FIELD EMISSION SCANNING ELECTRON MICROSCOPY

Make: Carl Zeiss, Germany

Model: SUPRA 55VP, Gemini Column.

With air lock system

Detectors;

1, Secondary Electron 1 (In Lens)

2, Secondary Electron 2(SE2)

3, Backscattered Electron (BSE)

4, VPSE (Variable Pressure Mode)

Energy Dispersive X-ray Analysis (Edx)

Oxford Instruments X-MAX (20mm²)

Resolution: 1.2 nm gold particle separation on a carbon substrate

Magnification: From a min of 100x to > 5, 00,000 X

Description

SUPRA 55VP FE-SEM is a general purpose ultra high resolution FE-SEM based on the unique

GEMINI Technology. It provided excellent imaging properties combined with analytical capabilities which make

this high end FE-SEM suitable for a wide range of applications in materials science, life science and

semiconductor technology. The large specimen chamber for the integration of optional detectors and accessories

enables the user to configure the SUPRA for specific applications without sacrificing productivity or efficiency.

Sample requirement

sample should be in dried condition and it can be powder, film, pellet , coating etc..

NMR SPECTROMETER 500MHz

Make: Bruker

Model: AVANCE III HD

Major Specifications/ Accessories available:

11.7 Tesla Magnet.

a) 5mm BBO probe with gradient facilities and auto-sampler with VT

facility.

Tuning range from 109Ag to P31 also observation of 19F with 1H

decoupling.

b) 3,2mm CP/MAS probe with VT facility.

Tuning range from 15N to 31P +1H +19H.

Type of measurement/analysis available:

1D NMR, 2D NMR, Multi-nuclear NMR; Variable temperature

measurements.

Sample requirement for liquid samples:

5 mg for 1HNMR and 50 mg for 13CNMR experiment. Compounds should be highly pure

and soluble in commonly available solvents . Solubility, nature of compound [carcinogenic, toxic, lachrymatory, explosive,

hygroscopic] and Structural formula [contemplated / known] to be mentioned. The sample must be soluble in 0.6 ml of deuterated

solvent. Facilities available for 1D NMR, 2D NMR, Multi-nuclear NMR; Variable temperature measurements. RADIOACTIVE

MATERIAL should not be submitted.

Sample requirement for solid samples:

For Solid State NMR, 750 mg fine powder is required.

NMR SPECTROMETER 400MHz

Make: Bruker

Model: AVANCE III HD

Major Specifications/ Accessories available:

9.4 T magnet.

a)5mm BBO probe with gradient facility and auto sampler with

VT facility.

Tuning range from 109Ag to P31 also observation of 19F with 1H

decoupling.

b) 4mm CP/MAS probe with VT facility.

Tuning range from 15N to 31P +1H.

Type of measurement/analysis available:

1D NMR, 2D NMR, Multi-nuclear NMR; Variable temperature

measurements.

Sample requirement for liquid samples:

5 mg for 1HNMR and 50 mg for 13CNMR experiment. Compounds should be highly

pure and soluble in commonly available solvents . Solubility, nature of compound [carcinogenic, toxic, lachrymatory, explosive,

hygroscopic] and Structural formula [contemplated / known] to be mentioned. The sample must be soluble in 0.6 ml of deuterated

solvent. Facilities available for 1D NMR, 2D NMR, Multi-nuclear NMR; Variable temperature measurements. RADIOACTIVE

MATERIAL should not be submitted.

Sample requirement for solid samples:

For Solid State NMR, 750 mg fine powder is required.

ELECTRON PARAMAGNETIC RESONANCE (EPR) SPECTROSCOPY

Make: BRUKER BIOSPIN, Germany

Model: EMX Plus Source: Microwave X Band

Operation mode:

Powder, liquid and crystal samples at RT and down to 100 K

Software: Bruker WIN EPR Acquisition, and Processing

Applications:

Physics : Susceptibility, semiconductors, Quantum dots, Defect centers

Chemistry : Free radicals formation, ET reaction kinetics, Organo metallic, catalysis, molecular magnets, electrochemical studies

and spin labels

Biology : Enzyme reaction. ET reaction, folding & dynamics, metal centers, structural elucidation

Material research : Polymers, glasses, superconductors, corrosion, fullerenes, carbon dating

Medical research : In vivo free radical concentration and EPR imaging.

Make:

Thermo Scientific

Model: ESCALAB 250XI BASE SYSTEM WITH UPS AND XPS

IMAGE MAPPING

Sources:

XR6 Micro-focused Monochromator (Al Kα XPS)

XR4 Twin Anode Mg/Al (300/400W) X-Ray Source.

