國家度量衡標準實驗室運作計畫（第三年度 ·...

92-1403-31-01-00-00-00-79

PG9204-0649 92-1403-31-01-00-00-00-79 92-1403-31-01-00-00-00-79 92 9001-9312 306,980 0% () 100%

() 100% 100% 0%

75% 75% 0% 306,980 305,498 99.52%

940,356 938,636 99.82%

Transfer StandardCalibrationMeasurementComparisonTraceabilityAssessmentProficiency TestingResearch on Nanometrology

HSU, CHANG HARN,BOH-SHENG DUANN, JIA-RUEY LIN, TZENG-YOW JOU, NAIN-LING HWANG, GWO-JEN PENG, GWO-SHENG

HWANG, ZEN-KUAN

1.(1)109

4,015 (2)81972368109 (3)

(4)7 (5)236451769

2.(1)186145 (2)TC28 (3)92CNLA (4)APLAC MRA (5)ILACAPLAC

3.

I

4.

5.()

6.8914116855,008

1. Standard maintenance and services project: (1) To secure 109 sets of system equipment, environmental facilities, etc, ensured regular operations and service quality of the National Measurement Laboratory , and provided calibration service for 4,015 items. (2) To conduct 8 international comparisons, 19 oversea traceabilities in 72 items, 368 domestic traceabilities, maintained equivalence of 109 systems of the National Measurement Laboratory with international standards. (3) To successfully initiate the International Mutual Recognition Arrangement, vigorously participated in third party accreditation including re-assessments of dimension, electricity, optical radiation, microwave this year. (4) To accomplish 7 researches in system improvement to reduce measurement uncertainty, expanding measurement parameters. (5) To conduct 23 seminars and 6 on-job-training programs, total 451 firms, 769 personnel were trained.

2. Chinese National Laboratory Accreditation project: (1) To promote and execute laboratory accreditation, completing 186 initial assessments, 145 re-assessments, and held laboratory surveillance activities. (2) To establish working groups and conducted 28 meetings of Technical Committee. (3) To organize CNLA 2003 annual meeting and on-job-training for those in charge of laboratory and to publish the annual report. (4) Participated the APLAC MRA assessment to Malaysia and Japan. (5) Vigorously participated the member meeting of ILAC, APLAC and international activities, maintaining mutual recognition accreditation.

3. Establishment of Standard Capability & Extension project: to establish or expand the calibration system to gradually satisfy traceability requirements of all parties. 4 projects were proceeded this year: gravimetric hygrometer standards, primary calibration system for long gauge blocks, areostatic balance dead weight standard system, cryogenic absolute radiometer measurement system.

4. Metrology Research & Development project: to develop standard related measuring techniques and established national own and international recognized standard development abilities. 4 projects were proceeded this year: laser optical-frequency standards, the torsion-type microforce standards, the standard system of trace moisture, and single-electron tunneling electrical standards.

5. Legal Metrology Technology Development project: is referance to the requirements of the domestic and international legal metrology equipment

II

manufacturing, usage and development and to establish related regulation for verification and pattern approval. Accomplishment included theverification regulations for the Net Quantity (volume) of Product in Prepackages, family verification for the Diaphragm Gas Meter, evaluation model for the designated verification body of Evidential Breath Alcohol Analyzer, and verification regulation for the Load Cell and the modulus verification for the Non-automatic Weighting Instruments.

6. In summary, NML presented 8patents , acquired 9 patents certificates , published 141 papers, issued 168 technical reports and resulted in NT$55,008 thousand revenue.

222

III

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http://www.bsmi.gov.tw/upload/b04/public/files/achievemen/92NML-11.xlshttp://www.bsmi.gov.tw/upload/b04/public/files/achievemen/92NML-12.ppt

92.01.26~92.02.27

NIMT

92.02.19 FY91

92.03.12 FY92

92.03.23~92.03.25

APMP

APMP

92.3.31

9

92.4.11

8

NMLCNLA

92.6.5 SARS

92.07.18 CMC

BIPM

92.08.01~92.08.09

BIPM

APMP

92.09.03 FY92

1

92.09.03

92.10.13~92.10.17

22

92.11.06

92.11.11

92.11.17~92.11.18

NMIJ SPM

92.11.21

92.12.01~92.12.05

APMP

APMP

APMP IIZUKA

92.12.24

CNLA

CNLA

CNAB

93.1.1

2

()

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(1)

(2)

(3)

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(1)

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1 2 3 4 5 6 7 8 9 10 11 12

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(16)

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(22) (23)

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7

92

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MSVP/

B.

/

NML

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(16) (17)

(5)

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(11)

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92

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MSVP/

(1)

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(5)

9

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92

1 2 3 4 5 6 7 8 9 10 11 12

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(2)

(3)

(4)

(5)

(6)

(7)

92

1 2 3 4 5 6 7 8 9 10 11 12

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Quadrature

Quadrature

Quadrature

Quadrature

B.

(1)

(3)

(2)

(5)

(6)

(4)

11

(1)(2)

(3)

(4)

(5)(6)

(7)(8)

(1)

(2)

(3)

(4)

92

1 2 3 4 5 6 7 8 9 10 11 12

C.

/

D.

12

4.

(3)

(1)

(2)

(4)

(5)

(6)

92

1 2 3 4 5 6 7 8 9 10 11 12

A.

(

532nm

)

(

)

B.

(1)

(2) (3) (4)

(10)(9) (11)

(12) (13) (14) (15)

(16)

(5) (6) (7) (8)

13

(1)

(2)

(1) (2) (3)

(4)

(5)

(6)

(7) (8) (9)

(3)

(4)

(5)

(6)

92

1 2 3 4 5 6 7 8 9 10 11 12

C.

nanowire

D.

14

5.

92

1 2 3 4 5 6 7 8 9 10 11 12

A.

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(1)

(2)

(3)

(4)

(5)

(6)

(4)

(5)

(7)

15

1.

A.

(6.3)

(5.2)

(

ICTMSVP)4000

4,015

12

GPS

CNLA

FY91

CY88-91

CNLANML

8

16

4

LIMS

///

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4,000

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36834,024,555

/26 33//

5991,035

2,223,704

89~946

290246,180

137,100

383,280

ICT 179MSVP70RP 16FR4

154,982

72

NML NML

157,543

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)()()(MGR

Technology)12230

1

/

192

C.

109

2

FY92

FY92

211 368

--107

--494

--751220

--517

--34

--13

--355

--37

19 1972

10 8

18

D.

1.50kN~2000kN FY92

0.01%~0.02%

2003/11/03~11/06

APMFIntroduction of Taiwan

Calibration Method for

Weigh-in-Motion

2.FY92-93

100 Hz15 m

100 m

PZT

Isolator

PZT

CNLA

3. FY91-93

19

91

4.FY92-93

0/45 :380 nm~780 nm:1 %~99 % 0.8 %k=2 0/d :380 nm~780 nm:1 %~99 % 0.63 %k=2

0/45

0/d

4

0/d ICTMSVP

5.FY92-93

:1~120kPa :0.5~1Pa(95%)

HP10889BDLL

VbLab ViewVb

LabViewHP10889B

DLL

6. FY92-93

:0~120V:0~5A-90 ~ +9060 Hz30(1800 Hz)

60 Hz30

(1800 Hz)

0.1 mW /VA

0.2 mW /VA

PLL

7.FY92

18000 m3/hr

ICT 2 MSVP

21

2.

A.

1. 1

TC 4

6 4

2.

3.

