ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION...

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September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen, and M. Savonen Accelerator Laboratory, Department of Physics, University of Jyväskylä

Transcript of ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION...

Page 1: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

ION BEAM RESEARCH AND DEVELOPMENT WORKAT JYFL

H. Koivisto, T. Ropponen, V. Toivanen, and M. Savonen

Accelerator Laboratory, Department of Physics,University of Jyväskylä

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September 2008 ECRWS 2008, Chicago, Illinois

Contents

- bremsstrahlung results will be presented by T. Ropponen

- new metal ion beams

- research work to solve a serious beam transmission problem

- measurements to define the bottle-neck concerning the beamtransmission (ECRIS? Beam line? Cyclotron?)

- injection voltage vs. transmission efficiency

- tests with quadrupoles to improve the beam profile

- tests with beam viewers

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September 2008 ECRWS 2008, Chicago, Illinois

FCJ2

FCI5

InflectorOuter radius of cyclotronAfter deflectorAfter cyclotron

Transmission efficiency for different sectionswere defined

Injection line of K-130 cyclotron/ Beam intensitymeasurement points

Page 4: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Total efficiency (FC2 -> PFC)

0%

2%

4%

6%

8%

10%

12%

14%

16%

18%

0 25 50 75 100 125 150 175

FC2 intensity [µA]

0

0,2

0,4

0,6

0,8

1

1,2

1,4

1,6

Dra

incu

rren

t[m

A]

Efficiency

Drain current

Total transmission efficiency

From FCJ2 to the first FC after cyclotron (PFC)

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September 2008 ECRWS 2008, Chicago, Illinois

Same tendency - i.e. decrease of efficiency when the beam intensityincreases - was noticed between FCJ2 and FCI5

Efficiency FC2 -> FC5

0,00

0,20

0,40

0,60

0,80

1,00

1,20

0 20 40 60 80 100 120 140 160

FC2 Intensity [µA]

Other sections:

- efficiency remainedconstant or decreasedslightly (less than 15 %)

efficiency up to 80-90 %

Different sections

FCJ2

FCI5

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September 2008 ECRWS 2008, Chicago, Illinois

FCI5 -> Inflector

0,00

0,20

0,40

0,60

0,80

1,00

1,20

0,0 20,0 40,0 60,0 80,0 100,0 120,0

FCI5 intensity [µA]

Series1

Inflector -> outer radius of cyclotron

0,00

0,20

0,40

0,60

0,80

1,00

1,20

0,0 10,0 20,0 30,0 40,0 50,0 60,0

Inflector intensity [µA]

Series1

efficiency up to 80-90 %efficiency up to 40 %

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September 2008 ECRWS 2008, Chicago, Illinois

Through deflector

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0,20

0,40

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1,00

1,20

0 5 10 15 20

Intensity @ outer radius [µA]

Deflector -> PFC

0,00

0,20

0,40

0,60

0,80

1,00

1,20

0,0 2,0 4,0 6,0 8,0 10,0 12,0

Intensity after defletor [µA]

Series1

efficiency up to 60 %

efficiency up to 95 %

Page 8: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Total efficiency (FC2 -> PFC)

0%

2%

4%

6%

8%

10%

12%

14%

16%

18%

0 25 50 75 100 125 150 175

FC2 intensity [µA]

0

0,2

0,4

0,6

0,8

1

1,2

1,4

1,6

Dra

incu

rren

t[m

A]

Efficiency

Drain current

FCJ2-> FCI5 up to 90 %

FCI5-> infl. up to 90 %

cyclotron up to 40 %

deflector up to 60 %

defl.-> PFC up to 95 %

≈ 18 % OK

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September 2008 ECRWS 2008, Chicago, Illinois

Conclusions concerning the transmission efficiencymeasurements

- the efficiency decreases as a function of intensity onlyin the section between FCJ2 - FC5

- after the afore-mentioned section the emittance of the beamapproximately equals to the acceptance of the cyclotron

Consequently, the transmission problem exists before the cyclotronbut what is wrong?

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September 2008 ECRWS 2008, Chicago, Illinois

Efficiency vs. injection voltage

Effect was stronger than canbe anticipated from Child-Langmuirlaw (40 % vs. 100 %).

This indicates that the beam qualityimproves fast with the injection voltage

Fast degradation of beam quality withintensity due to higher space charge?

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September 2008 ECRWS 2008, Chicago, Illinois

Beam profiles

Beam profile has been studied by KBr-viewers

Two problems were found:

Always With high intensities

With high focusing powerDue to the wrong entrance/exitangle of DJ1

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September 2008 ECRWS 2008, Chicago, Illinois

Test with quadrupoles

quadrupole doublet was installed before DJ1in order to correct the beam profile

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September 2008 ECRWS 2008, Chicago, Illinois

Quadrupole results

Measured: 197 π mm mrad,threshold 90 %

Measured: 155 π mm mrad,threshold 90 %

In simulations original emittance value of 200 π mm mradwas assumed

emittance box

Solenoid

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September 2008 ECRWS 2008, Chicago, Illinois

Tests with K130 cyclotron (with quadrupoles)

According to results with quarupoles a remarkable improvementin transmission efficiency was expected (remarkable decrease in emittance).But....

