Download SERESSA 2014 Program

10th International School on the Effects of Radiation on Embedded Systems for Space Applications

December 9 to 12, 2014, Bariloche

This four-day school SERESSA - International School on the Effects of Radiation on Embedded Systems for

Space Applications - combines academic, government, and industrial communities working in the area of

radiation effects on embedded systems. Radiation effects are a significant concern for space and avionics

systems, as well as for critical applications operating at ground level (automotive, medical, and banking).

Lecturers with significant experience in key selected subjects will provide complete state-of-the-art instruction

in this strategic field. The school is based on lectures, exercises, and practical courses involving real case

studies using the common tools of the domain. The topics cover the full spectrum of radiation effects on space

embedded systems: space environment, error mechanisms, testing, hardening by design, rate prediction. The

intended audience includes both beginning and experienced researchers, engineers, and post-graduate

students wishing to enhance their knowledge base in this rapidly evolving field. Topics covered by SERESSA

include: radiation environment, spacecraft anomalies, single-event effects (SEE), total dose effects (TID),

radiation effects in power systems, radiation effects in solar cells, architecture hardening in analog, and digital

circuits and in memories, software hardening, SEE and TID effects in FPGAs, hardness assurance methodology,

rate prediction, radiation testing, laser testing and remote testing experiments.

SERESSA 2014 Committees

General Chairs Raoul Velazco, TIMA, France

Pascal Fouillat, IMS, France

Local Organization Chairman Jose Lipovetzky, CONICET - CAB/CNEA, Argentina

Program Chairs Fernanda Lima Kanstermidt, UFRGS, Brasil

Pablo Alejandro Ferreyra, UNC (FCEFyN), Argentina

Publicity Chair Juan Fraire, UNC (FCEFyN), Argentina

LA IEEE Liaison Chair Cristian Rodriguez Rivero, UNC (FCEFyN), Argentina

Financial Chair Nicolás Tomatis, UNC (FCEFyN), Argentina

Poster Session Chair Mariano García Inza, (FI-UBA), Argentina

Local Organization Committee Laura Curuchet, Horacio Arnaldi, Miguel Sofo Haro (CAB), Argentina

Pablo Tognetti, Maria Florencia Masoero, Eduardo Rodriguez Lubary (INVAP), Argentina

Daniel Sanguinetti (SECTDP), Río Negro, Argentina

Day 1: Tuesday 9th Venue: INVAP

08:45 - Departure from Edelweiss Hotel in bus

09:00 - Registration

09:30 - Opening Remarks

P. Fouillat (IMS, France) & R. Velazco (TIMA, France)

09:40 - Opening Local Chair and Technical Program Overview

Jose Lipovetzky (CONICET, Argentina)

Fernanda Lima Kastensmidt (UFRGS, Brazil) & Pablo Ferreyra (UNC, Argentina)

09:50 - Coffee-Break and Registration

10:00 - Space Radiation Environments

Marcelo Famá (CEATSA, Argentina)

11:30 - Coffee- Break

12:00 - Single Event Effects (SEE): Mechanisms and Classifications

Steve Buchner (NRL, USA)

13:30 - Visit to facilities of CEATSA and INVAP

14:00 - Lunch

15:00 - Single Event Effects Test Methods

Konstantin Tapero (RISI, Russia)


17:00 - Laser Testing Laser Simulation Test Possibilities and Facilities

P. Fouillat (IMS, France) & Dale McMorrow (NRL, USA)

18:30 –End of 1st Day Activities

Day 2: Wednesday 10th

Venue: INVAP


09:00 - SEE and TID Effects and Mitigation Techniques for FPGAs

Fernanda Kastensmidt (UFRGS, Brazil)


10:45 - SEE Hardness Assurance

Steve Buchner (NRL, USA)

12:15 - Coffee-Break

12:30 - Total Dose and Dose Rate Effects in Microelectronics: Pushing the

Limits to Extreme Conditions

Philippe Adell (JPL, USA), presenter: José Lipovetzky (CAB, Argentina)

13:30 - Visit to facilities of CEATSA and INVAP

14:00 – Lunch

15:00 - COTS in Space: Constraints, Limitations and Disruptive Capability

Michel Pignol (CNES, France)


17:00 - SEEs using Micro Beams Facilities

Mario Debray (CNEA, Argentina)

