Long Term Stability Test
description
Transcript of Long Term Stability Test
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Long Term Stability Test
University of TsukubaYusuke TAKAHASHI
2009/07/29for ILC meeting
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Cut
• (P7-P4)-(P4 -P1) <0 :peak position correction• (P4-P1)-(P5+P2) >0 (P7-P4)-(P8+P5) >0 : Pk–Pk is away enough
d SGain
e A
d = p1-p0S = ADC Resolution (= 0.25pC/ADCcount)e = electric charge(= 1.6 x10-19 C)A = HAMAMATSU AMP Gain(= 63)
)
82
7exp(6)
52
4exp(3)
22
1exp(0
222 p
pxp
p
pxp
p
pxp
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Rejected ADC distribution
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Correction of 3-Gaussian fit
Before
After
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Gain Vs Vbias (Before)Type A Type B
Sample#1102
Sample#1103
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
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Gain Vs Vbias (After)Type A Type B
Sample#1102
Sample#1103
・ 25・ 30・ 40・ 50・ 60
• 温度を横軸に、 V0 , Capacitance をそれぞれ縦軸にとり温度依存性を見る
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
)( 0VVe
CGain bias
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V0 Temperature dependence (Before)
・ #1102 Type A・ #1102 Type B・ #1103 Type A・ #1103 Type B
TTV )(0
#1102 Type A α:0.051 ± 0.001 V/℃β:72.84 ± 0.02 V
#1102 Type B α:0.051 ± 0.001 V/℃β:72.83 ± 0.02 V
#1103 Type A α:0.053 ± 0.001 V/℃β:72.82 ± 0.02 V
#1103 Type B α:0.051 ± 0.001 V/℃β:72.88 ± 0.02 V
α:Temperature coefficient [V/℃]
β:V0 [V] @ 0 ℃
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V0 Temperature dependence (After)
・ #1102 Type A・ #1102 Type B・ #1103 Type A・ #1103 Type B
TTV )(0
#1102 Type A α:0.050 ± 0.001 V/℃β:72.82 ± 0.02 V
#1102 Type B α:0.051 ± 0.001 V/℃β:72.79 ± 0.03 V
#1103 Type A α:0.053 ± 0.001 V/℃β:72.80 ± 0.02 V
#1103 Type B α:0.051 ± 0.001 V/℃β:72.86 ± 0.02 V
α:Temperature coefficient [V/℃]
β:V0 [V] @ 0 ℃
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Capacitance Temperature dependence ( Before )
#1102 Type A Capacitance 1.584 ± 0.004 ×10-
2pF
#1102 Type B Capacitance 1.611 ± 0.004 ×10-
2pF
#1103 Type A Capacitance 1.564 ± 0.004 ×10-
2pF
#1103 Type B Capacitance 1.610 ± 0.004 ×10-
2pF
CTC )(
・ #1102 Type A・ #1102 Type B・ #1103 Type A・ #1103 Type B
Capacitance is assumed to be no temperature dependence.
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Capacitance Temperature dependence ( After )
#1102 Type A Capacitance 1.575 ± 0.004 ×10-
2pF
#1102 Type B Capacitance 1.603 ± 0.004 ×10-
2pF
#1103 Type A Capacitance 1.555 ± 0.004 ×10-
2pF
#1103 Type B Capacitance 1.600 ± 0.004 ×10-
2pF
CTC )(
・ #1102 Type A・ #1102 Type B・ #1103 Type A・ #1103 Type B
Capacitance dose not depend at the temperature.
Capacitance is assumed to be no temperature dependence.
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Set Up ( NoiseRate )
Clock
GeneratorGate Generator
Width 0.5s
Voltage
source
Discriminator
Thermostatic
chamber(25℃)
MPPC AMP×63×10
Coincidence
25ns
Vth
1HzPC
Scaler
GPIB
CAMAC
10MHz
Discriminator
Digital
Multi Meter
ECL
to
NIM
20ns
hoge
Noise
RS232C
25ns
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Threshold Curve
Vth [mV]
Vth [mV]
Sample#1102Type A
Over Voltage 3[V]
Width 25 ns
Threshold Curve (derivation)
Threshold Curve
322
1
2
)30(p
p
pVerfc
ppVtScalerCoun thth
dttxerfcx
2exp2
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Noise Rate(0.5 p.e.)Type A Type B
Sample#1102
Sample#1103
・ 25・ 30・ 40・ 50・ 60
Noise Rate grows, too , as the temperature rises.
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#1103Type A
・ 25・ 30・ 40・ 50・ 60
The cause of the miss data is unknown.Remeasurement was
finished.But, the analysis has not
finished yet.
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Noise Rate(1.5 p.e.)Type A Type B
Sample#1102
Sample#1103
・ 25・ 30・ 40・ 50・ 60
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Cross-Talk ProbabilityType A Type B
Sample#1102
Sample#1103
・ 25・ 30・ 40・ 50・ 60
Cross-Talk Probability doesn’t depend at the temperature.
.).5.0(
.).5.1(
epVtsscalercoun
epVtsscalercounP
th
thcrosstalk
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Leakage CurrentType A Type B
Sample#1102
Sample#1103
・ 25・ 30・ 40・ 50・ 60
Leakage Current grows, too , as the temperature rises.
