Long Term Performance of V-Cone Flow Meters...• The wafer V-Cone offers 1% of rate accuracy and...
Transcript of Long Term Performance of V-Cone Flow Meters...• The wafer V-Cone offers 1% of rate accuracy and...
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Long Term Performance of V-Cone Flow Meters
Mike Dyer Applications Engineer
New Zealand Gas Forum
Nov. 2017
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Agenda • Powerco’s Pressure Control Module
• V-Cone Meter Principles of Operation
• Data Collection
• Test Facility
• Applications Test Meter
• Test Data
• Conclusions
• Wafer damage tests
• Straight run tests
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Powerco Project
• Above ground pressure control
modules.
• They were not measuring flow but
wanted to verify their model.
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Options
• Turbine meters offer good accuracy
but require maintenance.
• Other technologies did not fit.
• The wafer V-Cone offers 1% of rate
accuracy and very little maintenance.
• Straight run requirements are 0 to 4
Dia. up and 0 to 2 Dia. down.
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Wafer V-Cone vertical up flow
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Wafer V-Cone
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Cone Meter Principles of
Operation High Pressure
Port
Low Pressure
Port
Flow
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Equations
=Thermal Expansion Correction
=Meter Flow Coefficient
=Gas Expansion Factor (2001)
=Meter Geometric Constant
=Differential Pressure
=Fluid Density
DPKYCFQ Da 1
aF
DC
Y
1K
DP
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Test Data Collection
• Customer’s were required by the EPA
to recalibrate meters.
• All of the calibrations took place at 3rd
party lab, CEESI Co. (air calibrated)
• This reduced the added uncertainty of
a second lab.
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Test Facility
• Flow rates were dictated by
customers application but were
consistent for any given meter.
• Master meter Critical Flow Venturi
(CFV).
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Test Facility
• Flow rate uncertainty 0.29% to 0.35%.
• Using the root sum square method
with sensitivity factors.
DPKYF
QC
a
D
1
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Cd Test Error
2222
TEPEDPEQEerrorD STSPSDPSQC
EQ
EDP
EP
ET
S
= Flow Error (0.29% to 0.35%)
= DP Error (.07 to .75%)
= Pressure Error (.07%)
= Temperature Error (± 0.5 C)
= Sensitivity Factor for each
measurement (1 to .48)
uncertainty of approximately 0.4% to 0.5%. DC
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Test Meter Applications
63 total calibrations, two of the 63 calibrations were identified as
outliers based on the Grubbs test and a 99.9% confidence.
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Example of Test Data
7 calibrations yielded 21 data sets
Cal Year Ave Cd YBC Cd shift YBC Cd Shift YBC Cd Shift YBC Cd Shift YBC Cd Shift YBC Cd Shift
1995 0.844681 0
2001 0.849769 6 0.60% 0
2006 0.850767 11 0.72% 5 0.12%
2008 0.84994 13 0.62% 7 0.02% 2 -0.10%
2010 0.852034 15 0.87% 9 0.27% 4 0.15% 2 0.25%
2012 0.853277 17 1.02% 11 0.41% 6 0.29% 4 0.39% 2 0.15%
2013 0.859209 18 1.72% 12 1.11% 7 0.99% 5 1.09% 3 0.84% 1 0.70%
Meter A
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• As DP meters wear they generate
less DP.
• We expected to see Cd values
increase over time.
DPKYF
QC
a
D
1
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Cd Change vs Time
15 meters, 61 calibrations, 107 data sets
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Cd vs Time by Meter
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Conclusions
• Data shows cone meters have
extremely good long term
performance.
• Recalibrating not necessary, however
we did not test abrasive fluids.
• We do recommend periodic visual
inspections.
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Damaged Cone
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0.845
0.850
0.855
0.860
0.865
0.870
0.875
0.880
0.885
0.890
0.895
0.900
0 20000 40000 60000 80000 100000 120000 140000 160000
Flo
wm
ete
r C
f
Re
baseline no damage
heavily damaged cone
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Obstruction Test Data
• 0.45 betas are very large cone and
condition flow better than a .75 beta.
• 0.45 beta test data with elbows out of
plane and half open gate valves.
• 0.75 beta with elbows out of plane.
• 0.65 beta Wafer V-Cones with
reducers.
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Straight Run Data
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Gate Valve Up and Down
Stream
3 dia. up and 0 dia. down
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Elbows 3 dia. Upstream
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2” x 4” Reducing Adapters 2” x 4” Concentric Reducers
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Reducer Data
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Questions?