6,5 %7,2µA110 µA+ ECR tuning

7,0 %4,7 µA66 µAwith quadr.

7,2 %4,1 µA52 µAwithout quadr.

EfficiencyI (PFC)I (FCJ2)

Page 15: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Total efficiency (FC2 -> PFC)

0%

2%

4%

6%

8%

10%

12%

14%

16%

18%

0 25 50 75 100 125 150 175

FC2 intensity [µA]

with quadrupoles

- we succeeded in decreasing the efficiency of low intensity beams!

- however, the intensity dependence is not seen!

The reason for the disappointing result is still unknown

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September 2008 ECRWS 2008, Chicago, Illinois

Future beam transmission R & D

- explanation for the quadrupole result has to be found

- explanation for the hollow beam structure has to be found

ECRIS/beam formation/space charge effect?

- electrostatic focusing (like NSCL/MSU)?

- ECRIS closer to dipole?

- higher injection voltage: requires new central area of cyclotron

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September 2008 ECRWS 2008, Chicago, Illinois

Results with the inductively heated ovenThe latest version of inductively heated oven seems to be reliablein operation

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September 2008 ECRWS 2008, Chicago, Illinois

Titanium (1700˚C) and Chromium (1500˚C) ion beams weresuccessfully produced with the oven

In both cases the intensity level of 20 µA was reachedfor the medium charge states

The consumption rates: Ti (1.8 mg/h), Cr (0.5 mg/h)

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September 2008 ECRWS 2008, Chicago, Illinois

Summary

1) a lot of information about the beam transmission has been gotten

- different options to solve the transmission problem will be considered:

electrostatic focusing, ECRIS closer to dipole, higher injection voltage?

2) studies to understand the hollow beam structure(also beam formation)

3) Bremsstrahlung experiments

4) Metal ion beams

Page 20: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Extra 10 minutes

List of 2nd and 3rd generation ECRIS

Applications

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September 2008 ECRWS 2008, Chicago, Illinois

SECOND GENERATION ECR ION SOURCESLab./country ECRIS PurposeLBNL/USA AECR-U 10 + 14 GHz cyclotron injection for 1) and 2)NSCL/MSU/USA ARTEMIS-A 14 GHz cyclotron injection for 1)

ARTEMIS-B 14 GHz test bench for ECRIS R&DANL/USA ECR2 14 GHz (+TWTA) linac injection for 1)

ECR1, 10 GHz charge breeder for linacTAMU/USA ECR2, 14 GHz 1)

CBECRIS, 14 GHz charge breederRIKEN/Japan RIKEN 18 GHz ECRIS inj. for heavy ion linac and RIBF

Liq. He-free SC-ECRIS, 18 GHz inj. for heavy ion linac and RIBFCNS Tokyo/Japan Liq. He-free SC-ECRIS, 14 GHz AVF cyclotron injectionVienna Univ./Austria 14 GHz ECIRS, all perm. Magn. Experiments with low energy HC ionsIMP/China LAPECR2 (all perm magn) 12-14 GHz multi-purpose, HV platform

LAPECR1 (all perm magn)12-14 GHz 4)LECR3, 14/18 GHz for HIRFL cyclotrons

LECR2M 14/18 GHz material physics, ECRIS R&DNIRS/Japan NIRS-ECR 10 GHz carbon ion therapy

NIRS-HEC, 18 GHz carbon ion therapyKei 8/10 GHz experimental

Kei2 8-11 GHz, all perm magn source developmentGunma Univ/Japan KeGM 10 GHz carbon ion therapyGSI/Germany 14.5 GHz Caprice multi-purpose

14.5 GHz Caprice test bench for ECRIS R&D

Heidelberg/Germ.Supernanogan 14 GH z (2), all

perm.mag carbon ion therapyLNS/INFN/Italy CAESAR 14/18 GHz inj. for K800 cyclotron

SERSE 18/(28) GHz inj. for K800 cyclotronLNL/INFN/Legnaro Supernanogan, 14 GHz, all perm.magn 1)LPSC PHOENIX, 14 GHz charge breeder R&D

1) nuclear physics2) space effects testing3) radiobiological4) material and atomic

physics5) hadron therapy

List of 2nd and 3rd generation ECR ion sources

Page 22: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

AB Dep./CERN GTS-LHC, 14/18 GHz for hadron injector at CERNGANIL/France ECR4, 14 GHz 1), 2), 3), 4)

ECR4M, 14 GHz 1), 2), 3), 4)SUPERSHYPIE, 14 GHz solid state physics

GTS 18 GHz 1)KVI/the Netherl. KVI-AECR 14 GHz cycl. (AGOR) inj. For 1) and 3)JYFL/Finland JYFL-14 GHz ECRIS (+ TWTA) cycl. injection for 1), 2) and 4)ATOMKI/Hungary 14 GHz ECRIS ?Frankfurt/Ger. IKF-ECRIS, 14 GHz 4), ECRIS R&DJINR/Russia DECRIS-2, 14 GHz 1)

ECR4M, 14 GHz 1), applicationsDECRIS-SC, 18 GHz hybrid inj. for CI-100 cyclotron (applied phys.)

