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Chapter-II
Applications of Thin Films and
Characterization Techniques
Chapter – II
Applications of Thin Films and Characterization Techniques
Sr. No.
Title
Page No.
Part - A
Applications of Thin Films
2. A.1. Introduction 29
2. A.2 Photoelectrochemical (PEC) solar cells 35 Part -B
Thin Film Characterization Techniques 2. B.1 Introduction 53
2. B.2 Optical absorption study 53
2. B.3 Raman spectral study 55
2. B.4 Scanning Electron Microscopy (SEM) 61
2. B.5 Atomic Force Microscopy (AFM) 64
2. B.6 Energy Dispersive Analysis by X-Rays Measurement (EDS)
66
2. B.7 X- ray Diffraction (XRD) 66
2. B.8 Thickness Measurement 68
2. B.9 Electrical Conduction Studies 69
REFERENCES 75
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CHAPTER– II
Applications of Thin Films and Characterization Techniques
Part - A
Applications of Thin Films
2. A.1. Introduction
There are number of applications in various fields. Few of them are
A.R.coatings, solar energy converters, transistors, coating technology,
interference filters, polarisers, narrow band filters, solar cells,
photoconductors, IR detectors, waveguide coatings, temperature. Controlled
aerospace devices, photo thermal solar coatings (such as black chrome,
Nickel, cobalt etc.) Magnetic films in recording device, superconducting films,
microelectronic devices, diamond films, and high coatings are used for
engineering applications, corrosion resistive thin film coatings and decorative
thin film coatings etc.
2. A.1.1. Applications of thin films:
1] Semiconductor:
Historically, the semiconductor industry has relied on flat, two-dimensional
chips upon which to grow and etch the thin films of material that become
electronic circuits for computers and other electronic devices. This thin layer
(only a couple of hundred nanometers thick) can be transferred to glass,
plastic or other flexible materials, opening a wide range of possibilities for
flexible electronics. In addition, the semiconductor film can be flipped as it is
transferred to its new substrate, making its other side available for more
components. This doubles the possible number of devices that can be placed
on the film. By repeating the process, layers of double-sided, thin-film
semiconductors can be stacked together, creating powerful, low-power, three-
dimensional electronic devices. "It's important to note that these are single-
crystal films of strained silicon or silicon germanium. The strain is introduced
in the way we form the membrane. Introducing strain changes the
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arrangement of atoms in the crystal such that we can achieve much faster
device speed while consuming less power."
For non-computer applications, flexible electronics are beginning to
have significant impact. Solar cells, smart cards, radio frequency identification
(RFID) tags, medical applications, and active-matrix flat panel displays could
all benefit from the development. The techniques could allow flexible
semiconductors to be embedded in fabric to create wearable electronics or
computer monitors that roll up like a window shade. "This is potentially a
paradigm shift. The ability to create fast, low-power, multilayer electronics has
many exciting applications. Silicon germanium membranes are particularly
interesting. Germanium has a much higher adsorption for light than silicon. By
including the germanium without destroying the quality of the material, we can
achieve devices with two to three orders of magnitude more sensitivity." That
increased sensitivity could be applied to create superior low-light cameras, or
smaller cameras with greater resolution.
2] Flat Panel Displays:
Developed from the Mykrolis contamination control technologies,
Entegris provides a broad portfolio of liquid and gas contamination control
technologies for the flat panel display fabrication. The Flat Panel Display
(FPD) fabrication environment is among the worlds most competitive and
technologically complex. Device designers and manufacturers continually
strive to satisfy the worldwide consumer’s appetite for larger displays, greater
pixel resolution and feature-rich performance all at a lower cost than the
previous generation of technology. The need to control contamination in air,
gas and liquid process streams is now a paramount focus of process
engineers and designers. Entegris provides the solutions to succeed under
these extreme conditions.
3] Photovoltaic:
In the familiar rigid solar panel, the energy of incoming photons is
converted to electricity in cells containing two thin layers of crystalline silicon.
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What makes roll-to-roll production of flexible film solar products possible is
replacement of the crystalline silicon with amorphous silicon supplied in high-
solids slurries that can be deposited onto substrates by web-converting
processes like slot die coating. Microlayer film. EDI can outfit its Contour cast
film dies with a new system, which makes it possible to produce film of
standard thickness yet with dozens of exceedingly thin ‘micro-layers’. The
multiple layer-to-layer interfaces create a torturous path for gas molecules and
thus substantially increase the barrier properties of the film. This is critical for
photovoltaic applications, which require barrier layers to prevent performance
losses caused by infiltration of oxygen or moisture vapour.
"Though as yet little known in the solar industry, the continuous-web
production methods familiar to EDI and its converter customers are a key to
developing high-volume, low-cost production of solar electric systems," said
Miller. "In working with solar manufacturers, EDI draws on extensive
experience in other applications that require thin-gauge, optically clear, close-
tolerance films and coatings with critical functionalities, including films and
coatings for flat panel displays and flexible batteries—particularly relevant,
since solar cells are a kind of battery. In comparison with conventional coating
methods, such as spray, roll, and spin coating, slot dies provide greater
control over coating weight and distribution because they are closed systems
into which coating material is pumped at closely pre-determined rates; in turn
this greater control makes possible thinner coatings,"
Many in the solar power industry and the investment community believe
the arrival of the grid parity point when cost of electricity generated by a
rooftop photovoltaic (PV) cell system is equivalent to that purchased from an
electrical utility will mark a major inflection point for the market that will deliver
a huge increase in growth. However, even when true grid parity arrives, it’s
unlikely to generate an abrupt rise in solar system installations due to the high
upfront costs and the long-term return of investing in a rooftop photovoltaic
system In fact, growth is set to moderate during the years when grid parity
arrives for various regions of the world as the industry enters a more mature
phase.
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4] Optical Coatings:
An optical coating is one or more thin layers of material deposited on
an optical component such as a lens or mirror, which alters the way in which
the optic reflects and transmits light. One type of optical coating is an
antireflection coating, which reduces unwanted reflections from surfaces, and
is commonly used on spectacle and photographic lenses. Another type is the
high-reflector coating which can be used to produce mirrors which reflect
greater than 99.99% of the light which falls on them. More complex optical
coatings exhibit high reflection over some range of wavelengths, and anti-
reflection over another range, allowing the production of dichroic thin-film
optical filters.
5] Data Storage:
As the data storage density in cutting edge microelectronic devices
continues to increase, the superparamagnetic effect poses a problem for
magnetic data storage media. One strategy for overcoming this obstacle is the
use of thermomechanical data storage technology. In this approach, data is
written by a nanoscale mechanical probe as an indentation on a surface, read
by a transducer built into the probe, and then erased by the application of
heat. An example of such a device is the IBM millipede, which uses a polymer
thin film as the data storage medium. It is also possible, however, to use other
kinds of media for thermomechanical data storage, and in the following work,
we explore the possibility of using thin film Ni-Ti shape memory alloy (SMA).
Previous work has shown that nanometer-scale indentations made in
martensite phase Ni-Ti SMA thin films recover substantially upon heating.
