Phasor Quick Ref Card

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GEInspection Technologies

Phasor XS™Quick Reference Guide 021-247-407, rev. 2

©2008 General Electric Company.

All rights reserved. We reserve the right to technical modications without prior notice.



Guide to the Keypad

-- Mode Selector: Phased Array or Conventional Operatin•

• -- View Select: Frame and/or A-Scan

• -- Gain Increment/Decrement: Press and hold to changedigital and analog gain

• -- ZOOM View: Expand the display to entire screen Press again to return to normal view mode

• -- Home Key: Returns the instrument to the phased arra

or conventional Home Menu. If held for 3 seconds, autoperforms a focal law calculation

• -- Freeze Key: Freezes the displayed image(s). If held for 3

automatically generates and stores a report



Guide to the Keypad cont...

• -- Power Key: On and off

• -- Test Key: Switches from Home to Knob MenuFunction Rotary Knob – Rotate the right-hand knob to change•the selected function.Gain Rotary Knob – Rotate the left-hand knob to change the •gain.



Setting Up

Press•

Press• to choose between PHASED ARRAY andCONVENTIONALSet units of measurement and operating language by•

pressing to activate the CONFIG menu. Then activ

REGIONAL submenu. Press next to UNITS or LANGturn the Function Knob to adjust.



Other basic features to adjust are accessed as follows•

Date –• CONFIG then STARTUP

Time –• CONFIG then STARTUPDisplay Brightness –• CONFIG then ST

Background Color –• DISPLAY then BA

Amplitude Color Palette –• DISPLAY then

Date and Time Format –• CONFIG then



Conguring for a Probe and Wedge

Access the probe and wedge settings by pressing to ac

PROBE menu. Then activate the PRB GEO submenu. Press

FREQUENCY, or NUMBER of ELEMENT, or PITCH to input valuon the probe body. Other probe and wedge features are adfollows:

Probe Part Number –• PROBE then PRB DAT

Probe Serial Number –• PROBE then PRB DAT

Wedge Part Number –• PROBE then WDGE DAT

Wedge Serial Number –• PROBE then WDGE DAT

Wedge Velocity –• PROBE then WDGE GEO




Access the probe and wedge settings by pressing to acPROBE menu. Wedge features are adjusted as follows:

Wedge Offset Z –• PROBE then WDGE GEO (user from Probe Index Point to contact surface – set to 0 wwedge is installed)

Wedge Angle –• PROBE then WDGE GEO ( user mwedge angle – set to 0 when no wedge is installed)

Wedge Front –• PROBE then WDGE GEO (user mefrom Probe Index Point to wedge’s front edge – requirthe origin offset feature)

Origin Offset –• PROBE then OFFSET (user measuwedge’s front edge to the target)




Markings on the probe body indicate the location of elemedirection that additional elements are arranged. To dene torientation of the probe’s elements with respect to the wedgeometry, access PROBE menu then WDGE DAT submenu.



Dening the Scan – LINEARThe sequence in which the phased array probe’s elements dened using features located in the SCAN menu.For LINEAR scan types set the following:

SCAN TYPE –• ELECTRNC (choose linear)

WAVE TYPE –• ELECTRNC (shear or longitudinal)

ANGLE START –• SCAN PATT (constant ring angle fo

First Element –• APERATURE (element where it begin

Number of Steps –• APERATURE (number of steps inAPRERATURE SIZE –• (number of elements in the ste

APRERATURE STEP –• (number of elements steppedstep to the next in the linear scan)

CALC –• SCAN PATT (calculate delay laws)



Dening the Scan - SECTORThe sequence and pattern at which the phased array probments re are dened using features located in the SCAN mSECTOR scan types set the following:

SCAN TYPE –• ELECTRNC (choose sector)

WAVE TYPE –• ELECTRNC (shear or longitudinal)

ANGLE START –• SCAN PATT (starting angle for secto

ANGLE STOP –• SCAN PATT (stopping angle for secto

ANGLE STEP –• SCAN PATT (angular increment betwFirst Element –• APERATURE (element where it begin

APRERATURE SIZE –• (number of elements in the ste

CALC –• SCAN PATT (calculate delay laws – required

changes in scan denition)



