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Integrating Microscopy Into the Analytical Scheme: A Pittcon® 2014 Microscopy Review Posted: February 24, 2014

The original of this article can be downloaded from:

http://www.americanlaboratory.com/913-Technical-Articles/156565-Integrating-Microscopy-Into-the-

Analytical-Scheme-A-Pittcon-2014-Microscopy-Review/

Barbara Foster

Microscopy is often overlooked at Pittcon®, yet of the 12,000+ scientists who attend,

approximately 30% use microscopy in some form (according to ongoing research from The

Microscopy & Imaging Place, Inc., www.the-mip.com). As clearly demonstrated by the

technologies covered in this article, microscopy has become part of the routine analytical

scheme. It brings eyes to chemistry, allowing researchers and technologists to see particle size,

shape, and distribution; measure spectra on the micro- and nanoscale; and observe processes

and properties like never before.

Particle analysis and electron microscopy will both be hot topics at Pittcon 2014, with a number

of companies having working systems on the show floor. MicroRaman will also be strong, with

interesting new hybrids such as Raman/AFM. And there is something new under the sun in that

good old workhorse, light microscopy: Microscopes that are especially comfortable, new

camera/communication hubs, and new exhibitors in calibration.

Here’s a quick overview of over two dozen microscopy and related imaging technologies that

will be on display on the show floor. Within each technology sector, companies are presented

alphabetically. And don’t miss the special educational opportunities listed at the end of the

article.

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Particle analysis Fluid Imaging Technologies debuts new AutoFocus

Figure 1 – Fluid Imaging Technologies introduces

FlowCAM with AutoFocus.

The FlowCAM® imaging particle analyzer from Fluid

Imaging Technologies (www.fluidimaging.com) is

now available with an AutoFocus feature (Figure 1).

This upgrade makes the system even easier to use, and provides a consistent and repeatable

fine focus with minimal user interaction.

The AutoFocus Assistant provides on-screen, step-by-step instructions to walk you through the

process. Using VisualSpreadsheet® to calculate the ideal focal position, the new AutoFocus

assures consistent, repeatable focus every time.

Booth #1656

HORIBA announces the new ParticleFinder

HORIBA’s (www.horiba.com/us/en) new ParticleFinder software module (Figure 2) automates

particle location and chemical characterization. In combination with HORIBA Raman

microscopes (see Spectroscopy, below), ParticleFinder brings a new level of automation and

ease of use for particle analysts. It is ideally suited for locating and identifying particulate matter

where automated molecular analysis is key,

especially for pharmaceutical materials, trace

forensic evidence, geological rock/mineral

particles, and airborne contaminants trapped on

filters. Booth #2102, 2202

Figure 2 – HORIBA adds ParticleFinder to Raman.

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Malvern features Morphologi G3 and Nanosight particle tracking

The Morphologi G3 automated image analysis system from Malvern (www.malvern.com) is an

advanced particle characterization tool for the measurement of particle size and particle shape

distributions from 0.5 microns to several millimeters. It offers the flexibility of operation and

validation required to support both R&D and automated QC applications. The Morphologi G3-ID

adds Raman spectroscopy, delivering component specific size and shape data required to fully

understand how formulation and manufacturing methods affect downstream processability and

end-product bioavailability.

Also new in the Malvern booth is its recent acquisition: nanoparticle tracking

from NanoSight(www.nanosight.com). NanoSight CEO Jeremy Warren reports, “We have

always seen Malvern as our natural home. The fit of Nanoparticle Tracking Analysis (NTA) into

the Malvern characterization range is crystal clear, plus NTA adds unique nanoparticle counting

and concentration measurement. NanoSight will continue as a brand within Malvern, whilst

taking advantage of the reach and depth of Malvern’s global channels.”

Booth #1648

Microtrac launches new suite, including 3D Image Analyzer

Microtrac (www.microtrac.com) is a pioneer in laser diffraction and DLS (dynamic light

scattering)instrumentation. New additions in the Microtrac booth at Pittcon include the DLS

particle size analyzer with cuvette sample cell, 3D Image Analyzer with online capability, particle

charge titration analyzer, and a full suite of surface area analyzers. These analyzers are ideal

for QC and R&D professionals. Bring your samples for a complimentary sample analysis.

