Donovan T. Lee. Integrated Circuit Technology EE40 6 August 2008.
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Transcript of Donovan T. Lee. Integrated Circuit Technology EE40 6 August 2008.
Donovan T. Lee
Donovan T. Lee
Integrated Circuit Technology
EE40
6 August 2008
Donovan T. Lee
Integrated Circuit Fabrication
Goal:
Mass fabrication (i.e. simultaneous fabrication) of many “chips”, each a circuit (e.g. a microprocessor or memory chip) containing millions or billions of transistors
Methods for Top Down processing:
1. Addition of material
2. Subtraction of unwanted material
3. Thermal/Doping modification of material
Analogous to making Gingerbread men… yeah.
Donovan T. Lee
Still in Infancy: Bottom-up Processing
Cheap electronics
Organic Printed Electronics – Process is serial (slow) and resolution is poor
High-performance transistors
Catalyzed Growth – Nanotubes/Nanowires hard to place and grow in the desired direction.
Donovan T. Lee
• Si substrate – selectively doped in various regions• SiO2 insulator – MOST IMPORTANT component• Polycrystalline silicon – used for the gate electrodes• Metal contacts and wiring
Standard Materials Set
Donovan T. Lee
Si Substrates (Wafers)Why are wafers round?
We pull crystalline-Si out of hot ingots, starting with a seed crystal.
Crystalline-Si exhibits the best electronic properties for transistors.
Typical wafer cost: $50 (!!!)
Sizes: 150 mm, 200 mm, 300 mm diameter
300 mm
“notch” indicatescrystal orientation
Donovan T. Lee
Doping
Makes the Silicon N-type or P-type
Donovan T. Lee
Suppose we have a wafer of Si which is p-type and we want to change the surface to n-type. The way in which this is done is by ion implantation. Dopant ions are shot out of an “ion gun” called an ion implanter, into the surface of the wafer.
Typical implant energies are in the range 1-200 keV. After the ion implantation, the wafers are heated to a high temperature (~1000oC). This “annealing” step heals the damage and causes the implanted dopant atoms to move into substitutional lattice sites.
Adding Dopants into Si
Eaton HE3High-Energy Implanter,showing the ion beam hitting theend-station x
SiO2
Si
+ + + +++As+ or P+ or B+ ions
x
SiO2
Si
++ ++ ++ ++++++As+ or P+ or B+ ions
Donovan T. Lee
e.g. AsH3 gaseous sourceAs+, AsH+, H+, AsH2
+
Ionsource
translationalmotion
As+
accelerator
Energy: 1 to 200 keVDose: 1011 to1016/cm2
Inaccuracy of dose: <0.5%Nonuniformity: <1%Throughput: ~60 wafers/hr
ion beam
wafer
spinning waferholder
Ion Implanter
F = q( v B )
analyzer magnet
resolving aperture
Donovan T. Lee
Dopant Diffusion• The implanted depth-profile of dopant atoms is peaked.
• In order to achieve a more uniform dopant profile, high-temperature annealing is used to diffuse the dopants
• Dopants can also be directly introduced into the surface of a wafer by diffusion (rather than by ion implantation) from a dopant-containing ambient or doped solid source
dopant atomconcentration(logarithmic scale)
as-implanted profile
depth, x
Donovan T. Lee
Annealing
Fixes the damage caused by ion implantation.
Donovan T. Lee
Rapid Thermal Annealing (RTA)Sub-micron MOSFETs need ultra-shallow junctions (xj<50 nm)
Dopant diffusion during “activation” anneal must be minimized Short annealing time (<1 min.) at high temperature is required
• Ordinary furnaces (e.g. used for thermal oxidation and CVD) heat and cool wafers at a slow rate (<50oC per minute)
• Special annealing tools have been developed to enable much faster temperature ramping, and precise control of annealing time– ramp rates as fast as 200oC/second– anneal times as short as 0.5 second– typically single-wafer process chamber:
Donovan T. Lee
Rapid Thermal Annealing Tools• There are 2 types of RTA systems:
1. Furnace-based • steady heat source + fast mechanical wafer transport
2. Lamp-based• stationary wafer + time-varying optical output from lamp(s)
Lamp RTA
Furnace RTA
A.T. Fiory, Proc. RTP2000
Donovan T. Lee
Film Growth
Allows formation of high-quality films (usually SiO2) necessary for low
leakage.
Donovan T. Lee
Formation of Insulating Films• The favored insulator is pure silicon dioxide (SiO2).
