INFOVION’S MAIN PRODUCTS · INFOVION’S MAIN PRODUCTS CONTENTS Cluster Sputter System Multi...

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INFOVION’S MAIN PRODUCTS CONTENTS Cluster Sputter System Multi Cathode Sputter System Combinatorial IBSD System Combinatorial Sputter System IBSD System Roll Coating Sputter System RTA System MOCVD System Ion Source Ion Energy Analyzer Effusion Cell Neutral Beam Etcher

Transcript of INFOVION’S MAIN PRODUCTS · INFOVION’S MAIN PRODUCTS CONTENTS Cluster Sputter System Multi...

  • INFOVIONS

    MAIN PRODUCTS

    CONTENTS

    Cluster Sputter System

    Multi Cathode Sputter System

    Combinatorial IBSD System

    Combinatorial Sputter System

    IBSD System

    Roll Coating Sputter System

    RTA System

    MOCVD System

    Ion Source

    Ion Energy Analyzer

    Effusion Cell

    Neutral Beam Etcher

  • Cluster Sputter System

    INFOVIONs Cluster Sputter System Provides The Best Available Valuefor Wide Ranging Research and Production Applications

  • Cluster Sputter System

    Operation Module : Process and Transfer Modules Operation Module : Process and Transfer Modules Operation Module : Process and Transfer Modules Operation Module : Process and Transfer Modules Sputter Source : 6 Magnetron Sputter SourcesSputter Source : 6 Magnetron Sputter SourcesSputter Source : 6 Magnetron Sputter SourcesSputter Source : 6 Magnetron Sputter Sources Power : RF & DC Power SelectablePower : RF & DC Power SelectablePower : RF & DC Power SelectablePower : RF & DC Power Selectable Gas Control : Ar, O2 , N2Gas Control : Ar, O2 , N2Gas Control : Ar, O2 , N2Gas Control : Ar, O2 , N2 Heating Module : Up to 600Heating Module : Up to 600Heating Module : Up to 600Heating Module : Up to 600CCCC Fully Automated Operating SystemFully Automated Operating SystemFully Automated Operating SystemFully Automated Operating System

  • Cluster Sputter Software Program-1

    Program Features

    Display of Cluster sputter system & process condition

    Fully Automated Control System

    Safety Interlock System for Instrument & users

    User authorization Sign up Mode

  • Cluster Sputter Software Program-2

    Display of PM#1,2,3 image & full conditionDisplay of PM#1,2,3 image & full conditionDisplay of PM#1,2,3 image & full conditionDisplay of PM#1,2,3 image & full condition Manual Control ModeManual Control ModeManual Control ModeManual Control Mode Display of Pump, Valve Condition & Display of Pump, Valve Condition & Display of Pump, Valve Condition & Display of Pump, Valve Condition &

    Deposition Time Deposition Time Deposition Time Deposition Time

  • Simultaneous Sputter Deposition in separate 4-Chamber

    Possible to Change RF & DC Power easily by using RF/DC

    Change-over switch

    Up to Thirteen RF/DC Magnetron Sputter Sources

    Excellent Film Uniformity on a 6 wafer

    Fully Automated Operating System

    Special Options are available for our customers

    Key Features

    Cluster Sputter System

    Specifications

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Deposition ModeDeposition ModeDeposition ModeDeposition Mode Co-Sputter Deposition Mode

    Sputter SourceSputter SourceSputter SourceSputter Source Thirteen 6" Magnetron Sputter Source (UHV & HV Type)

    Wafer UniformityWafer UniformityWafer UniformityWafer Uniformity 5% on 6" diameter wafer

    Power SuppliesPower SuppliesPower SuppliesPower Supplies Seven 1000W RF Power Supply & Five 2000W DC Power Supply

    Substrate Heating CapacitySubstrate Heating CapacitySubstrate Heating CapacitySubstrate Heating Capacity Up to 600 (Uniformity 5)

    Substrate Z-MotionSubstrate Z-MotionSubstrate Z-MotionSubstrate Z-Motion 0~100mm

    Substrate RPMSubstrate RPMSubstrate RPMSubstrate RPM Up to 100RPM

    Cassette Chamber CapacityCassette Chamber CapacityCassette Chamber CapacityCassette Chamber Capacity Up to sixteen wafers

    Gas ControlGas ControlGas ControlGas Control Ar, O2, N2

    Ultimate pressureUltimate pressureUltimate pressureUltimate pressure PM1,2,3 1 x 10-7 Torr

    PM4 5 x 10-8

    Torr

    Operating SystemOperating SystemOperating SystemOperating System HMI Software / PLC Based Process Control

    Fully Automated System

    Safety Interlock System

  • Multi Cathode Sputter System

    Semiconductor Devices

    Conductive Metal / Resistive Metal / Insulating Films

    Transparent Electrical Conductors (ITO)

    Lens Coatings (Reflective / Anti-reflective / Hard / Color)

    Thin Film Sensors

    Magnetic Storage Media and Heads (HD, GMR, TMR)

    Photovoltaic Thin Films (Solar Cells)

    Applications

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Deposition ModeDeposition ModeDeposition ModeDeposition Mode Co-Sputter Deposition Mode

    Sputter SourceSputter SourceSputter SourceSputter Source Three 6" Magnetron Sputter Source (HV Type)

    Wafer UniformityWafer UniformityWafer UniformityWafer Uniformity 5% on 6" diameter wafer