Pulser and Receiver SetupAccess the UT menu to set the Pulser and Receiver op•

Pulser Voltage – PULSER

Pulser Width (in nanoseconds) –• PULSER[(1/probe frequency) /2]

Receiver Frequency –• RECEIVER (includes lter sett

Rectication –• RECEIVER (includes halfwave, fullwa



Gate Position and Operating ModesThe instrument has two gates (A and B) which are congure

pressing to access the UT menu:

Select Gate to be Positioned –• GATE POS

Gate Starting Point –• GATE POS

Gate Width –• GATE POS

Gate Threshold –• GATE POS

Time of Flight Calculation –• GATEMODE (TOF MODE

Flank)Gate Triggering Logic –• GATEMODE (A gate with potriggers when crossed, negative logic triggers when nand also allows gate to be disabled)

Display or Hide Active Gate –• GATEMODE



Viewing ScansWith the phased array probe coupled to a test piece, there ways to view the resulting scans and measured data.

Press to choose between A-Scan, Sector (or Linear) Scaand Sector (or Linear Scan).

Press to access the DISPLAY menu and determine the mresults displayed as follows :

Link the A and Sector (or Linear) Scans Vertical Size –•

then set ASCAN MODE to BUD (Beam Ultrasonic DepthDisplay Leg Lines –• DISPLAY then BACKGRND, COLOControl the On-Screen Beam Cursor - press• two tiRight Knob.



Press• the LEG to change the number of displayed represent each pass of the ultrasound through the tes

Press• , UT, BASE, DISPLAY DELAY to adjust the Disp

Press• to set the Gain Increment Value -- The amouchange with each click of the Gain Knob. Options includened gain step and a gain knob LOCK. Press and hoswitch between analog and digital gain.



Viewing Measured Results

To determine which measured results are displayed, pressaccess the DISPLAY menu

Set Readings in Each of the Four Small Boxes –• RES

Set Readings in the Large Box –• RESULTS2CHOICES INCLUDE:BEAM— Angular position of the Beam CursorP%A/B— Peak amp. of all beams in scan currently capture

Gate A or B(as a % of FSH)PSA/B— Soundpath distance of peak beams in scan curr

captured by Gate A or BPPA/B— Projection distance of all beams in scan currentl

captured by Gate A or B



PDA/B— Material depth of all beams in scan currently caGate A or B.

PZA/B— Minimum material depth (incorrected according material thickness) of all beams in scan currently

by Gate A or BA%A/B— Amplitude (as a % of full-screen height) of the hi

to cross A-Gate or B-Gate in the beam selected beam cursor.

SA/SB— Sound-Path distance or duration represented byecho to cross a Gate in the beam selected by thSBA— Useful for calibration of the material velocity.PA/PB Projection distance according to the origin (front

wedge if “Probe/Origin Offset”= 0 from the probe



point (PIP) to the reflector represented by the A-DA/B— Material-thickness depth from the testpiece surf

volume corrected.ZA— Depth from surface, angle corrected, without leg

according to material thickness.OFF— No reading will be displayed in the reading box.



Zero OsetIf origin offset = 0, measurement are done from the front w

Top

Top

Backwall

P (for origin offset = 0

D

Z

D

S

VolumeCorrected

AngleCorrected



<>Zero OsetIf origin offset is less than or greater than zero:

Top

Top

Backwall

Origin offset

P<0P>0

D

Z

D

S

i h i l



Freezing the DisplayThe displayed image and measured values can be frozen b

. The freeze menu appears across the bottom of the disthese features to manipulate or evaluate the frozen image.

CURSOR 1—Operate a horizontal cursor with the Gain KnobVertical or Beam Cursor with the Function Knob. It also alloto display an ORIGIN LINE corresponding to the WEDGE FROORIGIN OFFSET (if any) distances to represent the user-de

target location.CURSOR 2—Operate a second (color coded) horizontal cursGain Knob and a Vertical or Beam Cursor with the Functionmenu also allows the user to display an ORIGIN LINE corres

the WEDGE FRONT plus ORIGIN OFFSET (if any)

MEAS 1 S l t t f READING ti th t



MEAS 1—Select up to four READING options that corresponpoint dened by the intersection of CURSOR 1’s horizontal acomponents.MEAS 2—Select up to four READING options that correspon

intersecting point dened by the intersection of CURSOR 2’and vertical components.RESULTS1—Display the four READINGS that were operationfreezing the display.