17:45 -Panel: South America Test Facilities and Projects

Marcelo Fama (CEATSA, Argentina) Marcilei Guazzelli da Silveira, (FEI, Brazil) Nilberto H. Medina (UFSP, Brazil)

José Lipovetzky (CAB, CNEA) Pablo Ferreyra and Juan Fraire (STI) Leonardo de Ferrariis (CONAE) TBC

18:30 –End of 2nd Day Activities

Day 3: Thursday 11th

Venue: Balseiro Institute – Bariloche Atomic Center


09:00 - Registration

09:15 – EMI and TID Combined Effects

Fabian Vargas (PUCRS, Brazil)


10:15 - System Hardening and Real Applications

Michel Pignol (CNES, France)


12:00 - New Developments in FPGA: SEUs and Fail-Safe Strategies from the

NASA Goddard Perspective

Melanie Berg (NASA, USA)

13:30 - Lunch

14:30 - Non-volatile Memories and Their Space Application

Alessandro Paccagnella (University of Padova, Italy)

16:00 - Coffee-Break and Poster Session

M. García Inza (UBA, Argentina)

16:30 - COTS-based systems in the radiation environment of the LHC:

Radiation Harness Assurance for Power Converter Controls

Slawosz Uznanski (CERN, Switzerland)

17:30 – Radiations Effects on Solar Panels

Martin Alurralde (CNEA, Argentina)

18:30 –End of 3rd Day Activities

Gala Dinner

Day 4: Friday 12th

Venue: Balseiro Institute – Bariloche Atomic Center


09:00 - Fault Injection Methodologies: Theoretical Aspects

-Ongil (University Carlos III, Spain)


10:45 - Fault Injection Methodologies: Practical Aspects

-


12:30 - Error-rate Prediction for Programmable Circuits: Methodology, Tools

and Studied Cases

Raoul Velazco (TIMA, France)

13:30 - Lunch

14:30 - Fault injection at Device Level and Practical Simulations

Ricardo Reis (UFRGS, Brazil)

16:00 - Coffee-Break and Poster Session

M. García Inza (UBA, Argentina)

16:30 – MOS Dosimetry

Adrián Faigon (UBA, Argentina) TBC

17:30 - Concluding Remarks

Raoul Velazco (TIMA, France)

18:30 –End of SERESSA Activities

Short Bios:

Pascal Fouillat: Pascal Fouillat was born in 1956. He received the M.S degree in Electronics from the

Ecole Normale Supérieure de Cachan, France, in 1980, and the PhD degree from the University of Bordeaux, in

1990. He joined the University of Bordeaux in 1990 as an assistant professor. Since 1999, he has been a full

professor at the Institut Polytechnique de Bordeaux, at the Electrical Engineering Department. From 1998 to

2006, he has been the head of the Design and Test Group, at the Microelectronics Laboratory at the University

of Bordeaux. During this period, he created a joint laboratory with STMicroelectronics, working in the design

and implementation of integrated wireless systems. In 2007, he founded the IMS Laboratory, a research unit of

the French National Center for Scientific Research (CNRS), with 400 employees mainly working in the

integration of electronic systems. From 2007 to 2012, he has been the director of the IMS Laboratory. In April

2012, he joined the French Ministry of Research in Paris where he is actually heading the department of

Mathematics, Physics, Nanothechnologies and Information Technologies, and in charge of elaborating the

French National Research Strategy in that field. He is co-author of more than 150 international publications

and 4 patents, and he has managed 20 PhD theses. His research interests are in Space Electronics, Analog IC

Design and Optical Techniques for Non-Destructive Diagnosis of ICs. His main contribution concerns the

elaboration of contactless testing techniques using a laser beam to evaluate the reliability of electronic devices

working in severe environments.

Raoul Velazco: Raoul VELAZCO was born in Montevideo, Uruguay in 1952. Living in France since 1976, he

got there the PhD and the Doctor ès Sciences in Computer Sciences in 1982 and 1990 respectively, both from

INPG (Institut National Polytechnique de Grenoble). With the CNRS (French Research Agency) since 1984,

where he is Director of Researches, he is presently a co-leader of the ARIS (Architectures Robustes de circuits