    Power SuppliesPower SuppliesPower SuppliesPower Supplies Three 1000W RF Power Supply

    Substrate Heating CapacitySubstrate Heating CapacitySubstrate Heating CapacitySubstrate Heating Capacity Up to 500 (Uniformity 5)

    Substrate Z-MotionSubstrate Z-MotionSubstrate Z-MotionSubstrate Z-Motion 0~100mm

    Substrate RPMSubstrate RPMSubstrate RPMSubstrate RPM Up to 100RPM

    Load Lock Chamber Load Lock Chamber Load Lock Chamber Load Lock Chamber Fully Automated Wafer Transfer System

    Gas ControlGas ControlGas ControlGas Control Ar, O2, N2

    Ultimate pressureUltimate pressureUltimate pressureUltimate pressure 1 x 10-6 Torr

    Operating SystemOperating SystemOperating SystemOperating System HMI Software / PLC Based Process Control

    Fully Automated System

    Safety Interlock System

    Specifications

  • Combinatorial IBD System-1

    Combinatorial Synthesis Method

    Sequential Ion Beam Sputter System

    Co-sputtering Ion Beam Deposition System

    Moving Mask System & Substrate Rotation

    Excellent Film Uniformity on a 6 wafer

    Key Features

    Discovery of New Ternary & Binary Material

    Using Combinatorial Synthesis

    High-throughput Characterization

    Excellent Film Uniformity on a 6 wafer

  • Combinatorial IBD System-2

    Deposition Mode : Step, Wafer layer & CoDeposition Mode : Step, Wafer layer & CoDeposition Mode : Step, Wafer layer & CoDeposition Mode : Step, Wafer layer & Co----Sputtering ModesSputtering ModesSputtering ModesSputtering Modes Operation Module : Process and Transfer Modules Operation Module : Process and Transfer Modules Operation Module : Process and Transfer Modules Operation Module : Process and Transfer Modules Sputter Source : RF Ion Source with 6cm beam gridSputter Source : RF Ion Source with 6cm beam gridSputter Source : RF Ion Source with 6cm beam gridSputter Source : RF Ion Source with 6cm beam grid RF Generator : 1000WRF Generator : 1000WRF Generator : 1000WRF Generator : 1000W Beam Energy : 100~1500 eVBeam Energy : 100~1500 eVBeam Energy : 100~1500 eVBeam Energy : 100~1500 eV Gas Control : Ar, O2 , N2Gas Control : Ar, O2 , N2Gas Control : Ar, O2 , N2Gas Control : Ar, O2 , N2 Heating Module : Up to 600Heating Module : Up to 600Heating Module : Up to 600Heating Module : Up to 600CCCC User friendly LoadUser friendly LoadUser friendly LoadUser friendly Load----Lock SystemLock SystemLock SystemLock System Fully Automated Operating SystemFully Automated Operating SystemFully Automated Operating SystemFully Automated Operating System

  • Combinatorial IBD System-3

    A

    B

    100

    50

    0

    100500C100

    50

    0

    Ternary Materials Phase DiagramTernary Materials Phase DiagramTernary Materials Phase DiagramTernary Materials Phase Diagram

    Combinatorial IBSD Process Features

    To prepare Binary & Ternary phase alloying at a high temp. at one time

    Rapid Investigation to find ideal composition of numerous compounds

    Excellent film uniformity on the 6 wafer ( > 98% )

    Possible to Change deposition modes

    (Combinatorial & Co-sputtering)

    Atomically controlled layer-by-layer thin films

    Ternary Materials Phase DiagramTernary Materials Phase DiagramTernary Materials Phase DiagramTernary Materials Phase Diagram

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Deposition ModeDeposition ModeDeposition ModeDeposition Mode Step, Wafer layer and Co-sputtering Modes

    Sputter SourceSputter SourceSputter SourceSputter Source RF Ion Beam Sputter Source

    Wafer UniformityWafer UniformityWafer UniformityWafer Uniformity 2% on 6" diameter wafer

    RF Power SuppliesRF Power SuppliesRF Power SuppliesRF Power Supplies 1000W RF Power Supply

    Ion Beam Sputter DC PowerIon Beam Sputter DC PowerIon Beam Sputter DC PowerIon Beam Sputter DC Power Beam Voltage: 1500V/1000mA, Accel Voltage: 1500V/300mA

    Substrate Heating CapacitySubstrate Heating CapacitySubstrate Heating CapacitySubstrate Heating Capacity Up to 600 (Uniformity 5)

    Substrate Z-MotionSubstrate Z-MotionSubstrate Z-MotionSubstrate Z-Motion 0~100mm

    Substrate RPMSubstrate RPMSubstrate RPMSubstrate RPM Up to 100RPM

    Load Lock Chamber Load Lock Chamber Load Lock Chamber Load Lock Chamber Fully Automated Wafer Transfer System

    Gas ControlGas ControlGas ControlGas Control Ar, O2, N2

    Ultimate pressureUltimate pressureUltimate pressureUltimate pressure 1 x 10-6

    Torr

    Operating SystemOperating SystemOperating SystemOperating System HMI Software / PLC Based Process Control

    Fully Automated System

    Safety Interlock System

    Specifications

  • Combinatorial Sputter System

    Specifications

    Key Features

    Discovery of New Ternary & Binary Material

    Using Combinatorial Synthesis

    High-throughput Characterization

    Specifications

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Deposition ModeDeposition ModeDeposition ModeDeposition Mode Step and Wafer layer Modes

