HW #4 Chapter 4 (MOSFET Circuits)analog.postech.ac.kr/3.Class/1.Classes/14_331/CH04A.pdf · 2002....
Transcript of HW #4 Chapter 4 (MOSFET Circuits)analog.postech.ac.kr/3.Class/1.Classes/14_331/CH04A.pdf · 2002....
Electronic Circuit 1 Ch-4
due 6/19(Thr)
Discussion session: 6/19(Thr), tentative
Quiz 4: 6/20(Friday) 10am~12pm, tentative
Late penalty: -20% / 24 hours(HW portion in total grading: 30%)
EECE331 Electronic Circuits 1, Spring Semester, 2014
HW #4: Chapter 4 (MOSFET Circuits)
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
Electronic Circuit 1 Ch-4
347
MOSFETMetal Oxide Semiconductor Field Effect Transistor
Electronic Circuit 1 Ch-4
348
http://www.computerhistory.org/semiconductor/timeline/1960-MOS.html
Electronic Circuit 1 Ch-4
349
Cross section of NMOS capacitor
oxide(SiO2)
p type silicon substrate
Al
B
VGB
G
Electronic Circuit 1 Ch-4
350
MOSFET : voltage controlled resistor, VCCS
Electronic Circuit 1 Ch-4
351
MOSFET operation
substrate(bulk)
p+ p+Inversion carrier
oxide
Source
Drain
L
n type silicon substrate
Depletion region
(free hole)
n+ poly
Gate
(b)0BSV
cross section of PMOSFET
Electronic Circuit 1 Ch-4
352
Comparison of MOSFET depletion region with PN junction
Electronic Circuit 1 Ch-4
353
NMOS capacitor : accumulation, depletion, inversion
Electronic Circuit 1 Ch-4
354
MOSFET operation
n+
Drain
Depletion region
n+ Inversion carrier
oxide
Source
L
P type silicon substrate
substrate(bulk)
(free electron)
n+ poly
Gate
(a) 0BSV
cross section of NMOSFET
Electronic Circuit 1 Ch-4
355
Channel inversion(逆轉, 反轉) of NMOSFET
Electronic Circuit 1 Ch-4
356
Inversion state of NMOS capacitor ? (compared to PN junction)
A state in which the inversion carriers at silicon surface near oxide can stay at surface without dispersing toward the silicon substrate.
Inversion carrier: free electrons in P-substrate, free holes in N-substrate
The voltage drop across silicon (Vsi.max = 2 phi F + VCB)
Electronic Circuit 1 Ch-4
357
NMOSFET : accumulation, depletion, inversion
Electronic Circuit 1 Ch-4
358
Difference between MOSFET & MOS capacitor
• Channel inversion carriers are supplied from _____&______
• Bias can be applied to an ________ channel through the source & draincontacts
n+ n+
Inversion carrier (free electron))
n+ poly gate
oxide
p type silicon substrate
Depletion region
CBVGBV
CBV
Electronic Circuit 1 Ch-4
359
Electron fills in all hole positions: No free carriers
B--
--
-
- -
Si
Si
Si
--
-
Depletion state Inversion state
Free electrons are added in the Depletion region.
FsiV 2Similar to the built-in potential of PN junction
Electronic Circuit 1 Ch-4
360
Inversion state
FsiV 2 Similar to the built-in potential of PN junction
No free carriers can cross the junction
N-type region(channel) can be maintained at the surface
Electronic Circuit 1 Ch-4
361
)(arg THGCoxN VVCqdensityechInversion
Gq
F
ox
SSFBGCox C
QVVC 2
CBFoxD VCq 2
FCBFFBTH VVV 22
MOSFET operation
Electronic Circuit 1 Ch-4
362
CBFFox
impFBTH V
Cq
VNMOSV 22)(
CBFFox
impFBTH V
Cq
VPMOSV 22)(
real
(NMOS) versus
CBF V2
CBF V2THV
THV
oxSSsiGFB CQV
2 distinct slopes Due to Channel doping to adjust
threshold voltage
Threshold voltage equation
MOSFET operation
Electronic Circuit 1 Ch-4
363
MOS level 1 mode: current equation
SBFFFBTHTHVVVyV × 22)0()(
SPICE level 1 model: two assumptions for simple derivation of ID
(Assumption 1) VTH(y) = VTH(0) for all y ( )Ly 0
(Assumption 2) Channel carrier mobility is constant independent of
bias voltages (VGS, VDS, VBS)
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
364
SBFFFBTHTH VVVyV 22)0()(
SBFsisi VVyV 2)0()(
))()(()( yVyVCyq THGCoxN
))(()( yVVVCyq THGSoxN
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
365
DD IyI )( )cdiffusion ()cdrift( urrenturrent
dy
ydqD
dyydVyqW N
nNn)()()(
)())((0
ydVyVVVCWLI DSVTHGSoxnD ))0()(( NNn qLqDW
Integrate the above equation from source(y=0) to drain(y=L)
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