èm I é é TI T q d ’I m q d é q

’ ure de systèmes intégrés) laboratory (Grenoble). His research activities focus with the study of

radiation effects on microelectronic circuits, the design hardening techniques and the development and

exploitation of experiments devoted to operate on board satellites. Raoul VELAZCO is author or co-author of

more than 220 scientific publications, 46 among them at IEEE Transactions on Nuclear Sciences (IEEE TNS) and

of a patent, which was transferred to the industry, about a new memory cell (the so-called HIT cells) robust

with respect to the transient effects of radiation. He has been the chairman of conferences and workshops

internationally recognized in the domain of the effect or radiation in microelectronic circuits. Among the most

representatives can be mentioned RADECS (Radiations and its Effects on Circuits and Systems) held in

Grenoble in September 2001, DFTS (International Symposium on Defect and Fault Tolerance of Systems), held

in Cannes, October 2003 and SEE (Single Event Effects Symposium) held in San Diego (USA) in April 2009. He is

general the founder and co-chair of SERESSA (international School of Effects if Radiations on Embedded

Systems for Space Applications), first edition held in Manaos (Brazil) in November 2005. The 10th edition of

SERESSA will be held December 2014 in Bariloche (Argentina).

d m d m m d

associate professor at Universidade Federal do Rio Grande do Sul (UFRGS). She got the bachelor's at Electric

Engineer from Universidade Federal do Rio Grande do Sul (1997), master's at Computer Science from

Universidade Federal do Rio Grande do Sul (1999) and Ph.D. at Computer Science from Universidade Federal

do Rio Grande do Sul (2003). She has done internship in Tima Laboratory in INPG, Grenoble, France and in

Xilinx Company, San Jose, USA. She has experience in Computer Science, focusing on Hardware, acting on the

following subjects: radiation effects in integrated circuits, mitigation techniques, reconfigurable architectures

such as FPGAs and embedded processors. She is co-author of more than 100 papers published in well know

Journals and Conferences and more than 3 books.

Marcelo Famá: Marcelo Famá obtained his PhD in Physics at the Balseiro Institute in Bariloche,

Argentina. He started his career with INVAP working on radiation effects on electronic devices for the

Argentine Scientific Missions SAC-B and SAC-C, including the irradiation of testing devices using 25 MeV

electrons, 10 MeV protons, and gamma rays. After finishing his experimental PhD in Atomic Collisions

(stopping power and multiple scattering), he joined the Laboratory for Atomic and Surface Physics at the

University of Virginia in US, where for many years he did research on radiation effects on space surface analogs

(condensed gases, minerals). He has been member of the Cassini Plasma Mass Spectrometer (CAPS) onboard

of the Cassini mission to Saturn, and also he is still member of the science team for the Strofio Instrument, a

mass spectrometer that is part of the BepiColombo/Mercury Planetary Orbiter spacecraft. He has published

over 30 papers in peer-reviewed journals and two chapters in books of astrophysics and space science.

Presently he is the General Manager (CEO) at the Argentine Space Environmental Testing Facility (CEATSA) in

Bariloche.

Stephen Buchner: Stephen Buchner received his undergraduate degree at Princeton University and his

graduate degree at the University of Pennsylvania, both in physics. He started his career with Lockheed Martin

working in the field of infrared detectors. More recently, he has worked at both the U.S. Naval Research

Laboratory and NASA where he has focused his efforts in the field of radiation effects and has published more

than 150 papers in peer-reviewed journals. He has been an associate editor for the IEEE Transactions on

Nuclear Science and has been short course presenter and session chairman at several Nuclear and Space

Radiation Effects Conferences and RADECS conferences. In his present capacity he investigates the

mechanisms responsible for radiation effects and advises space programs on space radiation issues. He has

been associated with SERESSA for the past seven years.

Konstantin Tapero: Konstantin Tapero graduated from National University of Science and Technology

“ I I ” m w I d lloys – Technological University) in 1993 in microelectronics

and semiconductor devices, PhD in physics of semiconductors and dielectrics in 1997. Currently he is a

scientific affairs advisor of Research Institute of Scientific Instruments (RISI), Lytkarino, Moscow region, Russia.

Also he is an associate professor of the Department of semiconductor electronics and physics of

m d N d T “ I I ” w R . H d

scientific interest is radiation effects in materials, semiconductor devices and integrated circuits; radiation

hardness assurance and reliability of semiconductor devices, integrated circuits and electronic equipment. He

has more than 20- ’ x d. H w d R m ’ d

ionizing dose testing, displacement damage dose testing and single event effects testing of electronic

components intended for space. He is a member of IEEE Nuclear and Plasma Science Society, IEEE Electron

Devices Society, ISROS (International Society on Reliability of Optoelectronics for Systems). In 2013 he was

elected to RADECS Council Board.

