IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

First Look at the Beam Test Results of the FPIX2 Readout Chip for the Btev Silicon

Pixel Detector

L. Uplegger, J. A. Appel, M. Artuso, G. Cardoso, H. P. Cease, D. C. Christian, D. A. Cinabro, S. Kwan, S. Magni, D. Menasce,

C. Newsom, A. Schreiner, M. A. Turqueti, J. Wang

Talk given by Lorenzo Uplegger

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

1. Measure the spatial resolution of the sensors before and afterirradiation

2. Test the read-out chip (ROC) close to real BTeV working conditions

3. Realize a tracking system completely based on pixel detectors

4. Build events using only the temporal information (timestamp) associated to pixel cells without the aid of an external trigger

Test-beam main goals

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

Tevatron

BTeV at C0CDF

D0 pp

BTeV at Fermi National Accelerator Laboratory

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

Muon

EM Cal

Straws &Si Strips

SM3 Magnet

RICH

BTeV detector layout

30 Pixel Detector Stations

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

BTeV pixel detector

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

FPIX2 Readout chip

128 Rows

22 Columns

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

FPIX1 Y measuring planes at 0 deg

Test beam setup

FPIX1 X measuring planes at 10 deg

FPIX2 Detector Under TestCan rotate from 0 to 25 deg

in steps of 5 deg

120GeV p

• 3 FPIX1 pixel detectors upstream and 3 FPIX1 pixel detectors downstream compose the telescope

• The FPIX2 detector under test is in the center. it can be rotated from 0 to 25 degrees a cooling system can lower the temperature to -5° C Y measuring

orientation

X measuring orientation

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

DATA

DATA

DATA

DATA

DATA

DATA

PCI BUS

Data acquisition system

1 mezzanine card distributes the Master clock to all the other cards. All cards distribute then the same clock to all detectors which are therefore synchronous!

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

CLK

particles

timestamp

2Mhz

123456

Data1Ts 2

Data2Ts 2

Data3Ts 2

Data4

Ts 2

Data5Ts 2

Data6Ts 2

Data7Ts 2

Data1Ts 2

Data2Ts 2

Data3Ts 2

Data4

Ts 2

Data5Ts 2

Data6Ts 2

Data7Ts 2

Data1Ts 6

Data2Ts 6

Data3Ts 6

Data4

Ts 6

Data5Ts 6

Data6Ts 6

Data7Ts 6

DAQ main features

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

XY track distribution on the pixel detectors

7 plane coincidences

FPIX1 Telescope

FPIX2 DeviceUnder Test

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

Temperature dependence at different angles

• Linear charge sharing applied

• Threshold set at 1800 e-

• The distribution of the residuals decreases until 15deg and then increases again.

• The resolution (without removing telescope resolution) varies from 12 to 7.5 m

• The change in temperature doesn’t change significantly the resolution.

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

• Linear charge sharing is applied

• Threshold set at 1800 e-

• The resolution (without removing telescope resolution) varies from 12 to 7.5 m

• The same behavior is observed for three different Voltages applied to the sensor.

Sensor bias dependence at different angles

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

Cluster size as function of angleThe angular dependence of the resolution can be easily understood observing the percentage of clusters sizes for different angles. The resolution improves when the number of hits in the clusteris 2 and the charge sharing can be used to determine the position of the hit.

• Cluster size = 1Cluster size = 2▲Cluster size ≥ 3

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

Cluster size shapes for different angles

Cluster size = 1Cluster size = 2Cluster size ≥ 3

IEEE October 16-22, 2004First Look at the Beam Test Results of the FPIX2 Readout Chip for the BTeV Silicon Pixel Detector

Conclusions

• We showed the first results of the test beam carried out at Fermilab in summer 2004

• We were able to build a system with FPIX1 pixel detectors as telescope and to characterize the FPIX2 pixel read out chip

• We collected data for different FPIX2 detectors and we were able to study the spatial resolution as a function of the angle, temperature and bias applied to the sensor.

• The detector angle causes the main effect on resolution.

• The temperature and bias applied don’t affect resolution significantly • Last month we irradiated these FPIX2 detectors in a high intensity proton beam.

They have already been tested on the bench and they are working We will characterize them again in December when the beam will be available again

after the current accelerator shutdown