Overcome LTE-A UE Design Test Challenges · eNodeB and UE interoperate ... - For LTE CAT4 this...

February 13, 2014 1

(c) Agilent Technologies

Presentations: Joaquin Torrecilla

Demonstrations: Sandy Fraser

Panelist: Ken Thompson

Moderator: Dave Allen

Agilent Technologies Webcast February 13, 2014

Overcome LTE-A UE

Design Test Challenges

with Agilent’s New UXM

• LTE-A Carrier Aggregation technology, and relevance in the 4G and beyond era

• Critical LTE-A UE and chipset test challenges and solutions

- End-to-end IP data throughput test for LTE/LTE-A chipsets/ UE’s

- Receiver test complexities and challenges with 2CC CA, 4x2 MIMO and fading

- Quickly setup multiple test sequences that require different parameters for each

sequence

• Summary

• Panel style Q&A

February 14, 2014

Agilent Technologies webcast

2

Agenda

Industry Inflection Point Data Traffic Growth Driven By Smartphones

Today’s Focus: LTE-Advanced Carrier Aggregation

Benefits:

• Faster IP Data

• Wider bandwidths

• Reduced latency

• Improved spectrum efficiency

LTE Technology & Smartphones, 2014

Continued growth and opportunity

• 263 LTE networks in 97 countries*

• 1371 LTE devices*

• 918.6M Smartphone shipments**

• Global shift (US 15%, China 33%; India growing 460% in 2013-’17)**

Industry Trends

*Source GSMA, Jan 2014 **Source: IDC, Mar 2013

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http://www.idc.com/getdoc.jsp?containerId=prUS23982813


Industry Inflection Point Data Traffic Growth Driven By Smartphones

Today’s Focus: LTE-Advanced Carrier Aggregation

Benefits:

• Faster IP Data

• Wider bandwidths

• Reduced latency

• Improved spectrum efficiency

LTE Technology & Smartphones, 2014

Continued growth and opportunity

• 263 LTE networks in 97 countries*

• 1371 LTE devices*

• 918.6M Smartphone shipments**

• Global shift (US 15%, China 33%; India growing 460% in 2013-’17)**

Industry Trends

*Source GSMA, Jan 2014 **Source: IDC, Mar 2013

150 Mbps

IP data

150 Mbps

IP data

LTE Carrier # 1

20 MHz Bandwidth

LTE Carrier # 2

20 MHz Bandwidth

LTE-A Carrier Aggregation Solution: 10 or 20 MHz fragments aggregated to get 30 - 40MHz channel bandwidth

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Embargo: 21 Jan 2014

5

LTE-A

CA CC#1

LTE-A

CA CC#2

W-CDMA

HSPA+

LTE

Interference

& AWGN

Multipath

fading

CA

& MIMO

Adaptive

modulation

& coding

Doppler

Real world conditions Affecting UE Performance

Need network and channel emulation to verify

LTE/LTE-A device performance

• Fading conditions

• Doppler speed

• Degree of spatial diversity

• Noise and interference conditions

• Transmission mode used and transitions

between modes

• Influence of adaptive modulation & coding

1. End-to-end IP data throughput test for LTE/LTE-A chipsets/ UE’s

2. Receiver test complexities and challenges with 2CC CA, 4x2 MIMO and fading

3. Quickly setup multiple test sequences that require different parameters for each sequence

Overcome LTE-A UE Design Test Challenges with Agilent’s New UXM Assess design readiness with greater confidence

3. Test Parameter changes

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1. E2E IP Throughput 2. Rx characterization

Introduction: Types of UE Test Type of Test Test Description Benefits Issues

Conformance

Test/

Certification

A mandatory set of test

cases covering RF,

protocol and mobility

features

Ensures a consistent quality of

product across a range of

areas

Provides a level of guaranteed

inter-operability

Focuses on radio test and not the

user’s application

Does not include performance testing

(i.e., Data throughput and battery life)

Field Testing Test UE performance on a

real network

Find UE issues on a real

network.

Not repeatable

Often involves travel

Difficult to trouble shoot

Infrastructure

Lab IoT

Perform IoT testing in an

infrastructure lab to ensure

eNodeB and UE

interoperate

Allows thorough IoT testing

with real equipment

Limited lab availability

Often involves travel

Lab time can be expensive

Lab based

Performance

Testing

Functional test and

performance test under lab

conditions

Find software regression

issues

Benchmark performance

issues (Throughput, Battery

life)

Can highlight the issue but not the

problem

Design

Verification RF

Tests

Extend conformance-like

tests to different

combinations of PHY layer

parameters and tighter

limits

Ensure consistent quality of

product.

Test product to a larger extent

than mandatory requirements.

