High Speed Stepped Electronic Load for Dynamic Testing of DC/DC Converters

TEAM MEMBERS:Sean KenneyBrian SicardMark Thomas

ECE ADVISOR:Kuan Zhou

INDUSTRY ADVISOR:John Canfield

Sean Kenney

PROBLEM DEFINITION

PROBLEM DEFINITION

• Dynamic testing of DC/DC converters• Available solutions on the market

Sean Kenney

DESIGN GOALS

DESIGN GOALS

• To design/build an active load with the following qualities:– Wide voltage compliance range– Very fast stepping rate– Wide range of settable currents– Unconditionally stable

HARDWARE IMPLEMENTATION

Mark Thomas

Implementation Phases for Each Sub-Circuit

Implementation Process

• Research Solutions• Choose Solution• Design Solution• Test Components• Design Review• Prototype Construction• Prototype Testing• Final Design Review• PCB Implementation

Sub-Circuits and Components• Power DAC

– Power DAC Current Sinking FET Network– Current Sense– Voltage Sense

• Power Management– Voltage Regulators

• Thermal Measurement– Current Source– High Accuracy Differential Amplifier

• Miscellaneous– Op Amp Buffers to Provide Circuit Isolation– MOSFET Switches– Pull-up/down Resistors

MICROCONTROLLER DEVELOPMENT

Brian Sicard

DEVELOPMENT PHASES

FAMILIARIZATION

• Purpose of Familiarization Phase• MSP430 Development Tools• Development Software

ALGORITHMS

• Familiarization++

TEST PLANBrian Sicard

TEST PHASES

TEST MOTIVATION

• Component/Device Behavior

• Sub-Circuit Functionality

• Algorithm Functionality

• Sub-Circuit Functionality W/Algorithms

• Total Design Functionality

• Prototype Functionality

Sean Kenney

ESTIMATED TIMELINE

ESTIMATED TIMELINE

Sean Kenney

BUDGET ESTIMATE

BUDGET ESTIMATE

• Total Budget Estimate: $596.14• Budget covered by Linear Technology