Microstructural Aspects & Performance Implications of … · Microstructural Aspects & Performance...

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1 W. Peng Pb-free, 2002 Microstructural Aspects & Performance Implications of Sn-Ag-Cu-Sb Solder in the Presence of Gold Weiqun Peng, Steven O. Dunford Puligandla Viswanadham and Stephen Quander Nokia, Dallas, TX75039, U.S.A.

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Page 1: Microstructural Aspects & Performance Implications of … · Microstructural Aspects & Performance Implications of Sn-Ag-Cu-Sb Solder in the Presence of Gold Weiqun Peng, Steven O.

1 W. Peng Pb-free, 2002

Microstructural Aspects & Performance Implications of Sn-Ag-Cu-Sb Solder in

the Presence of Gold

Weiqun Peng, Steven O. DunfordPuligandla Viswanadham and Stephen Quander

Nokia, Dallas, TX75039, U.S.A.

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2 W. Peng Pb-free, 2002

General requirementsof Pb-free in mobile phone applications

• WEEE requires mobile phones be lead-free in 01, 2006• Solder paste must be lead-free• PWB board finish must be lead-free• Component termination finishes & balls must be Pb-free

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Purposes

• To investigate reliability of totally lead-free solder joints• To study effects of gold coating thickness on Sn-Ag-Cu-

Sb solder joint performance• To discern failure mechanisms & microstructural evolution

differences in Sn-Ag-Cu-Sb and Sn-Pb-Ag solder joints after thermal cycling

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Experimental

• Materials/Hardware• 14 leadless component packages, Ni/Au termination finish

• FR4 high density micro-via test boards, Ni/Au surface finish

• Sn-Ag-Cu-Sb and Sn-Pb-Ag solder pastes• Test

• After reflow, after 200 cycles, after 500 cycles between −40 and 85°C

• Analysis• SEM, EDX for microstructural analysis

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Sample Matrix

Flash Au0.02-0.05um

Organicsubstrate

Intermediate Au0.15-0.5um

Ceramicsubstrate

Thick Au0.5-1.2umCeramicsubstrate

14 component packagesAfter reflow

200 cycles (-40 ~ 85°C)500 cycles (-40 ~ 85°C)

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Aspects of Analysis

• Voiding• Phase identification• Microstructure & interface• Effect of gold content • Effect of substrate• Effect of package size• Crack generation and development• What is the maximum Au content that can

be tolerated ????

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ResultsVoiding vs. Au thickness

Flash gold, round voidsSn-Ag-Cu-Sb solder

Thick gold, irregular voidsSn-Ag-Cu-Sb solder

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Voiding vs. solder paste

VoidsVoidsVoidsVoids

Sn-Ag-Cu-Sb, irregular shape.Thick gold

Sn-Pb-Ag, round shape.Thick gold

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Effect of gold content on voiding

Solubility of gold in Sn-Ag-Cu-Sb is greater than in Sn-Pb due to high Sn and high reflow temperature

Fraction of AuSn4 in the molten Sn-Ag-Cu-Sb joint is greater than in the Sn-Pb-Ag joint

AuSn4 crystals in molten solder will increase solder viscosity and degrade its spreadability

Increased viscosity restricts the release of gasses, resulting in higher void content

Fast cooling rate and large fraction of AuSn4results in irregular voids in thick gold joint

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Phase identification

Sn-Ag-Cu-Sb solder joint with thick gold terminal finish

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Ag

AuSn4

Ag3Sn

Sn

Au

Sn

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Au contents in Sn-Ag-Cu-Sb joint by EDX

Flash gold, ~1.5wt.% Medium gold ~ 3 wt. %

Special case, 12~17wt.%Thick gold, 5~7wt.%

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Microstructure change of Sn-Ag-Cu-Sb joint

Flash gold, reflowed Flash gold, 500cy

Thick gold, reflowed Thick gold, 500cy

No noticeable change in microstructure after thermal cycling

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Microstructure change of Sn-Pb-Ag joint

Flash gold, reflowed Flash gold, 500cy

Pb-rich phase becomes irregular

Thick gold, reflowed Thick gold, 500cy

Coarsened Au-needles & Pb-rich phase

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Interface of Sn-Ag-Cu-Sb joint after 500 cycles

