Nanoeducator II – new

generation of educational and

Basic research tool

Andrew Shubin,

VP Marketing, NT-MDT

History and Background

• 20 years on the SPM market

• Over 3800 devices in 59 countries

• 250 experts in HQ offices

• 30+ distributors worldwide

Our mission

“To enable scientists

to conduct nanoscale research

by creating advanced

instruments for nanotechnology”

Professor Victor Bykov

NT-MDT Founder and

General Manager

World-wide Distribution

NT-MDT Head Office,Moscow, Russia

NT-MDT S&LLimerick, Ireland

NT-MDT AmericaSanta Clara, USA

NT-MDT ShanghaiShanghai, China

NT-MDT EuropeEindhoven, NL

Global Representation

Representative

Offices

NT-MDT Development, Tempe, Arizona

To address the increasing activity of NT-MDT on the US and world

markets of scanning probe microscopy instrumentation, the company

has invited the experienced AFM developers and practitioneers:

Sergei Magonov, John Alexander and Sergey Belikov to form the

research unit NT-MDT Development in Tempe, Arizona. This

team, which has a combined SPM experience of almost 60 years, will

focus its efforts on development and applications of novel multi-

frequency SPM techniques related to quantitative nanomechanical

and electric measurements of various materials. The company will

start operations in April 2011.

Dr. Sergei Magonov was educated in the former USSR where he got his PhD and has

conducted research on polymers in the RussianAcademy of Sciences. In 1988 Dr. Magonov

moved to Germany (Freiburg University) where he started to apply first scanning tunneling

microscopy (STM) and later atomic force microscopy (AFM) to different materials. The

scientific results obtained in this period were summarized in the book (written jointly with

Prof. M. Whangbo) “Surface Analysis with STM and AFM”, VCH Weinheim 1996. In 1995

Sergei joined Digital Instruments – the leading manufacturer of the scanning probe

microscopes where he was involved in development of various AFM applications to soft

materials. After spending 12 years with Digital Instruments/Veeco Instruments he moved in

2007 to Agilent Technologies – another manufacturer of scanning probe microscopy, where

he was continuing research in AFM. He is the author of 13 chapters/reviews and 175 per-

review papers.

Product Line

Price range, Euros

New generation

of scientific training

laboratories

for nanotechnology

NANOEDUCATOR II

NANOEDUCATOR II

• AFM head availability

• Low noise - High resolution

•Fast scanning

• New digital controller

• Closed-loop X,Y,Z scanner

• Even more easy adjustments

New model advantages

TWO Measuring HEADS

Force Probe Head – for educational purposes

The force-probe is a piezo-tube driven into oscillation by a sinewave voltage applied to two electrodes

(inverse piezo-effect) and the oscillation amplitude is measured by the voltage generated across the

other two electrodes (direct piezo-effect).

AFM head – for the research purposes

Semiconductor laser-photodiode registration

system

Technical characteristics

Sample positioning

range:

5×5 mm

Sample positioner type: manual

Sample weight: up to 40 g

Sample size: Diameter up to 25 mm,

Thickness up to 10 mm

Scanning: Scanning by sample

Scanning range: 100×100×10 µm

(closed- loop)

Basic Operation Modes

Atomic Force Microscopy (AFM):

• Topography imaging

• Phase imaging

• Force imaging

• Force spectroscopy

•Scanning Tunneling Microscopy (STM):

• Constant Current

• Constant Height

•AFM Lithography

Applications:

- Biology (cells, viruses, bacteria)

- Material science

(metals, semiconductors, dielectric

s, composition materials, polymers)

- Data storage devices (data

storage media inspection)

- Micro- and nanostructures

(gratings, self-organizing systems)

Hi resolution possibilities

Sample HOPG

Scan size 2x2 nm

Delivery Set

NANOEDUCATOR II

can be used in scientific

research purposes besides

the educational needs

• scanning probe microscope

• handbooks

• manual

• demo samples

• accessories

Nanoeducator class

Student oriented

• User friendly interface

• Step-by-step mastering of SPM techniques

• Clear, animated support

• Inexpensive consumable materials

• Simple probe replacement

• Probe recovery availability

• New updated for operating

systems Windows® and Mac®

OS

• Remote control from the

teacher’s workstation for entire

classroom

• Various programs for image

processing and STM

manipulations

• Data sharing via iPhoneTM

and iPadTM

• Control via Internet

Cutting-Edge Tendencies

ELECTROCHEMICAL REACTION

Observing through the webcam, the tip sharpening action give the

students an insight to a common electrochemical process.

19

The etching process

The Tip Etching Device

Etching tool

Strong client support system

• Information support

• After sales service

• Ask-online service

Thank you!

YOU ARE WELCOME TO

VISIT OUR BOOTH 959