TC8 6 1

92

6

6/27

6

1.7/2217

2.8/1818

3.9/2319

4.10/2120

5.11/2521

6.12/2322

22

(GG06)

(GG05)DNA

()

TC16

1 92.9.29

1 92.9.29

1 92.9.29

1 92.9.29

2 92.9.29

92.11.28

2 92.9.29

92.10.17

1 92.9.29

2 92.9.29

92.11.11

1 92.9.29

1 92.9.29

2 92.9.29

92.11.7

1 92.9.29

16

23

B.

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3.

CNLA

704

158

APLAC NEWS 10

929

10

3

12/5 CNLA()

82

12/8 CNLA()

80

12/15 CNLA()

226

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()

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92.12.31

: 89

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14535

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22332124

279

4,220,000

1,146,00012,105,605

182,600

25

368,20018,022,405

10

F.

1. APLAC MRAILAC MRA ILACAPLAC APEC 2. APLAC MRA 3.

(APLACILAC) MRA

APLACILAC

CNLAILAC

APLACAPEC

ILACAPC

APLAC MRA

BPSLASAPLAC MRA

IANZHACCP

GLP

ILAC

CNALAPLAC

MRADSMAPLAC

MRA

APLAC

IAJapanAPLAC

MRA

G.

1.

2.

3.

21

8

()

26

CNLA

4.

5. APLAC

APLAC

6.

8

2003APLAC11

56

9

CNLA

APLAC

H.

1. ISO/IEC Guide 58

2. CNLA

3. CNLA

CNLA

CNLA

CNLA

27

I.

CNLA

CNLA

J.

28

3.

A.

Quadrature 1000Hz 1592Hz 210-7

Quadrature

1000pF100k1592Hz

Quadrature

1000pF

Quadrature

1592Hz

110-7 Quadrature

1592Hz1000pF

100k110-7

B.

LVDT

1.

2. 0.5 m/m

00 1/2

3. 100 ~ 1000 mm

4. K01

1.2m

30 nm

0.01 m

+(0.24210-6L)2]1/2m1m0.5m

C.

(10N~500N) 1.30

110-5

2.(5~500)N

3.:0.002%

4.ISO

376(1999),ASTM E74,JIS,

,

5.

6.

50

2

()110mm

(1~500)N

ISO

376(1999)ASTM E74

94

CNLA

9

40

151N10

2N525

10N1020N5

30N1040

110-5

(

)(

92CNLA)

2

303

40

1N102N

51N~20N

10N1020N5

10N~200N

30N10

30N~300N

1N~500N

0.002%

30

3

warm-gear

ISO 376(1999)

ASTM E74JIS

(NIM)100N200N

D.

1.

2.

3.

4.

8/212/17NIST

31

4.

A.

1.( 532nm) 532 nm

657 nm

657 nm532nm

657 nm532nm

657 nm

657 nm

Fabry-Perot

10-8

10-7

532 nm

10-13

532 nm

Fabry-Perot

75 %

Electronics letters

657 nm

Fabry-Perot

10-8

10-8

(

)

2.(

) 1556 nm1314 nm

778 nm

1556 nm778 nm

633

nm657 nm852 nm1064 nm

1556 nm 778 nm

1314 nm

()

32

B. 1.

50MHz100 MHz

100 MHz PLL10 MHz PLL

510-131s

GPS

6dBm

10MHz-23dBm 50MHz

50 MHz100MHz

10 MHz PLL100MHz PLL

H Maser

810-131s

810-131sGPS

H

Maser

810-131s

2. f-2f

AOMPZT Loop Filter

HV AMP1GHz Photo

Detector

f-2f

30dB AOMPZT Loop Filter1GHz

Photo Detectorpump

power

f-2f

633-946nm 1100nm

30dB40dB

33

510-131s

THz

THz

633nm

1064nm Nd:YAG

BIPM

BIPM

92

600-1800nm

34

510-131s

532nm633nm

657nm

600Hz

1064nm

210-121s 2003

Construction of a

frequency-stabilized mode-locked

femtosecond laser for optical

frequency metrology

tracking

stability:3x10-13@1s

RF

RF

(stability:8x10-13@1s)

Analog Phase detectorDigital

Phase detector

Analog Phase detector

Analog Phase detector

5kHz

5x10-13@1s

5x10-12@1s

H

maser

H maser

532nm

633nm657nm

657nm

657nm

852nm

35

Diode Laser

Frequency Stabilization with

Two-Frequency Doppler-broadened

Absorption Spectroscopy

657 nm

Fabry-Perot

10-8

10-8

760nm

3.

GPS

36

C. 1. < 10

-4

Nm/rad 25um67cm

FFT

1066I=2475g

cm2K= 8.610-9Nm/rad < 10-4 Nm/rad

0.0001rad

nN

2. 510-8 rad

1.910-8 rad9.8210-9 rad

3. < 10-4 N

(CCD)

DA

4. < 10-8 N

218.5

10-8 N-m0.11 m

10-7 N

10

10

5.

1 nN

Torsion strip Dalsa line

scan CCD 7 7m m pixel size8192 pixels32767

2.5

x5 pixel;

T0.35 ;

P4.3 mBar;

H1.6%

37

6. Torsion Strip 0.0149

Hz

torsion strip0.09 m

I=0.0083 2kg m I=0.0003 2kg m 0.0172 2kg m =1.5110k -418.5 kgsource mass

Fourier transform3800

9.76 pixels

6.8310

030

-5 rad

T1.031310-8 N-m

81.0314 10T N m= G

11 26.67 10 /N m

D. 1.

nanowire

nanowire

0.5ppm

nanowire

CNT/Nafion QCM

15ppm

ZnO nanowire

SEMnanowire

AMPS

ZnO nanowire

2.

QCM

38

3. 0.5~100

ppm

0.5~10000 ppm

4.

nanowire

CNT sensor application in Measurement of the

low humidity systempaperSensors &Actuators

CNT/Nafion

5.

QCM

6.

ZnO

nanowire

anowire/Nafion/TEOS

ZnO wire QCM

nanowire

FY94

E. 1.

OxfordHe3

2.

0.35 K

He3

He3

He3

924.2 K93

0.35 K

39

3.

< 60 nm

SOI

< 60 nm

4.

< 60 nm

AFM

30 nm

50 nm

5.

50 nm35 nm

40

6.

I-V

< 60 nm x 60 nm

60 nm x 40 nm

geometric-defined

I-V <

60 nm x 60 nm60 nm x 40

nm

(Coulomb Oscillations) 2EP2DS-15 (International Conference on Electronic Properties of Two-Dimensional Systems 2003 July, Japan)(1)Magnetic-field-induced phase transitions in a Si/SiGe hole

system(2)Large effective mass enhancement of the InAs1-x Nx

alloys in the dilute limit probed

by Subnikov-de Hass oscillations 1:

922/

1Solid State

Communications 126, p.197 (2003),

On the equivalence between magnetic-field-induced phase

transitions in the integer quantum

Hall effects.

2

,

SCIA simple method to fabricate Si-based single

electron transistor

41

5.

1.()

()

()

2.

()

42

3.

APLMF

ETCCMS

(EBA)

4.

()

NMi

43

5.

(

)

()CNPA-76

CNPA-76

(/)

44

1.

( )

( )

(1).

87.75 87.62

(2).

17.00 17.30

(3).

A.

B.

C.

D.

7.67 7.37

(4).

A.

B.

C.

D.

11.08 10.85

(5).

1.50 1.42

15

46

2.

68.21 40.71 11.08 5 0 17.01 56.39 31.01 20.59 0 125 92

65.10 45.85 8.27 5.34 0 17.38 58.47 29.27 19.44 0 124.56

1. 1

2. 8

47

1.