Booth #3213

Phenom-World unveils ParticleMetric software

Phenom-World (www.phenom-world.com) is launching the new ParticleMetric software for fully

automated visualization and analysis of particles and powders. ParticleMetric is based on SEM

(scanning electron microscopy) imaging, allowing the user to identify phenomena such as

broken particles, agglomerates, and foreign particles that can lead to new discoveries and

innovations in powder design, development, and quality control. The fully automated

measurements show different particle features such as particle shape, surface area, circularity,

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circumscribed circle diameter, and convexity can easily be correlated and reported.

Booth #550

Electron microscopy and analysis Carl Zeiss features fully correlated LM, EM, and X-ray microscopies

Experience the ultimate in materials characterization by imaging exactly the same sample area

with X-ray, light, and electron microscopes. This year at Pittcon, Carl

Zeiss (www.microscopy.zeiss.com ) brings together results from the Axio Imager and Axio

Zoom Light Microscopes (LM), the brand new EVO Scanning Electron Microscope (SEM), and

Xradia X-ray microscopes (XRM) for remarkably improved throughput and analyses (Figure 3).

Figure 3 – Carl Zeiss correlates workflow between light, electron, and X-ray microscopy.

Zeiss acquired Xradia X-ray microscopy in 2013, introducing two new nondestructive 3-D

imaging systems for synchrotron-quality lab-based research. Xradia 520 Versa offers submicron

imaging with unique dual-energy-based compositional contrast capability. Xradia 810 Ultra

provides <50 nm spatial resolution up to 10× faster for a wide variety of materials.

Also this year at Pittcon, Zeiss introduces its fourth-generation EVO Series SEM, achieving

superior low voltage (1 kV) resolution (twice that of the previous generation), and setting an

unmatched standard for tungsten and LaB6 source SEMs. SmartSEM7 enables rapid

throughput featuring EasyVP simple-to-use variable pressure electron optics, intelligent

SmartBrowse imaging, automatic aperture alignment, and Drift Corrected Frame Averaging.

Booth #4639

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EDAX launches new Silicon Drift Detectors

EDAX, Inc. (www.edax.com), well-known for its X-ray microanalysis and electron diffraction

instrumentation, introduces a new series of detectors for the transmission electron microscope

into its highly successful Octane Silicon Drift Detector (SDD) family (Figure 4). Based on the

state-of-the-art design of the company’s Octane SEM series, the Octane TEM portfolio offers

three models to meet the needs of all TEM applications. The Octane TEM SDD family is paired

with EDAX’s TEAM™ EDS software, allowing users to optimize their analysis time and get the

best data possible from their samples.

Booth #3931, 4031

Figure 4 – Comparison of a 30-mm2 Si(Li) detector to EDAX’s new Octane T Ultra W SDD (100

mm2).

FEI suite of solutions includes SEM, TEM, dual beam, and VSG software

Figure 5 – SEM image of a solar cell. Image courtesy

of FEI.

FEI (www.fei.com) delivers solutions for

characterization of a broad range of materials

including powders, polymers, particles, ceramics,

catalysts, solar, and fuel cell materials (Figure

5). FEI’s environmental microscope solutions provide in situ, dynamic observation of material

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performance under environmental influences or near-real operating conditions to yield critical

information about performance and lifetimes of functional materials. FEI’s SEM, TEM

(transmission electron microscope), and DualBeam FIB/SEM instruments excel in producing the

highest-quality images and analytical results from beam-sensitive or soft materials, as well as

for metals and alloys.

VSG, acquired last year by FEI, will also exhibit. VSG Avizo software processes and segments

multimodality data from tomography, microscopy, MRI, etc. In addition to advanced

measurement and quantification and porous and multiphase media analysis, Avizo offers 3-D

model reconstruction and 3-D image-based meshing for CFD (computational fluid dynamics)

and FEA (finite element analysis). For researchers and engineers involved in computation

chemistry, there are also functions for materials properties simulation direct from 3-D images

and simulation pre- and post-processing tools.

Booth #3709

JEOL USA announces the iT300LV SEM

JEOL (www.jeol.com) announces the iT300LV SEM, featuring a sleek tablet interface design

and intuitive operation for imaging a wide range of samples. The microscope’s smart analytical

port geometry accommodates 10 or more attachments, including dual EDS (energy-dispersive

X-ray spectrometer) systems at a working distance of 10 mm for high-throughput microanalysis.

