Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor:...

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Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor : Michael Yampolsky May 2009 1

Transcript of Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor:...

Page 1: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

Details designASIC test platform development

By: Nadav Mutzafi Vadim Balakhovski

Supervisor: Michael Yampolsky

May 2009 1

Page 2: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

DC to DC converterDC to DC converter Level translatorLevel translator PLL configurablePLL configurable FPGA implementation FPGA implementation

May 2009 2

Topic points

Page 3: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

May 2009 3

Voltages for I/O(1+2) Umodel 4604 :Umodel 4604 :

◦ ◦ Input voltage – 3.3VInput voltage – 3.3V

◦ ◦ Output voltage - 0.8V to 3.3VOutput voltage - 0.8V to 3.3V

◦ ◦ Set by resistorSet by resistor

◦ ◦ current 4A , 5A peakcurrent 4A , 5A peak

◦ ◦ High efficiency High efficiency

umodel4604

Page 4: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

May 2009 4

Voltages for core(3) Umodel 4604 :Umodel 4604 :

◦ ◦ Input voltage – 5VInput voltage – 5V

◦ ◦ Output voltage - 0.8V to 5VOutput voltage - 0.8V to 5V

◦ ◦ Set by resistorSet by resistor

◦ ◦ current 4A , 5A peakcurrent 4A , 5A peak

◦ ◦ High efficiency High efficiency

umodel4604

Page 5: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

May 2009 5

Voltages for core(4) LT1931 :LT1931 :

◦ ◦ Input voltage – 5VInput voltage – 5V

◦ ◦ Output voltage – N5VOutput voltage – N5V

◦ ◦ Current – 350mACurrent – 350mA

LDO_N5V

Page 6: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

May 2009 6

Voltages summary I/O voltages – two different I/O voltages – two different

voltages from 0.8V-3.3Vvoltages from 0.8V-3.3V Core voltages – negative 5V ,Core voltages – negative 5V ,

adjustable from 0.8V-5Vadjustable from 0.8V-5V Connector for 5V and for anotherConnector for 5V and for another

voltage from pc power supply.voltage from pc power supply.

Page 7: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

May 2009 7

Level translator

Page 8: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

May 2009 8

Level translator Auto bidirectionalAuto bidirectional Supporting 100MHzSupporting 100MHz Determinist voltages : Determinist voltages :

1.2V, 1.5V , 1.8V , 2.5V , 3.3V1.2V, 1.5V , 1.8V , 2.5V , 3.3V

level translator

Page 9: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

May 2009 9

PLL configurable

PLL

I2C

OSC

Page 10: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

May 2009 10

PLL configurable Programmable PLL , I2CProgrammable PLL , I2C Crystal Frequencies 8MHz-54 MHzCrystal Frequencies 8MHz-54 MHz Six output clock(3.3V recommend)Six output clock(3.3V recommend) Power supply 3.3VPower supply 3.3V

PLL ,I2C

Page 11: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

FPGA Block Diagram

FPGA

Tester IN

Tester OUT

DDRA

DDRB

CONTROLER

PSDB

ASICPLLI2C

Page 12: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

Tester IN module

Page 13: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

Tester OUT module

Page 14: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

Controller module FSMs:FSMs:

◦ ◦ Read – from DDR bank A to Tester INRead – from DDR bank A to Tester IN

◦ ◦ DUT – from tester in to DUT to tester out DUT – from tester in to DUT to tester out

◦ ◦ Write – from Tester OUT to DDR bank BWrite – from Tester OUT to DDR bank B

“ “Differentiator”Differentiator”

Buffering data from Tester INBuffering data from Tester IN

Bi – directional pins allocationBi – directional pins allocation

Page 15: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

FSM Read States: zerozero IS PAGE 1 AVAILABLEIS PAGE 1 AVAILABLE READING FROM PAGE 1 READING FROM PAGE 1 START DELAY PAGE 1START DELAY PAGE 1 INIT COUNTER PAGE 1 INIT COUNTER PAGE 1 READ 1READ 1 FINISH READ FROM PAGE 1FINISH READ FROM PAGE 1 WHAT NEXT PAGE 1 WHAT NEXT PAGE 1 LOOP 1LOOP 1

Page 16: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

FSM DUT States:

zerozero

Sending VectorsSending Vectors

HoldHold

Page 17: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

FSM Write States: zerozero IS PAGE 1 AVAILABLEIS PAGE 1 AVAILABLE WRITING STATE PAGE 1WRITING STATE PAGE 1 START DELAY PAGE 1START DELAY PAGE 1 INIT COUNTER PAGE 1INIT COUNTER PAGE 1 WRITE 1WRITE 1 FINISH WRITE PAGE 1FINISH WRITE PAGE 1

Page 18: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

““DifferentiatorDifferentiator””

Page 19: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

Buffering input vectorsBuffering input vectors

Tester IN

Fifo IN

Controller

InputBuffer

FFPin 0

FF

Pin 94

Pin 1

Pin 95

Pin 93

Pin 2

ProcStarII

DDRBank A

PC

GUI

MAX (FIFO_IN_CLK) = DDR_CLK

PCI CLK 66MHz

BUFFER_CLK <= FIFO_IN_CLK /3

DDR CLK = 260 MHz

Page 20: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

Rates constrainRates constrain Aim: 100Mhz * 96 = 9.6 Gbit/secAim: 100Mhz * 96 = 9.6 Gbit/sec

PCI: 66Mhz * 32 = 2.1 Gbit/secPCI: 66Mhz * 32 = 2.1 Gbit/sec

Multi Port: 260*32 = 8.3 Gbit/secMulti Port: 260*32 = 8.3 Gbit/sec

Page 21: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

Bi-directional pins

Controller

InputBuffer

Pin 0

Pin 95

Pin 48

OutputBuffer

Pin 0

Pin 94

Pin 95

PSDB

ASIC

Page 22: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

Pinout constrainPinout constrain

Max 96 input pinsMax 96 input pins

Max 48 Bi-directional pinsMax 48 Bi-directional pins

Page 23: Details design ASIC test platform development By: Nadav Mutzafi Vadim Balakhovski Supervisor: Michael Yampolsky May 20091.

FPGA future tasks Trigger supportTrigger support

Errors definition Errors definition

System self test performanceSystem self test performance

I2C core I2C core