Dale McMorrow: Dale McMorrow received the Ph.D. degree in Physical Chemistry from The Florida

State University, Tallahassee, FL under the direction of Dr. Michael Kasha. His graduate studies focused on the

role of intermolecular structure and dynamics in shaping the excitation and relaxation processes of molecular

species. After a postdoctoral fellowship at the University of Toronto he joined the technical staff at the Naval

Research Laboratory, and presently is head of the Radiation Effects Section. His current research interests

include the development, characterization, and application of linear- and nonlinear-optical techniques for

simulating single-event phenomena in microelectronic devices and complex integrated circuits.

Michel Pignol: Michel Pignol was born in Clermont-Ferrand, France, in January 1960. He received an

Engineering degree in Electronics from Polytech'Clermont-Ferrand, France, in 1983 and a Ph.D. in Electronics

from the Blaise Pascal University of Clermont-Ferrand, France, in 1986. He worked for SAGEM, Eragny, France,

where he was in charge of military and space embedded computers for 5 years. He has been working for CNES,

the French Space Agency, since 1990 where he has been in charge of R&D studies and program developments

on on-board data computers and high speed links. He is author of several corporate patents concerning fault-

tolerant architectures well suited to space applications, memory protections and very high speed data links. He

is involved in standardisation working groups, Program Committees for international conferences / journals,

and international schools.

Alessandro Paccagnella: Alessandro Paccagnella is Full Professor of Electronics and Director of the

Department of Information Engineering at the University of Padova. A. P. is author of more than 400 scientific

papers, and about 300 of them have been published on international journals. In the past, his research activity

has been directed to the study of different aspects of physics, technology, and reliability of semiconductor

devices. In relation with this activity he spent some research periods at the University of California, San Diego,

and at the IBM T.J. Watson Research Center, Yorktown Heights, New York. At present, he coordinates the

research activity of a group at the Department of Information Engineering, University of Padova, working on

CMOS devices and technology. His research work is focused on the study of ultra-thin gate dielectrics in MOS

devices and on the Total Ionizing Dose and Single Event Effect damage induced by ionizing radiation on single

devices and integrated circuits, with emphasis on non-volatile memories and programmable logic devices. He

has co-authored works, which received Awards at various conferences. In the field of ionizing radiation effects

on electronics components, A.P. has been co-organizer and chair of the scientific committee for RADECS2002,

Padova, September 2002, the most important European conference in this domain. In the past years, A.P. has

been organizer and chair of several sessions at RADECS and NSREC, the largest and most important

international meeting on the subject. He has been a short course instructor and organizer at NSREC and

RADECS conferences. He is a member of the Steering Committee of the RADECS association and has previously

been a co-spokeperson for the RD-49 experiment at CERN, Geneve, on electronics for the LHC environment.

He has been member of the Characterization, Reliability, and Yield subcommittee of the 2008 and 2009 IEDM

and member of the ISROS, RADSOL and WODIM scientific committees, and of the RADECS association. He has

animated the research activity in the area of ionizing radiation effects in Italy, contributing to the birth of the

first accelerated ion line to test electronic components at the Tandem accelerator at the Legnaro National

Laboratories-INFN and University of Padova, and to the organization of the biennial Italian School on Effects of

Ionizing Radiation for PhD students and young researchers.

Martín Alurralde: Martín studied at the Balseiro Institute, where he got his Master and Ph.D in physics

degrees. He works as researcher of the Physics department at CNEA where he is the team leader of the

radiation damage facility (EDRA) at Tandar. His field of work is radiation damage in materials and electronic

devices. He was responsible for radiation damage qualification of solar cells for SAC-D Aquarius and SAOCOM

missions. His prior experience includes surface science, nuclear techniques analysis and materials modeling

techniques applied to radiation damage for fusion reactors. He has worked at Paul Scherrer Institut, from 1989

to 1992, and École Polytechnique Fédérale de Lausanne, from 1998 to 2000, both in Switzerland. He has

coauthored more than 70 articles in journals and conferences.