The unique in-chamber five-axis motorized stage ensures fast asynchronous movement and

accurate sample positioning even for large, nonuniform samples. The iT300LV SEM features

accelerating voltages from 300 to 30 kV, pressures from 10 to 650 Pa, and a magnification

range from 5 to 300,000×.

Booth #3241

TESCAN presents VEGA LMU

Figure 6 – SEM image of crossed lines, toner

print over signature. Image courtesy of TESCAN

USA.

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TESCAN USA (www.tescan.com) will present the VEGA LMU, which is applicable to a wide

range of SEM applications and needs in today’s research and industry (Figure 6). The VEGA

offers a unique four-lens Wide Field Optics™ design offering a variety of working and displaying

modes. The proprietary Intermediate Lens (IML) functions as an “aperture changer” to adjust the

effective final aperture electromagnetically. Unique live stereoscopic imaging using advanced

3D Beam Technology opens up the micro and nanoworld for an amazing 3-D experience and 3-

D navigation. The VEGA offers several optional modules or dedicated applications optimized for

automatic sample examination procedures, such as morphology and particle analysis and 3-D

surface reconstruction, etc.

Booth #563

Light microscopy KEYENCE showcases imaging and metrology for industrial applications

Figure 7 – Digital image of needle. Image courtesy

of KEYENCE.

KEYENCE (www.keyence.com), widely known for its

digital microscopes, will be showcasing its latest

imaging and metrology equipment for industrial

applications. These systems provide users with the ability to perform 360º inspection on objects

with magnifications from 0.1× to 5000×, allowing for calibrated surface measurements from

nanometers to millimeters (Figure 7). Unlike most systems that can be complicated to operate,

KEYENCE microscopes are extremely easy to use so that anyone can capture high-quality 2-

D/3-D images. Booth #2318

Olympus IMS takes measuring and opto-digital imaging to the next level

Figure 8 – 3D Measuring & Opto-digital

Technology from Olympus: LEXT confocal and

DSX Opto-digital microscope.

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By combining the observation strength of light microscopy with the convenience of advanced

digital technology, Olympus (www.olympus-ims.com) is delivering a new level of operator

simplicity with no sacrifice in image quality, speed, or accuracy. Designed for quality assurance

and control labs, the Olympus DSX Series of opto-digital microscopes captures clear images,

acquires reliable measurements, and delivers reproducible results, all with the tap of a

touchscreen (Figure 8). The Olympus LEXT OLS4100 opto-digital laser confocal

microscope system meets the demand for increased measurement precision through

nanometer-level imaging, accurate 3-D measurement, and outstanding surface roughness

analysis.

Booth #4539

Vision Engineering’s new Ergo80 stereo provides comfort and quality imaging

If you are looking for comfort in microscopy viewing, visit Vision

Engineering (www.visioneng.com). Its Ergo80 stereomicroscope employs a revolutionary

patented eyepiece design that does not require users to precisely align their eyes with the

eyepieces. In fact, the user can sit back from the microscope (up to 1.5”) and still view the

image, meaning that uncomfortable and difficult-to-use eyepieces are a thing of the past. It is

worth a visit to this booth just to feel the difference between conventional oculars and these

ultrahigh-point systems.

The high-quality designed CMO stereomicroscope offers 8× to 64× standard magnification

range (128× max.), with patented ergonomic eyepieces to reduce fatigue, and an ergonomic

working position that offers freedom of head movement. The light source provides long life

(2000 hr.) and true color illumination. A modular system readily connects optional extras to

configure more detailed setups.

Booth #4759

Atomic force microscopy Bruker sets new standards with PeakForce Tapping® AFM

Proprietary PeakForce Tapping from Bruker (www.bruker.com) opens the door to research

possibilities that were once considered beyond the reach of atomic force microscopy (AFM)

(Figure 9). PeakForce Tapping has set a new standard and is now the principal AFM mode for

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research, with the fastest growing publication record. Operating at the lowest forces, it uniquely

provides a combination of the best quantitative and highest-resolution AFM data available for

mechanical, electrical, and topographic-related applications.

Booth #4135

Figure 9 – Results from Bruker’s new PeakForce Tapping. Left: Single-point atomic resolution.

Center: low imaging forces. Right: real-time quantitative modulus mapping.

