May 8, 2001 2

USB High Speed Compliance

Program Overview

USB High Speed Compliance

Program OverviewDan FroelichDan Froelich

Intel CorporationIntel Corporation

May 8, 2001 3

AgendaAgenda

USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests

– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite– USBCheck UpdatesUSBCheck Updates

HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary

May 8, 2001 4

HistoryHistory

USB-IF Full/Low Speed Compliance ProgramUSB-IF Full/Low Speed Compliance Program– Long evolution from 1996 (USB 1.0) to today (2001)Long evolution from 1996 (USB 1.0) to today (2001)

S3

Inrush

Signal Quality, S1

USBCheck, Hidview, Interoperability

Chap 11, OHCI, Current

Chap 9, UHCI, Drop/Droop

S3

Inrush

Signal Quality, S1

USBCheck, Hidview, Interoperability

Chap 11, OHCI, Current

Chap 9, UHCI, Drop/Droop

‘96‘96

YearYear

T e s ting

T e s ting

Level

Level

‘97‘97 ‘98‘98 ‘99‘99 ‘00‘00 ‘01‘01

May 8, 2001 5

Compliance Program EvolutionCompliance Program Evolution

The USB HS Compliance Program is an extension The USB HS Compliance Program is an extension of the USB FS/LS Compliance Programof the USB FS/LS Compliance Program– Years of experienceYears of experience– Tools already in placeTools already in place– Full Speed Tests Apply to Full Speed Tests Apply to – High Speed DevicesHigh Speed Devices

USB HS Compliance ProgramUSB HS Compliance ProgramWill Start at a High Level!Will Start at a High Level!

USB HS Compliance ProgramUSB HS Compliance ProgramWill Start at a High Level!Will Start at a High Level!

TodayToday TomorrowTomorrow

HSHS

FS/LSFS/LS

May 8, 2001 6

Goals of theCompliance ProgramGoals of theCompliance Program

High Quality USB 2.0 ProductsHigh Quality USB 2.0 Products Stable, Repeatable, Well Documented TestsStable, Repeatable, Well Documented Tests

– Documented Test ProceduresDocumented Test Procedures– Documented Test Assertions and DescriptionsDocumented Test Assertions and Descriptions

Instantly Available Testing (Qualified Test Houses)Instantly Available Testing (Qualified Test Houses) Leverage USB 1.1 Compliance ProgramLeverage USB 1.1 Compliance Program

– Reuse USB CheckReuse USB Check– Reuse Interoperability Test ProceduresReuse Interoperability Test Procedures– Reuse Full and Low Speed Electrical TestingReuse Full and Low Speed Electrical Testing

Minimize Test Equipment CostsMinimize Test Equipment Costs

May 8, 2001 7

AgendaAgenda

USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests

– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite– USBCheck UpdatesUSBCheck Updates

HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary

May 8, 2001 8

Full and Low Speed TestingFull and Low Speed Testing

Current ConsumptionCurrent Consumption USBCheckUSBCheck

– Chapter 9Chapter 9– Chapter 11Chapter 11– HidViewHidView

InteroperabilityInteroperability– HS Device and Hub HS Device and Hub

AdditionsAdditions– Power ManagementPower Management

USB FS/LS Test FixturesUSB FS/LS Test Fixtures– Droop/DropDroop/Drop– InrushInrush– FS/LS Signal QualityFS/LS Signal Quality– Backdrive voltageBackdrive voltage

May 8, 2001 9

Current ConsumptionCurrent Consumption

UnconfiguredUnconfigured– 100 ma max100 ma max

ConfiguredConfigured– 100 ma Max (Low Power)100 ma Max (Low Power)– 500 ma Max (High Power)500 ma Max (High Power)– < bMaxPower value< bMaxPower value

Active/Operating (Same as Configured)Active/Operating (Same as Configured) SuspendSuspend

– 500 ua max 500 ua max – 2.5 ma max for high power devices with remote wakeup enabled2.5 ma max for high power devices with remote wakeup enabled

