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MRF9045NR1
1RF Device DataFreescale Semiconductor
RF Power Field Effect TransistorN-Channel Enhancement-Mode Lateral MOSFET
Designed for broadband commercial and industrial applications with frequen-cies up to 1000 MHz. The high gain and broadband performance of this devicemake it ideal for large-signal, common-source amplifier applications in 28 voltbase station equipment.
• Typical Performance at 945 MHz, 28 VoltsOutput Power � 45 Watts PEPPower Gain � 19 dBEfficiency � 41% (Two Tones)IMD � -31 dBc
• Integrated ESD Protection
• Guaranteed Ruggedness @ Load VSWR = 5:1, @ 28 Vdc, 945 MHz, 45 Watts CW Output Power
Features• Excellent Thermal Stability• Characterized with Series Equivalent Large-Signal Impedance Parameters• Dual -Lead Boltdown Plastic Package Can Also Be Used As Surface
Mount.• 200�C Capable Plastic Package• N Suffix Indicates Lead-Free Terminations. RoHS Compliant.• TO-270-2 Available in Tape and Reel. R1 Suffix = 500 Units per 24 mm,
13 inch Reel.
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain-Source Voltage VDSS - 0.5, +65 Vdc
Gate-Source Voltage VGS - 0.5, +15 Vdc
Total Device Dissipation @ TC = 25°CDerate above 25°C
PD 1771.18
WW/°C
Storage Temperature Range Tstg - 65 to +150 °C
Operating Junction Temperature TJ 200 °C
Table 2. Thermal Characteristics
Characteristic Symbol Value (1) Unit
Thermal Resistance, Junction to Case RθJC 0.85 °C/W
Table 3. ESD Protection Characteristics
Test Conditions Class
Human Body Model 1 (Minimum)
Machine Model M2 (Minimum)
Table 4. Moisture Sensitivity Level
Test Methodology Rating Package Peak Temperature Unit
Per JESD 22-A113, IPC/JEDEC J-STD-020 3 260 °C
1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTFcalculators by product.
Document Number: MRF9045NRev. 12, 9/2008
Freescale SemiconductorTechnical Data
MRF9045NR1
945 MHz, 45 W, 28 VLATERAL N-CHANNEL
BROADBANDRF POWER MOSFET
CASE 1265-09, STYLE 1TO-270-2PLASTIC
© Freescale Semiconductor, Inc., 2008. All rights reserved.
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2RF Device Data
Freescale Semiconductor
MRF9045NR1
Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current(VDS = 65 Vdc, VGS = 0 Vdc)
IDSS � � 10 μAdc
Zero Gate Voltage Drain Leakage Current(VDS = 28 Vdc, VGS = 0 Vdc)
IDSS � � 1 μAdc
Gate-Source Leakage Current(VGS = 5 Vdc, VDS = 0 Vdc)
IGSS � � 1 μAdc
On Characteristics
Gate Threshold Voltage(VDS = 10 Vdc, ID = 150 μAdc)
VGS(th) 2 2.8 4 Vdc
Gate Quiescent Voltage(VDS = 28 Vdc, ID = 350 mAdc)
VGS(Q) 3 3.7 5 Vdc
Drain-Source On-Voltage(VGS = 10 Vdc, ID = 1 Adc)
VDS(on) � 0.22 0.4 Vdc
Forward Transconductance(VDS = 10 Vdc, ID = 3 Adc)
gfs � 4 � S
Dynamic Characteristics
Input Capacitance (VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Ciss � 70 � pF