Spectroscopy BaySpec features high-resolution, multilaser micro-Raman

BaySpec (www.bayspec.com) will feature its high-resolution multilaser Raman microscope,

Nomadic™. Continuously evolving from last year, the Nomadic multiexcitation confocal Raman

microscope now includes a high-resolution (2 cm–1), AFM-ready, large frame for wafers and

retrofitting options. The new system has inherited all the power of its predecessor, including

multiple laser excitations from UV to NIR with pushbutton switching, fully automated operation,

and unmatched sensitivity and speed implemented using BaySpec’s highly efficient proprietary

VPG® technology. The 2014 Nomadic is the ultimate Raman microscope for the most

challenging analysis in your laboratory.

Booth #2119

B&WTek presents handheld system

B&WTek (www.bwtek.com) is known for handheld Raman and now has intriguing accessories

to convert simple microscopes to Raman. New on the handheld side: NanoRam FP, with a

flexible fiber optic probe that is perfect for hard-to-reach places as well as disposable sleeves

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for the B&WTek immersion shaft accessory (available with both of its NanoRam products) to

reduce cross-contamination between measurements.

Booth #4214

HORIBA expands Raman and AFM/Raman

HORIBA’s XploRA-nano is a powerful instrument that combines Raman spectroscopy

and scanning probe microscopy (SPM) into a single integrated platform to analyze the same

sample with both techniques simultaneously (Figure 10). Raman, being a light-based technique,

is limited in spatial resolution by diffraction, but with the latest advance in tip-enhanced Raman

and probes solution from HORIBA, nano-Raman down to ~10-nm resolution is now within the

reach of most scientists. It is the new standard when it comes to label-free chemical imaging at

the nanoscale.

Figure 10 – Two new

microRaman systems

from HORIBA: a) XploRA-nano,

and b) XploRA PLUS.

The XploRA PLUS

from HORIBA Scientific incorpo

rates unique and powerful

functions in a high-performance system. Fully confocal, it does not compromise image quality,

spatial, or depth resolution. SWIFT™ Fast Raman imaging offers the best, most detailed Raman

images, typically 10× faster than the competition! Enhanced range of options such as multiple

laser wavelengths, EMCCD (electron multiplying charge coupled device) detection, Raman

polarization, and AFM coupling means that, for multisample and multiuser environments in

research and analytical labs, XploRA Plus is the uncompromising choice.

LabSpec 6, a complete Raman software application, guides researchers through system setup,

Raman spectrum data/map acquisition, measurement and data processing, and report

generation.

Booth #2122, 2202

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JASCO releases new laser Raman spectrometer

Building upon the high-performance capabilities of the NRS-5000/7000 series Raman

instruments, JASCO(www.jascoinc.com) has released the new compact and easy-to-use NRS-

4100 Series Laser Raman Spectrometer. The NRS-4100 has many of the great features and

performance of its larger siblings, with a whole host of new technological innovations.

Measuring just 24 cubic inches, this system is truly compact and lightweight. Up to three

excitation lasers can be selected with a range of wavelengths from the visible to the NIR. The

NRS-4100 incorporates a 200-mm spectrograph with the ability to include up to four gratings on

a selectable turret to provide resolution down to 0.7 cm–1/pixel.

Automatic optical-path alignment is included as standard and can be executed from a single

mouse-click in the Spectra Manager II software. Find out more at www.jascoinc.com/nrs-4100.

Booth #3639

Renishaw highlights inVia research Raman microscope

Renishaw (www.renishaw.com/invia) will feature the inVia research Raman microscope. Fully

configurable, this flexible research stand includes excitations from UV through NIR, 2-D/3-D fast

imaging, and near-excitation analysis, with accessories and microscope configurations to suit all

application areas from nanomaterials to biology. inVia provides a nondestructive means of

obtaining chemical/molecular information, with sub micrometer spatial resolution. Combine inVia

with other techniques to perform co-localized sample analysis, including SPM/AFM/TERS (tip-

enhanced Raman spectroscopy), SEM, and CLSM (confocal laser scanning microscopy).

Booth #1816

Thermo Scientific launches DXRxi Raman Imaging Microscope

Materials scientists, engineers, and academic researchers can now accelerate their research

and increase their productivity using the Thermo Scientific DXRxi from Thermo Fisher

Scientific(www.thermoscientific.com), a powerful new Raman imaging microscope that doesn’t

require Raman expertise to master. The instrument, which rapidly delivers research-grade

imagery of a material’s molecular structure and chemical composition, has applications in many

industries, including pharmaceutical formulation, semiconductor manufacturing, life sciences,

and geology.