    Sputter SourceSputter SourceSputter SourceSputter Source 3"-6" Magnetron Sputter Sources

    Wafer UniformityWafer UniformityWafer UniformityWafer Uniformity 5% on 6" diameter wafer

    RF Power SuppliesRF Power SuppliesRF Power SuppliesRF Power Supplies 1000W RF Power Supply

    Substrate Heating CapacitySubstrate Heating CapacitySubstrate Heating CapacitySubstrate Heating Capacity Up to 600 (Uniformity 5)

    Substrate Z-MotionSubstrate Z-MotionSubstrate Z-MotionSubstrate Z-Motion 0~100mm

    Substrate RPMSubstrate RPMSubstrate RPMSubstrate RPM Up to 100RPM

    Load Lock Chamber Load Lock Chamber Load Lock Chamber Load Lock Chamber Fully Automated Wafer Transfer System

    Gas ControlGas ControlGas ControlGas Control Ar, O2, N2

    Ultimate pressureUltimate pressureUltimate pressureUltimate pressure 1 x 10-6 Torr

    Operating SystemOperating SystemOperating SystemOperating System HMI Software / PLC Based Process Control

    Fully Automated System

    Safety Interlock System

  • Ion Beam Sputter Deposition System

    Optimal Ion Beam Sputter Deposition

    Motorized Three Target Changing System

    Dynamic Sequential Layer by Layer Deposition Method

    Substrate Rotation, Z-Motion & Heating

    Enhanced HMI Software

    Excellent film uniformity on a 6 wafer

    Corresponding to 300mm Wafer

    Fully Automated Operating System

    Various User Defined Options

    System Features

  • Ion Beam Deposition Advantages

    Pinhole-free films with enhanced adhesion due to higher ion energy

    Reduction of film stress and film densification are greatly enhanced

    by using ion assist gun

    Higher film purity thanks to Low operation pressure (low 10-4 Torr)

    Independent control of ion energy and flux that provides control of

    film microstructure, stoichiometry and stress

    Stable deposition rates and Excellent film uniformity

    Specifications

    Ion Beam Sputter Deposition System

    Specifications

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Deposition ModeDeposition ModeDeposition ModeDeposition Mode Sequential Layer by Layer Deposition Mode

    Sputter SourceSputter SourceSputter SourceSputter Source RF Ion Beam Sputter Source

    Assist SourceAssist SourceAssist SourceAssist Source RF Ion Beam Assist Source

    Wafer UniformityWafer UniformityWafer UniformityWafer Uniformity 2% on 6" diameter wafer

    RF Power SuppliesRF Power SuppliesRF Power SuppliesRF Power Supplies 1000W RF Power Supply

    Ion Beam Sputter DC PowerIon Beam Sputter DC PowerIon Beam Sputter DC PowerIon Beam Sputter DC Power Beam Voltage: 1500V/1000mA, Accel Voltage: 1500V/300mA

    Ion Beam Assist DC PowerIon Beam Assist DC PowerIon Beam Assist DC PowerIon Beam Assist DC Power Beam Voltage: 1000V/1000mA, Accel Voltage: 1000V/1000mA

    Substrate Heating CapacitySubstrate Heating CapacitySubstrate Heating CapacitySubstrate Heating Capacity Up to 600 (Uniformity 2)

    Substrate Z-MotionSubstrate Z-MotionSubstrate Z-MotionSubstrate Z-Motion 0~100mm

    Substrate RPMSubstrate RPMSubstrate RPMSubstrate RPM Up to 100RPM

    Load Lock Chamber Load Lock Chamber Load Lock Chamber Load Lock Chamber Fully Automated Wafer Transfer System

    Gas ControlGas ControlGas ControlGas Control Ar, O2, N2

    Ultimate pressureUltimate pressureUltimate pressureUltimate pressure 1 x 10-6 Torr

    Operating SystemOperating SystemOperating SystemOperating System HMI Software / PLC Based Process Control

    Fully Automated System

    Safety Interlock System

  • Advantages

    Atomic layer growth due to high surface mobility

    Atomically smooth surface due to high surface mobility

    Excellent film uniformity

    Higher film purity thanks to Low operation pressure (low 10-4 Torr)

    Acquire kinetic energy and

    ZnO target

    Ar+

    Ion Beam Sputter Deposition System

    Ion Beam

    Gun

    energy and still maintain directionality and kinetic energy

    a-ZnO

    Atomic Layer Growth !!!Atomic Layer Growth !!!

    Plastic

    Roughness analysis for Cu thin film(20nm thick on SiO2, Room Temp.)

    Rms RoughRms RoughRms RoughRms Rough Ave RoughAve RoughAve RoughAve Rough

    69.2 55.2

    Rms RoughRms RoughRms RoughRms Rough Ave RoughAve RoughAve RoughAve Rough

    9.21 7.26

    By Ion Beam Sputter By Sputter

  • Roll Coating Sputter System-1

    System Features

    Well proven rectangular magnetron sputter source

    Tension self stabilizing system

    Automated Door Access System

    High heating capacity to deposit the desired atoms

    Excellent film uniformity

    Fully Automated Operating System

    Various User Defined Options

    Web winding moduleWeb winding moduleWeb winding moduleWeb winding module---- up to 200 mm wideup to 200 mm wideup to 200 mm wideup to 200 mm wide

