C3502.pdf

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©2000 Fairchild Semiconductor International Rev. A, February 2000 KSC3502 NPN Epitaxial Silicon Transistor Absolute Maximum Ratings T C =25°C unless otherwise noted Electrical Characteristics T C =25°C unless otherwise noted h FE Classification Symbol Parameter Value Units V CBO Collector-Base Voltage 200 V V CEO Collector-Emitter Voltage 200 V V EBO Emitter-Base Voltage 5 V I C Collector Current (DC) 100 mA I CP Collector Current (Pulse) 200 mA P C Collector Dissipation (T C =25°C) 5 W P C Collector Dissipation (T a =25°C) 1.2 W T J Junction Temperature 150 °C T STG Storage Temperature - 55 ~ 150 °C Symbol Parameter Test Condition Min. Typ. Max. Units BV CBO Collector-Base Breakdown Voltage I C = 10µA, I E = 0 200 V BV CEO Collector-Emitter Breakdown Voltage I C = 1mA, I B = 0 200 V BV EBO Emitter-Base Breakdown Voltage I E = 10µA, I C = 0 5 V I CBO Collector Cut-off Current V CB = 150V, I E = 0 0.1 µA I EBO Emitter Cut-off Current V EB = 4V, I C = 0 0.1 µA h FE DC Current Gain V CE = 10V, I C = 10mA 40 320 V CE (sat) Collector-Emitter Saturation Voltage I C = 20mA, I B = 2mA 0.6 V V BE (sat) Base-Emitter Saturation Voltage I C = 20mA, I B = 2mA 1 V f T Current Gain Bandwidth Product V CE = 30V, I C = 10mA 150 MHz C ob Output Capacitance V CB = 30V, f= 1MHz 1.7 pF C re Reverse Transfer Capacitance V CB = 30V, f= 1MHz 1.2 pF Classification C D E F h FE 40 ~ 80 60 ~ 120 100 ~ 200 160 ~ 320 KSC3502 CRT Display, Video Output High Voltage : V CEO =200V Low Reverse Transfer Capacitance: C re =1.2pF @ V CB =30V 1 TO-126 1. Emitter 2.Collector 3.Base

Transcript of C3502.pdf

  • 2000 Fairchild Semiconductor International Rev. A, February 2000

    KS

    C3

    502

    NPN Epitaxial Silicon Transistor

    Absolute Maximum Ratings TC=25C unless otherwise noted

    Electrical Characteristics TC=25C unless otherwise noted

    hFE Classification

    Symbol Parameter Value Units

    VCBO Collector-Base Voltage 200 V

    VCEO Collector-Emitter Voltage 200 V

    VEBO Emitter-Base Voltage 5 V

    IC Collector Current (DC) 100 mA

    ICP Collector Current (Pulse) 200 mA

    PC Collector Dissipation (TC=25C) 5 W

    PC Collector Dissipation (Ta=25C) 1.2 W

    TJ Junction Temperature 150 C

    TSTG Storage Temperature - 55 ~ 150 C

    Symbol Parameter Test Condition Min. Typ. Max. Units

    BVCBO Collector-Base Breakdown Voltage IC = 10A, IE = 0 200 V BVCEO Collector-Emitter Breakdown Voltage IC = 1mA, IB = 0 200 V

    BVEBO Emitter-Base Breakdown Voltage IE = 10A, IC = 0 5 V ICBO Collector Cut-off Current VCB = 150V, IE = 0 0.1 A IEBO Emitter Cut-off Current VEB = 4V, IC = 0 0.1 A hFE DC Current Gain VCE = 10V, IC = 10mA 40 320

    VCE(sat) Collector-Emitter Saturation Voltage IC = 20mA, IB = 2mA 0.6 V

    VBE(sat) Base-Emitter Saturation Voltage IC = 20mA, IB = 2mA 1 V

    fT Current Gain Bandwidth Product VCE = 30V, IC = 10mA 150 MHz

    Cob Output Capacitance VCB = 30V, f= 1MHz 1.7 pF

    Cre Reverse Transfer Capacitance VCB = 30V, f= 1MHz 1.2 pF

    Classification C D E F

    hFE 40 ~ 80 60 ~ 120 100 ~ 200 160 ~ 320

    KSC3502

    CRT Display, Video Output High Voltage : VCEO=200V Low Reverse Transfer Capacitance: Cre=1.2pF @ VCB=30V