May 8, 2001 10

USBCheck –Chapter 9 AdditionsUSBCheck –Chapter 9 Additions

Other Speed Device Qualifier andOther Speed Device Qualifier andConfiguration DescriptorsConfiguration Descriptors– HS/FS Devices Must Use In Either EnvironmentHS/FS Devices Must Use In Either Environment– Standard Configuration Descriptors OnlyStandard Configuration Descriptors Only

For Current EnvironmentFor Current Environment

Endpoint Packet Size and Interval RulesEndpoint Packet Size and Interval Rules HS Devices Tested At High and Full SpeedsHS Devices Tested At High and Full Speeds bcdUSB = 0200H for ANY device designed to 2.0 SpecbcdUSB = 0200H for ANY device designed to 2.0 Spec

HS Capable Devices Must FunctionHS Capable Devices Must Functionin FS Environmentsin FS Environments

May 8, 2001 11

Compliance Tool USBCheckCompliance Tool USBCheck

USB Check 5.0 Beta 3 ReleasedUSB Check 5.0 Beta 3 Released

May 8, 2001 12

Interoperability TestingInteroperability Testing

Same Tree For HS/FS/LS TestingSame Tree For HS/FS/LS Testing Similar To FS/LS InteropabilitySimilar To FS/LS Interopability

– All Transfer TypesAll Transfer Types– 5 hubs deep with 5 meter cables5 hubs deep with 5 meter cables

(i.e. Tier 6)(i.e. Tier 6)– Mix of speedsMix of speeds– Power Management (S3)Power Management (S3)

Test devices at both FullTest devices at both Fulland High Speedsand High Speeds

Current Test Procedures OnlineCurrent Test Procedures Online

RootRoot

HS HubHS Hub

DUTDUT

HS HubHS Hub

HS HubHS Hub

Other Devices

Other Devices

FS HubFS Hub HS HubHS Hub

HS HubHS Hub

May 8, 2001 13

Full and Low Speed Electrical TestsFull and Low Speed Electrical Tests

CurrentCurrent

InrushInrush DropDrop Backdrive VoltageBackdrive Voltage

DroopDroop

Full/Low Speed Full/Low Speed Signal QualitySignal Quality

USB Check 5.0 Beta 3 ReleasedUSB Check 5.0 Beta 3 Released

May 8, 2001 14

AgendaAgenda

USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests

– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite– USBCheck UpdatesUSBCheck Updates

HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary

May 8, 2001 15

Test SuiteDevelopment Process Test SuiteDevelopment Process

UniversalUniversalSerial BusSerial Bus

SpecificationSpecification

Revision 2.0Revision 2.0

April 27, 2000April 27, 2000

UniversalUniversalSerial BusSerial Bus

SpecificationSpecification

Revision 2.0Revision 2.0

April 27, 2000April 27, 2000

Transaction TranslatorTransaction TranslatorAnd Hub And Hub

Compliance TestCompliance TestSpecificationSpecification

Revision .91Revision .91

March 15, 2001March 15, 2001

Transaction TranslatorTransaction TranslatorAnd Hub And Hub

Compliance TestCompliance TestSpecificationSpecification

Revision .91Revision .91

March 15, 2001March 15, 2001

Test AssertionsTest Assertions

TestTest

SuiteSuite

Test Results Refer To AssertionsTest Results Refer To Assertions

May 8, 2001 16

Test Specification FormatTest Specification Format

Test AssertionsTest Assertions

Test DescriptionsTest Descriptions– Occupy All Non-Periodic Buffers *Occupy All Non-Periodic Buffers *– Issue Clear TT For One BufferIssue Clear TT For One Buffer– Attempt Transaction For Cleared EndpointAttempt Transaction For Cleared Endpoint

HS Electrical Test Spec version 1.0 and TT/Hub Test HS Electrical Test Spec version 1.0 and TT/Hub Test Specification Rev .91 Posted In Members SiteSpecification Rev .91 Posted In Members Site

