Markless registration for scans of free form objects

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MARKLESS REGISTRATION FOR SCANS OF FREE-FORM OBJECTS Laboratory of photogrammetry of NTUA Artemis Valanis, PhD Student Charalambos Ioannidis, Professor

Transcript of Markless registration for scans of free form objects

Page 1: Markless registration for scans of free form objects

MARKLESS REGISTRATION FOR SCANS OF FREE-FORM OBJECTS

Laboratory of photogrammetry of NTUA Artemis Valanis, PhD Student Charalambos Ioannidis, Professor

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Target: to initialize the ICP algorithmin order to register partial scans of uniform or free-form objects

Difficulty: no targets present no characteristic points identifiable in the area of overlap

Problem identification

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Motivation

Front view Side view

Initial state

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Front view Side view

MotivationResult of ICP - no prior processing

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Various approaches for automatic ICP initialization:

Bae & Lichti, 2004 Geometric primitives Gelfand, 2005 Feature points Hansen, 2006 Plane-matching Makadia, 2006 Extended Gaussian

Images Biswas, 2006 Isosurfaces

Related Literature

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Bae & Lichti, 2004 Geometric primitives Gelfand, 2005 Feature points Hansen, 2006 Plane-matching Makadia, 2006 Extended Gaussian Images Biswas, 2006 Isosurfaces

Example Objects

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Constrained acquisition process Properly adjusted methods that:◦Recover the relative transformation between two or more

partial scans◦Approximately align the point clouds◦Enable the initialization of ICP ◦Achieve the optimal alignment of partial scans without the

use of targets or the identification of conjugate points

Proposed approach

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Worked cases

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Worked cases

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HDS2500FOV 40ox40o spot size = 6mm position accuracy = ±6mm (50m range)

Equipment used

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Key Idea

Y

XZ

Y

X Z

Y

X

Acquisition scenario

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Key Idea

Y

X Z

Y

X Z

Y

X

Y

X

Acquisition scenario Acquired dataProposed approach

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Front view Side view

Initial state

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Front view

Result of ICP combined with the proposed method

Front view Side view

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Data imported:2 scans acquired either by rotating the scan head vertically (ω angle) or horizontally (φ angle)

Process:The space of the unknown parameter (ω or φ angle) is sequentially sampled in order to obtain an approximation of the unknown angle. If the value of the evaluated measure is minimized then an approximate value is derived

Proposed algorithm

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If the unknown rotation is ω

◦The ω is given an initial value 0 that is increased by 5g in every loop

◦For every ω value, a rotation matrix is calculated and applied to the point-cloud that needs to be registered

◦After the transformation, the area of overlap between the reference and the moving scan is calculated and a rectangular grid is defined

Sampling process 1/2

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◦The evaluated function i.e. the median of the distances of the two point clouds at the nodes of the grid along the Z direction, is derived based on 2D tesselations created for each point-cloud

◦Once the comparison measure reaches a minimum, the process is repeated at the respective interval with a step of 1g

◦When another minimum is detected, the final value is derived by a simple interpolation

Sampling process 2/2

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2 scans acquired by different ω angle 5 targets used to evaluate the results Algorithm implemented in Matlab Calculation of the unknown transform in Cyclone and

in Matlab

Method Validation

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Initial State

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Target distances as calculated for the original scans

T (X,Y,Z) 0.0000 0.0000 0.0000 (m)

R (ω,φ,κ) 0.0000 0.0000 0.0000 (grad)

TargetID X-error (m)

Y-error (m)

Z-error (m)

Total error (m)

4 -0.0202 1.9803 -0.5524 2.0560

7 -0.0251 2.4629 -0.4710 2.5077

3 -0.0254 2.5420 -0.4685 2.5849

1 -0.0322 3.3798 -0.8934 3.4960

13 -0.0321 3.1860 -0.8455 3.2964

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Results of the sampling process

Coarse sampling Fine sampling

ωι sign(mzi) |mzi| ωι sign(mzi) |mzi|

0 (-) 1.2349m 10 (-) 0.084m

5 (-) 0.6235m 11 (+) 0.0221m

10 (-) 0.084m Approximate value

15 (+) 0.4264m ωο =10.7920g

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Results after the approximate alignment

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Results after the approximate alignment

T (X,Y,Z): 0.0000 0.0000 0.0000 (m)

R (ω,φ,κ): 10.7920 0.0000 0.0000 (grad)

TargetID X-error (m)

Y-error (m)

Z-error (m)

Total error (m)

4 -0.0202 0.0070 0.0109 0.0240

7 -0.0251 0.0113 0.0090 0.0289

3 -0.0254 0.0106 0.0048 0.0279

1 -0.0322 0.0198 -0.0067 0.0384

13 -0.0321 0.0159 -0.0016 0.0359

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Result of ICP after the application of the proposed algorithm

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T(X,Y,Z): -0.0007 -0.0074 0.0122 (m)

R(ω,φ,κ): 10.8685 0.1134 0.0156 (grad)

TargetID X-error (m)

Y-error (m)

Z-error (m)

Total error (m)

4 0.0004 -0.0003 -0.0008 0.0010

7 0.0001 -0.0010 0.0012 0.0016

3 -0.0004 0.0013 0.0022 0.0026

1 -0.0013 0.0012 0.0015 0.0023

13 0.0005 0.0025 0.0007 0.0027

Results of ICP after the application of the proposed algorithm

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Application of the method for the monument of Zalongon

9 set-ups

14 scans in total

4 scans with no tagets

Back

3 set-ups

4 scans (2 single and a scan-pair)

Front

6 set-ups

10 scans (3 single, 2 scan-pairs and a scan-

triplet)

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Accuracy evaluation for 2 scan-pairs

Scan couple of set-up 5 (top to base)

ICP initialization for ωο =25.0327g

TargetID X-error (m) Y-error (m)

Z-error (m)

Total error (m)

11 -0.0003 -0.0020 0.0016 0.0026

10 -0.0003 -0.0038 0.0012 0.0040

Scan couple of set-up 6 (top to base)

ICP initialization for ωο =35.6083g

TargetID X-error (m) Y-error (m)

Z-error (m)

Total error (m)

16 -0.0016 -0.0071 0.0013 0.0074

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Scan triplet of set-up 7 (top to middle)

ICP initialization for ωο =18.1991g

Average alignment error = 0.0070m

Scan triplet of set-up 7 (top & middle to base)

ICP initialization for ωο =18.1828g

Average alignment error = 0.0067m

TargetIDX-error

(m) Y-error (m) Z-error (m)Total error

(m)

15 0.0005 -0.0027 0.0009 0.0029

6 0.0022 -0.0009 0.0009 0.0026

Accuracy evaluation for a scan-triplet

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Registration results

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3D surface model

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With minor modifications, it is as easily applied for horizontal rotations

Applicable also for sequences of scans acquired under the described conditions

Provides a solution in cases of serious space limitations

A non-elaborate and effective solution for all of those who have invested on similar equipment

Merits of the proposed approach

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Thank you for your attention!