()

134,038 43.7 132,959 43.52

53,413 17.4 53,564 17.53

4,690 1.5 4,885 1.60

7,412 2.4 6,980 2.28

13,355 4.4 13,441 4.40

49,232 16.0 48,836 15.99

2,461 0.8 2,461 0.81

264,601 86.2 263,126 86.13

()

42,379 13.8 42,372 13.87

- -

42,379 13.8 42,372 13.87

306,980 100.00 305,498 100.00

1.

2.

48

2.

181,535

100,000

17,172

-

18,000

900,000 538,262

2,200,000 2,223,704

50,721,000 52,046,960

53,939,000 55,007,633

49

1. PTB

92 4 6 PTB PTB

Diverter mechanism

diverter

WGFF APMP

Key Comparison PTB

PTB 1200 Dr.Poschel Dr.

Engle 91 10 20~150mm

200~400mm 0.3~2100m3/h 35m 35m3

3.5 pump 6

0.3ton3ton30ton

load cellMettler magnetic-force-compensation system center

loading 380m3

0.02%

@ 95% confidence level 250liter1.6~1600m3/h

compact prover

compact prover

Flying-Start-and-Finish

ISO 4185

(1) nozzle

50

(2)(3)

NMIJ double diverting blade

NIST Dr. (T.T.Yeh)

double-drain channel

timing error NEL spear valve

fish-tail

FY92-93

PTB

pipe prover

51

PTB (CFD)

nozzle

2% stepping motor

nozzle 3~450mm diverter 1:100

NISTNELNMIJ diverting blade

Heidemhein rotary encoder 50micro-second

rotary encoder switching point

simulation minimum timing error

52

Nozzle

Steeping motor and

Drive units

Diverter

Diverter Unit and

encoder

NIST diverter design NMIJ Design

PTB diverter design

diverterpiping

supportreference meter volumetric type compact prover

control & data acquisition system

Mr. Eggerstein Mr. Eggerstein

PTB

timing error meter 3ton

10100220m3/h nozzle

switching position

rotary encoderPTB switching position

PTB LDV

EngineerTechnician

Dr. Dopheide LDVDr. Kramer

Dr. WendtDr. Muller LDV 2003/6/1

PTB()

Dr. Dopheide Dr.Wendt Liquid Group Transfer

Standardshydrodynamics test facilityLegal Metrology working groups

Dr.Engle Hydrodynamic Test Facility Working Group LeaderGas group

Gas metering&Legal MetrologyLDV and Fundamental Measurement

research, and Doppler Global Velocimetry working groups 2003

PTB PTB

pigsar

Euromet TCFLow Chairman

53

2. Excel corp.

92 8 7 9 Excel corp.

Excel corp. Excel

Excel corp.

Excel corp.

VB Labview

3. NIST

92 8 10 12NIST

Jack NIST PED

PED

John NIST CMM

CMM

B31

CMM

CMM

4. NIST

92 8 92 12 NIST

54

NIST

NIST

NIST UV

NIST

NIST

5.

Hnsch Gigaoptics

Hnsch

Gigaoptics

THz

THzTHz

55

CNLA APLAC

9231721 CNLA

IANZ 1.

(HACCP)2.

(GLP)

3.INAZ

INAZ

CNLAHACCPGLP

CNLA

92915 CNLA APLAC MRA

MRA Council

MRA

MRA

CNLA

92101317 CNLA

APLAC CNAL

CNAL

CNLA

92102830 CNLA

APLACDSM APLAC MRA

DSM

CNLA

92112428 CNLA

BPSLAS APLAC MRA

APLAC MRA

APLAC MRA Council

BPSLAS APLAC MRA

CNLA

CNLA

APLAC

9212812 CNLA APLAC IAJapan NMIJ IAJapan

ISO Guide58ISO 17025CNLA

56

92.8.27~28 Nmi

92.10.29~92.11.6 APLMF

57

15109

1 A-- 3 2 B-- 4 3 C-- 8 4 D-- 17 5 E-- 26 6 F-- 9 7 H-- 3 8 L-- 2 9 M-- 3 10 N-- 8 11 O-- 5 12 P-- 4 13 T-- 6 14 U-- 7 15 V-- 4

109

58

1.

2.

(conductivity)

189 65 34.4

59

(55) 83.6

3.TFT-LCD

TFT-LCD

(CRM) Limited sample

C.D.

50% - 75%

NML

CRM NML NML

NML

60

SEMI(Semiconductor Equipment and Materials International)

VESA(Video Electronics Standards Association)

(NIST)

VESA (FPDM)

NML

NML TFT-LCD

(1) TFT-LCD

1000x1200mm() 1350x1650mm() 1700x2000mm(

) 800x900mm()

NML FY94(100x100mm)

(2)//

A /

LCD-TV

(3)

40mm 2 ~ 17

61

(4)/ NML

/

/

SARS

0.02 C

ASTM 3537

41

1.

4,015

368

23 445710 6

59

62

1 A-- 247 2 B-- 140 3 C-- 201 4 D-- 500 5 E-- 635 6 F-- 380 7 H-- 97 8 L-- 110 9 M-- 62 10 N-- 277 11 O-- 674 12 P-- 222 13 T-- 205 14 U-- 109 15 V-- 156

4,015

2.

CY91 NML CY92 92.11 CY91

CY91 CY92

NML

(BCG Matrix

) 100

NML NML

Winfax

NML

63

NML

93.2.15 / NML

CY91

CY91

NML

NML 8.2( 10) 95 %

0.2

8.08.4 (8.2 0.3) 8.2

NMLNML

3.

NIMT(National Institute of Metrology(Thailand))

1995(Department of Science Service, DSS)

(Metrology Development ProgramMDP)

1997 (National

Metrological System Development Act) DSS

(Thailand Institute of Science and Technological Research TISTR)

NIMTNIMT 1998 6 11999 1 4

DSS

105

Thermometry Metrology

DepartmentNIMT&

&DKD(Deutscher Kalibrierdienst)

1/13~1/24

64

NIMT(NMIJ

Dr. Sakuma

)

() NIMT ()

NIMT DKD NIMT

NIMT

CMS NIMT

APMP TK4

NIMT

(

F)

19

65

FY92

()

(122) D01 PTB 02

(9) D03 PTB 02

(4) D03 PTB 02

(1) U02 NPL 02

(1) O03 NPL 02

5,000 kgf (1) N05 PTB 02

50,000 kgf (2) N04 PTB 02

200,000 kgf (1) N03 PTB 02

500 kgf (1) N05 PTB 02

20,000 kgf (1) N04 PTB 02

(1) U02 NPL 05

(3) E16 NIST 06

1.(1) E23 NRC 07

(16) D06 PTB 08

(2)

(1)

(1)

L01 PTB 08

1 T01 PTB 10

1 T05 NPL 11

(1) P03 PTB 10

(1) E10 NIST 12

8

66

FY92

/

(P1-APMP.EM-K9)(

E06,E04)

APMP(12) 2003.04

(T05) APMP 2003.10 (

BIPM)

(D19) BIPM14 2003.05 En1

(D05) BIPM13 2003.05 En1

(D03) (LK2) APMP13 2003.06 En1

(T01) NMIJ 2003.12 0.02C

(A01)

1

NMIJ 2003.03

APMP.M.P-K7(P03)

Electronic Pressure

Monitor:

Paroscientific Model

785 A15000(100MPa)

APMP16 2003.09 APMP

(V01) APMP APMP

(D03) APMP

(D03) APMP

(L02) APMP

(M01,M03) APMP

(F03) Twin-meters PD & Mass APMP CIPM

APMP

(F05) Ultrasound Air speed

Anemometer APMP

CIPM

APMP

(F01) Twin meter package APMP CIPM

APMP

67

7

FY92

(N03,N04,N05)

50kN~2000kN

50kN500kN2000kN 3 0.04%~0.05%

0.02%~0.03%

ASTM

OIML R60ISO R376

EN 10002

(D13)

(D12)

NML

100Hz

15m 100m

NT$40,000

2

(F01)

0.08%@95%CL

10000lpm

0.05%@95%CL

18000lpm

93

(O05)

1.