• A SiO2 film can be formed by one of two methods:
1. Oxidation of Si at high temperature in O2 or steam ambient
2. Deposition of a silicon dioxide film
ASM A412batchoxidationfurnace
Applied Materials low-pressure chemical-vapor deposition (CVD) chamber
Donovan T. Lee
22 SiOOSi Thermal Oxidation
• Temperature range: 700oC to 1100oC
• Process: O2 or H2O diffuses through
SiO2 and reacts with Si at the interface to form more SiO2
• 1 m of SiO2 formed consumes ~0.5 m of Si
oxidethickness
t
ttime, t
222 22 HSiOOHSi or
“dry” oxidation “wet” oxidation
Donovan T. Lee
Thermal oxidation grows SiO2 on Si, but it consumes Si, so the wafer gets thinner. Suppose we grow 1 m of oxide:
Silicon wafer, 100 m thick
Example: Thermal Oxidation of Silicon
99 m thick Si, with 1 m SiO2 all around total thickness = 101 m
99m101m
Donovan T. Lee
Oxidation Rate Dependence on Thickness
• The thermal oxidation rate slows with oxide thickness.
Consider a Si wafer with a patterned oxide layer:
Now suppose we grow 0.1 m of SiO2:
SiO2 thickness = 1 m
SiO2 thickness = 1.02 m SiO2 thickness = 0.1 m
Si
Note the 0.04m step in the Si surface!
Donovan T. Lee
Local Oxidation (LOCOS)Window Oxidation
Selective Oxidation Techniques
Donovan T. Lee
Deposition
Allows you to put down conformal films that cannot be grown from the substrate.
Donovan T. Lee
Chemical Vapor Deposition (CVD) of SiO2
2224 2HSiOOSiH • Temperature range:
350oC to 450oC for silane ~700oC for TEOS
• Process: Precursor gases dissociate at
the wafer surface to form SiO2
No Si on the wafer surface is consumed
• Film thickness is controlled by the deposition time
oxidethickness
t
time, t
OHCSiOOHOHCSi 6222452 42)( or “LTO”“TEOS”
Donovan T. Lee
CVD Properties:
•Can be deposited on top of anything.
•Can follow ups & downs (topography) of pre-existing layers
Conformality
Donovan T. Lee
Lithographic Patterning
Film-camera-like process that lets you define shapes in your thin films.
Donovan T. Lee
Patterning the Layers
Lithography refers to the process of transferring a pattern to the surface of the waferEquipment, materials, and processes needed:• A mask (for each layer to be patterned) with the desired pattern
• A light-sensitive material (called photoresist) covering the wafer so as to receive the pattern
• A light source and method of projecting the image of the mask onto the photoresist (“printer” or “projection stepper” or “projection scanner”)
• A method of “developing” the photoresist, that is selectively removing it from the regions where it was exposed
Planar processing consists of a sequence of additive and subtractive steps with lateral patterning
oxidationdeposition
ion implantation
etching lithography
Donovan T. Lee
Photoresist Exposure• A glass mask with a black/clear pattern is used to
expose a wafer coated with ~1 m thick photoresist
Areas exposed to UV light are susceptible to chemical removal
Mask
UV light
Lens
Si wafer
Image of mask appears here (3 dark areas, 4 light areas)
Mask image is demagnified by nX
“10X stepper”“4X stepper”“1X stepper”
photoresist
Donovan T. Lee
Exposure using “Stepper” Tool
wafer
scribe line
1 2
images
field size increases with technology
generation
Translationalmotion
Donovan T. Lee
Commercial Stepper Tool (ASM Lithography)
Donovan T. Lee
Photoresist Development• Solutions with high pH dissolve the areas which were
exposed to UV light; unexposed areas are not dissolved
Developed photoresist
Exposed areas of photoresist
Donovan T. Lee
Lithography Example
• Look at cuts (cross sections) at various planes
• Mask pattern (on glass plate)
BB
A A
(A-A and B-B)
Donovan T. Lee
“A-A” Cross-Section
The resist is exposed in the ranges 0 < x < 2 m & 3 < x < 5 m:
x [m]0 1 2 3 4 5
resist
resist after development
x [m]0 1 2 3 4 5
maskpattern
x [m]0 1 2 3 4 5
The resist will dissolve in high pH solutions wherever it was exposed:
Donovan T. Lee
In order to transfer the photoresist pattern to an underlying film, we need a “subtractive” process that removes the film, ideally with minimal change in the pattern and with minimal removal of the underlying material(s) Selective etch processes (using plasma or aqueous chemistry) have been developed for most IC materials
Jargon for this entire sequence of process steps: “pattern using XX mask”
photoresist
SiO 2
First: pattern photoresist
Si
We have exposed mask pattern, and developed the resist
etch stops on silicon (“selective etchant”)
oxide etchant … photoresist is resistant.
