pages 30–31

Download the SPIE Conference App

Technical Conferences . . . . . p. 12–16Made up of a unique blend of research-oriented and commercial presentations, the Optifab Technical Program gives you access to the latest research results and product breakthroughs.

Plenary Sessions . . . . p. 4Don’t miss these world-class speakers on the latest advancements and most promising breakthroughs.

Special Events . . . . . . p. 5These important events and sessions will provide valuable information and networking opportunities.

Industry Events . . . . . p. 6

World-Class Exhibition . . . . . . . . p. 10–11Come walk the floor at North America’s largest optical fabrication exhibition. Take advantage of this valuable opportunity to learn new methods, improve your processes, cut costs, and discuss your requirements face-to-face.

Courses . . . . . . . . . p. 18–23Get training that you can apply directly to your daily work. Learn from the best instructors in the industry.

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3Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

The #1 Optical Fabrication Event in North AmericaMake your plans now to attend Optifab, the largest optical manufacturing conference and exhibition held in the United States.

With a unique technical focus on classical and advanced optical manufacturing technologies, Optifab offers conference attendees an exceptional opportunity to interact with worldwide experts in the field of optical fabrication. We invite you to actively participate in the technical program by joining us for Optifab 2017.

The exhibition is the largest optical fabrication show in North America. Come see over 180 leading companies. This is a valuable opportunity to learn, improve your processes, and make key business connections.

We encourage you to join us this fall in Rochester.

Julie Bentley Univ. of Rochester (USA)

CONFERENCE CHAIR CONFERENCE CO-CHAIR

Sebastian StoebenauOptoTech Optikmaschinen GmbH (Germany)

PROGRAM COMMITTEETom Godin, Satisloh North

America Inc. (USA)Heidi Hofke, OptoTech Optical

Machinery Inc. (USA)Jay Kumler, JENOPTIK Optical

Systems, Inc. (USA)Justin J. Mahanna, Universal

Photonics Inc. (USA)Michael Marcus, Lumetrics

(USA)Paul Meier-Wang, AccuCoat Inc.

(USA)Ted Mooney, ITT Exelis (USA)Michael N. Naselaris, Sydor

Optics, Inc. (USA) Richard Nastasi, Universal

Photonics Inc. (USA)

John J. Nemechek, Metrology Concepts LLC (USA)

Buzz Nesti, Naked Optics Corp. (USA)

Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany)

Paul R. Tolley, Smart System Technology & Commercialization Ctr. (USA)

Blair Unger, Rochester Precision Optical (USA)

Martin J. Valente, Arizona Optical Systems, LLC (USA)

Kirk J. Warden, LaCroix Optical Co. (USA)

Robert Anton Wiederhold, Optimax Systems, Inc. (USA)

Thomas Battley, New York Photonics Industry Association (USA)

Michael J. Bechtold, OptiPro Systems (USA)

Christopher T. Cotton, ASE Optics (USA)

Walter C. Czajkowski, Edmund Optics, Inc. (USA)

Thomas Danger, Schneider GmbH & Co. KG (Germany)

Michael A. DeMarco, QED Technologies, Inc. (USA)

Apostolos Deslis, JENOPTIK Optical Systems, Inc. (USA)

Toshihide Dohi, OptiWorks, Inc. (Japan)

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4 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

PLENARY SESSION AND AWARD PRESENTATION

Special Events

Presentation of the 2016 Rudolf Kingslake Medal and Prize Tuesday 17 October 2017 • 8:00 to 9:55 am

8:00 to 8:10 am Peter de Groot, Zygo Corporation (United States)

The 2016 Rudolf Kingslake Medal and Prize is presented to Peter de Groot and James F. Biegen for their paper entitled “Interference microscope

objectives for wide-field areal surface topography measurements,” Opt. Eng. 55, 074110, published in the July 2016 issue of Optical Engineering.

8:10 to 8:45 am

Freeform Optics: current challenges for future serial production Christian Schindler, Carl Zeiss Jena GmbH

(Germany)

Abstract: One of the major develop-ments in the optics industry recently is the commercial manufacturing of freeform surfaces for optical mid- and high performance systems. The loss of limitation on rotational

symmetry enables completely new optical design solutions – but causes completely new challenges for the manufacturer too. Adapting the serial production from radial-symmetric to freeform optics cannot be done just by the extension of machine capabilities and software for every process step. New solutions for conventional optics productions or completely new process chains are necessary.

Biography: Christian Schindler is 33 years old and born in the near of Leipzig, Germany. He graduated in precision engineering and laser optical technologies in 2011 with a master thesis on freeform manufactur-ing in precision optics fabrication for Satisloh. During his time as student he worked for Fraunhofer IOF and Carl Zeiss AG. By entering the scientific field at EAH Jena within Prof. Bliedtners workgroup in 2011, he led research projects and formed an application center for micro machining with ultrashort pulsed lasers together with regional partners. Since 2016 he works for ZEISS as project manager in the field of development of optical manufacturing technologies.

8:45 to 9:20 am Concept for a new approach to realize complex optical systems in high volume

Heinrich Grüger, Fraunhofer-In-stitut für Photonische Mikrosys-teme (Germany)

Abstract: We have invented a new approach for the fabrication of off-axis optical systems using planar mounting in combination with a novel

folding principle. Lens based optics are limited by chromatic aberration. Applying mirrors helps to sup-press chromatic aberrations. Most tools for volume production apply stacking of components in planar technology but off-axis systems are assembled by manually alignment. The novel approach applies planar substrates featuring preprocessed bending lines. After placing the components the sides of the substrate are folded and the optical path is generat-ed. For proof of concept a camera has been realized from a 3D printed substrate successfully.

Biography: Heinrich Grüger was born in Würzburg, Germany in 1968. He studied physics at the University of Hannover where he specialized in plasma physics. From 1994 to 1998 he was employed by the Institute of Solid State and Materials Research (IFW) Dresden and the Technical University Dresden. He obtained his PhD in 1999 from the Technical University Dresden with a thesis on the plasma assisted deposition of carbon nitride thin films. In 1999 he was employed by the Fraunhofer-Institute Photonic Microsystems (IPMS) at Dresden, where he is working in the field of sensors. Since 2000 he was group manager and responsible for sensor system developments and since 2012 business unit manager “Sensors and Actu-ators Systems”. In 2016 he assigned the responsibility for the business unit and focused his engagement to scientific topics. He is author / coauthor of nu-merous papers, patents and several further patent applications.

9:20 to 9:55 To be announced

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Special Events

19th Annual Photonics ClambakeTuesday 17 October · 5:30 pm Location: Hyatt Ballroom TIckets are sold separately

Attendees and Exhibitors are welcome to attend. Limited space available. Reservations and payment form will be available early September. Invitations with additional information will be sent in late August. Contact Mike Naselaris, Sydor Optics, Inc. to be added to the invitation list: [email protected]

PRESENTED BY:

Networking Reception and Poster SessionWednesday 18 October 2017 • 4:30 to 6:00 pm Location: Empire HallSymposium attendees are invited to attend the Post-er/Networking Reception on Wednesday evening. Authors of poster papers will be present during the Poster Session to answer questions. The reception provides an opportunity for attendees to meet with colleagues, network, view poster papers, and interact with the authors. Refreshments will be served. Attendees are required to wear their conference badges to this session.

DAILY SCHEDULE Poster Set Up - Beginning at 10:00

Extended Poster Viewing from 10:00 to 4:30

Poster Session and Reception from 4:30 to 6:00 (with authors present)

POSTER AUTHOR SET-UP INSTRUCTIONS Paper numbers will be included on the poster boards in numerical order; please find your paper number and display your poster in the designated space. Authors are encouraged to display their posters early in the day for extended viewing. A poster author or coauthor is required to stand by the poster during the scheduled poster session to answer questions from attendees. Presenters who have not displayed their posters on their assigned board at least one-half hour before the interactive poster session begins will be considered a “no show”. Please remove posters at the end of the poster session. Posters not removed will be considered unwanted and will be discarded.

Student Travel Grants and Best Poster AwardsWednesday 18 October 2017 • 4:30 to 5:00 pmStudents interested in the optics industry can gain firsthand exposure to the industry’s largest manu-facturing conference and exhibition. APOMA is once again offering students a chance to participate in Optifab 2017 through travel grants and awards for outstanding student posters. Award winners will be chosen from the pool of qualified students.

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6 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

Industry Events

Job FairTuesday 17 October . . . . .10:00 am to 5:00 pmWednesday 18 October .10:00 am to 6:00 pmEmployers are looking for you for positions like optical engineering, military optics, software devel-opment and more. Stop by the SPIE Career Center Booth to learn more about the Job Fair, along with other ways to increase your chances of getting hired.  Let us help you find your dream job.  Register today for your chance to meet company recruiters at the Optifab Job Fair.

The Impact of Standards on Science, Technology, and Business in the World of OpticsWednesday 18 October 2017 • 3:00 to 4:30 pamWith the increasing importance of advanced imaging systems in aerospace and defense applications, a group of U.S. optical engineers and other scientists who manufacture, test, and use infrared materials have formed a working group to update standards for measuring optical material properties in the IR.  Panelists will discuss the impact that Standards have had on their technical and business operations. They will relate some personal experiences and take questions from the audience.

MODERATOR Allen Krisiloff Executive Director, Optics and Electro-Optics Stan-dards Council (OEOSC)

Training America’s Optics TechniciansThursday 19 October 2017 10:30 am to 12:00 noonThe global optics, photonics, and imaging industry is large and growing faster than the overall economy. This, coupled with industry reports that 20% of ex-perienced technicians and engineers are approaching retirement, is creating even greater need for skilled optics and photonics technicians. In fact, 75% of Up-state New York skilled optics technician job openings go unfilled annually due to an insufficient number of optics and photonics graduates.  Learn how Monroe Community College, the na-tion’s only community college awarding associate degrees in optics, is educating diverse optics and photonics technicians with the skills to meet the workforce needs.

SPEAKER Alexis Vogt Endowed Chair & Associate Pro-fessor Monroe Community College

Alexis KS Vogt, Ph.D. is Endowed Chair and Associate Professor of

Optics at Monroe Community College. In addition to teaching responsibilities, Dr. Vogt was appointed to her role at MCC in September 2015 to strengthen and grow the optics and photonics program – the nation’s oldest two-year degree program for training technicians to work in the optics and photonics indus-try. Dr. Vogt received her B.S. as well as her Ph.D. in Optics from the University of Rochester Institute of Optics where her research focused on polarization engineering, coherence theory, and microscopy. Prior to joining MCC, Dr. Vogt was the Applications & Business Development Manager at Melles Griot and previous to that, designed contact lenses and intraocular lenses for Bausch + Lomb. In addition to her industry experience, Dr. Vogt holds three patents and has authored numerous papers, presentations, and publications in the field, including the definitions of “light” and “polarization” for The World Book Ency-clopedia. She dedicates time to youth outreach and has been involved with coordinating and presenting optics demonstrations to children and educators both within the Rochester community and internationally. Dr. Vogt is recipient of the Rochester Business Journal 2016 “Forty Under 40” award recognizing individuals under the age of 40 who have achieved professional success and have made significant contributions to the Rochester community.

Don’t miss Alexis Vogt Course onFundamentals of Optical EngineeringSC1224 • Course Level: Introductory Wednesday 1:30 pm to 5:30 pmSee p. 23 for more information

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7Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

Many thanks to the following supporting organizations

CONFERENCE BAG INSERT FEATURED EXHIBITOR HOTEL KEY CARDS

LANYARDS GENERAL SPONSORS

PROMOTIONAL PARTNERS

Electro Optics Magazine Laser Focus World Optoindex

Photonics Media/Laurin Publishing Photonics Online The Optronics Co., Ltd.