    1 TO-126

    1. Emitter 2.Collector 3.Base

  • 2000 Fairchild Semiconductor International

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    Rev. A, February 2000

    Typical Characteristics

    Figure 1. Static Characteristic Figure 2. Static Characteristic

    Figure 3. DC current Gain Figure 4. Base-Emitter Saturation VoltageCollector-Emitter Saturation Voltage

    Figure 5. Base-Emitter On Voltage Figure 6. Collector Output Capacitance

    0 2 4 6 8 100

    4

    8

    12

    16

    20IB = 160A

    IB = 140A

    IB = 120A

    IB = 100A

    IB = 80A

    IB = 60A

    IB = 40A

    IB = 20A

    IB = 0

    I C[m

    A],

    CO

    LLE

    CT

    OR

    CU

    RR

    EN

    T

    VCE[V], COLLECTOR-EMITTER VOLTAGE

    0 20 40 60 80 1000

    2

    4

    6

    8

    10

    IB = 80A

    IB = 70AIB = 60A

    IB = 50A

    IB = 40A

    IB = 30A

    IB = 20A

    IB = 10A

    IB = 0

    I C[m

    A],

    CO

    LLE

    CT

    OR

    CU

    RR

    EN

    T

    VCE[V], COLLECTOR-EMITTER VOLTAGE

    0.1 1 10 100 10001

    10

    100

    1000

    VCE = 10V

    hF

    E,

    DC

    CU

    RR

    EN

    T G

    AIN

    IC[mA], COLLECTOR CURRENT

    0.1 1 10 1000.01

    0.1

    1

    10

    IC = 10 IB

    VCE(sat)

    VBE(sat)

    V

    BE(s

    at)

    , VC

    E(s

    at)

    [V],

    SA

    TU

    RA

    TIO

    N V

    OLT

    AG

    E

    IC[mA], COLLECTOR CURRENT

    0.0 0.2 0.4 0.6 0.8 1.0 1.20

    20

    40

    60

    80

    100

    120

    140

    160

    VCE = 10V

    I C[m

    A],

    CO

    LLE

    CT

    OR

    CU

    RR

    EN

    T

    VBE[V], BASE-EMITTER VOLTAGE

    0.1 1 10 100 10000.1

    1

    10

    100

    f = 1MHz

    Co

    b[p

    F],

    CA

    PA

    CIT

    AN

    CE

    VCB[V], COLLECTOR-BASE VOLTAGE

  • 2000 Fairchild Semiconductor International

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    Rev. A, February 2000

    Typical Characteristics (Continued)

    Figure 7. Reverse Transfer Capacitance Figure 8. Current Gain Dandwidth Product

    Figure 9. Safe Operating Area Figure 10. Power Derating

    0.1 1 10 100 10000.1

    1

    10

    100f=1MHz

    Cre[p

    F],

    CA

    PA

    CIT

    AN

    CE

    VCB[V], COLLECTOR-BASE VOLTAGE

    0.1 1 10 100 10001

    10

    100

    1000

    VCE = 30V

    f T[M

    Hz]

    , C

    UR

    RE

    NT

    GA

    IN B

    AN

    DW

    IDT

    H P

    RO

    DU

    CT

    IC[mA], COLLECTOR CURRENT

    1 10 100 10001

    10

    100

    1000

    DC (Ta = 25 o

    C)

    500s

    10ms1ms

    DC (Tc = 25 o

    C)

    IC MAX. (Pulse)

    IC MAX.

    I C[m

    A],

    CO

    LLE

    CT

    OR

    CU

    RR

    EN

    T

    VCE[V], COLLECTOR-EMITTER VOLTAGE

    0 25 50 75 100 125 150 1750

    1

    2

    3

    4

    5

    6

    7

    8

    Ta

    Tc

    P

    C[W

    ], P

    OW

    ER

    DIS

    SIP

    AT

    ION

    T[oC], TEMPERATURE

  • Package Demensions

    2000 Fairchild Semiconductor International Rev. A, February 2000

    KS

    C3

    502

    Dimensions in Millimeters

    3.25 0.208.00 0.30

    3.20 0.10

    0.75 0.10

    #1

    0.75 0.10

    2.28TYP[2.280.20]

    2.28TYP[2.280.20]

    1.60 0.10

    11.0

    0 0

    .20

    3.90

    0.

    10

    14.2

    0MA

    X

    16.1

    0 0

    .20

    13.0

    6 0

    .30

    1.75 0.20

    (0.50)(1.00)

    0.50 +0.100.05

    TO-126

  • 2000 Fairchild Semiconductor International Rev. E

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