Karel Výborný, Jan Zemen, Kamil Olejník, Petr Vašek, Miroslav Cukr, Vít Novák, Andrew...
-
Upload
austin-tyler -
Category
Documents
-
view
225 -
download
3
Transcript of Karel Výborný, Jan Zemen, Kamil Olejník, Petr Vašek, Miroslav Cukr, Vít Novák, Andrew...
![Page 1: Karel Výborný, Jan Zemen, Kamil Olejník, Petr Vašek, Miroslav Cukr, Vít Novák, Andrew Rushforth, R.P.Campion, C.T. Foxon, B.L. Gallagher, Tomáš Jungwirth.](https://reader037.fdocuments.net/reader037/viewer/2022103122/56649d095503460f949daf43/html5/thumbnails/1.jpg)
Karel Výborný, Jan Zemen, Kamil Olejník, Petr Vašek, Miroslav Cukr, Vít Novák, Andrew Rushforth, R.P.Campion, C.T. Foxon, B.L. Gallagher, Tomáš Jungwirth
Fyzikální ústav AV ČR, Cukrovarnická 10, Praha 6, CZ-16253School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, UK
internal structuremagnetotransportanisotropy (AMR)
Conclusion• a recipe how to extract anisotropy params.• classification of anisotropy using these: (normal/cubic/monoclinic symmetry)• microscopic calculation of the anisotropy parameters• in agreement with (different) experiments: normal AMR < 0, • sign switch AMRip vs. AMRop due to growth strain
Acknowledgements:LC510 (Center for fund. res.), NANOSPIN
Conclusion• a recipe how to extract anisotropy params.• classification of anisotropy using these: (normal/cubic/monoclinic symmetry)• microscopic calculation of the anisotropy parameters• in agreement with (different) experiments: normal AMR < 0, • sign switch AMRip vs. AMRop due to growth strain
Acknowledgements:LC510 (Center for fund. res.), NANOSPIN
IntroIn an isotropic material, the sheet resistance does not depend on current direction andtransversal resistance is zero. In a ferromagnet,(for instance diluted magnetic semiconductors)a special direction is given by the magnetization,the symmetry is lowered and both resistancesbecome a function of the current direction. This effect, called magnetotransport anisotropyis further promoted by the particular symmetryof the crystalline environment: e.g. cubic in GaAs.
IntroIn an isotropic material, the sheet resistance does not depend on current direction andtransversal resistance is zero. In a ferromagnet,(for instance diluted magnetic semiconductors)a special direction is given by the magnetization,the symmetry is lowered and both resistancesbecome a function of the current direction. This effect, called magnetotransport anisotropyis further promoted by the particular symmetryof the crystalline environment: e.g. cubic in GaAs.
Experimental
Model calculations
Phenomenology
Modelling the effect of strain
Isotropic• : angle between M and I the only param.• = polycrystalline (random psi, constant phi)• •
2|| cos)( xx
Cubic
• many angles: (M), (I)• •
• two angles: , , while • : magnetization to [100]• : current to [100]
Cubic – inplane configuration
• • for current I along ( ), voltage U along ( ):
Most general AMR (Cubic material): • •
Fourier expansion of U and V• •
Keeping only the lowest terms:
´Magnetocrystalline anisotropy´ Isotropic vs. cubic
Normal AMR: =NORCubic AMR: =CUB
Uniaxial (in the plane)
vs.
•
• (this is if I ||[100])
Uniaxial AMR: = UNI
Six-band model
• GaAs within k.p approximation + SO interaction• Mn moments: mean field, • Kohn-Luttinger Hamiltonian
Linear transport: Boltzmann equation
• equilibrium distribution shifted by •
• • relaxation time: , Fermi golden rule
Transversal AMR ( ) Longitudinal AMR ( )
Transversal AMR ( ) Longitudinal AMR ( )
• NOR = -3.6%• CUB = 0.79%• UNI = 0.25%
• 3.5% Mn, 50 nm film, measured at 4 K and inplane B = 1.3 T
Inferred AMR:
• negative normal AMR (contrary to metals) • uniaxial anisotr. present
• NOR = -6.0%• CUB = 1.5%• UNI not calc.
Microscopic mechanism:• mostly due to the minority hh band• Fermi surf./vel. change only little• relaxation times strongly anisotropic
• 3.5% Mn, bulk, no strain, saturated Mn moments, in-plane geometry
• 2.0% Mn, saturated Mn moments• biaxial strain (substrate – GaMnAs lattice mismatch)
• current along [100]• w/o strain [010] = [001]• strain lifts the degeneracy• tensile/compressive – different sign of AMRip-AMRop
• in agreement with exp. (Matsukura et al., Phys. E ’04)
Relaxation times:
• 5% Mn, 25 nm film, measured at 4 K and inplane B = 1.0 T
• NOR = -3.0%• CUB = 0.36%• UNI = 0.54%
2sin2sin2
12cos2cos
2
1120 vuxx
2sin2cos2
12cos2sin
2
112 vuxy
cossin)( || xy
)(k
321 ,, 321 ,,
xy
xy
xx
xx
321 ,, 321 ,,
jE
ji
jiijIUR,
/
2122
221
22
22
21
21
)]()([
)()(
1
VV
UUxx
])()([
)()(22
22
21
221
122221
21
1
VV
UUxy
121 )( vV
414
2121
21 )( uuuU
4sin2sin4cos2cos1/1
1241
1
12
1
1241
1 u
vu
u
vu
u
vuuxx
21 uv
2112122112
222122
211222
)],(),([
),(),(
ww
wwxx
21 uv
112 /)( uvu 121 /)( uuv
xx214
21212122 ),( uuuw
14 / uu
))(( kvEek
)/)(/1()( ii kEkv
)())(()()2(
23
3
kvE
fkvEek
kdej i
ki
Ii
IiiIpdMF RrsSJH,
)(