EX06 Ion gun

Detector:

Two types of detectors ensures optimum detection for each type of

analysis- two dimensional detector for imaging and a detector based on

channel electron multipliers for spectroscopy when high count rates are

to be detected

Salient Features:

Twin anode non-monochromated XPS Large area XPS(LAXPS) Small area XPS (SAXPS)

Fast Parallel Imaging(XPI) Energy Resolution Insulator analysis

Depth profiling capability Angle resolved XPS Ion scattering spectroscopy(ISS)

UV Photoelectron Spectroscopy(UPS) E-Beam Evaporator REELS Facility

Applications of ESCA 250 Xi:

- ESCA is unique and non destructive tool to study the surfaces of the materials

- The surfaces of a corroding sample can be analysed.

- Contamination in the matrix of a catalyst can be analysed qualitatively and quantitatively

- Inter faces (SEI in Li ion battery) of energy storage devises can be analysed qualitatively and quantitatively

- Depth profiling which may give elemental composition as function of depth (1-2 µ) can be done

Sample Requirements:

- Solid Samples in the form of pellets of 6mm or 8mm diameter.

- Thin films of area 10 mm2 Thickness 2 to 3 mm.

ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA) OR X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)

Make:

Thermo Scientific

Model: : MULTILAB 2000 Base system with X-Ray,

Auger and ISS attachments.

Sources:

Twin Anode Mg/Al (300/400W) X-Ray Source.

EX05 Ion gun for etching and ISS studies.

Electron Gun with spot size < 50 m dia.

Detector:

-110 mm radius hemispherical analyzer with 7 channeltrons.

- 4 variable analyzer slits viz 5, 2, 1 mm and 4mm.

- Operates in CAE (Constant Analyser Energy) and CRR

(Constant Retard Ratio) modes.

Salient Features:

- Sample heating and cooling stages in preparation and Analysis Chamber.

- Sample manipulator with high precision four axes movement.

- CCD camera and zoom microscope for optical viewing of the samples.

Applications of MULTILAB 2000:

- What elements and the quantity of those elements that are present within the top 1-12nm of the sample surface

- What contamination, if any, exits on the surface or in the bulk of the sample

- Empirical formula of a material that is free of excessive surface contamination

- The chemical state identification of one or more of the elements in the sample

- The binding energy of one or more electronic states

- The thickness of one or more thin layers (1-8nm) of different materials within the top 12nm of the surfaces.

Sample Requirements:

- Solid Samples in the form of pellets of 6mm or 8mm diameter.

- Thin films of area 10 mm2 and Thickness 2 to 3 mm.

X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)

Make:

FEI, The Netherlands

Model: : Tecnai 20 G2 (FEI make)

Resolution::

- Line-1.8 Å, Point-2.40 Å

- Information limit (nm) 0.16

- Incorporated with STEM.

- Bottom mount CCD Camera (Gatan-make)

- TEM magnification range 25 x - 700 kx

- TEM point resolution 0.27 nm

- TEM line resolution (nm) 0.144

TEM Holder:

- Single tilt

- Single tilt Low background

- Double tilt

- Double tilt Low background

- STEM HAADF resolution 0.24 nm

- STEM magnification range 150 x – 230 Mx

- EDS

Detection:

- Boron to higher (EDAX-make)

Specimen stage:

- Fully computer-controlled, eucentric side-entry, high stability CompuStage

Sample Preparation:

- - Ceramic sample preparation facility (Ion milling) (BALTEC make).

TRANSMISSION ELECTRON MICROSCOPE (TEM)

Make : Bruker Optik GmbH, Germany

Model No. : TENSOR 27

Source : Middle-infrared light (MIR)

Detector : DLaTGS

Spectral range : 370 to 7,500 cm-1

Spectral resolution : 0.125 cm-1

Beam splitter: Ge-based coating on KBr

Software : OPUS TM

FT-IR SPECTROMETER

Make : VARIAN

Model : Cary 500 Scan

Wavelength range: 190-3300 nm

Modes : Specular reflectance, Diffuse

reflectance, Absorbance

UV-VIS-NIR DOUBLE BEAM SPECTROPHOTOMETER

Make : VARIAN

Model : Cary 5000 Scan

Wavelength range: 175-3300 nm

Spectral bandwidth: 0.01 nm

Detector : PbS NIR

Samples : Solid and liquid

Accessories : Multi cell holder, Temperature

attachment (-10 to 100 ºC)