Expand Your Network with SPIE Social Media.

#SPIEoptifab

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8 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

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MONDAY 16 October

TUESDAY 17 October

WEDNESDAY 18 October

THURSDAY 19 October

MORNING SESSIONSSESSION 1: Grinding and Polishing Processes I 8:00 to 10:00 am

SESSION 5: PLENARY PRESENTATIONS: Freeform Optics: current challenges for future serial production (Christian Schindler) 8:10 to 8:45 am

SESSION 9: Freeform Fabrication and Testing 8:00 to 10:00 am

SESSION 13: Optical Materials 8:00 to 10:00 am

Concept for a new approach to realize complex optical systems in high volume (Heinrich Grüger) 8:45 to 9:20 am

SC1169 Optical Manufacturing Fundamentals (Williamson) 8:30 am to 5:30 pm

SC863 Introduction to Modern Optical Drawings– the ISO 10110 Standard (Aikens) 8:30 am to 12:30 pm

SC1040 Geometric Dimensioning and Tolerancing (Prystaj) 8:30 am to 5:30 pm

SC015 Fastening Optical Elements with Adhesives (Daly) 8:30 am to 12:30 pm

SC1171 Seeing, Analyzing and Controlling Mid-Spatial Frequency (MSF) and Surface Roughness Errors on Optical Surfaces (DeGroote Nelson) 8:30 am to 12:30 pm

SC700 Understanding Scratch and Dig Specifications (Aikens) 8:30 am to 12:30 pm

EXHIBITION — Walk the floor and see the latest in optical fabrication technologies

10:00 am to 5:00 pm 10:00 am to 6:00 pm 10:00 am to 3:00 pm

JOB Fair 10:00 am to 5:00 pm

JOB Fair 10:00 am to 6:00 pm

Training America’s Optics Technicians (Alexis Vogt) 10:30 am to 12:00 noon

SESSION 2: Grinding and Polishing Processes II 10:30 am to 12:30 pm

SESSION 6: Optical Design and Engineering 10:30 am to 12:10 pm

SESSION 10: Metrology I 10:30 am to 12:10 pm

SESSION 14: Coating and Cleaning 10:30 am to 12:10 pm

Lunch Break

AFTERNOON SESSIONSSC1017 Optics Surface Inspection Workshop (Aikens) 1:30 to 5:30 pm

SC1003 Optical Scatter Metrology for Industry (Stover) 1:30 to 5:30 pm

SC1224 Fundamentals of Optical Engineering (Vogt) 1:30 to 5:30 pm

SESSION 3: Grinding and Polishing Processes III 1:30 to 3:30 pm

SC1114 The Proper Care of Optics: Cleaning, Handling, Storage and Shipping (Schalck) 1:30 to 5:30 pm

SESSION 7: Diamond Turning 1:40 to 3:20 pm

SESSION 11: Metrology II 1:40 to 3:00 pm

The Impact of Standards on Science, Technology, and Business in the World of Optics (Allen Krisiloff) 3:00 to 4:30 pm

SESSION 4: Additive Manufacturing 4:00 to 6:00 pm

SESSION 8: Molding 3:50 to 5:10 pm

SESSION 12: Metrology III 3:30 to 4:30 pm

19th Annual Photonics Clambake 5:30 pm

Networking Reception and Poster Viewing 4:30 to 6:00 pm

Daily Event Schedule

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10 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

Experience North America’s premier optical fabrication showCome walk the floor at North America’s largest optical fabrication exhibition. Your badge will give you access to over 180 leading companies, Take advantage of this valuable opportunity to learn new methods, improve your processes, cut costs, and discuss your requirements face-to-face.

OPTIFABEXHIBITION

EXHIBITION CHAIRS

Richard NastasiUniversal Photonics, Inc. (USA)

Michael NaselarisSydor Optics, Inc. (USA)

Justin J. MahannaUniversal Photonics, Inc. (USA)

TO LEARN MORE:

Get the most up-to-date information on SPIE Optifab, including travel, accommodations, and registration at:www.spie.org/ofb17program

EXHIBITION DAYS AND TIMESTuesday 17 October . . . . . . . . . . . . . . . . .10:00 am to 5:00 pmWednesday 18 October . . . . . . . . . . . . . .10:00 am to 6:00 pmPoster Reception/Networking . . . . . . . . 4:30 pm to 6:00 pmThursday 19 October . . . . . . . . . . . . . . . .10:00 am to 3:00 pm

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11Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

4D Technology Corp.AccuCoat Inc.Advance Reproductions Corp.Advanced Abrasives Corp.AMETEK Precitech, Inc.Andover CorporationAngstrom Precision Optics Inc.Applied Image, Inc.Apre Instrumentsasphericon, Inc.attocube systems Inc.Blackstone-NEY Ultrasonics, Inc.Bridger Photonics, Inc.Bruker Nano Surfaces, Inc.Buhler Inc.Carl Zeiss Industrial MetrologyCenterline TechnologiesChardon ToolChemetall Precision

MicrochemicalsComTec SolutionsContour Fine ToolingCorning IncorporatedCOTEC GmbHCryslaser Inc.DCM TechDiacut, Inc.Diffraction International Ltd.Displays & Optical Technologies,

Inc.Diverse Optics Inc.dopa diamond toolsDynamic Structures - OpticsDynaVacElectro Optics MagazineEMD Performance Materials

Corp.EMF Corp.Eminess Technologies, Inc.Empire Precision PlasticsEmpire West, Inc.Energetiq Technology, Inc.Engis CorporationET Precision Optics Inc.Ferrotec (USA) Corp.Fil-Tech Inc.FLIR Systems, Inc.Fujitok Corp.Gage-Line Technology, Inc.Glass Fab, Inc.GNP Ceramics, LLCG-S Plastic OpticsGuernsey Coating Laboratories,

Inc.Hentschel Harteloxal GmbH +

Co. KGHeraeus Tenevo LLCHinds Instruments, Inc.HIWIN Corp.

2017 EXHIBITORS View the latest list: www.spie.org/ofb17program

HOYA Corp. USAilis gmbhINOInternational Opto IndexIntlvac Thin FilmIRD GlassIsuzu Glass, Inc.JAYCO Cleaning TechnologiesJENOPTIK Optical Systems, LLCJML Optical Industries, LLCK&Y Diamond Ltd.Kaufman & Robinson, Inc.Kreischer Optics, Ltd.Kugler of America Ltd.LaCroix Precision OpticsLarsen Equipment Design, Inc.Laser Focus WorldM3 Measurement SolutionsMahrMaterials Science, Inc.Metrology ConceptsMeyer Burger (Germany) AGMicroCircuit Labs., LLCMicrodiamant USA, Inc.Micro-LAM Inc.Mindrum Precision, Inc.Mitsui Chemicals America, Inc.MLOptic Corp.Moore Nanotechnology

Systems, LLCNaked Optics Corp.NavitarNGL Cleaning IncNiabraze, LLCNorth American Coating Labs.nPoint, Inc.Ohara Corp.optics.orgOptikos CorporationOptimax Systems, Inc.OptiPro SystemsOPTIX Co.Opto-Alignment TechnologyOPTOCRAFT GmbHOptoSigma Corp.OptoTech Optical Machinery Inc.Orientir, Inc.Panasonic Factory Solutions

CompanyPHASICS Corp.Photonic Cleaning Technologies,

LLCPhotonics Media/Laurin

PublishingPhotonics OnlinePI (Physik Instrumente) L.P.piezosystem jena, Inc.PIKE TechnologiesPolaris Motion

PR Hoffman Machine ProductsPrecision Glass & OpticsPrecision OpticalPrecitec, Inc.Pyser OpticsQED OpticsQED Technologies, Inc.Quantel USAR. Mathews Optical Works, Inc.RedLuxReynard Corp.Rigaku Innovative Technologies,

Inc.Safran ReoscSAGA, A Division of A & M Tool

& DesignSalem Advanced MaterialsSatisloh North America Inc.Savvy Optics Corp.Schneider Optical Machines Inc.SCHOTT Advanced Opticsscia Systems GmbHScoptiqueSDC TechnologiesSolayer GmbHson-x GmbHSpartan Felt Company, IncSpica Technologies, Inc.SPIE Career CenterSPIE Digital LibrarySunny Optical Technology Co.,

Ltd.Swift Glass, Inc.SwitzerSydor OpticsSynopsys, Inc.Syntec OpticsTaylor Hobson-AMETEK UPTTechmetals, Inc.Technotrade International, Inc.Tecport Optics, Inc.Tempo Clean Room FoamThe Optronics Co., Ltd.ThorlabsToyotec Co., Ltd.TRIOPTICS GmbHUC Components, Inc.United Lens Co., Inc.Universal PhotonicsValtech CorporationVermont Photonics

Technologies Corp.VisiMax Technologies, Inc.VM-TIM GmbHWavelength Opto-Electronic (S)

Pte LtdWordingham TechnologiesXactra TechnologiesXonox Technology GmbHZygo Corporation

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12 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

TECHNICAL PROGRAM

With a unique technical focus on classical and advanced optical manufacturing technologies, Optifab offers conference attendees an exceptional opportunity to hear from industry leaders on some of the biggest challenges and most promising areas in this field.DON’T MISS THESE TECHNICAL PRESENTATIONS

Conference 10448Monday–Thursday 16–19 October 2017 Proceedings of SPIE Vol. 10448

Optifab 2017Conference Chair: Julie L. Bentley, Univ. of Rochester (USA)

Conference Co-Chair: Sebastian Stoebenau, OptoTech Optikmaschinen GmbH (Germany)

Program Committee: Thomas Battley, New York Photonics Industry Association (USA); Michael J. Bechtold, OptiPro Systems (USA); Christopher T. Cotton, ASE Sailing Inc. (USA); Walter C. Czajkowski, Edmund Optics, Inc. (USA); Michael A. DeMarco, QED Technologies, Inc. (USA); Apostolos Deslis, JENOPTIK Optical Systems, LLC (USA); Toshihide Dohi, OptiWorks, Inc. (Japan); Dan Gauch, Schneider Optical Machines Inc. (USA); Tom Godin, Satisloh North America Inc. (USA); Heidi Hofke, OptoTech Optical Machinery Inc. (USA); Jay Kumler, JENOPTIK Optical Systems, LLC (USA); Justin J. Mahanna, Universal Photonics Inc. (USA); Michael A. Marcus, Lumetrics, Inc. (USA); Paul Meier-Wang, AccuCoat Inc. (USA); Ted Mooney, Harris Geospatial Systems (USA); Michael N. Naselaris, Sydor Optics, Inc. (USA); Richard Nastasi, Universal Photonics Inc. (USA); John J. Nemechek, Metrology Concepts LLC (USA); Buzz Nesti, Naked Optics Corp. (USA); Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany); Paul Tolley, Smart System Technology & Commercialization Ctr. (USA); Blair L. Unger, Rochester Precision Optics, LLC (USA); Martin J. Valente, Arizona Optical Systems, LLC (USA); Kirk J. Warden, LaCroix Optical Co. (USA); Robert Wiederhold, Optimax Systems, Inc. (USA); Dhananjay Joshi, Clemson Univ. (USA)