Philippe Adell: Dr. Philippe Adell started working at the NASA-Jet Propulsion Laboratory, in Feb. 2007

after completing his MS (2003) and PhD (2006) in Electrical Engineering at Vanderbilt University. Prior moving

to the US, he had radiation effects research experience with Alcatel Space and the French space agency

(CNES). He also graduated from the polytechnic institute of the University of Montpellier (France), with a MS

(1999) in material science and technologies. At NASA-JPL, he has provided his mission assurance expertise to

several JPL flight projects (Juno, MSL and Europa) and led many R&D programs about the development of

miniaturized rad-had electronics for space applications. Recently, he has been appointed by Charles Elachi, JPL

director, to be the JPL liaison for future international collaboration on interplanetary CubeSats with CNES and

the Van Allen Foundation. Philippe has more than 50 international publications in the field of radiation effects

in micro-electronics and systems. He has served as session chair and short course instructor in previous NSREC

and RADECS editions.

Melanie Berg: Ms. Berg began her career in 1988 as an ASIC designer working for various companies

such as IBM and STMicro Electronics. During this time, she was part of an engineering group that further

developed and documented the synchronous design methodology as is implemented today. Ms. Berg later

switched to FPGA design for space applications. She has been a part of development teams for a variety of

space crafts and instruments targeted for deep space. Melanie Berg is currently with the NASA Goddard

Radiation Effects and Analysis Group. Her responsibilities include researching the susceptibility of FPGA and

ASIC devices to radiation effects, developing and analyzing mitigation strategies, establishing FPGA test

methodology, and performing design reviews for a variety of NASA sponsored FPGA and ASIC designs.

Slawosz Uznanski: Slawosz Uznanski is a radiation effects engineer and a project leader for the new

radiation tolerant power converter control electronics for the Large Hadron Collider (LHC) at the

EuropeanOrganization for Nuclear Research (CERN). He received his M.Sc. from the Technical University of

Lodz, Poland in 2008 (with honors) and Ph.D. from the University of Aix-Marseille, France in 2011. His prior

experience includes Radiation Effects Engineer at STMicroelectronics (2008-2011) focusing on radiation-

hardening by design of digital CMOS technologies (65-28nm) for space and high reliability terrestrial

applications and R&D Engineer at Xilinx developing power-driven logical synthesis algorithms for Virtex-4,

Virtex-5 and Spartan-3A. He has coauthored a book on single event effect modelling and more than 40 articles

in IEEE journals and conferences.

José Lipovetzky: José (Enginering in Electronics UBA 2005, Phd UBA 2010), is adjunct researcher at

CONICET in the Low Temperature Laboratory of the Bariloche Atomic Center. Was professor at the University

of buenos Aires, where tough courses on IC design and semiconductor physics for graduate and undergraduate

students. He is author of 15 papers in peer reviewed journals, 2 patents and 30 papers international

conferences. Directed or codirected eight thesis in engineering and a Phd Thesis. Was co-chair of the EAMTA

2011, Publication Chair of the CASE since 2013. Taught courses on radiation effects in BELAS (Brazil 2014,

Estonia 2013), PUCRS (Brazil 2012), EAMTA 2013 (UTN Bs As 2013), EAMTA 2014 (FRM Mendoza) and made

testing of integrated circuits for space applications.

Celia López Ongil: Celia López Ongil received the Electronic Industrial Engineer from the Polytechnic

University of Madrid (UPM), Madrid, Spain, in 1995. She earned a PhD in Digital Systems from Polytechnic

University of Madrid (UPM), Spain, in February 2000. She has been Assistant Professor at Carlos III University

of Madrid (since 2010). She works in the Microelectronic Design and Applications Group which is composed of

9 doctors and 10 PhD students. Her research interests are: Hardware acceleration, CAD Tools for VLSI Design,

Fault Tolerant Digital Circuits Design and Assessment, Radiation Hardened Circuits. Dr. Celia López Ongil has

more than 100 papers in journals/conferences and 4 book chapters. She belongs to the Program Committee of

International On-line Testing Symposium and to the Program Committee of the Latin American Test Workshop.

She is reviewer on several international conferences and IEEE journals. He is Assistant Professor at Carlos III

University of Madrid, in six different grades on Telecommunications and Electronic Programs as well as

Security Engineering Degree for Spanish Guardia Civil. She has taught different subjects in Master and

Doctorate Programs. She has held some management positions in the Electronic Technology Department. Dr.