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With instant visual feedback and intuitive image-driven controls, the Thermo Scientific DXRxi

Raman imaging microscope offers unrivaled simplicity and approachability that enables

scientists of all abilities and disciplines to access the benefits of Raman imaging without a

learning curve. Users will advance research faster, publish more, and solve problems more

confidently than previously possible with Raman imaging.

Accessories 89 North highlights first direct-mount metal halide light source

The PhotoFluor 75 from 89 North (www.89North.com) is the first metal-halide light source that

mounts directly on your microscope—no more liquid light guides. With its small, space-saving

footprint, silent operation, and efficient DC ballast, the powerful LM-75 provides unmatched

stability. 89 North provides intelligent solutions for your microscopy illumination needs. The

company also distributes state-of-the-art, low-maintenance imaging products from Cairn

Research (www.cairn-research.co.uk), including easy-to-use modular image-splitters, filter

wheels, and a multiline laser launch system.

Booth #2152

APPLIED IMAGE brings new calibration to light microscopy

Figure 11 – Today’s more complex

measurement needs require more

sophisticated NIST and ISO certified

standards, such as those from APPLIED

IMAGE.

Calibration in the 21st century is no longer a

simple subjective determination. In the past,

all that was required was a linear scale and a reticle, but this approach is no longer adequate for

today’s complex electronic imaging systems. Today’s systems require NIST- or ISO-certified

standards for additional calibration of the limiting resolution, contrast capabilities and colors for

most instruments. APPLIED IMAGE(www.aig-imaging.com) provides a wide range of standards

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to meet these needs (Figure 11). In addition, APPLIED can design and manufacture a custom

calibration standard to your specific requirements. Booth #2565

Motic advances digital wireless platform

Figure 12 – Motic’s digital wireless platform for industrial,

educational, and clinical labs.

With the advancement of the digital age in our personal

lives, Motic (www.motic.com) introduces a new Moticam

X camera series that frees the viewer from traditional

wired connections (Figure 12). Using standard “free”

downloadable viewers for any Android or iOS platform,

real-time images can be shared from any microscope

simultaneously for educational to consultative dialogues

to up to six viewers—more if a MoticHUB is used.

Moticam X is the standard Moticam that can be connected to any microscope. It comes with

Motic Images Plus 2.0 for running on a Laptop with WiFi. Users can also download and use iOS

and Android Apps FOC to view streaming images, capture, and measure.

MoticHUB is a software-based application that can connect any Moticam or digital microscope

running Motic software to iOS and Android tablets through WiFi.

Booth #4364

USHIO announces new fiber-optic LED light sources

The Midori™ ULB 35i fiber-optic LED light source from USHIO America (www.ushio.com) is a

compact and lightweight fiber-optic illuminator, with high output efficacy, ideal for microscopy or

other fiber-optic applications where space is at a premium. This mercury-free, long-life ULB35i

LED light source has instant-on and electronic intensity dimming capabilities. Midori’s spectral

output below 430 nm and above 700 nm is minimal.

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The Midori unit is equipped with an ACMI fiber receptacle, and separate Storz or Olympus style

adaptors to accommodate most common fiber cable types.

Booth#1854

Educational opportunities Anasys Pittcon nanoIR scientific talks on biofuels, composites, fuel cells

Expanding Applications for AFM-Based Infrared Nanospectroscopy

Sunday, March 2, 1:30 PM (100-1), Session 100, Room S404d

Speaker: Craig Prater, Anasys Instruments

Characterization of Materials Using AFM-Based Nanomechanical, Nanothermal, and

Nanoscale Infrared Spectroscopy and Imaging

Sunday, March 2, 2:30 PM (100-4), Session 100, Room S404d

Speaker: Curtis Marcott, Light Solutions

Nanoscale Dynamic Mechanical Spectroscopy of Polymer Blends and Composites

Sunday, March 2, 1:30 PM (230-1), Session 230, Room S504bc

Speaker: Eoghan Dillon, Anasys Instruments

Nanoscale Infrared Spectroscopy of Fiber Composite Materials

Wednesday, March 5, 9:10 AM (1630-3), Session 1630, Room S504d

Speaker: Michael Lo, Anasys Instruments

For more information, visit http://www.anasysinstruments.com/pittcon_2014.