1.6.71.6.7 A Transaction Translator must clear an asynchronous (non-periodic) A Transaction Translator must clear an asynchronous (non-periodic) buffer associated with the given endpoint in response to a valid Clear TT buffer associated with the given endpoint in response to a valid Clear TT Buffer request.Buffer request.Specification Ref: Specification Ref: Universal Serial Bus Specification, Revision 2.0. Universal Serial Bus Specification, Revision 2.0. Section 11.24.2.11.Section 11.24.2.11.Test Description: Test Description: TD.1.11TD.1.11

RequirementRequirement

SourceSource

Test Covering ReqTest Covering Req

May 8, 2001 17

Test ProceduresTest Procedures

Full and Low Speed Compliance Test ProcedureFull and Low Speed Compliance Test Procedure– Covers FS/LS Hub, Device, and Host/System TestingCovers FS/LS Hub, Device, and Host/System Testing

Drop/Droop, InRush, Signal Quality, Current ConsumptionDrop/Droop, InRush, Signal Quality, Current Consumption USBCheck, InteroperabilityUSBCheck, Interoperability

– 1.0 RC2 Release on 1.0 RC2 Release on www.USB.orgwww.USB.org– USBCheck HS Changes To Be AddedUSBCheck HS Changes To Be Added

High Speed Electrical Compliance ProcedureHigh Speed Electrical Compliance Procedure– Very Thorough CoverageVery Thorough Coverage– Initial Post for Member Review in JuneInitial Post for Member Review in June

May 8, 2001 18

AgendaAgenda

USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests

– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite

HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary

May 8, 2001 19

New Testing AreasNew Testing Areas

HS ElectricalsHS Electricals– High Speed Signal QualityHigh Speed Signal Quality– Time Domain Reflectometry Time Domain Reflectometry

(TDR)(TDR)– Receiver Sensitivity and Receiver Sensitivity and

SquelchSquelch– J and K Voltage LevelsJ and K Voltage Levels– ChIRPChIRP– Packet ParametersPacket Parameters– Suspend/ResumeSuspend/Resume

Transaction TranslatorTransaction Translator– Full Functional TestFull Functional Test– Protocol Response CasesProtocol Response Cases– Implementation RulesImplementation Rules

HS Hub RepeaterHS Hub Repeater– Sync BitsSync Bits– LatencyLatency– EOP DribbleEOP Dribble

May 8, 2001 20USB HS Test FixtureUSB HS Test Fixture

HS RelayHS RelayHS RelayHS RelayTest PortTest Port

InitializationInitializationPortPort

Diff ProbeDiff ProbeDataDataGeneratorGenerator

90 Ohms90 Ohms

PowerPowerSelectionSelection

CktCkt

PowerPowerSelectionSelection

CktCkt

Vbus1Vbus1 Vbus2Vbus2VccVcc

GndGnd

New Test Fixture(s)New Test Fixture(s)

High Speed Isolation RelayHigh Speed Isolation Relay Ideal TerminationsIdeal Terminations Selectable VBUS SourceSelectable VBUS Source USB-IF Will ProvideUSB-IF Will Provide

May 8, 2001 21

General HS ElectricalTest ProcedureGeneral HS ElectricalTest Procedure

Connect Device Under Test To Test Port on FixtureConnect Device Under Test To Test Port on Fixture Configure DUT With Test Mode SWConfigure DUT With Test Mode SW Isolate DUT from Host with High Speed RelayIsolate DUT from Host with High Speed Relay Make Appropriate Electrical MeasurementsMake Appropriate Electrical Measurements

May 8, 2001 22

Electrical Example – HS Receiver SensitivityElectrical Example – HS Receiver Sensitivity

DUT Placed In DUT Placed In Test_SEO_NAK ModeTest_SEO_NAK Mode

Data Generator Data Generator Generates IN PacketsGenerates IN Packets

Device Must Respond Device Must Respond For In Spec PacketsFor In Spec Packets

Device Must Not Device Must Not Respond to Out of Respond to Out of Spec Data Generator Spec Data Generator OutputOutput

Data GeneratorData GeneratorTest Mode

SW

USB 2.0 Test FixtureUSB 2.0 Test Fixture

HS RelayHS RelayHS RelayHS Relay

Device UnderDevice Under TestTest

SMASMA

May 8, 2001 23

Electrical Example – High Speed Repeater TestingElectrical Example – High Speed Repeater Testing