MONDAY 16 OCTOBERSESSION 1 . . . . . . . . . MON 8:00 AM TO 10:00 AM

Grinding and Polishing Processes I

Session Chair: Sebastian Stoebenau, OptoTech Optikmaschinen GmbH (Germany)

Analysis and optimization of the surface profile correcting mechanism of pitch lap in large-aperture annular polishing, Huifang Zhang, Shanghai Univ. (China); Minghong Yang, Lunzhe Wu, Xueke Xu, Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-1]

APS 3D, a new benchmark in aspherical polishing, Dan Gauch, Schneider Optical Machines Inc. (USA); Dalibor Mikulic, Christian Veit, Schneider GmbH & Co. KG (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-2]

Novel high-NA MRF toolpath supports production of concave hemispheres, Chris Maloney, Christopher M. Supranowitz, Paul Dumas, QED Technologies, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-3]

Ultrasonic grinding of optical materials, Michael J. Cahill, Michael J. Bechtold, Edward Fess, Thomas Stephan, Rob Bechtold, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-4]

Innovative processing of meter-class optics, Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-5]

Etching hard brittle optical materials by masked ion beam, Yun Li, Taotao Fu, Jia Xin, Tingwen Xing, Institute of Optics and Electronics, Chinese Academy of Sciences (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-6]

SESSION 2 . . . . . . . . MON 10:30 AM TO 12:30 PM

Grinding and Polishing Processes II

Session Chair: Jessica Nelson, Optimax Systems, Inc. (USA)

New surface smoothing technologies for manufacturing of complex shaped glass components, Sebastian Henkel, Anne-Marie Schwager, Jens Bliedtner, Kerstin Götze, Ernst-Abbe-Hochschule Jena (Germany); Edda Rädlein, Technische Univ. Ilmenau (Germany); Christian Schulze, Ernst-Abbe-Hochschule Jena (Germany); Martin Gerhardt, Michael Fuhr, Effgen-Laport Schleiftechnik (Germany). . . . . . . . . . . . . . . . . . .[10448-7]

Controlling material removal rate and surface quality in femtosecond laser processing of optical materials, Lauren L. Taylor, Joshua C. Frechem, Rochester Institute of Technology (USA); Hainian Han, Chinese Academy of Sciences (China) and Rochester Institute of Technology (USA); Jing Xu, Thomas R. Smith, Michael Pomerantz, John C. Lambropoulos, Univ. of Rochester (USA); Jie Qiao, Rochester Institute of Technology (USA) . .[10448-8]

Beam shaping for efficient femtosecond laser processing of optical glass, Michael Seiler, Ernst-Abbe-Hochschule Jena (Germany); Christian Schindler, Carl Zeiss Jena GmbH (Germany); Jens Bliedtner, Ernst-Abbe-Hochschule Jena (Germany); Jean Pierre Bergmann, Technische Univ. Ilmenau (Germany) . . . . . . . . .[10448-9]

Novel lubrication strategies for lapping, grinding, and polishing of optical substrates, Joshua Cobb, Niraj Mahadev, Chemetall Precision Microchemicals (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-10]

The broad utility of Trizac(TM) Diamond Tile, John Gaglairdi, Bruce A. Sventek, Vincent Romero, Lijun Zu, 3M Co. (USA) . . . . . . . . . . . . . . . . . . .[10448-11]

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Impact of slurry pH on material removal rate and surface quality of polished fused silica, Melanie Redien, Cedric Maunier, Bertrand Remy, Karine Poliakoff-Leriche, Jérôme Néauport, Commissariat à l’Énergie Atomique (France) . . . . . . . . . . . . . . . . . . . . . . .[10448-12]

Lunch Break . . . . . . . . . . . . . . Mon 12:30 pm to 1:30 pm

SESSION 3 . . . . . . . . . . MON 1:30 PM TO 3:30 PM

Grinding and Polishing Processes III

Session Chair: John C. Lambropoulos, Univ. of Rochester (USA)

TBA, James T. Mooney, Harris Corp. (USA) . . .[10448-13]

New high-precision deep concave optical surface manufacturing capability, François Piché, Corning Research and Development Corp. (USA); Chris Maloney, QED Technologies, Inc. (USA); Steven J. VanKerkhove, Keith J. Donohue, Corning Research and Development Corp. (USA); Paul Dumas, Christopher M. Supranowitz, QED Technologies, Inc. (USA) . . . . . . . . . . . . . .[10448-14]

Precision production: enabling deterministic throughput for precision aspheres with MRF, Chris Maloney, QED Technologies, Inc. (USA); Navid Entezarian, Thorlabs, Inc. (USA); Paul Dumas, QED Technologies, Inc. (USA) . . . . . . . . . . . . . . . . . .[10448-15]

Evolving rocket optics applications drive manufacturing advances, Brian W. Myer, James Perdue, Kevin Bartlett, Jessica Nelson, Optimax Systems, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . .[10448-16]

Applying MRF® to errors caused by optical and opto-mechanical assembly, Jon Cilento, Christopher A. Hall, QED Optics (USA); William J. Messner, QED Technologies, Inc. (USA); Michael A. DeMarco, QED Optics (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-17]

Novel process for production of micro lenses with increased centering accuracy and imaging performance, Christian Wilde, TRIOPTICS GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-18]

SESSION 4 . . . . . . . . . . MON 4:00 PM TO 6:00 PM

Additive ManufacturingSession Chair: Ulrike Fuchs, asphericon GmbH (Germany)

Fabrication of free form optics with DLP based 3D printing, Mohammadreza Riahi, Yasaman Honarmand, Milad Rahimzadeh, Sarah Akbari, Somayeh Pourgholami, K.N. Toosi Univ. of Technology (Iran, Islamic Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-19]

Analysis and simulation of scattering of additive manufactured optical elements, Manuel Rank, André Horsak, Andreas Heinrich, Hochschule Aalen (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-20]

3d printed optical components with compositional and structural gradients, Rebecca Dylla-Spears, D. T. Nguyen, J. F. Destino, N. Dudukovic, W. Chen, E.B. Duoss, Mark A. Johnson, Michael C. Rushford, William A. Steele, Christopher M. Spadaccini, Tayyab I. Suratwala, T. D. Yee, Lawrence Livermore National Lab. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-21]

Current use and potential of additive manufacturing for optical applications, Matthew J. Brunelle, Ian Ferralli, Rebecca Whitsitt, Kate Medicus, Optimax Systems, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-22]

Additive manufacturing of glass lenses using fiber-fed laser-melting process, Edward C. Kinzel, John Hostetler, Douglas A. Bristow, Missouri Univ. of Science and Technology (USA); Jonathan T. Goldstein, Air Force Research Lab. (USA); Robert G. Landers, Missouri Univ. of Science and Technology (USA) . . . . . . . . . . .[10448-23]

Additive manufacturing of microoptical devices using the optical pickup head configuration, Hsi-Fu Shih, National Chung Hsing Univ. (Taiwan) . . . . . . . .[10448-24]

Conference 10448TUESDAY 17 OCTOBER

SESSION 5 . . . . . . . . .TUE 8:00 AM TO 9:55 AM

Plenary SessionSession Chair: Julie L. Bentley,

Univ. of Rochester (USA)

Freeform Optics: current challenges for future serial production (Plenary Presentation), Christian Schindler, Thomas Köhler, Eckhard Roth, Carl Zeiss Jena GmbH (Germany) . . . . . . . . [10448-25]

Concept for a new approach to realize complex optical systems in high volume (Plenary Presentation), Heinrich Grüger, Jens Knobbe, Tino Pügner, Michael Leuckefeld, Peter Reinig, Sebastian Meyer, Fraunhofer-Institut für Photonische Mikrosysteme (Germany) . . . . . . . . . . . . . . [10448-26]

SESSION 6 . . . . . . . . . TUE 10:30 AM TO 12:10 PM

Optical Design and EngineeringSession Chair: Blair L. Unger,

Rochester Precision Optics, LLC (USA)

Tolerancing aspheres based on manufacturing knowledge, Ulrike Fuchs, Sven Wickenhagen, Sven R. Kiontke, Sebastian Kokot, asphericon GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-28]

The importance of understanding manufacturing distributions in simulating manufactured performance of optical systems, Mark C. Sanson, Corning Incorporated (USA) . . . . . . . . . . . . . . . . . . . . . .[10448-29]

Integrating optical, mechanical, and test software, Victor L. Genberg, Gregory J. Michels, Sigmadyne, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-30]

Efficient production of mounted lens objectives using alignment turning, Christian Buss, TRIOPTICS GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-31]

Twyman effects in thin curved optics, John C. Lambropoulos, Univ. of Rochester (USA) . . . . .[10448-32]

Lunch Break . . . . . . . . . . . . . . . Tue 12:10 pm to 1:40 pm

SESSION 7 . . . . . . . . . . . TUE 1:40 PM TO 3:20 PM

Diamond TurningSession Chair: James T. Mooney,

Harris Corp. (USA)

Analysis of the application of poly-nanocrystalline diamond tools for ultra precision machining of steel with ultrasonic assistance, Marius Doetz, Olaf Dambon, Fritz Klocke, Fraunhofer-Institut für Produktionstechnologie IPT (Germany); Benjamin Bulla, Karl Schottka, David J. Robertson, son-x GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-33]

Micro-laser assisted machining: the future of manufacturing silicon optics, Donald E. Morrison, Rochester Precision Optics LLC (USA); Deepak Ravindra, Micro-Laser Assisted Machining Technologies, LLC (USA); Sai Kumar Kode, Chris Stroshine, Micro-Laser Assisted Machining Technologies (USA); Mike Mitchell, Rochester Precision Optics LLC (USA) . . . . . . .[10448-34]

UPC 300 ultra precise fast tool freeform machining system with integrated metrology for corrective machining, Dan Gauch, Schneider Optical Machines Inc. (USA); Frank Niehaus, Stephan Huttenhuis, Schneider GmbH & Co. KG (Germany) . . . . . . . . . . . . . . .[10448-35]

Aspheric optics fabrication by Single Point Diamond Turning: Some issues, Ramagopal V. Sarepaka, Siva Sakthibalan, Somaiah Doodala, Rakesh Singh Panwar, Rajendra D. Kotaria, Optics & Allied Engineering Pvt. Ltd. (India) . . . . . . . . . . . . . . . . . . . . . . . . .[10448-36]

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Effect of cutting parameters on surface roughness in ultra-high precision turning of a contact lens polymer, Muhammad Mukhtar Liman, Khaled Abou-El-Hossein, Odedeyi P. Babatunde, Nelson Mandela Metropolitan Univ. (South Africa) . . . . . . . . . . . . . . . . . . . . . .[10448-37]

SESSION 8 . . . . . . . . . . . TUE 3:50 PM TO 5:10 PM

MoldingSession Chair: Matthias Pfaff, OptoTech

Optikmaschinen GmbH (Germany)

Effect of precision glass molding on index of refraction in new and conventional chalcogenide glasses, George P. Lindberg, Jamie L. Ramsey, Blair L. Unger, John Deegan, Robert Benson, Rochester Precision Optics, LLC (USA) . . . . . . . . . . . . . . .[10448-38]

Precision glass molding of sensor/MEMS structures, Alois Kasberger, Christian Wistl, Maximilian Hasenberger, Raimund Förg, Technische Hochschule Deggendorf (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-39]

Fabrication of glass molded aspherical lens using a vitreous carbon mold for UV-LED exposure system, Seok-Min Kim, Young Kyu Kim, Muhammad Refatul Haq, Xun Lu, Chung-Ang Univ. (Korea, Republic of) . . . . . . . . . . . . . . . . . . . . . .[10448-40]

