IFFAT FATIMA

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IFFAT FATIMA UOG

description

IFFAT FATIMA. UOG. ELECTRON MICROSCOPE. Contents. History LM Vs EM Electron microscope Principle Types of EM Application & importance. History of Microscope. 1590-tube microscope by dutch glass maker. 1665-Robert hooke’s microscope. Continued……………………………. - PowerPoint PPT Presentation

Transcript of IFFAT FATIMA

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IFFAT FATIMA

UOG

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ELECTRON MICROSCOPE

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Contents

• History• LM Vs EM • Electron microscope• Principle• Types of EM• Application & importance

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History of Microscope1590-tube microscope by dutch glass maker 1665-Robert hooke’s microscope

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Continued……………………………

1674-Antonee van leeuwenhookeTEM co-invented by Ernst Ruska (1931)

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Main characteristics of microscope

• Resolution

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Magnification

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Light Microscope Vs Electron microscope

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Comparison

Light microscope

Resolution: 0.2μm to 200nmMagnification: 2000xIllumination: LightGlass lensesObjects seen: frog's egg cells‚ cell

wall‚ cilia‚ flagella‚ nucleus & other organelles etc.

Living specimenLower resolving powerFocus: condenser lense

Electron microscope

• Resolution: 0.2nm• Magnification: 2‚000‚000x• Illumination: Electron• Electromagnetic lenses• Objects seen: orgenelles‚ proteins‚

viruses‚ small molecules etc.• Dead specimen• Higher resolving power• Focus: vaccum & magnetic lense

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Electron microscope

• Electron microscope is a scientific instrument that uses a beam of energetic electrons to examine objects on a very fine scale.

Why electron beam?• Wave nature of particles

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Types of Electron microscope

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Transmission electron microscope

Instrumentation• Electron Source• Electromagnetic lense system• Sample holder• Imaging system

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Working

• Emission of a high voltage beam of electrons.• Focusing of beam on specimen.• Transmission through the specimen.• Magnification of the image.• Recording of the image by fluorescent screen,

light sensitive sensor (camera).

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TEM

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Sample preparation

• Fixation• Rinsing• Post fixation• Dehydration• Infiltration• Polymerization• Sectioning

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Applications

• Ultra-structure analysis• Crystal structure

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Scanning Electron microscope• Emission of a beam of by an electron gun.• Passage of electron beam through the vacuum.• Focusing of beam down toward the sample.• Ejection of X-rays & es. From sample after hitting.• Collection of by detectors & conversion to a signal.• Transmission of signal to a screen/ final image

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Scanning EM

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Sample preparation

• Metals require no preparation• Non metals require coating of a thin layer of

conductive material.

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Applications

• Medical & physical science• Semiconductor industry• Examination of a large specimen range.

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Any Q?