Put Hub Port in Put Hub Port in Test_Force_EnableTest_Force_Enable

Test SW Generates Test SW Generates Downstream Traffic Downstream Traffic

Capture Pre/Post Hub Capture Pre/Post Hub SignalsSignals

Analyze Data Analyze Data – Sync Truncation Sync Truncation – EOP DribbleEOP Dribble– LatencyLatency

Test Mode SW

OscilloscopeOscilloscope

Hub Under Hub Under TestTest

Breakout BoardBreakout Board Breakout BoardBreakout Board

HS Electrical Test Specification Rev 1.0 ReleasedHS Electrical Test Specification Rev 1.0 Released

May 8, 2001 24

AgendaAgenda

USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests

– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite

HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary

May 8, 2001 25

Transaction TranslatorTransaction Translator

Sophisticated Sophisticated Functional UnitFunctional Unit

Bulk/Control Bulk/Control Transaction BuffersTransaction Buffers

Periodic PipelinePeriodic Pipeline New ProtocolsNew Protocols

TT/Hub Test Specification Rev .91 ReleasedTT/Hub Test Specification Rev .91 Released

HSHS DeviceDevice

LS LS DeviceDevice

Port 1Port 1

480 MHz480 MHz12 MHz12 MHz1.5 MHz1.5 MHz

Port 2Port 2 Port NPort N

FS FS DeviceDevice

HubHub Hub State Hub State RepeaterRepeater Machines Machines HubHub Hub State Hub State RepeaterRepeater Machines Machines

Hub Hub ControllerController

Hub Hub ControllerController

High Speed ConnectionHigh Speed Connection

TransactionTransaction TranslatorTranslator

TransactionTransaction TranslatorTranslator

Port Routing Logic

May 8, 2001 26

Test Suite ArchitectureTest Suite Architecture

Test ExecutiveTest ExecutiveTest ExecutiveTest Executive

Hub and TT Test DLLHub and TT Test DLLHub and TT Test DLLHub and TT Test DLL

Test ServicesTest ServicesTest ServicesTest Services

Intel Test StackIntel Test StackIntel Test StackIntel Test Stack MS USBDI InterfaceMS USBDI InterfaceMS USBDI InterfaceMS USBDI Interface

FS Test DeviceFS Test DeviceFS Test DeviceFS Test Device LS Test DeviceLS Test Device

May 8, 2001 27

Test Devices - OverViewTest Devices - OverView

Basic FunctionalityBasic Functionality– Full Speed Full Speed – Low SpeedLow Speed– All Transfer TypesAll Transfer Types– Multiple EndpointsMultiple Endpoints

Protocol Level ControlProtocol Level Control– Produce All Possible Device ResponsesProduce All Possible Device Responses– Allows Testing of Corner CasesAllows Testing of Corner Cases

Defined Device Interface (Test Device Class)Defined Device Interface (Test Device Class)– Allows Any Capable PDK/Device to Be UsedAllows Any Capable PDK/Device to Be Used– Vendor Command BasedVendor Command Based– Allows Dynamic Device ReconfigurationAllows Dynamic Device Reconfiguration

May 8, 2001 28

Test Services - ArchitectureTest Services - Architecture

Test ServicesTest Services

HostHostControllerController

PortPort

HostHostPortPort

Hub PortHub PortEndPoint

Test DeviceEndPoint

Stack InterfaceStack Interface

MS USBDIMS USBDIInterfaceInterface

Intel EHCI TestIntel EHCI TestStackStack

DeviceDeviceNodeNode

DeviceDeviceNode ListNode List

Minimal I/OMinimal I/OInterfaceInterface

ReadRead

WriteWrite

Select Host ControllerSelect Host Controller

EnumerateEnumerate

Do Control RequestDo Control Request

Set/Clear Port FeatureSet/Clear Port Feature

HubHubDeviceDevice

TestTestDeviceDevice

DeviceDevice

May 8, 2001 29

Test ExecutiveTest Executive

Standard GUIStandard GUI LoggingLogging

– Assertion Pass/FailAssertion Pass/Fail– Time/Date/Version StampsTime/Date/Version Stamps