Aspheric DOE surface generation on IR lens Molds, Yeon Hwang, Yongbok Kim, Euisam S. Lee, JuHyeon Choi, Korea Photonics Technology Institute (Korea, Republic of) . . . . . . . . . . . . . . . . . . . . . .[10448-41]

WEDNESDAY 18 OCTOBERSESSION 9 . . . . . . . . . WED 8:00 AM TO 10:00 AM

Freeform Fabrication and Testing

Session Chair: Kate Medicus, Optimax Systems, Inc. (USA)

Fabrication and correction of freeform surface based on Zernike polynomials by slow tool servo, Yuan-Chieh Cheng, Ming-Ying Hsu, Wei-Jei Peng, Wei-Yao Hsu, Instrument Technology Research Ctr. (Taiwan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-42]

Precision asphere and freeform optics manufacturing using plasma jet machining technology, Thomas Arnold, Georg Böhm, Leibniz-Institut für Oberflächenmodifizierung e.V. (Germany) . . . . .[10448-43]

Computer aided manufacturing for complex freeform optics, Frank L. Wolfs, Edward Fess, Dustin Johns, Gabriel LePage, Greg Matthews, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-44]

Shape measurement of freeform surfaces using experimental ray tracing, Tobias Binkele, David Hilbig, Friedrich Fleischmann, Thomas Henning, Hochschule Bremen Univ. of Applied Sciences (Germany) .[10448-45]

Metrology for the manufacturing of freeform optics, Todd Blalock, Brian W. Myer, Ian Ferralli, Matthew J. Brunelle, Optimax Systems, Inc. (USA) . . . . . . .[10448-46]

Enhanced resolution and accuracy of freeform metrology through Subaperture Stitching Interferometry, Christopher M. Supranowitz, Chris Maloney, Paul E. Murphy, Paul Dumas, QED Technologies, Inc. (USA) . . . . . . . . . . . . . . . . . .[10448-47]

Conference 10448

SESSION 10 . . . . . . . .WED 10:30 AM TO 12:10 PM

Metrology ISession Chair: Dan Gauch,

Schneider Optical Machines Inc. (USA)

From optics testing to micro optics testing, Christian Brock, Johannes Pfund, Ralf Dorn, OPTOCRAFT GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-48]

Asphere cross testing: an exercise in uncertainty estimation, Paul E. Murphy, QED Technologies, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-49]

Advancements in non-contact metrology of asphere and diffractive optics, Scott DeFisher, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-50]

Spectrally controlled interferometry for measurements of flat and spherical optics, Artur G. Olszak, Chase Salsbury, Äpre Instruments, LLC (USA) and College of Optical Sciences, The Univ. of Arizona (USA) . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-51]

Surface characterization protocol for precision aspheric optics, Ramagopal V. Sarepaka, Siva Sakthibalan, Somaiah Doodala, Rakesh Singh Panwar, Rajendra D. Kotaria, Optics & Allied Engineering Pvt. Ltd. (India) . . . . . . . . . . . . . . . . . . . . . . . . .[10448-52]

Lunch Break . . . . . . . . . . . . . . Wed 12:10 pm to 1:40 pm

SESSION 11 . . . . . . . . . WED 1:40 PM TO 3:00 PM

Metrology IISession Chair: Paul E. Murphy, QED Technologies, Inc. (USA)

SUN : a fully automated interferometric test bench aimed at measuring photolithographic grade lenses with a sub nanometer accuracy, Renaud Mercier Ythier, Rémi Bourgois, Anne-Laure Hamy, Pierre Pourcelot, Safran Reosc (France) . . . . . . . . . . . . . . . . . . . .[10448-53]

Test bench for alignment and optical quality measurement of large-field of view objective, William Boucher, Etienne Homassel, Djamel Brahmi, Antoine Gascon, Benoit Wattellier, PHASICS S.A. (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-54]

Centering steep aspheric surfaces, Robert E. Parks, Optical Perspectives Group, LLC (USA) . . . . . .[10448-55]

Automated asphere centration testing with AspheroCheck UP, Felix Hahne, Patrik Langehanenberg, TRIOPTICS GmbH (Germany) . . . . . . . . . . . . . .[10448-56]

SESSION 12 . . . . . . . . . WED 3:30 PM TO 4:30 PM

Metrology IIISession Chair: Christopher T. Cotton

Tailored complex degree of mutual coherence for plane-of-interest interferometry with reduced measurement uncertainty, Gerald Fütterer, Hochschule Deggendorf Technologiecampus Teisnach (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-57]

Absolute surface form measurement of large flat optics based on oblique incidence method, Shijie Liu, You Zhou, Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China) . . . . . . . . . . . . . . . . . . .[10448-58]

Measurement of a concave spherical mirror with sub-50 pm repeatability by 3D nanoprofiler using normal vector tracing, Takao Kitayama, Hiroki Shiraji, Ryo Kizaki, Kazuya Yamamura, Katsuyoshi Endo, Osaka Univ. (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-59]

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Conference 10448

POSTER SESSION . . . . . WED 4:30 PM TO 6:00 PMSymposium attendees are invited to attend the Poster/Networking Reception on Wednesday evening. The reception provides an opportunity for attendees to meet with colleagues, network, view poster papers, and interact with the authors. Refreshments will be served.

Attendees are required to wear their conference registration badges

Non-conventional optomechanical choppers: Analysis and design of novel prototypes, Virgil-Florin Duma, Aurel Vlaicu Univ. of Arad (Romania) and Politehnica Univ. of Timisoara (Romania); Dorin Demian, Octavian Cira, Aurel Vlaicu Univ. of Arad (Romania); Nicolina Pop, Politehnica Univ. of Timisoara (Romania) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-72]

Optical properties of Ge-Sb-Se chalcogenide glasses, Li Wang, Beijing Univ. of Technology (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-73]

Influence of the supporting point mounting configuration on the SHG efficiency of a KDP crystal, Guoqing Pei, Xu Xu, Tinghai Qin, Han Yan, Lang Ye, Weifeng Du, Xiaodong Yuan, Hai Zhou, China Academy of Engineering Physics (China) . . . . . . . . . . . . .[10448-74]

High precision processing CaF2 application research based on the magnetorheological finishing technology, Xianyun Zhong, Institute of Optics and Electronics, Chinese Academy of Sciences (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-75]

An optimized method to calculate error correction ability of tool influence function in frequency domain, Jia Wang, Institute of Optics and Electronics, Chinese Academy of Sciences (China) . . . . . . . . . . . . . .[10448-76]

Multi-wavelength large optics wave front error metrology bench, William Boucher, Etienne Homassel, Benoit Wattellier, PHASICS S.A. (France) . . . . .[10448-77]

Precision lens assembly with alignment turning system, Cheng-Fang Ho, Chien-Yao Huang, Yi-Hao Lin, Hui-Jean Kuo, Wei-Yao Hsu, Instrument Technology Research Ctr. (Taiwan) . . . . . . . . . . . . . . . . . . .[10448-78]

Cheap and fast measuring roughness on big surfaces with an imprint method, Christian Schopf, Rolf Rascher, Johannes Liebl, Hochschule Deggendorf Technologiecampus Teisnach (Germany) . . . . .[10448-79]

The study of sub-surface damage distributions during grinding process on different abrasion materials, Ching-Hsiang Kuo, Chien-Yao Huang, Shyu-Cheng Shu, Zong-Ru Yu, Wei-Yao Hsu, Instrument Technology Research Ctr. (Taiwan) . . . . . . . . . . . . . . . . . . .[10448-80]

Manufacturing of three dimensional silicate moldings by selective laser beam sintering, Anne-Marie Schwager, Jens Bliedtner, Armin Bruder, Kerstin Götze, Ernst-Abbe-Hochschule Jena (Germany) . . . . .[10448-81]

Optical characterisation of hydroxide catalysed bonds applied to phosphate glass, Grégoire Lacaille, Gooch & Housego PLC (United Kingdom); Valentina Mangano, Univ. of Glasgow (United Kingdom); Peter E. MacKay, Gooch & Housego PLC (United Kingdom); Anna-Maria A. van Veggel, Christian J. Killow, Sheila Rowan, James Hough, Univ. of Glasgow (United Kingdom) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-82]

Development of a fully integrated and injection-moldable miniature spectrometer for low-cost applications, Matthias Haupt, Ulrich H. P. Fischer-Hirchert, Hochschule Harz (Germany) . . . . . . . .[10448-83]

Sub-nanometer precision surface shape measurement of optical flat and sphere, Jia Xin, Yun Li, Xi Hou, Tingwen Xing, Institute of Optics and Electronics, Chinese Academy of Sciences (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-84]

Newly patented process enables low-cost solution for increasing white light spectrum of LEDs, Jan-Marie A. Spanard, Light Spectrum Glazes (USA) . . . . . .[10448-85]

Aspheric Fizeau lenses with large aperture diameter, Ulrike Fuchs, Sven Wickenhagen, Anna Möhl, asphericon GmbH (Germany). . . . . . . . . . . . . . . . . . . . . . . .[10448-86]

Diffraction effect control in measuring off-axis aspheric on axis by using computer-generated holograms, Chaoyang Wei, Xuyu Li, Wendong Xu, Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China) . . . . . . . . . . . . . . . . . . . . . . .[10448-87]

Glass molding of 3mm diamter aspheric plano-convex lens, Hayoung Sung, Giljae Lee, Myung Sang Huh, Geunman Ryu, Hyunjin Bang, Osong Medical Innovation Foundation (Korea, Republic of) . . . . . . . . . . . .[10448-88]

A MWIR catadioptric optically passive athermal lens with chalcogenide glasses, Yu Bai, Institute of Optics and Electronics, Chinese Academy of Sciences (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-89]

Measurement of strongly curved surfaces by multi-beam experimental ray tracing, David Hilbig, Jan Schulze, Friedrich Fleischmann, Thomas Henning, Hochschule Bremen Univ. of Applied Sciences (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-90]

AVIOR: cost-effective mass production tool for precision optics, Andreas Rack, Jörg Weber, Clement David, Harald Liepack, Solayer GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-91]

Freeform optics manufacturing, Greg Matthews, James Ross, Jake Gemballa, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-92]

Fabrication of advanced glass light pipe structures, Yusuf Dogan, Matthew Morrison, Chehao Hu, Robert A. Atkins, Texas A&M Univ. (USA); Mehmet E. Solmaz, Izmir Katip Celebi Univ. (Turkey); Christi K. Madsen, Texas A&M Univ. (USA) . . .[10448-93]

The ultraprecision grinding force of optical glass with microstructured coarse-grained diamond wheel, Bing Guo, Mingtao Wu, Qingliang Zhao, Harbin Institute of Technology (China) . . . . . . . . . . . . . . . . . . . .[10448-94]

Manufacturing technique of off-axis aspherical mirror with diamond turning and magneto-rheological finishing, Min Woo Jeon, Korea Basic Science Institute (Korea, Republic of) . . . . . . . . . . . . . . . . . . . . . .[10448-95]

Material of LAPAN’s thermal IR camera equipped with two microbolometers in one aperture, Bustanul Arifin, Andi Mukhtar Tahir, Irwan Priyanto, Indonesia National Institute of Aeronautics and Space (Indonesia) .[10448-96]

Design of a solar concentrator considering arbitrary cylindrical surfaces, Maximino Avendaño Alejo, Martín Jiménez-Rodríguez, Univ. Nacional Autónoma de México (Mexico) . . . . . . . . . . . . . . . . . . . . . . . .[10448-97]

