Spectrochemical analysis in the metallurgical industry-IUPAC.pdf
Photodiodes Ingle and Crouch, Spectrochemical Analysis Photons incident on the depletion layer...
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Transcript of Photodiodes Ingle and Crouch, Spectrochemical Analysis Photons incident on the depletion layer...
Photodiodes
Ingle and Crouch, Ingle and Crouch, Spectrochemical AnalysisSpectrochemical Analysis
Photons incident on the Photons incident on the depletion layer induce a depletion layer induce a current.current.
In most cases, best In most cases, best response in the NIR.response in the NIR.
Response is linear over 6 – Response is linear over 6 – 7 orders of incident radiant 7 orders of incident radiant powerpower
Spectral Response of Photodiodes
Shinya Inoue and Kenneth Spring, Shinya Inoue and Kenneth Spring, Video MicroscopyVideo Microscopy, Plenum Press, New York, 1997., Plenum Press, New York, 1997.
Avalanche Photodiode
http://micro.magnet.fsu.edu/primer/java/digitalimaging/avalanche/index.htmlhttp://micro.magnet.fsu.edu/primer/java/digitalimaging/avalanche/index.html
Hamamatsu CatalogHamamatsu Catalog
Douglas A. Skoog and James J. Leary, Principles of Instrumental Analysis, Douglas A. Skoog and James J. Leary, Principles of Instrumental Analysis, Saunders College Publishing, Fort Worth, 1992.Saunders College Publishing, Fort Worth, 1992.
Simultaneous Simultaneous detection in detection in a spectrophotometer.a spectrophotometer.
Photodiode Arrays (PDA or DAD)
Charge Coupled Device (CCD)Charge Coupled Device (CCD)
Ingle and Crouch, Ingle and Crouch, Spectrochemical AnalysisSpectrochemical Analysiswww.piacton.comwww.piacton.com
CCD Architecture
http://micro.magnet.fsu.edu/primer/digitalimaging/concepts/ccdanatomy.html and http://micro.magnet.fsu.edu/primer/digitalimaging/concepts/ccdanatomy.html and Bryce Marquis (Haynes Lab)Bryce Marquis (Haynes Lab)
Image Area
serial registeramplifier
SiO2 backing
Pixel Arrayinsulating oxide
Top ViewTop View
CCD Architecture
Bryce Marquis (Haynes Lab)Bryce Marquis (Haynes Lab)
One pixel
“Channel Stops” form horizontal pixel boundaries
3 electrodesform verticalpixel boundaries
Top View
Cross section
Insulating oxiden-type silicon
p-type silicon
Electrode
Charge Generation/Collection
N-type
P-type
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Incident photons excite electron-hole pairs,electrons gather in potential wells in each pixel
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N-type silica is doped with pentavalent species = excess electrons
P-type is doped with trivalent species = excess holes
CCD Rain Bucket AnalogyCCD Rain Bucket Analogy
Shinya Inoue and Kenneth Spring, Shinya Inoue and Kenneth Spring, Video MicroscopyVideo Microscopy, Plenum Press, New York, 1997., Plenum Press, New York, 1997.
1. Generation 2. Collection3. Transfer4. Measurement
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Time-slice shown in diagram
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Charge Transfer
Every third electrode is coupled, charge packetsare walked towards serial registry
to serial registry
http://spiff.rit.edu/classes/phys445/lectures/ccd1/ccd1.htmlhttp://spiff.rit.edu/classes/phys445/lectures/ccd1/ccd1.html
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Charge Transportation
• Pixels at end of the array dump charge into serial register• Serial register walks charge packets to amplifier, where it is
measured.
amplifier
Noise Sources in CCD
• Shot Noise– Statistical variation of signal over time
• Increases with the square of the intensity
• Dark Signal Noise– Caused by thermal liberation of electrons
• Strongly coupled to temperature
• Readout Noise– Summation of noise associated with amplification of
signal, and conversion from analogue to digital• Increases with the processing speed
222 )()()( readdarkshottotal NNNN
Other Issues: Bad Pixels
• Hot Pixels– Increased charge accumulation due to variations in chip
surface.• Dead Pixels
– Defective pixels that do not respond.
Increasing hot pixels
Other Features: Binning
• On Chip Pixel Binning– Increases S/N
• Shot noise decrease
– Increased speed– Less storage space
needed
– Decreases resolution
http://micro.magnet.fsu.edu/primer/digitalimaging/concepts/binning.htmlhttp://micro.magnet.fsu.edu/primer/digitalimaging/concepts/binning.html