Issues such as repeated thermomechanical cycling of indentations, indent
proximity, and film thickness impact the practicability of this technique. While
there are still problems to be solved, the experimental evidence and
theoretical predictions show SMA thin films as an appropriate medium for
thermomechanical data storage.
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6] Optoelectronic:
An optoelectronic thin-film chip, comprising at least one radiation-
emitting region in an active zone of a thin-film layer and a lens disposed
downstream of the radiation-emitting region, said lens being formed by at
least one partial region of the thin-film layer, the lateral extent of the lens
being greater than the lateral extent of the radiation-emitting region. The thin-
film layer is provided for example by a layer sequence which is deposited
epitaxially on a growth substrate and from which the growth substrate is at
least partly removed. That is to say that the thickness of the substrate is
reduced. In other words, the substrate is thinned. It is furthermore possible for
the entire growth substrate to be removed from the thin-film layer. The thin-
film layer has at least one active zone suitable for generating electromagnetic
radiation. The active zone may be provided for example by a layer or layer
sequence which has a pn junction, a double heterostructure, a single quantum
well structure or a multiple quantum well structure. Particularly preferably, the
active zone has at least one radiation-emitting region. In this case, the
radiation-emitting region is formed for example by a partial region of the active
zone. Electromagnetic radiation is generated in said partial region of the
active zone during operation of the optoelectronic thin-film chip.
7] Super capacitor
Since first patents were in the 1950, the idea of storing charge in the
electric double layer that founds at the interface between a solid and an
electrolyte has presented itself as an attractive notation while its considerable
development was carried out by the slander oil company, Cleveland, Ohio
(SOHIO) in the 1960 a lack of sales lead them to license the technology to
Nippon electric company. The first high power double layer capacitor were
developed for military applications by the pinnacle research institute in 1982.
Conventional capacitor store energy electrostatically on two electrode
separated by a dielectric, the capacitance of which is C= €A/d, where € being
the dielectric constant, A surface area and d the dielectric thickness. In a
double layer capacitor, charges accumulate at the boundary between
electrode and electrolyte to form two charge layers with separation of several
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Angstroms. Super capacitors are electrochemical energy storage device. The
way that super capacitor store energy is based on two principles type’s
capacitive behaviour the electrical double layer capacitance from the pure
electrostatic charge accumulation at the electrode interface and the pseudo-
capacitance developed from fast and reversible surface redox process at
characteristic potential. Super capacitor integrated in to hybrid vehicle, power
source, power control, multi source supply, fuel save etc.
8] Gas sensors
Advancements in micro technology and the evolution of new
nonmaterial and devices have been playing a key role in the development of
very accurate and reliable sensors. The technology of sensors has developed
tremendously in the last few years owning many scientific achievements from
various experiments, offering newer challenges and opportunity to the quest
for every smaller devices capable of molecular level imaging and monitoring
of pathological samples and the macromolecules has lately gained the focus
of attention of the scientific community, particularly for remote monitoring due
to the increasing need for environmental safety and health monitoring.
Gas sensors generally operate different principles and various gas
sensing elements have been developed in past years, out of which resistive
metal oxide sensors comprise a significant part. However these sensing
elements typically operate at an elevated temperature for maximum
performance. This makes higher power consumption which is not suitable for
the inflation. Over the last decayed carbon nanotube has attracted
considerable attention, and great efforts have been made to exploit their
unusual electronic and mechanical properties. These properties make them
potential candidates for building blocks of active materials in nanoelectronics,
field emission devices, gas storage and gas sensors. Among these the room
temperature gas sensing property is very attractive for many applications.
9] Photoelectrochemical (PEC):
In photoelectrochemical experiments, irradiation of an electrode with light
that is absorbed by the electrode material causes the production of a current
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(a photocurrent). The dependence of the photocurrent on wavelength,
electrode potential, and solution composition provides information about the
nature of the photoprocess, its energetics, and its kinetics. Photocurrents at
electrodes can also arise because of photolytic processes occurring in the
solution near the electrode surface, Photoelectrochemical studies are
frequently carried out to obtain a better understanding of the nature of the
electrode-solution interface. Photoelectrochemistry and Electrogenerated
Chemiluminescence photocurrent can represent the conversion of light
energy to electrical and chemical energy; such processes are also
investigated for their potential practical applications. Since most of the studied
photoelectrochemical reactions occur at semiconductor electrodes, the brief
review of the nature of semiconductors and their interfaces with solutions is
necessary. Consideration of semiconductor electrodes also helps in gaining a
microscopic understanding of electron-transfer processes at solid-solution
interfaces.
2. A.2 Photoelectrochemical (PEC) solar cells
Though the number of applications of thin films in the large
optoelectronics field, its application in PEC is most important as the need of
energy source is increasing day by day hence the conversion of solar energy
to electrical energy is an important task in this era.
2. A.2.1.Basic theory of the Photoelectrochemical (PEC) solar cells
In1950's, much attention has been given to the possible use of
photoelectrochemical effects to convert solar energy directly into electric
power and, as a result of the energy crisis; the study of photoelectrochemical
phenomena has become increasingly more popular and important. Major part
of the present global energy production is now depends on use of fossil fuels.
However, the inherent problems associated with the use of fossil fuels such
as their dwindling sources and the environmental issues force the mankind to
look for new, renewable more sustainable long-term energy solutions to
provide the future energy demand [1, 2].
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One of the most powerful alternatives for future large scale electricity
production is photovoltaic’s, i.e., the conversion of sunlight directly into
electricity. Sunlight is available in most locations, and it provides such an
enormous supply of renewable energy that if the whole global electricity
demand would be covered exclusively by photovoltaic’s, the total land area
needed for light collection would be only a few percent of the world’s desert
area . Solar cells are easy to install and use, and their operational lifetimes
are long, which eliminates the need for continuous maintenance. Since
photovoltaic systems are modular, they are equally well suited for both
centralized and non-centralized electricity production. Therefore their
potential uses range from consumer electronics portable instruments like
calculators, wristwatches etc. to large power plants. Due to its reliability and
stability, solar energy is a good choice in applications where power is very
important and its shortages or outages cannot be tolerated, for example in
hospitals and certain production plants. Photovoltaic systems can be installed
on rooftops and facades of buildings, and they can be combined with solar
water heating systems. The power generated by rooftop solar cells can be
used locally, and the surplus can be exported to the commercial grid if there
is one in the region. The possibility for local electricity production offers
consumers more freedom by reducing their dependence on the availability
and price of commercial electricity. This is a crucial feature especially in
remote areas that lack the infrastructure of electrification. It is actually more
cost effective to install a photovoltaic system than to extend the grid if the
power requirement lies more than about half a kilometer away from the
electrical line. Rooftop photovoltaic installations, both by public institutions
and by individual citizens, are becoming more and more common worldwide
[3, 4]. In the end of the 20th century dominant energy sources switched to
petroleum, natural gas, hydropower and nuclear energy. Since the reserves
of fossil fuel are very limited and are being depleted very fast, search for
alternate sources of energy are being very much important. The world is
looking towards natural resources such as solar energy, wind energy, bio-
energy, ocean energy and geothermal energy etc., out of this solar energy
has greatest potential. In the last few decades’ lot of efforts has been already
gone in utilizing and converting solar energy in different forms.
