EE 4345 - Semiconductor Electronics Design Project Spring … · · 2002-02-06EE 4345 -...
Transcript of EE 4345 - Semiconductor Electronics Design Project Spring … · · 2002-02-06EE 4345 -...
L08 07Feb02 1
EE 4345 - SemiconductorElectronics Design ProjectSpring 2002 - Lecture 08
Professor Ronald L. [email protected]
http://www.uta.edu/ronc/
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Dates for TechnologyProject Reports
12 Feb - TP1.1 Eyad Fanous Group12 Feb - TP1.2 Nam Nguyen Group14 Feb - TP1.3 Viet Tran - The Pentagonal Group14 Feb - TP1.4 Fares Alnajjar Group19 Feb - TP1.5 Carlos Garcia Group19 Feb - TP1.6 Robert Colville Group21 Feb - TP1.7 Jepsy Colon Group21 Feb - TP1.8 Preeti Yadav Group26 Feb - TP1.9 Peter Presby - Group 626 Feb - TP1.10 Derek Johnson Group
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npn BJT currents(F A region, ©RLC)
IC =JCAC
IB=-(IE+IC )
JnE JnC
IE =-JEAE
JRB=JnE-JnC
JpE
JGC
JRE JpC
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Ebers-Moll(npn injection model)
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expt
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ECV
VII
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expt
BE
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S
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CCV
VII(common-emitter)
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� �� �
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eff,o
taieffavgrec
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taimaxfpfna
fnfii
fifni
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xeffavgrec
2V2/VexpnqWxqUJ
2V2/VexpnU ,EEqV w/
,kT/EEexpnp and ,kT/EEexpnn cesin
xqUqUdxJ curr, ecRn
p
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Effect of carrierrec. in DR (cont.)
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High levelinjection effects• Law of the junction remains in the
same form, [pnnn]xn=ni2exp(Va/Vt), etc.
• However, now �pn = �nn become >> nno= Nd, etc.
• Consequently, the l.o.t.j. reaches thelimiting form �pn�nn = ni
2exp(Va/Vt)• Giving, �pn(xn) = niexp(Va/(2Vt)), or
�np(-xp) = niexp(Va/(2Vt)),
L08 07Feb02 7
High level injeffects (cont.)
� �� �
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� �KFKFKFsinj lh,s
ia
tid
tKFa
appdnna
tainj lh,sinj lh
VJJ ,JJJ :Note nNlnV2 or ,
nN
lnV2VV Thus
Nx-n or ,Nxp giving V of range the for important is This
V2/VexpJJ :is density current injection level-High
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Summary of Va > 0current density eqns.• Ideal diode, Jsexpd(Va/(�Vt))
– ideality factor, �• Recombination, Js,recexp(Va/(2�Vt))
– appears in parallel with ideal term• High-level injection,
(Js*JKF)1/2exp(Va/(2�Vt))– SPICE model by modulating ideal Js term
• Va = Vext - J*A*Rs = Vext - Idiode*Rs
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Plot of typical Va > 0current density eqns.
Vext
ln J
data
ln(JKF)
ln(Js)
ln[(Js*JKF) 1/2]Effectof Rs
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aV
Vexp~
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�� taV2
Vexp~
VKF
ln(Jsrec)
Effect ofhigh levelinjection
low levelinjection
recomb. current
Vext-Vd=JARs
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Reverse bias (Va<0)=> carrier gen in DR• Va < 0 gives the net rec rate,
U = -ni/���, �� = mean min carr g/r l.t.
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NNN/NNN and
qN
VV2W where ,2
WqnJ
(const.) U- G where ,qGdxJ
dadaeff
eff
abi
0
igen
x
xgen
n
p
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Reverse bias (Va< 0),carr gen in DR (cont.)