  • Sputter Source & Heater Power On Sputter Source & Heater Power On Rectangular Magnetron Sputter SourcesRectangular Magnetron Sputter Sources

    Roll Coating Sputter System-2

    Sputter Source & Heater Power On Sputter Source & Heater Power On Rectangular Magnetron Sputter SourcesRectangular Magnetron Sputter Sources

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    System TypeSystem TypeSystem TypeSystem Type Roll film Deposition System

    Sputter SourceSputter SourceSputter SourceSputter Source Three Rectangular Magnetron Sputter Sources

    Sample TypeSample TypeSample TypeSample Type Ni-W Metal roll film

    RF Power SuppliesRF Power SuppliesRF Power SuppliesRF Power Supplies 1000W

    Substrate Heating CapacitySubstrate Heating CapacitySubstrate Heating CapacitySubstrate Heating Capacity 25 ~ 700 (Uniformity 5)

    Gas ControlGas ControlGas ControlGas Control Ar, O2, N2

    Ultimate pressureUltimate pressureUltimate pressureUltimate pressure 1 x 10-6 Torr

    Operating SystemOperating SystemOperating SystemOperating System HMI Software / PLC Based Process Control

    Fully Automated System

    Safety Interlock System

    Specifications

  • Roll Coating Sputter System-3

    Process Control System with Touch ScreenProcess Control System with Touch ScreenProcess Control System with Touch ScreenProcess Control System with Touch ScreenProcess Control System with Touch ScreenProcess Control System with Touch ScreenProcess Control System with Touch ScreenProcess Control System with Touch Screen

    Web winding moduleWeb winding moduleWeb winding moduleWeb winding module---- up to 200 mm wideup to 200 mm wideup to 200 mm wideup to 200 mm wide

    System Features

    Deposition Process : Multi turn system

    Deposition Chamber : Main Chamber & Silver Chamber

    System Control : PLC program in PC control

    with Touch Screen

    Gas Control : Ar, O2, N2

    Tension Self Stabilizer System

  • Closed-loop temperature control with Pyrometer or Thermocouple

    Fast Digital PID temperature control

    Tubular Infrared Halogen Lamps allow very fast ramp rates

    Multi-zone control of Infrared Halogen Lamps

    Motorized Horizontal Motion Door with Quartz Tray

    Cold Wall Chamber Technology provides high process reproducibility

    System Features

    Rapid Thermal Annealing System

    Full PC control for editing recipes and process data logging

    RTA (Rapid Thermal Annealing)

    RTO (Rapid Thermal Oxidation)

    Ion Implant Activation

    Contact alloying

    Oxidation and Nitridation

    Compound Semiconductor Annealing

    Crystallization and Densification

    Applications

  • Performance Characteristics

    Temperature Range: 250 to 1200

    Ramp Up Rate : 100/sec

    Ramp Down Rate : 100 /sec (at high temp.)

    Steady State Temperature Stability: 2

    Steady State Time: 1~9999 sec ( 1~600 sec recommended)

    Wafer Size: Up to 6 inch

    Gas Mixing Capability with Mass Flow Controllers

    RTA System

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Maximum Substrate SizeMaximum Substrate SizeMaximum Substrate SizeMaximum Substrate Size Up to 6"

    Process ChamberProcess ChamberProcess ChamberProcess Chamber Water-cooled Aluminum with quartz window

    Heating SourceHeating SourceHeating SourceHeating Source Multi-zone halogen lamp

    Fan lamp air cooling with heat exchanger

    High temperature version up to 1200

    Temperature ControlTemperature ControlTemperature ControlTemperature Control K-type Thermocouple (

  • RTA Software Program

    Program Features

    User-Friendly Automatic Control System

    Semi Automatic Control System

    Recipe System

    Data Save System

    Data Analysis System

    Safety Interlock System

  • RTA Software Program

    Auto Control Semi Auto Control

    Graph Data Sheet

  • Closed-loop temperature control with pyrometer or thermocouple

    Tubular Infrared Halogen Lamps allow very fast heating ramp rates

    Convective cooling process by using LN2 showering onto sample surface

    Rapid Heat/Cool exchange following thermal process program

    to control sample property

    Fast and accurate vertical sample position control by using servo motor

    System Features

    Rapid Cooling/Heating System

    RTA (Rapid Thermal Annealing)

    RTO (Rapid Thermal Oxidation)

    Ion Implant Activation

    Contact alloying

    Oxidation and Nitridation

    Compound Semiconductor Annealing

    Crystallization and Densification

    Applications

    Full PC control for editing recipes and process data logging

    Safety interlock system

  • Performance Characteristics

    Temperature Range: 250 to 800

    Ramp Up Rate : 100/sec

    Ramp Down Rate : 100 /sec

    Steady State Temperature Stability: 2

    Steady State Time: 1~9999 sec ( 1~600 sec recommended)

    Sample Size: Up to 6 inch long metal strip

    Gas Mixing Capability with Mass Flow Controllers

    Rapid Cooling Processing System

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Maximum Substrate SizeMaximum Substrate SizeMaximum Substrate SizeMaximum Substrate Size 200X150X(0.5~10)mm

    Process ChamberProcess ChamberProcess ChamberProcess Chamber Water-cooled Aluminum Chamber & Quartz Chamber

    Heating SourceHeating SourceHeating SourceHeating Source Multi-zone halogen lamp

    Fan lamp air cooling with heat exchanger

    High temperature version up to 800

    Cooling SourceCooling SourceCooling SourceCooling Source Nitrogen, Argon, Liquide Nitrogen