Output Capacitance(VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss � 38 � pF
Reverse Transfer Capacitance(VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss � 1.7 � pF
Functional Tests (In Freescale Test Fixture, 50 ohm system)
Two-Tone Common-Source Amplifier Power Gain(VDD = 28 Vdc, Pout = 45 W PEP, IDQ = 350 mA,f1 = 945.0 MHz, f2 = 945.1 MHz)
Gps 17 19 � dB
Two-Tone Drain Efficiency(VDD = 28 Vdc, Pout = 45 W PEP, IDQ = 350 mA, f1 = 945.0 MHz, f2 = 945.1 MHz)
η 38 41 � %
3rd Order Intermodulation Distortion(VDD = 28 Vdc, Pout = 45 W PEP, IDQ = 350 mA,f1 = 945.0 MHz, f2 = 945.1 MHz)
IMD � -31 -28 dBc
Input Return Loss(VDD = 28 Vdc, Pout = 45 W PEP, IDQ = 350 mA,f1 = 945.0 MHz, f2 = 945.1 MHz)
IRL � -14 -9 dB
Two-Tone Common-Source Amplifier Power Gain(VDD = 28 Vdc, Pout = 45 W PEP, IDQ = 350 mA,f1 = 930.0 MHz, f2 = 930.1 MHz and f1 = 960.0 MHz, f2 = 960.1 MHz)
Gps � 19 � dB
Two-Tone Drain Efficiency(VDD = 28 Vdc, Pout = 45 W PEP, IDQ = 350 mA,f1 = 930.0 MHz, f2 = 930.1 MHz and f1 = 960.0 MHz, f2 = 960.1 MHz)
η � 41 � %
3rd Order Intermodulation Distortion(VDD = 28 Vdc, Pout = 45 W PEP, IDQ = 350 mA,f1 = 930.0 MHz, f2 = 930.1 MHz and f1 = 960.0 MHz, f2 = 960.1 MHz)
IMD � -31 � dBc
Input Return Loss(VDD = 28 Vdc, Pout = 45 W PEP, IDQ = 350 mA,f1 = 930.0 MHz, f2 = 930.1 MHz and f1 = 960.0 MHz, f2 = 960.1 MHz)
IRL � -13 � dB
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MRF9045NR1
3RF Device DataFreescale Semiconductor
Figure 1. MRF9045NR1 930-960 MHz Broadband Test Circuit Schematic
Z3 0.14″ x 0.32″ MicrostripZ4 0.47″ x 0.32″ MicrostripZ5 0.16″ x 0.32″ x 0.62″ TaperZ6 0.18″ x 0.62″ MicrostripZ7 0.56″ x 0.62″ MicrostripZ8 0.33″ x 0.32″ MicrostripZ9 0.14″ x 0.32″ MicrostripZ10 0.36″ x 0.08″ MicrostripZ11 1.01″ x 0.08″ MicrostripZ12 0.15″ x 0.08″ MicrostripZ13 0.29″ x 0.08″ Microstrip
B1, B2 Short Ferrite Beads, Surface MountC1, C7, C13, C14 47 pF Chip CapacitorsC2, C8 2.7 pF Chip CapacitorsC3 3.9 pF Chip CapacitorC4, C5, C8, C9 10 pF Chip CapacitorsC6, C15, C16 10 μF, 35 V Tantalum Surface Mount CapacitorsC10 2.2 pF Chip CapacitorC11 4.7 pF Chip CapacitorC12 1.2 pF Chip CapacitorC17 220 μF, 50 V Electrolytic CapacitorL1, L2 12.5 nH InductorsZ1 0.20″ x 0.08″ MicrostripZ2 0.57″ x 0.12″ Microstrip
B1
C1
RF
INPUT
RF
OUTPUT
VGG VDD
C6
L1
Z5Z4Z3
C2
Z2Z1 Z7
C8
C9
Z8 Z9 Z10 C13
C14
B2
C15 C16 C17
C4
C5
Z6
+ +C7
++
C12
C3
Z11 Z12 Z13
L2
DUT
C10 C11
Figure 2. MRF9045NR1 930-960 MHz Broadband Test Circuit Component Layout
CU
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AR
EA
MRF9045MR1 Ground
C1C2
C3 C4
C5
C6
C7
C8C9
C10 C11 C12 C13
C14 C15 C16
L1 L2
A1 A2
B1B2
WB
1
WB
2
Ground
Vbias VsupplyC17
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductorsignature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will haveno impact on form, fit or function of the current product.