Test times can be an issue

Requires more flexibility on test

instruments.

Challenge #1

Challenge #2

Challenge #3

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E2E IP Data Throughput Value as a Measurement

• Benefits

• A simple measurement to make yielding quick results

• Tests a key performance parameter vs a headline theoretical limit

• Is a stress test that tests the complete phone

• Excellent at finding if you have a problem

• Issues

• Not so good at isolating what your problem is

• Treat with care

- Sometimes finds problems with the test and not the phone!

• Standardization work is progressing

• 3GPP is working on an Application Layer Data Throughput Test

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LTE-Advanced carrier aggregation

Cat 6

device

DL: 300 Mbps

UL: 50 Mbps

Challenge #1

End-to-end IP data throughput test 3GPP 37.901 Application Layer Data Throughput Testing

Application

Server

System

Simulator

Channel

emulator Test UE

Application

Layer Protocol

System Simulator Channel emulator profiles

FTP on TCP/IP HSPA

- settable parameters and

power levels, closed loop CQI

HSPA

- static, PB3, PA3, VA3, VA30, A120

UDP on IP LTE

- settable parameters and

power levels, closed loop CQI

LTE

- static, EPA5, EVA5, EVA70,

EVA200, ETU70

sf0 sf1 sf2 sf3 sf4 sf5 sf6 sf7 sf8 sf9

- 3GPP 37.901 is defined with no PDSCH data in sub-frames 0 and 5

- For LTE CAT4 this reduces the headline rate from 150Mbps to 120Mbps (20MHz channel)

- 3GPP 37.901 Application layer Throughput also excludes TCP/UDP protocol overhead and re-

transmissions which reduce the measurement result further

PDSCH data

DL

UL

DL

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Challenge #1

CAT6 DL E2E IP Throughput How we get 300Mbps …

• Assumes 2x2 MIMO, 2 component carriers, 20MHz, MCS=28, full RB allocation

TCP

IPv4

PDCP

RLC

MAC

PHY

App DATA

DATA DATA 75376 PHY bits

9422 Bytes 75376 PHY bits

9422 Bytes

#CC1 #CC2

0.1ms

DATA x12

1500 Bytes (Ethernet MTU)

DATA DATA DATA DATA x12 DATA DATA DATA

1460 Bytes

App DATA

App DATA

x24

x24

App DATA

x2 x2

Repeated 24 times

x24

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301.5 Mbps OTA

280.3 Mbps

~7% overhead

Challenge #1

E2E IP Throughput

CAT6 E2E IP Measurements on UXM

300Mbps achieved with 2x CCs and 20MHz bandwidth

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Challenge #1

Sustained maximum

end-to-end IP data throughput

with and without impairments

Demonstration #1

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Challenge #1

IP Data Throughput Measurements

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Challenge #1


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Challenge #1


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Challenge #1


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Challenge #1

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IP Data Throughput Measurements Challenge #1


IP Data Throughput Measurements IP Data Throughput Measurements

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Challenge #1


IP Data Throughput Measurements IP Data Throughput Measurements

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Challenge #1



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Challenge #1



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Challenge #1



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Challenge #1

UE Conformance Test Testing the Receiver

Test Reference Test Description Test Purpose

RCT

(Radio conformance Test)

3GPP 36.521

Section 6: UE Tx Parametric Measurements Ensure good quality UL

Section 7: UE Rx Testing Characterise Rx demod performance under

different conditions

Section 8: Performance Test

Rx Throughput/ BLER performance test with

L1 control loops

Test Throughput and BLER with closed loop

control loops in faded conditions

Section 9: Reporting Tests

UE reporting of channel conditions for L1

control loops

Test UE’s ability to estimate and report on

channel conditions

RRM

(Radio Resource

Management)

3GPP 36.521-3

Test UE’s support for mobility management

procedures – measurement reporting, link

monitoring, cell selection etc.

Test mobility functions under varying RF

conditions

PCT

Protocol/ Signaling

Conformance Test

3GPP 36.523

Test UE’s provides the correct protocol

exchange for specific implemented features

Ensure correct protocol message exchange

under ideal conditions

• For Rx characterization we are focusing on the conformance tests

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Challenge #2

Rx test complexities and challenges Section 7 – Receiver Sensitivity Measurements for CA

PCell

SCell

+

+ UE

• Test both Reference level sensitivity and Maximum input level for both receivers

• Additional ACS, blocking, intermodulation and spurious tests are required to complete this section

3GPP 36.521-1 Receiver Sensitivity Measurements

7.3A.1 Reference sensitivity level for CA (intraband

contiguous DL CA and UL CA)