    Low temperature version down to 300

    Temperature ControlTemperature ControlTemperature ControlTemperature Control K-type Thermocouple (

  • MOCVD System

    Patented unique design for gas stream

    High heating capacity to deposit the desired atoms on the wafer

    Possible to use various compositions of the gases

    Highly uniform thickness

    Excellent repeatability

    Low maintenance and high throughput

    System Features

  • MOCVD Unique Showerhead StructureMOCVD Unique Showerhead Structure

    MOCVD System

    Specifications

    MOCVD Unique Showerhead StructureMOCVD Unique Showerhead Structure

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Source TypeSource TypeSource TypeSource Type Showerhead

    Input Gas StreamInput Gas StreamInput Gas StreamInput Gas Stream Up to 3 layers

    Substrate holderSubstrate holderSubstrate holderSubstrate holder 2" size/3 stage (option)

    Substrate Heating CapacitySubstrate Heating CapacitySubstrate Heating CapacitySubstrate Heating Capacity Up to 1200 (Uniformity 5)

    Substrate MotionSubstrate MotionSubstrate MotionSubstrate Motion Z-motion, Revolution, Rotation (Option)

    Using gasUsing gasUsing gasUsing gas N2, O2, H2, NH3, SiH24

    Mo SourceMo SourceMo SourceMo Source 2 channels (Ga, Mn)

    Ultimate pressureUltimate pressureUltimate pressureUltimate pressure 5 x 10-3 Torr

    Operating SystemOperating SystemOperating SystemOperating System PLC program control with Touch screen

    Fully Automated System

    Safety Interlock System

  • PECVD System

    Dual Mixed Feature of PECVD and RTCVD

    Halogen Heating (1200) and RF Power Input

    Dry & Turbo, Rotary pumping

    Gas : Ar, N2, H2, NH2, SiH4, B2H6, PH3, TCS Liquid Direct Injection, MO source

    Deposit the desired films (Crystalline & Amorphous) on the wafer(4, 6)

    PC Automation & LCD (17) displayPC Automation & LCD (17) displayPC Automation & LCD (17) displayPC Automation & LCD (17) display

    System Features

  • Evaporation System

    8 inch Lift Off Dome8 inch Lift Off Dome

    Used for extensive material coating process. Metal, oxide, nitride and multi layers.

    Lift-off dome and planetary dome make highly uniform thickness, excellent step coverage and repeatability.

    Fully automated computer controlled operating system with safety interlocks. Possible to select thermal evaporation or

    e-beam evaporation.

    System Features

    8 inch Planetary Dome8 inch Planetary Dome

  • Neutral Beam Etcher

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Etching SourceEtching SourceEtching SourceEtching Source Neutrally Charged Species

    Temperature control Temperature control Temperature control Temperature control ESC Cooling

    Wafer size Wafer size Wafer size Wafer size 6 inch

    Substrate MotionSubstrate MotionSubstrate MotionSubstrate Motion Z-motion

    Using gasUsing gasUsing gasUsing gas Ar, O2, C2F6

    Plasma Analysis Plasma Analysis Plasma Analysis Plasma Analysis B-Dot Probe, Ion Energy Analyzer

    Operating SystemOperating SystemOperating SystemOperating System PLC program control with Touch screen

    Fully Automated System

    Safety Interlock System

  • INFOVIONs Ion Milling System utilizes a multi-platen, planetary (double rotation)stage assembly and a highly uniformity etch across each sample.

    Ion Beam Milling System

    System FeaturesSystem FeaturesSystem FeaturesSystem Features SpecificationsSpecificationsSpecificationsSpecifications

    Main chamberMain chamberMain chamberMain chamber Ultimate pressure: Turbo pumping High 10-7 Torr

    Ion gunIon gunIon gunIon gun -Beam aperture: Grid dia. 380 mm, Convex type

    - Ion beam energy: 1.5 KeV

    Specifications

    Largest commercial broad-beam ion source

    Dia32 double walled, Water cooled Chamber

    Beam Uniformity : 5% over 30cm diameter

    Beam Power : 300-1200eV, 5000mA

    Molybdenum, Self-aligning ion optics

    Double rotation planetary type Sample Stage

    Excellent repeatability

    Low maintenance and high throughput

    System Features

    Substrate holderSubstrate holderSubstrate holderSubstrate holder -Substrate Size : 3inch 5EA At Once installation possibility

    - 3inch Full Wafer & scrap Sample All use Substrate Holder

    - Rotation type: Double rotation planetary type, various etching angle

    - Motorized angle setting

  • CIGS Solar Cell Cluster System

    System Features

    INFOVIONs CIGS Solar Cell System Provides the Best Available Value

    for Wide Ranging Research and Production Applications

    System Features

    CIGS multi deposition system

    Single soda-lime glass (100x100/0.7~3t)

    Vacuum cluster system

    Separate entry/exit module

    PM 1 : Isolated CIGS evaporation module

    PM 2 : Ni, Al evaporation module

    PM 4 : AZO, ZnO sputter process module

    PM 5 : CIGS sputter process module

  • INFOVIONs CIGS Solar Cell System Provides the Best Available Value

    for Wide Ranging Research and Production Applications

    Fully automation with data logging capabilities Single soda-lime glass (100x100/0.7~3t) Vacuum cluster system Separate entry/exit module PM 1 : CIGS sputter process module- RF & pulsed DC sputter- 4 Magnetron sputter gun / 3set- RF power: 600W / 1set