Next: Etch oxide
only resist is attackedLast: strip resist
Pattern Transfer by Etching
Donovan T. Lee
Photolithographychromiumquartz plate
• 2 types of photoresist:
– positive tone:portion exposed to light will be dissolved in developer solution
– negative tone:portion exposed to light will NOT be dissolved in developer solution
from Atlas of IC Technologies by W. Maly
Donovan T. Lee
Projection Printing Considerations
Small lm is desired!
minimum feature size lm :
Intel’s Lithography Roadmap
Donovan T. Lee
Depth of Focus
Large z is desirable.
depth of focus z :
Donovan T. Lee
Etching
Remove material that you don’t want
Donovan T. Lee
Etching: Ion vs. Wet
better etch selectivity better control of etched feature sizes
from Atlas of IC Technologies by W. Maly
Donovan T. Lee
RIE-based Stringers / Spacers
Leftover material must be removed by overetching
Donovan T. Lee
D’oh! Stringers
Donovan T. Lee
Example Process Flow
CMOS Technology
Donovan T. Lee
Challenge: Build both NMOS & PMOS transistors on a single silicon chip
• NMOSFETs need a p-type substrate
• PMOSFETs need an n-type substrate
Requires extra process steps!
CMOS Technology
oxide
p-welln-type Si
n+ n+p+p+
Donovan T. Lee
oxiden-type wafer
*Create “p-well”
Grow thick oxide
*Remove thick oxide in transistor areas (“active region”)
Grow gate oxide
Deposit & *pattern poly-Si gate electrodes
*Dope n channel source and drains (need to protect PMOS areas)
Deposit insulating layer (oxide)
*Open contact holes
Deposit and *pattern metal interconnects
*Dope p-channel source and drains (need to protect NMOS areas)
→ At least 3 more masks, as compared to NMOS process
Conceptual CMOS Process Flow
p-welln-type Si
n+ n+p+p+
Grow thick oxide
*Remove thick oxide in transistor areas (“active region”)
Donovan T. Lee
Cross-sectional view of wafer
SiO2
n-type Si
1. Well Formation
• Before transistor fabrication, we must perform the following process steps:
1. grow oxide layer; pattern oxide using p-well mask
2. implant phosphorus; anneal to form deep p-type regions
Additional Process Steps Required for CMOS
boron
Top view of p-well mask(dark field)
p-well
Donovan T. Lee
We must protect the n-channel devices during the boron implantation step, and
We must protect the p-channel devices during the arsenic implantation step
“Select n-channel”
photoresist
Example: Select p-channel
2. Masking the Source/Drain Implants
“Select p-channel”
boron
oxide
p-welln-type Si
n+ n+p+p+
Donovan T. Lee
Modify oxide mask and “select” masks:
1. Open holes in original oxide layer, for body contacts
2. Include openings in select masks, to dope these regions
Forming Body Contacts
oxide
p-welln-type Si
n+ n+p+p+ p+n+
Donovan T. Lee
Select MasksN-select:
oxide
p-welln-type Si
n+ n+n+
P-select:
oxide
p-welln-type Si
n+ n+p+p+ p+n+
Donovan T. Lee
Example MEMS Flow
Micro Electro Mechanical Systems
Donovan T. Lee
MEMS Switch
DrainSource Gate(s)
• Contact Areas: 0.4x0.4 um2 to 8x8 um2
• Devices from 50 um to 250 um long
Drain
Donovan T. Lee
Process Flow
Isolation
Elec0 Layer
Si Substrate
Dimple hole
Main Sacrificial (LTO)
Pattern Elec0
Pre-alignment
Isolation Growth 6000A Low Temp Oxide 1000A Stoichiometric Silicon Nitride
Poly 0 Deposition
Poly 0 Formation RIE to isolation w/ overetch
Main Sacrificial Deposition 5500A Low Temp Oxide
Dimple Formation DRIE to Isolation or timed DRIE
Donovan T. Lee
Fine refill sacrificial (HTO)
Anchor holes
Elec1 Layer
Sacrificial Release
Fine Sacrificial Deposition 650A High Temp Oxide
Anchor Formation DRIE to isolation layer
Poly 1 Deposition 5500A @ 615C n-doped Poly 1 Formation RIE etch to Main Sac
Sacrificial Release HF:HCl 20’ then critical pt. dry
Process Finished
Process Flow