7.3A.2 Reference sensitivity level for CA (intraband

contiguous DL CA without UL CA)

7.3A.3 Reference sensitivity level for CA (inter-band DL CA

without UL CA)

7.3A.4 Reference sensitivity level for CA (intraband non-


7.4A.1 Maximum input level for CA (intra-band contiguous

DL CA and UL CA)

7.4A.2 Maximum input level for CA (intra-band contiguous

DL CA without UL CA)

7.4A.3 Maximum input level for CA (inter-band DL CA

without UL CA)

7.4A.4 Maximum input level for CA (intra-band non-


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Challenge #2

Rx test complexities and challenges Section 8 – Demodulation performance tests for CA

• Throughput testing under closed loop conditions with both fading and noise

• Verify the demodulation performance of PDSCH/PCFICH/PDCCH/PHICH

with a given SNR and fading channel for different Transmission Modes

• Includes throughput testing at PDCP level (8.7.x)

PCell

Channel

emulator

AWGN

AWGN

+

+

SCell

Channel

emulator

AWGN

AWGN

+

+

+

+ UE

3GPP 36.521-1 Receiver Performance Tests

8.2.1.1.1_A.1 FDD PDSCH Single Antenna Port Performance for CA

(intraband contiguous DL CA)


(interband DL CA)


(intraband non-contiguous DL CA)

8.2.1.3.1_A.1 FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA



(interband DL CA)

8.2.1.3.1_A.2_

1

FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA

(interband DL CA)


(intraband non-contiguous DL CA)

8.2.1.4.2_A.1 FDD PDSCH Closed Loop Multi Layer Spatial Multiplexing

4x2 for CA (intraband contiguous DL CA)


4 x 2 for CA (interband DL CA)


4 x 2 for CA (intraband non-contiguous DL CA)

8.2.2.1.1_A.1 TDD PDSCH Single Antenna Port Performance for CA


8.2.2.3.1_A.1 TDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA


8.2.2.4.2_A.1 TDD PDSCH Closed Loop Multi Layer Spatial Multiplexing

4x2 for CA (intraband contiguous DL CA)

8.7.1.1_A.1 FDD sustained data rate performance for CA (intraband

contiguous DL CA)

8.7.1.1_A.2 FDD sustained data rate performance for CA (interband DL

CA)

8.7.1.1_A.3 FDD sustained data rate performance for CA (intraband

non-contiguous DL CA)

8.7.2.1_A.1 TDD sustained data rate performance for CA (intraband

contiguous DL CA)

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Challenge #2

Rx test complexities and challenges Section 9 – Reporting of CSI tests for CA

• Statistical analysis of UE reported CSI (Channel Status Information)

- CQI Reporting under AWGN and fading

- Reporting of PMI and RI

• Test BLER =10% for an MCS which equates to the reported CQI 1

3GPP 36.521-1 Reporting of Channel State Information

9.6.1.1_A.1 FDD CQI Reporting under AWGN conditions – PUCCH

1-0 for CA (intraband contiguous DL CA)


1-0 for CA (interband DL CA)


1-0 for CA (intraband non-contiguous DL CA)

9.6.1.2_A.1 TDD CQI Reporting under AWGN conditions – PUCCH

1-0 for CA (intraband contiguous DL CA)

9.6.1.2_A.2 TDD CQI Reporting under AWGN conditions – PUCCH

1-0 for CA (interband DL CA)