    System Features

    CIGS Solar Cell Cluster System

    - RF power: 600W / 1set- Pulse DC power: 800V 7.2A 150kHz / 2set- Substrate heating (max 650) PM 2 : AZO, ZnO sputter process module- 4 Magnetron sputter gun / 3set- RF power: 600W / 1set- Pulse DC power: 800V 7.2A 150kHz / 2set- Substrate heating (max 650) PM 3 : Ni, Al evaporation module- E-beam source: 25cc / 4 pocket / 1set- E-beam source shutter with air actuator- Substrate heating (max 650) PM 4 : Isolated CIGS evaporation module- Effusion cell evaporator- Isolated operation system (exclusive use load-lock)- 10cc Cu, In, Ga, Na cell source with shutter- 150cc Se, S cell source with shutter- Substrate heating (max 650)- EIES and thickness controller

  • ---- InInInIn----linelinelineline 70"70"70"70" PDPPDPPDPPDP GlassGlassGlassGlass ITO( IndiumITO( IndiumITO( IndiumITO( Indium----TinTinTinTin----Oxide) , Oxide) , Oxide) , Oxide) , , MgO , MgO , MgO , MgO

    - ChamberChamberChamberChamber : 5000mm(l) x 1410mm(h) x 300mm(w): 5000mm(l) x 1410mm(h) x 300mm(w): 5000mm(l) x 1410mm(h) x 300mm(w): 5000mm(l) x 1410mm(h) x 300mm(w)

    - Sputter Sputter Sputter Sputter : 4 Target Source : 4 Target Source : 4 Target Source : 4 Target Source , , , , , , , , : 95% : 95% : 95% : 95% , Tack Time : 5min/ Batch, Tack Time : 5min/ Batch, Tack Time : 5min/ Batch, Tack Time : 5min/ Batch

    ---- 70"70"70"70" PDPPDPPDPPDP ITO ITO ITO ITO , , , , : 400/ min, : 400/ min, : 400/ min, : 400/ min, : 85%: 85%: 85%: 85%, , , , : : : : 7%7%7%7%

    In Line PDP System

    70"70"70"70" Glass Sputtering SystemGlass Sputtering SystemGlass Sputtering SystemGlass Sputtering System

  • Arc Sputter System

    System Features

    Arc Ion Sputtering System

    Oil Diffusion, Rotary Booster & Holding Pump

    Gas: Ar, N2, H2, C2H2, GN2 (Vent)

    PC, Automation & LCD (19) Display

    Plasma Gun 2300 x 80mm (Linear Anode Ion Source)

    Dia 482780h x 1220 Water Cooled chamber

    Functional Coating System (Temp Max 450)

    Rotation, Revolution, Sample Stage Rotation, Revolution, Sample Stage Rotation, Revolution, Sample Stage Rotation, Revolution, Sample Stage

    Streed Arc Gun 80 35eaStreed Arc Gun 80 35eaStreed Arc Gun 80 35eaStreed Arc Gun 80 35ea

    Low Maintenance and High ThroughputLow Maintenance and High ThroughputLow Maintenance and High ThroughputLow Maintenance and High Throughput

    Sample 2200mm 220Sample 2200mm 220Sample 2200mm 220Sample 2200mm 220

    Rotation Post 8eaRotation Post 8eaRotation Post 8eaRotation Post 8ea

    Sample BiasSample BiasSample BiasSample Bias

    Electric Magnet for UniformityElectric Magnet for UniformityElectric Magnet for UniformityElectric Magnet for Uniformity

  • INFOVIONS

    Core Source & System Components

  • Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Ion Source Type Ion Source Type Ion Source Type Ion Source Type RF Ion Source

    Beam Aperture Beam Aperture Beam Aperture Beam Aperture 60

    Beam Energy Beam Energy Beam Energy Beam Energy 100~1500eV

    Using GasUsing GasUsing GasUsing Gas Reactive & Inert gas

    Cooling Type Cooling Type Cooling Type Cooling Type Water cooling

    Specifications

    RF Ion Source

    INFOINFO--RFRF--60G60G

    Features

    Contamination-free Ion Source

    High Flux with Wide Range Energy

    Reactive & Inert gas Operation

    Easy Maintenance

    Good Compatibility

    Plasma Chamber Plasma Chamber Plasma Chamber Plasma Chamber Quartz

    Plasma source Plasma source Plasma source Plasma source ICP

    Grid Configuration Grid Configuration Grid Configuration Grid Configuration Mo multi grids

    Beam Neutralization Beam Neutralization Beam Neutralization Beam Neutralization Plasma Bridge Neutralizer, RF Neutralizer on request

    Mounting Configuration Mounting Configuration Mounting Configuration Mounting Configuration Flange DN-160CF, DN-160ISO on request

  • Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Ion Source Type Ion Source Type Ion Source Type Ion Source Type Hollow Cathode Ion Source