Dual band AR coatings of LAPAN’s thermal IR camera to enhance system and reduce stray light, Bustanul Arifin, Indonesia National Institute of Aeronautics and Space (Indonesia); Irwan Priyanto, Indonesia National Institute of Aeronautics and Space (Indonesia); Andi Mukhtar Tahir, Indonesia National Institute of Aeronautics and Space (Indonesia) .[10448-98]

Imaging around corners with single-pixel detector by computational ghost imaging, Bin Bai, Yu Zhou, Jianbin Liu, Huaibin Zheng, Songlin Zhang, Yuchen He, Zhuo Xu, Xi’an Jiaotong Univ. (China) . . . . . . . .[10448-99]

Laser scattering technique to characterize turbulent liquids, Aissa Manallah, Mohamed Bouafia, Malika Lakhal, Univ. Ferhat Abbas Sétif 1 (Algeria) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-100]

Spectroscopic enhancement & phase transformation study in Yb3+/Er3+ doped ferroelectric SrTiO3 ceramics, Prasenjit Prasad Sukul, Kaushal Kumar, Indian Institute of Technology (Indian School of Mines), Dhanbad (India) . . . . . . . . . . . . . . . . . . . . . . . .[10448-101]

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16 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

Highly efficient micro transmission grating fabrication inside quartz glass by femtosecond laser micromachining, Sanyogita Singh, Amar Ghar, Indian Institute of Technology Kanpur (India). . . . . . .[10448-102]

A streak tube multi-spectral three-dimensional imaging system for complex target, Jingya Cao, Shaokun Han, Wenze Xia, Liang Wang, Yu Zhai, Beijing Institute of Technology (China) . . . . . . . . . . . .[10448-103]

An improved three-dimensional non-scanning laser imaging system based on digital micromirror device, Wenze Xia, Shaokun Han, Jingya Cao, Beijing Institute of Technology (China) . . . . . . . . . . . . . . . . . . . . .[10448-104]

Design of an ultra-precision CNC chemical mechanical polishing machine and its implementation, Chupeng Zhang, Huiying Zhao, Xi’an Jiaotong Univ (China); Xinxing Ban, Chunye Jiang, Xi’an Jiaotong Univ. (China); Yawen Gu, Xi’an Jiaotong University (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-105]

Optical designs for MWIR and four quadrant detectors by using beam steering methods in missile applications, Doğan Uğur Sakarya, Roketsan A.S. (Turkey) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-106]

Four and eight faceted domes effects on drag force and image in missile application, Doğan Uğur Sakarya, Roketsan A.S. (Turkey) . . . . . . . . . . . . . . . . . .[10448-107]

THURSDAY 19 OCTOBERSESSION 13 . . . . . . . . .THU 8:00 AM TO 10:00 AM

Optical MaterialsSession Chair: Michael A. Marcus,

Lumetrics, Inc. (USA)

Stability requirements for two-beam interference lithography diffraction grating manufacturing, Felix Koch, Dennis Lehr, Tilman Glaser, Carl Zeiss Jena GmbH (Germany). . . . . . . . . . . . . . . . . . . . . . . .[10448-60]

Thermal instability of BK7 and how it affects the manufacturing of large high precision surfaces, Michael Hyman, Matthew J. Brunelle, Nohl Schluntz, Michael K. Gregory, Mark Notargiacomo, Gregory Frisch, Jeremiah Triftshauser, Optimax Systems, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . .[10448-61]

Conference 10448Commercializing potassium terbium fluoride, KTF (KTb3F10) faraday crystals for high laser power optical isolator applications, Wolfgang Schlichting, Northrop Grumman Corp. (USA); Kevin T. Stevens, Greg Foundos, Alexis Payne, Northrop Grumman SYNOPTICS (USA) . . . . . . . . . . . . . . . . . . . . . .[10448-62]

UV-cured polymer optics, Victor Pinon III, Sandia National Labs. (USA); Freddie Santiago, U.S. Naval Research Lab. (USA); Ashten Vogelsberg, Neil Cramer, Colorado Photopolymer Solutions (USA) . . . . .[10448-63]

Brilluoin spectroscopy application for express, non-contact testing of glass and polymer products, Stephan L. Logunov, Corning Incorporated (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-64]

Application of speckle shearing interferometry to the evaluation of creep strain in elastomers, Juan Benito Pascual Francisco, Alexandre V. Michtchenko, Orlando Susarrey Huerta, Omar Barragán-Pérez, Instituto Politécnico Nacional (Mexico) .[10448-65]

SESSION 14 . . . . . . . . THU 10:30 AM TO 12:10 PM

Coating and CleaningSession Chair: Jennifer D. T. Kruschwitz,

JK Consulting (USA)

Novel cleaning strategy for removing paraffin waxes from optical substrates, Mark Cyffka, Chemetall Precision Microchemicals (USA) . . . . . . . . . . . .[10448-66]

Rare earth-based low-index films for IR and multispectral thin film solutions, Markus Stolze, Umicore Thin Film Products AG (Liechtenstein) [10448-67]

Prospects for the enhancement of PIAD processes by plasma diagnostics, Jens Harhausen, Rüdiger Foest, Jochen Wauer, INP Greifswald e.V. (Germany); Olaf Stenzel, Steffen Wilbrandt, Christian Franke, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany) . . . . . . . . . . . . . . . . . .[10448-69]

Film stress and surface shape control of dichroic beam-spliter (DBS) with polarization maintaining by stress matching method, Chong Ma, Gang Chen Jr., Dingquan Liu, Shanghai Institute of Technical Physics of the Chinese Academy of Sciences (China) . . . .[10448-70]

Optical multilayer coating by ion beam sputtering, M. V. Daniel, Marcel Demmler, scia Systems GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[10448-71]

SPIE COURSESQUALITY CONTENT. EXPERT INSTRUCTORS. ACCREDITED PROVIDER OF IACET CEU.

Choose from a variety of options that work best for you.• Courses at events• In-company training—customized content at your facility.• Online courses

Learn from the best. Solve problems. Get ahead.

Education

“The instructor was skilled and clear in his presentation. In contrast to some other courses I have taken there is value in using the higher definition of the videos where the video is available as the presenter actually gestures and contributes to the presentation.”

– Online course taker on Mounting of Optical Components

SPIE is accredited by the International Association for Continuing Education and Training (IACET) and is authorized to issue the IACET CEU

For more information, visit: www.spie.org/courses

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17Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

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18 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

• Suite of Standards Training Courses: Scratch and Dig, Optics Surface Inspection Hands-on Workshop, and Modern Optical Drawings

COURSESPersonal Instruction. Real-time interaction.Effective, focused, and efficient training chosen specifically for optical manufacturing professionals. Take advantage of the unique opportunity to learn from some of the most experienced and accomplished minds in industry and research, and interact with peers who share similar challenges.

MONEY-BACK GUARANTEEWe are confident that once you experience an SPIE course for yourself you will look to us for your future education needs. However, if for any reason you are dissatisfied, we will gladly refund your money. We just ask that you tell us what you did not like; suggestions for improvement are always welcome.

CONTINUING EDUCATION UNITSSPIE is accredited by the International Association for Continuing Education and Training (IACET) and is authorized to issue the IACET CEU.

• 2 New Courses: The Proper Care of Optics and Fundamentals of Optical Engineering

• 3.5 hour course on optics fundamentals great for exhibitors, sales reps, marketers, and managers!

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19Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

Fastening Optical Elements with AdhesivesSC015 • Course Level: Intermediate • CEU: 0.4$300 Members • $355 Non-Members USD SPIE Student Members: $172 Monday 8:30 am to 12:30 pmOptomechanical systems require secure mounting of optical elements. Adhesives are commonly used, but rarely addressed in the literature. This course has compiled an overview of these adhesives, their properties, and how to test them. How to use them is addressed in detail with guidelines and examples provided. A summary of common adhesives is pre-sented with justification for their use. Consideration and analysis of adhesive strength, reliability, and stability are included. Different design approach-es to optimize the application are presented and discussed. Many examples are described as well as lessons learned from past experience. Discussions are encouraged to address current problems of course attendees.

LEARNING OUTCOMESThis course will enable you to:• describe and classify adhesives and how they

work (epoxy, urethane, silicone, acrylic, RTV, VU-cure, etc.)

• obtain guidance in: adhesive selection, surface preparation, application, and curing

• develop a basis for analysis of stress and thermal effects

• recognize contamination/outgassing and how to avoid it

• review design options• create and use an adhesive check list

INTENDED AUDIENCEThis course is for engineers, managers, and tech-nicians. This course provides a foundation for the correct design for successful optical mounting; an understanding of the best options to employ for each application, and the selection and approach condu-cive to production. A bound course outline (that is a good reference text) is provided, including sum-maries of popular adhesives and their properties.

INSTRUCTORJohn Daly has 35 years of experience in lasers and optomechanics. Over this period, he has worked optical bonding problems since his thesis projects, as an employee of several major corporations, and now as a consultant. His academic background in mechanical engineering and applied physics com-pliments this discipline. His work experience has been diverse covering areas such as: military lasers, medical lasers, spectroscopy, point and standoff de-tection, and E-O systems. His roles over these years have included analysis, design, development, and production. He is an SPIE member, with numerous publications, and is a committee member of the SPIE Optomechanical Engineering Program.

Attendee testimonial:That was an amazing amount of material!! Possibly the most applicable & easy to apply short course I’ve ever taken.

Optical Scatter Metrology for IndustrySC1003 • Course Level: Intermediate • CEU: 0.4$370 Members • $425 Non-Members USD SPIE Student Members: $200 Tuesday 1:30 pm to 5:30 pmThe course emphasizes quantifying, measuring and understanding scatter. A scatterometer will be used during the class to illustrate these issues and students are encouraged to bring samples to the course. Optical scatter, originally used almost exclusively to characterize the stray light generated by optically smooth surfaces, is now being used as a fast, economical way to monitor the surface texture requirements in a variety of industries. For example, as the lighting industry moves to LED’s scatter from a huge number of components is being measured for analysis in stray radiation codes. Texture is an important requirement for the metal producing industry and it changes with roll wear. The appear-ance of every day appliances (from door hinges to computer cases) varies dramatically with texture. The quality of flat panel displays depends on the scatter characteristics of the screen and components behind it. SEMI and ASTM have responded to the new applications with “scatter standards” to help communication between manufacturers, vendors and customers. The course starts with easier to analyze optical applications and then explores the transition to rougher industry surfaces, where the measurements are easier. Between a good optical mirror and a concrete sidewalk there are thousands of industry surfaces that can be monitored with scatter metrology. There are two key points for these “in-between” surfaces: (1) If the texture changes - the scatter changes and (2) these changes (and product function) cannot be adequately monitored by a single variable - such as RMS Roughness, Haze or Gloss. Students are asked to share as much as they can of their scatter metrology issues.

LEARNING OUTCOMESThis course will enable you to:• quantify and analyze scatter in terms of BRDF,

ARS, TIS, Haze and DSC units• explain the instrumentation for obtaining scatter

data and evaluate system calibration• describe and overcome the various difficulties

in comparing roughness statistics found from profilometers and scatterometers for both isotropic and non-isotropic samples

• convert scatter to roughness statistics if possible and understand when it is not possible

• evaluate the use of scatter measurements for specific applications such as: stray system radiation, surface micro-roughness, particulate sizing and background sensor noise

• explain the use of polystyrene latex sphere depositions as an optical scattering standard

• review scattering standards for the semiconductor and photo-voltaic industries

INTENDED AUDIENCEEngineers, scientists, and managers who need to understand and apply the basic concepts of scatter metrology to laboratory research and industrial pro-cess control. Some knowledge of calculus is helpful, but the course does not require that the student

Courses

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20 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

follow mathematical derivations. The instructor has worked with Thomas Germer (SC492 instructor) to avoid overlap between the two courses.

