DISCRETE SEMICONDUCTOR TEST SYSTEM WITH … SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER ... MOSFET...
Transcript of DISCRETE SEMICONDUCTOR TEST SYSTEM WITH … SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER ... MOSFET...
MODEL 8910/8920IST DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER
A Complete and Cost Effective Automated Test Equipment (ATE) System for Testing of Discrete Semiconductor Components from mW to kW
• Test 137 parameters and 12 different semiconductor devices
• User friendly interface powered by a Windows 7 touch screen PC
• Auto-calibration and self-test diagnostics
• Curve tracer program built-in
• USB Printer interface for printing test reports
• Provides accurate Kelvin or self-calibrated Non-Kelvin testing options
• Constant temperature controller heats DUTs up to 250 oC
• Stores and recalls previous test programs
• Provides automatic Go/No Go tests or parametric measurements
• Handler interface for wafer or package level production testing
• Start-up safety check prevents testing on defective, incorrect DUTs, test heads, or pin-outs
• Adjustable pulsing test from 10 uS to 300 uS
• Measures junction capacitances and input impedance of MOSFETs and IGBTs
• Optional 6-1 IGBT module testing
• Safety Start test mode to protect user from accidental test starts
• Fixtures available for easier testing of module packages
• Slide-out hardware cabinet for ease of servicing.
DeviceType
Leakage Current
BreakdownVoltage
On-StateParameter
GainTrigger Parameter
LatchParameter
Hold Parameter
SwitchingParameter
BipolarTransistor
Iceo, Ices, Icev Icbo, Iebo
BVceo, BVces BVcev, BVcbo BVebo
Vce(sat)Vbe(sat)
hFE Vbe(on)
MOSFETTransistor
Idss, Igsr, Igsf Idsv
BVdss Vds(on), Ids(on) Rds(on), Vsd
gFS Vgs(th)Vgs(on)
Ciss, Coss, Crss, Zin
IGBT Ices, Igsr, Igsf BVces Vce(sat), Ic(on) Vf
gFS Vge(th)Vge(on)
Cies, Coes, Cres, Zin
TRIAC Idrm, Irrm BVrrm, BVdrm Vtm 1/2/3/4 Igt 1/2/3/4Vgt 1/2/3/4
IL 1/2/3/4 Ih 1/2/3/4
SCR Idrm, Irrm BVdrm, BVrrm Vtm Igt, Vgt IL Ih
GTO Idrm, Irrm BVdrm Vtm Igt, Vgt IL Ih
DIODE Ir BVr Vf, If
Zener Diode Ir BVz, BVr Vf
J-FET Igss BVgss Idss, Rds(on) Vds(on)
gFS Vgs(p) Id(p)
Regulator +/-Vo, +/-Ipk +/-Isc
+/-dV +/-0r, +/-Ir
Optoisolator Irrm, Ir, IceoIcbo, Iebo Ic(off), Idrm
BVceo, BVcbo BVebo
Vf, Ic(on), Vce(sat), Vtm
CTR, hFE Igt Ih
TVS Ir BVr Vbo, Ibo, dVbo
IST MODEL 8900 SERIES TESTING PARAMETERS
1 Kelvin High Power test head*1 Kelvin Low Power test head1 Self Calibrated Non-Kelvin Low Power test head
Easy to use menu driven interface
USB ports for connecting printer, keyboard, mouse
High Current Source up to 4800 A*
Temperature Control for DUT hot plate
Windows 7 Touchscreen PC
*- IST Model 8920 only
IST 8920
IST 8910
IGBT Decoder Power Source
CURVE TRACER SOFTWARE
The IST 8900 Series is powered by a touch screen PC with Curve Tracer testing
software preinstalled. Using the Curve Tracer application, the 8910/8920 is able
to generate a single curve or as many as six curves per test cycle. Each curve is
plotted from up to 32 different measurements taken by the tester within a test range
specified by the user. The data increments can be set for either linear or logarithmic
format. The resulting graph shows a precise operating point for a device under a set
of changing conditions.
Both the IST-8920 (left) and the IST-8910 (right) are able to run Curve Tracer tests on
the parameters displayed in the table below.
Bipolar Transistor
Ice(o,s,v) – BVce(o,s,v) Icbo – BVcbo
Iebo – BVebo
Ic – Vce(sat) at different Ib Ib – Vce(sat) at different Ic
Ic – Vbe(sat) Ic – hFE
MOSFET
Idss – BVds(s,v) Ids – Vds at different Vgs
Rds – Ids at different Vgs Ids – Vgs at different Vds
Rds – Vgs at different Ids
Is – Vsd Vgs(th) – Ids
Igss(f,r) – Vgss(f,r) C(i,o,r)ss – Vds
IGBT
Ices – BVces If – Vf
Vge(th) – Ice
Iges(f,r) – Vges(f,r) Ic – Vce at different Vge
C(i,o,r)es – Vce Ic – Vge at different Vce
TRIAC
Idrm – BVdrm Irrm – BVrrm
SCR
Idrm – BVdrm Irrm – BVrrm
Diode
Vf – If Ir – BVr
Zener Diode
Vf – If Iz – BVz
The IST-8920 and 8910 are mounted
on slide out drawers for ease of
maintenance.