    Beam Aperture Beam Aperture Beam Aperture Beam Aperture 55

    Beam Energy Beam Energy Beam Energy Beam Energy 100~1000eV

    Using GasUsing GasUsing GasUsing Gas Reactive & Inert gas

    Cooling Type Cooling Type Cooling Type Cooling Type Water cooling

    Plasma Chamber Plasma Chamber Plasma Chamber Plasma Chamber Tantalum

    Specifications

    Hollow Cathode Ion Source

    INFOINFO--HCHC--55/55G55/55G

    Features

    Compatible with Reactive Conditions

    Wide Range Operation, easy-to-start

    Continuous Working

    Dual Chamber for Plasma Generation

    Various Application

    Plasma Chamber Plasma Chamber Plasma Chamber Plasma Chamber Tantalum

    Plasma source Plasma source Plasma source Plasma source

    Grid Configuration Grid Configuration Grid Configuration Grid Configuration Mo multi grids

    Beam Neutralization Beam Neutralization Beam Neutralization Beam Neutralization Plasma Bridge Neutralizer, RF Neutralizer on request

    Mounting Configuration Mounting Configuration Mounting Configuration Mounting Configuration Flange DN-160CF, DN-160ISO on request

  • Specifications

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Ion Source Type Ion Source Type Ion Source Type Ion Source Type RF Ion Source

    Beam Aperture Beam Aperture Beam Aperture Beam Aperture 60X450mm

    Beam Energy Beam Energy Beam Energy Beam Energy 100~1500eV

    Using GasUsing GasUsing GasUsing Gas Reactive & Inert gas

    Cooling Type Cooling Type Cooling Type Cooling Type Water cooling

    Plasma Chamber Plasma Chamber Plasma Chamber Plasma Chamber Quartz

    Linear Ion Source-1

    INFOINFO--RFRF--60X450G60X450G

    Features

    Applicable to 2th Generation Glass Substrates

    Uniform Processing for Ultra Large Substrates

    Contamination-free Ion Source

    Reactive & Inert gas Operation

    Low & Easy Maintenance

    Plasma Chamber Plasma Chamber Plasma Chamber Plasma Chamber Quartz

    Plasma source Plasma source Plasma source Plasma source ICP

    Grid Configuration Grid Configuration Grid Configuration Grid Configuration Mo multi grids

    Beam Neutralization Beam Neutralization Beam Neutralization Beam Neutralization Plasma Bridge Neutralizer, RF Neutralizer on request

    Mounting Configuration Mounting Configuration Mounting Configuration Mounting Configuration Rectangular O-ring type flange

  • Specifications

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Ion Source Type Ion Source Type Ion Source Type Ion Source Type RF Ion Source

    Beam Aperture Beam Aperture Beam Aperture Beam Aperture 60X2010mm

    Beam Energy Beam Energy Beam Energy Beam Energy 100~1500eV

    Using GasUsing GasUsing GasUsing Gas Reactive & Inert gas

    Cooling Type Cooling Type Cooling Type Cooling Type Water cooling

    Plasma Chamber Plasma Chamber Plasma Chamber Plasma Chamber Quartz

    Linear Ion Source-2

    INFOINFO--RFRF--60X2010G60X2010G

    Features

    Applicable to 7th Generation Glass Substrates

    Uniform Processing for Ultra Large Substrates

    Contamination-free Ion Source

    Reactive & Inert gas Operation

    Low & Easy Maintenance

    Plasma source Plasma source Plasma source Plasma source ICP

    Grid Configuration Grid Configuration Grid Configuration Grid Configuration Mo multi grids

    Beam Neutralization Beam Neutralization Beam Neutralization Beam Neutralization Plasma Bridge Neutralizer, RF Neutralizer on request

    Mounting Configuration Mounting Configuration Mounting Configuration Mounting Configuration Rectangular O-ring type flange

  • Gate Valve for PDP

  • Round Gate Valve

  • Features

    Analysis of electron and ion energy distribution functions

    Minimum perturbation of ion flight path and constant ion

    transmission at all energies

    Using the magnet to reduce secondary electron emission

    Using three grids to retard scattered electrons and prevent

    Ion Energy Analyzer-1

    contamination

    Possible to use as a Faraday Cup for charged particle flux

    measurement

    Specifications

    System FeaturesSystem FeaturesSystem FeaturesSystem Features SpecificationsSpecificationsSpecificationsSpecifications

    Input PowerInput PowerInput PowerInput Power Max. 1000 V

    Aperture SizeAperture SizeAperture SizeAperture Size 20mm dia.

    Shield SizeShield SizeShield SizeShield Size 58mm dia.

    Operating Temp.Operating Temp.Operating Temp.Operating Temp. Max. 300

    Pressure RangePressure RangePressure RangePressure Range 5 x 10-3 ~ 5 x 10-8 Torr

  • Features

    Versatile transfer lens system

    Compact design

    Magnetic shielded construction

    True multi-technique capabilities

    Windows based Advantage data system

    Ion Energy Analyzer-2

    Windows based Advantage data system

    Specifications

    System FeaturesSystem FeaturesSystem FeaturesSystem Features SpecificationsSpecificationsSpecificationsSpecifications

    1000 V/1A

    -500 V/1A

    Plasma chamberPlasma chamberPlasma chamberPlasma chamber Quartz

    Grid configurationGrid configurationGrid configurationGrid configuration Mo Grid

    Operating Temp.Operating Temp.Operating Temp.Operating Temp. Max. 300

    Pressure RangePressure RangePressure RangePressure Range 5 x 10-3 ~ 5 x 10-8 Torr

    Input PowerInput PowerInput PowerInput Power

  • MOMBE Effusion Cell

    Features

    Versatile and compact design to use metal organic source

    Operating temperature range is 30C ~ 500C

    Provides easy access to injector for cleaning

    Easy to install due to CF flange type mounting

    Quick connector type power and thermocouple terminals

    A variety of different crucible materials are available

    Specifications

    System FeaturesSystem FeaturesSystem FeaturesSystem Features SpecificationsSpecificationsSpecificationsSpecifications