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ProgressThe measurement of long-term stability began on July 7.
Sample #1102
Sample #1103
T = 85 ℃⊿ V = 3 V
Temperature monitor
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Summary & Plan
• V0 changes into the temperature linear.
• Capacitance and Cross-Talk Probability doesn’t depend at the temperature.
• Leakage Current depends at the temperature. Plan
Summary
• It is necessary to do the remeasurement data analysis.
• It is necessary to do Cross Talk correction. (accidental 2p.e. signal is excluded)• Leak Current is analyzed, and understood.
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Back Up
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回路図
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T=40℃ Vbias 79.07Type BType A
Sample#1102
Sample#1103
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GainV0
Type A :74.10 ±0.01 VType B :74.12 ±0.01 V
V0Type A :74.14 ±0.01 VType B :74.17 ±0.01 V
Sample#1102
Sample#1103
V0 が一致し、 Capacitance も一致した。⇒ 新しい回路で Gain に対する差異はない。
・ Type A・ Type B
・ Type A・ Type B
CapacitanceType A :1.601±0.006×10-
2pFType B :1.644±0.008×10-
2pF
CapacitanceType A :1.586±0.006×10-
2pFType B :1.611±0.006×10-
2pF
)( 0VVe
CGain bias
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Gain Vs VbiasType A Type B
Sample#1102
Sample#1103
・ 25・ 30・ 40・ 50・ 60
• 温度を横軸に、 V0 , Capacitance をそれぞれ縦軸にとり温度依存性を見る
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
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V0 温度依存性
・ #1102 Type A・ #1102 Type B・ #1103 Type A・ #1103 Type B
TTV )(0
#1102 Type A α:0.051 ± 0.001 V/℃β:72.84 ± 0.02 V
#1102 Type B α:0.051 ± 0.001 V/℃β:72.83 ± 0.02 V
#1103 Type A α:0.053 ± 0.001 V/℃β:72.82 ± 0.02 V
#1103 Type B α:0.051 ± 0.001 V/℃β:72.88 ± 0.02 V
α: 温度係数 [V/℃]β:0℃ のときの V0 [V]
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Capacitance 温度依存性#1102 Type A Capacitance 1.589 ± 0.004 ×10-
2pF
#1102 Type B Capacitance 1.616 ± 0.004 ×10-
2pF
#1103 Type A Capacitance 1.567 ± 0.004 ×10-
2pF
#1103 Type B Capacitance 1.607 ± 0.004 ×10-
2pF
CTC )(
・ #1102 Type A・ #1102 Type B・ #1103 Type A・ #1103 Type B
Capacitance には温度依存性がないと仮
定
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Gain Vs Vbias (2)
σ が2倍になる Vbias 79.0[V]を上限として同じ解析をした
Sample#1102Type A
・ 25・ 30・ 40・ 50・ 60
↓ : Pedestal を Gaussian Fit したときの σ を Bias Voltage で比較した
・ 25・ 30・ 40・ 50・ 60
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V0 温度依存性(2)
・ #1102 Type A・ #1102 Type B・ #1103 Type A・ #1103 Type B
TTV )(0
#1102 Type A α:0.049 ± 0.001 V/℃β:72.86 ± 0.03 V
#1102 Type B α:0.050 ± 0.001 V/℃β:72.83 ± 0.03 V
#1103 Type A α:0.050 ± 0.001 V/℃β:72.88 ± 0.03 V
#1103 Type B α:0.051 ± 0.001 V/℃β:72.90 ± 0.03 V
α: 温度係数 [V/℃]β:0℃ のときの V0 [V]
高温領域でも温度に対して線形に依存する。
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Capacitance 温度依存性(2)#1102 Type A Capacitance 1.584 ± 0.004 ×10-
2pF
#1102 Type B Capacitance 1.611 ± 0.004 ×10-
2pF
#1103 Type A Capacitance 1.564 ± 0.004 ×10-
2pF
#1103 Type B Capacitance 1.610 ± 0.004 ×10-
2pF
CTC )(
・ #1102 Type A・ #1102 Type B・ #1103 Type A・ #1103 Type B
Capacitance には温度依存性がないと仮
定
温度が上がるにつれてCapacitance が小さくなっている。
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Summary & Plan
• 60℃ までの Gain , Noise Rate ,Cross Talk , Leak Current の測定を終えた。• V0 , Capacitance ,Cross Talk ,
Leak Current に温度依存性があるように見える。
Plan
Summary
• 引き続き予備実験を続ける。( 25 ~ 60℃ の再測定)
• Noise Rate ,Leak Current の解析・理解を進める。
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Rejected ADC distributionsType A Type B
Sample#1102
Sample#1103
・ 25・ 30・ 40・ 50・ 60
• T=40,50,60 について棄却したデータの ADC 分布を見る。
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
・ 25・ 30・ 40・ 50・ 60
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T=40℃ Vbias 79.07Type BType A
Sample#1102
Sample#1103
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T=40℃ Vbias 79.27
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T=40℃ Vbias 79.47
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T=50℃ Vbias 79.07
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T=50℃ Vbias 79.27
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T=50℃ Vbias 79.47
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T=50℃ Vbias 79.67
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T=60℃ Vbias 79.07
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T=60℃ Vbias 79.27
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T=60℃ Vbias 79.47