10~100 %

2.

0.65%k=2

3.

1.

1~100 %

2.

0.54%

k=2

3.

1 ~ 372.5

kPa

1

~120 kPa

1.

68

(P01)

0.7~9.7 Pa

0.5~1 Pa

(NIST

NT$20

/)( 3

)

2.

160

3.

(

)

(

C(Appendix C)

2.NML (Chairman of Technical

Committee, APMP) CIPM (Consultative Committee, CC)

3.(key comparison) CIPM

4.JCRB

(NML)

CIPM NMI MRAMRA

1. NMI

2. NMI

3.

MRA key

comparisonsupplementary comparison

NMI

CMC CNLA

APMPJCRB 92 7 9

BIPM

70

1Vppm1010

ppm

71

CNLA

CNLA 92.12.31

()

M I N C E A O B T H L

9 0 1 24 11 1 1 6 1 6 6 66

137 18 20 171 106 17 8 38 24 21 160 720

60 1 5 25 14 4 2 8 8 1 0 128

206 19 26 220 131 22 11 52 33 28 166 914

() ()

()

()

KA KB KC KD KE KF KG KH KI KJ KK

2 0 5 0 1 0 1 0 1 2 0 12

63 8 41 16 37 73 10 10 2 12 6 278

17 2 21 2 7 11 1 3 1 3 0 68

82 10 67 18 45 84 12 13 4 17 6 358

1272 78

998 (0 81 10 33)

196 (10 0 186)

72
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CNLA

92/1 8 0 0 0 2 3 0 1 3 0 0 2 1992/2 2 0 0 0 4 2 0 0 3 0 0 4 1592/3 3 2 0 0 5 2 1 0 0 0 0 5 1892/4 1 2 0 0 2 1 1 1 0 0 0 0 892/5 0 2 0 1 2 2 1 0 0 0 0 5 1392/6 1 0 1 0 2 0 0 0 1 0 1 1 792/7 1 1 0 0 4 3 0 0 1 0 1 1 1292/8 2 0 0 0 3 4 0 0 0 1 0 4 1492/9 4 5 0 0 3 6 0 0 0 0 0 0 1892/10 3 1 0 0 2 5 0 0 0 2 2 1 1692/11 5 0 0 0 3 2 0 0 0 0 5 2 1792/12 3 4 0 1 5 4 0 0 0 1 2 3 23 33 17 1 2 37 34 3 2 8 4 11 28 180

CNLA 92

1 20 92.09.29 1 16 92.09.29 1 47 92.09.29

2 35 36 92.09.29 92.11.28

2 4 5 92.09.29 92.10.17

1 31 92.09.29

2 48 49 92.09.29 92.11.11

1 53 92.09.29 1 27 92.09.29

2 1 2 92.09.29 92.11.07

1 19 92.09.29

15

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(12)APECILACEANACCIAACSADCA

(13)(SRBs)APLMFAPMPPACPASC

(14)

(15)

1) NACLA

2) BQRB

3) GM

4)AQA Journal APLAC

2.ILAC 2003

2003 9 13 23 CNLA

ILAC

(1) ILAC

(2)ILAC(Mark) ILAC APC ILAC MRA

Mark

78

(3)ISO/IEC 17025 ISO 9001:2000

1) 60 ISO/IEC17020

ILAC/IAF

2) ISO/IEC17020 ILAC/IAF

ILAC/IAF

(Multi-lateral Mutual Recognition Arrangement, MLMRA)

A-serial

(4)ILAC IECICSCAISOUNIDO

WTO

(5) IAF/ILAC Joint Committee

(JCDCMAS)

3. APLAC 2003

APLAC 2003 11 10 14

Lotto HotelCNLA

CNLA(BOM)

APLAC Peter Unger

(1)APLAC

(2)MRAAB1

AB2

(3)ISO17011

ILAC IAF ISO17011APLAC

(4)

6

79

(Training Committee)

(1) Terms and Reference

(2)APLAC TR-001APLAC Guidelines on Training Courses for Assessors

(3) 10 6 TR-001 4

TR-001

(4) 2 TR-001

(5) TR-001

(6)

(7)-

(8)-

(9)-

(10) workshop

(11)

(12) Syllabus(

b/c)

(13)ISO 15189:2003 2003 2 15 ISO

(14)

(15) 2004 CNLA ISO 15189 Workshop

2 15,000

(16)ISO 15189 Workshop Inspection Body Workshop

Mr.PeterUnger

(17)ISO Working Group 18 2003 10 31 11 1 ISO

17011 last

(18) ISO 17011

80

Workshop

(19)Workshop ISO 17011 ISO 58

(20)APLAC evaluator APLAC MRA Council

(21) ILAC Developing Countries Committee

APLAC

(Public Information Committee)

Mr.Ian Roy(IANZ)

Mr.Warren Merkel(NVLAP) 15

(1)Members Liu Richard(INAZ) Kelvin

SHIH

(2)CNLA APLAC Secretary

Dr.Helen Liddy BoM

(3)2004

a. APLAC 6000/(2003 3000/) APLAC (Linking Policy)

Ian Roy On going

b.

Ian Roy PIC

On going

c. 2004 NCLSI Conference 2,500

W.Merkel D.Valentine

July 2004

d. () APLAC APLAC APEC MRAs

Ian Roy W.Merkel

Feb 29 2004

e. APLAC /

Mr.Ian Roy Feb 29 2004

f. APLAC MRA

Ian Roy Feb 29 2004

g. ( Signatory Plaque) 1500

C.Ramani Dec 31 2003

81

(2003 )

h.

1500 ( 3 /) 3500 ( 1 /)8000( 1000 2003 )

Mr.Ian Roy Dec 31 2003

i. PIC (PR )Mr.Ian

Mr.Ian Roy Jan 31 2004

j. APLAC members APLAC

Mr.Ian Roy March 15 2004

APLAC 2004 News Notes

PIC 2002 2003 News Notes

2004

: JAB()SAC()KAN()HKAS()VILAS()

NABL()

Terms of Reference Objective and

ActivitiesMr.Terlance Chen()

11 14

APLAC Proficiency Testing Committee 9

(1)Mr. Alan Squirrell(NATA)

Mr. Philip Briggs(NATA)

13 59

(2)Mr. Alan Squirrell (NATA, Australia)

Mr. Kazutoshi Kakita (JAB, Japan)Mr. Morio Hosaka

(JAB,Japan) Mr. Hershall Brewer (IAS, USA)

Ms. Rosnah Awang(Department of Chemistry, Malaysia)

(3)( 8)

(4) APLAC MRA 7 AB

APLAC PT

Hong Kong Accreditation Service (HKAS), Hong Kong

82

National Association of Testing Authorities (NATA), Australia

International Accreditation New Zealand (IANZ), New Zealand

International Accreditation Service Inc (IAS), USA

Bureau of Product Standards(BPS), Philippines

China National Accreditation Board for Laboratories(CNAL), China

International Accreditation Japan(IAJapan), Japan

(5)APLAC 1998 1999

2002 major sub disciplinessub area

Ms. Roxanne

Robinson(A2LA)