Cu Ni

AuSn4

(Cu,Ni)6Sn5

Flash gold joint

AuSn4

Ni-Co

Thick gold joint

• (Cu,Ni)6Sn5 between Ni &solder

• Au, Ag, Cu & Ni mixed IMCs

• Micro-cracks at interface

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Interface of Sn-Pb-Ag joint after 500 cycles

Pb phase

AuSn4

Flash gold joint Thick gold joint

• Ni3Sn4 at interface• No Pb-rich phase at

interface

• Pb-rich layer at interface• AuSn4 layer at interface • AuSn4 needles throughout

joint

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Good joints: Flash gold finish & organic substrate

organic

Sn-Ag-Cu-Sb

500cy

organic

Sn-Ag-Cu-Sb

reflowed

organic500cy

Sn-Pb-Ag

organic

Sn-Pb-Ag

reflowed

Package size: 5.6x5.6x1.6mm

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Bad joints: Thick gold finish & ceramic substrate

200cy

ceramic

Sn-Ag-Cu-Sb

ceramic

Sn-Ag-Cu-Sb

500cy

reflowed

Package size, 3.1x3.1x1.2mmMedium Au joints are similar to thick Au joints

ceramic ceramic

Sn-Pb-Ag Sn-Pb-Ag500cy

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Effect of package size

9.5x7.5x2mm, 200 cyclesSn-Ag-Cu-Sb

ceramic ceramic

3.1x3.1x1.2mm, 200 cyclesSn-Ag-Cu-Sb

• The joint stress is higher in larger pacakges.

• Sn-Pb-Ag presents the same situation as Sn-Ag-Cu-Sb.

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Void in solder gap

Crack generation

Component corner

Rough fillet surface Joint tip

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Crack developmentreflowed 200cy

500cy

• Sn-Ag-Cu-Sb solder joints

• Package size: 9.5x7.5x2mm

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• Sn-Ag-Cu-Sb solder joint

• Cracks originate at void in gap area

• Easier crack propagation along IMC boundary

Crack development

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Crack start from tip

PWB

Crack development

PbSn

AuSn4

• Sn-Pb-Ag solder joint• Cracks start from tip• Propagated along Pb/Sn

interface or in Pb-rich phase• Cracked joint smoother than

Sn-Ag-Cu-Sb joint• Role of Pb-rich phase

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High Au content may be tolerated

Sn-Ag-Cu-Sb solder joint after 500 cycles

20Sn80Au

AuSn2

AuSn4

20Sn80Au

AuSn4

SMALL PACKAGE3.0x3.0x1.2mm

12~17wt.% Au

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High Au content may be toleratedNo solder joint cracks

I

II

AuAu-Sn

AuAu-Sn

20Sn80Au

AuSn4

Au-Sn IMC

SMALL PACKAGE3.0x3.0x1.2mm

12~17wt.% Au

Sn-Pb-Ag solder joint after 500 cycles

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PrimaryAuSn4

Eutectic

Au-Sn-Pb microstructure

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High Au can be prevented

20Sn80AuConfined well

I

II

I

II

No big AuSn4in Sn-Pb-Ag joint

Sn-Au solder is confined in component joint as indicated by the white arrow.

Sn-Pb-Ag solder joint after 500 cycles

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Conclusions• Microstructure of Sn-Ag-Cu-Sb solder joint is more stable than

that Sn-Pb-Ag joint in the temperature range studied. (p13-16)

• Presence of Au affects voiding because of Au-Sn IMC formation.Thick gold finish results in irregular voids (p7)

Flash gold finish results in spherical voids (p7)

Sn-Ag-Cu solder joint has more, bigger & irregular voids (p8)

• High Au content may be tolerated both in Sn-Ag-Cu-Sb and Sn-Pb-Ag solder joints in specific instances, but further study is needed. (p24-26)

• Combination of gold content and CTE is the main reason for the failures observed, package size plays an important role. (p17-20)

• Flash gold is recommended for all applications. (p17 -20)

• Failure mechanism of Sn-Ag-Cu-Sb solder joint is different from that of Sn-Pb-Ag solder joint. (p21-23)

• Sn-Ag-Cu-Sb solder provides better performance than Sn-Pb-Ag solder

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Acknowledgements

• Ted Carper for helpful discussions

• Sridhar Canumalla and Sesil Mathew for analysis support