López Ongil has participated in several research projects in the topics of Fault Tolerance, Hardware

Acceleration, Design Automation for VLSI Circuits, (8 funded by European Commission, 6 funded by Spanish

Government and 2 funded by Madrid Community). She has been main researcher in two projects, in national

and local funded projects. In collaboration with companies she has participated in more than 20 research and

development projects, being the main researcher in two projects.

Miguel A. Aguirre: Miguel A. Aguirre is an Industrial Engineer 91, PhD 94, is a full professor in the

Electronic Engineering Dpt of the University of Sevilla, Spain since 2013. He is co-author of more than 100

papers in international conferences and more than 25 papers in journals, and addressed 5 doctoral thesis. His

field of interest is related to design for reliabiliity of digital circuits, ASICs and FPGAs, He is the promoter, by

means of an agreement with the European Space Agency, of the FT-UNSHADES system for early assessment of

digital circuit robustness against radiation.

Fabian Vargas: Fabian obtained his Ph.D. Degree in Microelectronics from the Institut National

Polytechnique de Grenoble (INPG), France, in 1995. At present, he is Full Professor at the Catholic University

(PUCRS) in Porto Alegre, Brazil. His main research domains involve the HW-SW co-design and test of system-

on-chip (SoC) for critical applications, system-level design and methodologies for radiation and

electromagnetic compatibility, and embedded sensor design for characterization, reliability and aging binning.

Among several activities, Prof. Vargas has served as Technical Committee Member or Guest-Editor in many

IEEE-sponsored conferences and journals. He holds 6 BR and international patents, co-authored a book and

published over 200 refereed papers. Prof. Vargas is associate researcher of the BR National Science Foundation

since 1996. He co-founded the IEEE-Computer Society Latin American Test Technology Technical Council (LA-

TTTC) in 1997 and the IEEE Latin American Test Symposium - LATS (former Latin American Test Workshop -

LATW) in 2000. Prof. Vargas received for several times the Meritorious Service Award of the IEEE Computer

Society for providing significant services as chair of the IEEE Latin American Regional TTTC Group and the LATS.

Prof. Vargas is a Golden Core Member of the IEEE Computer Society.

Ricardo Reis: Ricardo Reis received the EE from the Federal University of Rio Grande do Sul (UFRGS),

Porto Alegre, Brazil, in 1978. He earned a PhD from Polytechnic Institute of Grenoble (INPG), France, January

1983. He has been Full Professor at UFRGS (since 1979). He heads the Microelectronics Committee of Brazilian

National Science Foundation (CNPq). Research 1A (top level) of the CNPq. His research interests are: Physical

Design Automation, EDA, Radiation Hardened Circuits, VLSI Design and Microelectronics Education. Prof. Reis

has more than 400 hundred papers in journals/conferences. He has received the Fapergs Award as research of

the year 2002 (Science Foundation), and the Silver Core Award from IFIP. He is Chair of IFIP Technical

Committee 10. He is Professor at UFRGS of Microelectronics and Computer Science Graduate Programs. He

was head of the Microelectronics Graduate Program and Computer Science Graduate Program at UFRGS. He

has headed several research projects. Prof. Reis has served as General or Program Chair of several

international conferences. He also had the initiative to start SERESSA and He was the General Chair of the first

edition in 2005. He is Past President of the Brazilian Computer Society and Past VP of the Brazilian

Microelectronics Society. He has been CASS Chapter Rio Grande do Sul Chair (since 2007). The Chapter won 2

Chapter-of-the-Year Award (2011/2012) and Chapter-of-The-Year R9 2013. He was VP of IEEE CASS

representing R9, 2008 to 2011. He is IEEE Design&Test Editorial Board Member. Member of the Steering

Committee of several conferences: VLSI-SoC, ICECS, LASCAS, NEWCAS, IEEE-ISVLSI, SBCCI, IBERCHIP, EMicro.

He is a Senior member of IEEE.

Adrián Faigón: Adrian received his PhD in Physics from the Hebrew University of Jerusalem (HUJ), has

been involved in Device Physics and Technology research since 1980 at the Microelectronics Lab - School of

Applied Science and Technology - HUJ-Israel, and from 1990 onwards at the Faculty of Engineering-University

of Buenos Aires (UBA) where he founded the Device Physics-Microelectronics Laboratory. Full Professor at

UBA and Research Fellow at CONICET, A. Faigón, together with his Lab team, has been involved in the long

lasting effort to develop Microelectronics activities in Argentina promoting and taking part in private,

government and academic initiatives. His expertise is in MOS dielectrics growth and characterization focusing

in tunneling and associated phenomena, and in radiation effects in MOS structures. Over the last years his

research has been oriented to sensing and measuring radiation for medical applications. Innovations in this

area yielded three patents in MOS dosimetry.