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Why Go Solar?
A solar cell is a device that uses the photoelectric effect to generate electricity
from light. Solar cells are used to power many kinds of equipment, including
satellites, calculators, remote radiotelephones, and advertising signs.
The simplest type of solar cell is a silicon diode, but research is
continuing into more exotic materials with greater efficiencies. Modern solar
cells are encapsulated in glass-fronted plastic sheets. They have design
lifetimes that exceed forty years. Sunlight provides about 1.36 kilowatts per
square meter, and most solar cells are between 8 and 12 percent efficient. In
desert areas, they can operate for an average of 6 hours per day when
mounted in nonrotating brackets.
Why solar energy?
Solar power is one of the most promising sources of energy for the
21st Century. It's a technology that has truly come of age. After more than 50
years of refinement and use in space as well as large-scale "solar farms" right
here on Earth, solar power is ready for mainstream use like never before.
Going solar is something you should seriously consider for your residence or
commercial facility. It's good for your monthly electric bills, and it's good for
the planet.
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Characteristics of solar energy
� Clean: Solar power systems generate electricity with zero emission of
Nox, CO2, SOx or other gases associated with global warming and acid
rain.
� Renewable: Solar power systems can convert nature's sunlight into an
unlimited supply of energy.
� Abundant: The amount of sunlight striking earth in any given hour
contains light energy equivalent to the total world energy consumption
for one year.
Present Status of the Earth:
The various environmental problems we presently face on earth, such
as global warming and acid rain, can be attributed to the excessive
consumption of fossil fuels. Over dependence on fossil fuels for energy also
affects the health of everyone on Earth.
With global energy consumption continually increasing, we have
rethink seriously over our approach to the supply of energy. Natural energy
sources that do not release CO2 are critical for the creation of a healthier
planet.
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The clock is ticking:
The remaining oil reserves on the earth are equivalent to about 40 years
of consumption at the current rate of consumption. Actions must be taken now
to avert a crisis of depleting energy sources. Adoption of new natural energy
sources is a pressing need for the whole of society.
World energy resources, provide operable reserves
Solar is the remedy:
Utilization of solar energy, which is clean and inexhaustible, is a
promising substitute for fossil fuels. Photovoltaic (PV) modules are already
well established for residential use in many parts of the world. Large-scale
home systems can lead to energy self-sufficiency, while smaller-scale
systems can at minimum help reduce the consumption of fossil fuels, reduce
monthly electric utility bills, and decrease negative impact on the planet.
How Solar Energy Works:
Typical residential solar power systems use roof-mounted photovoltaic
(PV) modules to generate the electricity needed for day-to-day living. By
integrating these systems with the local power grid, homeowners can
automatically sell surplus electricity through the local grid or top up their solar
generated supply by purchasing additional electricity from their local provider
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as necessary. This highly efficient system delivers a stable supply of
electricity while ensuring that none of the power generated goes to waste.
Conversion of Sunlight to Electricity
what does the word "photovoltaic" mean, and how do photovoltaics
generate electricity from sunlight? "Photo" means light, and "voltaic" means
electricity, so putting the two together simply means electricity from light.
The individual photovoltaic cells that comprise PV modules are made
up of silicon semiconductors. When sunlight strikes the cell, some of it gets
absorbed into the silicon material. This solar energy frees electrons within the
semiconductor. Electric fields within the PV cell force the electrons to flow in
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specific direction, which creates a current. N-type silicon carries a negative
charge and P-type silicon carries a positive charge. Metal contacts on the top
and bottom of the PV cell allow the current to be drawn off for external use.
Binary and multinary compound thin films of chalcogenide of II-VI, IV-
VI, III-V, VI-VI groups have already emerged as proven and potential
candidates with low production cost and good performance in the field of solar
energy conversion.
� Classification of the Photoelectrochemical (PEC) Solar Cells
A wide range of power technologies exist which can make use of solar
energy reaching earth and converting them into different useful forms of
energy. Depending on built in potential, due to difference in Fermi energy
level solar energy trapping can be classified of two types-direct solar power
and indirect solar power as shown in Table 2.1 [5].
� Direct solar power:-
Direct solar power involves only one step transformation into a usable
form. Eg. Sunlight hits a photovoltaic cell generating electricity. Sunlight hits a
dark absorber surface of a solar thermal collector. The heat energy may be
carried away by fluid circuit.
� Indirect solar power: -
Indirect solar power involves more than one transformation to reach a
usable form. Eg. Vegetation utilize solar energy and covert into chemical
energy by photosynthesis which can later be burned as fuel to generate
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electricity (Bio-fuel ) methane (natural gas ) may be derived from the bio-fuel.
Wind turbines, hydroelectric dams are powered by solar energy through its
interaction with the earth’s atmosphere and the resulting weather
phenomena. Energy obtained from oil, coal etc., originated as solar energy
captured by vegetation in the remote geological past and fossilized. Oceans
thermal energy production uses the thermal gradient at different depths to
generate powers these temperature differences are due to the energy of the
sun.
In semiconductor – semiconductor (S-S) junction cells two types of
junction are occurred
a) Homojunction:
A homojunction cell consists of shallow p-n junction formed either by
diffusion of dopant into a monocrystalline semiconductor substrate or by
growth of an epitaxial layer onto the substrate.
b) Heterojunction:
A heterojunction is the interference between two dissimilar materials.
The semiconductor –metal (S-M) junction cells is known as
schottaky barrier cell. It is fabricated by deposing a
semitransparent metal film on the semiconductor surface. The
transparent metal film is normally evaporated on a carefully
processed semiconductor surface.
The MIS and SIS junction cells have a thin interfacial layer of an
insulator between a top inducing contact (metal or semiconductor) and a base
semiconductor. The interfacial layer is generally an oxide or the compound
which is always an insulator.
The semiconductor- liquid (SL) junction cells consist of a
semiconductor photoelectrode dipped into an electrolyte solution along with
counter electrode. The counter electrode is a suitable metal or graphite. The
charge transfer process at the semiconductor/ electrolyte interface results in
band bending establishing a potential barrier at the interface. These cells are
further classified into following groups:
� Photogalvonic cells
� Rechargable cells
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� Photoelectrolytic cell
� Photoelectrocatalytic cells
���� Photoelectrochemical cells
Amongst these groups of cells the photoelectrochemical system is
convinient. A PEC effect is defined as one in which irradiation of electrode /
electrolyte system produce a change in electric potential (on open circuit) or in
the current flowing in external circuit (under short circuit conditions) [6].Early
semiconductor electrochemistry studies have shown that the distribution of
potential at the semiconductor – electrolyte interface is almost similar to that
at a simple p-n junction [7]. A direct conversion of solar energy into electrical
energy using a semiconductor electrolyte interface was demonstrated by
Gerisher these are generally known as photoelectrochemical solar cells [8].