INSTRUCTORJohn Stover is President of The Scatter Works, Inc., a Tucson firm concentrating on scatter based metrology standards, consulting, instruments and measurements as they apply to diverse industries. He has researched light scatter related problems for over 40 years and led teams of engineers who developed state-of-the-art scatterometers, verified theoretical relationship between surface roughness and scatter and characterized surface defects to improve wafer metrology. He has been involved with international standards organizations for over 20 years, is an SPIE Fellow, and has been active as an author, conference chairman, and editor, and has over one hundred publications including the following book.

COURSE PRICE INCLUDES the text Optical Scat-tering: Measurement and Analysis, 3rd Edition (SPIE Press, 2012) by John Stover.

Understanding Scratch and Dig SpecificationsSC700 • Course Level: Introductory • CEU: 0.4 $400 Members • $455 Non-Members USD SPIE Student Members: $212 Monday 8:30 am to 12:30 pmSurface imperfection specifications (i.e. Scratch-Dig) are among the most misunderstood, misinterpreted, and ambiguous of all optics component specifica-tions. This course provides attendees with an under-standing of the source of ambiguity in surface im-perfection specifications, and provides the context needed to properly specify surface imperfections using a variety of specification standards, and to evaluate a given optic to a particular level of surface imperfection specification. The course will focus on the differences and application of the Mil-PRF-13830, ISO 10110-7, and BSR/OP1.002. Many practical and useful specification examples are included through-out, as well as a hands-on demonstration on visual comparison evaluation techniques.

The course is followed by SC1017 Optics Surface Inspection Workshop, which provides hands-on experience conducting inspections using the speci-fication information provided in this course.

LEARNING OUTCOMESThis course will enable you to:• describe the various surface imperfection

specifications that exist today• compose a meaningful surface imperfection

specification for cosmetic imperfections using ISO, ANSI, or Mil standards

• identify the different illumination methods and comparison standards for evaluation

• demonstrate a surface imperfection visual inspection

• understand the options available for controlling surface imperfections in a vendor/supplier relationship

INTENDED AUDIENCEThis material is intended for anyone who needs specify, quote, or evaluate optics for surface imper-fections. Those who either design their own optics or who are responsible for optics quality control will find this course valuable.

INSTRUCTORDavid Aikens a.k.a “the scratch guy”, is among the foremost experts on surface imperfection standards and inspection. Dave is President and founder of Savvy Optics Corp., is the head of the American delegation to ISO TC 172 SC1, and is currently the Executive Director of the Optics and Electro-Optics Standards Council, OEOSC.

COURSE PRICE INCLUDES a copy of the latest ANSI approved surface imperfections specification standard.

Optics Surface Inspection WorkshopSC1017 • Course Level: Introductory • CEU: 0.4 $400 Members • $455 Non-Members USD SPIE Student Members: $212 Monday 1:30 pm to 5:30 pmDue to the hands-on nature of this course, class size is limited to 12 participants. Early registration is recommended.

Understanding the correct way to inspect optical surfaces is one the most important skills anyone working with or around optics can have, including technicians, material handlers, engineers, managers, and buyers. While understanding the specifications is the first step, learning how to actually perform the inspection is just as important. This hands-on work-shop will allow attendees to learn the “Best Practice” for cleaning and inspecting optical surfaces. The course has many demonstrations and labs and gives attendees practice handling and inspecting optics to develop a high level of proficiency.

This course was designed to bring photonics per-sonnel up to an immediate working knowledge on the correct methods to conduct a surface inspection in accordance with MIL, ANSI, and ISO standards. It is designed to complement SC700 Understanding Scratch and Dig Specifications and provide hands-on experience applying the specification and inspection parameters covered in that course.

LEARNING OUTCOMESThis course will enable you to:• perform a visual review of the surface• create a surface map• safely clean the surface using air only, and the

drag method• assess when magnification or high-intensity

light is allowed or required• conduct a visual inspection according to MIL-

PRF-13830B• conduct a visual inspection according to ANSI

OP1.002• conduct a visual inspection according to ISO

10110-7 and ISO 14997 standards• acquire and apply the accumulation rules• review the tools available for microscope-based

inspection to ANSI and ISO standards• evaluate a surface and determine if a surface

passes or fails

Courses

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21Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

INTENDED AUDIENCEThis course is designed for all optical practitioners who need to handle and evaluate optics or optical assemblies. Other suggested attendees include mechanical engineers, purchasing agents, quality assurance personnel and other persons working with or around optical components. <b>SC700 Understanding Scratch and Dig Specifications is a pre-requisite for the course.</b>

INSTRUCTORDavid Aikens a.k.a “the scratch guy”, is among the foremost experts on surface imperfection standards and inspection. Dave is President and founder of Savvy Optics Corp., is the head of the American delegation to ISO TC 172 SC1, and is currently the Executive Director of the Optics and Electro-Optics Standards Council, OEOSC.

COURSE PRICE includes a copy of the OP1.002 the American National Standard for surface imperfec-tions on optics, if desired.

ATTENDEE TESTIMONIAL:Wonderful! I’ve learned many skills that I can use every day.

Geometric Dimensioning and TolerancingSC1040 • Course Level: Introductory • CEU: 0.7 $525 Members • $635 Non-Members USD SPIE Student Members: $284 Thursday 8:30 am to 5:30 pmCostly errors are made when Geometric Dimension-ing concepts and tolerance characteristics are not fully understood. This course is designed to familiar-ize personnel responsible for interpreting a technical drawing to estimate, inspect, and manufacture a part or assembly with symbology, principles, and concepts, associated with Geometric Dimensioning and Tolerancing ASME Y14.5-2009.

This course will cover all topics related to GD&T, but will focus on Geometric Dimensioning and verifica-tion concepts as they apply to the Optics Industry.

LEARNING OUTCOMESThis course will enable you to:• obtain an overview of the different used optical

and mechanical standards• become familiar with Geometric Dimensioning

and Tolerancing ASME Y14.5-2009 standards• define Terminology and Symbology• review new symbols in the 2009 Standard• utilize Rules and Concepts• calculate Material Conditions• interpret Tolerance Zones for GD&T Applications• interpret Geometric applications as they relate

to the optics industry• list Inspection Requirements

INTENDED AUDIENCEEstimators, Engineering, Inspectors, and Operators responsible for print interpretation.

INSTRUCTORWalt Prystaj is the director of PEN Associates LLC, a training and consulting firm, and adjunct faculty at Rochester Institute of Technology, as well as a trainer for Finger Lakes Community College, Monroe

Community College, Genesee Community College, and other educational institutions. He is a graduate of the University of Oswego, completed a Tool and Die Apprenticeship at Eastman Kodak, and is a former tool and die company owner. Walt has been training Geometric Dimensioning and Tolerancing in industry for over twenty-five years at more than 150 companies.

Introduction to Modern Optical Drawings – the ISO 10110 StandardSC863 • Course Level: Introductory • CEU: 0.4 $300 Members • $355 Non-Members USD SPIE Student Members: $2172 Wednesday 8:30 am to 12:30 pmSince the late 1990’s, the optics community has gradually been converting optics drawings from a free-form, notes-based method to a standardized, international pictographic method. In 2013, the United States will join the international community by adopting a version of ISO 10110 as the American National Standard for optics drawings. This new method is a great boon for an industry in need of standardization, but can be very confusing to the uninitiated.

This course provides attendees with an introduction to ISO-10110, the international standard for optics drawing notations. The course concentrates on the fundamentals of the drawing layout and how to read the notations required for typical optics, such as glass parameters, radius, wave-front, surface imperfections and roughness. Attendees are also informed about how the American version is going to differ from the current international standard. Prac-tical and useful examples are included throughout.

LEARNING OUTCOMES• read and interpret an optical drawing prepared

to ISO 10110• identify the meaning of the symbology and

specifications of ISO 10110 for materials imperfections, surface form, wedge, surface imperfections, and surface texture

• describe which symbol corresponds to each of the fundamental optical parameters

• compose and interpret an ISO 10110-compliant optical element drawing

INTENDED AUDIENCEThis material is intended for anyone who has a basic understanding of optics, and encounters or gener-ates optical drawings in the course of their work. Those who either design their own optics, work with optical designers, work with optical suppliers, or manufacture optics will find this course valuable.

INSTRUCTORDavid Aikens is President and founder of Savvy Op-tics Corp., and has been involved in optics drawings and specifications for over 20 years. He is the head of the American delegation to ISO TC 172 SC1, and is the Executive Director of the Optics and Elec-tro-Optics Standards Council. He is also chairman of the project to adopt ISO 10110 as the American National Standard for optics drawings.

Courses

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22 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

The Proper Care of Optics: Cleaning, Handling, Storage and ShippingSC1114 • Course Level: Introductory • CEU: 0.4$345 Members • $400 Non-Members USD SPIE Student Members: $190 Tuesday 1:30 pm to 5:30 pmThis course is also available in online format.

There are many ways to clean optics; some are learned from experience and/or failure. This course explains the proper cleaning methods for optics that are used by professional optical technicians and engineers.

How to clean optics has always been a challenging and controversial subject. Searching the Internet will yield hundreds of articles and videos that claim to know the best methods. This course will explain the simple steps used in cleaning optics. It will also describe the proper handling, storage and shipping of optical components. The course is designed for a diverse audience, from a first-time optical cleaner to an engineer searching for methods of handling and packaging optics. An in-class demonstration on inspecting and cleaning optics will be presented.

LEARNING OUTCOMESThis course will enable you to:• identify proper cleaning tools and their use• explain safety guidelines, personal protection

equipment and basic worktable layout• compare lighting types required for inspection

and cleaning• identify solvents and cleaning liquids used for

removing contaminates• describe hand techniques used for applicators,

wipes, and how to fold wipes• explain inspection methods for optical surfaces• list the types of contaminants and describe a

short history of scratch and dig• describe visual methods used: unaided eye, eye

loupe, microscope (light and digital)• describe types of optical coatings• explain proper cleaning of small, large and

infrared optics• describe special cleaning techniques• explain techniques used for instrument

inspection, disassembly, assembly, and cleaning• describe various instrument types• describe the tricks of the trade: edge cleaning,

protection, black paint and removing glue• describe handling of optics using tweezers,

cups, trays, storage and protection methods• summarize shipping containment methods• explain outdoor field cleaning

INTENDED AUDIENCETechnicians, engineers, scientists and managers who wish to learn the methods of cleaning, han-dling, storage and shipping of optics. High school to graduate degree.

INSTRUCTORRobert Schalck is an Optical Engineer with over 40 years experience in the optical industry, and author of the text “The Proper Care of Optics” (SPIE Press, 2013) as well as an SPIE Online Course of the same title. He presented his first paper on cleaning optics

at the OSA OF&T workshop in 1975. In 1989, he de-livered a paper on Classical Optical Cleaning at the OSA “How to Conference.” Over several decades, he has given presentations on how to clean optics to groups and organizations. He is a Senior Member of OSA and SPIE.

COURSE PRICE INCLUDES the text The Proper Care of Optics: Cleaning, Handling, Storage and Shipping (SPIE Press, 2013), by Robert Schalck.