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PCell

Channel

emulator

AWGN

AWGN

+

+

SCell

Channel

emulator

AWGN

AWGN

+

+

+

+ UE

Challenge #2

CQI/PMI/RI

CQI index modulation coding rate x

1024

efficiency

0 out of range

1 QPSK 78 0.1523

2 QPSK 120 0.2344

3 QPSK 193 0.3770

4 QPSK 308 0.6016

5 QPSK 449 0.8770

6 QPSK 602 1.1758

7 16QAM 378 1.4766

8 16QAM 490 1.9141

9 16QAM 616 2.4063

10 64QAM 466 2.7305

11 64QAM 567 3.3223

12 64QAM 666 3.9023

13 64QAM 772 4.5234

14 64QAM 873 5.1152

15 64QAM 948 5.5547

UE Reporting

CQI/RI Histograms

CSI reporting under faded conditions

EPA5 EVA5

ETU70 ETU300

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Challenge #2

CSI measurements

to validate UE performance under reported CSI

configurations and impairments

Demonstration #2

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Challenge #2

CSI Measurements

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Challenge #2


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Challenge #1


IP Data Throughput Measurements CSI Measurements

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Challenge #2



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Challenge #2


CSI Measurements

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Challenge #2


CSI Measurements

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Challenge #2


CSI Measurements

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Challenge #2


CSI Measurements

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Challenge #2


CSI Measurements

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Challenge #2



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Challenge #2


CSI Measurements

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Challenge #2

Design Verification RF tests complexity and challenges

• Mandatory requirements only test a subset of all

the different combinations of physical layer

parameters

• Some of the features are not required for

conformance testing, as they are defined for

future use; but chipset vendors must test them

during design phase

• Often, physical layer parameters are

interrelated. Recalculation of other parameters

are needed when changes are done

• Chipset designers need to start testing before

the L2 is ready – non-signaling mode

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Challenge #3

Test Parameter changes

• Sensitivity tests

• Sweep DL power level

• Sweep number of resource

blocks and offset

• Sweep modulation and

coding schemes

• Receiver Performance –

Demodulation of PDSCH

• Sweep CFI value

Design Verification RF Tests Some examples

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Challenge #3

RB Allocation

Resource Allocation Flexibility on UXM

- RB Allocation: number of RB and offset

- MCS: per SF, per codeword

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Challenge #3

DL channel resource allocation

flexibility for receiver testing

Demonstration # 3

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Challenge #3

Resource Allocations

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Challenge #3



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Challenge #3



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Challenge #3



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Challenge #3

Resource Allocations Resource Allocations

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Challenge #3



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Challenge #3



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Challenge #3



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Challenge #3



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Challenge #3



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Challenge #3

• Unique receiver test Flexible channel allocation and closed-loop testing

• Trusted transmitter test X-Series measurement science

• Sustained bidirectional 300 Mbps/50 Mbps E2E IP data

• Most highly integrated solution: multiple cells, carrier aggregation, 4x2 DL MIMO, integrated fading and built-in application server

Ensure realistic category 6 performance

Achieve design confidence

LTE-Advanced carrier aggregation

Cat 6

device

DL: 300 Mbps

UL: 50 Mbps

Gain new insights for LTE-Advanced Wring out designs with a broad range of integrated capabilities

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Be ready for 4G and beyond Expand capabilities with most advanced platform architecture

• Designed for next advancements in

antenna techniques, component

carriers & data rates

• Two independent 100 MHz RF transceivers

• Two receiver paths per cell

• Enables multiple cells, carrier aggregation,

higher order MIMO, and integrated fading

• Multi-format capable

• Supports LTE FDD and TDD now

Future-ready platform

Extensible architecture

• High-speed interconnects,

upgradeable processors and

expansion slots

Versatile touchscreen

• Next-generation ease of use,

flexibility for the future

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Introducing Agilent’s UXM

Q&A

Assess Design Readiness

with Greater Confidence

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UXM Product information

• UXM Wireless Test Set Product Page: www.agilent.com/find/E7515A

• UXM Brochure: http://cp.literature.agilent.com/litweb/pdf/5991-3849EN.pdf

UXM Demonstrations and Application Videos

Click here to visit the Playlist

• End-to-end IP Data Throughput demonstration

• Allocations Flexibility demonstration

• CSI measurements demonstration

• LTE-A Carrier Aggregation Technology and Test Challenges

LTE-Advanced Carrier Aggregation Flash animation

LTE-Advanced Resources

• Carrier Aggregation: Fundamentals and Deployments Webcast

• Application Note: http://cp.literature.agilent.com/litweb/pdf/5990-6706EN.pdf

For more information…

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Contact Dave Allen at [email protected]

http://www.agilent.com/find/E7515A

http://cp.literature.agilent.com/litweb/pdf/5991-3849EN.pdf





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Agilent’s Next Generation Wireless Test Sets Is your device ready?

Ramp up rapidly & optimize

full-volume manufacturing

• Ultimate scalability & port density

• Broadest multi-format coverage

• Highest throughput & yield

E7515A UXM Wireless Test Set Make a clear call

E6640A EXM Wireless Test Set Solve today, evolve tomorrow

Assess design readiness

with greater confidence

• Gain new insights for LTE-A

• Be ready for 4G and beyond

• Make a seamless transition

February 14, 2014


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Contact Dave Allen at [email protected]


Introducing Agilent’s UXM

Q&A



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E7515A UXM Wireless Test Set Make a clear call

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This Webcast

Joaquin Torrecilla: [email protected]

Sandy Fraser: [email protected]

Ken Thompson: [email protected]

Regional Contacts

Americas

Dave Allen: [email protected]

Europe

Herve Oudin: [email protected]

Asia

Yau-Mun Yip: [email protected]

Japan

Isao Yamaguchi: [email protected]

Contact Agilent












Thank You!

February 14, 2014


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Overcome LTE-A UE Design Test Challenges · eNodeB and UE interoperate ... - For LTE CAT4 this...

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