Modes : Specular reflectance, Diffuse

reflectance, Absorbance

Make : VARIAN

Model : Cary Eclipse

Wavelength range: 200-1100 nm

Source : Xenon pulse lamp

Detector : Photo multiplier tube

Modes : Excitation, Emission

FLUORESCENSE SPECTROPHOTOMETER

True Windows NT environment:

- Image management system for image processing, searching and archiving

- Network capability to transfer SEM images and data to external PCs and servers

Applications:

- To study surface morphology of samples

- Evaluation of crystallographic orientation

Make : TESCAN

Model : VEGA3

Magnification: x 30 – x 3, 00,000

Specimen size : Max. 150 mm diameter

Accelerating voltage: 0.3 – 30 kV

Resolution : 3.5 nm @ 25kV high vacuum mode

Attachments : Energy-dispersive X-ray. Spectroscopy (EDS) &

Backscattered Electron Detector (BSED)

SCANNING ELECTRON MICROSCOPE(SEM)

Make : Horiba, Japan

Model : XGT-5200 X-ray analytical microscope

Source : X-ray tube 50 kV max, 1 mA, with Rh target

Detector : Peltier cooled Silicon Drift Detector (SDD)

Elements Detected: Na to U (with sample at normal atmospheric pressure)

CCD camera : Magnification 30 and 100 approx.

Samples : Metal plates, powders and coatings

Energy Range: 0 - 40 keV

Maximum Measurement Area / Maximum Sample Size:

100 mm x 100 mm / 350 mm x 400 mm x 40 mm

X-RAY ANALYTICAL MICROSCOPE (XRF)

Description :

The XGT-5200 X-ray Fluorescence micro-analyzers combine the fast, non-destructive elemental analysis of energy dispersive

X-ray Fluorescence (EDXRF) with the capability to pinpoint individual particles with diameters down to 10 µm in size.

Automated sample scanning provides detailed images of element distribution, over areas as large as 10cm x 10cm.

High Resolution- Transmission Electron Microscope

Make : FEI

Model : Tecnai F20 The 200kV FEI Tecnai F20 Super-Twin is designed to produce optimum high

resolution performance in both TEM and STEM. This microscope features a

1024x1024 CCD camera positioned after the Gatan Imaging Filter (GIF) that can be

used for both dedicated spectroscopic analysis and energy-filtered imaging. The high

Resolution Gatan Orius 2672x2672 CCD can deliver high resolution and real time

speed for imaging application. The Tecnai F20 is equipped with Lorentz Lens for

magnetic imaging in Fresnel and Fouccault modes and NanoMegas Astar system for

automated phase/orientation mapping of nanocrystals materials.

Specifications :

Electron source

Flexible high tension (20, 40, 80, 120, 160, 200 kV and values in between)

Schottky field emitter with high maximum beam current (> 100 nA)

High probe current (0.5 nA or more in 1 nm probe)

Small energy spread (0.7 eV or less) • Spot drift < 1 nm/minute

Vacuum levels: specimen chamber < 1.2 × 10-5 Pa; gun < 1 × 10-6 Pa

Imaging

TEM point resolution (.24nm)

TEM line resolution (.102nm)

Information limit (.14nm)

Extended resolution (TrueImage) Minimum focus step (.16nm)

TEM magnification range 25X-1030kx

Camera length 30-4500mm

Maximized tilts for any X, Y, Z, α and β combination

Detector window: S-UTW

Active area: 30 mm2

Specimen-detector distance 15 mm

Collection angle 0.166 sterad

Elevation angle 0o

Detector resolution 135 eV@ Mn K-α at 100 μs

EDAX Energy-Dispersive X-ray detector

Tip Enhanced Raman Spectroscopy (TERS)

AFM & Raman

Atomic Force Microscopy (AFM) provides a variety of nanometric characterizations such as topography, conductivity, and thermal

measurements. While very effective at measuring certain properties, AFM cannot identify the chemical composition of a given material.

Raman spectroscopy, however, has emerged as a critical technique in the field of chemical characterization, accurately identifying and

classifying materials in a number of diverse fields and industries such as: material science, chemistry, biophysics, semiconductors, and

many more.

Raman:

Renishew Invia Reflex Spectrometer

focal length 250mm

Raman Spectrum: 50cm-1 to 4000cm-1

Microscope:

Specially adapted Research Grade Leica microscope allowing

confocal measurements with better than 2.5µm depth resolution

(using a 100x objective),2.5x, 20x and 50x objective.

Laser:

Air cooled Argon Ion Laser , 50Mw at 514nm,

High power Infrared diode laser 250Mw at 785nm,

Auto align and optimisation of input laser power

Detector

CCD array detector near infrared enhanced,

deep resolution (576x384 pixels). Peltier cooler to -70˚C