Diffusion, Osmosis, Active Transport Diffusion Facilitated Diffusion
ECE594I Notes set 8: Diffusion Noise - University of California
Transcript of ECE594I Notes set 8: Diffusion Noise - University of California
ECE594I notes, M. Rodwell, copyrighted
ECE594I Notes set 8:Diffusion Noise
Mark RodwellUniversity of California, Santa Barbara y
[email protected] 805-893-3244, 805-893-3262 fax
ECE594I notes, M. Rodwell, copyrighted
References and Citations:
DevicesState-Solid in Noise :Zielder Van PhysicsThermal : Kroemerand Kittel
:Citations / Sources
ng.EngineeriionsCommunicatofsPrinciple:Jacobs&Wozencraftory)(introduct s PrincipleSignal RandomVariables, Randomty, Probabili: PeeblesZ. Peyton
ive)comprehens(hard, Variables Randomandity Probabil:Papoulis
1982circaStanfordHellmanMartin:noteslectureyProbabilit1982circa Stanford, Cover, Thomas :notes lecture theory nInformatio
Designc ElectroniNoise Low :erMotchenbakng.EngineeriionsCommunicatofs Principle:Jacobs & Wozencraft
t dffS t d
circuits. in Noise :Notes nsApplicatio tor LinearSemiconduc National1982circa Stanford,Hellman, Martin:notes lecturey Probabilit
design)receiver (optical Personik & Smith noise), (device by Fukui Papers Kroemer and Kittel Peebles,Jacobs, & Wozencraft Ziel,der Van
study.for references Suggested
Theory nInformatio of Elements:Williams andCover )(!Notes App. Semi. National
ECE594I notes, M. Rodwell, copyrighted
Diffusion Noise: After van der Ziel
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noise. diffusioncreate diffusion withassociated nsfluctuatio theand diffusion, from arise currents Average
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assumed is noiseShot .satisfyingfully not but short is Ziel,der vanfrom taken,derivation The
s.adjustmentfew a makewillweinstead, ;rigorouslylimitation thisaddress to)background theI(nor
ECE594I notes, M. Rodwell, copyrighted
Diffusion Noise: After van der Ziel
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→+
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11
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ECE594I notes, M. Rodwell, copyrighted
Diffusion Noise: After van der Ziel:fluxNet
[ ]
),,1(),,(
2
11
zyxxnazyxx
xna
zyxmlknmlknawww kkkk
ΔΔ⋅Δ⋅∂∂⋅−=ΔΔΔ⋅⎥⎦
⎤⎢⎣⎡ Δ⋅∂∂
⋅−=
ΔΔΔ⋅+−⋅=−= →++→
( )
.),,1( and ),,(
so , so ,iprelationsh diffusion thehave also But we
11
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xzymlknDw
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ΔΔΔ
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⋅⋅=
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→++→
:densities spectral noiseflux calculatenow can we,2~ From 11 wS
xx
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zymlknDSx
zymlknDS nkknkk
ΔΔ
⋅ΔΔΔ
⋅+⋅=⋅ΔΔΔ
⋅⋅= →++→ γγ
henceiscurrentdiffusionnettheFinally
)(4~ thereforeisflux net theofdensity spectal noise The
qwI
xzyxnDS nww
=
⋅ΔΔΔ
⋅⋅= γ
hence,iscurrent diffusionnet theFinally, qwI =
γμγ ⋅ΔΔΔ
⋅⋅=⋅ΔΔΔ
⋅⋅=x
zyxnqkTx
zyxnDqS nnII )(4)(4~ 2
ECE594I notes, M. Rodwell, copyrighted
Diffusion Noise: After van der Ziel
carriersminorityormajoritywithworkingareewhether wstatednothaveWe
zyx
xnqR
ΔΔΔ
⋅=Δ ,)(
1 thenis boxesadjacent between resistance The carriers.majority now Consider
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μ
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zyxnq
nII
n
Δ=⋅ΔΔΔ
⋅⋅=
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4)(4~ thereforeisdensity spectal noise theand
)(
γγμ
μ
xn
⎤⎡
Δ
that derivation noise lour therma fromknow But we
hfhf
RkT
kThfhfhf
RS
kThf
kThfII nn
⎯⎯ →⎯⎥⎤
⎢⎡
+⋅=
⎯⎯ →⎯⎥⎦
⎤⎢⎣
⎡−
+=
<<
<<
11factorcorrectionourfoundhavewehence
,41)/exp(2
*4~
γkThfkT
→⎥⎦
⎢⎣ −
+=
:found thusis termnoise diffusion The
.11)/exp(2
factor,correctionour found have wehence γ
xzyxnqkT
kThfhfhf
xzyxnqS n
kThfnII Δ
ΔΔ⋅⋅⎯⎯ →⎯⎥
⎦
⎤⎢⎣
⎡−
+⋅ΔΔΔ
⋅= << )(41)/exp(2
)(4~ μμ
ECE594I notes, M. Rodwell, copyrighted
Noise of a PN junction
junction.a PNinnoise)(diffusion"noiseshot"computeNow
regionsneutralquasitheinlevelFermiquasitheindropsproducesthusvoltageappliedTheregion. depletion theacross mequilibriu-near in carriers withon,approxmatiShockley theRecall
junction.a PN innoise)(diffusion noiseshot computeNow
idd l tit thit tii itthdib dthfDi tl
layer. depletion theacross drops negligible withregionsneutral-quasitheinlevel Fermi-quasitheindropsproduces thus voltageapplied The