As compare to the traditional solid state cells photoelectrochemical (PEC)
solar cells can be much cheaper. This is particularly important because of the
comparatively low solar radiation power density requiring the use of large area
converters. The future prospects of photoelectrochemical solar energy
conversion method depend on how completely its potential advantage can be
realized in practice. Secondly, the photoelectrochemical method is convenient
in that one of its versions - photoelectrolysis, enables light energy to be
directly converted into chemical energy of the photoelectrochemical reaction
products, and thus permits the energy storage problem to be solved along
with proper energy conversion.
During the last two-three decade much work has been done on
photoelectrochemical (PEC) system in search of suitable liquid junction
photovoltaic solar cells [9].
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Table 2.1 Classification of solar energy utilization.
2. A.2.1.1.Oxidation and Reduction Process
The charge transfer across the semiconductor/ electrolyte interface in dark
as well as in light results in flow of current through the junction. This is the key
concepts for working in photoelectrochemical solar cells and reports are
available which predict the analogy between the semiconductor and
electrolyte [5].
A process in which substance gains an electron is called a reduction
reaction [10].
OX + e- ↔ Red Eo 2. 1
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Where OX and Red are oxidized and reduced species and Eo is the
standard electrochemical potential. The reverse process of losing an electron
is called an oxidation reaction. In a system, where one species loses an
electron and other species gains an electron is called redox system. If Eo is
positive, the reaction proceeds from left to right and when it is negative, the
reaction proceeds from right to left.
� The oxidized and reduced species in an electrolyte are analogous to
the conduction, valance bands respectively.
� The energy necessary to transfer an electron from the reduced
species to the oxidized species is analogous to the band gap; Eg, of
a semiconductor
� The term Efredox can also be explained in a similar manner as that of
the semiconductor Fermi level, Ef
� The redox potentials is potential required to transfer an electron
from redox species to the vacuum level or vice-versa [11].
2. A.2.1.2.Semiconductor-electrolyte Interface
The semiconductor/electrolyte interface was firstly studied and reported by
Brattain and Garret [12]. When semiconductor is dipped in redox solution, as
its chemical potential is different from the redox potential (Eredox), a new
equilibrium is established between the semiconductor and electrolyte solution
by rearrangement of charges. This results in a strong field near the junction.
When the semiconductor-electrolyte junction is illuminated with light having
energy greater than the band gap energy of semiconductor, electron-hole
pairs are produced in the depletion layer. Charge separation takes place due
to the local field present at the interface. The probability of annihilation of a
hole with an electron is reduced by this field. This condition will be optimum
when the light penetration depth is equal to the depletion layer width. So that
all the light is absorbed in the depletion layer and maximum number of
electron-hole pairs are produced in it. These separated charges produce a
counter charge and under open circuit conduction this counter field is
maximum. This is the open circuit voltage. The conduction band and valance
band get shifted due to the counter voltage. The photovoltage is given by the
46
change in the Fermi level as shown in Fig. 2.1. When a counter electrode is
immersed in the electrolyte and connected externally to the semiconductor,
the photo generated electron moves into the bulk of semiconductor through
the external circuit; it reaches the counter electrode to reduce an oxidized
species in the electrolyte. The hole is pushed to the electrode surface where it
oxidizes a species in the electrolyte. The photocurrent depends on the
absorption coefficient of the semiconductor, width of the space charge region,
hole diffusion length, area of illuminated electrode, photon energy and
radiation intensity. Under short circuit conditions, the Fermi levels of the
semiconductor and the potential of the redox couple of the solution are
equalized and a net charge flows during the illumination.
Semiconductor Electrolyte
E
Ec
Ef
Ev
Ec*
Ef , redox
Ev *
(In dark)
(In dark)Ef
* WOx
WRed
nEf *
pEf *
hν
+
−−−−
h+
e –
Fig. 2.1 The position of bands under illumination responsible for
photo induced charge transfer
2. A.2.2. Classification of the Photoelectrochemical (PEC) solar cells
The PEC cells are very similar the Schottky type solid state solar cells.
The principle of charge transfer reaction at the semiconductor – electrolyte
interface forms the basis of various types, of photoelectrochemical solar cells.
Depending on the net free energy change (∆G) in the overall system, PEC
cells can be divided into three categories.
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2. A.2.2.1. Electrochemical photovoltaic cells (∆∆∆∆G = 0)
These cells consists of such a redox couple that the total cathodic and
anodic reactions do not lead to net chemical change i. e. a change in the net
free energy, ∆G = 0. The electrodes do not participate in the chemical
reaction, they only serve as a “shuttle” for the charge transfer mechanism. At
the semiconductor electrode,
(Red)solv. + h+ ↔ (OX) solv. 2. 2
At the metal counter electrode,
(OX) solv. + e- ↔ (Red)solv 2.3
The above cell is the regenerative type PEC cell used for direct production of
electricity.
2. A.2.2.2. Photoelectrolysis cells (∆G > 0)
Effectively two redox couples are present and a net chemical change
takes place in the system by converting the optical energy in to chemical
energy. The photoelectrolysis cells and some electrochemical storage
cells belong to this category. Some examples of reaction for the above
type are
H2O hν H2 + ½ O2. 2.4
CO2 + H2O hν CH2O + O2 2.5
Chemical energy
2. A.2.2.3. Photocatalytic cells (∆G < 0)
In these cells, similar to above two redox couples are present such that
a net chemical changes take place. therefore ∆G < 0 and the optical energy
provide the activation energy for the chemical reaction. Example for
photocatalytic cell is
N2 + 3H2 hν 2NH3 2.6
2.A.2.3. Working of Photoelectrochemical (PEC) solar cells
The fabrication of Photoelectrochemical cell (PEC) for the conversion of solar
energy (sunlight) into electricity or chemical energy, the most important fact is
the long-term stability of cells that show high conversion efficiencies.
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Maximum work is carried out on the stability of semiconductor photoelectrode,
an electrolyte and a counter electrode as shown in Fig. 2.2. All parts play an
important role in the PEC cell. The distance between photoelectrode and
counter electrode is 0.5 cm. When both the electrodes are immersed in the
electrolyte, the band bending of the semiconductor photoelectrode may occur.
The transfer of electrons to or from the electrolyte can takes place only in the
energy region of the conduction band, while the hole transfer can takes place
in the region of the valance band. Such a transfer can occurs between two
states of the same energy, one empty and other filled. When the interface of
the semiconductor photoelectrode-electrolyte is illuminated, the electron-hole
pairs are generated in the depletion layer and are separated by the electric
field present at the interface. The incident energy of photon should be higher
than the bandgap energy of the semiconductor photoelectrode. The electron-
hole pairs generated in the bulk of the semiconductor are essentially lost
through recombination. If a positive potential is applied to the n-type
semiconductor photoelectrode and illuminated, the electron-hole pairs are
generated and the separated electrons rise to the top of the conduction band
and holes in the valence band. This process set up a counter field under
open circuit conductions. The counter field is at its maximum and is the open
circuit voltage; Voc is given by the equation-
Voc = (nKT/e) log [Isc+1/Io] 2.7
On the other hand, the counter electrode is being in the same
electrolyte, the photo voltage acts as a driving force for the electrons to move
under the short- circuit conditions from the semiconductor electrode to the
counter electrode and a regenerative cell is formed and is shown in Fig. 2.3.