� �
gens
gen
gengensrev
JJJJSPICE
JJJJJ
or of largest the set then ,0
V when 0 since :note model
VV where , current generation the plus bias negative
for current diode ideal the of value Thecurrent the to components two are there
bias, reverse ,)0V(V for lyConsequent
a
abi
ra
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Reverse biasjunction breakdown• Avalanche breakdown
– Electric field accelerates electrons tosufficient energy to initiatemultiplication of impact ionization ofvalence bonding electrons
– field dependence shown on next slide• Heavily doped narrow junction will
allow tunneling - see Neamen*, p. 274– Zener breakdown
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Reverse biasjunction breakdown• Assume -Va = VR >> Vbi, so Vbi-Va-->VR
• Since Emax~ 2VR/W = (2qN-VR/(�))1/2,and VR = BV when Emax = Ecrit (N- isdoping of lightly doped side ~ Neff)
BV = ��(Ecrit )2/(2qN-)
• Remember, this is a 1-dim calculation
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Junction curvatureeffect on breakdown• The field due to a sphere, R, with
charge, Q is Er = Q/(4��r2) for (r > R)• V(R) = Q/(4��R), (V at the surface)• So, for constant potential, V, the
field, Er(R) = V/R (E field at surfaceincreases for smaller spheres)
Note: corners of a jctn of depth xj arelike 1/8 spheres of radius ~ xj
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BV for reversebreakdown (M&K**)
Taken fromFigure 4.13,p. 198, M&K**Breakdownvoltage of aone-sided, plan,silicon stepjunction showingthe effect ofjunctioncurvature.4,5
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D DiodeGeneral FormD<name> <(+) node> <(-) node> <modelname> [area value]ExamplesDCLAMP 14 0 DMODD13 15 17 SWITCH 1.5Model Form.MODEL <model name> D [model parameters].model D1N4148-X D(Is=2.682n N=1.836Rs=.5664 Ikf=44.17m Xti=3 Eg=1.11Cjo=4p M=.3333 Vj=.5 Fc=.5Isr=1.565n Nr=2 Bv=100 Ibv=10 0uTt=11.54n)*$
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Diode Model Parameters (see .MODEL statement)Description UnitDefault
IS Saturation current amp 1E-14N Emission coefficient 1ISR Recombination current parameter amp 0NR Emission coefficient for ISR 1IKF High-injection “knee” current amp infiniteBV Reverse breakdown “knee” voltage volt infiniteIBV Reverse breakdown “knee” current amp 1E-10NBV Reverse breakdown ideality factor 1RS Parasitic resistance ohm 0TT Transit time sec 0CJO Zero-bias p-n capacitance farad 0VJ p-n potential volt 1M p-n grading coefficient 0.5FC Forward-bias depletion cap. coef, 0.5EG Bandgap voltage (barrier height) eV 1.11
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Diode Model Parameters (see .MODEL statement)Description UnitDefault
XTI IS temperature exponent 3TIKF IKF temperature coefficient (linear) °C-1 0TBV1 BV temperature coefficient (linear) °C-1 0TBV2 BV temperature coefficient (quadratic) °C-2 0TRS1 RS temperature coefficient (linear) °C-1 0TRS2 RS temperature coefficient (quadratic) °C-2 0T_MEASURED Measured temperature °CT_ABS Absolute temperature °CT_REL_GLOBAL Rel. to curr. Temp. °CT_REL_LOCAL Relative to AKO model temperature
°C
For information on T_MEASURED, T_ABS, T_REL_GLOBAL,and T_REL_LOCAL, see the .MODEL statement.
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The diode is modeled as an ohmic resistance(RS/area) in series with an intrinsic diode. <(+)node> is the anode and <(-) node> is the cathode.Positive current is current flowing from the anodethrough the diode to the cathode. [area value] scalesIS, ISR, IKF,RS, CJO, and IBV, and defaults to 1.IBV and BV are both specified as positive values.In the following equations:Vd = voltage across the intrinsic diode onlyVt = k·T/q (thermal voltage)
k = Boltzmann’s constantq = electron chargeT = analysis temperature (°K)Tnom = nom. temp. (set with TNOM option�
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• Dinj– key par: IS, N(~1)– rd=N*Vt/iD– rd*Cd = TT =– Cdepl given by CJO, VJ
and M– HLI: IKF, VKF
• Drec– param: ISR, NR(~2)– rd~NR*Vt/iD– rd*Cd = ?– Cdepl =?
