Implementing Low-Power CRC-Half for RFID Circuits
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Transcript of Implementing Low-Power CRC-Half for RFID Circuits
Qi Mi & Zhi LiECE 632 – Fall, 2008University of Virginia
OutlineIntroductionProblem StatementContributionDesignSimulationConclusionFuture WorkQ & A
IntroductionRFID applications
RFID security issues
Problem StatementConstraint:
Energy – foremost constraintSizeComplexity
Problem: We seek to find a feasible way of implementing low-power data encryption on RFID tags.
ContributionImplemented the core hash function (i.e., CRC-
Half) of CRC-MAC with PTM 90nm technology.
Analyzed energy at different operating voltages.
Gave an optimal operating voltage point for CRC-MAC.
Analyzed the trend of leakage current of the circuit.
CRC-MAC Briefing
Fig 1. A hardware implementation of CRC-MAC
CRC-MAC Briefing (cont’d)
Fig 2. C implementation of CRC-MAC as keyed one-way function
Circuit Design
Fig 3. A symbol view of CRC-Half
Simulation
Optimization DesignMetric: Total energy consumption
E/op = Eactive + Eleakage = CeffVDD2 + IlkgVDDTD
KnobsLower VDD (subthreshold design)
Robust, require CMOSShorten operation duration
th
DSDSTGSV
V
s
VVV
oLKG eL
WII 110
SimulationTechnology: PTM 90nm TechnologyCircuit Description: netlistsSimulation Environment
Schematic-level Software: FPGA Advantage 7.0 LS
Circuit-level Software: Cadence 2005 Simulator: Ocean with Spectre
Simulation (cont’d)Approach
Spectre Simulation Result
Data word: 0010 1001 0010 1101Key word: 1101 0010 0001 0111Output: 1011 0001 0001 0111
1
1
1
0
Leakage Current Simulation
s
VVV
oD
DSTGS
L
WII
10
Exponential Reduction as VDD decreases due to DIBL effect
Leakage Current is independent of CLK rate
Current Waveform in One Cycle
Pavg = α0→1fCeffVDD2
A higher CLK rate helps reduce energy consumption for a certain VDD
Total Energy per CRC cycleVDD
(V)
Tcr (ns) Iavg (A) Etotal (nJ)
0.5 10 3.09E-05 1.55E-03
0.45 15 1.98E-05 1.33E-03
0.4 20 1.33E-05 1.06E-03
0.35 40 6.20E-06 8.68E-04
0.3 70 3.50E-06 7.36E-04
0.25 200 1.53E-06 7.63E-04
0.2 700 7.16E-07 1.00E-03
0.15 1800 4.84E-07 1.31E-03
/total DD avg CRC CLKE V I n f
Energy Consumption Plot• The optimal supply voltage is around 0.3V• Leakage energy consumption starts to dominate in the sub-threshold region• Leakage current is taking up a large proportion of average current
ConclusionCRC-processing circuit is simulated in FPGA
and CadenceAverage and leakage currents are simulatedEnergy consumption comparison for different
VDD and VDD optimization for minimum energy consumption
Future WorkUse multiple power supplies to speed up the
critical pathSize up some parts of the circuit to increase
speedAdd high VT NMOS to the PDN to reduce
leakage
Q and A?
Thank you!