Eclipse Product Reliability MTBF Information ETSI

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OCTOBER 2011

ECLIPSE/ECLIPSE PACKET NODE RELIABILITY ETSI

EXECUTIVE SUMMARY This Product Reliability Report presents mean time between failure (MTBF) data prepared in accordance with Telcordia TR-322, Issue 6, December 1997.

2 AVIAT NETWORKS OCTOBER 2011

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ECLIPSE/ECLIPSE PACKET NODE RELIABILITY (ETSI)

TABLE OF CONTENTS

EXECUTIVE SUMMARY .......................................................................................................................... 1

REFERENCE DOCUMENTS ................................................................................................................... 3

SOURCE DATA AND ASSUMPTIONS .................................................................................................... 3

ECLIPSE RELIABILITY DEFINITIONS .................................................................................................... 3

CALCULATED MTBF ................................................................................................................................................ 3

ANTICIPATED MINIMUM FIELD MTBF ................................................................................................................... 3

ECLIPSE MTBF VALUES ......................................................................................................................... 4

INU MODULES .......................................................................................................................................................... 4

INDOOR UNITS ......................................................................................................................................................... 5

OUTDOOR UNITS ..................................................................................................................................................... 5

TERMINAL RELIABILITY .......................................................................................................................... 5

NODE RELIABILITY .................................................................................................................................. 6

INU/INUE-BASED TERMINAL RELIABILITY ........................................................................................................... 6

LINK RELIABILITY ..................................................................................................................................................... 7


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REFERENCE DOCUMENTS 1. Product Reliability Methodology, Aviat Networks

2. Guidelines for Calculation of Product MTBF and Reliability, Aviat Networks, IRD-DES013

3. TelCordia (Bellcore) Reliability Prediction Procedure for Electronic Equipment, TR-332, Issue 6, Dec 1997 and/or SR-332 May 2001

4. Non-electronic Parts Reliability Data 1995, Reliability Analysis Center (RAC), NPRD-95

SOURCE DATA AND ASSUMPTIONS The part failure rates used in this prediction are from TR-332, and NPRD-95 RAC Non –electronics Parts Reliability Data.

This reliability prediction is based on the high quality commercial parts used in the Eclipse product. The mechanical and electromechanical components were from NPRD-95 RAC Non-electronic Parts Reliability data. The environment was assumed to be Ground Benign (40°C) for the INU and Ground Fixed (50°C) for the ODU.

ECLIPSE RELIABILITY DEFINITIONS Reliability information is presented in the form of MTBF values for the Eclipse field replaceable units, including indoor equipment and modules, and complete ODU assemblies.

All reliability information is based upon an ambient external temperature of 25°C. Where average annual temperature of operation is consistently above this temperature the reliability may be less than that indicated. Several MTBF values are presented:

CALCULATED MTBF Calculated or predicted MTBF is determined according to Bellcore methods (see Source Data and Assumptions, above).

ANTICIPATED MINIMUM FIELD MTBF Anticipated minimum field MTBF is the MTBF value that will be based upon measured field returns for installed equipment. The anticipated field MTBF is determined by taking a 3x multiple of the predicted values.

Aviat Networks compiles statistics for field returns and actual measured MTBF on a global basis. This information can be supplied upon request.


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ECLIPSE MTBF VALUES

INU MODULES

Assembly Calculated MTBF, Years

Anticipated Minimum Field MTBF, Years

Indoor Chassis, IDC 310 930

Indoor Chassis Extended, IDCe 201 603

Network Controller Card 54 162

FAN Card (1RU) 943 2829

FAN Card (2RU) 427 1281

Node Protection Card (NPC) 79 237

AUX Card (AUX) 136 408

Radio Access Card (RAC30) 104 312

Radio Access Card (RAC30a) 104 312

Radio Access Card (RAC3X) 99 297

Radio Access Card (RAC40) 98 294



Data Access Card (4x) 299 897

Data Access Card (16x) 204 612

Data Access Card (3xE3) 370 1110

Data Access Card (1x155o) 109 218

Data Access Card (2x155o) 67 134

Data Access Card (2x155e) 235 705

Data Access Card (1x155oM) 110 330

Data Access Card (ES) 358 1,074

Data Access Card (GE) 198 594

Data Access Card (GE3) 144 432

Network Convergence Module (NCM) 123 369


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INDOOR UNITS



IDUsp 4x 63 189 IDUsp 16x 56 168 IDU 20x (v2) 42 126 IDUspe 44 189 IDU ES 33 99 IDU 155o 30 90 IDU GE 20x 24 72 IDU GE3 16x 24 72

OUTDOOR UNITS

Assembly Calculated MTBF, Years Anticipated Minimum Field MTBF, Years

ODU spe (Edge) 21.9 65.7 ODU 300 sp 16.6 49.8 ODU 300 hp 16.4 49.2 ODU 300 ep 15.6 46.8 ODU 600 15.7 47.1

TERMINAL RELIABILITY Eclipse terminal reliability is shown in the following table for non-protected configurations for example purposes.

Assembly Calculated MTBF, Years Anticipated Minimum Field MTBF, Years

IDU spe + ODU spe 15 45 IDUsp 4x + ODU300sp 13.1 39.4 IDUsp 16x + ODU300sp 12.8 38.4 IDU 20x + ODU300hp 11.6 34.8 IDU ES + ODU300hp 11.0 33.0 IDU GE 20x + ODU300hp 9.7 29.0 IDU 155o + ODU300hp 10.6 31.8


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NODE RELIABILITY Eclipse provides a new node-based architecture that supports a variety of simple and complex site architectures in a single INU or INUe. The resulting nodal reliability is improved over other systems that comprise of an IDU for each radio path. The actual MTBF of a node is dependent on the arrangement chosen.

INU/INUE-BASED TERMINAL RELIABILITY The Eclipse INU and Extended INU (INUe) both support a modular architecture that can be populated with a variety of system and interface modules, which can be arranged in a non-protected or protected configuration (depending on the module).

All modules are treated in series for purposes of MTBF/MTBO calculations, as shown in Figure 1 example for a non-protected system equipped with both a Gigabit and NxDS1 tributary cards. Note that the second fan is equipped for the INUe only.

Figure 3. INU/INUe 1+0 Terminal Reliability Model

Here the overall terminal MTBF is an addition of the component modules of the INU and the ODU:

MTBF = 1/((1/MTBFIDC)+ (1/MTBFNCC)+ (1/MTBFFAN)+ (1/MTBFFAN)+ (1/MTBFDAC GE)+

(1/MTBFDAC16x)+ (1/MTBFRAC)+ (1/MTBFODU))

Eclipse INU terminal reliability is shown in the following table for non-protected configurations for example purposes.



IDC+NCC+FAN+RAC30+DAC16x+ ODU300hp 10 30

IDC+NCC+FAN+RAC30+DACGE+ ODU300hp

10 30

IDC+NCC+FAN+RAC30+DAC16x+ DACGE+ODU300hp 10 30


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Eclipse INU terminal reliability can be improved by using the optional NPC to duplicate the NCC functions.

LINK RELIABILITY Link reliability is simply obtained by halving the terminal MTBF data provided above.

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Eclipse Product Reliability MTBF Information ETSI

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