Slawosz Uznanski: Slawosz is a radiation effects engineer and a project leader for the new radiation

tolerant power converter control electronics for the Large Hadron Collider (LHC) at the European Organization

for Nuclear Research (CERN). He received his M.Sc. from the Technical University of Lodz, Poland in 2008 (with

honors) and Ph.D. from the University of Aix-Marseille, France in 2011. His prior experience includes Radiation

Effects Engineer at STMicroelectronics (2008-2011) focusing on radiation-hardening by design of digital CMOS

technologies (65-28nm) for space and high reliability terrestrial applications and R&D Engineer at Xilinx

developing power-driven logical synthesis algorithms for Virtex-4, Virtex-5 and Spartan-3A. He has coauthored

a book on single event effect modelling and more than 40 articles in IEEE journals and conferences.

Poster Session

Analyzing Vulnerability Window of Master-Slave D Flip-Flop under Radiation Alexandra L. Zimpeck, Fernanda L. Kastensmidt, Ricardo Reis

Bulk and FDSOI SRAM Resiliency to Radiation Effects Walter Calienes, Ricardo Reis, Costin Anghel, Andrei Vladimirescu

A Facility for the Study of Single-event Effects in The TANDAR Accelerator Ma. L. Ibarraa, M. P. Barrera, A. Filevich, M. Alurralde

Oxides for non-volatile memory devices: The MeMOSat Project Pablo Levy, Federico Golmar, Néstor Ghenzi, Fernando Gomez Marlasca , Diego Rubi , et al.

Proton and oxygen irradiation of high-k based MOS C. Quinteros, F. Campabadal, E. Miranda, F. Palumbo

A Transparent and Non-intrusive Fault Injector for FPGA-based SoC N. Tomatis, M. Volarik, J. Fraire, P. Ferreyra

Radiation effects on MOS devices A. Faigón, J. Lipovetzky, M. A. Garcia-Inza, S. Carbonetto, L. Sambuco Salomone, et al.

SOI Micro and Nanostructure degradation analysis for medical and Space applications Alex Lozano, Felix Palumbo

Th B ch f JSC “URSC”-“ISDE” W k Exp c H C l f El c c Components to Space Radiation Influence V.S. Anashin, P.A. Chubunov, S.A. Iakovlev

Ionizing particle detection and clasification using CMOS commercial imagers Perez M., Sofo Haro M. , Rondón D. , Mora C. , Sidelnik I.M. , Lipovetzky J., Blostein J.J., et al.

Development of GNSS receivers for space applications at the UNLP P.A. Roncagliolo, J.G. García, R.G. López La Valle, J. Cogo, G. L. Puga, J.G. Díaz, et al.

Characterization of a CCD for Applications in Particle Detection Sofo Haro M., Fernandez Moroni G., Bertou X., Blostein J.J, Cancelo G., Estrada J., et al.

MeMOSat-01, a nonvolatile ReRAM performance experiment in low Earth orbit Fernando Gomez-Marlasca, Leandro Arcusin, Mariano Barella, Cynthia Quinteros, et al.

Design and Implementation of a Measurement Unit for Laser Testing of Semiconductor Memories I. Garda, A. Cédola, M. Cappelletti, F. San Juan, E. Peltzer y Blancá

December 9-12 Bariloche, Argentina

Agencia Nacional de Promoción Científica y Tecnológica

Secretaría de Ciencia, Tecnología y Desarrollo para la Producción de Rio Negro Comisión Nacional de Actividades Espaciales (CONAE)

Comisión Nacional de Energía Atómica (CNEA) Grenoble INP

Université Joseph Fourier Servicios Tecnológicos Integrados (STI)

Centro de Ensayos de Alta Tecnología (CETSA) Asociación Civil para la Investigación, Promoción, y Desarrollo de los Sistemas Embebidos (ACSE)

Investigaciones Aplicadas S.E (INVAP) Instituto Balseiro

IEEE Circuit and Systems Society (CAS) TIMA labs

Fundación Williams

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