Optical Manufacturing FundamentalsSC1169 • Course Level: Introductory • CEU: 0.7$555 Members • $665 Non-Members USD SPIE Student Members: $296 Monday 8:30 am to 5:30 pmThis course provides a familiarity with precision op-tical manufacturing and metrology; and an introduc-tion to the materials, machinery, tooling, methods, processes, metrology, and production flow used to fabricate precision optical elements. The optical, thermal, and working properties of common opti-cal materials will be compared. The processes and machinery involved in shaping, finishing, measuring, cleaning, and coating optical components will be described. Strengths and limitations of metrology instruments and methods will be discussed. An over-view of the ISO drawing indications will be presented.

This course serves as both successor and tribute to Bob Novak’s long-running SC350 Optical Manufac-turing Overview course that has been a staple at the Optifab event.

LEARNING OUTCOMESThis course will enable you to:• describe the normal process flow in the

manufacturing of spherical optical components• explain blank preparation, curve generating,

grinding, polishing, and centering processes• classify the metrology needed for each step in

the manufacturing process cycles• compare the applicability of various optical

fabrication techniques and equipment• judge the relative difficulty of fabricating

different materials in various configurations• relate optical performance to tolerances and

tolerances to manufacturing processes• compute optimal lot quantity breaks• facilitate clear communication between

engineers, sales, and opticians

INTENDED AUDIENCEThe course brings mutual understanding to a dual audience: Optical fabrication technicians who seek to gain greater depth and broader context for their specialties; and engineers, sales people, and buyers who require an awareness of current optical fabrica-tion methodology as well as “lead times” associated with low volume production.

INSTRUCTORRay Williamson has a 45-year career in precision optics. He holds a BS in Physics with a concen-tration in optics. He has been a hands-on optician on components ranging from micro to massive; a process engineer developing fabrication and testing methods, tooling, and sequences; an engineering manager responsible for staffing, documentation,

New

Courses

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23Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

methods, budgets, and customer technical con-tact; and a quality assurance manager creating and administering a quality and calibration system. He has provided courses to several hundred opticians. He works with ANSI/OEOSC as an American dele-gate to ISO on drawing standards. His consulting work at Ray Williamson Consulting concentrates on manufacturing, and qualifying optical components, training technicians, and technical writing. He is a Senior Member of both SPIE and OSA, and the author of the Field Guide to Optical Fabrication.

COURSE PRICE INCLUDES a copy of the Field Guide to Optical Fabrication (SPIE Press, 2011) by Ray Williamson.

Seeing, Analyzing and Controlling Mid-Spatial Frequency (MSF) and Surface Roughness Errors on Optical SurfacesSC1171 • Course Level: Introductory • CEU: 0.4 $300 Members • $355 Non-Members USD SPIE Student Members: $172 Thursday 8:30 am to 12:30 pmThis course is designed to reinforce the fundamen-tals of seeing, measuring and analyzing surface roughness and mid-spatial frequency (MSF) errors. After reviewing these fundamentals this course will cover how MSF errors are created, controlled and/or minimized using a variety of conventional and state of the art CNC optical manufacturing methods.

LEARNING OUTCOMESThis course will enable you to:• differentiate between surface roughness and

mid-spatial frequency errors• describe how MSF errors are formed or

controlled on optical surfaces• identify causes of MSF errors in the

manufacturing process• communicate with others regarding MSF

tolerances

INTENDED AUDIENCEThis is an introductory course intended for individu-als that design, fabricate or measure optical surfaces who wish to learn more about mid-spatial frequency errors. Undergraduate training in engineering or science is assumed.

INSTRUCTORJessica DeGroote Nelson is the Director of Tech-nology and Strategy at Optimax Systems, Inc. She specializes in optical materials and fabrication processes. She is an adjunct faculty member at The Institute of Optics at the University of Rochester teaching an undergraduate and graduate course on Optical Fabrication and Testing, and has given several guest lectures on optical metrology meth-ods. She earned a Ph.D. in Optics at The Institute of Optics at the University of Rochester. Dr. Nelson is a member of both OSA and SPIE.

Fundamentals of Optical EngineeringSC1224 • Course Level: Introductory • CEU: 0.4 $300 Members • $355 Non-Members USD SPIE Student Members: $172 Wednesday 1:30 pm to 5:30 pmThis course explains fundamental principles and applications of optics. The basic characteristics and the design of optical components and systems will be discussed. For perspective, general topics such as the history of optics and the presence of optical phenomenon in our everyday lives will be included. All information will be presented in a conversational format, with no requirement for dealing with com-plex theories or mathematics. This course will include hands-on demonstrations of optics phenomena.

LEARNING OUTCOMESThis course will enable you to:• explain fundamental concepts of optics• identify basic optical components• describe basic optical systems• compare relative optical performance• describe how concepts in optics play a role in

applications or devices found in modern society• explain the functioning of the human visual

system

INTENDED AUDIENCEEngineers, technicians, sales professionals, and sup-port staff interested in learning more about optics. Attendance will enhance the understanding and specification of basic optical principles, components, and systems.

INSTRUCTORAlexis Vogt Ph.D. is Endowed Chair and Associate Professor of Optics at Monroe Community College. In addition to teaching responsibilities, Dr. Vogt was appointed to her role at MCC in September 2015 to strengthen and grow the optics and photonics pro-gram – the nation’s oldest two-year degree program for training technicians to work in the optics and photonics industry. Dr. Vogt received her B.S. as well as her Ph.D. in Optics from the University of Roch-ester Institute of Optics where her research focused on polarization engineering, coherence theory, and microscopy. Prior to joining MCC, Dr. Vogt was the Applications & Business Development Manager at Melles Griot and previous to that, designed contact lenses and intraocular lenses for Bausch + Lomb. In addition to her industry experience, Dr. Vogt holds three patents and has authored numerous papers, presentations, and publications in the field, including the definitions of “light” and “polarization” for The World Book Encyclopedia.

New

Courses

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24 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

General InformationRegistrationOnsite Registration and Badge Pickup Hours Galleria Lobby, 1st Floor

Monday October 16 . . . . . . . . . . 7:30 am to 5:00 pm

Tuesday October 17 . . . . . . . . . . 7:30 am to 5:00 pm

Wednesday October 18 . . . . . . . 7:30 am to 6:00 pm

Thursday October 19 . . . . . . . . . 7:30 am to 3:00 pm

Conference Registration Includes admission to all conference sessions, ple-naries, panels, poster sessions, admission to the Exhibition, welcome reception, coffee breaks, and online proceedings.

COURSE AND WORKSHOP REGISTRATIONCourses and workshops are priced separately. Course-only registration includes your selected course(s), course notes, coffee breaks, and ad-mittance to the exhibition. Course prices include applicable taxes. Onsite, please go to Course Desk after you pick up your badge.

Multiple facilities may be used for courses; allow yourself enough time to register, pick up your ma-terials, and possibly walk to a nearby facility before your course begins.

EXHIBITION REGISTRATIONExhibition-Only visitor registration is complimentary.

Early Registration Pricing and Dates Conference registration prices increase by US$150 (Students, $50) and course prices increase $75 after 29 September 2017. The online form will automati-cally display the increased prices.

SPIE MEMBER, SPIE STUDENT MEMBER, AND STUDENT PRICING• SPIE Members receive conference and course

registration discounts. Discounts are applied at the time of registration.

• SPIE Student Members receive a 50% discount on all courses.

• Student registration rates are available only to undergraduate and graduate students who are enrolled full time and have not yet received their Ph.D. Post-docs may not register as students. A student ID number or proof of student status is required with your registration.

PRESS REGISTRATIONFor credentialed press and media representatives only. Please email contact information, title, and organization to [email protected].

SPIE CashierRegistration Area Open during registration hours

REGISTRATION PAYMENTS If you are paying by cash or check as part of your on-site registration, wish to add a course, workshop, or special event requiring payment, or have questions regarding your registration, visit the SPIE Cashier.

RECEIPT AND CERTIFICATE OF ATTEN-DANCEPreregistered attendees who did not receive a receipt or attendees who need a Certificate of At-tendance may obtain those from the SPIE Cashier at Badge Corrections and Receipts.

BADGE CORRECTIONSBadge corrections can be made by the SPIE Cashier at Cashier. Please have your badge removed from the badge holder and marked with your changes before approaching the counter.

REFUND INFORMATIONThere is a US$50 service charge for processing re-funds. Requests for refunds must be received by 06 October 2017; all registration fees will be forfeited after this date. Membership dues, SPIE Digital Library subscriptions, or Special Events purchased are not refundable.

U.S. GOVERNMENT CREDIT CARDSU.S. Government credit card users: have your pur-chasing officer contact the credit card company and get prior authorization before attempting to register. Advise your purchasing agent that SPIE is considered a 5968 company for authorization purposes.

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25Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

Author / Presenter Information

POSTER SETUP INSTRUCTIONS Convention Center, Empire Hall

Wednesday 18 OctoberSetup . . . . . . . . . . . . . . . . . . . . .10:00 am to 4:00 pm

Session . . . . . . . . . . . . . . . . . . . . 4:30 pm to 6:00 pm

Poster presenters must set up their posters between 10:00 am and 4:00 pm on the day of their assigned presentation.

Paper numbers will be posted on the poster boards in numerical order; please find your paper number and post your poster in the designated space.• A poster author or coauthor is required to stand

by the poster during the scheduled poster session to answer questions from attendees.

• Presenters who have not placed their papers on their assigned board by 4:00 pm on the day of their presentation will be considered a “no show” and their manuscript will not be published.

• Presenters must remove their posters immediately after the poster session. Posters not removed will be considered unwanted and will be discarded. SPIE assumes no responsibility for posters left up after the end of each poster session.

Onsite Services

INTERNET ACCESSComplimentary wireless access available in the lobby areas and meeting rooms; instructions will be posted onsite.

SPIE CONFERENCE AND EXHIBITION APPSearch and browse the program, special events, participants, ex-hibitors, courses, and more. Free Conference App available for iPhone and Android phones.

SPIE BOOKSTOREGalleria, 1st Floor

Stop by the SPIE Bookstore to browse the latest SPIE Press Books, proceedings, and educational materials. While there, get a t-shirt or educational toy to bring home to the family.

SPIE EDUCATION SERVICESRegistration Area, Galleria, 1st Floor

Browse course offerings and the other education services available: SPIE courses, videos, and CDs as well as customized in-company courses.

Restaurant & City InformationEmpire Lobby, 2nd level

Monday through Wednesday . . . . . . . 8 am to 5 pm

CHILD CARE SERVICESGenerations – North East Rochester

585-613-7500

YMCA – Lewis Street Child Care Center 585-325-2572

NOTE: SPIE does not imply an endorsement nor rec-ommendation of these services. They are provided on an “information only” basis for your further anal-ysis and decision. Other services may be available.

URGENT MESSAGE LINEAn urgent message line is available during registra-tion hours: (585) 770-2361

LOST AND FOUNDFound items will be kept at Cashier until 5:00 pm each day and then turned over to Rochester River-side Convention Center Security. At the end of the meeting, all found items will be turned over to Rochester Riverside Convention Center, (585) 232-7200.

Food and Beverage Services

COFFEE BREAKSMonday . . . . . . .Highland Ballroom Foyer, 1st Floor

Tuesday through Thursday . . . . . . . .Exhibition Hall

Complimentary coffee will be served twice daily, at 10:00 am and 3:00 pm. Check individual conference listings for exact times and locations.