(6) PT 6 PT

6 3

(7) PT 25 PT

6 8

(8) PT

APLAC PT:

T027 Rockwell Hardness

APLAC EA IAAC

424 232 88

12 8 4

2.8% 3.4% 4.5%

T028 Egg Powder

APLAC EA IAAC

234 286 5

13 6 2

7.3% 5.5% 9.8%

T029 Food

APLAC EA IAAC

560 420 156

68 26 14

12.1% 6.1% 8.9%

T030 Food Microbiological

APLAC EA IAAC

528 13 1

35 13 1

6.6% 4.2% 1.2%

T032 Dairy

APLAC EA IAAC

416 312 64

30 12 10

7.2% 3.8% 15.6%

APLAC EA IAAC

2162 1163 314

158 65 31

7.3% 5.5% 9.8%

83

APLAC PT: T027 Rockwell Hardness

Accredited Not accredited

72 584

3 17

4.1% 2.9%

T028 Egg Powder


228 222

10 11

4.3% 4.9%

T029 Food


980 228

85 17

8.6% 7.4%

T032 Dairy


810 152

75 17

9.2% 11.1%


2090 1186

173 62

8.2% 5.2%

(9) PT APLAC

2003 3 PT004 Measurement

Audit7

(10)2003 APLAC PT USD30000BoM NATA-

T037 Rice FlourCNAL-APLAC T034 Genetically Modified Organism

APLAC T035 Food Additives Food Veterinary Drug Residues

USD65002004

USD35000

(11)2003 APEC PT PT

2004 2 PT

2003 1AB PTAB PT

2003 3 6 PT USD 7000

5 PT 2 PT

NATA() 1 PTCNAL() 1 PT(Veterinary

Drug Residues)CNLA 2 PT(Telephone set, Data transport unit)

DSMc() 1 PT NATA() 1 PT (Screw gauge)

IANZ() 1 PT (Electric energy)

84

(12) 2004 APEC PT 8 PT 2

PT CNLA 3 PT

(13)APEC APEC2003

2004 12 2004 2005

APECAPEC APEC

PT LAB AB

(14) ISO 17025

(Instructions-Measurement Uncertainty)

APLAC PT002 APLAC PT

Result Sheet Uncertainty

(15) AB APLAC PT

LAB APLAC MRA

LAB

( APEC APLAC PT)

(16)A2LA Mr. Dan Tholen ISO TC-69 Appliances of Statistical

Methods FDIS 13528 Statistical methods for proficiency

testing by interlaboratory comparisons 2003

TS 21748 Use of repeatability, reproducibility, and trueness estimates in

measurement uncertainty estimation ISO 11843:1-4 Capability

of detection

(17) PT Provider 2002 11 9 AB

ISO Guide 43 () ILAC G13

85

APLAC PT Provider AB NATA, Australia ILAC Guide 13 Accredited-Medical (2)

Approved-Chemical, Veterinary, Electrical & Biological (3)

5

CNAL, China ILAC Guide 13 Chemical (Metal, non-metal, food, coal)

2

KOLAS, Korea ILAC Guide 13 Chemical, Mechanical, Biological, Calibration

2

A2LA, USA ISO Guide 43 &ILAC Guide 13

Food microbiological & Food chemical (1), Chemical Environmental (2), Mechanical calibration (1)

4

IANZ, New Zealand

ISO Guide 43 &ILAC Guide 13

Chemical Biological Dairy 2

IA Japan ISO Guide 43 Calibration: Balance, Electrical 2 IAS, USA ISO Guide 43

&ILAC Guide 13 Not yet Established --

TLAS, Thailand ISO Guide 43 &ILAC Guide 13

Not yet Established --

KAN, Indonesia ISO Guide 43 &ILAC Guide 13

Not yet Established --

(18) APLAC PT

APLAC PT001 Calibration Interlaboratory Comparison (03/03)

APLAC PT002 Testing Interlaboratory Comparison (03/03)

APLAC PT003 Proficiency Testing Directory (02/03)

APLAC PT004 Measurement Audit (08/03)

APLAC PT

(19) APLAC EPTIS

APLAC PT EPTIS

(20)APLAC EA APLAC IAAC

APLAC IAAC PT

86

APLAC

2003 11 11 13:30~17:30 11 12 08:30~12:30

15 30

APLAC

/

ISO

170255MRA

(1) / MRA

(2)

ILAC

(3) APLAC

(4) APLAC

APLAC MRA Council 12

2003 11 12 13:30-17:30 13 8:00-15:00

Lotte Hotel

(1) AB Area: Type Evaluation Result NATA, Australia

Calibration & Testing: re-evaluation Inspection: initial

non-conformity:1 40%lab ISO Guide 25 concern:1

comment:10

March 2007

IANZ, New Zealand


non-conformity:3 PT ,,

April 2007

87

AB Area: Type Evaluation Result concern:3

ISO 9002:1994,committee

,IANZPAC(IANZ)

comment:9

SAC, Singapore

Calibration & Testing: re-evaluation Inspection: initial(SAC-CAP program)

non-conformity:0 concern:1

comment:9

2005 6Inspection follow-up(surveillance&reassessment) June 2007

HKAS, Hong Kong


non-conformity:0 concern:3 HKAS,

(comment),HKAS approved inspector,HKAS comment:3

2007

VLAC, Japan

Testing ( ILAC member)

non-conformity:0 concern:1 2 ISO 17025, 4.12,5.4.7,5.8 5.9 comment:14

EMC only1 1follow-up

(2)APLAC MRA 4

MRA Council(2004 4)

88

(3)Follow-up AB Follow-up Area JAB, Japan Witness testing

&calibration assessments

Calibration& Testing

August,2006

DMSc, Thailand Ensuring corrective actions

Testing Feb.,2006

DSM, Malaysia Witness testing &calibration assessments


July,2006

KAN, Indonesia Consideration of extension calibration


2004

(4)CNAL,China IAS,UAS( Inspection)

(5) 7 :Mary Ryan(NATA),Julian Wilson(NATA),Ned

Gravel(SCC),C K Cheung(HKAS), Panadda Silva(DMSc),Warren

Merkel(NVLAP) Kwei Fern Chang(SAC)

(6) IAJapanema Mexico( inspection)BPSLAS

Philippine, PJL USA, VILAS Vietnam

(7) KAN CNAL inspection

(8) 2004 :SCC, Canada-Y UematsuNABL,India-J.

Dupont KOLAS,Korea-KF Change NVLAP,USA-H Liddy

KAN,Indoesia-P McCullenCNAL,China-

(9) ISO 15189 MR001

(10) MRA Scope 2004 2

ScopeMRA

(11) RM Producer ISO Guide 34:2000

ISO 17025 ISO Guide 25 Lab ISO

Guide 58RM Producer MRA

MRAMR001MR002 RM Production

(12)Tina Engelhard ILAC APLAC MRA Council

(13)ISO 17011 2004 ILAC APLAC

89

(14)2004 APLAC

(15) 2004 7 1

(16) 2004 4 21 22

APLAC

2003 11 13 15:30~17:00 11 14 08:30~17:00

APLACMr. Peter Unger

(1)Mr. Peter Unger APLAC

(2) BOM 3 IA

Japen Dr. Katuo Seta NVLAPMr.Jeff Holick.