366
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
367
DSDSTHGSoxnD VVVVLWCI
21 DSoxn V
LWCD
DSDSTHGSoxn VVVVL
WC
21 DSToxn VV
LWC
DSGSoxnD VVLWCI __________
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
368
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
369
0)())(()( DSTHGSoxTHGSoxN VVVCLyVVVCLyq
Pinchoff Voltage VDSAT
VDS value where the inversion charge density at the drain end ofchannel becomes 0
THGSDSAT VVV
Saturation region: VDS > VGS – VTH VD > VG - VTH
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
370
LL V
THGSoxnD ydVyVVVCWdyI DSAT
0 0)())((
)(
)0()(
LLq
q NnN
NydqDW
2)(21)( THGSoxnD VVCWLLI )0(Nn qDW
2)(21
THGSoxnD VVCLL
WI
)( THGSToxn VVVCLL
W
2)(21
THGSoxnD VVCLL
WI
Saturation region current equation
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
371
)(2DSATDS
A
si VVqN
L
DSVLL
)1(111
1
111DSV
LLL
LLLLLL
Channel Length Modulation
Channel length modulation factorSUBNL
1
For smaller channel length(L), the larger lambdadecreases the small-signal output resistance & voltage gain
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
372
)1(21)( DSDSDSTHGSoxnDDSATDSTHGS VVVVV
LWCIVVandVVif
)1()(21)( 2
DSTHGSoxnDDSATDSTHGS VVVLWCIVVandVVif
0)( DTHGS IVVif
MOS level 1 model: current equation
MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
373
)(2
DSATDSA
si VVqN
L
DSVLL
)1(111
1
111DSV
LLL
LLLLLL
Channel Length Modulation
Channel length modulation factorSUBNL
1
MOS level 1 model: current equation
For smaller channel length(L), the larger lambda decreases the small-signal output resistance & voltage gain
Electronic Circuit 1 Ch-4
374
)1(21)( DSDSDSTHGSoxnDDSATDSTHGS VVVVV
LWCIVVandVVif
)1()(21)( 2
DSTHGSoxnDDSATDSTHGS VVVLWCIVVandVVif
0)( DTHGS IVVif
MOS level 1 model: current equationUsed for hand analysis
복습 MOS level 1 model: current equation
Electronic Circuit 1 Ch-4
375
SPICE MOSFET (Large signal model)
(a)
CGD
D
CBD
VGD
G VDS
VBD
VBS
CBS
CGB
BID
VGS
+ _
++
rs
rd
S
+
__
_
_+
CGS
Electronic Circuit 1 Ch-4
376
S
CBD
gbd
gbs
CBSrs
gdsgmbvbs
gmvgs
CGD
CGS
rd
G
D
B
CGB
(b)
SPICE MOSFET (Small signal model)
Electronic Circuit 1 Ch-4
377
SPICE level 1 parameters
-11LEVEL
0.80.8PHI
TOX
LD
LAMBDA
0.4370.822GAMMA
128335UO
-0.9380.672VTO
단위PMOSFETNMOSFET모델 파라미터
21002.4 21025.7
71075.1 91032.8
81025.2 81025.2
V
sec/2 Vcm
V
V/1
m
m
V
mLW 2.1/20/ mLW 2/20/
SPICE MOSFET model
Electronic Circuit 1 Ch-4
378
0.0E+0
1.0E-5
2.0E-5
3.0E-5
4.0E-5
5.0E-5
6.0E-5
0.0 1.0 2.0 3.0 4.0 5.0
-ID(A)
-VDS(V)
VGS=-1.2, -1.4, -1.6VVBS=0
0.0E+0
5.0E-5
1.0E-4
1.5E-4
2.0E-4
2.5E-4
3.0E-4
3.5E-4
4.0E-4
4.5E-4
0.0 1.0 2.0 3.0 4.0 5.0
ID(A)
VDS(V)
VGS=1, 1.2, 1.4VVBS=0
(a)
(b)
SPICE level 1 Dot: SPICE simulation, Solid: measurement (a) NMOSFET; W/L=20/1.2um (b)PMOSFET; W/L=20/2um
SPICE MOSFET model
Electronic Circuit 1 Ch-4
379
DSTHGSoxnD VVVLWCI 1
21 2
MOSFET as an amplifier
Operate MOSFET in saturation region in an amplifier circuit(∵ both gm & ro are maximized in the saturation region )
Electronic Circuit 1 Ch-4
380
DSTHGSoxnD VVVLWCI 1
21 2
_________2 D
oxnGS
Dm
ILWC
VIg
mBS
THm
BS
Dmb g
VVg
VIg
3.0~1.0:22 BSF V
______1
1
DS
Do V
Ir
___________ FBTH VV
◦ Small-signal model in Saturation region
Electronic Circuit 1 Ch-4
381
◦ Small-signal equivalent circuit of NMOSFET
gsmg
D
G B
S
CGD
CGS
CGB
CSB
CDB
or1
bsmbg
the same small-signal equivalent circuit: the same in both PMOSFET & NMOSFET
Electronic Circuit 1 Ch-4
382
◦ Small-signal equivalent circuit(等價回路) of MOSFET
gsmg
D
G BS
CGD
CGS
CGB
CSB
CDB
or1
bsmbg
◦ Junction capacitance
MJSWBD
MJBD
DB
PBV
PDCJSW
PBV
ADCJC
11
MJSWBS
MJBS
SB
PBV
PSCJSW
PBV
ASCJC
11
◦ Small-signal equivalent circuit of MOSFET
Electronic Circuit 1 Ch-4
383
◦ gmb neglected⇒ T equivalent circuit
G B
gsmg
D
S
or1
bsmbg
gsmg
D
S
D
S
igG(ig=0)
ig=0G
The same terminal current
D
S
ig=0
D
S
G
T equivalent circuit
or1
gsmg
or1
gsmg
gsmg
or1
mg
si
or1
mg
CGD
si
◦ T equivalent circuit
Electronic Circuit 1 Ch-4
384