DECRIS-4, 14 GHz at test bench, will be used for U400 cycl.Vinca inst./Serbia andMontenegro MVINIS, 14/18 GHz material modificationsBiont/Slovak rep. DECRIS-2M, 14 GHz material modifications (nanotechn)Astana/Kazakhstan DECRIS-3 14 GHz inj. for DC-60 cycl., applied physicsTriumf/Canada Phoenix 14 GHz charge breedingKochi Univ./Japan 10 GHz NANOGAN ion beam lithographyNew Delhi/India PKDELIS, 14/18 GHz, hybrid inj. for linear acceleratorMSL/Sweden 14 GHz Hypernanogan inj. synchrotron (storage ring)KEK-JAERI/Japan ECRCB, 18 GHz charge breeder for KEK-JAERI RNBRCNP/Osaka/Japan 18 GHz SC-ECRIS inj. for cyclotroniThemba/South Afr ECR4, 14 GHz inj. for cyclotron

GTS 14/18 GHz under constructionCancer Cent. Marburg Supernanogan, 14 GHz (2),perm. magn carbon ion therapyTIFR/Mumbai/India Supernanogan, 14 GHz, perm. magn 4)VECC/Calcuta/India Hypernanogan, 14/18 GHz 1), 4)CLRC/Daresbury/UK PHOENIX 14/18 GHz charge breederCNAO/Pavia/Italy Supernanogan , 14 GHz (2),perm. magn carbon ion therapyOxford Instr./UK NANOGAN 10 GHz ion implantationXion/France Supernanogan, 14 GHz, perm. magn ion implantationHMI/Berlin/Germ. Supernanogan, 14 GHz, perm. magn ion implantation, 1)

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September 2008 ECRWS 2008, Chicago, Illinois

THIRD GENERATION ECR ION SOURCES

LBNL/USA VENUS 28 GHz cyclotron injection and ECRIS R&DIMP/China SECRAL 28 GHz HIRFL cyclotron injectionRIKEN/Japan 28 GHz ECRIS inj. for RIBF, under construct.NSCL/MSU/USA SUSI 18/(24) GHz cyclotron injection for 1)GSI/Germany MS-ECRIS 28 GHz under construct., multipurposeLPSC/France A-Phoenix 18/28 GHz, hybrid under commissioning

Page 24: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Total number of ion sources in the list: 70(unknown number of 1st generation sources)

≈ 34nuclear/high energyphysics

≈ 12material science

≈ 7ECRIS R&D

≈ 9hadron therapy

≈ 5implantation/nanotech.

≈ 6charge breeder

≈ 4space effects testing

Main applications

1Finland

5Italy

1Sweden

1Slovak rep.

1SerbiaMontenegro

1Netherland

1Kazakhstan

1Hungary

1Canada

1Austria

2UK

2Switzerland

2South Africa

3India

4Russia

5China

6France

9USA

9Germany

11Japan

Page 25: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

X-ray of Hitachi 256-Mbit SDRAMin 54-pin TSOP (plastic package)

Today, nearly all memories areToday, nearly all memories areassembled with centre bond padsassembled with centre bond padsand a lead frame on top of the dieand a lead frame on top of the die

Si-layer

B0B0

B3B3 B2B2

B1B1

Events in different area

Electronic component testing

Page 26: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

SEE tests

Not enough energy to reachthe sensitive area!

Higher charge state or biggeraccelerator needed!

Higher charge state (Xe35+)

Page 27: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Atmel AT60142F 3.3 V 512K8 SRAM - Heavy Ion SEU Results(JYFL0504), (UCL0506) & (UCL0509).

1.0E-12

1.0E-11

1.0E-10

1.0E-09

1.0E-08

1.0E-07

1.0E-06

0 10 20 30 40 50 60 70 80 90 100 110 120Ion LET - MeV/(mg/cm2)

Cro

ssS

ectio

n-(

cm2 /b

it)

Static S2/1 - Atmel 4M - RADEFStatic S2/2 - Atmel 4M - RADEFStatic S2/4 - Atmel 4M - HIF-Cock-2Static S2/3 - Atmel 4M - HIF-Cock-2Static S2/2 - Atmel 4M - HIF-Cock-1Static S2/3 - Atmel 4M - HIF-Cock-1 120 Krad

Page 28: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Hadron therapy (by carbon ions)

Several carbon therapy facility has ECR ion source(HIMAC, HIT, Marburg, Pavia)

Depth dose profiles for extended target volumesFigure by K. Tinschertfrom GSI

Page 29: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Porous membranesOxyphen

life science, etc...

Page 30: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

Surface treatment

http://www.quertech.com/crbst_29.html

Page 31: ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL...September 2008 ECRWS 2008, Chicago, Illinois ION BEAM RESEARCH AND DEVELOPMENT WORK AT JYFL H. Koivisto, T. Ropponen, V. Toivanen,

September 2008 ECRWS 2008, Chicago, Illinois

THANK YOU!