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4RF Device Data
Freescale Semiconductor
MRF9045NR1
Figure 3. MRF9045NR1 930-960 MHz Broadband Test Circuit Schematic
Z1 0.260″ x 0.060″ MicrostripZ2 0.240″ x 0.060″ MicrostripZ3 0.500″ x 0.100″ MicrostripZ4 0.215″ x 0.270″ MicrostripZ5 0.315″ x 0.270″ MicrostripZ6 0.160″ x 0.270″ x 0.520″ TaperZ7 0.285″ x 0.520″ MicrostripZ8 0.140″ x 0.270″ MicrostripZ9 0.450″ x 0.270″ MicrostripZ10 0.250″ x 0.060″ MicrostripZ11 0.720″ x 0.060″ MicrostripZ12 0.490″ x 0.060″ MicrostripZ13 0.290″ x 0.060″ MicrostripBoard Taconic RF-35-0300, εr = 3.5
B1 Short Ferrite BeadB2 Long Ferrite BeadC1, C8, C13, C14 47 pF Chip CapacitorsC2 0.4-2.5 pF Variable Capacitor, Johanson GigatrimC3 3.6 pF Chip CapacitorC4 0.8-8.0 pF Variable Capacitor, Johanson GigatrimC5, C6, C9, C10 10 pF Chip CapacitorsC7, C15, C16 10 μF, 35 V Tantalum Chip CapacitorsC11 7.5 pF Chip CapacitorC12 0.6-4.5 pF Variable Capacitor, Johanson GigatrimC17 220 μF Electrolytic Chip CapacitorL1, L2 12.5 nH Surface Mount InductorsWB1, WB2 10 mil Brass Wear Blocks
B1
C1
RF
INPUT
RF
OUTPUT
VGG VDD
C7L1
Z5Z4Z3
C2
Z2Z1 Z7
C10
C9
Z8 Z9 Z10 C13
L2
C14
B2
C15 C16 C17
C6
C5
Z6
+ +C8
++
C11C4
C12
Z11 Z12 Z13
C3
Figure 4. MRF9045NR1 930-960 MHz Broadband Test Circuit Component Layout
CU
T O
UT
AR
EA
WB
1
WB
2C1
C2C3
C5
C6
C7
C8
C9C10
C4 C11 C12
C13
C14
C15 C16
C17
L1 L2
Rev−02900 MHzMRF9045MB
OUTPUTINPUT
VGG
VDD
DUT
B1 B2
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductorsignature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will haveno impact on form, fit or function of the current product.
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MRF9045NR1
5RF Device DataFreescale Semiconductor
TYPICAL CHARACTERISTICS
960
12
20
−38
50
IRL
IMD
f, Frequency (MHz)
Figure 5. Class AB Broadband CircuitPerformance
Gps
, P
OW
ER
GA
IN (
dB) 18 40
17 35
16 −30
19 45
15 −32
14 −34
13 −36
955950945940935930
VDD = 28 Vdc
Pout = 45 W (PEP)
IDQ = 350 mA
Two−Tone Measurement
100 kHz Tone Spacing
100
17
21
IDQ = 525 mA
420 mA
VDD = 28 Vdc
f1 = 945 MHz
f2 = 945.1 MHz
Pout, OUTPUT POWER (WATTS) PEP
Figure 6. Power Gain versus Output Power
Gps
, P
OW
ER
GA
IN (
dB)
350 mA
280 mA
20.5
20
19.5
19
18.5
18
17.5
1010.1 100
−15
IDQ = 280 mA
350 mA
VDD = 28 Vdc
f1 = 945 MHz,
f2 = 945.1 MHz
Pout, OUTPUT POWER (WATTS) PEP
Figure 7. Intermodulation Distortion versusOutput Power
INT
ER
MO
DU
LAT
ION
DIS
TO
RT
ION
(dB
c)IM
D,
420 mA
525 mA
−20
−25
−30
−35
−40
−45
−50
−55
1010.1
100
−10
1
7th Order
VDD = 28 Vdc
IDQ = 350 mA
f1 = 945 MHz
f2 = 945.1 MHz
Pout, OUTPUT POWER (WATTS) PEP
Figure 8. Intermodulation Distortion Productsversus Output Power
INT
ER
MO
DU
LAT
ION
DIS
TO
RT
ION
(dB
c)IM
D,
3rd Order
5th Order
−20
−30
−40
−50
−60
−70
−80
10
Figure 9. Power Gain and Efficiency versusOutput Power
η
Gps
−10
−18
−14
, D
RA
IN�
EF
FIC
IEN
CY
(%
)
IMD
, IN
TE
RM
OD
ULA
TIO
N
DIS
TO
RT
ION
(dB
c)
IRL,
IN
PU
T R
ET
UR
N
LOS
S (
dB)−12
−16
100
20
0
50
ηVDD = 28 Vdc
IDQ = 350 mA
f = 945 MHz
Pout, OUTPUT POWER (WATTS) AVG.
