FPIX0 Electronic TestMarina ArtusoPaul Gelling

Jianchun Wang

The system works fine with charge injection calibration

Gain curve, threshold, and noise calibration

Americium source calibration

04/18/01 Jianchun (JC) Wang 2

FPIX0 Chip

04/18/01 Jianchun (JC) Wang 3

Gain Curve Calibration

Scan step

1mV ~ 31.25 e

High Gain Cell

Normal Gain Cell

04/18/01 Jianchun (JC) Wang 4

Efficiency curve around threshold can used to measure both noise and threshold

Attenuation factor: 0.31826

04/18/01 Jianchun (JC) Wang 5

Threshold Distribution

Threshold Voltage set to 1.95 V

04/18/01 Jianchun (JC) Wang 6

Noise Distribution

04/18/01 Jianchun (JC) Wang 7

Calibration with X-ray Source

Americium-241:60 KeV

(35.7%)

Peak expected: Q ~ 60 / 3.6 = 16.7 Ke

Charge – ADC curve from pulse calibration applied Qcluster (Ke)

Num

ber

of C

lust

ers

60 KeV peak

04/18/01 Jianchun (JC) Wang 8

Am-241 with Al Filter

Qcluster (Ke)

Num

ber

of C

lust

ers

9 mm (later 4 mm) Al filter used

lower energy peak is suppressed

04/18/01 Jianchun (JC) Wang 9

Relative Scale Calibration

Col 1 Row 1 Col 5 Row 11

Qcluster (Ke)

Num

ber

of C

lust

ers

220,000 Clusters recorded for 11 63 cells

04/18/01 Jianchun (JC) Wang 10

Peak Position Distribution

Column

Row

Peak Position (Ke)N

umbe

r of

Cel

ls

04/18/01 Jianchun (JC) Wang 11

Scale Correction

Corrected Charge (Ke)

Num

ber

of C

lust

ers

Single Point (60KeV) Calibration

Scale Factor only

04/18/01 Jianchun (JC) Wang 12

Summary

Pulse and source calibrations so far work fine, and can be used for future test

Strong X-ray source, more point calibration

Laser beam is much better choice ( investigating )