(3) 8 BOM

(4) L-A-Bs

(5) Rules of Procedure APLAC MOU

MR005 SEC045 SEC 046 APLAC

LOGOSEC 047APLAC MRA

(6) APLAC MRA()

(7)()

(8)()

(9)()

(10)()

(11) APECILACEAIAAC SADLA

()

(12) APEC APLMFAPMPPAC PASL

()

(13) APLAC ILAC

90

(14)APLAC BluetoothMOU

CNLAJABA2LA SAC

(15) 10(2004 )GA 2004 12 5

~10

APLAC MRA(1520)

1 Australia NATA 2 Hong Kong HKLS 3 New Zealand 4 Singapore SAC-SINGLAS 5 U.S.A. A2LA 6 U.S.A. NVLAP 7 Chinese Taipei CNLA

8 Japan IAJapan (JNLA JCSS)9 Japan JAB 10 Japan VLAC 11 Korea KOLAS 12 U.S.A. IAS ()

13 Peoples Republic of China CNAL (CNACL CCIBLAC)

14 Canada SCC 15 India NABL 16 Vietnam VILAS-STAMEQ 17 Indonesia KAN 18 Thailand TLAS 19 Thailand DMS 20 Malaysia DSM

91

ILAC MRA(3545) No. 1 Australia NATA 2 Austria BMWA 3 Belgium BELTEST and

BKO/OBE 4 Brazil INMETRO 5 Canada SCC 6 Chinese Taipei CNLA 7 Czech Rep CAI 8 Denmark DANAK 9 Finland FINAS 10 France COFRAC 11 Germany DASMIN 12 Germany DAP 13 Germany DACH 14 Germany PTB 15 Germany DATech 16 Hong Kong, China HKAS 17 India NABL 18 Indonesia KAN 19 Ireland NAB 20 Israel ISRAC 21 Italy SINAL 22 Italy SIT 23 Japan IAJapan 24 Japan JAB 25 Malaysia DSM 26 New Zealand IANZ 27 Norway NA 28 Peoples Republic of China CNACL 29 People's Republic of China CCIBLAC 30 Portugal IPQ 31 Republic of Korea KOLAS 32 Singapore SAC 33 Slovakia SNAS 34 South Africa SANAS 35 Spain ENAC 36 Sweden SWEDAC 37 Switzerland SAS

92

No. 38 Thailand TLAS/TISI 39 Thailand BLQS 40 The Netherlands RvA 41 United Kingdom UKAS 42 USA. A2LA 43 USA. NVLAP 44 USA. ICBO-ES 45 Vietnam VILAS/STAMEQ

1.APLAC

(2004) APLAC 11 5

6

CNLA APM011 Thermocouples (SAC-SINGLAS) (

)

APM012 Screw Thread Gauge NATA() APM013 Internal Cylindrical

Standards NATA()

APM014 High Resistance SCC() :3 :

APM015 Resistance JAB()

CNLA APT039 Toy Safety (HKAS) () :3

: APT038 Pharmaceutical (HKAS) () :1

: APT037 Rice Flour NATA() :1

: APT036 Food Veterinary

Residues CNAL() :

APT035 Food Additive CNAL() :1

: APT034 Genetically Modified

Organism CNAL() :

93

APLAC APLAC

14.4%

6.8%

APM001 112 5 4.4% APM002 165 16 9.6% APM003 130 11 8.4% APM004 AC/DC 546 63 11.5% APM005 122 29 23.7% APM006 418 92 22.0%

1493 216 14.4%

APT001 3470 262 7.5% APT002 1839 51 2.8% APT003 164 12 7.3% APT004 95 4 4.2% APT005 1336 51 5.5% APT007 654 54 8.2% APT008 1020 67 6.5% APT009 894 117 13.1% APT010 774 29 3.7% APT011 493 28 5.6% APT012 448 37 8.2% APT013 376 13 3.4% APT014 77 1 1.2% APT015 800 41 5.1% APT016 102 4 3.9% APT022 160 5 3.1% APT023 385 14 3.6% APT024 716 54 7.5% APT025 770 67 8.7% APT026 710 102 14.3% APT027 656 20 3.0% APT028 338 53 15.6% APT029 1208 102 8.4% APT030 928 52 5.6% APT032 962 91 9.4%

19375 1331 6.8%

94

14 2 14.3%

10

70 7

10%

452 19 4.2%

807 62 7.7%

Co-60Zn-65 Cs-134

6 1 16.7%

/ 1 V10 V1 mA10 mA

186 10 5.4%

-20 0 50 100

150 200 250 135 4

3.0%

CNLA-CN02 14 CNLA-CM25 28 CNLA-CM26 74 CNLA-CC11 37 CNLA-CI08 6 / CNLA-CK12 48 CNLA-CK13 22

2.

()

100193 ""

ISO/IEC Guide 43-1 ILAC G13

95

PTP001

90 1 1921231

PTP002

90 1 1921231

PTP003 Institute for Interlaboratory Studies()

90 1 1921231

,,

R.G.Visser

PTP004 LGC() 90 1 1921231

,,

Nick Boley

PTP005 American Oil Chemists' Society(AOCS) ()

90 3 193228

Richard Cantrill

PTP006 IMF Quality Services Pty Ltd. ()

90 3 193228

Ingrid Flemning

PTP007 WRc AQUACHECK ()

90 3 193228

P. Bedding

PTP008 Kiwa() 9051193510

P.M. van Beruel

PTP009 Central Science Laboratory()

90 3 59334

Linda Owen

PTP010 R.T. Corporation (RTC)()

9061393612

Christopher Rucinski

PTP012 Public Health Laboratory Service()

9061993618

Julie E Russell

PTP013 Analytical Products Group Inc.()

901127931126

Thomas V. Coyner

PTP014

901228931227

CNLA 13 CNLA

92

96

3.2002

(CNLA)

92

92 17 146

0 %

1.92 3 11CNLA

2.92 3 21

3.92 3 31

4.92 4 23

5.92 7 14

6.92 8 13

7.92 8 20

8.92 9 24

9.92 10 9 Y (Y-STR), CNLA

10.92 10 20 APLAC NEWS 10

11.92 10 22 23 (GBLP)

97

CNLA

12.92 11 8CNLA

13.92 11 10 COLAS(Commission of office laboratory accreditation)

CNLA

14.92 11 11

15.92 12 29

92 12 5 CNLA 82

92 12 8 CNLA 80

92 12 15 CNLA 226

(CNLA)

CNLA (APLAC)(ILAC)

(APLAC MRA)

(ILAC MRA)

(CNAB)

(PAC)(IAF)

(IATAC)(PAC MLA)

(IAF MLA)

CNLA CNAB

CNLA CNAB

98

(WTO)

WTO

92 9 17

20 8

91 12 12

92 6 30

92 8 27

92 9 17

CNLA

18

45 55

17 3

CNLA CNAB

() () ()

() () ()

() () ()

CNLA CNAB MRA

99

HACCPOHSAS

CNLA APLAC Bluetooth MOU

100

(FY90~92)

(FY92~94) (FY92)

(FY92~93)

(FY90~92)

Quadrature1000Hz 1592Hz

210-7

1. Quadrature

: (1)Quadrature(2) Quadrature

(1)Quadrature

Quadrature

NPL a.

b.

:

1 k10 k100 k () 1000 pF

:

10 k 100 k

1 ppm/C < 0.01 ppm

101

mK 0.01 ppm

Quadrature

10-4

0.01 ppm

:

Quadrature

< 10-8

uV

gain

-120dB 1uV

(2) Quadrature

Quadrature

90 90

Quadrature(twin-T) 90

:

Quadrature 1592Hz

(FY92~94)

LVDT

1.