OFFLN DB—Change the Gain that’s applied to the frozen diFILENAME—Launch the data set naming (or report generatprocess.

W ki ith D t S t



Working with Data Sets Instrument settings and report contents can be stored in a le. When recalled, instrument settings are automatically reto those found in the stored data set. Access the data set r

functions by pressing to activate the FILES menu. A newcreated as follows:

Press• next to ACTION until STORE DATASET appearsPress• twice next to FILENAME. Use the two knobs a

instrument’s text-entry feature to input the new data Press• next to SOURCE/DEST until the desired le-sanation appears.INT MEMORY – A limited number of data sets can be s•instrument

SD CARD P i d ti ti f d t t



SD CARD – Primary destination for data sets•DIALOG PROBE – Abbreviated data sets can be stored•probes

With the desired data set name input, press• next t

complete the data set creation process.An existing Data Set is recalled, as follows:•

Press• next to ACTION until RECALL DATASET appea

Press• next to SOURCE/DEST until the le’s current l

appears.Press• next to FILENAME. Turn the Function Knob undesired data set is listed.

Press• next to ENTER to recall the data set, automasetting the instrument’s parameters to the stored con

Working with Data Sets



Working with Data SetsInstrument settings and report contents can be stored in a le. Stored data sets can be deleted or edited. Access the drelated functions by pressing to activate the FILES men

An existing Data Set is deleted as follows (refer to Card 2 fomaking adjustments):

Press• next to ACTION until CLEAR DATASET appears

Press• next to SOURCE/DEST until the le’s current lappears.

Press• next to FILENAME. Turn the Function Knob undesired data set is listed.

Press• next to ENTER to delete the data set, press indicated to conrm the deletion. Data sets can not be



An existing and active Data Set is edited, as follows:With the data set active, change instrument settings as des

Press• next to ACTION until STORE DATASET appears

Press• next to SOURCE/DEST until the current data sstorage location appears.

Make no changes to the name of the active data set. •next to ENTER to complete the data set saving proces

existing data set will be overwritten with the modied

Generating Reports



Generating ReportsReports can be generated and stored on the instrument’s SThese reports can contain various user-selected componening instrument settings, displayed image, report header, an

Reports are generated in much the same way as a data setto Card 2 for help in making adjustments):

Press• to access the FILES menu.

Press• below HEADER, MEMO, or REPORT to determ

report’s contents. Press next to EDIT, then turn the input header or memo text. Make the following settinHDR IN REPORT – Set to YES to include a headerMEMO IN REPORT – Set to YES to include a ve-line memoPARMS IN REPORT – Set to YES to include a listing of setting



IMAGE IN REPORT – Set to YES to include display image

Press• next to ACTION until STORE REPORT appears

Press• twice next to FILENAME. Use the two knobs a

instrument’s text-entry feature to input the new reporPress• next to SOURCE/DEST until the SD CARD destpears. Reports can only be stored on SD cards.

With the desired data set name input, press• next t

complete the data set creation process. The SD card dwill flash.

Pressing and holding• for three seconds will automastore a report.

Contact Us



Contact UsUSA

GE Inspection Technologies50 Industrial Park Rd.Lewistown, PA 17044

T: 717.242.0327F: 717.242.2606

GermanyGE Inspection TechRobert-Bosch-StraT: +49.2233.601.11

F: +49.2233.601.55

France

GE Inspection Technologies68 chemin des OrmeauxF-69760 Limonest

T: +33.472.179.216F: +33.472.179.254

ChinaGE Inspection Tech5F, Hongcao Buildi421 Hongcao RoadShanghai 200233, T: +86.21.3414.462F: +86.21.6485.719

JapanMedie Corp Bldg.82-4-14 Kichijoji-honcho,Musashino-shi,Tokyo 180-0004 JapanT: +81.422.67.7067F: +81.422.67.7068

UK & IrelandGE Inspection Technologies892 Charter AvenueCanley Coventry CV4 8AFT: +44.2476.47.25.63F: +44.2476.46.80.15

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