B&WTek

SAS Women in Spectroscopy Session

Thursday, March 6, 8:30 AM, Room S405b

Katherine Bakeev from B&WTek will be one of numerous speakers for the Women in

Spectroscopy Session. Career options, academic experiences, and much more will be

discussed in this half-day symposium. Admittance is free of charge, but be sure to get to Room

S405b early if you want a seat, as this session is expected to fill up fast!

For more information, visit https://www.s-a-s.org/for-members/women-in-spectroscopy.

Hitachi will present daily Learning Labs

Thermal Analysis w/Real View Technology Monday, March 3 SEM Fundamentals

Tuesday, March 4

X-Ray Fluorescence and Forensics

Wednesday, March 5

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For registration and details, visit Booth #3624.

Horiba

Japan Symposium: “The State-of-the-Art Technologies that support Safety and Security in

Future”

Tuesday, March 4, two sessions: 8:30–11:30 AM and 1:30–4:30 PM, Room S505b

HORIBA Scientific’s Sergey Mamedov will be speaking at 2:45 on “Microspectroscopy for Trace

Analysis in Forensic Science.”

For more information, visit http://www.horiba.com.

Malvern Short Courses Sampling for Particle Size Analysis Saturday, March 1, 8:30 AM Instructor: Dr. Alan Rawle

Learn the basics and importance of sampling for particle size analysis. Find out how to better

determine the minimum mass needed for any required precision and how to calculate the best

fundamental sampling error.

For registration and details, visit:

http://ca.pittcon.org/Technical+Program/tpabstra14.nsf/SCoursesByCat/561FC4A974FC0CF88

5257B83006927E3?opendocument.

Particle Characterization of Nanomaterials

Wednesday, March 5, 8:30 AM

Instructor: Dr. Ana Morfesis

Understand particle size, molecular weight, and formulation stability as it relates to your

application using DLS and ELS techniques. Different application and data interpretation

examples will be presented.

For registration and details, visit:

http://ca.pittcon.org/Technical+Program/tpabstra14.nsf/SCoursesByCat/6218A094F7B30C6E85

257B87000FEC20?opendocument.

Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques

Thursday, March 6, 8:30 AM

Instructors: Drs. Alan Rawle and Ulf Nobbmann

In this full-day course, learn all the basics about particle sizing—technology, terminology,

international standards, and math. Discover the main measurement techniques, with an

emphasis on dynamic light scattering and laser diffraction techniques.

For registration and details, visit:

http://ca.pittcon.org/Technical+Program/tpabstra14.nsf/SCoursesByCat/2EBFDBA6116F2A308

5257B8300685593?opendocument.

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TESCAN USA and EDAX present Lunch & Learn

EBSD in the SEM

Monday, March 3, 12:00 PM

Instructor: EDAX Applications Staff

Electron backscatter diffraction (EBSD) in the SEM is a useful tool for analyzing materials with

crystalline structures. It allows users to analyze orientation, grain morphology, material

deformation, and distinct crystal phases. The amount of information that can be extracted is

always increasing as research in this field advances. This Lunch & Learn session will present

the fundamental principles of EBSD, several basic applications, and the future of the

technology.

To reserve a seat, contact Colleen Leary at cleary@tescan-usa.com.

TESCAN USA presents Lunch & Learn

Advantages of Variable Pressure in the Electron Microscope

Tuesday, March 4, 12:00 PM

Instructor: Dr. Lisa Chan, Applications Specialist

With some materials, if electrons accumulate on a nonconductive surface, the charge buildup

causes a divergence of the electron beam and degrades the SEM image. In the variable-

pressure SEM, some air is allowed into the sample chamber, and the interaction between the

electron beam and the air molecules creates a cloud of positive ions around the electron beam.

These ions will neutralize the negative charge from electrons collecting on the surface of a

nonconductive material, whereby an analysis of the sample can be performed. This workshop

will show that SEM imaging and EDS chemical analysis can be performed on nonconductive

samples, uncoated, when the chamber pressure is maintained at a certain level.

To reserve a seat, contact Colleen Leary at cleary@tescan-usa.com.

Barbara Foster is President & Chief Strategic Consultant, The Microscopy & Imaging Place,

Inc., 7101 Royal Glen Trail, Ste. A, McKinney, TX 75070, U.S.A.; tel. 972-924-5310; fax: 509-

479-2021; e-mail: bfoster@the-mip.com.