    Total height Total height Total height Total height 440mm

    Injection part height Injection part height Injection part height Injection part height 88.5mm

    Injection part diameter Injection part diameter Injection part diameter Injection part diameter 48mm

    Nozzle SizeNozzle SizeNozzle SizeNozzle Size 0.5~3mm

    Temperature range Temperature range Temperature range Temperature range 30C ~ 500C

    ThermocoupleThermocoupleThermocoupleThermocouple K-Type

    A variety of different crucible materials are available

    Application paper:

    - M.S. Yun, M.S. Kim, Y.D. Go, J.H. Hong, I.G. Yun,

    Microelectronic Engineering, 77 (2005), P.54

    - M.S. Kim, J.H. Hong, M.C. Jeong, J.M. Myoung,

    Applied Surface Science, 227 (2004), P.398

  • OLED Effusion Cell

    Features

    Versatile and compact design for use of low temperature volatile

    organics

    Operate at low temperatures through superior thermal control in

    30C ~ 700C range

    Provides easy access to crucible for cleaning

    Easy to installation

    Specifications

    System FeaturesSystem FeaturesSystem FeaturesSystem Features SpecificationsSpecificationsSpecificationsSpecifications

    Total height Total height Total height Total height 70mm

    Injection part diameter Injection part diameter Injection part diameter Injection part diameter 50mm

    Standard crucible Standard crucible Standard crucible Standard crucible 4cc high purity alumina

    Temperature range Temperature range Temperature range Temperature range 30C ~ 700C

    Charge capacity Charge capacity Charge capacity Charge capacity 3cc

    ThermocoupleThermocoupleThermocoupleThermocouple K-Type

    Easy to installation

    Base mounted power and thermocouple terminals

    Distribute coatings evenly by directing vapor

    Ideal for use in tandem for co-deposition of dye-doped organic

    emissive films

    Various material of crucibles

  • Specifications

    Base System FeaturesBase System FeaturesBase System FeaturesBase System Features SpecificationsSpecificationsSpecificationsSpecifications

    Source TypeSource TypeSource TypeSource Type Showerhead

    Input Gas StreamInput Gas StreamInput Gas StreamInput Gas Stream Up to 3 layers

    Substrate holderSubstrate holderSubstrate holderSubstrate holder 2" size/3 stage (option)

    Substrate Heating CapacitySubstrate Heating CapacitySubstrate Heating CapacitySubstrate Heating Capacity Up to 1200 (Uniformity 5)

    Substrate MotionSubstrate MotionSubstrate MotionSubstrate Motion Z-motion, Revolution, Rotation (Option)

    Using gasUsing gasUsing gasUsing gas N2, O2, H2, NH3, SiH24

    MOCVD Shower Head

    Features

    Plurality of gases in showerhead are not mixed before injection

    Uniform gas distribution

    Anti-oxidant and stable showerhead structure in high temperature

    Unique honeycomb structure

    Each component of showerhead is brazed in vacuum condition

    Using gasUsing gasUsing gasUsing gas N2, O2, H2, NH3, SiH24

    Mo SourceMo SourceMo SourceMo Source 2 channels (Ga, Mn)

    Ultimate pressureUltimate pressureUltimate pressureUltimate pressure 5 x 10-3 Torr

    Operating SystemOperating SystemOperating SystemOperating System PLC program control with Touch screen

    Fully Automated System

    Safety Interlock System

  • Specifications

    System FeaturesSystem FeaturesSystem FeaturesSystem Features SpecificationsSpecificationsSpecificationsSpecifications

    MaterialMaterialMaterialMaterial Flange and tube: SUS 304

    Actuator housing and stop clamps:

    Anodized aluminum

    Magnet TypeMagnet TypeMagnet TypeMagnet Type NdFeB or Alnico(for high temp.)

    Pressure range Pressure range Pressure range Pressure range ATM to 1 x 10-11

    Torr (HV/UHV)

    Operating TemperatureOperating TemperatureOperating TemperatureOperating Temperature -20 to 250

    Magnet Transfer Rod

    Features

    Continuous rotary motion when unguided

    Long stroke (up to 2000mm)

    Manual or Motorized linear travel actuator

    Greatly enhanced durability and stability by using

    space sustaining transport unit

    Low vibration and deflection of sample holder

    Operating TemperatureOperating TemperatureOperating TemperatureOperating Temperature -20 to 250

    Decoupling Axial load Decoupling Axial load Decoupling Axial load Decoupling Axial load 0.8 kg

    TorqueTorqueTorqueTorque 5.2 kg.m

    Lateral loadLateral loadLateral loadLateral load 12 kg Max.

    DimensionDimensionDimensionDimension 78 x (670mm or longer)*Modifications are available

  • Mask ChangeOLED Glass Chucking Module

  • OLED Glass Chucking Module

    Overview

    Main Plate

    Cylinder for Glass Stretching

    Glass (730x920)

    Stretching Bracket

    Mask Holder

    Mask

    Cylinder for Mask Chucking

    Cylinder for Glass Chucking

    Glass Holder

  • In-line IBD System

    Ion Source Moving

    Ion Beam Target Ion Beam Target

    Ion Beam1 Ion Beam 2(Deposition) (Cleaning)

    Target

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