Multi-Threading SupportMulti-Threading Support– Multiple Transfer StreamsMultiple Transfer Streams– Simpler TestsSimpler Tests

Robust - Well Tested EngineRobust - Well Tested Engine Tests are Simple DLL FunctionsTests are Simple DLL Functions

Several Third Party Test Several Third Party Test Executives Under Executives Under

EvaluationEvaluation

USBCheck Rewrite With Same Model PlannedUSBCheck Rewrite With Same Model Planned

May 8, 2001 30Note: all dates provided are for planning purposes only and are subject to changeNote: all dates provided are for planning purposes only and are subject to change

Compliance Program MilestonesCompliance Program Milestones

HS Logo Testing HS Logo Testing – Device Testing PreviewDevice Testing Preview October 2000October 2000– First Host Controller CertifiedFirst Host Controller Certified November 2000November 2000– First Device CertifiedFirst Device Certified December 2000December 2000– Full Device Testing Available At Compliance WorkshopsFull Device Testing Available At Compliance Workshops January 2001January 2001– Full Hub Testing Available at Intel Test LabFull Hub Testing Available at Intel Test Lab March 2001March 2001

Test Specifications Test Specifications – HS Electrical v. 1.0 Released To USB-IF MembersHS Electrical v. 1.0 Released To USB-IF Members March 2001March 2001– TT/Hub v .91 Released to USB-IF MembersTT/Hub v .91 Released to USB-IF Members March 2001March 2001– TT/Hub v 1.0 ReleaseTT/Hub v 1.0 Release June 2001June 2001

HS Electrical Test SuiteHS Electrical Test Suite– USB-IF Test Procedure ReleaseUSB-IF Test Procedure Release June 2001June 2001– USB-IF High Speed Test Fixture ReleaseUSB-IF High Speed Test Fixture Release October 2001October 2001– USB-IF Test Mode SW ReleaseUSB-IF Test Mode SW Release October 2001October 2001

May 8, 2001 31

Note: all dates provided are for planning purposes only and are subject to changeNote: all dates provided are for planning purposes only and are subject to change* Other brands and names may be claimed as the property of others.* Other brands and names may be claimed as the property of others.

Compliance Program MilestonesCompliance Program Milestones

TT/Hub Test SuiteTT/Hub Test Suite– Full/Low Seed Test Device SpecificationFull/Low Seed Test Device Specification June 2001June 2001 – Full Speed Compliance Test DeviceFull Speed Compliance Test Device October 2001October 2001– Low Speed Compliance Test DeviceLow Speed Compliance Test Device October 2001October 2001– USB-IF Automated Test Suite ReleaseUSB-IF Automated Test Suite Release October 2001October 2001

USBCheckUSBCheck– USB-IF 5.0 Beta 3 Windows 2000* Release - HS SupportUSB-IF 5.0 Beta 3 Windows 2000* Release - HS Support March 2001March 2001– USB-IF 5.0 Release for Windows XPUSB-IF 5.0 Release for Windows XP July 2001July 2001– USB-IF USBCheck Rewrite – Initial ReleaseUSB-IF USBCheck Rewrite – Initial Release October 2001October 2001

Test House CertificationTest House Certification– Formal HS Training BeginsFormal HS Training Begins June/July 2001June/July 2001– HS Certified Test HouseHS Certified Test House October 2001October 2001

May 8, 2001 32

SummarySummary

Thorough Electrical Tests Thorough Electrical Tests – High Speed ElectricalHigh Speed Electrical– High Speed Hub RepeaterHigh Speed Hub Repeater

Thorough Functional Test of Transaction TranslatorThorough Functional Test of Transaction Translator– Test SuiteTest Suite– Test DevicesTest Devices

Well Documented TestsWell Documented Tests– Test ProceduresTest Procedures– Test SpecificationsTest Specifications

Great Steps Being Taken To Ensure USB 2.0 SuccessGreat Steps Being Taken To Ensure USB 2.0 Success

May 8, 2001 33

Questions?Questions?