2. 0.5 m/m 00 1/2

3. 100 ~ 1000 mm

4. K01

1. 1.2 m 1.2 m

2. 1.2 m 16 B31

>1200 mm 0.3 m 0.1

m 20 nm>10 kg

3.-

0.01 m

0.005 m

1 m/m 0.05 m/m

4. 0.001

0.01

5. 1.2 m

6.

LVDT

(200.1) ISO guide

1

1

0.06m 0.03m

0.05m 0.210-6L 10-6/ 0.04

0.01

0.3

2 1 1 2

3

3

3

2

0.03m 0.03m 0.05m 0.110-6L 0.5810-6/ 0.0133 2.8810-3 0.2121

1 1 1 1 L0.1 110-6L/ 110-6L/ 110-6L/

0.03 m 0.03 m 0.05 m 0.110-6L 0.05810-6L 0.013310-6L 2.88 10-9L 0.212110-6L

50 9 5 50 50 50 50 50

[(0.066)2 +(0.24210-6L)2]1/2mLm

= 2 * [(0.066)2 +(0.24210-6L)2]1/2m 1m

0.5m

104

(FY92)

(10N~500N)

1.30 110-5

2.(5~500)N

3.:0.002%

4. ISO 376(1999),ASTM E74,JIS,,

5.

6.

1.(10N~500N)

(1)30110-5

30

40 15 1N 10

2N 5 25 10N 1020N 5

30N 1040110-5

(2)(5~500)N

(5~500)N

(1~500)N

(3)0.002%

0.002%

(4)

230 340

1N 102N 5

105

1N~20N 10N 10 20N 5

10N~200N 30N 10 30N~300N

1N~500N

(5)

3 warm-gear

ISO 376(1999)ASTM E74

JIS

(FY92~93)

1.

2.

3.

4.

1.

2. 11 12

3.10

1212

4.Bilateral Comparison of Irradiacne

Responsivity Between CMS and CSIR

106

FY90~93

1.

A. 532nm 10-13

B. 2x10-11

2.

A.

Accuracy: 10-7

B. 0.01m C.

3. 510-13GPS

4. 510-131s

5. 633nm532nm 657nm

1.

12

532 nm 10-13

657 nm 778 nm

10-7

0.5

107

2.

(1) 510-13GPS

810-131s

GPS

(510-11@1s)

410-121s

(2) 510-131s

810-131s

500-1200nm 1 GHz

10-11

(3) 633nm532nm 657nm

633nm

532

852nm

Apply Optics: Diode Laser Frequency Stabilization with

Two-Frequency Doppler-broadened Absorption Spectroscopy

2003 Construction of a

frequency-stabilized, mode-locked femtosecond laser for optical frequency

metrologyDelivery

of highly optical and microwave frequency standards over an optical fiber network, J.

Ye, J.-L. Peng, R.J. Jones, K.W. Holman, J.L. Hall, and D.J. Jones, S.A. Diddams, J.

Kitching, S. Bize, J.C. Berquist, and L.W. Hollberg, J. Opt. Soc. Am. B20, 1459

(2003)

108

FY92~93

1. < 10-4 Nm/rad

2. 510-8 rad

3. < 10-4 N

4. < 10-8 N

5. 1 nN

torsion strip

1.

(1) 25um 67cm

FFT

1,066

I=2475gcm2

K= 8.610-9Nm/rad < 10-4 Nm/rad

109

Pendulum mass

Data acquisition

Split diode sensor

(2)

Torsion strip 0.0172 kg-m2

k =1.5110-4

2.

5

corner-cube 32.61mm(rad)

1.910-8 rad 9.8210-9 rad

110

3.

(CCD)

DA

F=(A v Va) / (2 3.14159 D2)

A

VDA

Va

D

111

Laser

CCD

+VR

B

-VR

Pendulum

DA-CARD

Computer

4.

10 20

2 18.5

10-8 N-m 0.11 m 10-7 N

10

112

5.

12 10Torsion

strip Dalsa line scan CCD 7 7m m pixel size8192 pixels

32767 2.5

x5 pixel;

T0.35 ;

P4.3 mBar;

H1.6%

6.

Torsion Strip 0.0149 Hz

torsion strip 0.09 m

I=0.0083 kg-m2

I=0.0003 kg-m2

0.0172 kg-m2

k =1.5110-4

18.5 kgsource mass30

Fourier transform 3800 9.76 pixels

6.8310-5 rad

T1.031310-8 N-m

T1.031410-8 N-m

G 6.6710-11 N/m2

113

FY92

1. nanowire

2. nanowire

3.

4.

5. -90 1 1 ppb

1. nanowire

nanowire

Autoclave

6

Autoclave

TiO2

(1) 1TiO2 (Anatase) 40 10 M NaOH

(2) Autoclave

(3) Autoclave 200 24

(4) Autoclave

114

(5)

(6) 70 6

(7)

(SEM)

TiO2SEM

2.

(QCM)

(oscillating electric field)

Sauerbrey

AT-cut (m)

(F)Fm

QCM 2~16 MHz 0.1

Hz

QCM

115

(1)

(2)

(3)(feed through)

(4)

(5)

(6)

(7)

(8)

(9)

(10)

(11)

QCM

116

3.(QCM)

0.001 CNT(single wall; Carbon Nanotechnology, Inc.) 5 5 wt%

Nafion (mixture of lower aliphatic alcohol and water ;Aldrich)

CNT/Nafion(AT-cut)

(spin coater) 1000 rpm

CNT/Nafion QCM SWCNT(Single

wall carbon nano tube) Nafion

SEM

CNT/Nafion QCM SEM

CNT/Nafion QCM

8.46 ppmv 15315.73 ppmv 15.76 ppmv

(Rsqr = 0.995)

(< 5 sec, 15.76 ppmv)

117

(a)

20 Hz

0 5000 10000 15000 20000 25000 30000

(b)

50 Hz

Time/ sec

CNT , 177.60 ppm

v 307.71 ppmv (a) CNT (b) 4 wt.% CNT.

0 3000 6000 9000 12000 15000 180000

300

600

900

1200

1500

1800

2100

y=0.12x+228.51

r2=0.995

118

y=2 0.09x+21.68r =0.983

Freq

uenc

y ch

ange

/ H

z

Volume ratio/ ppm

v

(-F) (ppm

v) . QCM ( ) 4 wt.% CNT/Nafion ( ) Nafion.

4.

TiO2 TEOS nanowire TiO2

TEOS TiO2 TEOS 60-70 %

Nafion nanowire TiO2 Nafion

TEOS Nafion TiO2 powderNafion TEOS

2 3 10-40 % nanowire

Nanowire

12-98 % 1000 12-98 % RH

1000

2 % 2

1

10

100

1000

10000

100000

1000000

10000000

0 20 40 60 80 100 120

Relative Humidity / RH %

Impe

denc

e / Log Z

(5:TiO2 nanowire/Nafion, : TiO2

powder/Nafion, : Nafion, : TiO2 nanowire, :TiO2 powder)

stability of nanowire sensor

1

100

10000

1000000

100000000

0 20 40 60 80 100

time/

TiO2

12, 33, 50, 75 98 % sensor 80

119

da ys

Impe

denc

e

98%

12 %33 %

50%75 %

TiO2

FY92~93

1. < 60 nm x 60 nm

2.

3.

(Coulomb Oscillations)

NDL

Geomatrically defined

SEM image,

Si-dot width 45 nm, thickness 30

nm

NDL

Geomatrically defined

IDS verse Vgate

120

1.()

2.

3.

4.

5.

1.()

()

OIML R79 R87

121

OIML R79

OIML R87 38 OIML

20

20 20

20

(1)

(2)

(3)

11

/

2.