SPICE DiodeStatic Model
Vd
iD*RS
Vext = vD + iD*RS
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DC CurrentId = area�(Ifwd - Irev) Ifwd = forward current = Inrm�Kinj + Irec�Kgen Inrm = normal current = IS�(exp ( Vd/(N�Vt))-1)
Kinj = high-injection factorFor: IKF > 0, Kinj = (IKF/(IKF+Inrm))1/2otherwise, Kinj = 1
Irec = rec. cur. = ISR�(exp (Vd/(NR·Vt))- 1)
Kgen = generation factor = ((1-Vd/VJ)2+0.005)M/2
Irev = reverse current = Irevhigh + Irevlow
Irevhigh = IBV�exp[-(Vd+BV)/(NBV·Vt)]Irevlow = IBVL�exp[-(Vd+BV)/(NBVL·Vt)}
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vD=Vext
ln iD
Data
ln(IKF)
ln(IS)
ln[(IS*IKF) 1/2]
Effectof Rs
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� t
aVNF
Vexp~
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aVNR
Vexp~
VKF
ln(ISR)
Effect ofhigh levelinjection
low levelinjection
recomb. current
Vext-Va=iD*Rs
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aVN
V2
exp~
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npn BJT currents(F A region, ©RLC)
IC =JCAC
IB=-(IE+IC )
JnE JnC
IE =-JEAE
JRB=JnE-JnC
JpE
JGC
JRE JpC
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Charge componentsin the BJT From Getreau, Modeling the
Bipolar Transistor,Tektronix, Inc.
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Gummel-Poon Staticnpn Circuit Model
C
E
BB’
ILC
ILE IBF
IBR ICC - IEC =IS(exp(vBE/NFVt
- exp(vBC/NRVt)/QB
RC
RE
RBB
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Gummel-PoonModelGeneral FormQXXXXXXX NC NB NE <NS> MNAME <AREA> <OFF> <IC=VBE,VCE> <TEMP=T>
Netlist Examples
Q5 11 26 4 Q2N3904 IC=0.6, 5.0
Q3 5 2 6 9 QNPN .67
NC, NB and NE are the collector, base and emitter nodes
NS is the optional substrate node; if unspecified, the ground is used.MNAME is the model name,AREA is the area factor, and TEMP is the temperature at which this device operates, and overridesthe specification in the Analog Options dialog.
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Gummel-PoonStatic ModelGummel Poon Model Parameters (NPN/PNP)
Adaptation of the integral charge control model of Gummel and Poon.
Extends the original model to include effects at high bias levels.
Simplifies to Ebers-Moll model when certain parameters not specified.
Defined by parameters
IS, BF, NF, ISE, IKF, NE determine forward characteristics
IS, BR, NR, ISC, IKR, NC determine reverse characteristics
VAF and VAR determine output conductance for for and rev
RB(depends on iB), RC, and RE are also included
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Gummel-Poon StaticModel Parametersname parameter units default areaIS transport saturation current A 1.0e-16 *BF ideal maximum forward beta - 100NF forward current emission coefficient - 1.0VAF forward Early voltage V infiniteISE B-E leakage saturation current A 0 *NE B-E leakage emission coefficient - 1.5BR ideal maximum reverse beta - 1NR reverse current emission coefficient - 1VAR reverse Early voltage V infiniteISC B-C leakage saturation current A 0 *NC B-C leakage emission coefficient - 2EG energy gap for temperature eV 1.11
effect on ISXTI temperature exponent for effect on IS - 3
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Gummel-Poon StaticModel Parametersname parameter units default areaIKF corner for forward beta A infinite *
high current roll-offIKR corner for reverse beta A infinite *
high current roll-offRB zero bias base resistance W 0 *IRB current where base resistance A infinite *
falls halfway to its min valueRBM minimum base resistance W RB *
at high currentsRE emitter resistance W 0 *RC collector resistance W 0 *TNOM parameter - meas. temperature °C 27
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Gummel Poon npnModel Equations
IBF = IS�expf(vBE/NFVt)/BF
ILE = ISE�expf(vBE/NEVt)
IBR = IS�expf(vBC/NRVt)/BR
ILC = ISC�expf(vBC/NCVt)
QB = (1 + vBC/VAF + vBE/VAR )��
{� + �� + (BF�IBF/IKF + BR�IBR/IKR)�����}
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Gummel PoonBase ResistanceIf IRB = 0, RBB = RBM+(RB-RBM)/QB
If IRB > 0RB = RBM + 3(RB-RBM)�(tan(z)-z)/(ztan2(z))
[�+���iB/(��IRB)]1/2-�(��/��)(iB/IRB)1/2
z =
Regarding (i) RBB and (x) RTh on slide 22,RBB = Rbmin + Rbmax/(1 + iB/IRB)�RB