The short- circuit current is given by the equation-
Isc = Io [exp (eVoc /nKT)-1] 2.8
The electrons promoted to the conduction band drift towards the
interior, while the holes, the minority carriers, come to the surface of the
semiconductor. Here they encounter the reduced form of the redox couple in
the solution. The component is oxidized by the holes, transported to the
49
counter electrode and therefore gets reduced. This reduction is driven by the
external connection from the semiconductor.
Fig. 2.2. A typical electrochemical photovoltaic cell
h+
e −−−−
Ec
Ef
Ev
Ef Ef,redox
Red. + h+ →→→→ Ox. Ox. + e- →→→→ Red.
WOx
WRed
A+ + e- →→→→ A
A + h+ →→→→ A+
WOx
WRed
n-type Semiconductor Electrolyte Metal
Fig. 2.3. Current flow and energy level diagram for n- semiconductor PEC cell.
50
2.A.2.4. Requirements of Photoelectrochemical (PEC) cells
The performance of photoelectrochemical cells depends upon the
following components.
2.A.2.4.1. Semiconductor photoelectrode
Semiconductor photoelectrode used in PEC cell for the achievement of
good performance should satisfy the following requirements:
� It should remain stable in the dark as well as under illumination.
� Charge carriers in the material should have high mobility and life time.
� The band gap should be such that, maximum span of the solar
spectrum should be utilized.
� The electrode must be stable against corrosion when placed in the
specific redox electrolyte. Low band gap semiconductors generally get
easily corroded. Therefore, the choice of semiconductor materials is a
very important for PEC solar cells.
� Thickness should be large enough to absorb all the incident
radiation.
� It should be of the direct band gap type with high optical
absorption coefficient (104 to 105 cm-1).
� Series resistance Rs should be as small as possible and shunt
resistance Rsh should be large enough, ideally Rs = 0 and Rsh = ∞.
2.A.2.4.2. Electrolyte/redox couple
Another important parameter in the PEC cell is the electrolyte.
Electrolytes consist of the oxidized species and the reduced species.
These species are ionic species which helps to transfer the photo
generated holes from photo electrode to counter electrode. The energy
levels in the electrolyte are similar to the concept of energy states in
the solid and Ef-redox is equivalent to the Fermi energy level of the
semiconductor. When the semiconductor electrode is immersed into
the electrolyte, the equilibrium situation is achieved by the electron
exchange at the surface; the fermi level of the semiconductor adjusts
with each other which produces a barrier height depends on the nature
of the solution species and particular semiconductor. Electrolyte
properties require for the PEC cells are:
51
� Reduction-oxidation reactions should occur appropriate to the
semiconductor band edges.
� Charge transfer rates of oxidized and reduced species at both
semiconductor and counter electrode should be high or
effective.
� Oxidized, reduced species and solvent components should have
photo and thermal stability through useable solar spectrum and
operational temperature range.
� The electrolyte should have minimum optical absorption.
� It should be non-corrosive to electrodes.
� Ionic conductance of electrolyte should permit negligible ohmic
losses.
� Toxicity, reactivity and cost should preferably below.
2.A.2.4.3. The Counter electrode
The counter electrode is important, it must satisfy regenerative
processes, the electrolyte species are oxidized at the counter electrodes
giving no net chemical change in the composition of electrolyte. The
requirements for the counter electrode for better performance in the PEC
cell are:
� When a counter electrode is immersed into the electrolyte, the half
cell potential of the electrode should match with that of the half cell
potential of the semiconductor electrode.
� The counter electrode should not react with electrolyte. i.e. it should
be chemically inert.
� The counter electrode should have a low potential for the reduction
reaction.
� It must be electronically active i.e. the charge transfer between the
counter electrode and redox species in the electrolyte must be fast.
52
2.A.2.5. Efficiency of Photoelectrochemical (PEC) cells
A solar cell's energy conversion efficiency (η) is the percentage of
power converted (from absorbed light to electrical energy) and collected,
when a solar cell is connected to an electrical circuit. This term is calculated
using the ratio of the maximum power point, Pm, divided by the input light
irradiance (E, in W/m²) under standard test conditions and the surface area of
the solar cell (Ac in m²).
m
c
Pη=
E×A 2.9
22
2.A.2.6. Fill Factor of Photoelectrochemical (PEC) cells
This is the ratio of the maximum power point (Imax maximum short
circuit current, Voc Maximum open circuit voltage) divided by the open circuit
voltage (Voc) and the short circuit current (Isc):
max max
sc oc
I VFF=
I V 2.10
2.A.2.7. Merits of Photoelectrochemical (PEC) solar cell
� Since the junction formation is a spontaneous process randomly
oriented crystallites can be used.
� Many complicated processing steps in the fabrication of a p-n-
junction are eliminated or simplified.
� The depletion layer width (W) and the minority carrier diffusion
length (LD) should be large.
� Growth of single crystal with large size need not be required.
� The fabrication of PEC cell should be easy and simple.
� The most important advantage of a PEC cell is it has ability for
chemical storage [13, 14].
53
Part-B
Thin Films Characterization Techniques
2. B.1 Introduction
In the past decade the advancement in science has taken place mainly
with the discovery of new materials. Characterization is an important stage in
the development of exotic materials. The whole characterization of any
material consists of phase analysis, compositional characterization, structural
and surface characterization, which have strong bearing on the properties of
materials. In this section different analytical techniques are used to
characterize thin films are described with related principles of their operation
and working.
2. B.2. Optical absorption Study
The equilibrium situation in semiconductor can be disturbed by
generation of carriers due to optical photon absorption. Optical photon
incident on any material may be reflected, transmitted or absorbed. The
phenomena of radiation absorption in a material is all together considered to
be due to inner shell electrons, valence band electrons, free carriers including
electrons and electrons bound to localized impurity centers or defects of some
type. In the study of fundamental properties of the semiconductors, the
absorption by the second type of electrons is of great importance. In an ideal
semiconductor, at absolute zero temperature the valence band would be
completely full of electrons, so that electron could not be excited to higher
energy state from the valence band. Absorption of quanta of sufficient energy
tends to transfer of electrons from valence band to conduction band.
The optical absorption spectra of semiconductors generally exhibits a
sharp rise at a certain value of the incident photon energy which can be
attributed to the excitation of electrons from the valence band to conduction
band may also involve acceptor or donor impurity levels, traps, excitons
etc.The conservation of energy and momentum must be satisfied in optical
absorption process.
54
Basically there are two types of optical transitions that can occur at the
fundamental edge of the crystalline semiconductor, direct and indirect. Both
involve the interaction of an electromagnetic wave with an electron in the
valence band, which is rose across the fundamental gap to the conduction
band. However, indirect transition involves simultaneous interaction with
lattice vibration. Thus the wave vector of the electron can change in the
optical transition. The momentum change being taken or given up by phonon.
Direct interband optical transition involves a vertical transition of electrons
from the valence band to the conduction band such that there is no change in
the momentum of the electrons and energy is conserved as shown in Fig. 2.4
(a). The optical transition is denoted by a vertical upward arrow. The forms of
the absorption coefficient ‘α’ as a function of photon energy hν depend on
energy of N(E) for the bands containing the initial and final states. For simple
parabolic bands and for direct transitions [15].