HIGH POWER SEMICONDUCTOR TESTING WITH THE IST 8920
As power modules age, their performance degrades. Proper testing and
maintenance of semiconductor devices used in power switching can
ensure optimal performance and prevent down-time throughout a device’s
lifecycle. The IST Model 8900 Discrete Semiconductor Test System allows
you to effectively identify the percent of degradation in semiconductor
devices by simulating the exact current and voltage of the parameters used
by devices under real operating conditions. Equipped with a Constant
Temperature source, the 8900 series is able to heat devices up to 250°C
to introduce thermal stress and allow devices to be tested at their normal
operating temperatures so that failing devices can be detected earlier and
before they become a serious problem.
The comprehensive 8920 model supports high power ON-state parameter testing for Vce(sat), Vds(on), Rds(on), Vsd, Vf, and
Vtm at force currents of 400 A, 800 A, 1,600 A, 2,400 A, 3,200 A and 4,800 A.
Force voltages for Off-state parameter testing of Breakdown Voltage and Leakage Current measurements can be set to 2.5 KV,
5 KV, 7.5 KV or 10 KV.
HIGH POWER CONSTANT CURRENT WITH RELAY ASSEMBLYThe 8920 features a high power constant current source that supplies up to
48 units of a 50 A or 100 A current source in parallel, enabling automated
high current, high voltage power device testing.
KELVIN TEST FIXTURES FOR HIGH POWER TESTING
The IST 8920 includes specialized test fixtures that make it easy to setup and
measure high power devices such as IGBTs, MOSFETs, Transistors, GTOs,
SCRs, and Diodes. The test fixtures provide error-free testing while
eliminating time consuming setups needed to secure test leads and sources.
Using the test fixtures, testing can be performed at currents up to 4800 A
and at voltages up to 10 KV.
SWITCHING EFFICIENCY ANALYSIS IN POWER IGBTs & MOSFETs
At low frequencies, conduction loss is the primary driver of power loss in a device
and their performance can be assessed by measuring the DC parameters of Vce(sat),
Vds(on), and Rds(on). At higher frequencies, the Cies, Coes, and Cres parameters and
the device’s input impedance dictate the switching and driving loss.
Devices with heavy power loss will generate excess heat, leading to premature aging
of the device and poor performance. The IST 8900 Series is a complete solution that
is able to properly test high power devices as part of maintenance and production
routines to ensure optimal performance and longevity of power devices used in
today’s high frequency switching applications.
TWO MODELS TO FIT YOUR BUDGET AND TESTING NEEDS
IGBT & MOSFET DECODER MODULE
The optional IGBT & MOSFET Decoder Module allows for testing of IGBT (6-in-1,
4-in-1, 2-in-1) and MOSFET packages. A Kelvin connection is required. One unit is
tested at a time and subsequent units are activated sequentially as each test finishes.
Additional software for hand-shaking control may be required for testing of packages
with built-in control ICs.
SUPER HIGH POWER RELAY
This UL listed power enclosure is completely sealed against air and moisture to
prevent environmental factors from influencing test results. The DPDT relays provide
a switching current source of up to 3600 A and voltage up to 10 KV. (Patent Pending)
HOT PLATE STAND w/CONSTANT TEMPERATURE CONTROL
The Hot Plate Stand is controlled by the IST 8900 Series to pre-heat a DUT to its
maximum operating temperature prior to testing. Testing devices at actual operating
temperatures produce more accurate assessments of a device’s true performance
abilities.
VICE CLAMPING TEST FIXTURE
This fixture is used to test Disc Packages such as GTOs, SCRs, Triacs, and Diodes.
The fixture supplies pressure to clamp down on the DUT to connect the internal
contacts. (Patent Pending)
POWER MODULE TEST FIXTURE WITH CONSTANT TEMPERATURE CONTROL
This fixture simplifies the setup for testing power IGBT devices. Devices can be
mounted by simply positioning the device and pulling down on the lever to securely
connect the test leads. A hot plate stand is built into the fixture to allow for testing at
operating temperatures. (Patent Pending)
ACCESSORIES
The IST 8900 series test systems are available as a lower cost model in the 8910 and
as a comprehensive model in the 8920. Both systems have identical parameter testing
capabilities, but the 8920 is larger and can perform testing up to 4800 A / 10 KV.
The 8910 (shown on right) is more compact and can test up to 50 A / 2.5 KV.