( )m.equilibriu in ionconcentratcarrier minority theis where
,/exp)0(isedgedepletionat theionconcentratcarrier minority thediagram, band thefromDirectly
po
fpop
nkTqVnxn ==
ECE594I notes, M. Rodwell, copyrighted
Noise of a PN junction
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∂∂⋅−−=
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. lifetime ionrecombinat the andarea junction theis R
R
AxqAt
ττ ∂∂
equationsdiffusionthesetotermsnoise addnow must We
ECE594I notes, M. Rodwell, copyrighted
Generation / Recombination Noise
./current current generation a thermal also is There./current ionrecombinat electron an is there, a volume In
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RR
Δ⋅⋅=Δ⋅⋅=ΔΔΔ=Δ
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g
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q
RRpoRGGR
RpoG
Δ⋅⋅−=Δ⋅−⋅−=−= ττ
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22 ( ) ( )
area, junction theis that Noting
./2'2/222 22
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ΔΔ=
Δ⋅+⋅=Δ⋅+⋅=+= ττ
. 2'
2~ 2 xAnn
qSR
poRII GRGR
Δ⋅⋅⎥⎦
⎤⎢⎣
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τ
ECE594I notes, M. Rodwell, copyrighted
Diffusion Noise in a PN junction
)(4)(4)(4~ is noise diffusion that thefoundearlier had We
22 ADzyDzykTS ΔΔΔΔ
current diffusion in nsfluctuatio model could we, that Given
)(4)(4)(4
diffusion
22
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xxnDq
xyxnDq
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ΔΔ⋅=
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( )
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ion.recombinat and diffusion coupledrepresent circuit to equivalent an drawn have weonce clarified be willonsubstituti hoc-adsomewhat This
ECE594I notes, M. Rodwell, copyrighted
Noise of a PN junction
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in n Δ+=∂∂
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2'2~and4~
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2 xAnn
qSxnS po Δ⎥⎤
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=Δ= .2 and xAqSxAD
SR
pRII
nnn GRGR
Δ⋅⋅⎥⎦
⎢⎣
=Δ⋅=τ
ECE594I notes, M. Rodwell, copyrighted
PN junction: Equivalent Circuit of Diffusion & its Noise
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Δ⋅⋅⎥⎦
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ECE594I notes, M. Rodwell, copyrighted
PN junction: Equivalent Circuit of Diffusion & its Noise
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R
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jDqACjG
τωτωγ
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ECE594I notes, M. Rodwell, copyrighted
PN junction: Equivalent Circuit of Diffusion & its Noise
:esequivalencwithaboveasistionrepresentaintuitive/usefulmoreA
( )circuit equivalent
/'quantity physical
:esequivalenc withabove,as istionrepresentaintuitive / useful more A1
nnnpo
CgRIVxqAxqAqADxInnn
⎭⎬⎫
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sideright on 2/ roughcurrent th ionrecombinat-generation of noiseshot sideleft on 2/ roughcurrent th ionrecombinat-generation of noiseshot
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xAnnqqSxAnnq
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density spectral withnoise diffusion is diffdiff IIdiff SI
ECE594I notes, M. Rodwell, copyrighted
PN junction: Equivalent Circuit of Diffusion & its Noise
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−
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ECE594I notes, M. Rodwell, copyrighted
PN junction: Equivalent Circuit of Diffusion & its Noise
nxqAnxqA )2/()2/(
are (currents) fluxes thecurrents,r -g For the
⎫⋅Δ⋅⋅Δ⋅
n
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n
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xxx
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nxqAInxqAI
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22
2
11
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⎩⎨⎧
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poRG
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nn
nnxqAII
nnxqAII
ττ)()2/(
and )()2/(
thereforeiscurrent ionrecombinat-generationnet The
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111
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n
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xAnnqq
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grgr