αααα = A (hνννν −−−− Eg)n / hνννν 2.11
where A is a constant depending upon the transition probability for direct
transition, n = 1/2 or 3/2 depending on whether the transition is allowed or
forbidden in the quantum mechanical sense. Eg is the optical gap.
Let’s visualize a situation given in Fig. 2.4 (b) where interband
transition takes place between different k−states. As they satisfy the
momentum conservation laws, the only way such transition can take place is
through the emission or absorption of a phonon with wave vector q i.e.
k' ±±±± q = k + K 2.12
The transitions defined by equation (2.12) are termed as indirect
transitions. For indirect transitions [16]
αααα = A (hνννν −−−− Eg)n / hνννν 2.13
For allowed transition n = 2 and for forbidden transitions n = 3.
The band gap energy ‘Eg’ is determined by extrapolating the linear
portion of the plot of (αhν)n against hν to the energy axis at α = 0.
While discussing the optical absorption edges observed in amorphous
semiconductors the following assumptions are made the matrix elements for
55
(a)
Valance Band
Conduction
Band
'kr
kr k
r
Valance Band
Conduction
Band
hν = Eg
O
E
kr
'kr
kr
(b)
the electronic transitions are constant over the range of photon energies of
interest and K−conservation selection rule is relaxed. This assumption is
made in amorphous semiconductors because near the band edges at least,
∆k ∼ k and thus k is not a good quantum number. On E − k diagram such
transitions would be non−vertical. However, no phonon absorption or
emission processes are invoked to conserve momentum and all the energy
required is provided by the incident photons. Such transitions are termed
non−direct as opposed to indirect. Without knowledge of the form of N(E) at
the band edges, and under the assumption of parabolic bands, the absorption
in many amorphous material is observed to obey the relation (A) with n = 2.
Thus absorption edge of many amorphous semiconductors can be described
by a simple power law, at least over a limited range of the absorption
coefficients, which enables an optical gap ‘Eg’ to be defined.
Fig. 2.4 “Direct interband optical transitions” for a) direct band and b) indirect
band semiconductors. The transitions are represented by vertical arrow.
2. B.3.Raman Spectral Study
Raman spectroscopy is different from the rotational and vibrational
spectroscopy considered above in that it is concern with the scattering of
radiation by the simple, rather than an absorption process. It is named after
the Indian physicists who first observed it in 1928, C. V. Raman. Both
rotational and vibrational spectroscopies are possible. The energy of the
56
exciting radiation will determine which type of the transition occurs-rotational
transitions are lower in energy than vibrational transitions.
In addition to this, rotational transitions are around three orders of
magnitude slower than vibrational transitions. Therefore, collisions with other
molecule may occur in the time in which the transition is occurring. A collision
is likely to change the rotational state of the molecule, and so the definition of
the spectrum obtained will destroyed. Rotational spectroscopy is therefore
carried out on gases at low pressure to ensure that the time between the
collision is greater than the time for transition.
The basic set up of Raman spectrometer is shown above.
Note that the detector is orthogonal to the direction of the incident
radiation, so as to observe only scattered light. The source needs to provide
intense monochromatic radiation, and usually laser. The criteria for a
molecule to be Raman active are also different to other types of spectroscopy,
which required permanent magnetic dipole moment, at least for diatomic
molecules. A molecule will only be Raman if the following gross selection rule
is fulfilled.
� Gross selection rule:
For spectroscopic techniques such as infrared spectroscopy, as seen
in the first section it is necessary for the molecule being analyzed to have a
permanent electric dipole. This is not the case for Raman spectroscopy;
rather it is the polarizability (α) of the molecule which is important.
The oscillating electric field of a photon causes charged particles
57
(electrons and, to a lesser extent, nuclei) in the molecule to oscillate. This
leads to an induced electric dipole moment, µind,
Where µind = (α) E
This induced dipole moment then emits a photon, leading to either
Raman or Raleigh scattering. The energy of this interaction is also dependent
on the polarizability:
Energy of interaction = -1/2α E 2
In comparison with the equation for the interaction energy for other
forms of spectroscopy, it can be seen that the energies of Raman transitions
are relatively weak. To counter this, a higher intensity of the exciting radiation
is used.
For Raman scattering to occur, the polarizability of the molecule must
vary with its orientation. One of the strengths of Raman spectroscopy is that
this will be true for both heteronuclear and homonuclear diatomic molecules.
Homonuclear diatomic molecules do not possess a permanent electric dipole,
and so are undetectable by other methods such as infrared.
� Selection rules arising from quantum mechanics:
A detailed discussion of the quantum mechanical basis for
spectroscopy is beyond the scope of this brief introduction. Here, the quantum
numbers and the allowed transitions involved are simply stated.
� Rotational
To find allowed rotational transitions, the total angular momentum
quantum number for rotational energy states, J, must be considered. Raman
spectroscopy involves a 2 photon process, each of which obeys:
∆J=±1
Therefore, for the overall transition
∆J=±2
Where, ∆J=0 for corresponds to Raleigh scattering,
∆J=0 corresponds to a Stokes transition,
and ∆J= -2 corresponds to an anti-Stokes transition.
� Vibrational
To find allowed transitions the vibrational quantum number, ν must be
58
Source Molecule
hν1
hν1
Source Molecule
hν1
hνr1 hνr2
considered.
For the overall transition,
∆ν = ±1
Transitions where ∆ν = ±2 are also possible, but these are of weaker
intensity.
� Types of scattering
Consider a light wave as a stream of photons each with energy hν.
When each photon collides with a molecule, many things may happen, 2 of
which are considered below:
� Elastic, or Raleigh scattering
This is when the photon simply 'bounces' off the molecule, with no
exchange in energy. The vast majority of photons will be scattered in this way.
� Inelastic, or Raman scattering
This is when there is an exchange of energy between the photon and
the molecule, leading to the emission of another photon with a different
frequency to the incident photon:
59
This scattering phenomenon as shown follows.
� Raman scattering
The molecule may either gain energy from, or lose energy to, the
photon. In the diagram below, 3 energy states of the molecule are shown (E1,
E2, E3). The molecule is originally at the E2 energy state. The photon interacts
with the molecule, exciting it with an energy hν1. However, there is no
stationary state of the molecule corresponding to this energy, and so the
molecule relaxes down to one of the energy levels shown. In doing this, it
emits a photon. If the molecule relaxes to energy state E1, it will have lost
energy, and so the photon emitted will have energy hνr1, where hνr1 > hν1.
60
These transitions are known as anti-Stokes transitions. If the molecule relaxes
to energy state E3, it will have gained energy, and so the photon emitted will
have energy hνr2, where hνr2 < hν1. These transitions are known as Stokes
transitions.
For rotational spectroscopy, both Stokes and anti-Stokes transitions
are seen. For vibrational spectroscopy, Stokes transitions are far more
common, and so anti-Stokes transitions can effectively be ignored [17-22].
Fig. 2.5 Photograph of Multi RAM (Brucker) made Germany.