IST 8910
Parameters Current Range Resolution Accuracy Test Condition
Iceo/s/v, IcboIebo, Idss/v, Igsr/f Idrm, Irrm, Igko Igss, Ir, Ic(off)
0 - 400 na 0.1 na +/-5% 0 - 10 KV
0 - 4 ua 1 na +/-2% 0 - 10 KV
0 - 40 ua 10 na +/-1% 0 - 10 KV
0 - 400 ua 0.1 ua +/-1% 0 - 10 KV
0 - 4 ma 1 ua +/-1% 0 - 10 KV
0 - 40 ma 10 ua +/-1% 0 - 5 KV
0 - 400 ma 0.1 ma +/-1% 0 - 2 KV
Parameter Voltage Range Resolution Accuracy Test Condition
BVceo/s/vBVcbo, BVebo BVdss, BVrBVdrm, BVrrm BVgss, BVz
0 - 30 V 0.05 V +/-1% 0 - 5 A
30 - 60 V 0.05 V +/-1% 0 - 2 A
60 - 2500 V 0.3 V +/-2% 0 - 40 ma
2500 V - 10 KV 1.5 V +/-3% 0 - 10 ma
Parameter Current Resolution Accuracy Test Condition
hFE, Vce(sat)Vbe(on), Vbe(sat) Vds(on), Ids, VdsRds(on), Ic(on), Vf If, Vtm +/-Vo, +/-Ipk+/-Isc, Vbo, Ibo
0 - 20 ma 5 ua +/-1% 0 - 20 V
0 - 200 ma 50 ua +/-1% 0 - 20 V
0 -2 A 0.5 ma +/-1% 0 - 20 V
0 - 25 A 6 ma +/-1% 0 - 20 V
0-50 A 12 ma +/-1% 0 - 20 V
0 - 4800 A 24 ma +/-3% 0 - 20 V
Parameter Current Resolution Accuracy Test Condition
hFE, Vgs(th)Vbe(on), Vgs(on) Vge(th), Vge(on) Igt, Vgt, ILIh, Ic(on)Igt 1/2/3/4Vgt 1/2/3/4
0 - 100 ua 20 na +/-1% 0 - 20 V
0 - 1 ma 0.2 ua +/-1% 0 - 20 V
0 -10 ma 2 ua +/-1% 0 - 20 V
0 - 100 ma 20 ua +/-1% 0 - 20 V
0 - 1 A 0.2 ma +/-1% 0 - 20 V
0 - 20 A 4 ma +/-1% 0 - 20 V
Parameter Range Accuracy Test Condition
Cies, Coes, Cres, Ciss, Coss, Crss
20 pF - 1000 nF +/-3% 0 - 60 V1 MHz - 10 KHz
Leakage Current Measurement Range
Breakdown Voltage Range
On-State Current Range
Triggering Voltage/Current Range
Capacitance Measurement Range
Physical SpecificationsUnit Dimensions Weight
8910 Mainframe 19.5”H x 21.5”D x 21”W 53 kg
8920 Mainframe 32”H x 23”D x 29.5”W 120 kg - 168 kg
IGBT 6-1 Decoder 5”H x 11”D x 12”W 15 lbs (6.8 kg)
Test Fixture for Disc Package
12”H x 10”D x 9”W 18 lbs (8.2 kg)
Test Fixture for Power Module
7”H x 12”D x 9”W 20 lbs (9.1 kg)
Test Fixture for Hot Plate Stand
4”H x 14”D x 9”W 11.6 lbs (5.2 kg)
Accessories Furnished
• 12” Touch Screen Windows 7 PC, Keyboard, & Mouse
• Known Good Transistors for Mainframe Self Testing
• AC Power Cord
• Instruction Manual
• Axial Lead Test Socket Adapter
• Multiple Application Low Power Non-Kelvin Socket Adapter
• Medium Power “3-in-Line” Kelvin Test Socket Adapter
• Univ. High Power Test Fixture Adapter w/Kelvin Connections
• Shorting Plugs for Test Socket Self-Calibration application
• Removable 4 Wheeled Dolly (8920 Only)
Optional Accessories
• IGBT & MOSFET Decoder Module
• Power Module Test Fixture w/Constant Temperature Control
• Hot Plate Heating Stand w/Constant Temperature Control for Regular Device Packages
• Vice Clamping Test Fixture for High Power Disc Packages
• Test Socket Adapter for TO-3, TO-66, & TO-204
• Single/Dual Optoisolator Test Socket Adapter
• Miniature Universal Test Clip Adapter
• Test Socket Adapter for SMD Package
• Super High Power Universal Test Fixture w/Kelvin Connections
IST 8900 SERIES TECHNICAL SPECIFICATIONS
ISTInformation Scan Technology, Inc.487 Gianni St., Santa Clara, CA 95054Phone: 408.621-0336Fax: 408.988.1908Web: www.infoscantech.com
Parameter Range Accuracy Test Condition
Zin 0.50 ohm - 20k ohm +/-5% 1 MHz - 100 KHz
Input Impedance Measurement Range