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22)(
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Δ⋅⋅+⋅=
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ECE594I notes, M. Rodwell, copyrighted
Impedance and Noise Analysis of Short-base Diode
( )fpo kTqVnn −= 1)/exp()0(' :edge depletionAt
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ECE594I notes, M. Rodwell, copyrighted
Impedance and Noise Analysis of Short-base Diode
element; finite singlea as region model small Assume WxpW bb =Δ−→
22
22
2221
2'
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WqADqAWfj
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b
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⎤⎡
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qIW
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ECE594I notes, M. Rodwell, copyrighted
Impedance and Noise Analysis of Short-base Diode
:ttensimply wri more be can admittance diode theSo,22 IWIWI ⎤⎡
e.capacitanc diffusion and resistance junction withmodel diodefamiliar theis This
22
22
2122
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n
bDC
n
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kTqI
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⎦
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.derivation the togenerators noise theaddnow must We
ECE594I notes, M. Rodwell, copyrighted
Impedance and Noise Analysis of Short-base Diode
( )circuitequivalent
/'quantity physical 1nnnpo
CgRIVxqAxqAqADxInnn
⎭⎬⎫
⎩⎨⎧ Δ⋅Δ⋅⋅Δ−= − τ
)2''(2~
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2~ and 2
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circuitequivalent
21
2
212211
pon
II
n
poII
n
poII
nnnxADqS
xAnnqqSxAnnq
qS
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diffdiff
grgrgrgr
++⋅Δ
=
Δ⋅+=
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diagram. oncircuit -short0density carrier minority the2,point At 2 →=n
1.point at circuit -short AC an as drepresente is This.0)0(' hence ,0 Therefore . bias applied
fixeda withcurrent)(noisecurrent diodeinnsfluctuatio theanalyze Now we
, == nVV fDCf δδ
ECE594I notes, M. Rodwell, copyrighted
Impedance and Noise Analysis of Short-base Diode
( )circuitequivalent
/'quantity physical 1nnnpo
CgRIVxqAxqAqADxInnn
⎭⎬⎫
⎩⎨⎧ Δ⋅Δ⋅⋅Δ−= − τ
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circuitequivalent
21
2
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pon
II
n
poII
n
poII
nnnxADqS
xAnnqqSxAnnq
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)2'(2~~~
:current noisecircuit -Short
21
21
2
11nnn
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IIIIII diffdiffgrgrnoisenoise++⋅+
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22
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:hence bias, forward strong in ' and 0' But,2
1
21
2
12
nWADqWAnqS
nnnW
nbII
po
bn
ii⋅+
⋅=
>>=τ
so , 2
simply iscurrent DCBut the
2
11
1
nW
qADWAqnI
W
b
nb
nDC
bnII noisenoise
⋅+⋅
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DCII IqSnoisenoise
⋅= 2~
ECE594I notes, M. Rodwell, copyrighted
Noise Model of Short-Base Diode
/:found have We
IkT
2~2/ where/
/2
DCII
nbdiffjdiffdiff
DCj
IqS
DWrC
qIkTr
noisenoise⋅=
==
=
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biasforwardstrongofcaseforpeformedwasAnalysis(b). largefor derive to)! hard(but leducationa bemight It (a) b
DCII
W
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pointmootaisItdiffusionermalcarrier thminorityfromandtion/recombinageneration both from arising noise theis that Note
bias.forwardstrongofcasefor peformed wasAnalysis (b)
nI
noise. or thermal noise,shot noise, diffusion thiscall whether topointmoot a isIt diffusion.ermalcarrier th-minority from and
ECE594I notes, M. Rodwell, copyrighted
Impedance and Noise Analysis of *Long*-base Diode
( )
)2''(2~
2)2'(
2~ and 2
)2'(2~
circuit equivalent/'quantity physical
21
2
21
1
2211
pon
II
n
poII
n
poII
nnnpo
nnnxADqS
xAnnqqSxAnnq
qS
CgRIVxqAxqAqADxInnn
diffdiff
grgrgrgr
++⋅Δ
=
Δ⋅+=
Δ⋅+=
⎭⎬⎫
⎩⎨⎧ Δ⋅Δ⋅⋅Δ−= −
ττ
τ
xΔ
equations. aldifferenti diffusion thesolvemust oneor elements,finite of #larger a useeither must one thenlonger, is region diffusion theIf
fjgfjjBfjgfjY frequency. with varies)2( where),2()2()2( :finds Helong. is analysis his solves; Zielder van
+= ππππ
DCDCdcII qIfjkTggfjgkTIIqSnoisenoise
2)2(4))2((4)2(2~0 −=−++= ππ