Gps
, P
OW
ER
GA
IN (
dB)
14
30
10
20
12 10
40
1 10
Gps
22
16
18
60
, D
RA
IN E
FF
ICIE
NC
Y (
%)
η
0.1
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6RF Device Data
Freescale Semiconductor
MRF9045NR1
TYPICAL CHARACTERISTICS
0
5
10
15
20
25
30
35
40
45
50
55
60
65
70
22 24 26 28 30 32
VDD, DRAIN VOLTAGE (VOLTS)
Figure 10. Output Voltage versus Supply Voltage
Pou
t,
OU
TP
UT
PO
WE
R (
WA
TT
S)
PE
P
Pin = 0.3 W
Pin = 0.6 W
Pin = 1 W
IDQ = 350 mA
f = 945 MHz
Two−Tone Measurement
100 kHz Tone Spacing
Figure 11. MTTF Factor versus Junction Temperature
210
1011
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere2
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by ID2 for MTTF in a particular application.
1010
108
MT
TF
FA
CT
OR
(H
OU
RS
X A
MP
S2 )
90 110 130 150 170 190100 120 140 160 180 200
109
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MRF9045NR1
7RF Device DataFreescale Semiconductor
Figure 12. Series Equivalent Source and Load Impedance
fMHz
ZsourceΩ
ZloadΩ
930
945
0.81 - j0.25
0.85 - j0.05
2.03 + j0.09
2.03 + j0.28
VDD = 28 V, IDQ = 350 mA, Pout = 45 W (PEP)
f = 945 MHz
Zo = 5 Ω
f = 930 MHz
f = 945 MHz
f = 930 MHz
ZloadZsource
Zsource = Test circuit impedance as measured from gate to ground.
Zload = Test circuit impedance as measured from drain to ground.
Zsource
Zload
Input
Matching
Network
Device
Under Test
Output
Matching
Network
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8RF Device Data
Freescale Semiconductor
MRF9045NR1
PACKAGE DIMENSIONS
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MRF9045NR1
9RF Device DataFreescale Semiconductor
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10RF Device Data
Freescale Semiconductor
MRF9045NR1
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MRF9045NR1
11RF Device DataFreescale Semiconductor
PRODUCT DOCUMENTATION
Refer to the following documents to aid your design process.
Application Notes
• AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins• EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
Revision Date Description
12 Sept. 2008 • Data sheet revised to reflect part status change, including use of applicable overlay.
• Replaced Case Outline 1265-08 with 1265-09, Issue K, p. 1, 8-10. Corrected cross hatch pattern inbottom view and changed its dimensions (D2 and E3) to minimum value on source contact (D2 changedfrom Min-Max .290-.320 to .290 Min; E3 changed from Min-Max .150-.180 to .150 Min). Added JEDECStandard Package Number.
• Added Product Documentation and Revision History, p. 11
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12RF Device Data
Freescale Semiconductor
MRF9045NR1
How to Reach Us:
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Document Number: MRF9045NRev. 12, 9/2008
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