61
2. B.4 Scanning Electron Microscopy (SEM)
Scanning electron microscope is an instrument that is used to observe
the morphology of the solid sample at higher magnification, higher resolution
and depth of focus as compared to an optical microscope [23]. When an
electron strikes the atom, variety of interaction products are evolved. Figure
2.6 illustrates these various products and their use to obtain the various kinds
of information about the sample. Scattering of electron from the electrons of
the atom results into production of backscattered electrons and secondary
electrons. Electron may get transmitted through the sample if it is thin.
Primary electrons with sufficient energy may knock out the electron from the
inner shells of atom and the excited atom may relax with the liberation of
Auger electrons or X-ray photons. All these interactions carry information
about the sample. Auger electron, ejected electrons and X-rays are energies
specific to the element from which they are coming. These characteristic
signals give information about the chemical identification and composition of
the sample.
A) Uses
a) Topographic images
b) Micro structural analysis
c) Elemental analysis if equipped with appropriate detector (EDAX, WDX)
d) Magnification of 10 - 50,000
B) Samples
e) Minimum size: 0.1 mm; maximum size depends on machine
f) Samples must be conductive or coated with thin conductive layer
g) Compatible with vacuum environment
Principle of Scanning Electron Microscope
A well-focused mono-energetic (~25KeV) beam is incident on a solid
surface giving various signals as mentioned above. Backscattered electrons
and secondary electrons are particularly pertinent for SEM application, their
62
intensity being dependent on the atomic number of the host atoms. Each may
be collected, amplified and utilized to control the brightness of the spot on a
cathode ray tube. To obtain signals from an area, the electron beam is
scanned over the specimen surface by two pairs of electro-magnetic
deflection coils and so is the C.R.T. beam in synchronization with this.
Fig. 2.6. Variety of interaction products evolved due to interaction of electron
beam and sample
The signals are transferred from point to point and signal map of the
scanned area is displayed on a long persistent phosphor C.R.T. screen.
Change in brightness represents change of a particular property within the
scanned area of the specimen. The ray diagram of scanning electron
microscope is shown in Fig. 2.7. The scattering cross section for back-
scattered electrons is given as [24],
Secondary Electrons
Back Scattered Electrons
Auger Electrons
X-rays
Cathodolumenescence
Electromotive force
Electron Beam
Transmitted Beam
63
∗= −
2cot102.16
2
30 φE
ZQ 2.14
where, Z is atomic number and E is electric field.
Here the cross-section is proportional to Z2. Hence, the back-scattered
electrons are used for the Z contrast or for compositional mapping.
Fig. 2.7. The schematic ray diagram of scanning electron microscope.
64
2. B.5 Atomic Force Microscopy (AFM)
The atomic force microscopy (AFM) probes the surface of a sample
with a sharp tip, a couple of microns long often less than 100 Å in diameter.
The tip is located at the free end of a cantilever, which is 100 to 200 µm long.
The forces between the sample surface and tip cause the cantilever to deflect
or bend. A detector measures the cantilever deflection as tip is scanned over
the sample or the sample is scanned under the tip. The measured cantilever
deflection allows a computer to generate a map or surface topography.
Several forces typically contribute to the deflection of an AFM cantilever. AFM
operates by measuring the attractive or repulsive forces between a tip and the
sample. The forces most commonly associated with atomic force microscopy
are interatomic force called the Van der Waals force. The dependence of the
Van der Waals force upon the distance between the tip and the sample is
shown in figure. The two distance regimes are labeled in the figure are the
contact regime and non-contact regime.
In the contact regime, the cantilever is held at a distance less than few
angstroms from the sample surface, and the inter-atomic force between the
cantilever and the sample is repulsive. In the non-contact regime, the
cantilever is held at a distance of the order of tens to hundred of angstroms
from the sample surface, and the inter-atomic force between the cantilever
and sample is attractive. Figure shows schematic diagram of AFM.In principle,
AFM resembles the record player as well as the surface profilometer.
However, AFM incorporates a number of refinements that enable it to achieve
atomic–scale resolution: Sensitive detection, flexible cantilever, sharp tips,
high-resolution tip-sample positioning and Force feedback [25, 26].
65
Fig. 2.8.a. Inter-atomic force versus distance curve for the operation of AFM
Fig. 2.8.b. Schematic diagram of Atomic Force Microscope (AFM)
Repulsive force Force
contact
Attractive force
Intermitted contact
Non- contact
Distance
(Tip –to-sample separation)
(a)
(b)
66
2. B.6 Energy Dispersive Analysis by X-Rays Measurement (EDS)
In EDS technique a sample is made the target in an X- ray tube and is
bombarded with electrons of suitable energy, it emits characteristics X-rays.
This is the basis of a method of chemical analysis. The emitted X-rays are
analyzed in an X-ray spectrometer and the elements present in the sample
are qualitatively identified by their characteristics wavelengths. For
compositions greater than or about 1% and elements separated by few atomic
numbers, energy dispersion analysis is very useful because the intensities are
increased about 100-Fold. The resolution however, of an energy dispersion
instruments is as much as 50 times less than the wavelength dispersion
spectrometer using a crystal; thus overlapping of lines from nearby elements
may occur. If a sample is irradiated with X-rays of sufficiently high energy, it
will emit fluorescent radiation. This radiation may be analysized in an X-ray
spectrometer and the elements present in the sample identified by their
characteristics wavelengths. Study of thin films, ferrites, composites,
biological samples and pharmaceutical samples are the common application
areas [27].
2. B.7 X- ray Diffraction (XRD) Technique
X-ray diffraction (XRD) is a powerful technique for determination of
crystal structure and lattice parameters. The basic principles of X-ray
diffraction are found in textbooks e.g. by Buerger [28], Klug and Alexander
[29], Cullity [30], Tayler [31], Guinier [32], Barrett and Massalski [33].
Figure 2.9 shows the schematics of X-ray diffractometer. Diffraction in
general occurs only when the wavelength of the wave motion is of the same
order of magnitude as the repeat distance between scattering centers. This
condition of diffraction is nothing but Bragg’s law and is given as,
2d sinθθθθ = nλλλλ 2.15
Where,
d = interplaner spacing
θ = diffraction angle
n = order of diffraction
67
λ = wavelength of x-ray
2θ
θ
X-ray
Source
Sample
Detector
Receiving SlitDiverging Slit
Fig. 2.9. Schematics ray diagram of X-ray diffractometer.
For thin films, the powder technique in conjunction with diffractometer
is most commonly used. In this technique the diffracted radiation is detected
by the counter tube, which moves along the angular range of reflections. The
intensities are recorded on a computer system. The‘d’ values are calculated
using relation (E) for known values of θ, λ and n. The X- ray diffraction data
thus obtained is printed in tabular form on paper and is compared with
Joint Committee Power Diffraction Standards (JCPDS) data to identify the
unknown material. The sample used may be powder, single crystal or thin
film. The crystallite size of the deposits is estimated from the full width at half
maximum (FWHM) of the most intense diffraction line by Scherrer's formula
as follows [34].