FOOD & REFRESHMENTS FOR PURCHASE

CAFÉ EXPRESSBack of the Exhibition HallHours of operation - As posted onsite

Hot and cold snacks, hamburgers, deli sandwiches, salads, and pastries are available for purchase. Cash and credit cards accepted.

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26 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

Travel to Rochester

SPIE OPTIFAB 2015 Joseph A. Floreano Riverside Rochester Convention Center123 East Main Street, Rochester, New York, 14604-1619 USA

Rochester is the third largest urban area in New York State. Rochester is a terrific place to visit, offering plenty of experiences to relish and remember, whether you’re in the mood for museum hopping or antique shopping, cultural adventures or sport-ing pleasures, scenic cruising or bargain choosing, history, mystery, and artistry.

ROCHESTER AIRPORT The Greater Rochester International Airport (ROC) is conveniently located 8 miles (10 minutes’ drive) from the Hyatt Regency and the Radisson Hotel Rochester Riverside, both connected to the Rochester Riverside Convention Center. The Hilton Garden Inn is 5 miles, a 15 minute drive from the airport.

Taxi from Greater Rochester International Airport Taxi from ROC to the event hotels and Convention Center is approximately $25 one way.

COMPLIMENTARY AIRPORT SHUTTLES Hyatt Regency RochesterComplimentary airport shuttle, 6 am - 11 pm

Radisson Hotel RochesterComplimentary parking for guests

Complimentary airport shuttle, 4:30 am - midnight

Hilton Garden InnComplimentary airport shuttle, 6 am - 10 pm

TAXITaxi from Greater Rochester International Airport Taxi from ROC to the event hotels and Convention Center is approximately $25 one way.

General InformationCar Rental

Hertz Car Rental has been selected as the official car rental agency for this

Symposium. To reserve a car, identify yourself as an Optifab conference attendee using the Hertz Meeting Code CV# 029B0022. Note: When booking from International Hertz locations, the CV # must be entered with the letters CV before the number, i.e. CV029B0022.• In the United States call 1-800-654-2240• In Canada call 1-800-263-0600, or 1-416-620-

9620 in Toronto.• In Europe and Asia call the nearest Hertz

Reservation Center or travel agent.• Outside of these areas call 1-405-749-4434• Book Hertz Online

Parking

ROCHESTER RIVERSIDE CONVENTION CENTER PARKING Radisson Hotel Rochester Riverside is compli-mentary for overnight guests and $10 for day visitors.

Hilton Garden Inn is complimentary to overnight guests.

Hyatt Regency RochesterValet Parking: Valet parking is available via the Motor Court Entrance on East Main Street. Valet Charge: $17.00 per car, per night with in/out privi-leges. The Hyatt Regency Rochester is connected to the South Avenue Parking Garage. Hyatt Guests use the South Avenue Parking Garage, which is managed and operated by Riverside Parking.

Hotel Overnight Self-Parking Overnight guests receive a discounted rate of $4.00 per night with in/out privileges.

Self-Parking Option Non-Overnight Guests It will be necessary to pull a ticket upon entrance and payment will be taken at the exit. All exit gates accept credit cards. If paying cash, please utilize the payment kiosk located on level 2, to the left of the Elevators next to the Hyatt entrance, or exit via the left hand South Ave Exit.

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27Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

Proceedings

Paid conference registration includes online Pro-ceedings of SPIE. In the tables below you will find product order numbers to use on the registration form.

Available as part of registration:Online Proceedings Volume—access to a single conference proceedings volume via the SPIE Digital Library. Available as papers are published.

Accessing Online ProceedingsTo access your proceedings:

• Go to http://spiedigitallibrary.org and sign in. If you do not have an SPIE account, create one us-ing the email address you used to register for the conference.

• Click the My Account link at the top of the page, then find the My Conference Proceedings tab, which will show your available proceedings vol-umes.

You can also access this content via your organiza-tion’s SPIE Digital Library account.

For assistance, contact SPIE:Email: [email protected] (North America): +1 888 902 0894Phone (Rest of World): +1 360 685 5580

DL. 10448 Optifab 2017 $123.75 Julie L. Bentley,

Sebastian Stoebenau

Online Proceedings Volume

Conference Attendees: You may purchase additional print volumes for $123.75 each.

Product Order Number

Collection Title/Included Volumes Meeting

Attendees

Price for separate purchase

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28 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

SPIE Event Policies

Acceptance of Policies and Registration ConditionsThe following Policies and Conditions apply to all SPIE Events. As a condition of registration, you will be required to acknowledge and accept the SPIE Registration Policies and Conditions contained herein.

Attendee Registration and Admission PolicySPIE, or their officially designated event management, in their sole discretion, reserves the right to accept or decline an individual’s registration for an event. Further, SPIE, or event management, reserves the right to prohibit entry or to remove any individual whether registered or not, be they attendees, exhibitors, representatives, or vendors, whose conduct is not in keeping with the character and purpose of the event. Without limiting the foregoing, SPIE and event management reserve the right to remove or re-fuse entry to anyone who has registered or gained access under false pretenses, provided false information, or for any other reason whatsoever that they deem is cause un-der the circumstances.

Payment PolicyRegistrations must be fully paid before access to the con-ference is allowed. SPIE accepts VISA, MasterCard, Ameri-can Express, Discover, Diner’s Club, checks and wire trans-fers. Onsite registrations can also be paid with cash.

SPIE Safe Meeting and Misconduct PolicySPIE is a professional, not-for-profit society committed to providing valuable and safe conference and exhibition experiences. SPIE is dedicated to equal opportunity and treatment for all its members, meeting attendees, staff, and contractors. Attendees are expected to be respectful to other attendees, SPIE staff, and contractors. Harass-ment and other misconduct will not be tolerated; violations will be addressed promptly and seriously. Consequences up to and including expulsion from the event as appropri-ate may be implemented immediately.

The SPIE anti-harassment policy can be found at http://spie.org/policy

Reporting of Unethical or Inappropriate BehaviorOnsite at an SPIE meeting, contact any SPIE Staff with con-cerns or questions for thorough follow-up. If you feel in im-mediate danger, please dial the local emergency number for police intervention.

SPIE has established a confidential reporting system for staff and all meetings participants to raise concerns about possible unethical or inappropriate behavior within our community. Complaints may be filed by phoning toll-free to +1-888-818-6898 from within the United States and Canada, or online at www.SPIE.ethicspoint.com and may be made anonymously.

Identification Requirement PolicyTo verify registered participants and provide a measure of security, SPIE will ask attendees to present a govern-ment-issued photo identification at registration to collect registration materials.

Individuals are not allowed to pick up badges for other attendees. Further, attendees may not have some other person participate in their place at any conference-related activity. Such other individuals will be required to register on their own behalf to participate.

Access to Conference Events / Access for Children Younger than 18All conference technical and networking events require a badge for admission. Registered attendees may bring chil-dren with them as long as they have been issued a badge. Registration badges for children under 18 are free and available at the SPIE registration desk onsite. Children un-der 14 years of age must be accompanied by an adult at all times, and guardians are asked to help maintain a profes-sional, disturbance-free conference environment.

Exhibition Hall Access / Access for Chil-dren Younger than 18Everyone who attends the exhibition must be registered and have a badge. Badges for children are free and avail-able onsite at the registration desk. Children under 14 years of age must be accompanied by an adult at all times. Guardians are asked to help maintain a professional, dis-turbance-free exhibition environment. Children under 18 are not allowed in the exhibition area during exhibition move-in and move-out.

Unauthorized Solicitation PolicyUnauthorized solicitation in the Exhibition Hall is prohibit-ed. Any nonexhibiting manufacturer or supplier observed to be distributing information or soliciting business in the aisles, or in another company’s booth, will be asked to leave immediately.

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29Tel: +1 360 676 3290 • [email protected] • #SPIEoptifab

SPIE Event Policies Recording PolicyConferences, courses, and poster sessions: For copyright reasons, recordings of any kind are prohibited without prior written consent of the presenter or instructor. At-tendees may not capture or use materials presented in any meeting/course room or in course notes on display without written permission. Consent forms are available at Speaker Check-In or SPIE Registration. Individuals not complying with this policy will be asked to leave a given session and/or asked to surrender their recording media. Refusal to comply with such requests is grounds for expulsion from the event.

Exhibition Hall: Recordings of any kind are prohibited without explicit permission from on-site company repre-sentatives. Individuals not complying with this policy will be asked to surrender their recording media and to leave the exhibition hall. Refusal to comply with such requests is grounds for expulsion from the event.

Capture and Use of a Person’s ImageBy registering for an SPIE event, you grant full permission to SPIE to capture, store, use, and/or reproduce your im-age or likeness by any audio and/or visual recording tech-nique and create derivative works of these images and re-cordings in any SPIE media now known or later developed, for any legitimate SPIE marketing or promotional purpose.

By registering for an SPIE event, you waive any right to inspect or approve the use of the images or recordings or of any written copy. You also waive any right to royalties or other compensation arising from or related to the use of the images, recordings, or materials. By registering, you release, defend, indemnify and hold harmless SPIE from and against any claims, damages or liability arising from or related to the use of the images, recordings or materials, including but not limited to claims of defamation, invasion of privacy, or rights of publicity or copyright infringement, or any misuse, distortion, blurring, alteration, optical illu-sion or use in composite form that may occur or be pro-duced in taking, processing, reduction or production of the finished product, its publication or distribution.

Laser Pointer Safety Information/PolicySPIE supplies tested and safety-approved laser pointers for all conference meeting rooms. For safety reasons, SPIE requests that presenters use provided laser pointers.

Use of a personal laser pointer represents the user’s ac-ceptance of liability for use of a non-SPIE-supplied laser pointer. If you choose to use your own laser pointer, it must be tested to ensure <5 mW power output. Laser pointers in Class II and IIIa (<5 mW) are eye safe if power output is correct, but output must be verified because manufactur-er labeling may not match actual output. You are required to sign a waiver releasing SPIE of any liability for use of potentially non-safe, personal laser pointers. Waivers are available at Speaker Check-In.

Unsecured Items PolicyPersonal belongings should not be left unattended in meeting rooms or public areas. Unattended items are subject to removal by security. SPIE is not responsible for items left unattended.

Wireless Internet Service PolicyAt most events, SPIE provides wireless access for attend-ees. Properly secure your computer before accessing the public wireless network. SPIE is not responsible for com-puter viruses or other computer damage.

No-Smoking PolicySmoking, including e-cigarettes, is not permitted at any SPIE event.

Agreement to Hold HarmlessAttendee agrees to release and hold harmless SPIE from any and all claims, demands, and causes of action arising out of or relating to your participation in the event you are registering to participate in and use of any associated fa-cilities or hotels.

Event Cancellation PolicyIf for some unforeseen reason SPIE should have to cancel an event, processed registration fees will be refunded to registrants. Registrants will be responsible for cancellation of travel arrangements or housing reservations and the applicable fees.

SPIE INTERNATIONAL HEADQUARTERSPO Box 10 Bellingham, WA 98227-0010 USA Tel: +1 360 676 3290 Fax: +1 360 647 1445 [email protected] • www.SPIE.org

SPIE EUROPE OFFICES2 Alexandra GateFfordd Pengam, Cardiff, CF24 2SA UKTel: +44 29 2089 4747Fax: +44 29 2089 [email protected] • www.SPIE.org

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30 SPIE Optifab 2017 • www.spie.org/ofb17program • Program current as of 6/19/2017

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