WTO

122

-CNS 14741

OIML R31

-CNS 14741-CNMV 31

-CNPA 31

1000 m3/h

160m3/h 16m

3/h

OIML R31OIML R6CNS

14741

-

(1)

(2)CNPA 31

123

(3)CNMV 31

(4)CNS 14741

(5)

(6)

(7)

3.

()

(

)

ISO/IEC 17020ISO GUIDE 65

ISO/IEC 17025 APLAC Requirements for inspection body accreditation

EA-5/01ILAC Guide 8ISO GUMISO GUIDE 43-1 ISO GUIDE 43-2ILAC

G13 APLAC PT 001APLAC PT 004EAL-P7

124

( ISO/IEC 17025)

(1)

(2)

LNE Drager

/

/

4.

2

100 kg

125

OIML R60 2000

OIML R60WELMEC

NMi

100 kg

pi OIML R-76-1

pi 0.3 0.8pi

pi 1

126

(1)OIML R60 ()

(2)OIML R60 + R76 + WELMEC()

(3)OIML R76 + WELMEC()



(6)OIML R76 + WELMEC

(7)OIML R76 + WELMEC+

/

5.

(1) /

/

/

//

(2)

127

2003 SARS

9 38 C

0.02 C

4000

CNLA

92 67

9

WTO/APEC

1.

128

2.3.

4

1.

(FY90~92)

()

Quadrature

2.

(FY92~94)(FY92)

(FY93)

-1.2 m

FY92 FY93

FY93 Pitch Yaw 1.2 m 2 arcsec

2 arcsec 10

cosine error(

4.

()

()

(

)

1.2.

3./

130

1.

(1)

532 nm 10-13

657 nm

Fabry-Perot

10-8

10-8 Optical engineering

Fabry-Perot

75 %

633 nm657

nm852 nm 1064 nm 1556 nm 778 nm

(2)

500-1200nm1GHz

810-13@1s 10

-11NML

NML

GPS

NML

510-12@1s

131

GPS

2.

1

SPM NIST

()

3.

(QCM)

CNT/NafionQCM

8.46 ppmv 15315.73 ppmv 15.76 ppmv

(Rsqr = 0.995) (< 5 sec,

15.76 ppmv)

(TiO2) Nanowire 12-98 % RH

1000

2 % 2

4.

NDL

1.( 0.35 K) 2. < 60 nm

3. < 60 nm 4.

5. I-V( < 60 nm x 60 nm 60 nm

x 40 nm)

92

132

NDL

NDL

KRISS 2001

9 50

NML

1.

20

20

133

30

0.5

2.

95 16m3/h 97

160m3/h

35

10 8.5 140 264

36960 200

20

(1) OIML R31

G1.0~G160(k=2) 1/3

0.35% of Reading

(2)

10

134

(3) G1.0-G160 567

135

1

GPIB or RS485interface

GPIB or RS485interface

T1

2

3

14

1 10

P1 T2 P2

SN1 SN14

1

T3

P3

1

10

.......

1

14

....

....

......

3.

APLAC

Requirements for inspection body accreditation

ISO/IEC 17025

136

(

)

()

()

()

()

(1)ISO/IEC 17025

(2)ISO/IEC 17020

(3)ISO/IEC GUIDE 43-1, 43-2

(4)

4.

137

()

1 (Gauge

Block Laser

Interferometer)

1 17,896,110 17,896,110 1

1.

2.

139

Gauge Block Laser Interferometer

91 12 31 1. 12.

Gauge Block Interferometer 92-1403-31-01-00-00-00-79 2.NPL B&S 13. 3.07-3100708059-061254 4. 2 321 14. 5.(03)5732147 15. 6.NPL 7.17,896,110

8.2003 9.1 10.

11. NPL

1.

2.

140

633 nm

543 nm

110-8

300 mm

25 nm + 0.210-6 L 95 % confidence level

Flatness better than 1/10

5 nm

win98

141

() () Gauge Block Laser Interferometer

110-8

300 mm 25 nm + 0.210-6 L

16,000,000 17,896,110 1 17,896,110

()

() Seamless Steel Pressure Vessel

1. ASME Sa-372 Type IV

2. 16" X 25' X 0.852

3. 2

4. 1:4

5. 2700 psig

2,900,000 2,835,000 1 2,835,000

10000 m3/hr

18000 m3/hr

()

() Laser Interferometer System

1. 1 mW 6mm 632.991354 nm 0.02 ppm 2.4-3.0 MHz

2. 3. 5 nm 711 mm/s

4. 5.

1,265,000 840,000 1 840,000

142

() 1.2 m

() 1.2 m precision air bearing positioning stage

1.: 1200 mm 2.0.3 m 3.30 nm 4.1 m 5.2 m 6.5 m

7.PitchYaw2

8.0.1 m

1,800,000 1,500,000

1 1,500,000

() () Tunable Laser Source(TLS) Erbium Doped Fiber Amplifier(EDFA)

1500-1580 nm 1 pm 23 dBm

1,200000 575,600

1 575,600

() () He3 low-temperature system

0.3 K ~ 1.2 K

2,000,000 1,924,435

1 1,924,435

()

() Cryostat

1)2.5-liter LN2

capacity

2)4.4-liter LHe capacity

3)LHe hold time > 40 hours

4)LN2 hold time 18 hours

1,850,000 1,505,500

1 1,505,500

()

() Receiver cavity

1.absorbtance

0.9998 @ 633 nm

2.wavelength

range: 0.2 um ~

5 um

3.acceptance

angle: 7 degree

(f/8)

4.receiver

2,122,000 2,428,680

1 2,428,680

143

Cryo-radiometer

electronic

controller

system

r4esponsivity:

2 K/mW

5. noise (rms):

(1)

APMP TC Chairs Meeting

92.03.22~92.03.26

UNCERT 2003

92.04.08~

92.04.16

UNCERT 2003

NPLSSFM Club SSFM Club user

club NML

92.04.20~92.04.25

57th IEEE Semiannual Vehicular Technology Conference

92.05.16~92.05.29

NPLSupelecSAR Measurement System

NPL Supelec NML SAR

Ilmenau

Ilmenau

PTB

2003

PTB

NML

92.06.20~92.06.29

92.07.04~92.07.19

Prof. Hnsch

ICSE

92.07.19~92.08.03

BIPM Summer School

APMP TCL Chair

NML

145

92.08.01~

92.08.09 CCL-WGDM8

APMP TCL

NML

SPIE

NISTMIC

92.08.17~92.08.28

NCSLNMI

NIST

NML

(MIC)

92.08.17~92.08.28

NCSLNMI

NIST

NIST NML

92.08.18~92.08.30

NCSL

NMLAnritsu

NML

92.08.24~92.09.02

KRISS/Auv

Inter Noise2003

Auv

92.09.21~92.09.26

IMEKO/

NIM,CSIRO,IMGC

92.10.11~92.10.19

(CGPM)

92.10.11~92.10.19

NML

(CGPM)

92..10.12~92.10.21

KRISSNRCCRM

CRM seminarGas workshop

146

92..10.12~92.10.21

KRISSNRCCRM

CRM seminarGas workshop

92.10.19~92.10.26

CSIRO

國家度量衡標準實驗室運作計畫（第三年度 ·...

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Transcript of 國家度量衡標準實驗室運作計畫（第三年度 ·...

國家度量衡標準實驗室運作計畫 （第三年度 ·...

Documents

Transcript of 國家度量衡標準實驗室運作計畫 （第三年度 ·...

國家度量衡標準實驗室運作計畫（第三年度 ·...

Transcript of 國家度量衡標準實驗室運作計畫（第三年度 ·...