θβ
λ=
cos
9.0D 2.16
Where, D is crystallite size, λ is wavelength of X-ray used, β is full width at
half maxima of the peak (FWHM) in radians, θ is Bragg's angle. The X- ray
diffraction data can also be used to determine the dimension of the unit cell.
68
This technique is not useful for identification of individuals of multilayer’s or
percentage of doping material.
2. B.8. Thickness Measurement
The thickness of film is the most significant parameter that affects the
properties of the thin films. It may be measured either by in-situ monitoring of
the rate of the deposition or after the film is taken out form deposition
chamber. Technique of the first type often referred to as monitor methods
generally allow both monitoring and controlling of deposition rate of film
thickness. Any known physical quantity related to film thickness can be used
to measure the thickness. The method chosen should be convenient, reliable
and simple. One of the most convenient surfaceprofilometer and reliable
method for determining film thickness in this method, area and weight of the
film are measured.
Fig. 2.10 Schematics ray Diagram of Typical Profilometer
Electro-magnetic sensors detect the vertical motion of the stylus as it is
moved horizontally across the sample.
Measure
A) Film thickness (step height)
a) changes of 200 Å to 65 µm
b) vertical resolution of about 10 Å
B) Roughness
69
a) horizontal resolution depends on tip radius problem: stylus
penetrates soft films
In our experiment we used the XP-1 Ambios Technology surface profilometer
(contact mode) having 1 Ao resolution.
Fig.2.11 Photograph showing the XP-1 Ambios Technology surface
profilometer
2. B.9 Electrical Conduction Studies
Surface Electrical Conduction phenomena are well known to have a
strong influence on the electronic properties of bulk semiconductors. When
Electrical Conduction takes place through thin specimens, the carriers are
being subjected to considerable scattering by the boundary surface in addition
to normal bulk scattering. This additional scattering will reduce the effective
carrier mobility below the bulk value and will thus give rise to quantum size
effects. A study of these size effects can yield information on the electronic
structure of a surface and is therefore of considerable fundamental and
practical importance. These phenomena play an important role in the
transport properties of semiconducting film of about 1µm thickness and having
carrier concentration up to 1018 cm-3. Surface transport phenomena in bulk
70
semiconductor have received much attention in recent years. This subject is
well explained by Pulliam et al. [35]. The important Electrical Conduction
Studies i.e. electrical resistively, thermoelectric power (TEP) are discussed
below.
a) Electrical Conductivity Measurement
The use of thin films as resistors, contacts and interconnections has
lead to extensive study of conductivity, its temperature dependence, the effect
of thermal processing stability and so on. Investigations of the electrical
resistivity as a highly structure sensitive properties make it possible to gain
insight into the structural and electrical properties of the metal film which is
important from both the theoretical and practical point of view.
The contact techniques are widely used for the measurement of
resistivity. These techniques include two-point probe, four point probe and the
spreading resistance methods. The two-point method is simple and easy to
use. In this technique a constant current I is passed through a sample of
known dimensions (cross-sectional area ‘A’). And the d.c. voltage ‘V’ between
two fixed position probes (separation‘d’) measured either with impedance
voltmeter or potentiometrically. For uniform sample resistively is given by
ρρρρ = (A/I) (V/d) 2.17
In case of semiconducting thin films, the resistivity decreases with increase in
temperature. The thermal activation energies ‘Ea’ are calculated by using
following relation:
σσσσ = σσσσοοοο exp (-∆∆∆∆E /κκκκT) 2.18
Where ∆E is the activation energy for the conduction, κ is Boltzmann constant
and σ0 is the pre exponential constant depending on the material.
Fig. 2.12a. and 2.12b. shows photograph and schematic diagram of the
electrical conductivity measurement unit. The two brass plates of the size 10
x 5 x 0.5 cm are grooved at the centre to fix the heating elements. Two strip
heaters (65 Watts) were kept parallel in between these two brass plates to
71
achieve uniform temperature. The two brass plates are then screwed to each
other. The sample was mounted on the upper brass plate at the centre. To
avoid the contact between the film and the brass plate, a mica sheet was
placed between the film and brass plate. The area of the film was defined
and silver emulsion (paste) was applied to ensure good electrical contact to
the films. The working temperature was recorded using a Chromel-Alumel
thermocouple (24 gauge) fixed at the centre of the brass plates. Testronix
model 34 C (power supply unit ) was used to pass the current through the
sample. The potential drop across the film was measured with the help of
Meco 801 digital multimeter and current passed through the sample was
noted with a sensitive 4 digit picoammeter (Scientific equipment, Roorkee
DPM 111).The measurements were carried out by keeping the film system in
a light tight box, which was kept at room temperature.
Fig 2.12a. Photograph showing the electrical conductivity
measurement assembly.
72
Fig. 2.12b. Cross sectional view of electrical conductivity measurement
unit.
b) Thermoelectric Power Measurement (TEP)
If some metal contacts are applied to the two ends of a semiconductor
and if one junction is maintained at higher temperature than the other, a
potential difference is developed between the two electrodes. This
thermoelectric or Seebeck voltage is produced partly because
i) The majority carriers in the semiconductor diffuse from hot to cold junction,
thus giving a potential difference between the ends of the specimen. This
voltage builds upto a value such that the return current just balances the
diffusion current when a steady state is reached.
ii) Other part which contributes to the thermoelectric voltage is the contact
potential difference between metal and semiconductor, which occurs at two
junctions.
73
In the semiconductor, if the charge carriers are predominantly
electrons, the cold junction becomes negatively charged and if the charge
carriers are positive holes, the cold junction becomes positively charged. The
magnitude of the developed voltage is proportional to the difference in
temperature between the hot and cold junction, if the temperature difference
is small. From the sign of the thermoelectric voltage it is thus possible to
deduce whether a given specimen exhibits n-or p-type conductivity.
The thermoelectric power (TEP), which is defined as the ratio of
thermally generated voltage to the temperature difference across the piece of
semiconductor, gives the information about the type of carriers in the
semiconductor.
Fig. 2.13a) and 2.13b) shows photograph and schematic diagram of
the TEP measurement unit. Thermoelectric power measurement apparatus
consist of two brass blocks. One brass block was used as a sample holder-
cum-heater. Other brass block was kept at room temperature. The hot and
cold junction was kept thermally isolated by inserting an insulated barrier
between the junctions. The size of the film used in this study was 40 mm x
12.5 mm x 1.35 mm on amorphous glass substrates, were fixed on two brass
blocks. Chromel – Alumel thermocouples (24 gauze) were used to sense the
working temperature. A 65 watt strip heater was used for heating the sample.
The temperature of the hot junction was raised slowly from room temperature,
with a regular interval of 10 K. the thermo emf was noted up to the highest
temperature of 500 K. Silver contacts were made to films with copper wire. A
backellite box was used for proper shielding of the TEP unit, which also
minimises to some extent, thermal radiation losses. The mean temperature
was measured with a Meco 801 digital multimeter while the differential
thermal gradient and thermoelectric voltage were measured with digital
Tektronix microvoltmeter.
74
Fig.2.13a.Photograph showing the thermoelectric power measurement
assembly.
Fig. 2.13b. Cross sectional view of thermoelectric power measurement
unit.
75
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