Nnaemeka Nnaji & Nthabeleng Molupe - Rhodes University
Transcript of Nnaemeka Nnaji & Nthabeleng Molupe - Rhodes University
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Basics of X-ray Diffraction Technique
Nnaemeka Nnaji & Nthabeleng Molupe
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Introduction
X-rays were discovered by Wilhelm Roentgen(aka Roentgen rays) in 1895
X-ray diffraction in crystals was discovered byMax Von Laue in 1912
X-ray wavelength range: 0.01-10 nm
Penetrating power depends on energy
Two types of X-rays
Hard X-rays: high frequency & energy
Soft X-rays: lower frequency & energy
Max Von Laue
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Introduction
X-rays: short wavelength electromagnetic radiationsproduced by deceleration of high energy electrons or byelectronic transitions of electrons in the inner orbital ofatoms
Principle: X-ray diffraction is based on the constructiveinterference of monochromatic X-rays and crystallinematerials (samples)
X-rays generated by cathode ray tube, filtered toproduce monochromatic radiation, collimated toconcentrate and directed towards sample
Interaction of incident rays with sample producesconstructive interferences when conditions satisfyBragg’s Law
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X-ray diffraction (XRD)
Non-destructive
Analysing wide range of materials Fluids
Metals
Minerals
Polymers
Plastics
Pharmaceuticals
Thin-film coating
Ceramics
Solar cells
Semiconductors
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Crystal structure
Crystalline materials are characterized by orderly periodicarrangements of atoms which form a crystal lattice thatextends in all directions
The unit cell is the basic repeating unit that defines a crystal.
Parallel planes of atoms intersecting the unit cell are used to define directions and distances in the crystal.
These crystallographic planes are identified by Miller indices.
The (200) planes of
atoms in NaCl
The (220) planes of
atoms in NaCl
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Instrumentation
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Diffraction on crystals
Bragg condition
Diffraction by 3D lattice of points is equivalent to a reflection of the incident beam on a family of net planes
Bragg’s Law
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Diffractograms of different materials
(From “Elements of X-ray Diffraction”, B.D. Cullity, Addison Wesley)
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Factors affecting diffraction pattern
2θ-degrees
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Information in a Diffraction Pattern Phase Identification (Structure, using Miller indices) &
quality (“residual” stress)
Crystal Size (using Debye‐Scherrer equation)
Texture (crystalline or amorphous)
20 40 60 80 100
0
6000
12000
18000
24000
Inte
nsity
2(degree)
Al
20 40 60 80 100
0
250
500
750
Inte
nsity
2 (degree)
SiNPs
(200)
(220)(311)
(400)
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Strengths
Powerful for sample identification
Requires minimal sample preparation
Relatively straightforward data interpretation
Limitations
Homogeneous and single-phase material required for sample identification
Access to a standard reference file of inorganic compounds is required
For mixed materials, detection limit is » 2% of sample
For unit cell determinations, indexing of patterns for nonisometric crystal systems is complicated
Peak overlay may occur and worsens for high angle “reflections”
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Acknowledgements
Dr Managa
Professor Tebello Nyokong
Institute for Nanotechnology Innovation, Rhodes University